CN114088527B - Device and method for detecting elastic modulus of material - Google Patents
Device and method for detecting elastic modulus of material Download PDFInfo
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- CN114088527B CN114088527B CN202111403746.3A CN202111403746A CN114088527B CN 114088527 B CN114088527 B CN 114088527B CN 202111403746 A CN202111403746 A CN 202111403746A CN 114088527 B CN114088527 B CN 114088527B
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
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Abstract
The application discloses a device and a method for detecting elastic modulus of a material, wherein the device comprises a test sample, a test light path device and a force measuring device, wherein the test light path device and the force measuring device are both fixed on a horizontal plane, one end of the test sample is connected with the force measuring device through a clamp, the other end of the test sample is connected with the test light path device through a clamp, the force measuring device and the test light path device apply tension or extrusion force to the test sample, so that the test sample deforms, the force measuring device reads a tension value, and the test light path device calculates deformation amount of the test sample. The detection device and the detection method have the advantages of high measurement precision, easiness in operation, high linearity and symmetry, good stability and repeatability and the like.
Description
Technical Field
The application belongs to the field of nondestructive detection, and particularly relates to a device and a method for detecting elastic modulus of a material.
Background
The modulus of elasticity is an important physical quantity describing the ability of a solid material to resist deformation and is one of the bases for selecting mechanical components. The measurement of the elastic modulus has important significance for researching the mechanical property, the state and the service life of the material. The method for measuring the elastic modulus may include a dynamic method, a static method, and the like. The dynamic method has accurate measurement results, but the measurement method and the measurement instrument are relatively complex and have complicated operation. The static method is a common method for obtaining the elastic modulus of a material in a laboratory, and the method is used for calculating the elastic modulus of the sample by applying a certain external force to the sample and measuring the tiny deformation of the sample by a specific measuring method on the basis of the known geometric dimension of the sample. The current measuring method of the tiny deformation quantity of the material mainly comprises an optical measuring method, an electrical measuring method, an ultrasonic measuring method and the like. In the traditional optical measurement method, certain measurement deviation can be caused by factors such as non-uniform light beam intensity in space, algorithm defects and the like; the electrical measurement method is only applicable to metal materials and has great limitation.
Vortex light is a special singular light, the light intensity of which is distributed in a ring shape, the wave front structure is spiral, and the center of a light beam becomes a singular point due to the mutual cancellation of phases, so that the center generates a dark spot with a phase which cannot be defined to be smaller, and the vortex light has definite orbital angular momentum and no heating effect. Due to the unique individuality of the light beam, the light beam is widely applied to the research fields of optical trapping of particles, micro-manipulation, biomedicine, communication and the like, and vortex rotation in the nondestructive detection field gradually shows the excellent characteristics.
Disclosure of Invention
The application aims to: the application aims to solve the technical problem of providing a device and a method for detecting the elastic modulus of a material aiming at the defects in the prior art.
In order to solve the technical problem, in a first aspect, a detection device for elastic modulus of a material is disclosed, the detection device comprises a test sample, a test light path device and a force measuring device, wherein the test light path device and the force measuring device are both fixed on a horizontal plane, one end of the test sample is connected with the force measuring device through a clamp, the other end of the test sample is connected with the test light path device through a clamp, the force measuring device and the test light path device apply tension or extrusion force to the test sample, the test sample deforms, the force measuring device reads a tension value, and the test light path device calculates deformation amount of the test sample.
With reference to the first aspect, in one implementation manner, the test light path device includes a laser, a beam expanding device, a vortex light generating device, a beam splitter, a cylindrical lens, a first reflecting mirror, a second reflecting mirror, an industrial camera and a computer,
the laser is used for emitting a monochromatic laser beam;
the beam expanding device is used for receiving the monochromatic laser beams and converting the monochromatic laser beams into parallel monochromatic beams with the diameters being enlarged, wherein the diameters of the parallel monochromatic beams are transmitted forwards;
the vortex light generating device is used for receiving the parallel monochromatic light beams and converting the parallel monochromatic light beams into vortex light beams with the topological charge number of l;
the optical wave is used for receiving vortex light beams with the topological charge number of l and sending the vortex light beams to the beam splitter;
the beam splitter is used for receiving vortex light with the topological charge number of l sent from the light wave and dividing the vortex light into a first vortex light beam and a second vortex light beam; simultaneously receiving vortex beams reflected by the cylindrical lens and the second reflector;
the cylindrical lens is used for receiving the second vortex beam and sending the second vortex beam to the first reflecting mirror;
the first reflector is used for receiving the second vortex beam sent by the cylindrical lens and reflecting the second vortex beam back to the cylindrical lens to obtain a third vortex beam with the topological charge number of-l; the third vortex beam with the topological charge number of-l is transmitted to an industrial camera through a beam splitter;
the second reflector is used for receiving the first vortex beam and reflecting the first vortex beam back to the beam splitter, and the beam splitter transmits the first vortex beam to the industrial camera;
the industrial camera is used for receiving the reflected first vortex beam and third vortex beam;
the computer is connected with the industrial camera and is used for displaying interference images of vortex light beams received by the industrial camera and displaying the interference images on a display of the computer.
With reference to the first aspect, in one implementation manner, the test light path device further includes a force application nut and a screw, the second reflector is provided with a base, the second reflector base is sleeved on the screw, the test sample is connected with the second reflector base through a clip, and one end of the screw is rotationally connected with the force application nut; when the force application nut is rotated, the second reflector base moves along the screw direction with the second reflector.
With reference to the first aspect, in one implementation manner, the force measuring device includes a tension sensor and a tension sensor digital display, where the tension sensor is connected to one end of the test sample through a clip, and the tension sensor digital display is connected to the tension sensor through a data line, and is used for displaying a tension value.
With reference to the first aspect, in one implementation manner, the vortex light generating device is a fork grating, or a spiral phase Plate, or a liquid crystal Q-Plate, or the like.
In a second aspect, a method for detecting elastic modulus of a material is disclosed, comprising the steps of:
step 1, turning on a laser to emit a monochromatic laser beam;
step 2, adjusting the position and the aperture size of the light wave to enable vortex light with the topological charge number of l to pass through;
step 3, displaying interference images corresponding to two vortex beams with opposite topological charges received by the industrial camera 8 on a display of a computer; the interference images are arranged in a circular ring shape at equal intervals by 2l petal-shaped patterns;
step 4, adjusting the force application nut to enable the screw to drive the second reflecting mirror (72) to move for displacement delta L along the direction of the screw (722), enabling the corresponding interference image to rotate by taking the center of the image as a rotating shaft, enabling the previous petal-shaped graph to occupy the position of the adjacent petal-shaped graph, and recording a pulling force value F displayed by the digital display of the pulling force sensor at the moment;
and 5, calculating the elastic modulus E of the test sample.
With reference to the second aspect, in one implementation manner, an expression of light intensity of the interference image when the vortex beams with opposite topological charges displayed on the display of the computer in the step 3 interfere is as shown in formula (1):
wherein I is light intensity, E l (r) represents the vortex light amplitude intensity, which is a fixed value, l represents the topological charge number of vortex light, the value is an integer or a fraction, lambda is the vortex light wavelength, the value is the same as the wavelength of a monochromatic laser beam, deltax is the difference between the distance from the first vortex light beam to the second reflector and the distance from the second vortex light beam to the first reflector, theta is the azimuth angle of petal-shaped patterns in the interference image under the polar coordinates of a plane, and r is the polar diameter of the petal-shaped patterns taking the center of the interference image as a pole.
With reference to the second aspect, in one implementation manner, in the step 4, the previous petal-shaped pattern occupies a position of an adjacent petal-shaped pattern, and the rotating included angle isThen there are:
the displacement Δl is therefore expressed as:
in the step 5, the elastic modulus E of the test sample is:
wherein L is the original length of the test sample, and S is the stress area of the test sample.
When the topological charge number L of the vortex rotation is increased, the number of petal-shaped patterns of the interference image is increased, when each petal-shaped pattern occupies the position of the adjacent petal-shaped pattern, the second reflector displacement delta L is reduced, the tensile deformation amount of the test sample is reduced, the higher the precision of measuring the tiny deformation amount delta L is, and the more accurate the measurement of the elastic modulus is.
With reference to the second aspect, in one implementation, to further reduce the measurement error, step 4 is repeated, and the test sample is continuously stressed to obtain 2n sets of data, namely: f (F) 1 ,F 2 ...F n ...F 2n In order to keep the deformation of the test sample within the elastic limit range, n is a positive integer, the value of n is related to the material, length, cross section area and wavelength and topological charge number of eddy rotation of the test sample (0), and the elastic modulus of the sample to be tested is calculated by using a difference-by-difference method:
in the above formula, i is a positive integer, i is less than or equal to n,as an average of n sets of data separated by a difference, i.e
With reference to the second aspect, in one implementation manner, when the test sample is a cylindrical rod-shaped object, the force application nut is adjusted in step 4, so that the second mirror moves by a displacement Δl along the screw direction, and a tensile force is applied to the test sample, where the elastic modulus E of the test sample is:
where d is the diameter of the test sample.
The beneficial effects are that:
the application provides a method and a detection device for measuring elastic modulus of a material by using a static stretching method based on vortex light nondestructive detection technology. The measuring method and the measuring device have the advantages of high measuring precision, easiness in operation, high linearity and symmetry, good stability and repeatability and the like.
Drawings
The foregoing and/or other advantages of the application will become more apparent from the following detailed description of the application when taken in conjunction with the accompanying drawings and detailed description.
Fig. 1 is a schematic diagram of a device for detecting elastic modulus of a material according to an embodiment of the present application.
Fig. 2 is a schematic diagram showing connection of the second reflective mirror 72 in the device for detecting elastic modulus of material according to the embodiment of the present application.
Fig. 3 is a simulated image of vortex beam interference with opposite topological charges generated by a device for detecting elastic modulus of a material according to an embodiment of the present application.
Fig. 4 is a schematic diagram of deformation of a sample to be tested under the action of a tensile force F, which is generated by the device for detecting elastic modulus of a material according to the application embodiment.
Fig. 5 shows that Δl is 0 and Δl is 6 when the topological charge number l=6 generated by the device for detecting elastic modulus of material according to the embodiment of the present applicationThe interference image is simulated.
Fig. 6 is a schematic diagram of a second detection device for elastic modulus of a material according to an embodiment of the present application.
The reference numerals in the figures illustrate: test sample 0, test light path device 100, laser 1, beam expander 2, vortex light generating device 3, beam splitter 5, cylindrical lens 6, first mirror 71, second mirror 72, industrial camera 8, computer 81, force measuring device 9, tension sensor 91, tension sensor digital display 92, laser beam 11, vortex light beam 12 with topological charge number l, first vortex light beam 121, second vortex light beam 122 and third vortex light beam 123.
Detailed Description
Embodiments of the present application will be described below with reference to the accompanying drawings.
The device and the method for detecting the elastic modulus of the material provided by the embodiment of the application can be applied to the tensile method for detecting the elastic modulus of the material and the compression method for detecting the elastic modulus of the material.
The first embodiment of the application discloses a device for detecting the elastic modulus of a material, which comprises a test sample 0, a test light path device 100 and a force measuring device 9, wherein the test light path device 100 and the force measuring device 9 are both fixed on a horizontal plane, one end of the test sample 0 is connected with the force measuring device 9 through a clamp, the other end of the test sample 0 is connected with the test light path device 100 through a clamp, the force measuring device 9 and the test light path device 100 apply tensile force or extrusion force to the test sample 0, so that the test sample 0 deforms, the force measuring device 9 reads a tensile force value, and the test light path device 100 calculates the deformation amount of the test sample 0.
In the first embodiment, as shown in fig. 6, the test optical path device 100 includes a laser 1, a beam expanding device 2, a vortex light generating device 3, an optical blade 4, a beam splitter 5, a cylindrical lens 6, a first reflecting mirror 71, a second reflecting mirror 72, an industrial camera 8 and a computer 81,
the laser 1 is used for emitting a monochromatic laser beam 11;
the beam expanding device 2 is used for receiving the monochromatic laser beam 11 and changing the monochromatic laser beam 11 into a parallel monochromatic beam with a forward transmission and a larger diameter; in this embodiment, the beam expanding device 2 includes a first convex lens and a second convex lens (not labeled in the figure), and the diameter of the parallel monochromatic light beam is 2-3 mm;
the vortex light generating device 3 is used for receiving the parallel monochromatic light beams and changing the parallel monochromatic light beams into vortex light beams 12 with topological charge number of l;
the optical wave 4 is used for receiving the vortex beam 12 with the topological charge number of l and sending the vortex beam to the beam splitter 5;
the beam splitter 5 is configured to receive the vortex beam 12 with the topological charge number of l sent from the optical wave 4 and split the vortex beam into a first vortex beam 121 and a second vortex beam 122; simultaneously receiving the vortex beam reflected by the cylindrical lens 6 and the second reflector 72;
the cylindrical lens 6 is used for receiving the second vortex beam 122 and sending the second vortex beam to the first reflecting mirror 71;
the first reflector 71 is configured to receive the second vortex beam 122 sent by the cylindrical lens 6, and reflect the second vortex beam 122 back to the cylindrical lens 6 to obtain a third vortex beam 123 with a topological charge number of-l; the third vortex beam 123 with the topological charge number of-l is transmitted to the industrial camera 8 through the beam splitter 5;
the second reflector 72 is configured to receive the first vortex beam 121 and reflect the first vortex beam 121 back to the beam splitter 5, and the beam splitter 5 transmits the first vortex beam 121 to the industrial camera 8;
the industrial camera 8 is configured to receive the reflected first and third vortex beams 121 and 123; in this embodiment, the industrial camera 8 is a CCD (charge coupled device ) camera.
The computer 81 is connected with the industrial camera 8, and is used for displaying interference images of the first vortex beam 121 and the third vortex beam 123 which are received by the industrial camera (8) and have opposite topological charges.
In the first embodiment, as shown in fig. 2, the test light path device 100 further includes a force nut 721 and a screw 722, the second reflector 72 is provided with a base, the base of the second reflector 72 is sleeved on the screw 722, the test sample 0 is connected with the base of the second reflector 72 through a clip, and one end of the screw 722 is rotatably connected with the force nut 721; when the biasing nut 721 is rotated, the base of the second mirror 72 moves in the screw direction with the second mirror 72.
In the first embodiment, the force measuring device 9 includes a tension sensor 91 and a tension sensor digital display 92, the tension sensor 91 is connected with one end of the test sample 0 through a clip, and the tension sensor digital display 92 and the tension sensor 91 are connected through a data line for displaying a tension value.
In the first embodiment, the vortex light generating device is a fork grating, or a spiral phase Plate, or a liquid crystal Q-Plate, or the like.
The second embodiment of the application discloses a method for detecting the elastic modulus of a material, which comprises the following steps:
step 1, turning on a laser 1 to emit a monochromatic laser beam 11;
step 2, adjusting the position and aperture size of the light wave 4 to enable vortex light beams 12 with topological charge number of l to pass through;
step 3, displaying interference images corresponding to two vortex beams with opposite topological charges received by the industrial camera 8 on a display of the computer 81; the interference images are arranged in a circular ring shape at equal intervals by 2l petal-shaped patterns, as shown in simulation diagrams 3 and 5, the topological charge number of vortex rotation in the diagram 3 is 8, and the topological charge number of vortex rotation in the diagram 5 is 6;
the light intensity expression of the interference image when the vortex beams with opposite topological charges are interfered is shown in formula (1) on the display of the computer 81:
wherein I (r) is light intensity, E l (r) represents the intensity of vortex light amplitude, which is a constant value, l represents the topological charge number of vortex light, λ represents the vortex light wavelength, which is the same as the wavelength of the monochromatic laser beam 11, Δx represents the difference between the distance from the first vortex beam 121 to the second mirror 72 and the distance from the second vortex beam 122 to the first mirror 71, θ represents the azimuth angle of the petal-shaped pattern in the interference image in the planar polar coordinate, and r represents the petal-shaped pattern with the interference image center as the poleAnd (5) a polar diameter.
Step 4, adjusting the force application nut 721 to drive the screw 722 to drive the second reflector 72 to move along the direction of the screw 722 by a displacement Δl, and rotating the corresponding interference image by taking the center of the image as a rotating shaft, so that the previous petal-shaped graph occupies the position of the adjacent petal-shaped graph as shown in fig. 5, and recording the pulling force value F displayed by the digital display 92 of the pulling force sensor at the moment;
the previous petal-shaped graph occupies the position of the adjacent petal-shaped graph, and the rotating included angle is thatThen there are:
the displacement Δl is therefore expressed as:
step 5, calculating the elastic modulus E of the test sample 0:
wherein L is the original length of the test sample 0, and S is the stress area of the test sample 0.
In the second embodiment, step 4 is repeated, and the test sample is continuously stressed to obtain 2n groups of data, namely: f (F) 1 ,F 2 ...F n ...F 2n In order to keep the deformation of the test sample within the elastic limit range, n is a positive integer, the value of n is related to the material, the length, the cross section area and the wavelength and the topological charge number of vortex rotation of the test sample 0, and when the test sample 0 is a carbon steel material with the diameter of 0.6mm and the length of 1cm, the wavelength of vortex light is 632nm and the topological charge number is 4, n is a natural number less than or equal to 50; calculating the elastic modulus of the sample to be measured by using a difference-by-difference method:
in the above formula, i is a positive integer, i is less than or equal to n,as an average of n sets of data separated by a difference, i.eFor example, the measured 4 groups of data are F 1 、F 2 、F 3 、F 4 Then n is 2, i is 1 and 2,
in the second embodiment, when the test sample 0 is a cylindrical rod-like object, the original length of the test sample 0 is L, and the wavelength of vortex light is 632nm, the topological charge number of vortex rotation l=6. An interference image of 12 petal-shaped patterns as shown in the simulation of FIG. 5 was observed on the display of the computer 81, and the included angle of each 2 petal-shaped patterns wasThe force application nut 721 is adjusted to move the second reflector 72 along the direction of the screw 722, a 20N tensile force is applied to the test sample 0, a place where the cylindrical rod-shaped object (such as a metal wire) may be bent is straightened, and the tensile force value is set to 0N through the tension sensor display, so that the influence on the measurement result caused by the bending of the test sample is prevented. Continuing to adjust the force nut 721 to elongate the cylindrical rod-like object with the movement of the second mirror 72, the second mirror 72 is moved on the screw 722 by a displacement +.>During this process, each petal of the interference image is observed to rotate and occupy the position of the adjacent petals on the display of the computer 81, as shown in fig. 5. In this process, test sample 0 is stretched by ΔL, as shown in the figure4, the tensile force value F displayed by the digital display 92 of the tensile force sensor at this time is recorded, and the elastic modulus E of the test sample 0 is:
where d is the diameter of test sample 0.
The application provides a device and a method for detecting elastic modulus of a material, and the method and the way for realizing the technical scheme are numerous, the above description is only a specific implementation mode of the application, and it should be pointed out that a plurality of improvements and modifications can be made to a person skilled in the art without departing from the principle of the application, and the improvements and the modifications are also considered as the protection scope of the application. The components not explicitly described in this embodiment can be implemented by using the prior art.
Claims (3)
1. The detection method of the elastic modulus of the material is characterized by comprising the steps of detecting by using a detection device, wherein the detection device comprises a test sample (0), a test light path device (100) and a force measuring device (9), the test light path device (100) and the force measuring device (9) are both fixed on a horizontal plane, one end of the test sample (0) is connected with the force measuring device (9) through a clamp, the other end of the test sample (0) is connected with the test light path device (100) through the clamp, the force measuring device (9) and the test light path device (100) apply tensile force or extrusion force to the test sample (0) so that the test sample (0) deforms, the force measuring device (9) reads a tensile force value, and the test light path device (100) calculates the deformation amount of the test sample (0);
the test light path device (100) comprises a laser (1), a beam expanding device (2), a vortex light generating device (3), a beam splitter (5), a cylindrical lens (6), a first reflecting mirror (71), a second reflecting mirror (72), an industrial camera (8) and a computer (81),
the laser (1) is used for emitting a monochromatic laser beam (11);
the beam expanding device (2) is used for receiving the monochromatic laser beam (11) and changing the monochromatic laser beam (11) into a parallel monochromatic beam with a forward transmission and a larger diameter;
the vortex light generating device (3) is used for receiving the parallel monochromatic light beams and changing the parallel monochromatic light beams into vortex light beams (12) with topological charge number of l;
the wave (4) is used for receiving vortex light beams (12) with topological charges of l and sending the vortex light beams to the beam splitter (5);
the beam splitter (5) is used for receiving the vortex beam (12) with the topological charge number of l sent from the light wave (4) and dividing the vortex beam into a first vortex beam (121) and a second vortex beam (122); simultaneously receiving the vortex beam reflected by the cylindrical lens (6) and the second reflector (72);
the cylindrical lens (6) is used for receiving the second vortex beam (122) and sending the second vortex beam to the first reflecting mirror (71);
the first reflector (71) is used for receiving the second vortex beam (122) sent by the cylindrical lens (6) and reflecting the second vortex beam (122) back to the cylindrical lens (6) to obtain a third vortex beam (123) with the topological charge number of-l; the third vortex beam (123) with the topological charge number of-l is transmitted to an industrial camera (8) through a beam splitter (5);
the second reflector (72) is used for receiving the first vortex beam (121) and reflecting the first vortex beam (121) back to the beam splitter (5), and the beam splitter (5) transmits the first vortex beam to the industrial camera (8);
-the industrial camera (8) for receiving the reflected first (121) and third (123) vortex beams;
the computer (81) is connected with the industrial camera (8) and is used for displaying interference images of vortex light beams received by the industrial camera (8);
the test light path device (100) further comprises a force application nut (721) and a screw (722), the second reflector (72) is provided with a base, the base of the second reflector (72) is sleeved on the screw (722), the test sample (0) is connected with the base of the second reflector (72) through a clamp, and one end of the screw (722) is rotationally connected with the force application nut (721); when the force application nut (721) is rotated, the base of the second reflector (72) moves along the screw direction along with the second reflector (72);
the force measuring device (9) comprises a tension sensor (91) and a tension sensor digital display (92), wherein the tension sensor (91) is connected with one end of a test sample (0) through a clamp, and the tension sensor digital display (92) is connected with the tension sensor (91) through a data line and is used for displaying a tension value;
the detection method comprises the following steps:
step 1, turning on a laser (1) to emit a monochromatic laser beam (11);
step 2, adjusting the position and the aperture size of the light wave (4) to enable vortex light beams (12) with the topological charge number of l to pass through;
step 3, displaying interference images corresponding to two vortex beams with opposite topological charges received by an industrial camera (8) on a display of a computer (81); the interference images are arranged in a circular ring shape at equal intervals by 2l petal-shaped patterns;
step 4, adjusting a force application nut (721), enabling a screw (722) to drive a second reflecting mirror (72) to move for displacement delta L along the direction of the screw (722), enabling a corresponding interference image to rotate by taking the center of the image as a rotating shaft, enabling a previous petal-shaped image to occupy the position of an adjacent petal-shaped image, and recording a pulling force value F displayed by a digital display (92) of a pulling force sensor at the moment;
step 5, calculating the elastic modulus E of the test sample (0);
the light intensity expression of the interference image when the vortex light beams with opposite topological charges displayed on the display of the computer (81) in the step 3 interfere is shown in the formula (1):
wherein I (r) is light intensity, E l (r) represents the intensity of vortex light amplitude, which is a constant value, l represents the topological charge number of vortex light, lambda represents the vortex light wavelength, which is the same as the wavelength of the monochromatic laser beam (11), deltax represents the difference between the distance from the first vortex beam (121) to the second reflector (72) and the distance from the second vortex beam (122) to the first reflector (71), theta represents the azimuth angle of petal-shaped patterns in the interference image under the polar coordinates of the plane, and r represents the flower with the center of the interference image as the poleThe polar diameter of the petal-shaped graph;
in the step 4, each petal-shaped pattern occupies the position of the adjacent petal-shaped pattern, and the rotating included angle is thatThen there are:
the displacement Δl is therefore expressed as:
in the step 5, the elastic modulus E of the test sample (0) is:
wherein L is the original length of the test sample (0), and S is the stress area of the test sample (0);
repeating the step 4, and continuously applying force to the test sample (0) to obtain 2n groups of data, namely: f (F) 1 ,F 2 ...F n ...F 2n N is a positive integer, and the value of n is related to the material, length, cross section area and wavelength and topological charge number of vortex rotation of the test sample (0); calculating the elastic modulus of the sample to be measured by using a difference-by-difference method:
in the above formula, i is a positive integer, i is less than or equal to n,as an average of n sets of data separated by a difference, i.e
2. The method of claim 1, wherein the vortex light generating device is a fork grating, or a spiral phase Plate, or a liquid crystal Q-Plate.
3. The method according to claim 1, wherein when the test specimen (0) is a cylindrical rod-like object, the force nut (721) is adjusted in step 4 to move the second mirror (72) by a displacement Δl along the direction of the screw (722), and a tensile force is applied to the test specimen (0), and the elastic modulus E of the test specimen (0) is:
where d is the diameter of the test sample (0).
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