CN110531400A - The in-orbit radiation risk detection device of spacecraft - Google Patents
The in-orbit radiation risk detection device of spacecraft Download PDFInfo
- Publication number
- CN110531400A CN110531400A CN201910822742.5A CN201910822742A CN110531400A CN 110531400 A CN110531400 A CN 110531400A CN 201910822742 A CN201910822742 A CN 201910822742A CN 110531400 A CN110531400 A CN 110531400A
- Authority
- CN
- China
- Prior art keywords
- probe unit
- effect
- spacecraft
- thickness
- group
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B64—AIRCRAFT; AVIATION; COSMONAUTICS
- B64G—COSMONAUTICS; VEHICLES OR EQUIPMENT THEREFOR
- B64G1/00—Cosmonautic vehicles
- B64G1/22—Parts of, or equipment specially adapted for fitting in or to, cosmonautic vehicles
- B64G1/66—Arrangements or adaptations of apparatus or instruments, not otherwise provided for
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/02—Dosimeters
- G01T1/026—Semiconductor dose-rate meters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Engineering & Computer Science (AREA)
- Nonlinear Science (AREA)
- Remote Sensing (AREA)
- Aviation & Aerospace Engineering (AREA)
- Measurement Of Radiation (AREA)
Abstract
The invention discloses a kind of detection devices of the in-orbit radiation risk of spacecraft, including detector housing and seven groups of built-in probe units, every group of probe unit is made of a temperature sensor and an accumulated dose detector, wherein the shell right above one group of probe unit needs aperture, to guarantee not detected by the shielding of shell；Another group of probe unit is directly detected using spacecraft casing as shielded layer；Remaining five groups of probe unit is respectively set different-thickness metal screen layer and is detected with being directed to different Space Radiation Effects respectively, and every group of probe unit is both placed on intermediate circuit board, is acquired by circuit board to temperature and accumulated dose.The present invention have the characteristics that structure it is simple, it is small in size, light-weight, low in energy consumption, it can be achieved that the risks such as different spaces radiation effect such as surface charging and discharging effects, total dose effect, single particle effect, displacement damage effect and interior charged effect differentiation.
Description
Technical field
The invention belongs to the in-orbit situation detection technology fields of spacecraft, specifically, the present invention is more particularly directed to a kind of space flight
The detection device of the in-orbit radiation effect risk of device.
Background technique
Space radiation environment is mainly derived from steller radiation band, solar cosmic ray, galactic cosmic rays, main component
It is electronics, proton and a small amount of heavy ion.Wherein, radiation belt of the earth environment is the most important radiation for influencing LEO spacecraft
One of environment can be generally divided into inner radiation belt and outer radiation belt.Solar flare burst period can emit a large amount of high energy protons, electricity
Son, heavy nucleus particle flux, referred to as solar cosmic ray.Wherein the overwhelming majority is made of proton, and therefore, be otherwise known as solar proton thing
Part.For the energy range of solar cosmic ray particle generally from 10MeV to tens GeV, ingredient is mainly proton.Milky way galaxy universe
Ray is from extrasolar charged particle, and the very low charged particle of, flux high by energy forms, wherein proton at
It point accounts for 85%, α particle components and accounts for 14%, heavy ion composition accounts for 1%, and particle energy is 100~1014MeV, flux are 2~4/
(cm2·s).In polar region, a small number of cosmic-ray particles can be deposited in magnetosphere along the magnetic line of force；Other than polar region, only a small amount of energy is special
Not high cosmic-ray particle can penetrate earth's magnetic field shielding and enter in magnetosphere；Other overwhelming majority cosmic-ray particles are by earth magnetism
Place shielding, will not threaten to earth Orbital Space Vehicle.
Space radiation environment will bring serious radiation injury effect to Spacecraft Material and device, mainly include single-particle
Effect, tatal ionizing dose effects, displacement damage effect, surface charging and discharging effects, interior charged effect, surface charging and discharging effects etc..
Single particle effect is also known as single event effect.High energy charged particles generate a large amount of charged particles in the sensitive volume of device
The phenomenon that, it belongs to ionisation effect.
It is usually that the mechanism as caused by single high-energy heavy ion or high energy proton is different from single particle effect, total dose effect
Caused dosage effect is usually accumulated by the radiation for a long time of many charged particles.In spacecraft engineering, total dose effect one
As refer to tatal ionizing dose effects.
After charged particle incidence Spacecraft Material or device, in addition to generating total dose effect by ionization, it is also possible to
So that absorber atom is left its position in a manner of different shocks, lattice defect is generated, to generate displacement damage.That is displacement damage
Hurt effect.
Satellite charged effect is also known as charging and discharging effects, refers to that the environment such as satellite and space plasma and high energy electron are mutual
It acts on and the accumulation of electrostatic charge occurred and process of releasing, is divided into surface charging and discharging effects and interior charged effect.Surface charge and discharge
Effect refers to satellite and the process that under space environment interaction, charge is accumulated and released in satellite surface material.
Under the strong disturbances environment such as solar flare outburst, coronal mass ejection, geomagnetic storm or GEO substorm, a large amount of high energy
Electron injection is into geostationary orbit or sun-synchronous orbit, so that electron flux of the energy greater than 1MeV is significantly increased.This
A little electronics can be directed through satellite surface covering, satellite structure and instrument and equipment shell, in inside satellite circuit board, wire insulation
It is deposited in the dielectrics such as layer, causes it that charge accumulation occurs, the deep layer of medium is caused to charge, also referred to as interior electrification.
Unit for electrical property parameters (such as threshold voltage shift) using radiosensitive semiconductor devices is the sensitivity of total radiation dose
Parameter carries out the common method that work is present dose meter.By taking PMOS field-effect body pipe as an example, when PMOS field-effect body pipe is by sky
Between after charged particle irradiation, induct oxide charge and interface charge in its sensitizing range-gate oxide and the interface Si/SiO2, from
And the threshold voltage shift of PMOSFET can be caused.The variation of this starting voltage can carry out real-time measurement by simple circuit.It is logical
Cross corresponding relationship between ground calibration threshold voltage shift and accumulated dose.In-orbit threshold voltage shift can be measured, is obtained in-orbit
Accumulated dose.Therefore, PMOS dosimeter have can real-time monitoring the characteristics of, simultaneously as the low-power consumption of MOS, small geometrical size
Feature, PMOS dosimeter but also with low energy consumption and can approximate point side function.By multiple PMOS probes, power supply, control switch electricity
Road, constant-current source circuit, output starting voltage processing circuit constitute the multi-probe PMOS dosemeter of star multiple spot.
Spacecraft is under space radiation environment effect, it may occur that single particle effect, tatal ionizing dose effects, displacement damage effect
It answers, the risks such as interior charged effect.Therefore, spacecraft can carry out reinforcing screen by the bulkhead and crucial sensitive components of spacecraft
Equal measures are covered to avoid risk.But different Space Radiation Effects occur have certain critical condition.
Tatal ionizing dose effects primarily directed in spacecraft module and the electronic component of emphasis shielding protection, meanwhile, I
It is also known that the threshold value and performance variation law of the anti-ionization total-dose of used electronic component.So only it is to be understood that space flight
The thickness of thickness and the emphasis shielding of device typical case's bulkhead, by monitoring accumulated dose and dosage rate under the two shielding thickness
Variation, it can quick diagnosis go out whether tatal ionizing dose effects can occur.
The single particle effect of component, which has, occurs particle energy threshold value, and main source radiation is proton and heavy ion,
And heavy ion is compared to proton that then quantity is relatively fewer.Therefore, our emphasis monitor proton, it can obtain to a certain extent
The probability of single particle effect may occur.According to the threshold value of proton single particle effect, it can the shielding for being back-calculated to obtain needs is thick
Degree.Monitor the variation of the accumulated dose under the shielding thickness, available proton or heavy ion greater than some threshold energy
Number, it can analysis obtains occurring the risk of single particle effect.
Spacecraft displacement damage effect is usually equivalent to primarily directed to the sensitive optoelectronics device such as solar panel and CCD
The radiation injury of the proton of the electronics or 10MeV of 1MeV.Therefore, it is necessary to the fluence of the emphasis monitoring higher particle of energy and lead to
Amount.Therefore, the flux and fluence of the particle of a certain threshold value can be higher than by monitoring, in-orbit be subjected to displacement can be monitored and damage effect
The risk answered.
Interior charged effect is primarily referred to as high energy electron and penetrates spacecraft bulkhead, and deposits to spacecraft internal electron wiring board
On equal insulating materials, and then the phenomenon that charging.Therefore, spacecraft bulkhead is exactly the shielding thickness of high energy electron, needs to monitor
And penetrate electronics after spacecraft bulkhead.Therefore, by the ionization total-dose under monitoring spacecraft bulkhead shielding thickness, both
Available fluence and flux into the charged electron inside spacecraft can be used to determine whether having in generation in turn
The risk of charged effect.
Currently, the domestic detection device that there is no about the in-orbit radiation risk of spacecraft, can not be designed by simple structure
Carry out the comprehensive radiation effect of quick detection with electronic component device to be diagnosed to be the space radiation risk that may occur.
Summary of the invention
In order to solve the above-mentioned technical problem, by sky during being run to spacecraft the object of the present invention is to provide one kind
Interradius injects row detection and quick diagnosis causes the device of risk, may be implemented to single particle effect, total dose effect, displacement damage
Hurt the risk that a variety of Space Radiation Effects such as effect, surface charging and discharging effects, interior charged effect may cause and carries out quick diagnosis.
Present invention employs the following technical solutions:
The detection device of the in-orbit radiation risk of spacecraft, seven groups of detections including rectangle detector housing and enclosure interior
Unit, every group of probe unit are made of a temperature sensor and an accumulated dose detector, wherein in one group of probe unit
Accumulated dose detector right above shell need aperture, to guarantee the accumulated dose detector not by the shielding of shell, with needle
Surface charging and discharging effects are detected；The not set shielded layer in the top of other side probe unit directly utilizes spacecraft casing
As shielded layer, detected for displacement damage effect；Remaining five groups of probe unit places different thickness right above it respectively
For the metal of degree as shielded layer, shielding thickness is respectively the thickness of the shielding thickness of typical component, maskable 2MeV electronics
Degree and three LET values shielded in silicon respectively are 15MeV.cm2/mg、37MeV.cm2/mg、75MeV.cm2/ mg ion
Equivalent A l thickness.
Wherein, pmos fet, photodiode or cmos fet crystal can be selected in accumulated dose detector 4
Pipe, is individually placed to the corresponding position of every group of probe unit.
Wherein, temperature sensor selects thermistor, is individually placed to the corresponding position of every group of probe unit.
Wherein, spacecraft module wall thickness selects the thickness of 2mm Equivalent A l.
The present invention is laid by the assembled unit of seven temperature sensors and susceptible-dose element, thick in different shieldings
Under degree, different spaces radiation effect such as surface charging and discharging effects, total dose effect, single particle effect, displacement damage may be implemented
The differentiation of the risks such as effect and interior charged effect.The present invention has the characteristics that structure is simple, small in size, light-weight, low in energy consumption.
Detailed description of the invention
Fig. 1 is the in-orbit radiation risk quick diagnosis device structural schematic diagram of spacecraft of the embodiment of the invention；
Fig. 2 is the in-orbit radiation risk quick diagnosis device structure partial side view of spacecraft of the embodiment of the invention
Figure.
Wherein: 1 cabinet (shell)；The perforation of 2 cabinet top covers；3 temperature sensors；4 accumulated dose sensors；5 shielded layers one；6
Shielded layer two；7 shielded layers three；8 shielded layers four；9 shielded layers five；10 circuit boards.
Specific embodiment
Below in conjunction with attached drawing, invention is further described in detail, but this is only exemplary, it is no intended to this
The protection scope of invention carries out any restrictions.Below with reference to accompanying drawings and embodiments, the present invention will be further described, needs to refer to
Out, embodiment described below is intended to convenient for the understanding of the present invention, and does not play any restriction effect to it.
The in-orbit radiation risk detection device of the spacecraft of a specific embodiment of the invention is shown referring to Fig. 1, Fig. 1
Structural schematic diagram, seven groups of probe units including rectangular cabinet (detector housing) 1 with setting inside housings, seven
Group sensor is arranged in parallel two rows, three groups of side probe unit, and different shielded layers are respectively set above each probe unit
The shielded layer of thickness is detected with being directed to single particle effect respectively, and shielded layer is respectively shielded layer 37, shielded layer 48 and screen
Cover layer 59；Four groups of other side probe unit, two of them probe unit is not provided with shielded layer and one of probe unit is corresponding
Cabinet top cover perforation 2 is offered at the position of shell, so that carrying out unscreened accumulated dose spy for surface charging and discharging effects
It surveys, another probe unit is detected using shell as shielded layer for displacement damage effect, remaining two groups of probe units point
Not She Zhi shielded layer 1 and shielded layer 26, to be measured for total dose effect and interior charged effect, wherein every group of detection
Unit is made of a temperature sensor 3 and an accumulated dose detector 4.
Show in specific embodiment in Fig. 1, opens up at the top of first group of probe unit in left side due to offering cabinet top
It covers perforation 2 and is fully exposed in space environment, therefore, be directed to surface charging and discharging effects, shielding thickness 0, surface charge and discharge
The accumulated dose when monitoring of electrical effect does not shield as；Second group of left side probe unit, using spacecraft bulkhead as shielded layer,
Therefore, for displacement damage effect, the usual thickness of spacecraft bulkhead is usually selected, that is, selects the thickness of 2mm Equivalent A l, this is thick
Spending maskable electron energy is 1MeV, which is also the exemplary electronic energy for judging solar cell displacement damage effect
Amount, the Al of the thickness maskable proton energy are 20MeV.Left side third probe unit, for total dose effect, we selected typical
The shielding thickness of component, this thickness can be selected according to specific spacecraft.The 4th probe unit of left side is imitated for interior electrification
Answer, total shielding thickness of selection is the equivalent aluminium of 5mm, i.e. h6, the Al of the thickness it is maskable fall 2MeV electronics.
The first probe unit of right side, the second probe unit and third probe unit are directed to single particle effect respectively, selection
It is 15MeV.cm2/mg, 37MeV.cm2/mg, 75MeV.cm2/mg that total shielding thickness, which is the LET value that can be shielded respectively in silicon,
Ion Equivalent A l thickness.
In other embodiments, the position of seven groups of probe units can be exchanged, but need the thickness shielded can root
It is arranged according to needing it to detect purpose.
Referring to fig. 2, Fig. 2 shows the in-orbit radiation risk quick diagnosis device of the spacecraft of the embodiment of the invention
Structure partial side view.It can be seen from the figure that the one of accumulated dose detector of the perforation positive alignment of cabinet upper surface, to protect
The radiation of card space can be applied directly on accumulated dose detector；The only shielding by cabinet of intermediate accumulated dose detector；The
The then shielding by cabinet and increased shielded layer of three accumulated dose detectors.In line with small in size, light-weight, small power consumption original
Then, sensitive accumulated dose detector element and temperature sensor are integrated on circuit board, are designed to the in-orbit wind of tabular spacecraft
Dangerous quick diagnosis device.
Temperature sensor 3 usually selects thermistor.To select macro bright ± 5% thermistor of MF11-10000 Ω in Chengdu
For, thermistor nominal value 10K Ω, Standard resistance range is 0.9k Ω~41k Ω, and measurement temperature range is -55 DEG C~85 DEG C, heat
Quick resistance temperature calculates formula are as follows:
R=R0exp (B (1/T-1/T0))
Wherein: R0=10k Ω；
B, the value of T0 need to be determined according to the practical calibration value of each thermistor.
Therefore, thermistor is connected with the resistance of a steady state value, resistance both ends after concatenation add one constant
Voltage, since the resistance value of thermistor changes with temperature, pass through the voltage at measurement thermistor both ends
Know the resistance value of thermistor, and then temperature value can be calculated by formula above.
Pmos fet, photodiode, cmos fet transistor etc. can be selected in accumulated dose detector 4.With
For pmos fet, the threshold voltage shift using radiosensitive pmos fet is the quick of total radiation dose
Sense parameter carries out the basic principle that work is PMOS dosimeter.With the increase of dose of radiation, beginning voltage variety Δ V and
Irradiation dose D approximation meets following relationship: Δ V=a × Db, (b < 1).A and b is a constant, brilliant by the specific PMOS selected
Body pipe determines.PMOS transistor is by three pole, that is, grids, source electrode and drain electrodes.Grid is shorted ground, In when measuring beginning voltage
It is passed through constant current between source electrode and drain electrode, that is, can measure the beginning voltage of source electrode and drain electrode.Pass through the variation of beginning voltage
Determine irradiation dose.
In addition, each group of probe unit includes a susceptible-dose element and a temperature-sensing element (device).Spacecraft is in-orbit
Radiation risk quick diagnosis device usually places at top towards solar direction.If surrounding's thickness of shell of diagnostic device may
Dosage detection can be affected, then by increasing the thickness of surrounding shell or local screen can be carried out to probe unit surrounding
The mode covered excludes the possible interference of probe unit ambient enviroment.
The present apparatus can be realized the quick diagnosis of 5 kinds of Space Radiation Effects, and wherein single particle effect includes three kinds of states, i.e.,
Single particle effect will not occur, need to assess whether that single particle effect occurs and be certain to that single particle effect occurs.Using more
The component and temperature sensor component of a ionization total-dose sensitivity can be fast by rationally designing different shielding thickness
The fast quantity and variations of flux situation for simply judging the Space Particle under different-energy threshold value, and then quick diagnosis goes out space flight
Single particle effect, tatal ionizing dose effects, displacement damage effect, surface charging and discharging effects and interior charged effect etc. may occur for device
The risk of 5 kinds of Space Radiation Effects.
Although giving detailed description and explanation to the specific design method and thinking of this patent above, it should be noted that
, we can the conception of patent according to the present invention various equivalent changes and modification are carried out to above embodiment, produced
It, should all be within protection scope of the present invention when the spirit that raw function is still covered without departing from specification and attached drawing.
Claims (4)
1. the detection device of the in-orbit radiation risk of spacecraft, seven groups of probe units including detector housing and enclosure interior, often
Group probe unit is made of a temperature sensor and an accumulated dose detector, wherein the accumulated dose in one group of probe unit
Shell right above detector needs aperture, to guarantee the accumulated dose detector not by the shielding of shell, to fill for surface
Discharge effect is detected；The not set shielded layer in the top of other side probe unit, directly using spacecraft casing as shielding
Layer, is detected for displacement damage effect；Remaining five groups of probe unit places the metal of different-thickness right above it respectively
As shielded layer, shielding thickness is respectively the thickness and three of the shielding thickness of typical component, maskable 2MeV electronics
A LET value shielded in silicon respectively is 15MeV.cm2/mg、37MeV.cm2/mg、 75MeV.cm2The Equivalent A l of/mg ion is thick
Degree.
2. detection device as described in claim 1, wherein accumulated dose detector 4 selects pmos fet, photoelectricity two
Pole pipe, cmos fet transistor, are individually placed to the corresponding position of every group of probe unit.
3. detection device as described in claim 1, wherein temperature sensor selects thermistor, is individually placed to every group of detection
The corresponding position of unit.
4. detection device as described in any one of claims 1-3, wherein the thickness of spacecraft module wall thickness selection 2mm Equivalent A l
Degree.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910822742.5A CN110531400B (en) | 2019-09-02 | 2019-09-02 | Spacecraft in-orbit radiation risk detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910822742.5A CN110531400B (en) | 2019-09-02 | 2019-09-02 | Spacecraft in-orbit radiation risk detection device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110531400A true CN110531400A (en) | 2019-12-03 |
| CN110531400B CN110531400B (en) | 2020-11-06 |
Family
ID=68666138
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910822742.5A Active CN110531400B (en) | 2019-09-02 | 2019-09-02 | Spacecraft in-orbit radiation risk detection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110531400B (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111123347A (en) * | 2019-12-24 | 2020-05-08 | 兰州空间技术物理研究所 | Integrated fixing structure for space particle detector |
| CN113064196A (en) * | 2021-03-18 | 2021-07-02 | 西北核技术研究所 | Method and system for quickly discriminating radiation sensitive position of electronic system based on X-ray |
| CN113534234A (en) * | 2020-04-22 | 2021-10-22 | 国家卫星气象中心(国家空间天气监测预警中心) | High-energy electron detector calibration device and method and high-energy electron flux inversion method |
| CN113543615A (en) * | 2021-06-29 | 2021-10-22 | 中国科学院长春光学精密机械与物理研究所 | Irradiation protection method for space electronic equipment |
| CN113899396A (en) * | 2021-09-15 | 2022-01-07 | 北京遥测技术研究所 | Miniaturized space radiation effect risk monitoring system |
| CN116562630A (en) * | 2023-07-07 | 2023-08-08 | 数字太空(北京)智能技术研究院有限公司 | Risk assessment method and device for satellite influenced by space environment |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5396169A (en) * | 1991-03-19 | 1995-03-07 | Lynx Golf Inc. | Method for characterizing the upset response of CMOS circuits using alpha-particle sensitive test circuits |
| JP2012190095A (en) * | 2011-03-09 | 2012-10-04 | Mitsubishi Electric Corp | Seu countermeasure commanding device and electrical apparatus and method for setting operation level of electrical apparatus |
| CN108008289A (en) * | 2017-11-22 | 2018-05-08 | 西北核技术研究所 | A kind of acquisition methods in device proton single particle effect section |
| CN108072890A (en) * | 2016-11-15 | 2018-05-25 | 中国科学院国家空间科学中心 | A kind of three-dimensional High energy particles Radiation effect comprehensive survey device |
-
2019
- 2019-09-02 CN CN201910822742.5A patent/CN110531400B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5396169A (en) * | 1991-03-19 | 1995-03-07 | Lynx Golf Inc. | Method for characterizing the upset response of CMOS circuits using alpha-particle sensitive test circuits |
| JP2012190095A (en) * | 2011-03-09 | 2012-10-04 | Mitsubishi Electric Corp | Seu countermeasure commanding device and electrical apparatus and method for setting operation level of electrical apparatus |
| CN108072890A (en) * | 2016-11-15 | 2018-05-25 | 中国科学院国家空间科学中心 | A kind of three-dimensional High energy particles Radiation effect comprehensive survey device |
| CN108008289A (en) * | 2017-11-22 | 2018-05-08 | 西北核技术研究所 | A kind of acquisition methods in device proton single particle effect section |
Non-Patent Citations (5)
| Title |
|---|
| H.J.KIM ET AL.: "Spacecraft charging for microsatellite KITSAT-3", 《JOURNAL OF SPACECRAFT AND ROCKETS》 * |
| N.V.KUZNETSOV: "The rate of single event upsets in elctronic circuits onboard spacecraft", 《COSMIC RESEARCH》 * |
| ROBERT REDUS ET AL.: "compact environmental anomaly sensor (CEASE) flight integration support contract", 《HTTP:WWW.RESEARCHGATE.NET/PUBLICATION/235021502》 * |
| 朱恒静 等: "《宇航大规模集成电路保证技术》", 31 August 2016 * |
| 王月玲 等: "一种用于评估抗辐射DSP单粒子翻转的试验方法", 《微电子学与计算机》 * |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111123347A (en) * | 2019-12-24 | 2020-05-08 | 兰州空间技术物理研究所 | Integrated fixing structure for space particle detector |
| CN113534234A (en) * | 2020-04-22 | 2021-10-22 | 国家卫星气象中心(国家空间天气监测预警中心) | High-energy electron detector calibration device and method and high-energy electron flux inversion method |
| CN113064196A (en) * | 2021-03-18 | 2021-07-02 | 西北核技术研究所 | Method and system for quickly discriminating radiation sensitive position of electronic system based on X-ray |
| CN113064196B (en) * | 2021-03-18 | 2023-06-27 | 西北核技术研究所 | Method and system for rapidly discriminating radiation sensitive position of electronic system based on X-rays |
| CN113543615A (en) * | 2021-06-29 | 2021-10-22 | 中国科学院长春光学精密机械与物理研究所 | Irradiation protection method for space electronic equipment |
| CN113899396A (en) * | 2021-09-15 | 2022-01-07 | 北京遥测技术研究所 | Miniaturized space radiation effect risk monitoring system |
| CN113899396B (en) * | 2021-09-15 | 2023-07-04 | 北京遥测技术研究所 | Miniaturized space radiation effect risk monitoring system |
| CN116562630A (en) * | 2023-07-07 | 2023-08-08 | 数字太空(北京)智能技术研究院有限公司 | Risk assessment method and device for satellite influenced by space environment |
| CN116562630B (en) * | 2023-07-07 | 2023-09-15 | 数字太空(北京)智能技术研究院有限公司 | Risk assessment method and device for satellite influenced by space environment |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110531400B (en) | 2020-11-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110531400A (en) | The in-orbit radiation risk detection device of spacecraft | |
| CN110531399B (en) | Spacecraft on-orbit fault early warning and discriminating device | |
| JP2000147129A (en) | Personal neutron exposure dosemeter and neutron dose rate meter | |
| CN108072888B (en) | Medium-Earth Orbit space environment and the integrated detection device of effect | |
| CN106873024B (en) | A kind of highly sensitive environmental neutron energy spectrum analysis system for small-sized fast reactor | |
| Prokofiev et al. | Characterization of the ANITA neutron source for accelerated SEE testing at The Svedberg Laboratory | |
| Aulchenko et al. | CsI calorimeter of the CMD-3 detector | |
| Scuderi et al. | TOF diagnosis of laser accelerated, high-energy protons | |
| Hyun et al. | Performances of photodiode detectors for top and bottom counting detectors of ISS-CREAM experiment | |
| Frederickson et al. | Radiation-induced insulator discharge pulses in the CRRES internal discharge monitor satellite experiment | |
| Kimoto et al. | Total dose orbital data by dosimeter onboard Tsubasa (MDS-1) satellite | |
| Lin et al. | The STEREO IMPACT suprathermal electron (STE) instrument | |
| Moffett et al. | Electron particle deflection using a field reversed configuration magnetosphere geometry as an analog for radiation shielding in deep space | |
| Inguimbert et al. | Anomalies of the ADSP 21060 onboard the DEMETER satellite | |
| Ceraudo et al. | Radiation-induced effects on the RIGEL ASIC | |
| Novotny et al. | Runaway electron diagnostics using silicon strip detector | |
| JP3358617B2 (en) | Neutron dose rate meter | |
| Iwahashi et al. | Heavy ion and proton irradiation of gas electron multipliers with liquid crystal polymer insulator: evaluation tests for use in space | |
| Nam et al. | Development and characterization of tissue equivalent proportional counter for radiation monitoring in international space station | |
| Prokofiev et al. | ANITA—a new neutron facility for accelerated SEE testing at the svedberg laboratory | |
| Silveira et al. | A Commercial off-the-shelf pMOS Transistor as X-ray and Heavy Ion Detector | |
| Riordan et al. | A differential absorption spectrometer for bremsstrahlung diode voltage measurement | |
| Shanmugam et al. | A new technique for measuring the leakage current in Silicon Drift Detector based X-ray spectrometer—implications for on-board calibration | |
| Va'vra et al. | Soft X-ray production in spark discharges in hydrogen, nitrogen, air, argon and xenon gases | |
| Dachev et al. | Analysis of the pre-flight and post-flight calibration procedures performed on the Liulin space radiation dosimeter |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |