CN113777070A - Method for evaluating aging degree of silicone rubber through inorganic degree - Google Patents
Method for evaluating aging degree of silicone rubber through inorganic degree Download PDFInfo
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- 229920002379 silicone rubber Polymers 0.000 title claims abstract description 123
- 239000004945 silicone rubber Substances 0.000 title claims abstract description 54
- 230000032683 aging Effects 0.000 title claims abstract description 46
- 238000000034 method Methods 0.000 title claims abstract description 33
- 238000012360 testing method Methods 0.000 claims abstract description 92
- 239000000523 sample Substances 0.000 claims abstract description 50
- 229910002808 Si–O–Si Inorganic materials 0.000 claims abstract description 41
- 229910052681 coesite Inorganic materials 0.000 claims abstract description 32
- 229910052906 cristobalite Inorganic materials 0.000 claims abstract description 32
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 32
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 32
- 229910052682 stishovite Inorganic materials 0.000 claims abstract description 32
- 229910052905 tridymite Inorganic materials 0.000 claims abstract description 32
- 238000006073 displacement reaction Methods 0.000 claims abstract description 30
- 239000013068 control sample Substances 0.000 claims abstract description 15
- 238000002329 infrared spectrum Methods 0.000 claims abstract description 9
- 238000012512 characterization method Methods 0.000 claims abstract description 8
- 230000033558 biomineral tissue development Effects 0.000 claims description 17
- 239000002131 composite material Substances 0.000 claims description 15
- 239000012212 insulator Substances 0.000 claims description 15
- 238000010438 heat treatment Methods 0.000 claims description 12
- 238000010298 pulverizing process Methods 0.000 claims description 6
- 238000004364 calculation method Methods 0.000 abstract description 5
- 238000000227 grinding Methods 0.000 description 8
- 238000011156 evaluation Methods 0.000 description 6
- 238000001514 detection method Methods 0.000 description 4
- 238000005102 attenuated total reflection Methods 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 238000010835 comparative analysis Methods 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 239000013074 reference sample Substances 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 238000005033 Fourier transform infrared spectroscopy Methods 0.000 description 1
- 238000004566 IR spectroscopy Methods 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
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Abstract
The invention discloses a method for evaluating the aging degree of silicone rubber through the inorganic degree, which comprises the following steps of 1: selecting a silicon rubber product to be tested as a test sample, and selecting inorganic SiO2As a control sample; step 2: performing infrared spectrum characterization on the test surface of the test sample and the surface of the control sample by using an infrared spectrometer to obtain an infrared characteristic spectrogram and inorganic SiO of the test sample Si-O-Si2The infrared characteristic spectrogram; and step 3: according to the infrared characteristic peak of Si-O-Si relative to inorganic SiO2Judging the inorganic degree of the silicon rubber product according to the displacement difference of the infrared characteristic peak on the wave number, and further evaluating the aging degree of the silicon rubber product according to the inorganic degree. The method utilizes the infrared spectrometer to represent the surface inorganic degree of the silicon rubber product, further evaluates the aging degree of the silicon rubber product through the inorganic degree, has simple operation, can obtain the result through simple subtraction formula calculation, and has objective and reliable result.
Description
Technical Field
The invention relates to the technical field of high-voltage insulation detection, in particular to a method for evaluating the aging degree of silicon rubber through the inorganic degree.
Background
The silicon rubber product has the advantages of light weight, good stain resistance, convenient maintenance and the like, and is widely applied to the field of high-voltage insulation. But since silicone rubber is a type of rubber with-CH3The polymer material with side chains and Si-O-Si as main chains inevitably has main side chain fracture and aging under the combined action of conditions such as high temperature, ultraviolet, humidity and the like. Aging will be accompanied by the manifestation of many aging characteristics such as a decrease in elongation at break, an increase in hardness, inorganic silicidation, etc., wherein inorganic silicidation is one of the important characteristics in the aging process. Inorganic silicification directly causes the reduction of surface hydrophobicity, mechanical properties and the like, so that the operation safety of products cannot be ensured.
For the evaluation method of the degree of mineralization, X-ray diffraction spectroscopy (XPS) is mainly used for characterization at present, but XPS detection time is long, detection requirement is high, and actual requirements of field detection cannot be met, so that the evaluation system of the silicon rubber product by means of mineralization is immature, and a new method needs to be researched and applied.
Disclosure of Invention
Aiming at the defects of the prior art, the invention aims to provide a method for evaluating the aging degree of silicon rubber through the inorganic degree, an infrared spectrometer is adopted to carry out infrared spectrum characterization on a silicon rubber product to obtain an Si-O-Si infrared characteristic spectrogram of the silicon rubber product, and according to the fact that an infrared characteristic peak of Si-O-Si is relative to inorganic SiO2Judging the inorganic degree of the silicon rubber product by the displacement difference of the infrared characteristic peak on the wave number, and further evaluating the aging degree of the silicon rubber product through the inorganic degree. The method utilizes the infrared spectrometer to represent the surface inorganic degree of the silicon rubber product, further evaluates the aging degree of the silicon rubber product through the inorganic degree, has simple operation, can obtain the result through simple subtraction formula calculation, and has objective and reliable result.
In order to achieve the purpose, the technical means adopted by the invention are as follows: a method for evaluating the ageing degree of silicon rubber by inorganic degree includes such steps as,
step 1: selecting a silicon rubber product to be tested as a test sample, and selecting inorganic SiO2As a control sample;
step 2: performing infrared spectrum characterization on the test surface of the test sample and the surface of the control sample by using an infrared spectrometer to obtain an infrared characteristic spectrogram of the test sample Si-O-Si and an infrared characteristic spectrogram of the control sample;
and step 3: according to the infrared characteristic peak of Si-O-Si relative to inorganic SiO2Judging the inorganic degree of the silicon rubber product according to the displacement difference value of the infrared characteristic peak on the wave number, and further evaluating the aging degree of the silicon rubber product according to the inorganic degree.
The method utilizes the infrared spectrometer to represent the surface inorganic degree of the silicon rubber product, further evaluates the aging degree of the silicon rubber product through the inorganic degree, has simple operation, can obtain the result through simple subtraction formula calculation, and has objective and reliable result.
Preferably, in step 1, the test sample is a silicone rubber product cut into a rectangular parallelepiped shape, and the test surface is an outer surface of the silicone rubber product which is in contact with the external environment. The silicon rubber product is cut into a rectangular parallelepiped shape for facilitating muffle furnace heating treatment and infrared spectrometer characterization.
Preferably, when the silicone rubber product is a silicone rubber product which is not actually used in a factory, step S1 is further included between step 1 and step 2: the test specimen was placed in a muffle furnace for heat treatment. The method for accelerating aging in the laboratory is used for carrying out muffle furnace heating treatment on the silicon rubber product which is not actually used in the factory, can be used for quickly verifying the aging performance of the silicon rubber, and avoids unqualified products from flowing into the market to cause loss.
Preferably, the temperature of the muffle furnace is 300 ℃, and the test sample which is not actually used in the factory is subjected to heat treatment for 0h, 0.5h, 1.5h, 3.0h and 5.0h respectively. In the same batch, 0h is set as a control group, and the test samples with different processing times can be effectively compared, and the service life of the silicon rubber product can be compared.
Preferably, in step 2, the scanning range of the infrared spectrometer is1000cm-1-1250cm-1. Si-O-Si and inorganic SiO2The wave number of the infrared characteristic peak of (2) is located at 1000cm-1-1250cm-1In between, therefore, the scanning range of the infrared spectrometer is set at 1000cm-1-1250cm-1In addition, other spectrums irrelevant to the method are saved, so that the infrared characteristic spectrogram can more clearly display Si-O-Si and inorganic SiO2And comparison between test samples of different degrees of aging.
Preferably, in step 3, the infrared characteristic peak of Si-O-Si is relative to that of inorganic SiO2The smaller the displacement difference of the infrared characteristic peak in wave number, the higher the degree of mineralization.
Preferably, in step 3, the displacement difference is inorganic SiO2Wave number of infrared characteristic peak of-Si-O-Si.
Preferably, inorganic SiO2Has a wave number of 1104.63cm-1。
Preferably, in step 3, when the displacement difference is less than 86, the silicone rubber product has primary powdering, and when the displacement difference is less than 81, the silicone rubber product has severe powdering.
Preferably, when the silicon rubber product to be tested is the composite insulator silicon rubber shed, in the step 1, the silicon rubber shed at the high-voltage end of the composite insulator is selected as a test sample. The silicon rubber umbrella skirt at the high-voltage end of the composite insulator is the part which begins to age firstly in the whole composite insulator, and can represent the inorganic degree of the whole composite insulator.
The method utilizes the infrared spectrometer to represent the surface inorganic degree of the silicon rubber product, further evaluates the aging degree of the silicon rubber product through the inorganic degree, has simple operation, can obtain the result through simple subtraction formula calculation, and has objective and reliable result.
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FIG. 1 is a schematic view of the steps of a method for evaluating the degree of aging of silicone rubber by the degree of mineralization according to an embodiment of the present invention;
FIG. 2 is a schematic view showing the steps of a method for evaluating the degree of aging of silicone rubber by the degree of mineralization in accordance with another embodiment of the present invention;
FIG. 3 is a definition of a displacement difference L;
FIG. 4 shows the operating composite insulator shed Si-O-Si infrared characteristic peak and inorganic SiO2A comparative analysis chart of infrared characteristic peaks;
FIG. 5 shows the infrared characteristic peak and inorganic SiO of the test sample treated in the muffle furnace at different times2Comparative analysis chart of infrared characteristic peak.
Detailed Description
As required, detailed embodiments of the present invention are disclosed herein. However, it is to be understood that the disclosed embodiments are merely exemplary of the invention, which may be embodied in various forms. Therefore, specific details disclosed herein are not to be interpreted as limiting, but merely as a basis for the claims and as a representative basis for teaching one skilled in the art to variously employ the present invention in virtually any appropriately detailed manner, including employing various features disclosed herein in combination with features that may not be explicitly disclosed herein.
As shown in fig. 1, an embodiment of the present invention provides a method for evaluating the aging degree of silicone rubber by the degree of mineralization, comprising the steps of,
step 1: selecting a silicon rubber product to be tested as a test sample, and selecting inorganic SiO2As a control sample.
Step 2: performing infrared spectrum characterization on the test surface of the test sample and the surface of the control sample by using an infrared spectrometer to obtain an infrared characteristic spectrogram of the test sample Si-O-Si and an infrared characteristic spectrogram of the control sample; the infrared characteristic peak and the inorganic SiO of the test sample Si-O-Si can be read on the infrared characteristic spectrogram2The value of the infrared characteristic peak of (2).
And step 3: according to the infrared characteristic peak of Si-O-Si relative to inorganic SiO2Judging the inorganic degree of the silicon rubber product by the displacement difference of the infrared characteristic peak on the wave number, and further evaluating the aging degree of the silicon rubber product through the inorganic degree.
The infrared spectrum technology is a means for characterizing the surface chemical structure and information of a material; when a sample to be analyzed is focused and irradiated by infrared light with a certain frequency, if the vibration frequency of a certain group in a molecule is the same as the irradiation infrared frequency, resonance is generated, so that the infrared light with a certain frequency is absorbed, and the condition that the molecule absorbs the infrared light is recorded by an instrument, so that a spectrum which comprehensively reflects the characteristics of the components of the sample can be obtained, and the type and the structure of a compound can be further estimated.
In the embodiment, when the silicon rubber product is aged after running for a certain period, the molecular structure of the silicon rubber begins to change, and the Si-O-Si infrared characteristic peak on the surface of the material undergoes blue shift or red shift.
In this embodiment, in step 1, the test sample is a silicone rubber product cut into a rectangular parallelepiped shape, and the test sample retains an outer surface of the silicone rubber product in contact with the external environment as a test surface. Specifically, in this example, the test specimen had dimensions of 20mm × 10mm × 2mm, and the test face of the test specimen remained intact without any damage. The silicone rubber product is cut into a test sample in a cuboid shape, so that the test sample can be conveniently placed into an infrared spectrometer for testing.
In other embodiments, the size of the test sample is not limited to 20mm × 10mm × 2mm, and the shape of the test sample is not limited to a rectangular parallelepiped, as long as the integrity of the test surface of the test sample is ensured and the test sample can be accommodated by the infrared spectrometer. In addition, the cutting process is not required to touch the test area, so that the test sample is prevented from being polluted and the test result is not influenced.
In this embodiment, the silicone rubber product to be tested is a silicone rubber shed at the high-voltage end of the composite insulator. The selected part is preferably pulverized, whitish, silver-lined or ablated, and the silicone rubber umbrella skirt at the high-voltage end of the composite insulator is the part which begins to age firstly in the whole composite insulator and can represent the inorganic degree of the whole composite insulator.
In other embodiments, the test sample may be selected from other parts of the silicone rubber shed, such as the shed away from the insulating tube portion.
In this embodiment, the control sample is cut into the same shape and size as the test sample, and the amount of the parameter is controlled, so that the test result is more reliable.
In this embodiment, in step 2, an infrared spectrometer Is used to perform fourier infrared spectroscopy on the test surface of the test sample and the surface of the control sample, the infrared spectrometer selected in this embodiment Is a Thermo Fisher Nicolet Is10 FT-IR spectrometer manufactured by saimer flyers, which Is a mid-infrared spectrometer, and the scanning range Is 1000cm-1-1250cm-1The transmission mode is attenuated total reflection, and the number of scanning times is 32. Si-O-Si and inorganic SiO2The wave number of the infrared characteristic peak of (2) is located at 1000cm-1-1250cm-1In between, therefore, the scanning range of the infrared spectrometer is set at 1000cm-1-1250cm-1In addition, other spectrums irrelevant to the method are saved, so that the infrared characteristic spectrogram can more clearly display Si-O-Si and inorganic SiO2And comparison between test samples of different degrees of aging.
In other embodiments, the setting of the scanning range and the scanning times is not limited to the above values, which are preferred values obtained by technicians through multiple tests, and in other embodiments, other values may be set as long as the infrared characteristic spectrogram of the test sample is clear.
In this example, in step 3, the characteristic peak in terms of infrared of Si-O-Si with respect to inorganic SiO2The displacement difference value of the infrared characteristic peak on the wave number is used for judging the inorganic degree of the silicon rubber product, and the formula is represented as follows: displacement difference of inorganic SiO2Wave number of infrared characteristic peak of-Si-O-Si. The inorganic SiO can be obtained by testing2Has a wave number of 1104.63cm-1I.e. a difference of 1104.63cm-1-wave number of infrared characteristic peak of Si-O-Si. Referring to FIG. 3, the displacement difference is definedAnd L, the wave number of the infrared characteristic peak of Si-O-Si is defined as P, and L is 1104.63-P. As the silicon rubber product is aged after running for a certain period of time, the molecular structure of the silicon rubber begins to change, the Si-O-Si infrared characteristic peak on the surface of the silicon rubber product can be blue-shifted or red-shifted, and when the Si-O-Si infrared characteristic peak on the surface of the silicon rubber product is closer to the inorganic SiO2The more close the silicon rubber product is to inorganic SiO is shown when the infrared characteristic peak of the silicon rubber product is shown2I.e. the closer the silicone rubber product is to the powdering state, the conclusion is drawn: infrared characteristic peak of Si-O-Si relative to inorganic SiO2The smaller the displacement difference of the infrared characteristic peak on the wave number is, the higher the inorganic degree is, namely the higher the aging degree of the silicon rubber product is.
In step 3, when the displacement difference is less than 86, primary powdering of the silicone rubber product occurs, and at this time, it is necessary to start increasing attention and evaluation of the operating state of the silicone rubber product. When the displacement difference is less than 81, the silicone rubber product is severely pulverized, and the product needs to be replaced at the moment.
The embodiment can be used for judging the inorganic degree of an aged silicon rubber product, and the judgment cannot be made for a product which needs to quickly judge the performance of the silicon rubber and is not actually used in a factory. Now, referring to fig. 2, a method for evaluating the aging degree of silicone rubber by the degree of mineralization according to another embodiment of the present invention will be described in detail.
In another embodiment, the silicone rubber product is a silicone rubber product which is not actually used in the factory, and other steps are the same as those in the above embodiment, but step S1 is further included between step 1 and step 2: the test specimen was placed in a muffle furnace for heat treatment. The method for accelerating the aging of the silicon rubber product in the laboratory is used for carrying out muffle furnace heating treatment on the silicon rubber product which is not actually used in the factory, can be used for quickly verifying the performance of the silicon rubber, is not required to be used and then is tested, and avoids unqualified products from flowing into the market to cause loss.
In this example, the temperature of the muffle furnace was 300 ℃, and the test specimens which were not actually used in the factory were subjected to heat treatment for 0 hour, 0.5 hour, 1.5 hour, 3.0 hours, and 5.0 hours, respectively. The 0h is set as a comparison group, and the test samples in different time periods can be effectively compared, and the service life of the silicon rubber product can be compared.
In other embodiments, the temperature of the muffle furnace is not limited to 300 ℃ and can be about 300 ℃. The time for heating the test sample is not limited to the above time, and may be 2.0h, 3.5h, etc., and is set according to actual requirements.
In this example, five test samples were heated for 0h, 0.5h, 1.5h, 3.0h, and 5.0h, respectively, and then the test surfaces of the five test samples were subjected to infrared spectrum characterization to obtain five infrared characteristic spectrograms of Si-O-Si, which were combined with the inorganic SiO2In the infrared characteristic spectrogram of (1), as shown in FIG. 5, the actually displayed spectrogram is a colored line, so that the characteristic peak of Si-O-Si and the inorganic SiO on the test sample heated at different time periods can be clearly seen2The different displacement between the characteristic peaks can immediately judge the time section of the Si-O-Si characteristic peak and the inorganic SiO2The displacement between characteristic peaks is maximal.
In other embodiments, only one test sample can be used, the infrared characteristic spectrograms of the test sample are respectively measured when the test sample is heated by a muffle furnace for 0h, 0.5h, 1.5h, 3.0h and 5.0h, and the infrared characteristic spectrograms of five Si-O-Si are combined into the inorganic SiO2Can also immediately judge the Si-O-Si infrared characteristic peak and the inorganic SiO in which time period2The displacement difference between the infrared characteristic peaks is the largest.
According to the embodiment, after the silicone rubber product which is newly delivered and is not actually used is subjected to aging treatment by using a laboratory accelerated aging method, the surface inorganization degree of the product is represented by using an infrared spectrometer, the aging degree of the silicone rubber product is further evaluated by the inorganization degree, the operation is simple, the result can be obtained by simple subtraction formula calculation, the result is objective and reliable, the silicone rubber performance can be quickly verified, the test is not required to be carried out after the silicone rubber product is put into use, and unqualified products are prevented from flowing into the market and causing loss.
To demonstrate the feasibility of the method employed in the present invention, the feasibility of the method is described below.
Selecting different pulverization degrees and non-operating silicon rubber sheds in the same area as test samples, carrying out A, B, C, D marking on the test samples which are actually operated according to the pulverization degrees, wherein the pulverization degrees are higher and higher from A to D, and the non-operating test samples are marked as Origin. Specifically, a composite insulator of the same specification of the same manufacturer in the same area is selected, a composite insulator of the same specification of the same manufacturer which does not run (i.e. the running time is 0 year) is selected at the same time, a silicon rubber umbrella skirt is selected from the same part of each composite insulator for sampling, a tool knife is used for cutting a test sample of 20mm x 10mm x 2mm in size, the test surface of the test sample is kept complete and does not generate any damage, in addition, an inorganic SiO of the same size is cut2As a control sample. Respectively performing infrared spectrum test on the surfaces of A, B, C, D, Origin five test samples and a control sample by using an infrared spectrometer, wherein the scanning range is 1000cm-1-1150cm-1The transmission mode is attenuated total reflection, the scanning times are 32 times, and the infrared characteristic spectrogram of Si-O-Si of five test samples and the inorganic SiO of a reference sample are obtained2The infrared characteristic spectrogram of five Si-O-Si is combined into the inorganic SiO2As shown in fig. 4. Calculating the infrared characteristic peak of Si-O-Si relative to the inorganic SiO2The calculated results are shown in table 1, based on the displacement difference of the infrared characteristic peak in the wave number.
TABLE 1 Displacement Difference values for different powdering test samples
When the silicon rubber product is a silicon rubber product which is not actually used in a new factory, sampling is carried out on the same silicon rubber product, five test samples with the size of 20mm multiplied by 10mm multiplied by 2mm are respectively cut by using a tool knife, the test surface of each test sample is kept complete and does not generate any damage, and in addition, inorganic SiO with the same size is cut2As a control sample, the test sample was subjected to accelerated laboratory agingAnd performing heating treatment in a muffle furnace at 300 ℃, and performing heating treatment on the five test samples for 0h, 0.5h, 1.5h, 3.0h and 5.0h respectively. 0h is the test sample which is not subjected to accelerated ageing treatment and is marked as Origin. Respectively carrying out infrared spectrum test on the surfaces of the five test samples and the control sample by using an infrared spectrometer, wherein the scanning range is 1000cm-1-1250cm-1The transmission mode is attenuated total reflection, the scanning times are 32 times, and the infrared characteristic spectrogram of Si-O-Si of five test samples and the inorganic SiO of a reference sample are obtained2The infrared characteristic spectrogram of five Si-O-Si is combined into the inorganic SiO2As shown in fig. 5. Calculating the infrared characteristic peak of Si-O-Si relative to the inorganic SiO2The calculated results are shown in table 2, based on the displacement difference of the infrared characteristic peak in the wave number.
TABLE 2 Displacement Difference for muffle furnace processing test samples at different times
As the silicon rubber product is aged after running for a certain period of time, the molecular structure of the silicon rubber begins to change, the Si-O-Si infrared characteristic peak on the surface of the silicon rubber product can be blue-shifted or red-shifted, and when the Si-O-Si infrared characteristic peak on the surface of the silicon rubber product is closer to the inorganic SiO2The more close the silicon rubber product is to inorganic SiO is shown when the infrared characteristic peak of the silicon rubber product is shown2I.e. the closer the silicone rubber product is to the pulverized state. As can be seen from tables 1 and 2, the test samples with higher pulverization degree have smaller displacement difference, and the evaluation method provided by the present application is correctly feasible.
Combining the actual powdering condition of the aged test sample and table 1, and the actual powdering condition of the test sample subjected to accelerated aging treatment in a laboratory and table 2, it can be seen that when the displacement difference is less than 86, the primary powdering of the silicone rubber product occurs, and at this time, it is necessary to begin to increase the attention and evaluation of the operating state of the silicone rubber product. When the displacement difference is less than 81, the silicone rubber product is severely pulverized, and the product needs to be replaced at the moment. Therefore, the evaluation method can quickly evaluate the inorganization degree of the silicone rubber, further evaluate the aging degree of the silicone rubber product through the inorganization degree, quickly verify the performance of the silicone rubber, test the product which does not leave the factory after being used, avoid unqualified products from entering the market to cause loss, prompt attention to the surface hydrophobicity, mechanical performance and the like of the silicone rubber product for the product which is already operated, and timely replace the product of which the performance does not meet the use requirement, thereby ensuring the operation safety of the product to be better ensured.
While the invention has been described with reference to the above disclosure, it will be understood by those skilled in the art that various changes and modifications in the above-described structures and materials, including combinations of features disclosed herein either individually or in any combination, will be apparent to one skilled in the art from the spirit of the invention. Such variations and/or combinations are within the skill of the art to which the invention pertains and are within the scope of the following claims.
Claims (10)
1. A method for evaluating the aging degree of silicone rubber through the degree of mineralization is characterized in that: the method comprises the following steps:
step 1: selecting a silicon rubber product to be tested as a test sample, and selecting inorganic SiO2As a control sample;
step 2: performing infrared spectrum characterization on the test surface of the test sample and the surface of the comparison sample by using an infrared spectrometer to obtain an infrared characteristic spectrogram of the test sample Si-O-Si and an infrared characteristic spectrogram of the comparison sample;
and step 3: according to the infrared characteristic peak of Si-O-Si relative to inorganic SiO2Judging the inorganic degree of the silicon rubber product according to the displacement difference of the infrared characteristic peak on the wave number, and further evaluating the aging degree of the silicon rubber product according to the inorganic degree.
2. The method for evaluating the degree of aging of silicone rubber by degree of mineralization according to claim 1, wherein: in the step 1, the test sample is the silicone rubber product cut into a rectangular parallelepiped shape, and the test surface is an outer surface of the silicone rubber product in contact with an external environment.
3. The method for evaluating the degree of aging of silicone rubber by degree of mineralization according to claim 1, wherein: when the silicone rubber product is a silicone rubber product which is not actually used in a factory, a step S1 is further included between the step 1 and the step 2: and putting the test sample into a muffle furnace for heating treatment.
4. The method for evaluating the aging degree of silicone rubber by the degree of mineralization according to claim 3, wherein: and the temperature of the muffle furnace is 300 ℃, and the test sample is respectively subjected to heat treatment for 0h, 0.5h, 1.5h, 3.0h and 5.0 h.
5. The method for evaluating the degree of aging of silicone rubber by degree of mineralization according to claim 1, wherein: in the step 2, the scanning range of the infrared spectrometer is 1000cm-1-1250cm-1。
6. The method for evaluating the degree of aging of silicone rubber by degree of mineralization according to claim 1, wherein: in the step 3, the infrared characteristic peak of the Si-O-Si is relative to the inorganic SiO2The smaller the displacement difference of the infrared characteristic peak on the wave number is, the higher the inorganic degree is, and the higher the aging degree of the silicon rubber product is.
7. The method for evaluating the degree of aging of silicone rubber by degree of mineralization according to claim 1, wherein: in the step 3, the difference in displacement is the inorganic SiO2Wave number of the infrared characteristic peak of (a) -the wave number of the infrared characteristic peak of Si-O-Si.
8. Method for assessing the degree of ageing of silicone rubbers by mineralization according to claim 7, characterized in thatIn the following steps: the inorganic SiO2Has a wave number of 1104.63cm-1。
9. The method for evaluating the degree of aging of silicone rubber by degree of mineralization according to claim 1, wherein: in the step 3, when the displacement difference is less than 86, the silicone rubber product is subjected to primary pulverization, and when the displacement difference is less than 81, the silicone rubber product is subjected to severe pulverization.
10. The method for evaluating the degree of aging of silicone rubber by degree of mineralization according to claim 1, wherein: and when the silicon rubber product to be tested is the composite insulator silicon rubber shed, selecting the silicon rubber shed at the high-voltage end of the composite insulator as the test sample in the step 1.
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Citations (6)
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