CN113064196A - Method and system for quickly discriminating radiation sensitive position of electronic system based on X-ray - Google Patents
Method and system for quickly discriminating radiation sensitive position of electronic system based on X-ray Download PDFInfo
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Abstract
The invention provides a method and a system for quickly discriminating a radiation sensitive position of an electronic system based on X-rays, which solve the problem that the radiation sensitive position is difficult to quickly and accurately position in the process of an electronic system-level total dose effect test. The method and the system adopt a local shielding technology and a one-by-one device scanning irradiation mode in the test process, can quickly and accurately obtain the radiation sensitive position of the electronic system, do not need to change the system design, avoid the problems of long line plus bias, offline test and the like, and have the advantages of simple and easy implementation, short experimental period, low cost and simple operation method.
Description
Technical Field
The invention belongs to the field of evaluation of total dose effect of an electronic system, relates to a method and a system for quickly discriminating a radiation sensitive position of the electronic system based on X-rays, and particularly relates to a method for estimating the radiation resistance of the total dose effect of the electronic system and quickly discriminating the radiation sensitive position of the electronic system.
Background
The existing electronic total system total dose effect test mainly utilizes60The Co gamma ray is developed, which has the advantages of strong penetrability, uniform dose field and the like, but also has the defects of high experimental cost, difficult shielding, long circuit lead-out of a bias and test circuit and the like. In addition, as the functionality and complexity of electronic systems increase, it has led to progress in the system-wide environment60During the Co gamma total dose test, the radiation sensitive position of the system is difficult to be quickly and accurately positioned, and the estimation of the total dose resistance of the system level and the development of the radiation-resistant reinforcement design work are seriously influenced.
Currently, two approaches are mainly adopted for positioning the radiation-sensitive position in the system-level total dose experiment: firstly, leading out the output of key components in the system in the design process of the system, and monitoring the working state of the key components in real time in the irradiation process; secondly, a mode of off-line testing the system after irradiation is adopted, each component and each key link in the system are measured point by point for many times after irradiation, and the key components are replaced by trial to obtain weak components and sensitive positions of the system. Obviously, the first method needs to add additional test points or test circuits in the actual system design process, which not only increases the design difficulty and complexity of the system, but also affects the normal operating state of the system. The second method is time-consuming and labor-consuming, and is easy to damage the system in the processes of point-by-point testing and secondary replacement of components, thereby causing additional damage. Therefore, a system-level total dose effect test method is urgently needed to solve the problem that the radiation sensitive position is difficult to locate in the system total dose effect test process.
Disclosure of Invention
The invention provides a method and a system for quickly discriminating a radiation sensitive position of an electronic system based on X-rays, aiming at improving the efficiency of a total dose effect test of the system and solving the problem that the radiation sensitive position is difficult to quickly and accurately position in the process of the total dose effect test of the electronic system.
In order to achieve the purpose, the invention adopts the following technical scheme:
an electronic system radiation sensitive position fast screening method based on X-ray comprises the following steps:
step one, setting a relative position distribution diagram of electronic system components according to a PCB component layout diagram of a tested electronic system;
step two, processing the shielding body, and opening a window on the shielding body according to the size of a component in the electronic system;
fixing the electronic system on an X, Y-direction moving automatic guide rail, and aligning the window of the shielding body to a component needing to be irradiated in the electronic system;
setting the voltage and current of the X-ray source and the surface distance between the window and the component so as to obtain the required dosage rate, and calibrating the surface dosage rate of the component below the shielding window and the dosage rate below the shielding position by using a dosage calibrator so that the dosage rate difference between the surface dosage rate and the dosage rate is in a set range;
supplying power to the electronic system and monitoring the output of the electronic system;
starting an X-ray source, and irradiating the 1 st component in the electronic system to a specified total dose point;
moving the automatic guide rail according to the relative position distribution diagram obtained in the step one, moving the 2 nd component to a position below a shielding body window, and irradiating and accumulating the total dose to a specified total dose point;
moving the automatic guide rail according to the relative position distribution diagram obtained in the step one, sequentially moving all components in the electronic system to a window for irradiation, and accumulating the total dose to a specified total dose point;
step nine, after all components in the electronic system are irradiated, repeating the processes from step six to step eight, and accumulating the 2 nd and 3 rd total dose points of … …;
step ten, monitoring the output of the electronic system in the irradiation process, if the output is abnormal or the system function is invalid, judging that the component under irradiation under the window is a system weak component, and recording the total accumulated total dose value of the component at the moment;
judging a system output failure mode, if the whole system fails, terminating the irradiation test, wherein the total dose resistance of the system is determined by the sum of the total doses accumulated by multiple weak devices at present; and if the system output failure only occurs in part of the system links, skipping the failure sample, and irradiating the next component to search for a second sensitive device and a third sensitive device in the system until all functions of the system fail.
And further, in the fourth step, a dose calibrator is used for calibrating the surface dose rate of the element device below the shielding body window and the dose rate below the shielding position, and the dose rate difference between the surface dose rate and the dose rate is more than 3 orders of magnitude.
Meanwhile, the invention also provides another method for quickly discriminating the radiation sensitive position of the electronic system based on the X-ray, which comprises the following steps:
step one, processing a shielding body, and opening a window on the shielding body according to the size obtained by components in an electronic system;
fixing the electronic system on an X, Y-direction moving automatic guide rail, aligning a shielding body window to a component needing to be irradiated in the electronic system, aligning a ray outlet of the X-ray tube to the shielding body window, and ensuring that the center of the ray outlet, the center of the shielding body window and the center of the irradiated component are on the same straight line;
setting the voltage and the current of the X-ray source so as to obtain the required dose rate, and calibrating the surface dose rate of the component below the shielding body window and the dose rate below the shielding position by using a dose calibrator so that the dose rate difference between the surface dose rate and the dose rate is in a set range;
step four, supplying power to the electronic system, and monitoring the output of the electronic system in real time;
starting the X-ray source, irradiating until the system outputs or fails in function, and recording the accumulated total dose at the failure moment to obtain the total dose resistance of the component under the bias condition in the electronic system;
step six, replacing a failed component in the electronic system or replacing the electronic system, and repeating the step two to the step five to obtain the total dose resistance of all components in the electronic system;
and step seven, acquiring the radiation sensitive position of the electronic system according to the total dose resistance of all the components obtained in the step six.
In addition, the invention also provides an electronic system radiation sensitive position fast screening system based on the X-ray, which comprises an automatic guide rail, a ray tube guide rail, an X-ray tube and a shielding body; the automatic guide rail is arranged below the electronic system and used for realizing the movement of the electronic system in the direction X, Y; the X-ray tube is arranged on the tube guide rail and is used for providing irradiated X-rays; the shielding body is arranged between the X-ray tube and the electronic system, a window is arranged on the end face of the shielding body, and the X-ray irradiates to components of the electronic system through the window.
Furthermore, the X-ray shielding device further comprises a plurality of shielding sheets, wherein the shielding sheets are used for shielding the windows which do not pass through the X-ray.
Further, the shielding body is a lead shielding body.
Compared with the prior art, the invention has the following beneficial effects:
1. the invention provides a method and a system for quickly discriminating a radiation sensitive position of an electronic system based on X-rays, which can quickly and accurately find a weak position of the total dose of the system, can give the total dose resisting capability of the system, and provide powerful data support for the application and radiation resisting reinforcement of the electronic system in a radiation environment.
2. The system-level local shielding irradiation method and system based on the X-ray can effectively solve the problems of long line, offset arrangement and the like in the device-level test process, and can accurately give the total dose resistance level of internal devices when the system is in a normal working state.
3. The method and the system for quickly discriminating the radiation sensitive position can effectively solve the technical problem in the evaluation of the total dose effect of the system, are simple and effective, greatly reduce the test cost of the total dose effect of the system and have good application prospect.
Drawings
FIG. 1 is a flow chart of a method for rapidly screening a radiation sensitive position of an electronic system based on X-rays according to the invention;
fig. 2 is a schematic structural diagram of the X-ray-based electronic system radiation-sensitive position fast screening system of the present invention.
Reference numerals: 1-automatic guide rail, 2-ray tube guide rail, 3-X-ray tube, 4-shielding body, 5-shielding piece, 6-electronic system, 41-window and 61-component.
Detailed Description
The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.
The X-ray source is one of the ground radiation sources simulating the total dose effect in the radiation environment, and60compared with a Co gamma ray source, the Co gamma ray source has the advantages of easy shielding, easy generation and the like. By utilizing the advantages, the invention provides the method and the system for quickly discriminating the radiation sensitive position of the electronic system based on the 10keV-X ray, and solves the problem that the radiation sensitive position of the system is difficult to determine in the ground examination test process of the electronic system. The method and the system adopt a local shielding technology and a one-by-one device scanning irradiation mode in the test process, can quickly and accurately obtain the radiation sensitive position of the electronic system, do not need to change the system design, avoid the problems of long line plus bias, offline test and the like, and have the advantages of simple and easy implementation, short experimental period, low cost and simple operation method.
As shown in FIG. 2, the invention provides an electronic system radiation sensitive position fast screening system based on X-ray, which comprises an automatic guide rail 1, a ray tube guide rail 2, an X-ray tube 3, a shield 4 and a shielding sheet 5; the automatic guide rail 1 is arranged below the electronic system 6 and is used for realizing the movement of the electronic system 6 in the direction X, Y; an X-ray tube 3 disposed on the tube guide 2 for supplying irradiated X-rays; the shield 4 is disposed between the X-ray tube 3 and the electronic system 6, a window 41 is disposed on an end surface of the shield, the X-ray irradiates the component 61 of the electronic system 6 through the window 41, a plurality of windows 41 are disposed on the shield 4, and the shielding sheet 5 is used for shielding the windows 41 which do not pass through the X-ray.
As shown in fig. 1, the method for rapidly discriminating a radiation sensitive position of an electronic system based on X-rays provided by the invention specifically includes the following steps:
step one, making a relative position distribution diagram of electronic system components according to a PCB component layout diagram of a tested electronic system 6;
step two, processing the shielding body 4, and opening a window 41 on the shielding body 4 according to the size of the component 61 in the electronic system 6;
fixing the electronic system 6 on the automatic guide rail 1 which can move in the direction X, Y, arranging the shielding body 4 between the X-ray source and the electronic system 6, and aligning the window 41 of the shielding body 4 with the component 61 which needs to be irradiated in the electronic system 6;
setting the voltage and current of the X-ray source and the distance between the window 41 and the surface of the component 61, thereby obtaining the required dosage rate; in order to ensure the shielding effect of the shielding body 4 and determine the set value of the target dose rate, a dose calibrator (Unidos) is used for calibrating the surface dose rate of the component 61 below the shielding body window 41 and the dose rate below the shielding position, and simultaneously, the difference between the dose rates of the component 61 and the shielding position is ensured to be more than 3 orders of magnitude so as to ensure that the misjudgment of the total dose resistance of the target component caused by the accumulation of redundant total dose of the shielding component is avoided in the test process;
and step five, supplying power to the electronic system 6, and monitoring the output of the electronic system 6.
Starting an X-ray source, and irradiating the 1 st component 61 in the electronic system 6 to a specified total dose point;
step seven, moving the automatic guide rail 1 according to the relative position distribution diagram obtained in the step one, moving the 2 nd component 61 to a position below the window 41 of the shielding body 4, and irradiating to a specified total dose point;
moving the automatic guide rail 1 according to the relative position distribution diagram obtained in the step one, sequentially moving all the components 61 in the electronic system 6 to a window 41 for irradiation, and accumulating the total dose to a specified total dose point;
step nine, after all the components 61 in the system are irradiated, repeating the processes from the step six to the step eight, and accumulating the 2 nd and the 3 rd total dose points of … …;
step ten, monitoring the output of the electronic system 6 in the irradiation process, if the output is abnormal or the system function is invalid, judging that the component 61 which is receiving irradiation below the window 41 is a system weak component, and recording the total accumulated total dose value of the component at the moment;
judging a system output failure mode, if the whole system fails, terminating the irradiation test, wherein the total dose resistance of the system is determined by the sum of the total doses accumulated by multiple weak devices at present; if the system output failure only occurs in part of the system links, the failure sample can be skipped, and the next device is irradiated to search for the second and third sensitive devices in the system until the system has complete functions and fails.
Meanwhile, the invention also provides another method for quickly discriminating the radiation sensitive position of the electronic system based on the X ray, which is based on the local shielding irradiation of the system level of the X ray, so that the system is in a full working state, a target component 61 in the system is irradiated, the rest components 61 are shielded by using the designed shielding body 4, the irradiation is carried out until the system output or the function is failed, and the total dose accumulated at the failure moment is recorded, so that the total dose resistance of the components 61 in the system under the bias state condition can be obtained, the accurate evaluation of the radiation resistance of each component 61 in the electronic system 6 is realized, and the radiation sensitive position of the system is further obtained, and the method specifically comprises the following steps:
step one, processing a shield 4, and opening a window 41 on the shield 4 according to the size of a component 61 to be evaluated in an electronic system 6;
fixing the electronic system 6 on the X, Y-direction moving automatic guide rail 1, aligning the window 41 of the shielding body 4 with the component 61 needing to be irradiated in the electronic system 6, aligning the ray outlet of the ray tube with the window 41 of the shielding body 4, and ensuring that the center of the ray outlet, the center of the window 41 of the shielding body 4 and the center of the irradiated component 61 are on the same straight line;
setting the voltage and the current of the X-ray source so as to obtain the required dose rate, and calibrating the dose rate on the surface of the component 61 below the window 41 of the shielding body 4 and the dose rate of a selected point at the shielding position by using Unidos;
step four, supplying power to the electronic system 6, and monitoring the output of the electronic system 6 in real time;
starting the X-ray source, irradiating until the system outputs or fails in function, and recording the accumulated total dose at the failure moment to obtain the total dose resistance of the component 61 under the bias condition in the system;
step six, replacing the failed component 61 in the electronic system 6 or replacing the electronic system 6, and repeating the step two to the step five to obtain the total dose resistance of all the components 61 in the electronic system 6;
and step seven, acquiring the radiation sensitive position of the electronic system 6 according to the total dose resistance of all the components 61 obtained in the step six.
The method avoids the problems of long-line bias adding, offline testing and the like, ensures that the bias conditions in the irradiation process of each component 61 in the system are real working conditions, and has the advantages of simple and easy implementation method, short experimental period, low cost and simple operation method.
The process of the present invention is described in detail below by means of specific examples.
Step one, according to a layout diagram of PCB board element 61 of a tested electronic system 6, making a relative position distribution diagram of the system element 61, numbering the electronic elements 61 needing irradiation in the system, such as 1#, 2#, 3# … … n #, and taking the 1# device as an origin, and moving in the x and y directions to reach the positions of 2#, 3# … … n #;
step two, processing the shielding body 4, and opening the window 41 on the shielding body 4 according to the size of the component 61 in the system, where the system includes multiple sizes of the component 61, and the shielding body 4 needs to open the window 41 according to the size classification of the component 61, for example: firstly, a # size window 41 is suitable for 1#, 2# and 3# components 61, secondly, holes are suitable for 4# and 5#, when the # hole is used for irradiation in a weak mode, the # window 41 is shielded by a shielding piece 5, similarly, when the # hole is used, the # hole needs to be shielded, and the number of the windows 41 is determined by the size type of the components 61 in the system;
fixing the electronic system 6 on the movable automatic guide rail 1 in the x and y directions, aligning the window 41 of the shielding body 4 with the 1# component 61 needing to be irradiated in the system, aligning the ray outlet of the ray tube with the window 41 of the shielding body 4, and ensuring that the center of the ray outlet, the center of the window 41 of the shielding body 4 and the center of the irradiated component 61 are on the same straight line, as shown in fig. 2;
setting the voltage and the current of an X-ray source so as to obtain the required dose rate, and calibrating the dose rate on the surface of the element 61 below the window 41 of the shielding body 4 and the dose rate at a selected point at the shielding position by using Unidos, wherein the dose rate difference between the two is more than 3 orders of magnitude;
step five, supplying power to the electronic system 6, and monitoring the output of the system in real time;
starting an X-ray source, and irradiating the 1# component 61 to a specified total dose point;
seventhly, controlling the automatic moving guide rail to move the 2# component 61 to a position below the window 41 of the shielding body 4, and irradiating and accumulating the total dose to a specified total dose point;
step eight, sequentially moving all the numbered components 613#, 4#, and 5# … … in the electronic system 6 to the position below the window 41 for irradiation through the movable automatic guide rail 1, and accumulating the total dose to a specified total dose point;
step nine, after all the components 61 in the system are irradiated, repeating the processes from step six to step eight, and accumulating the 2 nd and 3 rd total dose points … … of all the components 61;
step ten, monitoring the output of the system in real time in the irradiation process, judging that the component 61 which is receiving irradiation below the window 41 is a system weak component once the output is abnormal or the system function is invalid, and recording the total accumulated total dose value of the component at the moment;
judging a failure mode output by the system, if the function failure of the whole system occurs, terminating the irradiation test, wherein the total dose resistance of the system is determined by the sum of the total doses accumulated by the current irradiation component 61 for many times, and the component 61 is radiation sensitive of the system; if the system output failure only occurs in a non-critical link of the system and the main functions of the system still keep normal, the failure sample can be skipped, the next component 61 is irradiated to find the 2 nd and 3 rd sensitive components 61 in the system, and the irradiation is continued until all the functions of the system have functional failure.
Claims (7)
1. An electronic system radiation sensitive position fast screening method based on X-ray is characterized by comprising the following steps:
step one, setting a relative position distribution diagram of electronic system components according to a PCB component layout diagram of a tested electronic system;
step two, processing the shielding body, and opening a window on the shielding body according to the size of a component in the electronic system;
fixing the electronic system on an X, Y-direction moving automatic guide rail, and aligning the window of the shielding body to a component needing to be irradiated in the electronic system;
setting the voltage and current of the X-ray source and the surface distance between the window and the component so as to obtain the required dose rate, and calibrating the surface dose rate of the component below the shielding window and the dose rate below the shielding position by using a dose calibrator so that the dose rate difference between the surface dose rate and the dose rate is in a set range;
supplying power to the electronic system and monitoring the output of the electronic system;
starting an X-ray source, and irradiating the 1 st component in the electronic system to a specified total dose point;
moving the automatic guide rail according to the relative position distribution diagram obtained in the step one, moving the 2 nd component to a position below a shielding body window, and irradiating and accumulating the total dose to a specified total dose point;
moving the automatic guide rail according to the relative position distribution diagram obtained in the step one, sequentially moving all components in the electronic system to a window for irradiation, and accumulating the total dose to a specified total dose point;
step nine, after all components in the electronic system are irradiated, repeating the processes from step six to step eight, and accumulating the 2 nd and 3 rd total dose points of … …;
step ten, monitoring the output of the electronic system in the irradiation process, if the output is abnormal or the system function is invalid, judging that the component under irradiation under the window is a system weak component, and recording the total accumulated total dose value of the component at the moment;
judging a system output failure mode, if the whole system fails, terminating the irradiation test, wherein the total dose resistance of the system is determined by the sum of the total doses accumulated by multiple weak devices at present; and if the system output failure only occurs in part of the system links, skipping the failure sample, and irradiating the next component to search for a second sensitive device and a third sensitive device in the system until all functions of the system fail.
2. The method for rapidly discriminating radiation-sensitive positions of an X-ray based electronic system according to claim 1, wherein: and in the fourth step, a dose calibrator is used for calibrating the surface dose rate of the element device below the shielding body window and the dose rate below the shielding position, and the dose rate difference between the surface dose rate and the dose rate is more than 3 orders of magnitude.
3. An electronic system radiation sensitive position fast screening method based on X-ray is characterized by comprising the following steps:
step one, processing a shielding body, and opening a window on the shielding body according to the size of a component in an electronic system;
fixing the electronic system on an X, Y-direction moving automatic guide rail, aligning a shielding body window to a component needing to be irradiated in the electronic system, aligning a ray outlet of the X-ray tube to the shielding body window, and ensuring that the center of the ray outlet, the center of the shielding body window and the center of the irradiated component are on the same straight line;
setting the voltage and the current of the X-ray source so as to obtain the required dose rate, and calibrating the surface dose rate of the component below the shielding body window and the dose rate below the shielding position by using a dose calibrator so that the dose rate difference between the surface dose rate and the dose rate is in a set range;
step four, supplying power to the electronic system, and monitoring the output of the electronic system in real time;
starting the X-ray source, irradiating until the system outputs or fails in function, and recording the accumulated total dose at the failure moment to obtain the total dose resistance of the component under the bias condition in the electronic system;
step six, replacing a failed component in the electronic system or replacing the electronic system, and repeating the step two to the step five to obtain the total dose resistance of all components in the electronic system;
and step seven, acquiring the radiation sensitive position of the electronic system according to the total dose resistance of all the components obtained in the step six.
4. The method for the rapid radiation-sensitive position screening of an electronic system based on X-rays according to claim 3, characterized in that: and fifthly, calibrating the surface dose rate of the element below the shielding body window and the dose rate below the shielding position by using a dose calibrator, wherein the dose rate difference between the surface dose rate and the dose rate is more than 3 orders of magnitude.
5. The utility model provides a quick discrimination system in electron system radiation sensitive position based on X ray which characterized in that: comprises an automatic guide rail (1), a ray tube guide rail (2), an X-ray tube (3) and a shield (4); the automatic guide rail (1) is arranged below the electronic system (6) and is used for realizing the movement of the electronic system (6) in the direction X, Y; the X-ray tube (3) is arranged on the tube guide rail (2) and is used for providing irradiated X-rays; the shielding body (4) is arranged between the X-ray tube (3) and the electronic system (6), a window (41) is arranged on the end face of the shielding body, and the X-ray irradiates a component (61) of the electronic system (6) through the window (41).
6. The X-ray based electronic system radiation sensitive position fast screening system according to claim 5, characterized in that: the X-ray shielding device further comprises a plurality of shielding sheets (5), the windows (41) are multiple, and the shielding sheets (5) are used for shielding the windows (41) which do not pass through the X-ray.
7. The X-ray based electronic system radiation sensitive position fast screening system according to claim 5 or 6, characterized in that: the shielding body (4) is a lead shielding body.
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| CN113064196B (en) | 2023-06-27 |
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