CN114111640A - Sine stripe structured light projection system and working method - Google Patents

Sine stripe structured light projection system and working method Download PDF

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Publication number
CN114111640A
CN114111640A CN202111474841.2A CN202111474841A CN114111640A CN 114111640 A CN114111640 A CN 114111640A CN 202111474841 A CN202111474841 A CN 202111474841A CN 114111640 A CN114111640 A CN 114111640A
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phase
lens
structured light
stripes
sine
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CN114111640B (en
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杨智慧
张韶辉
郝群
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Beijing Institute of Technology BIT
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Beijing Institute of Technology BIT
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254Projection of a pattern, viewing through a pattern, e.g. moiré

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)

Abstract

A sine stripe structured light projection system and a working method solve the problems that the traditional DMD technology adopts binary pulse width modulation to obtain sine stripes, the sine stripes are not suitable for high-speed measurement, the contrast of the sine stripes projected by adopting binary stripes through defocusing is reduced along with the increase of defocusing amount, and meanwhile, the manufacturing cost is greatly reduced. It includes: the device comprises an illumination light source (1), a lens system (2), a micro motor (3), a displacement detector (4) and a phase-shifting reflector (5); the illumination system provides illumination for the sine stripe structured light projection system; the lens system converts parallel light emitted by the illumination light source into divergent light, and the super lens converts the divergent light with uniform distribution characteristics into divergent light with sine stripe characteristics; the phase-shifting reflector regulates and controls the projection and the phase of the sine stripe structured light; the micro motor drives the phase-shifting reflector to rotate; the displacement detector collects displacement data of the phase-shifting mirror.

Description

Sine stripe structured light projection system and working method
Technical Field
The invention relates to the technical field of photoelectric detection, in particular to a sinusoidal stripe structure light projection system and a working method adopted by the sinusoidal stripe structure light projection system.
Background
With the rapid development of high-end manufacturing industry, urgent needs are provided for the automatic measurement of the complex curved surface of a large-scale component, such as the measurement of the full-size profile of an automobile body, the measurement of the profile of a key area of an airplane and the like. The fringe projection profile technology is a typical structured light three-dimensional measurement technology, has the advantages of simple structure, large measurement dynamic range, high precision, high speed and the like, and is a main technical means for detecting the three-dimensional shape of a large-size dynamic target.
At present, fringe projection systems mainly comprise a galvanometer and a digital projector. The galvanometer is small in size, but low in brightness and poor in contrast, so that the measurement precision is low, and a Digital projector based on a Digital Micromirror Device (DMD) technology obtains rapid development by virtue of the advantages of high speed and high resolution, and mainly adopts binary pulse width modulation and binary fringe defocusing projection to realize projection of sine fringes. The former is to decompose a pre-projected gray scale sine stripe into N bit images based on the PWM principle, and form the sine stripe by controlling the integral time; the latter is to form the sine stripe by defocusing the binary stripe image through the lens. The binary pulse width modulation method needs time integration of projection-image, so that the time response speed of the projection system is reduced, and the detection of the three-dimensional shape of a high-speed target is not facilitated. The binary fringe out-of-focus projection is limited by the limited depth of field of the projection imaging lens, and the contrast of the sine fringe is reduced along with the increase of the out-of-focus amount, so that the high-precision acquisition of the axial large-range three-dimensional shape is influenced. In addition, the existing domestic digital projector system is complex and large in size, a core DMD chip mainly depends on import, the cost is high, a new technical approach for realizing positive line stripe structure light projection with high speed, resolution and low cost is urgently required to be searched, and the problem of three-dimensional shape measurement of a large-size and high-speed target is solved.
Disclosure of Invention
In order to overcome the defects of the prior art, the invention provides a light projection system with a sine stripe structure, which solves the problems that the sine stripe obtained by adopting binary pulse width modulation in the traditional DMD technology is not suitable for high-speed measurement, the contrast of the sine stripe projected by adopting binary stripe defocusing is reduced along with the increase of the defocusing amount, and the manufacturing cost is greatly reduced.
The technical scheme of the invention is as follows: such a sinusoidal fringe structured light projection system, comprising: the device comprises an illumination light source (1), a lens system (2), a micro motor (3), a displacement detector (4) and a phase-shifting reflector (5);
the illumination system provides illumination for the sine stripe structured light projection system; the lens system converts parallel light emitted by the illumination light source into divergent light, and the super lens converts the divergent light with uniform distribution characteristics into divergent light with sine stripe characteristics; the phase-shifting reflector regulates and controls the projection and the phase of the sine stripe structured light; the micro motor drives the phase-shifting reflector to rotate; the displacement detector collects displacement data of the phase-shifting mirror.
The invention adopts the super lens to convert the uniformly distributed characteristic divergent light into the divergent light with the sine stripe characteristic, has high response speed and large depth of field compared with a projection device based on the DMD, and does not depend on a complex control program, thereby ensuring the measurement precision; the phase adjustment of the sine stripes is realized by adopting a micro motor to control a phase-shifting reflector, and the function which can be completed by a complex electronic system can be realized only by mechanical control, so that the volume and the complexity of the system are greatly simplified, the cost is reduced, and the localization of the structured light projection system is promoted; therefore, the problem that the traditional DMD technology adopts binary pulse width modulation to obtain the sine stripes, which is not suitable for high-speed measurement, and adopts the binary stripes to perform defocusing projection to reduce the contrast of the sine stripes along with the increase of the defocusing amount is solved, and meanwhile, the manufacturing cost is greatly reduced.
Also provided is a method of operating a sinusoidal fringe structured light projection system, comprising the steps of:
(1) the illumination light source emits light rays which are changed into divergent light after passing through the lens system, the super surface of the lens system simultaneously converts the light rays into stripes with sine characteristics, the stripes are projected onto the phase-shifting reflector, and the stripes are irradiated onto the surface of a measured target through the phase-shifting reflector;
(2) when the sinusoidal stripes are subjected to phase shifting treatment, the micro motor controls the phase shifting reflector to rotate for certain displacement, and the movement precision is fed back by the displacement detector, so that the phase of the sinusoidal stripes projected on the surface of the measured target is accurately changed within a certain range.
Drawings
FIG. 1 is a schematic diagram of a sinusoidal fringe structured light projection system in accordance with the present invention.
Fig. 2 is a schematic view of the structure of a lens system according to the present invention.
FIG. 3 is a flow chart of a method of operation of a sinusoidal fringe structured light projection system in accordance with the present invention.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the term "comprises/comprising" and any variations thereof in the description and claims of the present invention and the above-described drawings is intended to cover non-exclusive inclusions, such that a process, method, apparatus, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
As shown in fig. 1, the light projection system with the sinusoidal stripe structure includes: the device comprises an illumination light source 1, a lens system 2, a micro motor 3, a displacement detector 4 and a phase-shifting reflector 5;
the illumination system provides illumination for the sine stripe structured light projection system; the lens system converts parallel light emitted by the illumination light source into divergent light, and the super lens converts the divergent light with uniform distribution characteristics into divergent light with sine stripe characteristics; the phase-shifting reflector regulates and controls the projection and the phase of the sine stripe structured light; the micro motor drives the phase-shifting reflector to rotate; the displacement detector collects displacement data of the phase-shifting mirror.
The invention adopts the super lens to convert the uniformly distributed characteristic divergent light into the divergent light with the sine stripe characteristic, has high response speed and large depth of field compared with a projection device based on the DMD, and does not depend on a complex control program, thereby ensuring the measurement precision; the phase adjustment of the sine stripes is realized by adopting a micro motor to control a phase-shifting reflector, and the function which can be completed by a complex electronic system can be realized only by mechanical control, so that the volume and the complexity of the system are greatly simplified, the cost is reduced, and the localization of the structured light projection system is promoted; therefore, the problem that the traditional DMD technology adopts binary pulse width modulation to obtain the sine stripes, which is not suitable for high-speed measurement, and adopts the binary stripes to perform defocusing projection to reduce the contrast of the sine stripes along with the increase of the defocusing amount is solved, and meanwhile, the manufacturing cost is greatly reduced.
Preferably, the illumination system employs an LED illumination source.
Preferably, as shown in fig. 2, the lens system includes a first lens 21, a second lens 22, a third lens 23, and a super lens 24 in sequence along the light exit direction of the light source, wherein the first lens, the third lens, and the super lens have positive powers, the second lens has negative powers, and the super lens is designed and processed on a super surface of the lens surface.
Preferably, the micro motor adopts a stepping belt reduction gearbox motor GM 18168-01.
Preferably, the displacement detector employs a MTE-40 grating detector with a resolution up to 0.5 um.
As shown in fig. 3, there is also provided a method of operating a sinusoidal fringe structured light projection system, comprising the steps of:
(1) the illumination light source emits light rays which are changed into divergent light after passing through the lens system, the super surface of the lens system simultaneously converts the light rays into stripes with sine characteristics, the stripes are projected onto the phase-shifting reflector, and the stripes are irradiated onto the surface of a measured target through the phase-shifting reflector;
(2) when the sinusoidal stripes are subjected to phase shifting treatment, the micro motor controls the phase shifting reflector to rotate for certain displacement, and the movement precision is fed back by the displacement detector, so that the phase of the sinusoidal stripes projected on the surface of the measured target is accurately changed within a certain range.
Preferably, in the step (2), the micro motor rotates by a certain step distance, the phase-shifting mirror rotates by a certain displacement X at the same time, and an error of the displacement X is compensated by the displacement detector, so that a sinusoidal fringe projected by the projection system completes phase shift, and the sinusoidal fringe is used for acquiring three-dimensional data of the target by the structured light three-dimensional measurement system.
The above description is only a preferred embodiment of the present invention, and is not intended to limit the present invention in any way, and all simple modifications, equivalent variations and modifications made to the above embodiment according to the technical spirit of the present invention still belong to the protection scope of the technical solution of the present invention.

Claims (7)

1. A sinusoidal fringe structured light projection system characterized by: it includes: the device comprises an illumination light source (1), a lens system (2), a micro motor (3), a displacement detector (4) and a phase-shifting reflector (5); the illumination system provides illumination for the sine stripe structured light projection system; the lens system converts parallel light emitted by the illumination light source into divergent light, and the super lens converts the divergent light with uniform distribution characteristics into divergent light with sine stripe characteristics; the phase-shifting reflector regulates and controls the projection and the phase of the sine stripe structured light; the micro motor drives the phase-shifting reflector to rotate; the displacement detector collects displacement data of the phase-shifting mirror.
2. The sinusoidal fringe structured light projection system of claim 1, wherein: the lighting system adopts an LED lighting source.
3. The sinusoidal fringe structured light projection system of claim 2, wherein: the lens system is sequentially provided with a first lens (21), a second lens (22), a third lens (23) and a super lens (24) along the light source light emergent direction, wherein the first lens, the third lens and the super lens have positive focal power, the second lens has negative focal power, and the super lens is designed and processed on the super surface of the lens.
4. The sinusoidal fringe structured light projection system of claim 3, wherein: the micro motor adopts a motor GM18168-01 with a stepping reduction gearbox.
5. The sinusoidal fringe structured light projection system of claim 4, wherein: the displacement detector employs an MTE-40 grating detector with a resolution up to 0.5 um.
6. The method of operating a sinusoidal fringe structured light projection system as claimed in any one of claims 1-5 wherein: which comprises the following steps:
(1) the illumination light source emits light rays which are changed into divergent light after passing through the lens system, the super surface of the lens system simultaneously converts the light rays into stripes with sine characteristics, the stripes are projected onto the phase-shifting reflector, and the stripes are irradiated onto the surface of a measured target through the phase-shifting reflector;
(2) when the sinusoidal stripes are subjected to phase shifting treatment, the micro motor controls the phase shifting reflector to rotate for certain displacement, and the movement precision is fed back by the displacement detector, so that the phase of the sinusoidal stripes projected on the surface of the measured target is accurately changed within a certain range.
7. The method of operating a sinusoidal fringe structured light projection system as claimed in claim 6 wherein: in the step (2), the micro motor rotates by a certain step distance, the phase-shifting reflector simultaneously rotates by a certain displacement X, the error of the displacement X is compensated by the displacement detector, and the sinusoidal stripes projected by the projection system complete phase shift so as to be used for acquiring target three-dimensional data by the structured light three-dimensional measurement system.
CN202111474841.2A 2021-12-03 2021-12-03 Sinusoidal stripe structured light projection system and working method Active CN114111640B (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023202101A1 (en) * 2022-04-21 2023-10-26 Yixin Xu A stroboscopic multiple fringe pattern modulation device based on incoherent light source

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20090022819A (en) * 2007-08-31 2009-03-04 에스엔유 프리시젼 주식회사 A three dimensional object measurement equipment use lcd
CN205718873U (en) * 2016-04-22 2016-11-23 华南师范大学 A kind of double frequency phase shift tripleplane measuring instrument
CN205718875U (en) * 2016-06-28 2016-11-23 西安励德微系统科技有限公司 A kind of scan-type structure light projection system
CN206369893U (en) * 2016-12-01 2017-08-01 广西师范大学 A kind of fringe projection camera lens for three-dimensional measurement
US20190137665A1 (en) * 2017-11-08 2019-05-09 Samsung Electronics Co., Ltd. Projector including meta-lens
CN112505057A (en) * 2020-12-08 2021-03-16 广西师范大学 Rolling surface defect detection system and method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20090022819A (en) * 2007-08-31 2009-03-04 에스엔유 프리시젼 주식회사 A three dimensional object measurement equipment use lcd
CN205718873U (en) * 2016-04-22 2016-11-23 华南师范大学 A kind of double frequency phase shift tripleplane measuring instrument
CN205718875U (en) * 2016-06-28 2016-11-23 西安励德微系统科技有限公司 A kind of scan-type structure light projection system
CN206369893U (en) * 2016-12-01 2017-08-01 广西师范大学 A kind of fringe projection camera lens for three-dimensional measurement
US20190137665A1 (en) * 2017-11-08 2019-05-09 Samsung Electronics Co., Ltd. Projector including meta-lens
CN112505057A (en) * 2020-12-08 2021-03-16 广西师范大学 Rolling surface defect detection system and method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
叶红: "第1.2.2节 干涉光场调控技术" *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023202101A1 (en) * 2022-04-21 2023-10-26 Yixin Xu A stroboscopic multiple fringe pattern modulation device based on incoherent light source

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