CN114094575B - Voltage sag tolerance level analysis method and system for sensitive equipment - Google Patents
Voltage sag tolerance level analysis method and system for sensitive equipment Download PDFInfo
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- CN114094575B CN114094575B CN202111383140.8A CN202111383140A CN114094575B CN 114094575 B CN114094575 B CN 114094575B CN 202111383140 A CN202111383140 A CN 202111383140A CN 114094575 B CN114094575 B CN 114094575B
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- 238000000034 method Methods 0.000 claims description 14
- 230000036541 health Effects 0.000 description 6
- 238000012423 maintenance Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 230000002035 prolonged effect Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J3/00—Circuit arrangements for ac mains or ac distribution networks
- H02J3/001—Methods to deal with contingencies, e.g. abnormalities, faults or failures
- H02J3/00125—Transmission line or load transient problems, e.g. overvoltage, resonance or self-excitation of inductive loads
Abstract
The invention relates to a voltage sag tolerance level analysis method and system of sensitive equipment, which respectively and independently consider the voltage sag problem of the sensitive equipment on an uncertain region as the joint distribution of three factors of voltage amplitude, duration and current self-health state of the voltage sag, respectively form independent failure probability functions of the voltage amplitude, the duration and the current self-health state of the voltage sag, evaluate the failure condition of the sensitive equipment by solving the joint distribution probability, and solve the technical problem that the influence of the voltage sag on the sensitive equipment is difficult to evaluate in the voltage sag tolerance level analysis of the current sensitive equipment.
Description
Technical Field
The invention relates to the technical field of power grids, in particular to a voltage sag tolerance level analysis method and system of sensitive equipment.
Background
The voltage sag brings huge economic loss to sensitive equipment users, and the complaints caused by the voltage sag account for 80% of the complaints of the electric energy quality problem according to statistics. Therefore, it is extremely important to effectively evaluate the tolerance level of sensitive devices to voltage sags. In order to evaluate the voltage sag tolerance level of the sensitive device, the voltage sag tolerance curve of the device is generally used for evaluation, and from the view point of the voltage tolerance curve, the voltage sag tolerance curve can be divided into an operation area, a failure area and an uncertainty area, as shown in fig. 1, in which the influence of the voltage sag on the device is difficult to evaluate, in other words, the voltage sag is likely to fail, and the voltage sag is likely to operate normally, so that the evaluation and the management of the voltage sag are very unfavorable; the existing voltage sag tolerance curve is characterized by using the voltage amplitude and the duration of the voltage sag, and the occurrence of an uncertainty region indicates that the response of the sensitive device to the voltage sag is also related to other factors.
Disclosure of Invention
The invention aims to provide a voltage sag tolerance level analysis method and system of sensitive equipment, which are used for solving the technical problem that an uncertain area is difficult to evaluate the influence of voltage sag on the sensitive equipment in the voltage sag tolerance level analysis of the existing sensitive equipment.
The embodiment of the invention provides a voltage sag tolerance level analysis method of sensitive equipment, which comprises the following steps:
step S1, acquiring voltage tolerance curve parameters of sensitive equipment, wherein the parameters comprise T max 、T min 、U max 、U min The method comprises the steps of carrying out a first treatment on the surface of the Wherein T is max T, the maximum value of tolerance of sensitive equipment to voltage sag duration min Tolerance of voltage sag duration for sensitive devicesMinimum value of degree, U max U is the upper voltage limit of the tolerance curve of the sensitive equipment min A lower voltage limit for a tolerance curve of the sensitive device;
step S2, when the sensitive equipment senses voltage sag, acquiring a voltage sag amplitude U and duration time T, and judging failure probability according to the tolerance curve parameter, the voltage sag amplitude U and the duration time T; when in the operation region, the failure probability P is 0; when the device is in the failure zone, the failure probability P is 1; when in the uncertainty region, go to step S3;
step S3, respectively calculating influence probability P1 of the failure of the sensitive equipment caused by the duration time of the voltage sag, influence probability P2 of the failure of the sensitive equipment caused by the voltage amplitude of the voltage sag and influence probability P3 of the failure of the sensitive equipment caused by the condition of the equipment, and calculating failure probability P according to the influence probability P1, the influence probability P1 and the influence probability P1;
and S4, judging that the sensitive equipment fails when the failure probability P is larger than a preset threshold value, and judging that the sensitive equipment does not fail when the failure probability P is smaller than or equal to the preset threshold value.
Preferably, the calculation considers the probability of impact P1 of the duration of the voltage dip on the failure of the sensitive device, in particular as follows:
preferably, the probability of influence P2 of the voltage amplitude of the voltage dip on the failure of the sensitive device is considered, specifically as follows:
preferably, the influence probability P3 of the sensitive device failure caused by the considered device condition is specifically as follows:
L real ＝L(1+γ)
wherein L is the operation period of the sensitive equipment, L real For the actual effective operational life, L is the operational life estimated by the manufacturer when leaving the factory, gamma is a preset coefficient, gamma<0。
Preferably, the calculating the failure probability P according to the influence probability P1, the influence probability P1 and the influence probability P1 is specifically as follows:
P＝P 1 *P 2 *P 3 。
preferably, the preset threshold is 0.6.
The embodiment of the invention also provides a voltage sag tolerance level analysis system of the sensitive equipment, which is used for realizing the method, and comprises the following steps:
a parameter acquisition unit for acquiring voltage tolerance curve parameters of the sensitive equipment, wherein the parameters comprise T max 、T min 、U max 、U min The method comprises the steps of carrying out a first treatment on the surface of the Wherein T is max T, the maximum value of tolerance of sensitive equipment to voltage sag duration min U, which is the minimum value of tolerance of sensitive equipment to voltage sag duration max U is the upper voltage limit of the tolerance curve of the sensitive equipment min A lower voltage limit for a tolerance curve of the sensitive device;
the first judging unit is used for acquiring a voltage sag amplitude value U and a duration time T when the sensitive equipment senses the voltage sag, and judging the failure probability of the sensitive equipment according to the tolerance curve parameter, the voltage sag amplitude value U and the duration time T; when in the operation region, the failure probability P is 0; when the device is in the failure zone, the failure probability P is 1; generating a calculation instruction when the area is in the uncertain region;
the failure probability calculation unit is used for receiving the calculation instruction, respectively calculating the influence probability P1 of the failure of the sensitive equipment caused by the duration time of the voltage sag, the influence probability P2 of the failure of the sensitive equipment caused by the voltage amplitude value of the voltage sag and the influence probability P3 of the failure of the sensitive equipment caused by the equipment condition when receiving the calculation instruction, and calculating the failure probability P according to the influence probability P1, the influence probability P1 and the influence probability P1; and
and the second judging unit is used for judging that the sensitive equipment fails when the failure probability P is larger than a preset threshold value, and judging that the sensitive equipment does not fail when the failure probability P is smaller than or equal to the preset threshold value.
The embodiment of the invention has the following beneficial effects:
according to the embodiment of the invention, the problem of voltage sag distributed in an uncertain region by the sensitive equipment is respectively and independently considered as the joint distribution of three factors including the voltage amplitude of the voltage sag, the duration of the voltage sag and the current self-health state, so that independent failure probability functions of the voltage amplitude of the voltage sag, the duration of the voltage sag and the current self-health state are respectively formed, and the failure condition of the sensitive equipment is evaluated by solving the joint distribution probability.
Additional features and advantages of embodiments of the invention will be set forth in the description which follows.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a voltage tolerance curve of a sensing device according to an embodiment of the present invention.
Fig. 2 is a flowchart of a voltage sag tolerance level analysis method of a sensitive device according to an embodiment of the present invention.
Fig. 3 is a block diagram of a voltage sag tolerance level analysis system for a sensitive device according to an embodiment of the present invention.
Detailed Description
Various exemplary embodiments, features and aspects of the disclosure will be described in detail below with reference to the drawings. In addition, numerous specific details are set forth in the following examples in order to provide a better illustration of the invention. It will be understood by those skilled in the art that the present invention may be practiced without some of these specific details. In some instances, well known means have not been described in detail in order to not obscure the present invention.
Referring to fig. 2, an embodiment of the present invention provides a method for analyzing voltage sag tolerance level of a sensitive device, including the following steps:
step S1, acquiring voltage tolerance curve parameters of sensitive equipment, wherein the parameters comprise T max 、T min 、U max 、U min The method comprises the steps of carrying out a first treatment on the surface of the Wherein T is max For maximum and minimum tolerance of sensitive device to voltage sag duration, for minimum tolerance of sensitive device to voltage sag duration, U max U is the upper voltage limit of the tolerance curve of the sensitive equipment min A lower voltage limit for a tolerance curve of the sensitive device;
step S2, when the sensitive equipment senses voltage sag, acquiring a voltage sag amplitude U and duration time T, and judging failure probability according to the tolerance curve parameter, the voltage sag amplitude U and the duration time T; when in the operation region, the failure probability P is 0; when the device is in the failure zone, the failure probability P is 1; when in the uncertainty region, go to step S3;
step S3, respectively calculating influence probability P1 of the failure of the sensitive equipment caused by the duration time of the voltage sag, influence probability P2 of the failure of the sensitive equipment caused by the voltage amplitude of the voltage sag and influence probability P3 of the failure of the sensitive equipment caused by the condition of the equipment, and calculating failure probability P according to the influence probability P1, the influence probability P1 and the influence probability P1;
the probability of influence P2 of the voltage amplitude of the considered voltage sag on the failure of the sensitive equipment is specifically as follows:
wherein, the influence probability P3 of the sensitive equipment failure caused by the considered equipment condition is specifically as follows:
L real ＝L(1+γ)
wherein L is the operation period of the sensitive equipment, L real For the actual effective operational life, L is the operational life estimated by the manufacturer when leaving the factory, gamma is a preset coefficient, gamma<0。
Wherein, the failure probability P is calculated according to the influence probability P1, the influence probability P1 and the influence probability P1, and is specifically as follows:
P＝P 1 *P 2 *P 3 。
and S4, judging that the sensitive equipment fails when the failure probability P is larger than a preset threshold value, and judging that the sensitive equipment does not fail when the failure probability P is smaller than or equal to the preset threshold value.
Preferably, the preset threshold is 0.6.
Specifically, in the embodiment of the invention, the energy function for evaluating the voltage sag of the sensitive device is expressed as (1):
in formula (1), E is energy, T is duration of voltage sag, U max Is the upper voltage limit of the tolerance curve of the device, and U is the voltage dip voltage amplitude.
Considering that the occurrence of voltage sag in an uncertain region is random, the amplitude and duration of the voltage sag can be considered to be irrelevant, so in the embodiment of the invention, the duration of the voltage sag and the probability of influence of the voltage amplitude on the failure of sensitive equipment are considered to be formula (2) and formula (3):
in the formula (2) and the formula (3), P 1 、P 2 The duration and the voltage amplitude of the voltage sag respectively cause the failure probability of the voltage sag independently, T max 、T min Maximum and minimum tolerance of sensitive equipment to voltage sag duration, U min Is the lower voltage limit of the device tolerance curve.
It will be appreciated that the ability of the sensitive device to withstand voltage sags is related to the current state of health itself, the better the state of health the higher the withstand ability and vice versa. Two factors are considered in assessing the health condition of sensitive equipment, one is the operation period, and the other is the operation level; this is similar to the human case, age and medical conditions can affect keeping your health; the allowable operation period of the sensitive equipment is assumed to be L years, namely the equipment can be operated for L years under the condition that the influence of operation and maintenance factors is not considered; the effective operation period of the sensitive equipment can be prolonged through effective operation and maintenance, namely, the effective operation period is shown as a formula (4)
L real ＝L(1+γ) (4)
In formula (4), L real For the actual effective operational life, L is the operational life estimated by the manufacturer at the time of shipment, and γ is the operational dimension influencing factor. Regarding operation and maintenance influence factors, considering that effective operation and maintenance bring positive influence, the health condition of equipment can be improved, the service life of the equipment can be prolonged, equipment failure has negative influence on the equipment, performance of the equipment is reduced, and the service life of the equipment is shortened. Valuing and effective operation and maintenance gamma 1 Gamma related to equipment failure event 2 Efficient operation and maintenance of equipment [0,1 ]]Some value, the device happensThe fault event takes [ -1,0]A certain value, gamma 1 、γ 2 The specific values of (2) may be given according to the specific conditions of different sensitive devices.
γ＝γ 1 +γ 2 (5)
The device health is not directly related to the duration of the voltage dip and the voltage amplitude and is therefore considered independent of the voltage dip.
Where P3 is the probability that the device condition results in a failure of the sensitive device and l is the operational life.
Based on the above, the joint probability of failure of the sensitive device in the uncertain region is:
P＝P 1 *P 2 *P 3 (7)
after the formula (2), the formula (3), the formula (4), the formula (5) and the formula (6) are used for being brought in, the failure probability of the sensitive equipment in an uncertain region is as follows:
preferably, the calculation considers the probability of impact P1 of the duration of the voltage dip on the failure of the sensitive device, in particular as follows:
according to the embodiment of the invention, the problem of voltage sag distributed in an uncertain region by the sensitive equipment is respectively and independently considered as the joint distribution of three factors including the voltage amplitude of the voltage sag, the duration of the voltage sag and the current self-health state, so that independent failure probability functions of the voltage amplitude of the voltage sag, the duration of the voltage sag and the current self-health state are respectively formed, and the failure condition of the sensitive equipment is evaluated by solving the joint distribution probability.
Referring to fig. 3, another embodiment of the present invention further provides a system for analyzing voltage sag tolerance level of a sensitive device, for implementing the method described in the foregoing embodiment, where the system according to the embodiment of the present invention includes:
a parameter acquisition unit 1 for acquiring voltage tolerance curve parameters of the sensitive equipment, wherein the parameters comprise T max 、T min 、U max 、U min The method comprises the steps of carrying out a first treatment on the surface of the Wherein T is max For maximum and minimum tolerance of sensitive device to voltage sag duration, for minimum tolerance of sensitive device to voltage sag duration, U max U is the upper voltage limit of the tolerance curve of the sensitive equipment min A lower voltage limit for a tolerance curve of the sensitive device;
the first judging unit 2 is used for acquiring a voltage sag amplitude value U and a duration time T when the sensitive equipment senses the voltage sag, and judging the failure probability of the sensitive equipment according to the tolerance curve parameter, the voltage sag amplitude value U and the duration time T; when in the operation region, the failure probability P is 0; when the device is in the failure zone, the failure probability P is 1; generating a calculation instruction when the area is in the uncertain region;
the failure probability calculation unit 3 is configured to receive the calculation instruction, and when receiving the calculation instruction, calculate an influence probability P1 that the duration of the voltage dip causes the failure of the sensitive device, an influence probability P2 that the voltage amplitude of the voltage dip causes the failure of the sensitive device, and an influence probability P3 that the condition of the device causes the failure of the sensitive device, respectively, and calculate a failure probability P according to the influence probability P1, and the influence probability P1; and
and the second judging unit 4 is used for judging that the sensitive equipment fails when the failure probability P is larger than a preset threshold value, and judging that the sensitive equipment does not fail when the failure probability P is smaller than or equal to the preset threshold value.
The system of the present embodiment corresponds to the method of the foregoing embodiment, and therefore, a portion of the system of the present embodiment that is not described in detail may be obtained by referring to the method portion of the foregoing embodiment, which is not described herein again.
The foregoing description of embodiments of the invention has been presented for purposes of illustration and description, and is not intended to be exhaustive or limited to the embodiments disclosed. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the various embodiments described. The terminology used herein was chosen in order to best explain the principles of the embodiments, the practical application, or the technical improvements in the marketplace, or to enable others of ordinary skill in the art to understand the embodiments disclosed herein.
Claims (3)
1. A method for analyzing voltage sag tolerance level of sensitive equipment, comprising the steps of:
step S1, acquiring voltage tolerance curve parameters of sensitive equipment, wherein the parameters comprise T max 、T min 、U max 、U min The method comprises the steps of carrying out a first treatment on the surface of the Wherein T is max T, the maximum value of tolerance of sensitive equipment to voltage sag duration min U, which is the minimum value of tolerance of sensitive equipment to voltage sag duration max U is the upper voltage limit of the tolerance curve of the sensitive equipment min A lower voltage limit for a tolerance curve of the sensitive device;
step S2, when the sensitive equipment senses voltage sag, acquiring a voltage sag amplitude U and duration time T, and judging failure probability according to the tolerance curve parameter, the voltage sag amplitude U and the duration time T; when in the operation region, the failure probability P is 0; when the device is in the failure zone, the failure probability P is 1; when in the uncertainty region, go to step S3;
step S3, respectively calculating influence probability P1 of the failure of the sensitive equipment caused by the duration time of the voltage sag, influence probability P2 of the failure of the sensitive equipment caused by the voltage amplitude of the voltage sag and influence probability P3 of the failure of the sensitive equipment caused by the condition of the equipment, and calculating failure probability P according to the influence probability P1, the influence probability P2 and the influence probability P3;
wherein,L real l (1+γ), L is the operational age of the sensitive device, L real For the actual effective operational life, L is the operational life estimated by the manufacturer when leaving the factory, gamma is a preset coefficient, gamma<0，P＝P 1 *P 2 *P 3 ；
And S4, judging that the sensitive equipment fails when the failure probability P is larger than a preset threshold value, and judging that the sensitive equipment does not fail when the failure probability P is smaller than or equal to the preset threshold value.
2. The method of claim 1, wherein the preset threshold is 0.6.
3. A voltage sag tolerance level analysis system for a sensitive device, for implementing the method of claim 1 or 2, the system comprising:
a parameter acquisition unit for acquiring voltage tolerance curve parameters of the sensitive equipment, wherein the parameters comprise T max 、T min 、U max 、U min The method comprises the steps of carrying out a first treatment on the surface of the Wherein T is max T, the maximum value of tolerance of sensitive equipment to voltage sag duration min U, which is the minimum value of tolerance of sensitive equipment to voltage sag duration max U is the upper voltage limit of the tolerance curve of the sensitive equipment min A lower voltage limit for a tolerance curve of the sensitive device;
the first judging unit is used for acquiring a voltage sag amplitude value U and a duration time T when the sensitive equipment senses the voltage sag, and judging the failure probability of the sensitive equipment according to the tolerance curve parameter, the voltage sag amplitude value U and the duration time T; when in the operation region, the failure probability P is 0; when the device is in the failure zone, the failure probability P is 1; generating a calculation instruction when the area is in the uncertain region;
the failure probability calculation unit is used for receiving the calculation instruction, respectively calculating the influence probability P1 of the failure of the sensitive equipment caused by the duration time of the voltage sag, the influence probability P2 of the failure of the sensitive equipment caused by the voltage amplitude value of the voltage sag and the influence probability P3 of the failure of the sensitive equipment caused by the equipment condition when receiving the calculation instruction, and calculating the failure probability P according to the influence probability P1, the influence probability P2 and the influence probability P3; and
the second judging unit is used for judging that the sensitive equipment fails when the failure probability P is larger than a preset threshold value, and judging that the sensitive equipment does not fail when the failure probability P is smaller than or equal to the preset threshold value;
wherein,L real l (1+γ), L is the operational age of the sensitive device, L real For the actual effective operational life, L is the operational life estimated by the manufacturer when leaving the factory, gamma is a preset coefficient, gamma<0，
P＝P 1 *P 2 *P 3 。
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| CN102901895A (en) * | 2012-09-29 | 2013-01-30 | 上海市电力公司 | Method for evaluating voltage dip sensitivity of sensitive equipment |
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| CN108919003A (en) * | 2018-07-06 | 2018-11-30 | 华北电力大学 | A kind of test of sensitive equipment voltage dip resistance characteristics and data processing method |
| CN110658409A (en) * | 2019-10-15 | 2020-01-07 | 深圳供电局有限公司 | Sensitive equipment voltage sag fault level evaluation method, computer equipment and storage medium |
| CN110780128A (en) * | 2019-08-16 | 2020-02-11 | 广东电网有限责任公司 | Sensitive equipment voltage sag fault probability evaluation method |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US20150094975A1 (en) * | 2013-10-01 | 2015-04-02 | King Fahd University Of Petroleum And Minerals | Wavelet transform system and method for voltage events detection and classification |
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Patent Citations (5)
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|---|---|---|---|---|
| CN102901895A (en) * | 2012-09-29 | 2013-01-30 | 上海市电力公司 | Method for evaluating voltage dip sensitivity of sensitive equipment |
| CN103777096A (en) * | 2014-01-17 | 2014-05-07 | 华北电力大学 | Sensitive device immunity estimation method based on multiple sag threshold values and duration time |
| CN108919003A (en) * | 2018-07-06 | 2018-11-30 | 华北电力大学 | A kind of test of sensitive equipment voltage dip resistance characteristics and data processing method |
| CN110780128A (en) * | 2019-08-16 | 2020-02-11 | 广东电网有限责任公司 | Sensitive equipment voltage sag fault probability evaluation method |
| CN110658409A (en) * | 2019-10-15 | 2020-01-07 | 深圳供电局有限公司 | Sensitive equipment voltage sag fault level evaluation method, computer equipment and storage medium |
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