CN214584972U - Foreign matter layering check out test set - Google Patents
Foreign matter layering check out test set Download PDFInfo
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- CN214584972U CN214584972U CN202120650535.9U CN202120650535U CN214584972U CN 214584972 U CN214584972 U CN 214584972U CN 202120650535 U CN202120650535 U CN 202120650535U CN 214584972 U CN214584972 U CN 214584972U
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Abstract
The utility model relates to a foreign matter layering check out test set relates to panel detection technology field, and this foreign matter layering check out test set includes: the first camera device is used for performing front-view imaging on the panel to be detected, is positioned above the panel to be detected and images the whole area to be detected of the panel to be detected; the second camera devices are used for performing side-view imaging on the panel to be detected from the upper part of the panel to be detected; each second camera device images different to-be-detected subareas of the to-be-detected panel, and the plurality of to-be-detected subareas jointly cover the whole to-be-detected area of the to-be-detected panel. This application utilizes the front view to shoot and looks sideways at the principle that the object can produce the parallax error under the same screen of shooting, utilizes same set of light path formation of image, simple structure, and convenient operation, and can obtain great detection area under the prerequisite of guarantee detection precision, facilitate for the foreign matter detection work on the panel.
Description
Technical Field
The application relates to the technical field of panel detection, in particular to foreign matter layering detection equipment.
Background
In the field of automatic detection of panel appearance defects, specific positions of panel defects cannot be effectively distinguished at present, namely, whether the panel defects are positioned inside or outside the panel cannot be effectively distinguished. For example, cover glass (CG glass) needs to be attached to an upper polarizer or a screen, dust is easily sandwiched between the CG glass and the polarizer, and when the dust is in a micron level, a defect of attachment foreign matter is formed between the CG glass and the upper polarizer, and the defect of attachment foreign matter may cause generation of defective products. And some external defects (such as dust, dirt and the like) can be removed through cleaning, and the quality is not influenced. Therefore, the specific position of the panel defect is effectively distinguished, and the defect treatment is very critical.
In order to solve the above technical problems, a foreign matter delamination detection technique is provided.
Disclosure of Invention
The application provides a foreign matter layering check out test set utilizes the principle that the object can produce the parallax error under the same screen of front view shooting and look sideways at shooting, utilizes same set of light path formation of image, simple structure, and convenient operation, and can obtain great detection area under the prerequisite that the guarantee detected the precision, facilitate for the foreign matter detection work on the panel.
In a first aspect, the present application provides a foreign matter stratification detection apparatus, comprising:
the first camera device is used for performing front-view imaging on the panel to be detected, is positioned above the panel to be detected and is used for imaging the whole area to be detected of the panel to be detected;
the second camera devices are used for performing side-view imaging on the panel to be detected from the upper part of the panel to be detected;
each second camera device images different sub-areas to be detected of the panel to be detected, and the plurality of sub-areas to be detected jointly cover the whole sub-area to be detected of the panel to be detected.
Preferably, the plurality of second camera devices are uniformly distributed above the panel to be measured, and the angle between the lens optical axis of each second camera device and the normal of the panel to be measured is the same.
Preferably, the positions and imaging angles of the plurality of second image pickup devices are distributed in mirror symmetry with respect to the first image pickup device.
Preferably, the sizes and the shapes of the sub-regions to be detected are the same;
the sub-regions to be detected are not overlapped, the whole sub-region to be detected is formed by splicing the plurality of sub-regions to be detected, or,
and the sub-regions to be detected are overlapped, and the whole region to be detected is formed by cutting and splicing the plurality of sub-regions to be detected.
Specifically, the first image capturing device includes a black-and-white camera and a high-resolution imaging lens;
the lens optical axis of the high-resolution imaging lens is perpendicular to the panel to be detected, and the imaging center of the whole area to be detected is superposed with the center of the surface image to be detected of the first camera device.
Specifically, the second imaging device includes a black-and-white camera and an imaging lens.
Specifically, the plurality of second camera devices are 16 cameras, and the 16 cameras are distributed on two sides of the first camera device in a two-row eight-column manner in a mirror image manner, and are used for acquiring side view images of different sub-regions to be detected on the panel to be detected.
Preferably, the intersection point of the central axis of the lens of the first camera device and the panel to be measured coincides with the central point of the panel to be measured, and the center of the shooting area of the second camera device coincides with the center of the corresponding sub-area.
Further, the foreign matter layering detection equipment further comprises an image splicing module, wherein the image splicing module is connected with the second camera devices and used for receiving the images output by the second camera devices, splicing the images output by the second camera devices and outputting side-looking images after splicing.
Further, equipment still includes foreign matter layering judgment module, foreign matter layering judgment module with image concatenation module with first camera device is connected for receive the image of first camera device output with look sideways at the image after the concatenation, obtain the foreign matter through comparing two images and be in the position of the panel that awaits measuring, the output the positional information of foreign matter.
The beneficial effect that technical scheme that this application provided brought includes:
this application utilizes the front view to shoot and looks sideways at the principle that the object can produce the parallax error under the same screen, utilizes same set of light path formation of image, simple structure, and convenient operation, and utilize a plurality of cameras that look sideways at to acquire the different subregion's of panel that awaits measuring image to can obtain great detection area under the prerequisite of guarantee detection precision, facilitate for the foreign matter detection work on the panel.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a schematic operation diagram of a foreign matter delamination detection apparatus provided in an embodiment of the present application;
FIG. 2 is a top view of the foreign object stratification detection apparatus provided in the embodiments of the present application;
fig. 3 is a schematic view illustrating detection of a panel to be detected of the foreign matter layering detection apparatus provided in the embodiment of the present application;
in the figure:
1. a first image pickup device; 10. a black and white camera; 11. a high resolution imaging lens; 2. a second image pickup device; 20. a black and white camera; 21. an imaging lens; 3. and (5) a panel to be tested.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Embodiments of the present application will be described in further detail below with reference to the accompanying drawings.
The embodiment of the application provides a foreign matter layering check out test set utilizes the principle that the object can produce the parallax error under the same screen of forward looking shooting and look sideways at shooting, utilizes same set of light path formation of image, simple structure, and convenient operation, and can obtain great detection area under the prerequisite of guarantee detection precision, facilitate for the foreign matter detection work on the panel to fall the mesh of optimizing quality control.
In order to achieve the technical effects, the general idea of the application is as follows:
a foreign matter delamination detection apparatus comprising:
the first camera device 1 is used for performing front-view imaging on the panel 3 to be detected, the first camera device 1 is positioned above the panel 3 to be detected and images the whole area to be detected of the panel 3 to be detected;
a plurality of second cameras 2 for performing side-view imaging on the panel 3 to be tested from above the panel 3 to be tested;
each second camera device 2 images different sub-regions to be measured of the panel 3 to be measured, and the plurality of sub-regions to be measured cover the whole region to be measured of the panel 3 to be measured.
Embodiments of the present application will be described in further detail below with reference to the accompanying drawings.
In a first aspect, referring to fig. 1 to 3, an embodiment of the present application provides a foreign object stratification detection apparatus, including:
the first camera device 1 is used for performing front-view imaging on the panel 3 to be detected, the first camera device 1 is positioned above the panel 3 to be detected and images the whole area to be detected of the panel 3 to be detected;
a plurality of second cameras 2 for performing side-view imaging on the panel 3 to be tested from above the panel 3 to be tested;
each second camera device 2 images different sub-regions to be measured of the panel 3 to be measured, and the plurality of sub-regions to be measured cover the whole region to be measured of the panel 3 to be measured.
Specifically, the first imaging device 1 includes a black-and-white camera 10 and a high-resolution imaging lens 11; the black and white camera 10 may be a large target surface black and white camera.
The lens optical axis of the high-resolution imaging lens 11 is perpendicular to the panel 3 to be measured, and the imaging center of the whole area to be measured coincides with the center of the surface image to be measured of the first camera device 1.
When the high-resolution imaging lens is used, the lens optical axis of the high-resolution imaging lens 11 is perpendicular to the panel 3 to be detected, namely perpendicular to the upper surface of the panel 3 to be detected, and the horizontal and vertical positions of the lens are adjusted, so that the lens can just cover the maximum imageable area together when the lens clearly images the panel 3 to be detected, and the center of the panel 3 to be detected coincides with the center of the imaged area.
Specifically, the second image pickup device 2 includes a monochrome camera 20 and an imaging lens 21.
The lens optical axis of each imaging lens 21 has the same angle with the normal of the panel 3 to be measured.
Specifically, the upper surface of the panel 3 to be tested is divided into a plurality of sub-regions to be tested with the same size, and each sub-region to be tested can be marked if necessary so as to facilitate later-stage combination and comparison;
each second imaging device 2 corresponds to one sub-region to be measured.
In the embodiment of the application, utilize the front view to shoot and look sideways at the principle that the object can produce the parallax error under the same screen, utilize same set of light path formation of image, simple structure, convenient operation, and can obtain great detection area under the prerequisite of guarantee detection precision, facilitate for the foreign matter detection work on the panel to fall the purpose of optimizing quality control.
Advantages of embodiments of the present application over the prior art include, but are not limited to, the following:
firstly, the same light path is used for imaging, the structure is simple, the position relation of images acquired by two camera devices is relatively consistent, and the reliability is high;
secondly, images are acquired at one time and defect layering is carried out, so that the detection efficiency is high;
thirdly, the area of the detection area is large, the requirement on the thickness degree of the panel 3 to be detected is low, and certain detection precision can be ensured in the face of different thicknesses.
Specifically, the plurality of second image capturing devices 2 are uniformly distributed above the panel 3 to be measured, and the angle between the lens optical axis of each second image capturing device 2 and the normal of the panel 3 to be measured is the same.
Preferably, the positions and imaging angles of the plurality of second imaging devices 2 are distributed in mirror symmetry with respect to the first imaging device 1.
Specifically, the sizes and the shapes of all sub-regions to be detected are the same;
the sub-regions to be measured do not coincide with each other, and the plurality of sub-regions to be measured are spliced to form the whole region to be measured, or,
the sub-regions to be detected are overlapped, and the plurality of sub-regions to be detected are cut and spliced to form the whole region to be detected.
Specifically, the plurality of second camera devices 2 are 16 cameras, and the 16 cameras are distributed on two sides of the first camera device 1 in a mirror image manner in two rows and eight columns, and are used for acquiring side view images of different sub-regions to be measured on the panel 3 to be measured.
Accordingly, the upper surface of the panel 3 to be measured is divided into 16 sub-regions of the same size, and the sub-regions correspond to the second image capturing devices 2, respectively.
Specifically, the intersection point of the central axis of the lens of the first camera device 1 and the panel 3 to be measured coincides with the central point of the panel 3 to be measured, and the center of the shooting area of the second camera device coincides with the center of the corresponding sub-area.
In practical implementation, as shown in fig. 2 of the drawings of the specification, the number of the second image capturing devices 2 is 16, 4 x 4, θ is an angle formed by the optical axis of the lens and the normal of the surface to be measured of the panel 3 to be measured, θ is 30 degrees,
the lens of each second camera 2 captures 1/16 areas of the upper surface of the panel 3 to be measured in the manner shown in figures 1 and 2 of the drawings,
as shown in fig. 1 and 2 of the drawings, the horizontal and vertical positions of the lens of the second imaging device 2 are adjusted to clearly image the area to be shot, so that the center of the area to be shot coincides with the center of the area to be imaged, and the image formed by the area to be shot can be just completely covered by the area to be imaged together.
Further, the equipment also comprises an image splicing module, wherein the image splicing module is connected with each second camera device 2;
the image stitching module is used for receiving the images output by the second camera devices 2, stitching the images output by the second camera devices 2 and outputting stitched side-looking images.
Further, the equipment also comprises a foreign matter layering judgment module, wherein the foreign matter layering judgment module is connected with the image splicing module and the first camera device 1;
the foreign matter layering judgment module is used for receiving the image output by the first camera device 1 and the spliced side-looking image, obtaining the position of the foreign matter on the panel 3 to be detected by comparing the two images and outputting the position information of the foreign matter.
If necessary, the image output from the first image pickup device 1 may be referred to as a front-view image formation map, the image output from each second image pickup device 2 may be referred to as a side-view image formation map, and the image obtained by fusing the images output from all the second image pickup devices 2 may be referred to as a side-view fused image formation map.
Specifically, when the foreign matter layering detection device performs comparison analysis, when the bright points on the spliced side-view image and the bright points on the image output by the first camera device 1 are superposed on the acquisition comparison fusion map, it indicates that foreign matter exists on the surface of the panel 3 to be detected;
when the bright points on the spliced side view image correspond to the bright points on the image output by the first imaging device 1 but do not coincide with each other, it indicates that a foreign object exists in the inner layer of the panel 3 to be measured.
In specific implementation, an electronic device with a computer can be used as the image stitching module and the foreign matter layering judgment module to perform corresponding image comparison work, and certainly, the comparison can also be performed manually.
It should be noted that before determining whether different bright spots corresponding to a foreign object coincide, it is also necessary to determine whether the outlines of the two bright spots are substantially the same, and if the outlines of the two bright spots are substantially the same, it is determined that the bright spots originate from the same foreign object, and then it is determined whether the bright spots coincide, and it is determined whether the corresponding foreign object exists on the surface or in the inner layer.
In the embodiment of the present application, a specific work flow is given, where the panel 3 to be tested corresponding to the work flow is assumed to have an inner layer and a surface layer, where the upper surface layer is denoted by a, the inner layer is denoted by B, and defects may appear in both the inner layer and the surface layer, and if the current defect to be tested includes p0_ A, p1_ A, p2_ A, p0_ B, p1_ B and p2_ B, and the above six points may be located in the inner layer or the surface layer, the corresponding work flow is specifically as follows:
in the first step, the upper surface of the panel 3 to be measured is divided into 16 regions to be measured of the same size.
Secondly, the panel 3 to be measured is powered on to be in a lighting state, the first camera device 1 is used for imaging the whole screen to obtain an image PA, in addition, 16 second camera devices 2 are used for imaging the corresponding regions to be measured, namely 1/16 regions corresponding to the regions to be measured respectively, and 16 images PB1 and PB2 … PB16 are obtained correspondingly respectively.
And thirdly, carrying out fusion calibration on each PB series image and the image PA.
Fourthly, whether the defect is in the inner layer or the surface layer of the screen can be detected through the fused image, as shown in fig. 3 of the attached drawings, in the figure, P0 '_ A, P1' _ a and P2 '_ a are images of surface layer points P0_ A, P1_ a and P2_ a in fig. 1 of the attached drawings, and assuming that the three object points are all in the same 1/16 area range, the relative positions of the surface layer points imaged by the first camera 1 and the second camera 2 are the same according to the optical principle, that is, the three points P0' _ A, P1 '_ a and P2' _ a are completely overlapped in the fused image;
for the inner layer points P0_ B, P1_ B and P2_ B, due to the influence of panel refraction, the relative positions of the first image pickup device 1 and the second image pickup device 2 in the fusion map are different when the same inner layer point is photographed,
therefore, P0_ B1, P1_ B1 and P2_ B1 in FIG. 3 are the relative positions of the images of the front-view camera lens module to the inner layer points P0_ B, P1_ B and P2_ B in the fused image respectively,
p0_ B2, P1_ B2, and P2_ B2 are the relative positions in the fused map of the side view camera lens module's imaging of the interior layer points P0_ B, P1_ B and P2_ B, respectively.
Namely, the judgment basis of the embodiment of the present application is as follows:
when foreign objects on the surface layer of the panel 3 to be detected are imaged and converted into images, points acquired by the first camera device 1 and the second camera device 2 are completely overlapped and are expressed as one point;
when the foreign matter points on the inner layer of the panel 3 to be detected are converted into images after imaging, the points acquired by the first camera device 1 and the second camera device 2 are not overlapped and have a certain relative position, so that whether the foreign matter is on the surface layer or the inner layer can be judged.
It is noted that, in the present application, relational terms such as "first" and "second", and the like, are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The foregoing are merely exemplary embodiments of the present application and are presented to enable those skilled in the art to understand and practice the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A layered foreign object detection apparatus, the apparatus comprising:
the device comprises a first camera device (1) for performing front-view imaging on a panel (3) to be detected, wherein the first camera device (1) is positioned above the panel (3) to be detected and is used for imaging the whole area to be detected of the panel (3) to be detected;
the second camera devices (2) are used for performing side-view imaging on the panel (3) to be detected from the upper part of the panel (3) to be detected;
each second camera device (2) images different sub-areas to be measured of the panel to be measured (3), and the plurality of sub-areas to be measured jointly cover the whole area to be measured of the panel to be measured (3).
2. The foreign matter delamination detection apparatus as recited in claim 1, wherein the plurality of second image capturing devices (2) are uniformly distributed above the panel under test (3), and an angle formed by a lens optical axis of each of the second image capturing devices (2) and a normal line of the panel under test (3) is the same.
3. The foreign matter delamination detection apparatus according to claim 1, wherein a plurality of the second image pickup devices (2) are arranged in mirror symmetry with respect to the first image pickup device (1) in terms of position and imaging angle.
4. The foreign matter delamination detection apparatus as recited in claim 1,
the sizes and the shapes of the sub-regions to be detected are the same;
the sub-regions to be detected are not overlapped, the whole sub-region to be detected is formed by splicing the plurality of sub-regions to be detected, or,
and the sub-regions to be detected are overlapped, and the whole region to be detected is formed by cutting and splicing the plurality of sub-regions to be detected.
5. The foreign substance stratification detection apparatus according to claim 1, wherein the first image pickup device (1) includes a black-and-white camera (10) and a high-resolution imaging lens (11);
the lens optical axis of the high-resolution imaging lens (11) is perpendicular to the panel (3) to be detected, and the imaging center of the whole area to be detected is superposed with the center of the area image to be detected of the first camera device (1).
6. The foreign matter delamination detection apparatus according to claim 1, wherein:
the second imaging device (2) includes a black-and-white camera (20) and an imaging lens (21).
7. The foreign matter layering detection apparatus according to claim 1, wherein the plurality of second cameras (2) are 16 cameras, and the 16 cameras are distributed on two sides of the first camera (1) in a mirror image manner in two rows and eight columns for obtaining side-view images of different sub-regions to be detected on the panel to be detected (3).
8. The foreign matter delamination detection apparatus according to claim 1, wherein an intersection point of a central axis of a lens of the first camera (1) and the panel under test (3) coincides with a central point of the panel under test (3), and a center of a photographing region of the second camera coincides with a center of a corresponding sub-region.
9. The foreign object delamination detection apparatus as set forth in claim 1, further comprising an image stitching module connected to each of the second image capturing devices (2) for receiving the images output by the second image capturing devices (2), stitching the images output by the second image capturing devices (2), and outputting a stitched side view image.
10. The foreign matter layering detection device according to claim 9, further comprising a foreign matter layering judgment module, connected to the image stitching module and the first camera device (1), for receiving the image output by the first camera device (1) and the stitched side view image, obtaining a position of the foreign matter on the panel (3) to be detected by comparing the two images, and outputting position information of the foreign matter.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202120650535.9U CN214584972U (en) | 2021-03-29 | 2021-03-29 | Foreign matter layering check out test set |
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| CN202120650535.9U CN214584972U (en) | 2021-03-29 | 2021-03-29 | Foreign matter layering check out test set |
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| CN214584972U true CN214584972U (en) | 2021-11-02 |
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