CN103777096A - Sensitive device immunity estimation method based on multiple sag threshold values and duration time - Google Patents

Sensitive device immunity estimation method based on multiple sag threshold values and duration time Download PDF

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CN103777096A
CN103777096A CN201410022793.7A CN201410022793A CN103777096A CN 103777096 A CN103777096 A CN 103777096A CN 201410022793 A CN201410022793 A CN 201410022793A CN 103777096 A CN103777096 A CN 103777096A
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temporarily
voltage
description
sag
falls
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CN103777096B (en
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徐永海
孔祥雨
兰巧倩
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North China Electric Power University
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Abstract

The invention discloses a sensitive device immunity estimation method based on multiple sag threshold values and the duration time, and pertains to the technical field of electric energy quality analysis. Effective value calculation is performed on sag recording data to obtain a sag RMS waveform, and the time T (Uc) in the sag in which the voltage is less than or equal to the voltage amplitude Uc that can be withstood by equipment are solved to form a sequence of multiple sag threshold values and the duration time; the sag description matrix, sag description table and sag description graph of some station are formed; single sag accident estimation and sensitive device voltage sag immunity station estimation are performed; and voltage sag severity estimation is performed based on the provided severity overall indicator MMDSI. The method has the following advantages that voltage sag is described based on the multiple sag threshold values and the duration time, and through the provided novel sensitive device voltage sag immunity estimation method, problems of excessive estimation and inaccuracy with traditional methods can be solved, the severity of voltage sag can be estimated reasonably.

Description

Based on how falling temporarily threshold value and duration sensitive equipment immunocompetence appraisal procedure
Technical field
The invention belongs to power quality analysis technical field, particularly relate to a kind of based on many sensitive equipment immunocompetence appraisal procedures of falling temporarily threshold value and duration.
Background technology
Voltage dip refers to the quality of power supply event declining suddenly in the rms voltage short time of causing due to reasons such as short-circuit fault of power system, large-size machine startup, transformer excitation flows.
The evaluation work of voltage dip is mainly to process by recorder data is fallen in electric energy quality monitoring system temporarily, obtains that index of correlation value describes that the order of severity falls in individual event, website and system voltage temporarily and to consumer influence degree.The size of voltage dip on sensitive equipment impact, refer to the immunocompetence size of sensitive equipment to voltage dip from sensitive equipment angle, its evaluation work is mainly voltage-tolerance curve based on sensitive equipment and falls in conjunction with single temporarily that correlated characteristic falls in event, website temporarily and index judges whether sensitive equipment can be affected, draws the affected frequency.
In traditional sensitive equipment voltage dip immunocompetence appraisal procedure, voltage dip is described by temporary range of decrease value and duration.Temporarily range of decrease value refers to that the minimum voltage amplitude of falling temporarily in process accounts for the number percent of nominal voltage, and the duration refers to falls in process voltage magnitude temporarily lower than the time of falling temporarily threshold value.Traditional appraisal procedure supposes that it is square wave that temporary range of decrease value changes waveform, and in fact voltage dip is really not so, because the initial period of voltage dip and recovery stage are not instantaneous completing, what especially direct current generator startup and transformer excitation flow caused falls temporarily, and it recovers duration in stage can be very long.In other words, traditional appraisal procedure is coarse and even is inapplicable.Different sensitive equipment voltage immunocompetences are different, even the sensitive equipment of same type is because of the difference of its manufacturer, hardware, control method, its voltage immunocompetence is not identical yet, and it is also the inapplicable major reason of traditional appraisal procedure that voltage dip describing method is not attached to concrete sensitive equipment characteristic.
Summary of the invention
The object of the present invention is to provide a kind of based on how falling temporarily threshold value and duration sensitive equipment immunocompetence appraisal procedure, bonding apparatus voltage-tolerance curve has proposed a kind of based on many novel describing methods of voltage dip that fall temporarily threshold value and duration, be intended to apply to equipment immunocompetence assessment upper, excessively assess to solve classic method, coarse problem.In website evaluation method, propose website and fallen temporarily the concept of description figure, and proposed the order of severity overall target based on the novel description of voltage dip, the order of severity that can reasonable assessment voltage dip.Concrete steps are as follows:
Step 1: carry out root-mean-square value and calculate and fall temporarily RMS waveform falling temporarily recorder data.Ask and fall temporarily middle voltage and be less than or equal to the tolerant voltage magnitude U of equipment ctime T (U c).And then sequence T (0.9), T (0.9-h), the T (0.9-2h) of threshold value and duration fall in formation temporarily more than one ... T (0.1) wherein T is the time, and unit is ms.
Step 2: the arbitrary event 1≤s that falls temporarily in event falls in certain monitoring for certain website month (certain season, certain year) n temporarily i≤ n, adopts T i(0.9), T i(0.9-h), T i(0.9-2h) ... T i(0.1) be described, formation is fallen temporarily Description Matrix, is fallen description list and fall temporarily description figure temporarily.
Step 3: voltage dip Severity: description figure falls in website temporarily that adopt step 2 to produce, in conjunction with voltage dip seriousness index, falls temporarily the seriousness overall target MMDSI of description based on novel voltage, the order of severity of assessment voltage dip comprises:
(1) the single event of falling is temporarily assessed.The sequence that adopts step 1 to produce, in conjunction with sensitive equipment voltage-tolerance curve bound form or mean value form, assessment sensitive equipment voltage dip immunocompetence.
(2) sensitive equipment voltage dip immunocompetence website evaluation.Description figure falls in website temporarily that adopt step 2 to produce, in conjunction with sensitive equipment voltage-tolerance curve bound form or mean value form, and assessment sensitive equipment voltage dip immunocompetence.
(3) voltage dip Severity.Description figure falls in website temporarily that adopt step 2 to produce, in conjunction with voltage dip seriousness index, falls temporarily the seriousness overall target MMDSI of description based on novel voltage, the order of severity of assessment voltage dip.
Technical scheme process flow diagram is as Fig. 1.
In step 1, ask and fall temporarily middle voltage and be less than or equal to U ctime T (U c) process be:
Fall temporarily s and can be described as the function of a voltage about the time: U=s (t) or t=s -1(U).For the free voltage U falling temporarily in process ccan be described as t=s -1(U), can try to achieve two according to RMS Wave data and separate t c1, t c2, wherein U is voltage, is perunit value.
Definition: T (U c)=| t c1-t c2|, wherein 0.1≤U c≤ 0.9.T (U c) refer to that falling temporarily middle voltage is less than or equal to U ctime.
In step 1, obtaining many processes of falling temporarily the sequence of threshold value and duration is:
Because the immune voltage magnitude in the voltage-tolerance curve of equipment is generally accurate to the 2nd of radix point, the desirable 0.01-0.05p.u. of voltage spaces h.Utilize T (U c) definition can be in the hope of how falling temporarily sequence T (0.9), T (0.9-h), the T (0.9-2h) of threshold value and duration ... T (0.1).
In step 2, falling temporarily Description Matrix forming process is:
N that monitors for certain website month (certain season, certain year) is fallen temporarily event, utilizes the many sequence computing method of falling temporarily threshold value and duration in step 1, arbitrary event s that falls temporarily that website is monitored i(1≤s i≤ n), can be described as T i(0.9), T i(0.9-h), T i(0.9-2h) ... T i(0.1), for more intuitive expression, can form one and fall temporarily Description Matrix, row represent temporary descending chain, and row represents a certain all descriptions of falling temporarily event:
T ( i , j ) = T 1 ( 0.9 ) T 1 ( 0.9 - h ) T 1 ( 0.9 - 2 h ) . . . T 1 ( 0.9 - jh ) . . . T 1 ( 0.1 ) T 2 ( 0.9 ) T 2 ( 0.9 - h ) T 2 ( 0.9 - 2 h ) . . . T 2 ( 0.9 - jh ) . . . T 2 ( 0.1 ) . . . . . . . . . . . . . . . . . . . . . T i ( 0.9 ) T i ( 0.9 - h ) T i ( 0.9 - 2 h ) . . . T i ( 0.9 - jh ) . . . T i ( 0.1 ) . . . . . . . . . . . . . . . . . . . . . T n ( 0.9 ) T n ( 0.9 - h ) T n ( 0.9 - 2 h ) . . . T n ( 0.9 - jh ) . . . T n ( 0.1 )
In step 2, falling temporarily description list forming process is:
The each threshold voltage duration in Description Matrix of falling temporarily forming in statistic procedure 2 is more than or equal to the event of falling the temporarily number of certain duration, as element corresponding to form unit, as shown in the table:
Figure BDA0000458225770000032
In step 2, falling temporarily description figure formation method is:
To fall temporarily every a line in description list and be depicted as one take the time as horizontal ordinate, the curve that unity element is ordinate forms all collection of curves to fall temporarily description figure under the same coordinate system.
In step 3, the single case evaluating method that falls is temporarily:
In the time that sensitive equipment voltage-tolerance curve adopts mean value form as Fig. 2, for this equipment, when voltage is lower than the tolerant voltage magnitude U of equipment cand lower than U cduration is greater than the duration T of voltage disturbance ctime, device fails; Otherwise this equipment is normally worked.Wherein U cfor withstand voltage mean value; T cfor duration mean value.Fall temporarily description according to novel voltage, appraisal procedure is as follows: if T is (U c)>=T c, equipment failure; If T is (U c) < T c, equipment is normal.
In the time that sensitive equipment voltage-tolerance curve adopts bound form as Fig. 3, if voltage is higher than U maxand the duration is less than T mintime, equipment is working properly; If voltage is lower than U minand the duration is greater than T max, equipment failure; When other situations, equipment is in uncertain region, and likely normal work is also likely broken down.Wherein U maxfor upper voltage limit; U minfor lower voltage limit; T maxfor the maximum duration; T minfor minimum duration.Fall temporarily description according to novel voltage, appraisal procedure is as follows: if T is (U max) < T min, equipment is normal; If T is (U min)>=T max, equipment failure; If T is (U max)>=T minand T (U min) < T max, equipment is in uncertain region.
In step 3, website evaluation is generally to form and describes website and fall temporarily index or the chart of information, in order to reflect the fault frequency etc. of the order of severity that website falls temporarily and the equipment of powering thereof.
In step 3, sensitive equipment voltage dip immunocompetence website evaluation method is:
In the time that evaluated sensitive equipment voltage-tolerance curve is known, while adopting mean value form, in the time falling immunocompetence website evaluation temporarily, find its voltage-tolerance curve flex point (U avr, T avr) at Fig. 5 website, the position in description figure falls temporarily, for example D point, and the fault frequency that this equipment causes because of voltage dip for a year is ordinate corresponding to D point, is made as y (D).
When evaluated sensitive equipment voltage-tolerance curve the unknown, while adopting bound form, find its upper limit, lower limit curve flex point (U max, T min), (U min, T max) at Fig. 5 website, the position in figure is described, for example A, B point.The quantity of falling temporarily in normal region is n-y (A), fault zone quantity is y (B), uncertain region is y (A)-y (B), the fault frequency that this equipment causes because of voltage dip for 1 year is (y (B), y (A)).
In step 3, duration seriousness index (DSI), temporarily range of decrease value seriousness index (MSI) and seriousness overall target (MDSI) can be described as:
DSI ( T ) = 0 , T < T min ( T - T min ) &times; ( 100 T max - T min ) , T min &le; T &le; T max 100 , T > T max MSI ( U ) = 0 , U > U max ( U max - U ) &times; ( 100 U max - U min ) , U min &le; U &le; U max 100 , U < U min
MDSI ( U , T ) = MSI &times; DSI ( T ) 100
The seriousness index production method that falls temporarily description based on novel voltage in step 3 is:
In conjunction with the concept of seriousness index, can obtain falling temporarily based on novel voltage the seriousness overall target MMDSI of description:
MMDSI=max{MDSI(0.9)),MDSI(0.9-h,))......MDSI(0.1,T(0.1))}
If MMDSI=0, can obtain T (U max) < T min, equipment is normal.If MMDSI=100, can obtain: T (U min)>=T max, equipment failure.If between MMDSI value 0-100, can obtain T (U max)>=T minand T (U min) < T max, equipment is in uncertain region, and MMDSI is larger, falls temporarily and more approaches voltage-tolerance curve lower limit, falls temporarily more serious.
The invention has the advantages that, based on how falling temporarily threshold value and the duration is described voltage dip, and and then the novel sensitive equipment voltage dip immunocompetence appraisal procedure that proposes can solve that classic method is excessively assessed, coarse problem, the order of severity of reasonable assessment voltage dip.
Accompanying drawing explanation
Fig. 1 is the technology of the present invention process flow diagram
Fig. 2 is sensitive equipment voltage-tolerance curve
Fig. 3 is sensitive equipment voltage-tolerance curve bound form and mean value form.
Fig. 4 is certain website voltage dip description list data.
Fig. 5 is certain website voltage dip description figure.
Fig. 6 is four quasi-representative sensitive equipment voltage-tolerance curve data.
Fig. 7 is the assessment result that adopts voltage-tolerance curve mean value form.
Fig. 8 is the assessment result that adopts voltage-tolerance curve bound form.
Fig. 9 is voltage dip seriousness index MDSI and the MMDSI of PC.
Embodiment
For making the object, technical solutions and advantages of the present invention clearer, below in conjunction with China's a certain electric energy quality monitoring system voltage dip recorder data, the website evaluation method for sensitive equipment voltage dip immunocompetence proposing take the present invention is as example, to can programming in logic device (PLC), the sensitive equipment of speed adjustable device (ASD), AC relay (AC Relay), personal computer (PC) 4 quasi-representatives assesses.Should be emphasized that, following explanation is only exemplary, rather than in order to limit the scope of the invention and to apply.
Step 1: carry out root-mean-square value and calculate and fall temporarily RMS waveform falling temporarily recorder data.
Free voltage U in process falls temporarily ccan be described as t=s -1(U), can try to achieve two according to RMS Wave data and separate t c1, t c2.T (U c)=| t c1-t c2| wherein 0.1≤U c≤ 0.9.T (U c) refer to that falling temporarily middle voltage is less than or equal to U ctime.
Step 2: the arbitrary event 1≤s that falls temporarily in event falls in certain monitoring for certain website month (certain season, certain year) n temporarily i≤ n, calculates respectively T i(0.9), T i(0.9-h), T i(0.9-2h) ... T i(0.1), h gets 0.05, obtains the multiple voltage dips of website and is described as many sequence T that fall temporarily threshold value and duration i(0.9), T i(0.9-h), T i(0.9-2h) ... T i(0.1), now h gets 0.05.And then statistics is fallen temporarily and is described in sequence each threshold voltage duration and be more than or equal to the event of falling the temporarily number of certain duration and obtain Fig. 4.
To fall temporarily every a line in description list and be depicted as one take the time as horizontal ordinate, the curve that unity element is ordinate forms all collection of curves to fall temporarily description figure as Fig. 5 under the same coordinate system.
Step 3:(1) single event assessment falls temporarily.The sequence that adopts step 1 to produce, in conjunction with sensitive equipment voltage-tolerance curve bound form or mean value form, assessment sensitive equipment voltage dip immunocompetence.
As Fig. 6, adopt mean value form in conjunction with the voltage-tolerance curve flex point data of evaluated equipment, find its voltage-tolerance curve flex point (U avr, T avr) at Fig. 5 website, the position in description figure falls temporarily, for example D point, and the fault frequency that this equipment causes because of voltage dip for a year is ordinate corresponding to D point, is made as y (D).
Analyze contrast and adopt novel voltage to fall temporarily the assessment result of describing the fault frequency causing with the voltage dip of traditional description, as shown in Figure 7.
As seen from Figure 7,4 kind equipment voltage-tolerance curve mean value forms, the fault frequency that classic method draws adopts method acquired results large than the present invention.The failure rate that classic method obtains four kind equipments than the present invention adopt method acquired results respectively high by 9.7%, 10.9%, 9.5% and 15.2%.The contrast verification of assessment result the excessively shortcoming of assessment of previously described classic method, and adopt the inventive method to carry out the feasibility of equipment voltage dip immunocompetence assessment.
(2) sensitive equipment voltage dip immunocompetence website evaluation.The website that step 2 produces falls description figure temporarily in conjunction with sensitive equipment voltage-tolerance curve bound form or mean value form assessment sensitive equipment voltage dip immunocompetence.
Adopt voltage-tolerance curve upper and lower limit shape form, find its upper limit, lower limit curve flex point (U max, T min), (U min, T max) at Fig. 5 website, the position in figure is described, for example A, B point.The quantity of falling temporarily in normal region is n-y (A), fault zone quantity is y (B), uncertain region is y (A)-y (B), the fault frequency that this equipment causes because of voltage dip for 1 year is (y (B), y (A)).
Analyze contrast and adopt novel voltage to fall temporarily the assessment result of describing the fault frequency causing with the voltage dip of traditional description, as shown in Figure 8.
As seen from Figure 8,4 kind equipment voltage-tolerance curve bound forms, the fault frequency, interval that classic method draws all adopt method acquired results large than the present invention.The contrast verification of assessment result the excessively shortcoming of assessment of previously described classic method, and adopt the inventive method to carry out the feasibility of equipment voltage dip immunocompetence assessment.
(3) voltage dip Severity.Without loss of generality, herein take PC as example.Utilize following three formula to calculate MDSI (0.9, T (0.9)), MDSI (0.9-h, T (0.9-h)) ... MDSI (0.1, T(0.1))
DSI ( T ) = 0 , T < T min ( T - T min ) &times; ( 100 T max - T min ) , T min &le; T &le; T max 100 , T > T max MSI ( U ) = 0 , U > U max ( U max - U ) &times; ( 100 U max - U min ) , U min &le; U &le; U max 100 , U < U min
MDSI ( U , T ) = MSI &times; DSI ( T ) 100
Can obtain falling temporarily based on novel voltage the seriousness overall target MMDSI of description:
MMDSI=max{MDSI(0.9,)),MDSI(0.9-h,T(0.9-h)),......MDSI(0.1,T(0.1))}
If MMDSI=0, can obtain T (U max) < T min, equipment is normal.If MMDSI=100, can obtain: T (U min)>=T max, equipment failure.If between MMDSI value 0-100, can obtain T (U max)>=T minand T (U min) < T max, equipment is in uncertain region, and MMDSI is larger, falls temporarily and more approaches voltage-tolerance curve lower limit, falls temporarily more serious.
Analyze the assessment result that the seriousness overall target (MMDSI) of describing seriousness overall target (MMDSI) traditional description falls in contrast employing novel voltage temporarily, as shown in Figure 9.
As shown in Figure 9, fall temporarily for arbitrary, its MMDSI value is all less than or equal to MDSI value; Some that adopts MDSI assessment makes equipment in the falling temporarily of malfunction, in the time adopting MMDSI assessment, can't make equipment failure, but in the range of indeterminacy, even normal region; Some that adopts MDSI to assess makes equipment falling temporarily in uncertain region, in the time adopting MMDSI assessment, its order of severity is generally little, be even 0, in normal region, this mainly determines by the non-rectangle degree of falling temporarily, and non-rectangle degree is higher, adopt classic method excessively to assess degree just higher, the difference of MDSI and MMDSI is also just larger.Make equipment in the falling temporarily of normal region, in the time adopting MMDSI assessment, certainly in normal region by some of MDSI assessment.Adopt the voltage dip severity MDSI of classic method in the time that assessment non-rectangle falls temporarily, to have the excessively shortcoming of assessment, and adopt the severity MMDSI of the novel description of voltage dip to address this problem.
Below embodiment has been described in detail the present invention by reference to the accompanying drawings, and those skilled in the art can make many variations example to the present invention according to the above description.Thereby some details in embodiment should not form limitation of the invention, the present invention by the scope defining using appended claims as protection scope of the present invention.

Claims (5)

1. based on how to fall temporarily threshold value and a duration sensitive equipment immunocompetence appraisal procedure, it is characterized in that, comprise the following steps:
Step 1: carry out root-mean-square value and calculate and fall temporarily RMS waveform falling temporarily recorder data; Ask and fall temporarily middle voltage and be less than or equal to the tolerant voltage magnitude U of equipment ctime T (U c); And then sequence T (0.9), T (0.9-h), the T (0.9-2h) of threshold value and duration fall in formation temporarily more than one ... T (0.1) wherein T is the time, and unit is ms;
Step 2: the arbitrary event 1≤s that falls temporarily in event falls in certain monitoring for certain website month (certain season, certain year) n temporarily i≤ n, adopts T i(0.9), T i(0.9-h), T i(0.9-2h) ... T i(0.1) be described, formation is fallen temporarily Description Matrix, is fallen description list and fall temporarily description figure temporarily;
Step 3: voltage dip Severity: description figure falls in website temporarily that adopt step 2 to produce, in conjunction with voltage dip seriousness index, falls temporarily the seriousness overall target MMDSI of description based on novel voltage, the order of severity of assessment voltage dip comprises:
(1) the single event of falling is temporarily assessed: the sequence that adopts step 1 to produce, and in conjunction with sensitive equipment voltage-tolerance curve bound form or mean value form, assessment sensitive equipment voltage dip immunocompetence;
(2) sensitive equipment voltage dip immunocompetence website evaluation: description figure falls in website temporarily that adopt step 2 to produce, in conjunction with sensitive equipment voltage-tolerance curve bound form or mean value form, assessment sensitive equipment voltage dip immunocompetence;
(3) voltage dip Severity: description figure falls in website temporarily that adopt step 2 to produce, in conjunction with voltage dip seriousness index, falls temporarily the seriousness overall target MMDSI of description based on novel voltage, the order of severity of assessment voltage dip.
2. method according to claim 1, it is characterized in that, in described step 1, form the sequence of falling temporarily threshold value and duration more than: T (0.9), T (0.9-h), T (0.9-2h) ... T (0.1), wherein T is the time, and unit is ms; H is voltage spaces.Adopt definition of T (U c) | t c1-t c2| wherein 0.1≤U c≤ 0.9, U cfor voltage, it is perunit value; T (U c) refer to that falling temporarily middle voltage is less than or equal to U ctime; Voltage spaces h gets 0.01-0.05p.u..
3. method according to claim 1, it is characterized in that, in step 2, form certain website and fall temporarily Description Matrix: event falls in certain moon, certain season or certain year n temporarily that monitor for certain website, utilize the many sequence computing method of falling temporarily threshold value and duration in step 1, to arbitrary event s that falls temporarily i(1≤s i≤ n), be described as T i(0.9), T i(0.9-h), T i(0.9-2h) ... T i(0.1), represent intuitively, form one and fall temporarily Description Matrix, row represent temporary descending chain, a certain all descriptions of falling temporarily of row table:
T ( i , j ) = T 1 ( 0.9 ) T 1 ( 0.9 - h ) T 1 ( 0.9 - 2 h ) . . . T 1 ( 0.9 - jh ) . . . T 1 ( 0.1 ) T 2 ( 0.9 ) T 2 ( 0.9 - h ) T 2 ( 0.9 - 2 h ) . . . T 2 ( 0.9 - jh ) . . . T 2 ( 0.1 ) . . . . . . . . . . . . . . . . . . . . . T i ( 0.9 ) T i ( 0.9 - h ) T i ( 0.9 - 2 h ) . . . T i ( 0.9 - jh ) . . . T i ( 0.1 ) . . . . . . . . . . . . . . . . . . . . . T n ( 0.9 ) T n ( 0.9 - h ) T n ( 0.9 - 2 h ) . . . T n ( 0.9 - jh ) . . . T n ( 0.1 )
4. method according to claim 1, it is characterized in that, in step 2, form certain website and fall temporarily description list and description figure: the each threshold voltage duration in Description Matrix of falling temporarily forming in statistic procedure 2 is more than or equal to the event of falling the temporarily number of certain duration; To fall temporarily every a line in description list and be depicted as one take the time as horizontal ordinate, the curve that unity element is ordinate forms all collection of curves to fall temporarily description figure under the same coordinate system.
5. method according to claim 1, is characterized in that, in step 3, proposes the seriousness overall target MMDSI describing based on voltage dip:
MMDSI=max{MDSI(0.9,)),MDSI(0.9-h,T(0.9-h)),......MDSI(0.1,T(0.1))}
Utilize based on novel voltage and fall temporarily the order of severity that the seriousness overall target MMDSI reflecting voltage of description falls temporarily: work as MMDSI=0, can obtain T (U max) < T min, equipment is normal; Work as MMDSI=100, obtain: T (U min)>=T max, equipment failure; Between MMDSI value 0-100, obtain T (U max)>=T minand T (U min) < T max, equipment is in uncertain region, and MMDSI is larger, falls temporarily and more approaches voltage-tolerance curve lower limit, falls temporarily more serious.
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CN113656237A (en) * 2021-07-16 2021-11-16 华南理工大学 Load voltage sag immunity rating method, system, device and medium
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