CN114077509A - Detection method and detection device for reliability detection of flash memory chip - Google Patents
Detection method and detection device for reliability detection of flash memory chip Download PDFInfo
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- CN114077509A CN114077509A CN202010808124.8A CN202010808124A CN114077509A CN 114077509 A CN114077509 A CN 114077509A CN 202010808124 A CN202010808124 A CN 202010808124A CN 114077509 A CN114077509 A CN 114077509A
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/008—Reliability or availability analysis
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F8/00—Arrangements for software engineering
- G06F8/60—Software deployment
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- G06F8/63—Image based installation; Cloning; Build to order
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
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Abstract
The application relates to a detection method and a detection device for detecting the reliability of a flash memory chip, which belong to the technical field of solid-state storage detection and comprise the following steps: installing a flash memory chip into a test jig; burning the RDT code into the flash memory chip by using MPTool; inserting the flash memory chip which is successfully burned with the RDT code together with the test jig into a power supply interface in the high-temperature box; electrifying the SATA power supply interface to enable BOOT of the SATA chip to load RDT codes from the flash memory chip into an RAM of the SATA chip; starting to enter an RDT offline scanning process after the SATA chip is loaded; the SATA chip scans the flash memory chip, finds out bad blocks in the flash memory chip and generates bad block information; the SATA chip calculates the particle quality of the flash memory chip by analyzing the bad block information and divides the particle quality grade of the flash memory chip; the SATA chip prompts the corresponding quality grade of the particles of the flash memory chip through the driving prompt unit. This application has the effect that improves the production efficiency of product.
Description
Technical Field
The present disclosure relates to the field of solid-state storage detection technologies, and in particular, to a method and an apparatus for detecting reliability of a flash memory chip.
Background
Flash memory (Flash), also known as Flash memory, is a form of electrically erasable programmable read only memory (eeprom), allows memory to be erased or written multiple times during operation, and is non-volatile. In the field of solid state storage, fixed hard disks (SSDs) using flash memory as a storage medium are widely used in computer storage devices, and the quality of flash memory particles on a solid state disk determines the stability of the solid state disk.
A flash memory chip is composed of two or more Die (also called chips), wherein one Die can be divided into a plurality of planes, each Plane comprises a plurality of blocks, each Block is divided into a plurality of pages, and the Die is packaged to form particles. Therefore, a Flash chip usually includes several blocks (blocks), and due to the influence and limitation of factors such as production technology and process, some blocks of the Flash chip may not be normally used when the Flash chip leaves the factory, and these blocks that cannot be used are called as "bad blocks"; therefore, before the flash memory taking the flash memory chip as a storage medium leaves a factory, each 'block' in the flash memory chip needs to be scanned and detected, the number of bad blocks in the flash memory chip is recorded, and after the scanning and the detection are completed, the firmware program is solidified into the solid state disk.
In a reliability verification (RDT) test rack in the market at present, a control chip (SATA Controller chip) of a solid state disk and a mass production tool (MPTool) are used to burn an RDT code into flash memory chip particles on a PC host, and then the test rack and the flash memory chip particles are together checked to a power supply interface inside a high temperature box to perform RDT offline scanning. Whether the RDT offline scanning is finished or not is simply judged through an LED indicator lamp on the test rack (the long-time illumination of the LED indicator lamp indicates that the RDT scanning is finished, and the flashing of the LED indicator lamp indicates that the RDT scanning is not finished). And then, reinserting the test jig corresponding to the particles after RDT scanning is finished into the PC end, and acquiring the data after RDT offline scanning by using MPTool at the PC end so as to know the quality grade classification of the particles of the flash memory chip.
The existing RDT off-line scanning technology has no participation of a PC terminal, so that information obtained from a semi-finished product plate or a commercial RDT test rack is very limited, and whether RDT is completed or not can be known only through an LED indicator lamp on the semi-finished product or the test rack. After the off-line scanning of the RDT is finished, the flash memory chip particles are classified in a grading way only after the corresponding test frame is inserted into the PC end and data is read through the MPTool of the PC end.
Aiming at the related technology, the inventor considers that the operation flow of the existing flash memory reliability verification is very complicated, so that the production efficiency of a production line is low.
Disclosure of Invention
In order to solve the problem that the existing RDT test frame needs to be connected with a PC (personal computer) end to acquire detailed information due to insufficient information, and the production efficiency of products is improved, the application provides a detection method and a detection device for detecting the reliability of a flash memory chip.
In a first aspect, the present application provides a method for detecting reliability of a flash memory chip, which adopts the following technical scheme:
a detection method for detecting the reliability of a flash memory comprises the following steps:
installing a flash memory chip into a test jig;
burning the RDT code into the flash memory chip by using MPTool;
inserting the flash memory chip which is successfully burned with the RDT code together with the test jig into a power supply interface in the high-temperature box;
electrifying the SATA power supply interface to enable BOOT of the SATA chip to load RDT codes from the flash memory chip into an RAM of the SATA chip;
starting to enter an RDT offline scanning process after the SATA chip is loaded;
the SATA chip scans the flash memory chip, finds out bad blocks in the flash memory chip and generates bad block information;
the SATA chip calculates the particle quality of the flash memory chip by analyzing the bad block information and divides the particle quality grade of the flash memory chip;
the SATA chip prompts the corresponding quality grade of the particles of the flash memory chip through the driving prompt unit.
By adopting the technical scheme, the RDT code is burnt into the flash memory chip, each block in the flash memory chip is comprehensively detected by combining software and hardware, a bad block is found out, bad block information is generated, the particle quality grade of the flash memory chip is divided according to the bad block information through the software SATA chip, and the division of the particle quality grade of the flash memory chip is prompted through the hardware prompting unit according to the SATA chip, so that the detection process of the bad block information of the flash memory chip is realized, and meanwhile, the particle quality grade of the flash memory chip is divided and displayed, and the production efficiency of products is improved.
Preferably, before burning the RDT code into the flash memory chip, the detection method further includes pre-configuring a particle quality grade parameter on the PC terminal, where the particle quality grade parameter is used to classify the particle quality grade of the flash memory chip;
when the MPTool is used for burning the RDT codes into the flash memory chip, the PC end writes the configured particle quality grade parameters into the flash memory chip;
after the SATA power supply interface is powered on, the SATA chip loads the particle quality grade parameters in the flash memory chip at the same time.
By adopting the technical scheme, the particle quality grade parameters are configured in advance at the PC terminal, so that the particle quality grade parameters can be conveniently changed when the flash memory chips of different models are detected; and simultaneously, the particle quality grade parameters are synchronously written into the flash memory chip when the RDT codes are burnt, and the particle quality grade parameters are loaded simultaneously when the SATA chip reads the RDT codes in the flash memory chip, so that the particle quality grades of the flash memory chip are divided when the SATA chip scans and detects the flash memory chip.
Preferably, the prompting unit is a nixie tube display, the nixie tube display is single digit display, and the quality grade of the flash memory chip particles is divided into 1-9 grades.
By adopting the technical scheme, the nixie tube displayer can conveniently and quickly acquire the particle quality grade corresponding to the flash memory chip through display, is not easily influenced by the outside, and is set to be single digit to reduce the space occupation of the prompt unit under the condition of meeting the requirement of particle quality grade division.
Preferably, after the SATA chip calculates the quality of the flash memory chip particles by analyzing the bad block information and performs quality classification on the flash memory chip particles, the detection method further includes the step of the SATA chip storing the quality classification of the flash memory chip particles into the flash memory chip.
By adopting the technical scheme, the particle quality grade is stored in the flash memory chip, and the prompting unit can recover the prompting of the particle quality grade after the power is cut off and the power is turned on again.
In a second aspect, the present application provides a detection apparatus for detecting reliability of a flash memory, which adopts the following technical solution:
a detection apparatus for reliability detection of a flash memory, comprising:
the test jig is used for installing the flash memory chip and carrying out RDT (remote data transfer) off-line scanning detection on the flash memory chip;
the PC end is electrically connected with the test frame and is used for burning the RDT code into the flash memory chip;
and the high-temperature box is used for installing the test jig and providing detection limit temperature for the flash memory chip.
Through adopting above-mentioned technical scheme, the flash memory chip is installed on the test jig for the flash memory chip can be connected with the PC end, thereby obtains the RDT code, and the flash memory chip carries out RDT off-line scanning on the test jig simultaneously and verifies in order to carry out the reliability, sets up the high temperature cabinet simultaneously and detects the flash memory chip under extreme temperature, with the performance that detects the flash memory chip.
Preferably, the test jig comprises a PCB mainboard and at least one detection seat arranged on the PCB mainboard and used for installing the flash memory chip, the detection seat is electrically connected with an SATA chip used for detecting and scanning the flash memory chip through the detection seat, and the SATA chip is used for searching for bad blocks in the flash memory chip and generating bad block information.
By adopting the technical scheme, the flash memory chip is electrically connected with the SATA chip or the PC end through the installation detection seat, and the SATA chip is used for scanning the flash memory chip, so that bad blocks in the flash memory chip are searched, bad block information is integrated, and a bad block information table is generated.
Preferably, the test jig further comprises at least one prompting unit, the prompting units are arranged in one-to-one correspondence with the detection seats, and the prompting units are electrically connected to the SATA chip and used for displaying the quality grade of the flash memory chip particles installed in the corresponding detection seats.
By adopting the technical scheme, the particle quality grade of the flash memory chip is prompted through the prompting unit, so that a detector can synchronously know the particle quality grade of the flash memory chip in the corresponding detection seat after detection is finished.
Preferably, the prompting unit comprises a nixie tube display and a driving circuit electrically connected between the nixie tube display and the SATA chip, and the nixie tube display is single-digit display.
By adopting the technical scheme, the driving circuit is controlled by the SATA chip and drives the nixie tube display to display, so that a detection person can quickly know the quality grade of the particles corresponding to the flash memory chip and is not easily influenced by the outside.
In summary, the present application includes at least one of the following beneficial technical effects:
1. by arranging software and hardware, the flash memory chip can simultaneously carry out particle quality grade division and display in the bad block detection scanning process so as to replace the existing manual work that the flash memory chip is taken out from a high-temperature box through a test frame, then the test frame is accessed to a PC (personal computer) end, MPtool is operated to read data, and the production efficiency of products is improved;
2. after the quality grade of the particles is classified, the quality grade of the particles is stored in Flash, and the digital tube display can restore the quality grade of the displayed particles after the power is cut off and on again.
Drawings
FIG. 1 is a flow chart of steps for reliability detection of a flash memory chip in the related art;
FIG. 2 is a flowchart of the overall steps of an embodiment of the present application;
FIG. 3 is a partial flow chart of the steps in the embodiment of the present application, mainly illustrating the steps in the K1 production phase;
FIG. 4 is a PC end interface display diagram of an embodiment of the present application, primarily illustrating a particle quality grade parameter configuration interface;
FIG. 5 is a partial flow chart of the steps of an embodiment of the present application, showing primarily the steps of the RDT production phase;
FIG. 6 is a block diagram of a portion of the structure of the embodiment of the present application, which mainly shows the connection relationship between the SATA chip and a digital tube display;
fig. 7 is a partial structural view of the embodiment of the present application, mainly showing the structure of the test rack.
Description of reference numerals: 1. a test jig; 11. a PC board; 12. detecting the seat; 13. an SATA chip; 14. a presentation unit; 141. a nixie tube display; 142. a drive circuit; 15. and the SATA power supply interface.
Detailed Description
The present application is described in further detail below with reference to figures 1-7.
Referring to fig. 1, a production process of a Solid State Disk (SSD) may be divided into a K1 production stage, an RDT production stage, a K2 production stage, and a K3 production stage, wherein the K1 production stage is to burn RDT codes into a flash memory chip using MPTool. The K2 production stage is to use the bad block information analyzed in the RDT stage to generate a corresponding bad block table when the MPTool is applied to perform the card-opening volume production of an SSD product, and the SSD subjected to the K2 production stage volume production is an available SSD solid state disk. The production stage of K3 is that the SSD solid state disk after being produced in the production stage of K2 is subjected to customer test to enable 'blocks' in a flash memory chip to be worn out and possibly generate new bad blocks, and the SSD is delivered to a customer and needs to be an unused factory initialization stage, so that the production stage of K3 is carried out on the solid state disk, and the SSD solid state disk can be delivered to an end consumer after inheriting the wear and the bad block table in the test stage. The RDT stage is an important process for scanning the quality of the flash memory chip and obtaining the quality grade of the particles of the flash memory chip, the existing method generally utilizes a PC end to carry out the grade division of the quality grade of the particles or directly pastes the particles on a PCB board to carry out RDT, and the RDT is followed by a K2 production flow directly, wherein the former has the defects that the production process needs to be additionally added with a flow, the flow is complicated, and the efficiency is low; the latter has the disadvantages that the K2 production is bad in card opening, the intelligent repair is carried out due to the bad quality of the particles, the particles with better quality are replaced, the paster is carried out, the K2 production flow is carried out, certain manpower and material resources are consumed in the process, and the efficiency is low.
The embodiment of the application discloses a method for detecting the reliability of a flash memory chip. Referring to fig. 2, the detection method specifically includes the following steps:
mounting a flash memory chip in a test jig 1;
and burning the RDT code into the flash memory chip by using MPTool.
Referring to fig. 2 to 4, specifically, the two steps are referred to as a K1 production phase, the MPTool of the RDT testing scheme supported by the PC end needs to be opened first, then the test rack 1 is placed in the flash memory chip to be subjected to RDT testing, the test rack 1 is plugged into the PC port, and the RDT offline scanning parameters are configured through the PC end. Before burning the RDT code into the flash memory chip, the detection method also comprises the step of pre-configuring a particle quality grade parameter on the PC terminal, wherein the particle quality grade parameter is used for dividing the particle quality grade of the flash memory chip, so that the particle quality grade of the flash memory chip is conveniently divided when the SATA chip 13 scans the flash memory chip. The classification of the particle quality grades is mainly based on the number of bad blocks and the particle quality grade configuration interface of the PC end, and a detector can set the maximum number of the bad blocks of the corresponding grade according to the quality requirement. After the PC end completes parameter configuration on the particle quality grade parameters, the RDT codes are burnt into the flash memory chip through the PC end, and meanwhile, the particle quality grade parameters are written into the flash memory chip.
Inserting the flash memory chip which is successfully burned with the RDT code together with the test jig 1 into a power supply interface in a high-temperature box;
powering on the SATA power supply interface 15, so that the BOOT of the SATA chip 13 loads the RDT code from the flash memory chip into the RAM of the SATA chip 13;
after the SATA chip 13 is loaded, starting to enter an RDT offline scanning process;
the SATA chip 13 scans the flash memory chip, finds out bad blocks in the flash memory chip and generates bad block information;
the SATA chip 13 calculates the quality of the flash memory chip particles by analyzing the bad block information and divides the quality grades of the flash memory chip particles;
the SATA chip 13 prompts the corresponding flash memory chip particle quality level through the driving prompting unit 14.
Referring to fig. 2 and 5, specifically, the above two steps are referred to as an RDT production phase, after the flash memory chip is burned at the PC end, the flash memory chip on which the RDT code is successfully burned is placed in the high temperature box together with the test rack 1, and the SATA power supply interface 15 is plugged into a corresponding power supply interface in the high temperature box, and at this time, the corresponding power supply interface in the high temperature box does not supply power to the SATA power supply interface 15. The temperature of the high-temperature box is controlled to rise, when the temperature in the high-temperature box rises to a preset detection limit temperature value, the corresponding interface of the high-temperature box is controlled to supply power to the SATA power supply interface 15, the SATA chip 13 is powered on, at the moment, BOOT of the SATA chip 13 loads RDT codes burnt in the flash memory chip from the flash memory chip and writes particle quality grade parameters in the flash memory chip into RAM of the SATA chip 13, and the limit temperature value required to be detected by the flash memory chip in the application is 70 ℃. After the SATA chip 13 is powered on, the LED indicator light on the test rack 1 is usually turned on for one minute, and then the RDT offline scanning process is started, and the LED indicator light flickers at a frequency of 1 second in the RDT offline scanning process. In the RDT offline scanning process, the SATA chip 13 scans the flash memory chip through the RDT erasing and reading formal scanning process, finds out a bad block in the flash memory chip, and generates bad block information. The SATA chip 13 calculates the particle quality of the flash memory chip by analyzing the bad block information, and the SATA chip 13 classifies the particle quality grades of the flash memory chip according to the particle grade parameters configured by the PC terminal in the K1 production stage, the particle quality grades are classified into 1-9 and 9 grades in the application, and the lower the particle quality grade number of the flash memory chip is, the higher the particle quality grade of the flash memory chip is, that is, the quality of the flash memory chip particles when the number displayed by the digital tube display 141 is 1 is higher than the quality of the flash memory chip particles when the number displayed by the digital tube display 141 is 9, the flash memory chips with different grades are used for producing solid state disks with different qualities, for example a flash chip of class 1 is commonly used in the production of a solid state disk of 4Plane128G, a flash chip of class 2 is used in the production of a solid state disk of 2Plane128G, a flash memory chip of grade 3 was used in the production of a solid state disk of 4Plane 64G.
Referring to fig. 6, in order to facilitate the detection personnel to quickly know the quality grade of the flash memory chip particles, a prompt unit 14 is further arranged on the test rack 1, the prompt unit 14 is electrically connected with the SATA chip 13 and is used for indicating the corresponding quality grade of the flash memory chip particles, the prompt unit 14 can adopt voice prompt or light prompt, in this application, the prompt unit 14 preferably adopts light prompt, the prompt unit 14 adopts a digital tube display 141 and a driving circuit 142 connected with the digital tube display 141, a driving circuit 142 is arranged between the digital tube display 141 and the SATA chip 13, and the SATA chip 13 controls the driving circuit 142 to drive the digital tube display 141 to display the corresponding quality grade of the flash memory chip particles through a high level or a low level output from a bottom layer I \ O port.
Referring to fig. 5, in order to facilitate the digital display 141 to recover the display particle quality level after power is turned off and then powered on again, the SATA chip 13 calculates the particle quality level of the flash memory chip and stores the particle quality level in the flash memory chip while displaying the particle quality level in the digital display 141.
After the RDT offline scanning process is finished, the LED indicator lamps of the test rack 1 are normally on, and then the K2 production stage is continued after quality classification and PCB bonding according to the quality grade of the particles displayed by the nixie tube display 141.
The embodiment of the application also discloses a device for detecting the reliability of the flash memory chip. With reference to fig. 6 and 7, the detection device includes:
the test jig 1 is used for installing a flash memory chip and performing RDT (remote data transfer) off-line scanning detection on the flash memory chip;
the PC end is electrically connected with the test frame 1 and is used for burning the RDT code into the flash memory chip;
and the high-temperature box is used for installing the test jig 1 and providing detection limit temperature for the flash memory chip.
Before the test jig 1 carries out RDT offline scanning detection on the flash memory chip, the flash memory chip is firstly installed in the test jig 1, then the test jig 1 is connected with a PC end, the RDT code is burnt into the flash memory chip through the PC end, and after the RDT code is successfully burnt into the flash memory chip, the test jig 1 is pulled out from the PC end and is inserted into a high-temperature box. The high temperature box is preset with a detection limit temperature value to provide the detection limit temperature for the flash memory chip so as to detect the performance of the flash memory chip under the high temperature condition. The PC end and the high-temperature box can be extended to the PC end and the high-temperature box in the existing RDT detection.
Referring to fig. 7, the test jig 1 includes a PCB main board, at least one detection seat 12 disposed on the PCB main board for installing a flash memory chip, the detection seat 12 is electrically connected to an SATA chip 13 for scanning the flash memory chip through the detection seat 12, and the flash memory chip is installed and placed in the detection seat 12, so that the flash memory chip is conducted with the SATA chip 13. The PCB is also provided with an SATA power supply interface 15, and the SATA power supply interface 15 is used for connecting an external power supply and supplying power to the SATA chip 13.
After the SATA power supply interface 15 is powered on, the SATA chip 13 scans the flash memory chip in the detection holder 12, finds a bad block in the flash memory chip, and generates bad block information, and the SATA chip 13 calculates the quality of the corresponding flash memory chip particles by analyzing the bad block information and divides the quality grade of the flash memory chip particles.
Specifically, firstly, a PC end is required to be opened to support MPTool of an RDT (remote data technology) encoding scheme, then a test frame 1 is placed into a flash memory chip to be subjected to RDT encoding, the test frame 1 is inserted into a PC port, RDT offline scanning parameters are configured through the PC end, meanwhile, in order to facilitate the SATA (serial advanced technology attachment) chip 13 to divide the particle quality grade of the flash memory chip when scanning the flash memory chip, the PC end is also pre-configured with particle quality grade parameters, after the parameter configuration is completed, RDT codes are burnt into the flash memory chip through the PC end, and meanwhile, the particle quality grade parameters are written into the flash memory chip.
Referring to fig. 6 and 7, in order to facilitate the inspector to quickly know the quality grade of the particles corresponding to the flash memory chip in the detection base 12, the PCB is further provided with prompt units 14 corresponding to the detection base 12 one to one, the prompt units 14 can adopt voice prompt or light prompt, and the prompt units 14 in the application adopt light prompt. The prompt unit 14 includes a digital display 141 and a driving circuit 142 electrically connected between the digital display 141 and the SATA chip 13, and the driving circuit 142 drives the prompt unit 14 to display the quality level of the particles of the flash memory chip.
Referring to fig. 6, in the present application, the number of the detection sockets 12 is two, and the number of the flash memory chips detected at the same time is increased under the condition that the SATA chip 13 has enough connection pins, so as to improve the detection efficiency. In the present application, since there are two detection sockets 12, there are two driving circuits 142, and the driving circuit 142 includes a nixie tube driving IC, in the present application, the nixie tube driving IC preferably uses a CD4511B chip. The SATA chip 13 controls the driving circuit 142 to drive the digital tube display 141 to display the quality grade of the corresponding flash memory chip particles through the high level or the low level output by the bottom I \ O port.
Referring to fig. 7, the SATA chip 13 performs a particle quality classification on the flash memory chip detected by the SATA chip according to the bad block information of the flash memory chip detected by the SATA chip and a pre-configured particle quality classification parameter. In order to facilitate the digital display 141 to display the quality grade of the flash memory chip particles, the quality grade of the flash memory chip particles can be divided into 1-9 grades, and the digital display 141 displays the flash memory chip particles in single digit, wherein the lower the number of the quality grade of the flash memory chip particles is, the higher the quality grade of the flash memory chip particles is, that is, the quality of the flash memory chip particles when the number displayed by the digital display 141 is 1 is higher than the quality of the flash memory chip particles when the number displayed by the digital display 141 is 9.
The above embodiments are preferred embodiments of the present application, and the protection scope of the present application is not limited by the above embodiments, so: all equivalent changes made according to the structure, shape and principle of the present application shall be covered by the protection scope of the present application.
Claims (8)
1. A detection method for detecting reliability of a flash memory chip is characterized by comprising the following steps: the method comprises the following steps:
mounting the flash memory chip in a test jig (1);
burning the RDT code into the flash memory chip by using MPTool;
inserting the flash memory chip which is successfully burned with the RDT code together with the test frame (1) into a power supply interface in the high-temperature box;
powering on the SATA power supply interface (15), so that BOOT of the SATA chip (13) loads RDT codes from the flash memory chip into RAM of the SATA chip (13);
after the loading of the SATA chip (13) is finished, starting to enter an RDT offline scanning process;
the SATA chip (13) scans the flash memory chip, finds out bad blocks in the flash memory chip and generates bad block information;
the SATA chip (13) calculates the particle quality of the flash memory chip by analyzing the bad block information and divides the particle quality grade of the flash memory chip;
the SATA chip (13) prompts the corresponding flash memory chip particle quality grade through a driving prompt unit (14).
2. The method of claim 1, wherein the method comprises:
before burning the RDT code into the flash memory chip, the detection method also comprises the steps of pre-configuring a particle quality grade parameter on the PC terminal, wherein the particle quality grade parameter is used for dividing the particle quality grade of the flash memory chip;
when the MPTool is used for burning the RDT codes into the flash memory chip, the PC end writes the configured particle quality grade parameters into the flash memory chip;
after the SATA power supply interface (15) is powered on, the SATA chip (13) loads the particle quality grade parameters in the flash memory chip at the same time.
3. The method of claim 2, wherein the method comprises: the prompting unit (14) is a nixie tube display (141), the nixie tube display (141) is single digit display, and the quality grade of the flash memory chip particles is divided into 1-9 grades.
4. The method of claim 2, wherein the method comprises: after the SATA chip (13) calculates the quality of the flash memory chip particles by analyzing the bad block information and performs quality grade division on the flash memory chip particles, the detection method further comprises the step that the SATA chip (13) stores the quality grade of the flash memory chip particles into the flash memory chip.
5. The utility model provides a detection device that flash memory chip reliability detected which characterized in that: the method comprises the following steps:
the test jig (1) is used for installing a flash memory chip and carrying out RDT (remote data transfer) off-line scanning detection on the flash memory chip;
the PC end is electrically connected to the test frame (1) and is used for burning the RDT code into the flash memory chip;
and the high-temperature box is used for installing the test jig (1) and providing detection limit temperature for the flash memory chip.
6. The apparatus of claim 5, wherein the flash memory chip comprises: the test jig (1) comprises a PCB mainboard and at least one detection seat (12) arranged on the PCB mainboard and used for installing a flash memory chip, wherein the detection seat (12) is electrically connected with a SATA chip (13) used for detecting and scanning the flash memory chip through the detection seat (12), and the SATA chip (13) is used for searching a bad block in the flash memory chip and generating bad block information.
7. The apparatus of claim 6, wherein the flash memory chip comprises: the test jig (1) further comprises at least one prompting unit (14), the prompting units (14) and the detection bases (12) are arranged in a one-to-one correspondence mode, and the prompting units (14) are electrically connected to the SATA chips (13) and used for displaying the quality grades of the flash memory chips installed in the corresponding detection bases (12).
8. The apparatus of claim 7, wherein the flash memory chip comprises: the prompting unit (14) comprises a digital tube display (141) and a driving circuit (142) electrically connected between the digital tube display (141) and the SATA chip (13), and the digital tube display (141) is single-digit display.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114822677A (en) * | 2022-05-20 | 2022-07-29 | 深圳市金胜电子科技有限公司 | Information recording method and device of NAND flash memory chip, electronic equipment and medium |
| CN116994632A (en) * | 2023-06-30 | 2023-11-03 | 珠海妙存科技有限公司 | Flash memory particle grading method, system, controller and medium based on reading time |
| CN117809725A (en) * | 2024-03-01 | 2024-04-02 | 四川云海芯科微电子科技有限公司 | Flash memory particle screening and grading method |
-
2020
- 2020-08-12 CN CN202010808124.8A patent/CN114077509A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114822677A (en) * | 2022-05-20 | 2022-07-29 | 深圳市金胜电子科技有限公司 | Information recording method and device of NAND flash memory chip, electronic equipment and medium |
| CN116994632A (en) * | 2023-06-30 | 2023-11-03 | 珠海妙存科技有限公司 | Flash memory particle grading method, system, controller and medium based on reading time |
| CN116994632B (en) * | 2023-06-30 | 2024-04-19 | 珠海妙存科技有限公司 | Flash memory particle grading method, system, controller and medium based on reading time |
| CN117809725A (en) * | 2024-03-01 | 2024-04-02 | 四川云海芯科微电子科技有限公司 | Flash memory particle screening and grading method |
| CN117809725B (en) * | 2024-03-01 | 2024-05-14 | 四川云海芯科微电子科技有限公司 | Flash memory particle screening and grading method |
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