CN205786695U - Seat is connected for the extensive automatization of chip and manual test - Google Patents
Seat is connected for the extensive automatization of chip and manual test Download PDFInfo
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- CN205786695U CN205786695U CN201620440510.5U CN201620440510U CN205786695U CN 205786695 U CN205786695 U CN 205786695U CN 201620440510 U CN201620440510 U CN 201620440510U CN 205786695 U CN205786695 U CN 205786695U
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- gland
- chip
- revolving fragment
- lower sheeting
- test
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- 238000012360 testing method Methods 0.000 title claims abstract description 68
- 210000004907 gland Anatomy 0.000 claims abstract description 111
- 239000012634 fragment Substances 0.000 claims abstract description 46
- 238000007906 compression Methods 0.000 claims abstract description 10
- 230000006835 compression Effects 0.000 claims abstract description 9
- 239000000523 sample Substances 0.000 claims description 5
- 239000004065 semiconductor Substances 0.000 abstract description 2
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
nullThis utility model relates to the tool field of semiconductor integrated circuit chip test，Specifically disclose one and connect seat for the extensive automatization of chip and manual test，Including chip gland and chip test base，Chip gland includes gland revolving fragment、Gland lower sheeting and compression spring，Clamping relatively rotating with gland lower sheeting between gland revolving fragment and gland lower sheeting，Certain distance is left between gland revolving fragment and gland lower sheeting，Compression spring is arranged between gland revolving fragment and gland lower sheeting，The upper surface of chip test base is provided with many locating dowels，It is provided with hole, multiple location on gland revolving fragment and gland lower sheeting，Hole, location on gland revolving fragment is curved and forms draw-in groove on its medial wall，Locating dowel head can pass the hole, location on gland lower sheeting and on gland revolving fragment，The head of locating dowel can move along hole, location，And the head of locating dowel can be connected on draw-in groove.This utility model can improve testing efficiency.
Description
Technical field
This utility model relates to the tool field of semiconductor integrated circuit chip test, particularly relates to one
Seat is connected for the extensive automatization of chip and manual test.
Background technology
Along with the constantly reduction of integrated circuit feature size and improving constantly of integrated level, electronic product cost is not
Disconnected decline, performance improve constantly, but the thing followed is the integrity problem of system.High reliability request
Device normally can work under the mal-conditions such as high pressure, high temperature, high irradiation.Reliability testing progressively becomes
One requisite testing process before chip operation.Burn-in test is mainly analog equipment and used in reality
The high intensity test of the various mal-conditions in journey, simultaneously according to the requirement used, rational prediction product makes
Use the life-span.The measurement jig of burn-in test is mainly adopted manually at present, and testing efficiency is low, it is difficult to full
The rapid response to customer's need in foot market.Traditional die is during burn-in test, due to chip gland and test base
The restriction of holder structure, is required to use manually-operated mode to pick and place test chip, manual clamping chip gland,
Test mode although it is so can meet the Production requirement of chip, but when chip large-scale mass production,
The mode efficiency defect of traditional manual test has just become bottleneck, it is difficult to meet the production capacity demand in market.
Utility model content
For overcoming disadvantages mentioned above, the purpose of this utility model be to provide a kind of can improve testing efficiency for
The extensive automatization of chip and manual test connect seat.
In order to reach object above, the technical solution adopted in the utility model is: a kind of extensive for chip
Automatization and manual test connect seat, and including chip gland and chip test base, described chip gland includes
Gland revolving fragment, gland lower sheeting and compression spring, described gland revolving fragment is arranged on gland lower sheeting
Top, clamping relatively rotating with gland lower sheeting between described gland revolving fragment and gland lower sheeting,
Leaving certain distance between described gland revolving fragment and gland lower sheeting, described compression spring is arranged on gland rotation
Between rotor and gland lower sheeting, the upper surface of described chip test base is provided with many locating dowels, described fixed
The diameter of position post head is more than the diameter of locating dowel shaft, and described gland revolving fragment is all provided with on gland lower sheeting
It is equipped with multiple consistent with locating dowel quantity and positions hole, determining on described gland revolving fragment with it one to one
Hole is curved and forms draw-in groove on its medial wall in position, described locating dowel head can pass on gland lower sheeting and
Hole, location on gland revolving fragment, the head of described locating dowel can move along hole, location, and described locating dowel
Head can be connected on draw-in groove.The beneficial effects of the utility model are, obviate original chip testing pedestal and
The mounting means of chip gland structure and chip base and chip gland, chip gland uses elastic body,
Compression spring is to mechanical hand/manually and chip to be measured all leaves the biggest working place, it is simple to realize automatically
Changing, gland revolving fragment can freely stretch within the specific limits with gland lower sheeting, at compatible different-thickness
While chip, it is also possible to accurately the pressure of control chip test mode is to ensure stablizing of chip and test bench
Contact；Four locating dowels are used to be connected between chip gland and chip test base, during test, both convenient manual
Operation, also allows for mechanical hand and captures, implement large-scale automatic test, improve testing efficiency.
Preferably, the upper surface of described gland lower sheeting is provided with multiple grab, and described knob sheet is provided with
The arc connecting hole consistent with grab quantity, on the medial wall of described arc connecting hole, formation coordinates with grab
Card hook and slot, the length of described card hook and slot is more than grab, when described gland revolving fragment can occur with gland lower sheeting
When relatively rotating, described grab can move along card hook and slot.Simple in construction, easy to operate.
Preferably, described chip test base includes test bench main body, chip positioning frame, described chip positioning frame
Being arranged on the upper surface of test bench main body, described many locating dowels are arranged on the upper surface of chip positioning frame.
Preferably, described test bench body interior is provided with spring probe.
Preferably, the rotation of described gland revolving fragment is by manually or mechanically hand drive.
Accompanying drawing explanation
Fig. 1 is the axonometric chart of the present embodiment；
Fig. 2 is the two-dimensional cross-sectional view of the present embodiment；
Fig. 3 is the three-dimensional cross-sectional view of the present embodiment；
Fig. 4 is the axonometric chart of this example chips test bench；
Fig. 5 is the top view after gland revolving fragment and gland lower sheeting relatively rotate in the present embodiment.
In figure:
1-chip gland；101-gland revolving fragment；102-gland lower sheeting；103-compression spring；104-card
Hook；105-card hook and slot；106-positions hole；107-draw-in groove；108-arc connecting hole；
2-chip test base；201-chip positioning frame；202-locating dowel；203-test bench main body；204-bullet
Spring probe；205-chip.
Detailed description of the invention
Below in conjunction with the accompanying drawings preferred embodiment of the present utility model is described in detail, so that this utility model
Advantage and feature can be easier to be readily appreciated by one skilled in the art, thus to protection domain of the present utility model
Make apparent clear and definite defining.
Seeing shown in accompanying drawing 1-3, the one of the present embodiment connects for the extensive automatization of chip and manual test
Joint chair, mainly includes two big assembly, respectively chip gland 1, chip test bases 2.
Wherein, chip gland 1 includes gland revolving fragment 101, gland lower sheeting 102 and compression spring 103,
Gland revolving fragment 101 is arranged on the top of gland lower sheeting 102, and the upper surface of gland lower sheeting 102 is arranged
There are four grabs 104, knob sheet is provided with the arc connecting hole 108 consistent with grab 104 quantity, arc
Forming the card hook and slot 105 coordinated with grab 104 on the medial wall of connecting hole 108, the length of card hook and slot 105 is big
By card hook and slot 105 and grab 104 between grab 104, gland revolving fragment 101 and gland lower sheeting 102
Cooperation realize clamping, and gland revolving fragment 101 can relatively rotate with gland lower sheeting 102, works as pressure
When lid revolving fragment 101 can relatively rotate with gland lower sheeting 102, grab 104 can be along card hook and slot 105
Mobile.Leaving certain distance between gland revolving fragment 101 and gland lower sheeting 102, compression spring 103 sets
Put in the groove between gland revolving fragment 101 and gland lower sheeting 102.
Chip test base 2 includes test bench main body 203, chip positioning frame 201 and four locating dowels 202,
Chip positioning frame 201 is arranged on the upper surface of test bench main body 203, is used for positioning correcting chip 205, four
Locating dowel 202 is arranged on the upper surface of chip positioning frame 201, and the diameter of locating dowel 202 head is more than location
The diameter of post 202 shaft, gland revolving fragment 101 and gland lower sheeting 102 are provided with four and location
Post 202 quantity is consistent and positions hole 106 one to one with it, the hole, location 106 on gland revolving fragment 101
Draw-in groove 107 is formed on curved and its medial wall.
Coordinating by locating dowel 202 and gland revolving fragment 101 between chip gland 1 with chip test base 2
Connecting, then realize location and the installation function of chip gland 1, its concrete connected mode is: locating dowel
202 heads can pass the hole, location 106 on gland lower sheeting 102 and on gland revolving fragment 101, locating dowel
The head of 202 can move along hole 106, location, and the head of locating dowel 202 can be connected on draw-in groove 107.
Wherein, test bench main body 203 is internally provided with spring probe 204；Additionally, gland revolving fragment 101
Rotate by manually or mechanically hand drive.
When automatically testing, first by the position of the locating dowel 202 on video camera reading chip test base, then machine
Tool hands can draw chip 205 to be measured the mobile surface to chip test base 1, chip 205 from charging tray
Freely falling body is in chip test base 1, and chip 205 positions correcting via chip positioning frame 201, it is ensured that core
Sheet 205 and spring probe 204 accurate contraposition in test bench main body 203.Then mechanical hand can grip chip
Gland 1, after calibrating position, mechanical hand drives chip gland 1 to be automatically moved to the surface of chip test base 2,
Starting behind in-position to move to chip test base 2, the gland lower sheeting 102 of chip gland and gland rotate
Hole 106, location on sheet 101 sequentially passes through locating dowel 202 and realizes the location of chip gland.When pressing under gland
After chip 205 is withstood on the chip positioning frame 201 of chip test base 2 by sheet 102, gland lower sheeting 102 stops
Only motion, mechanical hand promotes gland revolving fragment 101 to continue to move down, until on gland revolving fragment 101
Draw-in groove 107 flushes with locating dowel 202 head end.Now, mechanical hand drives gland revolving fragment 101 up time
Pin stops after rotating specified angle.Mechanical hand unclamps, and chip gland 1 hangs in locating dowel 202, by pressure
Power spring 103 and gland lower sheeting 102 implement the pressing to chip 205, whole test fixture arrival work
State, the installment work of a station completes.
Manual test is similar with test automatically, and simply the action of mechanical hand is operated by staff.Meanwhile, gland
Revolving fragment 101 has corresponding locking groove, to control the anglec of rotation of gland revolving fragment 101.
Embodiment of above only for technology of the present utility model design and feature are described, its object is to allow familiar
The people of technique understands content of the present utility model and is carried out, and can not limit this utility model with this
Protection domain, all according to this utility model spirit done equivalence change or modify, all should contain
In protection domain of the present utility model.
Claims (5)
- null1. one kind connects seat for the extensive automatization of chip and manual test，Including chip gland (1) and chip test base (2)，It is characterized in that: described chip gland (1) includes gland revolving fragment (101)、Gland lower sheeting (102) and compression spring (103)，Described gland revolving fragment (101) is arranged on the top of gland lower sheeting (102)，Clamping relatively rotating with gland lower sheeting (102) between described gland revolving fragment (101) and gland lower sheeting (102)，Certain distance is left between described gland revolving fragment (101) and gland lower sheeting (102)，Described compression spring (103) is arranged between gland revolving fragment (101) and gland lower sheeting (102)，The upper surface of described chip test base (2) is provided with many locating dowels (202)，The diameter of described locating dowel (202) head is more than the diameter of locating dowel (202) shaft，Described gland revolving fragment (101) be provided with multiple consistent with locating dowel (202) quantity on gland lower sheeting (102) and position hole (106) with it one to one，Hole, location (106) on described gland revolving fragment (101) is curved and forms draw-in groove (107) on its medial wall，Described locating dowel (202) head can be through the gland lower sheeting (102) hole, location (106) above and on gland revolving fragment (101)，The head of described locating dowel (202) can be mobile along hole, location (106)，And the head of described locating dowel (202) can be connected on draw-in groove (107).
- The most according to claim 1 connect seat for the extensive automatization of chip and manual test, it is characterized in that: the upper surface of described gland lower sheeting (102) is provided with multiple grab (104), the arc connecting hole (108) consistent with grab (104) quantity it is provided with on knob sheet, the card hook and slot (105) coordinated with grab (104) is formed on the medial wall of described arc connecting hole (108), the length of described card hook and slot (105) is more than the width of grab (104), when described gland revolving fragment (101) can relatively rotate with gland lower sheeting (102), described grab (104) can be mobile along card hook and slot (105).
- The most according to claim 1 connect seat for the extensive automatization of chip and manual test, it is characterized in that: described chip test base (2) includes test bench main body (203), chip positioning frame (201), described chip positioning frame (201) is arranged on the upper surface of test bench main body (203), and described many locating dowels (202) are arranged on the upper surface of chip positioning frame (201).
- The most according to claim 3 connect seat for the extensive automatization of chip and manual test, it is characterised in that: described test bench main body (203) is internally provided with spring probe (204).
- 5. according to connecting seat for the extensive automatization of chip and manual test described in any one in claim 1-4, it is characterised in that: the rotation of described gland revolving fragment (101) is by manually or mechanically hand drive.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620440510.5U CN205786695U (en) | 2016-05-16 | 2016-05-16 | Seat is connected for the extensive automatization of chip and manual test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620440510.5U CN205786695U (en) | 2016-05-16 | 2016-05-16 | Seat is connected for the extensive automatization of chip and manual test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205786695U true CN205786695U (en) | 2016-12-07 |
Family
ID=57409823
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620440510.5U Active CN205786695U (en) | 2016-05-16 | 2016-05-16 | Seat is connected for the extensive automatization of chip and manual test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205786695U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114113846A (en) * | 2021-11-23 | 2022-03-01 | 上海创远仪器技术股份有限公司 | System, method, device, processor and computer readable storage medium for realizing automatic test for voltage-controlled oscillator |
-
2016
- 2016-05-16 CN CN201620440510.5U patent/CN205786695U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114113846A (en) * | 2021-11-23 | 2022-03-01 | 上海创远仪器技术股份有限公司 | System, method, device, processor and computer readable storage medium for realizing automatic test for voltage-controlled oscillator |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address | ||
| CP03 | Change of name, title or address |
Address after: Room 103, Building 3, No. 18 Dongchang Road, Suzhou Industrial Park, Suzhou City, Jiangsu Province, 215000 Patentee after: Suzhou Fatedi Technology Co.,Ltd. Country or region after: China Address before: Room 103, Building 3, No. 18 Dongchang Road, Suzhou Industrial Park, Suzhou City, Jiangsu Province, 215000 Patentee before: FTDEVICE TECHNOLOGY (SUZHOU) CO.,LTD. Country or region before: China |