CN113899396A - Miniaturized space radiation effect risk monitoring system - Google Patents
Miniaturized space radiation effect risk monitoring system Download PDFInfo
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- CN113899396A CN113899396A CN202111078320.5A CN202111078320A CN113899396A CN 113899396 A CN113899396 A CN 113899396A CN 202111078320 A CN202111078320 A CN 202111078320A CN 113899396 A CN113899396 A CN 113899396A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D21/00—Measuring or testing not otherwise provided for
- G01D21/02—Measuring two or more variables by means not covered by a single other subclass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D11/00—Component parts of measuring arrangements not specially adapted for a specific variable
- G01D11/24—Housings ; Casings for instruments
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/02—Dosimeters
- G01T1/026—Semiconductor dose-rate meters
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
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Abstract
The invention provides a miniaturized space radiation effect risk monitoring system which comprises a detector shell, a charged probe module, a total dose effect probe module, a displacement probe module, a single event upset sensitive probe module, a driving module, a measuring module, a digital processing module and a power supply module, wherein the charged probe module is arranged in the detector shell; the live probe module is of a stacked telescope structure and comprises an insulating support, and a surface current probe, a surface potential probe and an inner live current probe which are sequentially stacked in the insulating support from top to bottom, wherein the inner live current probe comprises two or more inner live current probes with different shielding depths. The invention innovatively provides a stacked telescope type probe structure, the measurement precision is improved by approximate point measurement, the circuit and integrated design are simplified by adopting the ways of digital signal processing and the like, the monitoring device is miniaturized and lightened, the resource occupation amount of a satellite platform is reduced, and the test precision and the reliability of the device are further improved by the anti-interference design on the circuit and the structure.
Description
Technical Field
The invention relates to the technical field of measurement and testing, in particular to a miniaturized space radiation effect risk monitoring system.
Background
The space radiation effect refers to the phenomena of performance degradation, function obstruction or loss of space components and materials under the action of space radiation particles. The main space radiation effect comprises a surface charging effect, an inner charging effect, a total dose effect, a displacement damage effect, a single event upset effect and the like.
The surface charging effect is that charges are accumulated on the surface of the spacecraft due to the interaction between the spacecraft and a surface material after the spacecraft is impacted and collided by high-energy charged particles in space during the on-orbit operation, so that the surface charging phenomenon is caused. The energetic charged particles generate a charging potential and a charging current in the material.
The internal charging effect is caused by the fact that the spacecraft is immersed in a high-energy electronic environment for a long time, and high-energy electrons penetrate through the cabin wall of the spacecraft, are deposited on materials such as internal electronic devices and the like, and are charged.
The total dose effect is a phenomenon that a large amount of radiation particles enter the interior of a semiconductor device material and are ionized with electrons outside the atomic nucleus of the material to generate additional charges, and the charges are accumulated on an oxide layer in the device, so that the performance of the device is degraded and even finally lost.
The displacement damage effect is a phenomenon that a large number of radiation particles enter the interior of a semiconductor device material and elastically collide with atomic nuclei of the material to cause displacement of material lattice atoms, so that defects are generated in the interior of the device material, the service life of minority carriers is influenced, and the related performance of the device is gradually reduced and even finally lost.
The single event upset effect is the phenomenon of the change or damage of the logic state, function and performance of a device caused by the additional charge formed by the direct ionization action or the indirect ionization action of secondary particles generated by nuclear reaction in the device material, wherein the additional charge is single high-energy heavy particles or protons in space.
The inner charging effect, the total dose effect and the displacement damage effect are different effects generated when radiation penetrates through the cabin wall of the spacecraft and enters the spacecraft, so that the radiation effect under different shielding thicknesses is monitored when the risk caused by space radiation is judged.
At present, few spacecraft space radiation effect risk monitoring devices are used in China, technical conditions are not mature, a plurality of different space radiation effects cannot be monitored in real time through simple structural design and circuit design, and meanwhile, the monitoring devices are large in size and cannot efficiently utilize precious satellite platform resources.
Disclosure of Invention
The invention provides a telescope-type probe structure for spatial radiation effect risk monitoring, which improves the measurement precision by approximate point measurement, simplifies circuits and integrated design by adopting ways of digital signal processing and the like, miniaturizes and lightens a monitoring device, reduces the occupancy of satellite platform resources, and further improves the test precision and the reliability of the device by the anti-interference design on the circuits and the structure.
The invention provides a miniaturized space radiation effect risk monitoring system which comprises a detector shell, a charged probe module, a total dose effect probe module and a displacement probe module which are arranged on the upper surface of the detector shell, a single-particle upset sensitive probe module arranged in the detector shell, a driving module and a measuring module which are electrically connected with the charged probe module, the total dose effect probe module and the displacement probe module, a digital processing module which is electrically connected with the single-particle upset sensitive probe module and the measuring module, a communication module which is electrically connected with the digital processing module and a power supply module which is electrically connected with the driving module, the measuring module, the digital processing module and the communication module;
the detector shell is used for protecting the photoelectric probe module, the total dose effect probe module, the displacement probe module, the single event upset sensitive probe module, the driving module, the measuring module, the word processing module and the communication module and is arranged on a satellite platform;
the charged probe module, the total dose effect probe module, the displacement probe module and the single event upset sensitive probe module are used for receiving space environment radiation and converting the space environment radiation into analog signals for output;
the driving module is used for driving the electric probe module, the total dose effect probe module and the displacement probe module to work;
the measuring module is used for conditioning the analog signal and outputting the conditioned signal to the digital processing module;
the digital processing module is used for controlling the measurement module to acquire analog signals, calculating, correcting and framing the analog signals and then sending the analog signals to the superior equipment through the communication module, and the digital processing module is used for detecting the analog signals acquired by the single event upset sensitive probe module, calculating, correcting and framing the analog signals and then sending the analog signals to the superior equipment through the communication module;
the power supply module is used for supplying power;
the electrified probe module is of a stacked telescope structure and comprises an insulating support, and a surface current probe, a surface potential probe and an internal electrified current probe which are sequentially stacked in the insulating support from top to bottom, wherein the internal electrified current probe comprises two or more internal electrified current probes with different shielding depths;
the live probe module is used for carrying out same-position measurement of surface current, surface potential and internal live current and converting the same-position measurement into analog signal output, the surface current probe is used for carrying out surface current measurement and shielding interference for the surface potential probe and the internal live current probe, the surface potential probe is used for carrying out surface potential measurement and shielding interference for the internal live current probe, the internal live current probe is used for carrying out internal live current measurement of different shielding thicknesses and converting the internal live current to obtain the internal live current of the equivalent shielding thickness, and an internal live current model is established.
The invention relates to a miniaturized space radiation effect risk monitoring system, which is characterized in that as a preferred mode, a surface current probe comprises a conductor plate, and a surface potential probe comprises an insulating medium and a conductor plate electrode;
the internal live current probe comprises a first internal live current probe, a second internal live current probe and a third internal live current probe which are sequentially stacked in the insulating support from top to bottom, and the first internal live current probe, the second internal live current probe and the third internal live current probe are fixed on the copper-clad laminate.
According to the miniaturized space radiation effect risk monitoring system, as an optimal mode, the total dose effect probe module and the displacement probe module are arranged on the same circuit board.
The miniaturized space radiation effect risk monitoring system is used as an optimal mode, and the total dose effect probe module is used for realizing total dose effect detection of multi-shielding thickness through different heights of steps on the outer side of a detector shell;
the total dose effect probe module comprises a 0mm shielding thickness total dose effect probe, a 1mm shielding thickness total dose effect probe, a 2mm shielding thickness total dose effect probe and a 3mm shielding thickness total dose effect probe;
the total dose effect probe module uses PMOS field effect transistors;
the displacement probe module comprises four displacement probes, each displacement probe and a total dose effect probe are integrated on a circuit board, and the displacement probes use photodiodes.
The invention relates to a miniaturized space radiation effect risk monitoring system, which is preferably characterized in that a single event upset sensitive probe module comprises an SRAM (static random access memory) device for storing measurement data, a digital processing module judges whether single event upset occurs or not by carrying out timing check and refreshing on the measurement data and carrying out data bit comparison, if the data bit is abnormal, the single event upset is judged to occur, and if the data bit is not abnormal, the single event upset is judged not to occur.
The miniaturized space radiation effect risk monitoring system is preferably characterized in that the single-particle overturning sensitive probe module is detachable, an SRAM device is taken out and placed on one side of a radiation source for calibration when the single-particle overturning sensitive probe module is calibrated, and the SRAM device is inserted into the detector shell after calibration.
The invention relates to a miniaturized space radiation effect risk monitoring system, which is used as an optimal mode, wherein a driving module is a constant current source driving circuit;
the measuring module comprises a surface potential measuring circuit, a surface current measuring circuit, an internal charged current measuring circuit, a total dose effect measuring circuit and a displacement effect measuring circuit.
The invention relates to a miniaturized space radiation effect risk monitoring system, which is used as an optimal mode, wherein a surface potential measuring circuit comprises an ultrahigh impedance low-bias operational amplifier, a multilayer shielding cable, a potential protection ring, a protection grid and a protection layer;
the surface current measuring circuit comprises an ultrahigh impedance low bias current operational amplifier, a multilayer shielding cable, a potential protection ring, a protection grid and a protection layer;
the internal live current measuring circuits comprise ultrahigh-impedance low-bias operational amplifiers, multilayer shielding cables, potential protection rings, protection grids and protection layers;
the total dose effect measuring circuit and the displacement effect measuring circuit both use a multi-path analog switch switching path.
The invention relates to a miniaturized space radiation effect risk monitoring system, which is used as a preferred mode, wherein a digital processing module comprises an ARM, an ADC and a multi-path analog switch;
the communication module uses an RS422 interface and a UART communication protocol.
According to the miniaturized space radiation effect risk monitoring system, as a preferable mode, the detector shell comprises a plurality of layers of shells, and the shells of the layers are connected through sub-ports.
The invention adopts the following technical scheme:
a miniaturized space radiation effect risk monitoring device comprises a power supply module, a first detection module and a second detection module, wherein the power supply module is used for supplying power to the miniaturized space radiation effect risk monitoring device; the probe module is used for receiving the radiation of the space environment and converting the radiation effect into a related analog signal; the driving module is used for driving the probe module to normally work; the measuring module is used for conditioning the analog signal converted by the probe module and outputting the conditioned signal to the digital processing module; the digital processing module is used for controlling the measurement module to acquire the analog signal of the probe module, and sending the analog signal to the superior equipment through the communication module after calculation, correction and framing; the communication module is used for sending the data information processed by the processing module; the detector shell is used for protecting internal probes and circuits and is installed on a satellite platform.
Further, miniaturized space radiation effect risk monitoring devices, characterized in that, the probe module includes 1 area electric probe module, 4 total dose effect probes and displacement effect probes and 1 single event upset sensitive probe of different shielding thickness (0mm, 1mm, 2mm, 5 mm).
Furthermore, miniaturized space radiation effect risk monitoring devices, its characterized in that, electrified probe module includes 1 surface potential probe, 1 surface current probe, 3 different shielding depth's interior electrified current probe.
Furthermore, the miniaturized space radiation effect risk monitoring device is characterized in that a total dose effect probe adopts a PMOS field effect transistor, a displacement effect probe adopts a photodiode, and a single-particle upset sensitive probe adopts an SRAM device.
Further, miniaturized space radiation effect risk monitoring devices, its characterized in that, the design of integrating is carried out to the probe module, effectively reduces the complete machine volume. The electrified probe module adopts a stacked telescope type structure, and 4 total dose effect probes and displacement effect probes with different shielding thicknesses are integrated on a circuit board, so that the electrical connection is simplified.
Furthermore, miniaturized space radiation effect risk monitoring devices, its characterized in that, the surface potential probe comprises insulating medium and conductor plate electrode, and surface current probe adopts the conductor plate, and interior electrified current probe adopts copper clad laminate.
Further, the miniaturized space radiation effect risk monitoring device is characterized in that in order to protect the total dose effect probe and the displacement effect probe from being damaged by irradiation in a calibration experiment, the SRAM device is connected with an external calibration device through an interface when the single-particle upset sensitive probe is calibrated, and the SRAM device is inserted back into the device again to reserve the slot after the calibration is completed.
And after the SRAM is calibrated, inserting the SRAM into a product. Because the calibration experiment of the SRAM has radiation influence on other probes, the calibration experiment needs to be performed outside, and plugs are used for connecting cables, so that the SRAM is separately placed near a radiation source.
Further, miniaturized space radiation effect risk monitoring devices, characterized in that, the drive module is constant current source drive circuit, and the effect is that the electric current adds on total dose effect probe.
Further, miniaturized space radiation effect risk monitoring devices, its characterized in that, measuring module includes surface potential measuring circuit, surface current measuring circuit, interior electrified current measuring circuit, total dose effect measuring circuit and displacement effect measuring circuit.
Furthermore, the miniaturized space radiation effect risk monitoring device is characterized in that the surface potential measuring circuit, the surface current measuring circuit and the inner live current measuring circuit all adopt ultrahigh impedance and low bias current operational amplifiers, the measuring circuits are easily interfered by the outside, such as leakage current, static electricity, piezoelectricity and the like, so that equipotential shielding is carried out to reduce electrostatic interference and electromagnetic interference, and multilayer shielding cables are adopted to reduce interference introduced by a cable transmission path; and the design of a potential protection ring, a protection grid and a protection layer is adopted, so that the influence of leakage current of the printed board is reduced.
Furthermore, miniaturized space radiation effect risk monitoring devices, characterized in that, total dose effect measuring circuit and displacement effect measuring circuit adopt multichannel analog switch switching path to measure, reduce the hardware circuit, make the printed board miniaturized.
Furthermore, miniaturized space radiation effect risk monitoring devices, its characterized in that, digital processing module includes ARM, ADC, multichannel analog switch etc..
Furthermore, the miniaturized space radiation effect risk monitoring device is characterized in that the digital processing module adopts an integrated chip to control and process signals, the number of devices is greatly reduced, the circuit design of the whole machine is simplified, the area of a printed board is effectively reduced, and meanwhile, the dynamic logic can reduce power consumption.
Further, miniaturized space radiation effect risk monitoring devices, characterized in that, communication module adopts RS422 interface and UART communication protocol.
Furtherly, miniaturized space radiation effect risk monitoring devices, its characterized in that, the detector casing promotes electromagnetic compatibility through anti-interference design, improves device measurement accuracy.
The invention has the following advantages:
(1) the invention has small volume, light weight, low power consumption, low resource occupation of the satellite platform, high approximate point measurement precision and simple installation and use, and is very favorable for carrying and applying to various large, medium and small satellite platforms under the existing condition and carrying out multi-point space environment measurement; according to the invention, through the combined arrangement of various probes, under different shielding thicknesses, the discrimination of space radiation effect multiparameters such as surface charging effect, internal charging effect, total dose effect, displacement damage effect, single event upset effect and other risks can be realized;
(2) the charged probe module adopts a stacked telescope type structure, the same-position measurement is respectively carried out on the surface charging current, the surface charging potential and the internal charged current, the measurement precision is provided, and meanwhile, the internal charged current probe can measure the internal charged current with different equivalent shielding thicknesses and establish an internal charged current model through the structure.
(3)4 total dose effect probes and displacement effect probes with different shielding thicknesses are integrated on a circuit board, so that the electrical connection is simplified; because the measuring circuit of the measuring module is easily interfered by the outside, such as leakage current, static electricity, piezoelectricity and the like, equipotential shielding is carried out to reduce electrostatic interference and electromagnetic interference, a multilayer shielding cable is adopted to reduce interference introduced into a cable transmission path, and a potential protection ring, a protection grid and a protection layer are adopted to reduce the influence of printed board leakage current and the like; the total dose effect measuring circuit and the displacement effect measuring circuit adopt a multi-path analog switch switching path for measurement, hardware lines are reduced, and a printed board is miniaturized.
(4) The digital processing module adopts an integrated chip to control and process signals, so that the number of devices is greatly reduced, the circuit design of the whole machine is simplified, the area of a printed board is effectively reduced, and meanwhile, the dynamic logic can reduce the power consumption; the detector shell improves electromagnetic compatibility through anti-interference design, and improves the measurement accuracy of the device.
Drawings
FIG. 1 is a block diagram of a miniaturized spatial radiation effect risk monitoring system;
FIG. 2 is a schematic view of a probe of a miniaturized spatial radiation effect risk monitoring system;
fig. 3 is a telescope type structure diagram of a charged probe module of a miniaturized space radiation effect risk monitoring system.
Reference numerals:
1. a probe housing; 2. a live probe module; 21. an insulating support; 22. a surface current probe; 23. a surface potential probe; 24. an internal live current probe; 241. a first inner live current probe; 242. a second inner live current probe; 243. a third inner live current probe; 3. a total dose effect probe module; 31. a 0mm shield thickness total dose effect probe; 32. 1mm shield thickness total dose effect probe; 33. 2mm shield thickness total dose effect probe; 34. a 3mm shield thickness total dose effect probe; 4. a displacement probe module; 5. a single event upset sensitive probe module; 6. a drive module; 7. a measurement module; 8. a digital processing module; 9. a communication module; 10. and a power supply module.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.
Example 1
As shown in fig. 1-2, a miniaturized spatial radiation effect risk monitoring system includes a detector housing 1, a charged probe module 2, a total dose effect probe module 3, a displacement probe module 4 disposed on the upper surface of the detector housing 1, a single event upset sensitive probe module 5 disposed inside the detector housing 1, a driving module 6 and a measuring module 7 electrically connected to the charged probe module 2, the total dose effect probe module 3, and the displacement probe module 4, a digital processing module 8 electrically connected to the single event upset sensitive probe module 5 and the measuring module 7, a communication module 9 electrically connected to the digital processing module 8, and a power module 10 electrically connected to the driving module 6, the measuring module 7, the digital processing module 8, and the communication module 9;
the detector shell 1 is used for protecting the photoelectric probe module 2, the total dose effect probe module 3, the displacement probe module 4, the single event upset sensitive probe module 5, the driving module 6, the measuring module 7, the word processing module 8 and the communication module 9, and is installed on a satellite platform;
the detector shell 1 comprises a plurality of layers of shells, and the shells are connected by using sub-ports;
the charged probe module 2, the total dose effect probe module 3, the displacement probe module 4 and the single event upset sensitive probe module 5 are used for receiving space environment radiation and converting the space environment radiation into analog signals for output;
as shown in fig. 3, the live probe module 2 is a telescope-type structure, the live probe module 2 includes an insulating support 21, and a surface current probe 22, a surface potential probe 23, and an internal live current probe 24 that are sequentially stacked in the insulating support 21 from top to bottom, and the internal live current probe 24 includes two or more internal live current probes with different shielding depths;
the live probe module 2 is used for carrying out same-position measurement of surface current, surface potential and internal live current and converting the same-position measurement into an analog signal for outputting, the surface current probe 22 is used for carrying out surface current measurement and shielding interference for the surface potential probe 23 and the internal live current probe 24, the surface potential probe 23 is used for carrying out surface potential measurement and shielding interference for the internal live current probe 24, the internal live current probe 24 is used for carrying out internal live current measurement of different shielding thicknesses and converting the internal live current to obtain the internal live current of the equivalent shielding thickness, and an internal live current model is established;
the surface current probe 22 comprises a conductor plate, and the surface potential probe 23 comprises an insulating medium and a conductor plate electrode;
the inner live current probe 24 comprises a first inner live current probe 241, a second inner live current probe 242 and a third inner live current probe 243 which are sequentially stacked in the insulating bracket 21 from top to bottom, and the first inner live current probe 241, the second inner live current probe 242 and the third inner live current probe 243 are fixed on the copper-clad laminate;
the driving module 6 is used for driving the electric probe module 2, the total dose effect probe module 3 and the displacement probe module 4 to work;
the measuring module 7 is used for conditioning the analog signal and outputting the conditioned signal to the digital processing module 8;
the digital processing module 8 is used for controlling the measurement module 7 to collect analog signals, calculate, correct and frame the analog signals and then send the analog signals to a superior device through the communication module 9, and the digital processing module 8 is used for detecting the analog signals collected by the single event upset sensitive probe module 5, calculating, correcting and frame the analog signals and then sending the analog signals to the superior device through the communication module 9;
the power supply module 10 is used for supplying power;
the total dose effect probe module 3 and the displacement probe module 4 are arranged on the same circuit board; the total dose effect probe module 3 is used for realizing total dose effect detection of multi-shielding thickness through different heights of steps on the outer side of the detector shell 1;
the total dose effect probe module 3 comprises a 0mm shielding thickness total dose effect probe 31, a 1mm shielding thickness total dose effect probe 32, a 2mm shielding thickness total dose effect probe 33 and a 3mm shielding thickness total dose effect probe 34;
the total dose effect probe module 3 uses a PMOS field effect transistor;
the displacement probe module 4 comprises four displacement probes, each displacement probe and a total dose effect probe are integrated on a circuit board, and the displacement probes use photodiodes;
the single event upset sensitive probe module 5 comprises an SRAM device for storing measurement data, the digital processing module 8 judges whether single event upset occurs or not by timing check and refresh of the measurement data and data bit comparison, if the data bit is abnormal, the single event upset is judged to occur, and if the data bit is not abnormal, the single event upset is judged not to occur;
the single-particle upset sensitive probe module 5 is detachable, and when the single-particle upset sensitive probe module 5 is calibrated, the SRAM device is taken out and placed on one side of a radiation source for calibration, and then is inserted into the detector shell 1 after calibration;
the driving module 6 is a constant current source driving circuit;
the measuring module 7 comprises a surface potential measuring circuit, a surface current measuring circuit, an internal charged current measuring circuit, a total dose effect measuring circuit and a displacement effect measuring circuit;
the surface potential measuring circuit comprises an ultrahigh impedance low-bias operational amplifier, a multilayer shielding cable, a potential protection ring, a protection grid and a protection layer;
the surface current measuring circuit comprises an ultrahigh impedance low bias current operational amplifier, a multilayer shielding cable, a potential protection ring, a protection grid and a protection layer;
the internal live current measuring circuits comprise ultrahigh-impedance low-bias operational amplifiers, multilayer shielding cables, potential protection rings, protection grids and protection layers;
the total dose effect measuring circuit and the displacement effect measuring circuit both use a multi-path analog switch switching path;
the digital processing module 8 comprises an ARM, an ADC and a multi-path analog switch;
the communication module 9 uses an RS422 interface and a UART communication protocol.
Example 2
Fig. 1 shows a system architecture diagram of the present embodiment, which includes a power module 10, a probe module, a driving module 6, a measuring module 7, a digital processing module 8, a communication module 9, and a detector housing 1. The power module 10 is used for supplying power to the whole device; the probe module comprises a surface current probe 22, a surface voltage probe 23, an internal charged current probe 24, a total dose effect probe 3, a displacement effect probe 4 and a single event upset sensitive probe 5, and is used for receiving space environment radiation and converting radiation effects into related analog signals; the driving module 6 is used for driving the probe module to normally work; the measuring module 7 is used for conditioning the analog signal converted by the probe module and outputting the conditioned signal to the digital processing module 8; the digital processing module 8 is used for controlling the measuring module 7 to collect analog signals of the probe module, and sending the analog signals to superior equipment through the communication module 9 after calculation, correction and framing; the communication module 9 is used for sending the data information processed by the processing module; the detector housing 1 is used for protecting internal probes and circuits and for installation on a satellite platform.
Fig. 2 shows a schematic structural diagram of a spatial radiation effect risk monitoring device according to an embodiment of the present invention, which includes a rectangular chassis (detector housing 1) and a probe module disposed inside the detector housing 1, wherein the surface current probe 22, the surface potential probe 23, the first inner live current probe 241, the second inner live current probe 242, and the third inner live current probe 243 are in a stacked telescope structure and measure a surface charging current, a surface charging potential, and an inner live current, respectively; shielding layers with different shielding thicknesses are respectively arranged above the total dose effect probe 3 and the displacement effect probe 4 to monitor the total dose effect and the displacement effect respectively, and the shielding layers are respectively a shielding layer I, a shielding layer II, a shielding layer III and a shielding layer IV; the single event upset sensitive probe 5 is mounted on the circuit board and monitors for a single event upset effect.
Fig. 3 shows a stacked telescope structure diagram of the live probe module 2, by which the inner live current probe 24 can measure inner live currents of different equivalent shielding thicknesses, which are respectively the equivalent shielding thickness one, the equivalent shielding thickness two, and the equivalent shielding thickness three.
The surface potential adopts a plate capacitance principle to perform capacitance voltage division on a signal received by the probe, and the surface potential is obtained by measuring a voltage division value; basic principles of surface current and internal charge current measurement: the metal plate is impacted by charged particles to generate current, and the current signal amplifies the charging current into a voltage signal output in a low resistance mode through the super high resistance amplifier; basic principle of total dose effect measurement: the PMOS field effect transistor generates and traps radiation induced charges in the gate oxide layer so as to change the threshold voltage, the constant current of the driving module is added on the PMOS, and the monitoring of the total radiation dose is completed by monitoring the change of the voltage value; basic principle of displacement damage effect measurement: the characteristic that the dark current of the photodiode is the most seriously influenced parameter by irradiation is utilized, and the displacement damage effect is monitored by measuring the change of the dark current; the single event upset effect measurement is to store specific data in an SRAM, carry out timing check and refresh on the specific data through a digital processing module, and judge the probability of upset occurrence by comparing whether the data bit is abnormal or not, wherein the single event upset is considered to occur.
The case (detector shell 1) is composed of a plurality of layers of shells, and all the layers are connected through sub-ports, so that the installation stability and the electromagnetic compatibility are improved. 4 total dose effect probes 3 and displacement effect probes 4 are arranged on the periphery of the electrified probe module 2, and different shielding thicknesses (0mm, 1mm, 2mm and 5mm) are realized through different heights of the step on the outer side of the case shell.
The effective radiation receiving surfaces of the tops of the surface current probe 22, the surface potential probe 23 and the three inner live current probes 24 in the live probe module 2 are all circular and are limited by the insulating support 21, so that the effective areas are all 10cm2The whole body is of a folding telescope type structure. Since the internal insulating material may also have an internal charging effect in space, the volume of the insulating material is designed to be reduced as much as possible to reduce the influence. The surface current probe 22 is an aluminum plated polyimide film, and the surface potential probe 23 is an aluminum plate with a polyimide film attached to the surface. The three inner live current probes 24 are all copper clad laminates, namely, the top layer of the PCB is coated with copper and is windowed, and the thickness of the plate is 2 mm. Five probe layers are positioned in the insulating support.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered to be within the technical scope of the present invention, and the technical solutions and the inventive concepts thereof according to the present invention should be equivalent or changed within the scope of the present invention.
Claims (10)
1. A miniaturized space radiation effect risk monitoring system which characterized in that: comprises a detector shell (1), a charged probe module (2), a total dose effect probe module (3) and a displacement probe module (4) which are arranged on the upper surface of the detector shell (1), and a single event upset sensitive probe module (5) which is arranged in the detector shell (1), a driving module (6) and a measuring module (7) which are electrically connected with the charged probe module (2), the total dose effect probe module (3) and the displacement probe module (4), a digital processing module (8) electrically connected with the single event upset sensitive probe module (5) and the measuring module (7), a communication module (9) electrically connected with the digital processing module (8) and a power supply module (10) electrically connected with the driving module (6), the measuring module (7), the digital processing module (8) and the communication module (9);
the detector shell (1) is used for protecting the charged probe module (2), the total dose effect probe module (3), the displacement probe module (4), the single event upset sensitive probe module (5), the driving module (6), the measuring module (7), the word processing module (8) and the communication module (9), and is installed on a satellite platform;
the charged probe module (2), the total dose effect probe module (3), the displacement probe module (4) and the single event upset sensitive probe module (5) are used for receiving the space environment radiation and converting the space environment radiation into analog signals to be output;
the driving module (6) is used for driving the charged probe module (2), the total dose effect probe module (3) and the displacement probe module (4) to work;
the measuring module (7) is used for conditioning the analog signal and outputting the conditioned signal to the digital processing module (8);
the digital processing module (8) is used for controlling the measurement module (7) to collect the analog signals, and sending the analog signals to a superior device through the communication module (9) after calculation, correction and framing, and the digital processing module (8) is used for detecting the analog signals collected by the single event upset sensitive probe module (5), calculating, correcting and framing the analog signals and sending the analog signals to the superior device through the communication module (9);
the power supply module (10) is used for supplying power;
the electrified probe module (2) is of a stacked telescope structure, the electrified probe module (2) comprises an insulating support (21), and a surface current probe (22), a surface potential probe (23) and an inner electrified current probe (24) which are sequentially stacked in the insulating support (21) from top to bottom, and the inner electrified current probe (24) comprises two or more inner electrified current probes with different shielding depths;
the utility model discloses a surface potential measurement of taking electric current probe module (2) is used for carrying out surface current, surface potential and interior electrified current's co-location measurement and convert analog signal output into, surface current probe (22) are used for carrying out surface current's measurement simultaneously do surface potential probe (23) with interior electrified current probe (24) shielding interference, surface potential probe (23) are used for carrying out surface potential's measurement simultaneously do interior electrified current probe (24) shielding interference, interior electrified current probe (24) are used for carrying out the interior electrified current measurement of different shielding thickness and convert and obtain equivalent shielding thickness interior electrified current, establish interior electrified current model.
2. A miniaturized spatial radiation effect risk monitoring system as claimed in claim 1, wherein: the surface current probe (22) comprises a conductor plate, and the surface potential probe (23) comprises an insulating medium and a conductor plate electrode;
the inner live current probe (24) comprises a first inner live current probe (241), a second inner live current probe (242) and a third inner live current probe (243) which are sequentially stacked in the insulating bracket (21) from top to bottom, and the first inner live current probe (241), the second inner live current probe (242) and the third inner live current probe (243) are fixed on the copper-clad laminate.
3. A miniaturized spatial radiation effect risk monitoring system as claimed in claim 1, wherein: the total dose effect probe module (3) and the displacement probe module (4) are arranged on the same circuit board.
4. A miniaturized spatial radiation effect risk monitoring system as claimed in claim 3, wherein: the total dose effect probe module (3) is used for realizing total dose effect detection of multi-shielding thickness through different heights of steps on the outer side of the detector shell (1);
the total dose effect probe module (3) comprises a 0mm shielding thickness total dose effect probe (31), a 1mm shielding thickness total dose effect probe (32), a 2mm shielding thickness total dose effect probe (33) and a 3mm shielding thickness total dose effect probe (34);
the total dose effect probe module (3) uses PMOS field effect transistors;
the displacement probe module (4) comprises four displacement probes, each displacement probe and a total dose effect probe are integrated on a circuit board, and the displacement probes use photodiodes.
5. A miniaturized spatial radiation effect risk monitoring system as claimed in claim 1, wherein: the single event upset sensitive probe module (5) comprises an SRAM device for storing measurement data, the digital processing module (8) judges whether single event upset occurs or not by timing checking and refreshing the measurement data and comparing data bits, if the data bits are abnormal, the single event upset is judged to occur, and if the data bits are not abnormal, the single event upset is judged not to occur.
6. A miniaturized spatial radiation effect risk monitoring system as claimed in claim 5, wherein:
the single event upset sensitive probe module (5) is detachable, and when the single event upset sensitive probe module (5) is calibrated, the SRAM device is taken out and placed on one side of a radiation source for calibration, and then the SRAM device is inserted into the detector shell (1) after calibration.
7. A miniaturized spatial radiation effect risk monitoring system as claimed in claim 1, wherein: the driving module (6) is a constant current source driving circuit;
the measuring module (7) comprises a surface potential measuring circuit, a surface current measuring circuit, an internal charged current measuring circuit, a total dose effect measuring circuit and a displacement effect measuring circuit.
8. A miniaturized spatial radiation effect risk monitoring system as claimed in claim 7, wherein: the surface potential measuring circuit comprises an ultrahigh impedance low bias current operational amplifier, a multilayer shielding cable, a potential protection ring, a protection grid and a protection layer;
the surface current measuring circuit comprises an ultrahigh impedance low bias current operational amplifier, a multilayer shielding cable, a potential protection ring, a protection grid and a protection layer;
the internal live current measuring circuits comprise ultrahigh-impedance low-bias operational amplifiers, multilayer shielding cables, potential protection rings, protection grids and protection layers;
the total dose effect measuring circuit and the displacement effect measuring circuit both use a multi-channel analog switch switching path.
9. A miniaturized spatial radiation effect risk monitoring system as claimed in claim 1, wherein: the digital processing module (8) comprises an ARM, an ADC and a multi-path analog switch;
the communication module (9) uses an RS422 interface and a UART communication protocol.
10. A miniaturized spatial radiation effect risk monitoring system as claimed in claim 1, wherein: the detector shell (1) comprises a plurality of layers of shells, and the shells of all layers are connected through sub-ports.
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