CN114094575A - Voltage sag tolerance level analysis method and system for sensitive equipment - Google Patents
Voltage sag tolerance level analysis method and system for sensitive equipment Download PDFInfo
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J3/00—Circuit arrangements for ac mains or ac distribution networks
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- H02J3/00125—Transmission line or load transient problems, e.g. overvoltage, resonance or self-excitation of inductive loads
Abstract
The invention relates to a voltage sag tolerance level analysis method and system of sensitive equipment, wherein the voltage sag problem of the sensitive equipment distributed in an uncertain area is respectively and independently considered as the joint distribution of three factors of voltage amplitude of voltage sag, voltage sag duration and current self health state, the voltage amplitude of voltage sag, the voltage sag duration and the current self health state independent failure probability function are respectively formed, the failure condition of the sensitive equipment is evaluated by solving the joint distribution probability, and the technical problem that the influence of voltage sag on the sensitive equipment is difficult to evaluate in the uncertain area in the voltage sag tolerance level analysis of the current sensitive equipment is solved.
Description
Technical Field
The invention relates to the technical field of power grids, in particular to a voltage sag tolerance level analysis method and system for sensitive equipment.
Background
The voltage sag brings huge economic loss to sensitive equipment users, and complaints caused by the voltage sag account for 80% of complaints of power quality problems according to statistics. Therefore, it is very important to effectively evaluate the tolerance level of sensitive devices to voltage sags. In order to evaluate the voltage sag tolerance level of a sensitive device, a device voltage tolerance curve is generally used for evaluation, and from the view point of the voltage tolerance curve, the voltage sag tolerance curve can be divided into an operation area, a failure area and an uncertain area, as shown in fig. 1, the influence of the voltage sag on the device is difficult to evaluate in the uncertain area, in other words, the device may fail, and may also operate normally, so that the voltage sag evaluation and management are very unfavorable; the existing voltage sag tolerance curve is characterized by using the voltage amplitude and the duration of the voltage sag, and the occurrence of an uncertain region indicates that the response of sensitive equipment to the voltage sag is also related to other factors.
Disclosure of Invention
The invention aims to provide a voltage sag tolerance level analysis method and system for sensitive equipment, and aims to solve the technical problem that in the current voltage sag tolerance level analysis of the sensitive equipment, an uncertain region is difficult to evaluate the influence of voltage sag on the sensitive equipment.
The embodiment of the invention provides a voltage sag tolerance level analysis method of sensitive equipment, which comprises the following steps:
step S1, obtaining voltage tolerance curve parameters of the sensitive equipment, wherein the parameters comprise Tmax、Tmin、Umax、Umin(ii) a Wherein, TmaxThe maximum and minimum values of the tolerance of the sensitive device to the voltage sag duration, the minimum value of the tolerance of the sensitive device to the voltage sag duration, UmaxUpper voltage limit, U, of tolerance curve of sensitive equipmentminThe lower voltage limit of the tolerance curve of the sensitive equipment is shown;
step S2, when the sensitive equipment senses the voltage sag, obtaining the voltage sag amplitude U and the duration T, and judging the failure probability according to the tolerance curve parameter, the voltage sag amplitude U and the duration T; when the running area is in the running area, the failure probability P is 0; when the device is in the failure area, the failure probability P is 1; when the determination area is in the indeterminate region, the flow proceeds to step S3;
step S3, respectively calculating an influence probability P1 considering the failure of the sensitive equipment caused by the duration time of the voltage sag, an influence probability P2 considering the failure of the sensitive equipment caused by the voltage amplitude of the voltage sag, and an influence probability P3 considering the failure of the sensitive equipment caused by the equipment condition, and calculating a failure probability P according to the influence probabilities P1, P1 and P1;
and step S4, when the failure probability P is larger than a preset threshold value, judging that the sensitive equipment fails, and when the failure probability P is larger than the preset threshold value, judging that the sensitive equipment does not fail.
Preferably, the calculation takes into account the probability of influence P1 of the duration of the voltage sag on the failure of the sensitive device, as follows:
preferably, the probability P2 of the influence of the voltage amplitude considering the voltage sag on the failure of the sensitive device is as follows:
preferably, the probability of influence P3 of the device condition causing the failure of the sensitive device is considered, specifically as follows:
Lreal＝L(1+γ)
wherein L is the operating life of the sensitive equipment, LrealFor the actual effective operational life, L is the operational life estimated by the manufacturer at the time of delivery, gamma is a predetermined coefficient, gamma is<0。
Preferably, the failure probability P is calculated according to the influence probability P1, the influence probability P1 and the influence probability P1, specifically as follows:
P＝P1*P2*P3。
preferably, the preset threshold is 0.6.
The embodiment of the present invention further provides a voltage sag tolerance level analysis system of a sensitive device, which is used for implementing the above method, and the system includes:
a parameter obtaining unit, configured to obtain a voltage tolerance curve parameter of the sensitive device, where the parameter includes Tmax、Tmin、Umax、Umin(ii) a Wherein, TmaxThe maximum and minimum values of the tolerance of the sensitive device to the voltage sag duration, the minimum value of the tolerance of the sensitive device to the voltage sag duration, UmaxUpper voltage limit for tolerance curve of sensitive equipment，UminThe lower voltage limit of the tolerance curve of the sensitive equipment is shown;
the first judgment unit is used for acquiring a voltage sag amplitude U and duration T when the sensitive equipment senses voltage sag, and judging the failure probability of the sensitive equipment according to the tolerance curve parameter, the voltage sag amplitude U and the duration T; when the running area is in the running area, the failure probability P is 0; when the device is in the failure area, the failure probability P is 1; when the mobile terminal is in the uncertain zone, generating a calculation instruction;
a failure probability calculation unit, configured to receive the calculation instruction, and when it receives the calculation instruction, respectively calculate an influence probability P1 of considering that the duration of the voltage sag causes failure of the sensitive device, an influence probability P2 of considering that the voltage amplitude of the voltage sag causes failure of the sensitive device, and an influence probability P3 of considering that the device condition causes failure of the sensitive device, and calculate a failure probability P according to the influence probabilities P1, P1, and P1; and
and the second judging unit is used for judging that the sensitive equipment fails when the failure probability P is greater than a preset threshold value, and judging that the sensitive equipment does not fail when the failure probability P is greater than the preset threshold value.
The embodiment of the invention has the following beneficial effects:
the embodiment of the invention respectively and independently considers the voltage sag problem of the sensitive equipment distributed in the uncertain area as the combined distribution of three factors of the voltage amplitude of the voltage sag, the duration of the voltage sag and the current self health state, respectively forms the voltage amplitude of the voltage sag, the duration of the voltage sag and the independent failure probability function of the current self health state, evaluates the failure condition of the sensitive equipment by obtaining the combined distribution probability, constructs the failure condition of the sensitive equipment suffering from the voltage sag based on the three factors of the voltage amplitude of the voltage sag, the duration of the voltage sag and the current self health state, fills the vacancy of judgment of the uncertain area, provides a practical technology for the voltage sag influence analysis and treatment measure formulation of the sensitive equipment, and solves the problem that the voltage sag tolerance level of the current sensitive equipment is analyzed, the uncertain region has difficulty in evaluating the technical problem of the influence of voltage sag on sensitive equipment.
Additional features and advantages of embodiments of the invention will be set forth in the description which follows.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a diagram illustrating a voltage tolerance curve of a sensing device according to an embodiment of the present invention.
Fig. 2 is a flowchart of a method for analyzing a voltage sag tolerance level of a sensitive device according to an embodiment of the present invention.
Fig. 3 is a block diagram of a system for analyzing the voltage sag tolerance level of a sensitive device according to an embodiment of the present invention.
Detailed Description
Various exemplary embodiments, features and aspects of the present disclosure will be described in detail below with reference to the accompanying drawings. In addition, in the following detailed description, numerous specific details are set forth in order to provide a better understanding of the present invention. It will be understood by those skilled in the art that the present invention may be practiced without some of these specific details. In some instances, well known means have not been described in detail so as not to obscure the present invention.
Referring to fig. 2, an embodiment of the present invention provides a method for analyzing a voltage sag tolerance level of a sensitive device, including the following steps:
step S1, obtaining voltage tolerance curve parameters of the sensitive equipment, wherein the parameters comprise Tmax、Tmin、Umax、Umin(ii) a Wherein, TmaxThe maximum and minimum values of the tolerance of the sensitive device to the voltage sag duration, the minimum value of the tolerance of the sensitive device to the voltage sag duration, UmaxElectricity as tolerance curve for sensitive equipmentUpper limit of UminThe lower voltage limit of the tolerance curve of the sensitive equipment is shown;
step S2, when the sensitive equipment senses the voltage sag, obtaining the voltage sag amplitude U and the duration T, and judging the failure probability according to the tolerance curve parameter, the voltage sag amplitude U and the duration T; when the running area is in the running area, the failure probability P is 0; when the device is in the failure area, the failure probability P is 1; when the determination area is in the indeterminate region, the flow proceeds to step S3;
step S3, respectively calculating an influence probability P1 considering the failure of the sensitive equipment caused by the duration of the voltage sag, an influence probability P2 considering the failure of the sensitive equipment caused by the voltage amplitude of the voltage sag, an influence probability P3 considering the failure of the sensitive equipment caused by the equipment condition, and calculating a failure probability P according to the influence probability P1, the influence probability P1 and the influence probability P1;
wherein, the probability P2 of the influence of the voltage amplitude considering the voltage sag on the failure of the sensitive device is as follows:
wherein, the influence probability P3 of the device condition causing the failure of the sensitive device is considered as follows:
Lreal＝L(1+γ)
wherein, L is the operating life of the sensitive equipment, LrealFor the actual effective operational life, L is the estimated operational life of the manufacturer at the time of delivery, γ is a predetermined coefficient, γ<0。
Wherein, the failure probability P is calculated according to the influence probability P1, the influence probability P1 and the influence probability P1, which is as follows:
P＝P1*P2*P3。
and step S4, when the failure probability P is larger than a preset threshold value, judging that the sensitive equipment fails, and when the failure probability P is larger than the preset threshold value, judging that the sensitive equipment does not fail.
Preferably, the preset threshold is 0.6.
Specifically, the energy function when evaluating the voltage sag of the sensitive device in the embodiment of the present invention is expressed by equation (1):
in formula (1), E is the energy, T is the duration of the voltage sag, UmaxIs the upper voltage limit of the tolerance curve of the equipment, and U is the voltage sag voltage amplitude.
Considering that the voltage sag occurs randomly in an uncertain region, the amplitude and duration of the voltage sag can be considered to be irrelevant, and therefore, in the embodiment of the present invention, the duration of the voltage sag and the probability of the voltage amplitude affecting the failure of the sensitive device are considered as formula (2) and formula (3), respectively:
in the formulae (2) and (3), P1、P2The voltage sag failure probability, T, is the duration and voltage amplitude of the voltage sag alonemax、TminMaximum and minimum values, U, respectively, of the tolerance of the sensitive device to the duration of the voltage sagminThe lower voltage limit of the tolerance curve of the device.
It will be appreciated that the ability of the sensitive device to withstand voltage sags is related to the current state of health, which is also more capable at best, and vice versa. Two factors are considered for evaluating the health condition of the sensitive equipment, one factor is the operation age, and the other factor is the operation and maintenance level; this is similar to the human situation, age and medical conditions can affect keeping your health; assuming that the allowed operation time of the sensitive equipment is L years, namely the equipment can operate for L years under the condition of not considering the influence of operation and maintenance factors; the effective operation and maintenance can prolong the effective operation life of the sensitive equipment, namely the effective operation life is shown as a formula (4)
Lreal＝L(1+γ) (4)
In the formula (4), LrealFor the actual effective operation life, L is the operation life estimated by the manufacturer when leaving the factory, and gamma is the operation and maintenance influence factor. For the operation and maintenance influence factor, the positive influence brought by effective operation and maintenance is considered, the health condition of the equipment can be improved, the service life of the equipment can be prolonged, the equipment is in failure, negative influence is generated on the equipment, the performance of the equipment is reduced, and the service life of the equipment is shortened. Value of gamma and effective operation and maintenance gamma1Gamma associated with equipment failure event2And the effective operation and maintenance of the equipment is taken to be [0,1 ]]A value of-1, 0 for a failure event of a device]A certain value, γ1、γ2The specific value of (b) can be given according to the specific situation of different sensitive devices.
γ＝γ1+γ2 (5)
Device health is not directly related to the duration and magnitude of the voltage sag and is therefore considered independent of the voltage sag.
Where P3 is the probability of a device condition causing a sensitive device to fail and l is the operating age.
Based on the above, the joint probability of the failure of the sensitive device in the uncertain region is as follows:
P＝P1*P2*P3 (7)
after the sensitive device is substituted by the formula (2), the formula (3), the formula (4), the formula (5) and the formula (6), the failure probability of the sensitive device in the uncertain region is as follows:
preferably, the calculation takes into account the probability of influence P1 of the duration of the voltage sag on the failure of the sensitive device, as follows:
the embodiment of the invention respectively and independently considers the voltage sag problem of the sensitive equipment distributed in the uncertain area as the combined distribution of three factors of the voltage amplitude of the voltage sag, the duration of the voltage sag and the current self health state, respectively forms the voltage amplitude of the voltage sag, the duration of the voltage sag and the independent failure probability function of the current self health state, evaluates the failure condition of the sensitive equipment by obtaining the combined distribution probability, constructs the failure condition of the sensitive equipment suffering from the voltage sag based on the three factors of the voltage amplitude of the voltage sag, the duration of the voltage sag and the current self health state, fills the vacancy of judgment of the uncertain area, provides a practical technology for the voltage sag influence analysis and treatment measure formulation of the sensitive equipment, and solves the problem that the voltage sag tolerance level of the current sensitive equipment is analyzed, the uncertain region has difficulty in evaluating the technical problem of the influence of voltage sag on sensitive equipment.
Referring to fig. 3, another embodiment of the present invention further provides a voltage sag tolerance level analysis system of a sensitive device, for implementing the method according to the above embodiment, where the system according to the embodiment of the present invention includes:
a parameter obtaining unit 1, configured to obtain a voltage tolerance curve parameter of a sensitive device, where the parameter includes Tmax、Tmin、Umax、Umin(ii) a Wherein, TmaxThe maximum and minimum values of the tolerance of the sensitive device to the voltage sag duration, the minimum value of the tolerance of the sensitive device to the voltage sag duration, UmaxUpper voltage limit, U, of tolerance curve of sensitive equipmentminThe lower voltage limit of the tolerance curve of the sensitive equipment is shown;
the first judgment unit 2 is used for acquiring a voltage sag amplitude U and a duration T when the sensitive equipment senses the voltage sag, and judging the failure probability of the sensitive equipment according to the tolerance curve parameter, the voltage sag amplitude U and the duration T; when the running area is in, the failure probability P is 0; when the device is in the failure area, the failure probability P is 1; when the mobile terminal is in the uncertain zone, generating a calculation instruction;
the failure probability calculation unit 3 is configured to receive the calculation instruction, and when it receives the calculation instruction, respectively calculate an influence probability P1 of considering that the duration of the voltage sag causes failure of the sensitive device, an influence probability P2 of considering that the voltage amplitude of the voltage sag causes failure of the sensitive device, and an influence probability P3 of considering that the device condition causes failure of the sensitive device, and calculate a failure probability P according to the influence probabilities P1, P1, and P1; and
and the second judging unit 4 is configured to judge that the sensitive device fails when the failure probability P is greater than a preset threshold, and judge that the sensitive device does not fail when the failure probability P is greater than the preset threshold.
The system of this embodiment corresponds to the method of the foregoing embodiment, and therefore, for the parts of the system of this embodiment that are not described in detail, the parts can be obtained by referring to the method of the foregoing embodiment, and are not described again here.
While embodiments of the present invention have been described above, the above description is illustrative, not exhaustive, and not limited to the disclosed embodiments. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments. The terminology used herein is chosen in order to best explain the principles of the embodiments, the practical application, or improvements made to the technology in the marketplace, or to enable others of ordinary skill in the art to understand the embodiments disclosed herein.
Claims (7)
1. A method for analyzing the voltage sag tolerance level of a sensitive device is characterized by comprising the following steps:
step S1, obtaining voltage tolerance curve parameters of the sensitive equipmentThe parameter includes Tmax、Tmin、Umax、Umin(ii) a Wherein, TmaxThe maximum and minimum values of the tolerance of the sensitive device to the voltage sag duration, the minimum value of the tolerance of the sensitive device to the voltage sag duration, UmaxUpper voltage limit, U, of tolerance curve of sensitive equipmentminThe lower voltage limit of the tolerance curve of the sensitive equipment is shown;
step S2, when the sensitive equipment senses the voltage sag, obtaining the voltage sag amplitude U and the duration T, and judging the failure probability according to the tolerance curve parameter, the voltage sag amplitude U and the duration T; when the running area is in the running area, the failure probability P is 0; when the device is in the failure area, the failure probability P is 1; when the determination area is in the indeterminate region, the flow proceeds to step S3;
step S3, respectively calculating an influence probability P1 considering the failure of the sensitive equipment caused by the duration of the voltage sag, an influence probability P2 considering the failure of the sensitive equipment caused by the voltage amplitude of the voltage sag, an influence probability P3 considering the failure of the sensitive equipment caused by the equipment condition, and calculating a failure probability P according to the influence probability P1, the influence probability P1 and the influence probability P1;
and step S4, when the failure probability P is larger than a preset threshold value, judging that the sensitive equipment fails, and when the failure probability P is larger than the preset threshold value, judging that the sensitive equipment does not fail.
2. The method according to claim 1, wherein the calculation takes into account the probability of influence P1 of the duration of the voltage sag on the failure of the sensitive equipment, as follows:
3. the method according to claim 2, wherein the probability P2 of the impact of the voltage amplitude of the voltage sag on the failure of the sensitive device is considered as follows:
4. the method according to claim 3, wherein the probability of influence P3 that the equipment condition causes the failure of the sensitive equipment is considered as follows:
Lreal＝L(1+γ)
wherein L is the operating life of the sensitive equipment, LrealFor the actual effective operational life, L is the operational life estimated by the manufacturer at the time of delivery, gamma is a predetermined coefficient, gamma is<0。
5. The method according to claim 4, wherein the failure probability P is calculated according to the influence probability P1, the influence probability P1 and the influence probability P1, and specifically as follows:
P＝P1*P2*P3。
6. the method of claim 1, wherein the preset threshold is 0.6.
7. A voltage sag tolerance level analysis system of a sensitive device, for implementing the method of any one of claims 1-6, the system comprising:
a parameter obtaining unit, configured to obtain a voltage tolerance curve parameter of the sensitive device, where the parameter includes Tmax、Tmin、Umax、Umin(ii) a Wherein, TmaxIs the maximum and minimum values of the tolerance of the sensitive device to the duration of the voltage sag, and is the minimum value of the tolerance of the sensitive device to the duration of the voltage sag, UmaxUpper voltage limit, U, of tolerance curve of sensitive equipmentminElectricity for tolerance curve of sensitive equipmentA lower pressure limit;
the first judgment unit is used for acquiring a voltage sag amplitude U and duration T when the sensitive equipment senses voltage sag, and judging the failure probability of the sensitive equipment according to the tolerance curve parameter, the voltage sag amplitude U and the duration T; when the running area is in the running area, the failure probability P is 0; when the device is in the failure area, the failure probability P is 1; when the mobile terminal is in the uncertain zone, generating a calculation instruction;
a failure probability calculation unit, configured to receive the calculation instruction, and when it receives the calculation instruction, respectively calculate an influence probability P1 of considering that the duration of the voltage sag causes failure of the sensitive device, an influence probability P2 of considering that the voltage amplitude of the voltage sag causes failure of the sensitive device, and an influence probability P3 of considering that the device condition causes failure of the sensitive device, and calculate a failure probability P according to the influence probabilities P1, P1, and P1; and
and the second judging unit is used for judging that the sensitive equipment fails when the failure probability P is greater than a preset threshold value, and judging that the sensitive equipment does not fail when the failure probability P is greater than the preset threshold value.
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