CN114088740B - Method and system for determining layer of surface defect of transparent body - Google Patents
Method and system for determining layer of surface defect of transparent body Download PDFInfo
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- CN114088740B CN114088740B CN202210081598.6A CN202210081598A CN114088740B CN 114088740 B CN114088740 B CN 114088740B CN 202210081598 A CN202210081598 A CN 202210081598A CN 114088740 B CN114088740 B CN 114088740B
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Abstract
The application relates to a method and a system for determining the layer of surface defects of a transparent body, which comprises the following steps: respectively shooting a first surface and a second surface of the transparent body to respectively obtain a corresponding first defect image and a corresponding second defect image, wherein the lens orientations of the imaging device are not parallel when the two surfaces are shot; and comparing the defect positions of the corresponding areas of the two defect images, and determining the layer surface of the defect on the transparent body by combining the lens pitch angle of the imaging device, wherein the lens pitch angle is the included angle between the lens orientation of the imaging device and the movement direction of the transparent body. The method and the device can solve the problem that the common machine vision in the related technology is not enough to obviously distinguish the glass layer where the defect is located by only depending on the depth of field of the lens in the detection process.
Description
Technical Field
The application relates to the technical field of glass production detection, in particular to a method and a system for determining the layer of a transparent body surface defect.
Background
In the glass panels testing process, need distinguish the aspect at glass surface defect (like greasy dirt, fingerprint, foreign matter granule etc.) place, for example outer glass cover plate of cell-phone, if dirty or foreign matter are located glass's internal surface, can cause serious influence to the technology quality of display screen after the laminating, if dirty or foreign matter are located glass's surface, can clean glass through modes such as wiping after the glass laminating, can not influence the quality that shows. Therefore, it is important to distinguish defects on the glass surface in the display field.
Because the glass is transparent and the thickness of the glass in the display field is usually less than 1mm, the depth of field of a lens is not enough to obviously distinguish the glass layer where the defect is located in the detection process of the common machine vision.
Disclosure of Invention
The embodiment of the application provides a method and a system for determining the layer where the surface defects of a transparent body are located, so as to solve the problem that the glass layer where the defects are located cannot be distinguished obviously only by the depth of field of a lens in the detection process of common machine vision in the related technology.
In a first aspect, there is provided a method of determining the level of a surface defect of a transparent body, comprising the steps of:
respectively shooting a first surface and a second surface of the transparent body to respectively obtain a corresponding first defect image and a corresponding second defect image, wherein the lens orientations of the imaging device are not parallel when the two surfaces are shot;
and comparing the defect positions of the corresponding areas of the two defect images, and determining the layer surface of the defect on the transparent body by combining the lens pitch angle of the imaging device, wherein the lens pitch angle is the included angle between the lens orientation of the imaging device and the movement direction of the transparent body.
In some embodiments, the step of shooting the first surface is a first pitch angle, the step of shooting the second surface is a second pitch angle, and determining the layer where the defect is located includes:
when the first pitch angle and the second pitch angle are both obtuse angles, if the defect on the first defect image is located at the upstream of the defect on the second defect image, determining that the defect on the transparent body is located on the first surface;
or if the defect on the first defect image is positioned at the downstream of the defect on the second defect image, judging that the defect on the transparent body is positioned on the second surface.
In some embodiments, the step of shooting the first surface is a first pitch angle, the step of shooting the second surface is a second pitch angle, and determining the layer where the defect is located includes:
when the first pitch angle and the second pitch angle are acute angles, if the defect on the first defect image is positioned at the downstream of the defect on the second defect image, judging that the defect on the transparent body is positioned on the first surface;
or if the defect on the first defect image is positioned at the upstream of the defect on the second defect image, judging that the defect on the transparent body is positioned on the second surface.
In some embodiments, the step of shooting the first surface is a first pitch angle, the step of shooting the second surface is a second pitch angle, and determining the layer where the defect is located includes:
and when one of the first pitch angle and the second pitch angle is an obtuse angle and the other is an acute angle, recording the distance between the defect on the first defect image and the defect on the second defect image in the moving direction of the transparent body as a first distance, and comparing the first distance with a standard distance to determine the layer plane where the defect on the transparent body is located.
In some embodiments, the standard distance comprises a first standard distance that is: the first pitch angle is an obtuse angle and the second pitch angle is an acute angle, and the calculated distance between the defect on the first defect image and the defect on the second defect image in the moving direction of the transparent body is known when the defect is on the first surface or the second surface.
In some embodiments, determining the level of the defect comprises:
when the first pitch angle is an obtuse angle and the second pitch angle is an acute angle, if the first distance is equal to the first standard distance, the defect on the transparent body is located on the first surface or the second surface, otherwise, the defect is located on the second surface or the first surface.
In some embodiments, the standard distance comprises a second standard distance, the second standard distance being: the first pitch angle is an acute angle and the second pitch angle is an obtuse angle, and the calculated distance between the defect on the first defect image and the defect on the second defect image in the moving direction of the transparent body is known when the defect is on the first surface or the second surface.
In some embodiments, determining the level of the defect comprises:
when the first pitch angle is an acute angle and the second pitch angle is an obtuse angle, if the first distance is equal to the second standard distance, the defect on the transparent body is located on the first surface or the second surface, otherwise, the defect is located on the second surface or the first surface.
In some embodiments, the imaging device has one and has two imaging stations for respectively photographing the first surface and the second surface; alternatively, the first and second electrodes may be,
the two imaging devices are respectively arranged at two sides of the motion track of the transparent body.
In a second aspect, there is provided a system for determining the level of a surface defect of a transparent body, comprising:
an imaging device for photographing the first and second surfaces of the transparent body to obtain corresponding first and second defect images;
and the processor is connected with the imaging device and used for comparing the defect positions of the corresponding areas of the two defect images and determining the layer where the defect on the transparent body is located by combining the lens pitch angle of the imaging device, wherein the lens pitch angle is an included angle between the orientation of the lens of the imaging device and the movement direction of the transparent body.
The beneficial effect that technical scheme that this application provided brought includes:
compared with the field depth depending on the lens, the method and the device can effectively determine the layer where the defects are located.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a schematic diagram of a defect provided by an embodiment of the present application on a first surface;
FIG. 2 is a schematic diagram of a defect provided by an embodiment of the present application on a second surface;
FIG. 3 is a schematic diagram of a first arrangement provided by an embodiment of the present application;
FIG. 4 is a schematic diagram of a second arrangement provided by an embodiment of the present application;
FIG. 5 is a schematic diagram of a third arrangement provided by an embodiment of the present application;
FIG. 6 is a schematic diagram of a fourth arrangement provided by an embodiment of the present application;
FIG. 7 is a schematic diagram of a fifth arrangement provided by an embodiment of the present application;
FIG. 8 is a schematic diagram of a sixth arrangement provided by an embodiment of the present application;
FIG. 9 is a schematic diagram of a seventh arrangement provided by an embodiment of the present application;
fig. 10 is a schematic diagram of an eighth arrangement provided in the embodiment of the present application.
In the figure: 1. a transparent body; 10. a first surface; 11. a second surface; 2. an imaging device; 3. and (5) a defect.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 1 and 2, embodiments of the present application provide a method of determining the level of a surface defect of a transparent body, comprising the steps of:
101: by using the imaging device 2, two surfaces of the transparent body 1, namely a first surface 10 and a second surface 11, are respectively photographed from two sides of the transparent body 1, corresponding first defect images and second defect images are obtained, and the lens orientations of the imaging device 2 are not parallel when the two surfaces of the transparent body 1 are photographed.
102: and comparing the defect positions of the corresponding areas of the first defect image and the second defect image, and determining the layer of the defect 3 on the transparent body 1 by combining the lens pitch angle of the imaging device 2 when shooting the defect images, wherein the lens pitch angle is an included angle between the lens orientation of the imaging device 2 and the movement direction of the transparent body 1.
In this embodiment, the imaging device 2 may adopt a line scan camera or an area array camera, during the shooting process, one surface of the whole transparent body 1 may be shot at one time, and then the defect 3 is confirmed, or one surface of the whole transparent body 1 may be shot for multiple times, and one area is shot, and then one area is compared, and finally the confirmation and identification of all the defects 3 are completed, and as for which mode, the reasonable selection may be performed according to the size of the transparent body 1 and the confirmation of the defects 3.
It should be noted that the direction of movement of the transparent body 1, wherein "movement" should be understood in a broad sense:
it may be that the transparent body 1 is actually moving and the imaging device 2 is stationary, such as shown in fig. 3.
It is also possible that the transparent body 1 is stationary and the imaging device 2 is moved, so that the transparent body 1 is moved relative to the imaging device 2, as is explained with reference to fig. 3, for example, the transparent body 1 is stationary and the imaging device 2 is moved to the left, so that the transparent body 1 is moved to the right relative to the imaging device 2.
It is also possible that both the transparent body 1 and the imaging device 2 are moving, for example as explained with reference to fig. 3, the transparent body 1 is moving to the right and the imaging device 2 is moving to the left, so that the transparent body 1 is moving to the right with respect to the imaging device 2.
In addition, if the size of the transparent body 1 is small, and the imaging device 2 adopts an area-array camera, one surface of the whole transparent body 1 can be photographed at one time, and then the transparent body 1 and the imaging device 2 can be kept still during actual operation.
In this embodiment, the number of the imaging devices 2 can be selected according to actual needs, for example, one imaging device 2 can be adopted, and the imaging device has two imaging stations for respectively shooting the first surface 10 and the second surface 11 of the transparent body 1, and the imaging device is firstly placed on one imaging station, and after shooting of one surface of the transparent body 1 is completed, the imaging device is moved to the other imaging station to complete shooting of the other surface.
Alternatively, two imaging devices 2 are used, and the two imaging devices 2 are respectively arranged on both sides of the movement locus of the transparent body 1, so that both surfaces of the transparent body 1 are photographed at the same time, wherein the term "movement" in the "movement locus" herein should also be understood in the above broad sense.
When one imaging device 2 or two imaging devices 2 are used, it is common to photograph which surface the camera of the imaging device 2 is focused on.
It should be noted that when two imaging devices 2 are used, the cameras of the two imaging devices 2 can be focused on the same surface, and further, because the thickness of the transparent body 1 is small, the camera of the imaging device 2 on one side of the transparent body 1 can be focused on the other side surface of the transparent body 1, and the camera of the imaging device 2 on the other side can be focused on the one side surface of the transparent body 1, so as to perform cross focusing, which is also feasible.
With reference to fig. 1 and 2, the principle of the present application is as follows:
whether the defect 3 is on the first surface 10 or the second surface 11, when the first surface 10 and the second surface 11 are imaged, because the transparent body has a certain refractive index due to the thickness, the position of the defect 3 on the defect image has a dislocation in the moving direction of the transparent body 1, and based on the dislocation and the lens pitch angle of the imaging device 2 when the defect image is shot, the layer plane where the defect is located can be determined.
Compared with the field depth depending on the lens, the method and the device can effectively determine the layer where the defects are located.
In addition, the method can carry out micrometer-scale detection only by amplifying the dislocation to a certain degree.
When identifying the layer where the defect is located, the lens pitch angle of the imaging device 2 needs to be considered, that is, when actually imaging, the lens pitch angle of the imaging device 2 needs to be determined, so that misjudgment is avoided, and eight arrangement modes can be determined according to the layer where the defect 3 is located and the lens pitch angle of the imaging device 2, which are detailed in fig. 3, 4, 5, 6, 7, 8, 9 and 10.
The first to fourth types are relatively longer in dislocation distance, so that the dislocation distance is obvious, and the fifth to eighth types are slightly more complicated because the dislocation distance is relatively shorter.
Eight ways are explained in detail below.
Referring to fig. 3 and 4, in both of these modes, if the lens pitch angle, i.e., the first pitch angle α, when the first surface 10 is photographed and the lens pitch angle, i.e., the second pitch angle β, when the second surface 11 is photographed are obtuse, the defect 3 on the transparent body 1 is located on the first surface 10 if the defect 3 on the first defect image is located upstream of the defect 3 on the second defect image, and the defect 3 on the transparent body 1 is located on the second surface 11 if the defect 3 on the first defect image is located downstream of the defect 3 on the second defect image, along the moving direction of the transparent body 1.
Referring to fig. 5 and 6, in both of these modes, if the lens pitch angle, i.e., the first pitch angle α, when the first surface 10 is photographed and the lens pitch angle, i.e., the second pitch angle β, when the second surface 11 is photographed are both acute, along the moving direction of the transparent body 1, if the defect 3 on the first defect image is located downstream of the defect 3 on the second defect image, the defect 3 on the transparent body 1 is located on the first surface 10, and if the defect 3 on the first defect image is located upstream of the defect 3 on the second defect image, the defect 3 on the transparent body 1 is located on the second surface 11.
Referring to fig. 7 and 8, it can be seen that both of these ways are that the first pitch angle α is obtuse and the second pitch angle β is acute, while, along the direction of movement of the transparent body 1, the defect 3 on the first defect image is located downstream of the defect 3 on the second defect image, but in the way of fig. 7 the defect 3 is actually on the first surface 10, whereas in the way of fig. 8 the defect 3 is actually on the second surface 11.
A similar situation occurs in fig. 9 and 10, both of which can be found in that the first pitch angle alpha is acute and the second pitch angle beta is obtuse, while, in the direction of movement of the transparent body 1, the defect 3 on the first defect image is located upstream of the defect 3 on the second defect image, but in the fig. 9 mode the defect 3 is actually on the first surface 10, whereas in the fig. 10 mode the defect 3 is actually on the second surface 11.
That is, the two modes of fig. 7 and 8, and the two modes of fig. 9 and 10, relying only on the misalignment and the first and second pitch angles α, β, are not sufficient to easily determine the level at which the defect 3 is actually located.
Therefore, for these four ways, the determination needs to be made with the aid of standard distances.
At this time, when the imaging device 2 photographs the first surface 10 and the second surface 11, the lens incident angles are γ and σ, respectively, where the lens incident angle refers to an included angle between an optical axis of the lens and a surface normal of the transparent body 1, and γ ≠ σ since the lens orientations of the imaging device 2 are not parallel when two surfaces of the transparent body 1 are photographed.
The specific principle is as follows:
as will be explained with reference to fig. 7, in fig. 7, if the defect 3 is on the first surface 10, the distance of the misalignment, i.e. the distance of the defect 3 on the first defect image and the defect 3 on the second defect image in the moving direction of the transparent body 1, can be calculated as follows:
sinγ/sinθ1n, n is the refractive index of the transparent body 1, theta1Is that defect 3 is the angle of refraction of light when on the first surface 10; tan theta is thus calculated1Further calculate the distance equal to dtan theta1And d is the thickness of the transparent body 1.
And sin σ/sin θ if the defect 3 is on the second surface 112N, n is the refractive index of the transparent body 1, theta2Is that defect 3 is the angle of refraction of light when on the second surface 11; tan theta is thus calculated2Further calculate the distance equal to dtan theta2。
Since γ ≠ σ, the calculated distances described above are not equal.
Based on the principle, the layer surface where the defect 3 on the transparent body 1 is located can be determined only by knowing the corresponding standard distance in advance when the layer surface where the defect 3 is actually located, and comparing the distance between the defect 3 on the first defect image and the defect 3 on the second defect image in the moving direction of the transparent body 1, namely the first distance L, with the standard distance.
Wherein, the standard distance includes a first standard distance and a second standard distance, and the first standard distance L1 is: the first pitch angle α is an obtuse angle and the second pitch angle β is an acute angle, and the calculated distances of the defect 3 on the first defect image and the defect 3 on the second defect image in the moving direction of the transparent body 1 when the defect 3 is on the first surface 10 or the second surface 11 are known; the second standard distance L2 is: the first pitch angle α is an acute angle and the second pitch angle β is an obtuse angle, and the calculated distances of the defect 3 on the first defect image and the defect 3 on the second defect image in the moving direction of the transparent body 1 when the defect 3 is known to be on the first surface 10 or the second surface 11;
when the first pitch angle α is obtuse and the second pitch angle β is acute, the defect 3 on the transparent body 1 is located on the first surface 10 or the second surface 11 if the first distance L = the first standard distance L1, and otherwise, on the second surface 11 or the first surface 10;
when the first pitch angle α is an acute angle and the second pitch angle β is an obtuse angle, the defect 3 on the transparent body 1 is located on the first surface 10 or the second surface 11 if the first distance L = the second standard distance L2, and otherwise, is located on the second surface 11 or the first surface 10.
It should be noted that one standard distance may be calculated for each of fig. 7, 8, 9, and 10, or the standard distance may be calculated for one of the cases by using the two modes of fig. 7 and 8 as a set, or the standard distance may be calculated for one of the cases by using the two modes of fig. 9 and 10 as a set.
It should be noted that the above-mentioned calculation of the standard distance and the calculation of the distance of the defect position of the corresponding area of the defect image on the two surfaces in the moving direction of the transparent body 1 in fig. 7, 8, 9 and 10 are explained, and the "calculation" should be understood in a broad sense.
That is, the calculation may be to calculate a certain value, or may be to simply obtain a mark with equal length, and the purpose is to perform comparison to determine whether the mark is equal in length.
In addition, as an example, when imaging, the range of the incident angle of the lens of the imaging device 2 is 30 ° -60 ° is more effective, but other angles are also feasible.
The embodiment of the application further provides a system for determining the layer where the surface defects of the transparent body are located, the system comprises an imaging device 2 and a processor, the imaging device 2 is used for shooting a first surface 10 and a second surface 11 of the transparent body 1 to obtain a corresponding first defect image and a corresponding second defect image, the processor is connected with the imaging device 2 and is used for comparing the defect positions of the corresponding areas of the two defect images, and the layer where the defects 3 on the transparent body 1 are located is determined by combining the lens pitch angle of the imaging device 2 when the defect images are shot, wherein the lens pitch angle is an included angle between the lens orientation of the imaging device 2 and the movement direction of the transparent body 1.
Compared with the system depending on the depth of field of the lens, the system provided by the application can effectively determine the layer where the defect is located.
In the description of the present application, it should be noted that the terms "upper", "lower", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, which are only for convenience in describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and operate, and thus, should not be construed as limiting the present application. Unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are intended to be inclusive and mean, for example, that they may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as appropriate.
It is noted that, in the present application, relational terms such as "first" and "second", and the like, are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The above description is merely exemplary of the present application and is presented to enable those skilled in the art to understand and practice the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (11)
1. A method of determining the level of a surface defect in a transparent body, comprising the steps of:
respectively shooting a first surface (10) and a second surface (11) of a transparent body (1) to respectively obtain corresponding first defect images and second defect images, wherein the lens orientation of an imaging device (2) is not parallel when shooting the two surfaces, and the first surface (10) and the second surface (11) are two opposite surfaces of the transparent body (1);
comparing the upstream and downstream relations of the defect positions of the two defect image corresponding areas in the movement direction of the transparent body (1), and determining the layer of the defect (3) on the transparent body (1) by combining the arrangement mode of the lens pitch angle of the imaging device (2), wherein the lens pitch angle is an included angle between the lens orientation of the imaging device (2) and the movement direction of the transparent body (1), the lens pitch angle for shooting the first surface (10) is a first pitch angle, the lens pitch angle for shooting the second surface (11) is a second pitch angle, and the arrangement mode is that the first pitch angle and the second pitch angle are both obtuse angles, and the first pitch angle and the second pitch angle are both acute angles.
2. The method for determining the level of surface defects in a transparent body according to claim 1,
determining the level of the defect (3) comprises:
when the first pitch angle and the second pitch angle are both obtuse angles, if the defect (3) on the first defect image is positioned at the upstream of the defect (3) on the second defect image, judging that the defect (3) on the transparent body (1) is positioned on the first surface (10);
or if the defect (3) on the first defect image is positioned at the downstream of the defect (3) on the second defect image, judging that the defect (3) on the transparent body (1) is positioned on the second surface (11).
3. The method for determining the level of surface defects in a transparent body according to claim 1,
determining the level of the defect (3) comprises:
when the first pitch angle and the second pitch angle are acute angles, if the defect (3) on the first defect image is positioned at the downstream of the defect (3) on the second defect image, judging that the defect (3) on the transparent body (1) is positioned on the first surface (10);
or if the defect (3) on the first defect image is positioned at the upstream of the defect (3) on the second defect image, judging that the defect (3) on the transparent body (1) is positioned on the second surface (11).
4. A method of determining the level of a surface defect in a transparent body, comprising the steps of:
respectively shooting a first surface (10) and a second surface (11) of a transparent body (1) to respectively obtain corresponding first defect images and second defect images, wherein the lens orientation of an imaging device (2) is not parallel when shooting the two surfaces, and the first surface (10) and the second surface (11) are two opposite surfaces of the transparent body (1);
comparing the defect positions of the corresponding areas of the two defect images, recording the distance between the defect (3) on the first defect image and the defect (3) on the second defect image in the moving direction of the transparent body (1) as a first distance by combining the arrangement mode of the lens pitch angle of the imaging device (2), comparing the first distance with a standard distance, and determining the layer plane where the defect (3) on the transparent body (1) is located;
the lens pitch angle is an included angle between the lens orientation of the imaging device (2) and the movement direction of the transparent body (1), the lens pitch angle for shooting the first surface (10) is a first pitch angle, the lens pitch angle for shooting the second surface (11) is a second pitch angle, the arrangement mode is that one of the first pitch angle and the second pitch angle is an obtuse angle and the other is an acute angle, and the standard distance is a distance between the defect (3) on the first defect image and the defect (3) on the second defect image calculated when the defect (3) is known to be on the first surface (10) or the second surface (11) in the movement direction of the transparent body (1).
5. The method of determining the level of surface defects in a transparent body of claim 4, wherein:
the standard distance comprises a first standard distance which is: the first pitch angle is an obtuse angle and the second pitch angle is an acute angle, and the calculated distance between the defect (3) on the first defect image and the defect (3) on the second defect image in the moving direction of the transparent body (1) is known when the defect (3) is on the first surface (10) or the second surface (11).
6. Method for determining the level of a defect of a surface of a transparent body according to claim 5, characterized in that determining the level of a defect (3) comprises:
when the first pitch angle is an obtuse angle and the second pitch angle is an acute angle, if the first distance is equal to the first standard distance, the defect (3) on the transparent body (1) is located on the first surface (10) or the second surface (11), otherwise, the defect is located on the second surface (11) or the first surface (10).
7. The method of determining the level of surface defects in a transparent body of claim 4, wherein:
the standard distance comprises a second standard distance, and the second standard distance is as follows: the first pitch angle is an acute angle and the second pitch angle is an obtuse angle, and the calculated distance between the defect (3) on the first defect image and the defect (3) on the second defect image in the moving direction of the transparent body (1) is known when the defect (3) is on the first surface (10) or the second surface (11).
8. Method for determining the level of a defect of a surface of a transparent body according to claim 7, wherein determining the level of a defect (3) comprises:
when the first pitch angle is an acute angle and the second pitch angle is an obtuse angle, if the first distance is equal to the second standard distance, the defect (3) on the transparent body (1) is located on the first surface (10) or the second surface (11), otherwise, the defect is located on the second surface (11) or the first surface (10).
9. Method for determining the level of defects on the surface of a transparent body according to claim 1 or 4, characterized in that:
one imaging device (2) is provided, and the imaging device is provided with two imaging stations for respectively shooting a first surface (10) and a second surface (11); alternatively, the first and second electrodes may be,
the two imaging devices (2) are respectively arranged at two sides of the motion track of the transparent body (1).
10. A system for determining the level of a surface defect of a transparent body, comprising:
an imaging device (2) for photographing a first surface (10) and a second surface (11) of a transparent body (1) to obtain corresponding first and second defect images, wherein the first surface (10) and the second surface (11) are two opposite surfaces of the transparent body (1);
and the processor is connected with the imaging device (2) and used for comparing the upstream and downstream relations of the defect positions of the corresponding areas of the two defect images in the motion direction of the transparent body (1) and determining the layer where the defect (3) on the transparent body (1) is located by combining the arrangement mode of the lens pitch angle of the imaging device (2), wherein the lens pitch angle is an included angle between the lens orientation of the imaging device (2) and the motion direction of the transparent body (1), the lens pitch angle for shooting the first surface (10) is a first pitch angle, the lens pitch angle for shooting the second surface (11) is a second pitch angle, and the arrangement mode is that the first pitch angle and the second pitch angle are both obtuse angles and the first pitch angle and the second pitch angle are both acute angles.
11. A system for determining the level of a surface defect of a transparent body, comprising:
an imaging device (2) for photographing a first surface (10) and a second surface (11) of a transparent body (1) to obtain corresponding first and second defect images, wherein the first surface (10) and the second surface (11) are two opposite surfaces of the transparent body (1);
the processor is connected with the imaging device (2) and used for comparing the defect positions of the corresponding areas of the two defect images, recording the distance between the defect (3) on the first defect image and the defect (3) on the second defect image in the movement direction of the transparent body (1) as a first distance by combining the arrangement mode of the lens pitch angle of the imaging device (2), and comparing the first distance with a standard distance to determine the layer plane where the defect (3) on the transparent body (1) is located;
the lens pitch angle is an included angle between the lens orientation of the imaging device (2) and the movement direction of the transparent body (1), the lens pitch angle for shooting the first surface (10) is a first pitch angle, the lens pitch angle for shooting the second surface (11) is a second pitch angle, the arrangement mode is that one of the first pitch angle and the second pitch angle is an obtuse angle and the other is an acute angle, and the standard distance is a distance between the defect (3) on the first defect image and the defect (3) on the second defect image calculated when the defect (3) is known to be on the first surface (10) or the second surface (11) in the movement direction of the transparent body (1).
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| CN202210081598.6A CN114088740B (en) | 2022-01-24 | 2022-01-24 | Method and system for determining layer of surface defect of transparent body |
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Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006057125A1 (en) * | 2004-11-24 | 2006-06-01 | Asahi Glass Company, Limited | Method and device for inspecting defect of transparent plate body |
| JP5521377B2 (en) * | 2009-04-13 | 2014-06-11 | セントラル硝子株式会社 | Glass plate defect identification method and apparatus |
| CN101988908A (en) * | 2009-07-31 | 2011-03-23 | 法国圣-戈班玻璃公司 | Method and system for distinguishing fault of substrate |
| KR101324015B1 (en) * | 2011-08-18 | 2013-10-31 | 바슬러 비전 테크놀로지스 에이지 | Apparatus and method for detecting the surface defect of the glass substrate |
| WO2013077282A1 (en) * | 2011-11-25 | 2013-05-30 | シャープ株式会社 | Inspection method for liquid-crystal display panel |
| CN104634789A (en) * | 2014-04-24 | 2015-05-20 | 东旭集团有限公司 | System and method for performing foreign matter inspection on upper surface of ultrathin glass substrate |
| CN104865271A (en) * | 2015-04-15 | 2015-08-26 | 浙江工业大学 | Detection method for distinguishing upper and lower surface image of transparent thin plate |
| WO2018048843A1 (en) * | 2016-09-08 | 2018-03-15 | Corning Incorporated | Optical inspection systems and methods for detecting surface defects in a transparent sheet |
| CN107764841B (en) * | 2017-11-17 | 2024-03-01 | 仝人智能科技(江苏)有限公司 | Device and method for detecting and distinguishing defects of upper surface and lower surface of transparent glass cover plate |
| CN107764834B (en) * | 2017-12-07 | 2024-06-11 | 南京波长光电科技股份有限公司 | Device for automatically detecting surface defects of transparent part and detection method thereof |
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