CN113760750A

CN113760750A - Intelligent equipment testing method and device, electronic equipment and storage medium

Info

Publication number: CN113760750A
Application number: CN202110932945.7A
Authority: CN
Inventors: 林丰
Original assignee: Shenzhen TCL New Technology Co Ltd
Current assignee: Shenzhen TCL New Technology Co Ltd
Priority date: 2021-08-13
Filing date: 2021-08-13
Publication date: 2021-12-07
Anticipated expiration: 2041-08-13
Also published as: CN113760750B

Abstract

The embodiment of the application discloses an intelligent device testing method, an intelligent device testing device, electronic equipment and a storage medium; the method and the device can receive a test starting instruction aiming at the master control terminal and the plurality of slave control terminals; displaying a test operation interface according to the test starting instruction; acquiring at least one piece of test operation information through a test operation interface; packaging information of at least one piece of test operation information to obtain a test operation instruction; the test operation instruction is sent to the plurality of slave control terminals, so that the plurality of slave control terminals carry out test operation on the plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal, the workload of carrying out automatic test on the intelligent device can be reduced, and the efficiency of the automatic test is improved.

Description

Intelligent equipment testing method and device, electronic equipment and storage medium

Technical Field

The application relates to the technical field of communication, in particular to an intelligent device testing method and device, electronic equipment and a storage medium.

Background

After a type of intelligent equipment is developed, the developed intelligent equipment can be put into production and use after the intelligent equipment is subjected to complete machine testing. When the intelligent device is automatically tested, due to the particularity of the intelligent device (for example, the same type of device may have multiple models), the automatic test script needs to be written specifically for each model of intelligent device. When the requirements of the intelligent devices are changed, the automatic test scripts of the intelligent devices of different types under the same type need to be developed again, so that the efficiency of automatic test on the intelligent devices is reduced.

Disclosure of Invention

The embodiment of the application provides an intelligent device testing method and device, electronic equipment and a storage medium, and the workload of automatic testing on the intelligent device can be reduced, so that the efficiency of automatic testing is improved.

The embodiment of the application provides an intelligent device testing method, which comprises the following steps:

receiving a test starting instruction aiming at a master control terminal and a plurality of slave control terminals;

displaying a test operation interface according to the test starting instruction;

acquiring at least one piece of test operation information through the test operation interface;

packaging the information of the at least one test operation information to obtain a test operation instruction;

and sending the test operation instruction to the plurality of slave control terminals, and carrying out test operation on a plurality of intelligent devices by the plurality of slave control terminals according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal.

Correspondingly, this application embodiment still provides an intelligent equipment testing arrangement, includes:

the test starting instruction receiving unit is used for receiving test starting instructions aiming at the master control terminal and the plurality of slave control terminals;

the test operation interface display unit is used for displaying a test operation interface according to the test starting instruction;

the information acquisition unit is used for acquiring at least one piece of test operation information through the test operation interface;

the information packaging unit is used for packaging the at least one piece of test operation information to obtain a test operation instruction;

and the instruction sending unit is used for sending the test operation instruction to the plurality of slave control terminals, and the plurality of slave control terminals carry out test operation on the plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal.

In one embodiment, the information packaging unit includes:

the information identification subunit is used for carrying out information identification on the at least one piece of test operation information to obtain the test operation type and the test operation parameters of each piece of test operation information;

the generating subunit is used for generating an execution sequence of each test operation type according to the test operation parameters;

and the information packaging subunit is used for packaging the test operation type and the test operation parameter according to the execution sequence to obtain a test operation instruction.

In one embodiment, the generating subunit includes:

the comparison module is used for comparing the test triggering time of each test operation type to obtain the initial execution sequence of each test operation type;

and the updating module is used for updating the initial execution sequence of each test operation type according to the test operation frequency to obtain the execution sequence of each operation type.

In one embodiment, the instruction sending unit includes:

the acquisition subunit is used for acquiring the identification information of each slave control terminal;

the determining subunit is configured to determine, according to the identification information, an information transmission path of each slave control terminal;

and the sending subunit is configured to send the test operation instruction to the slave control terminal through the information transmission path.

In one embodiment, the sending subunit includes:

the acquisition module is used for acquiring identification information of a test operation program, wherein the test operation program is an application program in the slave control terminal;

and the sending module is used for sending the test operation instruction to the test operation program of the slave control terminal through the information transmission path according to the identification information of the test operation program.

The embodiment of the application further provides an intelligent device testing method, which comprises the following steps:

receiving a test operation instruction sent by a master control terminal, wherein the test operation instruction is generated based on test operation information, and the test operation information is obtained through a test operation interface;

displaying a test operation execution interface according to the test operation instruction;

analyzing the test operation instruction to obtain test operation information;

and triggering the intelligent equipment to execute corresponding test operation through the test operation execution interface according to the test operation information.

the test operation instruction receiving unit is used for receiving a test operation instruction sent by the main control terminal, the test operation instruction is generated based on test operation information, and the test operation information is obtained through a test operation interface;

the test operation execution interface display unit is used for displaying a test operation execution interface according to the test operation instruction;

the analysis unit is used for analyzing the test operation instruction to obtain test operation information;

and the triggering unit is used for triggering the intelligent equipment to execute corresponding test operation through the test operation execution interface according to the test operation information.

In one embodiment, the trigger unit comprises

The analysis subunit is used for analyzing the test operation information to obtain at least one test operation type and test operation parameters corresponding to the test operation type;

the determining subunit is used for determining a corresponding operation control in the test operation execution interface according to the test operation type;

and the triggering subunit is used for triggering the target operation control according to the execution sequence so as to enable the intelligent equipment to execute corresponding test operation.

In one embodiment, the trigger subunit includes:

the identification module is used for identifying the position information of the target operation control on the test operation execution interface according to the execution sequence;

and the adding module is used for adding acting force information on the position so as to trigger the target operation control.

Correspondingly, the embodiment of the application also provides an electronic device, which comprises a memory and a processor; the memory stores a computer program, and the processor is used for operating the computer program in the memory to execute the intelligent device testing method provided by any one of the embodiments of the application.

Correspondingly, an embodiment of the present application further provides a storage medium, where the storage medium stores a computer program, and the computer program, when executed by a processor, implements the intelligent device testing method provided in any embodiment of the present application.

The method and the device can receive a test starting instruction aiming at the master control terminal and the plurality of slave control terminals; displaying a test operation interface according to the test starting instruction; acquiring at least one piece of test operation information through a test operation interface; packaging information of at least one piece of test operation information to obtain a test operation instruction; the test operation instruction is sent to the plurality of slave control terminals, so that the plurality of slave control terminals carry out test operation on the plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal, the workload of carrying out automatic test on the intelligent device can be reduced, and the efficiency of the automatic test is improved.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

Fig. 1 is a schematic view of a scenario of an intelligent device testing method provided in an embodiment of the present application;

fig. 2 is a schematic flowchart of an intelligent device testing method provided in an embodiment of the present application;

fig. 3 is a schematic diagram of another scenario of an intelligent device testing method provided in an embodiment of the present application;

fig. 4 is a schematic flowchart of another intelligent device testing method provided in the embodiment of the present application;

fig. 5 is a schematic flowchart of another intelligent device testing method provided in the embodiment of the present application;

fig. 6 is a schematic structural diagram of an intelligent device testing apparatus provided in an embodiment of the present application;

fig. 7 is a schematic structural diagram of an intelligent device testing apparatus provided in an embodiment of the present application;

fig. 8 is a schematic structural diagram of an electronic device provided in an embodiment of the present application.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, however, the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments of the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

The embodiment of the application provides an intelligent device testing method, which can be executed by a first intelligent device testing device, and the first intelligent device testing device can be integrated in a first electronic device with at least one device testing hardware. The first electronic device may be a terminal or the like.

Among other things, the terminal may include a device that inputs programs and data to a computer or receives a result of processing output from the computer via a communication facility, and may interact with a user.

For example, the terminal may include a smart phone, a smart tablet, a personal computer, and the like.

The embodiment of the present application further provides another intelligent device testing method, where the intelligent device testing method may be executed by a second intelligent device testing apparatus, and the second intelligent device testing apparatus may be integrated in a second electronic device having at least one device testing hardware. The second electronic device may be a terminal or the like.

In an embodiment, the first electronic device may be a master control terminal, and the second electronic device may be a slave control terminal.

The master control terminal comprises a terminal capable of controlling the slave control terminal. The slave control terminal comprises a terminal capable of executing corresponding operation according to the instruction of the master control terminal. For example, the master control terminal may control the slave control terminal to perform corresponding operations. For example, the master control terminal may control the slave control terminal and the master control terminal to perform the same operation. For example, when a tester triggers a test start control on the master control terminal, the test start control on the slave control terminal is also started.

In an embodiment, as shown in fig. 1, an application scenario schematic diagram of the intelligent device testing method provided in the embodiment of the present application is provided, where the application scenario may include a master control terminal, a slave control terminal, a cloud server, and the like.

Among them, the cloud server (ECS) is a computing Service that is simple, efficient, safe, reliable, and flexible in processing capability. The management mode is simpler and more efficient than that of a physical server. A user can rapidly create or release any plurality of cloud servers without purchasing hardware in advance.

In the embodiment of the application, the cloud server can communicate with various different types of intelligent devices and terminal devices, and manage and control the various different types of intelligent devices and terminal devices.

The master control terminal can receive a test starting instruction aiming at the master control terminal and a plurality of slave control terminals; displaying a test operation interface according to the test starting instruction; acquiring at least one piece of test operation information through a test operation interface; packaging information of at least one piece of test operation information to obtain a test operation instruction; and sending the test operation instruction to the plurality of slave control terminals so that the plurality of slave control terminals perform test operation on the plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal.

The controlled terminal can receive a test operation instruction sent by the master control terminal, the test operation instruction is generated based on test operation information, and the test operation information is obtained through a test operation interface; displaying a test operation execution interface according to the test operation instruction; analyzing the test operation instruction to obtain test operation information; and triggering the intelligent equipment to execute corresponding test operation through a test operation execution interface according to the test operation information.

The cloud server can obtain slave control terminal test data of at least one slave control terminal; acquiring equipment test data of at least one intelligent equipment; performing association processing on the slave control terminal test data and the equipment test data to obtain an association relation between the terminal test data and the equipment test data; and generating a test report of the intelligent equipment according to the association relation.

For example, the method proposed in the embodiment of the present application may copy operations on the master control terminal to a plurality of slave control terminals, so that the slave control terminals may simulate the operations of the master control terminal. For example, the method provided in the embodiment of the present application may copy the test operation of the master terminal on the intelligent device to the multiple slave terminals, so that the multiple slave terminals may perform the test operation on the intelligent device controlled by the slave terminals by the master terminal in a model manner. Then, in the testing process, the cloud server can obtain the slave control terminal testing data and the equipment testing data of the intelligent equipment, and generate a testing report according to the slave control terminal testing data and the equipment testing data.

The following are detailed below, and it should be noted that the order of description of the following examples is not intended to limit the preferred order of the examples.

The embodiment of the present application will be described from the perspective of a first intelligent device testing apparatus, where the first intelligent device testing apparatus may be integrated in a first electronic device, and the first electronic device may be a master control terminal.

As shown in fig. 2, a method for testing an intelligent device is provided, where the method for testing an intelligent device can be executed by a main control terminal, and the specific process includes:

101. and receiving a test starting instruction aiming at the master control terminal and the plurality of slave control terminals.

The test starting instruction comprises an instruction which can start the master control terminal and the plurality of slave control terminals to perform test operation.

In an embodiment, the intelligent device testing method provided in the embodiment of the present application may include one master control terminal and a plurality of controlled terminals. The master control terminal can be connected with at least one intelligent device, the slave control terminal can also be connected with at least one intelligent device, and the master control terminal can control a plurality of slave control terminals.

The main control terminal can be a smart phone, a smart tablet, a personal computer and the like. The controlled terminal can also be a smart phone, a smart tablet, a personal computer and the like.

The smart devices may include various smart home devices. For example, the smart devices may include smart air conditioners, smart washing machines, smart televisions, smart microwaves, and the like.

For example, as shown in fig. 3, the intelligent device testing method provided in the embodiment of the present application may include 1 master control terminal and 3 controlled terminals. The master control terminal and the controlled terminal are respectively smart phones. The master control terminal can be connected with 1 intelligent device, and each controlled terminal can also be connected with 1 intelligent device. For example, the master control terminal may be connected to 1 intelligent air conditioner, and each controlled terminal may also be connected to 1 intelligent air conditioner. The intelligent air conditioners can be different in model and have different functional bright points.

In an embodiment, the master control terminal may control the connected smart devices. For example, the master control terminal may control operations such as turning on or off of the connected smart device.

In an embodiment, the slave control terminal may also control the connected intelligent device. For example, the slave control terminal may control operations such as turning on or off of the connected smart device.

In an embodiment, the main control terminal and the intelligent device may be connected in various ways. For example, the master control terminal and the intelligent device can be connected through bluetooth. For another example, the main control terminal and the intelligent device may be connected through wifi (wireless fidelity), and the like.

The slave control terminal and the intelligent device can be connected in various modes. For example, the slave control terminal and the intelligent device can be connected through Bluetooth. For another example, the slave control terminal and the smart device may be connected through WiFi, and so on.

In one embodiment, the test procedure may be configured before the main control terminal formally initiates the test operation. For example, the master control terminal and the controlled terminal may be configured so that the master control terminal knows which terminals are controlled terminals. For another example, a secure and stable information transmission path between the master control terminal and the controlled terminal may be established, so that the testing process may be smoothly performed, and so on.

In an embodiment, before the step "receiving a test starting instruction for the master control terminal and the plurality of slave control terminals", the method may include:

acquiring test configuration information aiming at a plurality of intelligent devices;

analyzing the test configuration information to obtain slave control terminal configuration information and test operation program configuration information;

determining a slave control terminal corresponding to each intelligent device according to the slave control terminal configuration information;

and determining the test operation program in the application programs of the slave control terminal according to the test operation program configuration information.

The test configuration information comprises information configured on the electronic equipment by a tester before the tester tests the intelligent equipment through the electronic equipment. According to the test configuration information, the electronic device can know the flow steps according to which the intelligent device is tested.

For example, the test configuration information may configure which are slave terminals, which are test operations, and so on.

In an embodiment, the intelligent device testing method provided in the embodiment of the present application may be executed by a testing operation program installed on a terminal.

The test operation program comprises an application program which can respond to a test starting instruction and control the intelligent equipment to perform test operation according to the test starting instruction.

For example, the test operating program may control the smart device to turn on, turn off, or perform certain functional modes of operation, and so on.

For another example, when the smart terminal is a smart home, the test operation program may be a smart home APP, and the like.

Wherein the application comprises a computer program performing one or more specific functions, which is operable in an interactive mode to interact with a user using the application, and which has a visual display interface.

For example, the application programs may include application software on various terminals. For example, the Application program may include various mobile phone software (APP), tablet Application software, Application software on a notebook Computer, Application software on a Personal Computer (PC), and the like.

As another example, an application may also include an applet. Among them, the applet (Mini Program) is an application Program that can be used without downloading and installing S. In order to provide more diversified business services to users, developers can develop corresponding applets for applications (such as instant messaging applications, shopping applications, mail applications, and the like) of the terminal, the applets can be embedded into the applications of the terminal as sub-applications, and the corresponding business services can be provided for the users by running the sub-applications (i.e., the corresponding applets) in the applications.

In one embodiment, the test configuration information may include slave terminal configuration information and test operating program configuration information. Therefore, after the master control terminal acquires the test configuration information, the master control terminal can analyze the test configuration information, so as to acquire the slave control terminal configuration information and the test operation program configuration information.

The slave control terminal configuration information comprises configuration information related to the slave control terminal. For example, the slave terminal configuration information may include identification information of the slave terminal, a server to which the slave terminal is connected, and the like.

Wherein the test operation program configuration information includes configuration information associated with the test operation program. For example, the test operation program configuration information may include identification information of the test operation program, a transmission path, and the like.

In an embodiment, the test configuration information may be configured by a tester and stored in the main control terminal, and the test main control terminal may obtain the test configuration information.

In an embodiment, the main control terminal may include a test configuration interface, and when a tester inputs test configuration information through the test configuration interface, the main control terminal may acquire the test configuration information.

In an embodiment, after the master control terminal obtains the slave control terminal configuration information, the master control terminal may determine the slave control terminal corresponding to each intelligent device according to the slave control terminal configuration information. Specifically, the step of determining the slave control terminal corresponding to each intelligent device according to the slave control terminal configuration information may include:

analyzing the configuration information of the slave control terminal to obtain the identification information of the slave control terminal;

matching the identification information of the slave control terminal with a preset identification matching table to obtain a matching result;

and determining the slave control terminal of the intelligent equipment according to the matching result.

In an embodiment, the slave control terminal configuration information may include identification information of the slave control terminal, so that the master control terminal may parse the slave control terminal configuration information to obtain the identification information of the slave control terminal.

The identification information of the slave control terminal comprises information which can represent the identity of the slave control terminal. By means of the identification information, the slave control terminal can be distinguished from other slave control terminals. For example, the identification information of the slave terminal may be a unique identifier of the device. For example, the identification information may be an International Mobile Equipment Identity (IMEI), and the like.

In one embodiment, after the master control terminal obtains the identification information of the slave control terminals, the master control terminal may determine which terminals are the slave control terminals.

For example, if the identification information of the slave control terminal is "abcd 789 dfg", the master control terminal may determine the slave control terminal according to the identification information.

And then, the master control terminal can match the identification information of the slave control terminal with a preset identification matching table to obtain a matching result. Then, the master control terminal can determine the connection relationship between the slave control terminal and the intelligent terminal according to the matching result.

The preset identification matching table comprises a connection relation between the slave control terminal and the intelligent terminal. Therefore, the master control terminal can match the identification information of the slave control terminal with the preset identification matching identification, so that the connection relationship between the slave control terminal and the intelligent terminal is determined.

In an embodiment, after the slave control terminal corresponding to each intelligent device is determined, the master control terminal may further determine a test operation program in the application programs of the slave control terminals according to the test operation program configuration information.

For example, the test operation program may include identification information of the test operation program. Then, the master control terminal may detect the identification information of all the application programs in the slave control terminal, thereby determining whether there is a test operation program in the slave control terminal.

The identification information of the application program may include a Package Name (Package Name) of the application program, and the like. The package name may be a unique identifier of an application program, and one package name represents one application.

In an embodiment, after the slave control terminal corresponding to each intelligent terminal is determined, in order to enable the slave control terminal to copy the operation of the tester on the master control terminal, it is further required to ensure that information can be stably transmitted between the master control terminal and the slave control terminal. Therefore, after the master control terminal determines the slave control terminal corresponding to each intelligent device, the master control terminal can also determine whether information can be stably transmitted between the master control terminal and the slave control terminal. Specifically, after the step "determining the slave control terminal corresponding to each intelligent device according to the slave control terminal configuration information", the method may include:

respectively sending a communication test instruction to each slave control terminal;

receiving a communication test feedback instruction returned by the slave control terminal;

identifying the communication test feedback instruction to obtain the feedback time of the communication test feedback instruction;

and establishing an information transmission path between the slave control terminal and the master control terminal according to the feedback time.

The communication test instruction comprises an instruction capable of testing the communication condition. The communication test feedback instruction comprises an instruction returned to the master control terminal by the slave control terminal. This may only be an instruction that acknowledges the communication test instruction.

For example, the communication test instructions may include instructions with a communication test question, and then the communication test feedback instructions may include a reply to the communication test question.

In one embodiment, after the slave control terminal transmits the communication test command, the slave control terminal may record the time of the command transmission. Then, the master control terminal may calculate the feedback time of the test feedback instruction and the instruction sending time, so as to obtain the instruction feedback duration of the slave control terminal.

For example, the time of transmission of the communication test instruction is 11: 30, the feedback time of the test feedback instruction is 11: 35. and the master control terminal obtains the instruction feedback time of the slave control terminal by calculation, wherein the instruction feedback time is 5 minutes. The longer time of 5 minutes indicates that the current information transmission paths of the master control terminal and the slave control terminal can be transmitted at a slower rate. At this time, the master control terminal may notify the tester of the instruction feedback duration of the slave control terminal, so that the tester may adjust the information transmission path between the master control terminal and the slave control terminal.

For another example, when the instruction feedback duration of the slave control terminal is 2 seconds, this indicates that the current information transmission paths of the master control terminal and the slave control terminal are relatively stable and efficient, and at this time, the current information transmission paths of the master control terminal and the slave control terminal may be determined as the information transmission paths.

In an embodiment, when the master control terminal has not received the communication test feedback instruction of the slave control terminal within a certain time threshold, the master control terminal may notify the tester, so that the tester may adjust an information transmission path between the master control terminal and the slave control terminal.

For example, when the master control terminal still receives a communication test feedback instruction of the slave control terminal for more than 10 minutes, the master control terminal notifies a tester so that the tester can adjust an information transmission path between the master control terminal and the slave control terminal.

In an embodiment, in order to more conveniently perform the intelligent device testing method proposed in the embodiment of the present application, the applicant of the present application develops an intelligent device testing program (also referred to as agent).

In one embodiment, the agent may be installed on the master control terminal and the controlled terminal. Then, the master control terminal can determine the slave control terminal according to the agent. In addition, the main control terminal can also determine a test operation program through the agent, so that the operation of a tester on the main control terminal can be synchronized on the controlled terminal. Moreover, the agent can also perform communication test between the master control terminal and the controlled terminal, so that the communication between the master control terminal and the controlled terminal can be normal.

In an embodiment, the agent may further collect performance conditions of the master control terminal and the controlled terminal in the testing process. For example, the agent may collect performance data of the CPU, the memory, the frame rate, and the like of the master control terminal and the controlled terminal, and send the collected performance data to the cloud, so that the cloud may analyze the test process according to the performance data.

102. And displaying a test operation interface according to the test starting instruction.

In an embodiment, after the main control terminal receives the test start instruction, the test operation interface may be displayed according to the test start instruction.

The test operation interface comprises an interface which can trigger the test operation of the intelligent equipment.

In one embodiment, the test operation interface may be an interface on a test operation program. For example, when a tester clicks a test start control on a test operation program on the main control terminal, the main control terminal receives a test start instruction. And then, the main control terminal can display a test operation interface according to the test starting instruction.

103. And acquiring at least one piece of test operation information through the test operation interface.

In an embodiment, the test operation interface may include a plurality of controls, where each control may correspond to a test operation on the smart device.

For example, when the intelligent device is an intelligent washing machine, the test operation interface may include an open control, a close control, a pause control, a washing control, a dehydration control, and the like.

Each control is provided with a parameter setting area, and a tester can set the parameters of each control through the parameter setting area, so that the test operation of the intelligent equipment is realized.

For example, when a tester needs to test the start function, the close function and the pause function of the intelligent washing machine, the tester can select the start control, the close control and the pause control on the test operation interface. The tester may then set the parameters of the open control, the close control, and the pause control, respectively. For example, the tester may set the time the intelligent washing machine is turned on, the time the intelligent washing machine is turned off, the pause time and frequency of pauses of the intelligent washing machine, and so on.

When a tester selects a control and sets parameters of the control through the test operation interface, the main control terminal can acquire at least one piece of test operation information.

The test operation information includes information that can explain what test operation is performed on the smart device and how the test operation is performed.

Wherein one test operation information may correspond to one test operation

For example, when a tester selects the open control and sets the corresponding parameters, a test operation message is generated. For another example, when the tester selects the washing control and sets the corresponding parameters, another test operation information is generated, and so on.

104. And packaging the information of at least one piece of test operation information to obtain a test operation instruction.

In an embodiment, after the main control terminal obtains the at least one test operation information, the at least one test operation information may be subjected to information packaging processing, so as to obtain the test operation instruction. Specifically, the step of performing information packaging processing on at least one piece of test operation information to obtain a test operation instruction may include:

performing information identification on at least one piece of test operation information to obtain a test operation type and a test operation parameter of each piece of test operation information;

generating an execution sequence of each test operation type according to the test operation parameters;

and packaging the test operation type and the test operation parameters according to the execution sequence to obtain a test operation instruction.

The operation type may refer to what the test operation performed on the smart device is. For example, when the smart device is a smart washing machine, turning on the smart washing machine is one type of operation. Turning off the intelligent washing machine is also one type of operation. It is also an operation type to make the intelligent washing machine perform the dehydration function.

The test operation parameters may refer to rules to be obeyed when the intelligent device is subjected to test operation. For example, the test operating parameters may include a test trigger time and a test operating frequency, among others.

The test trigger time may refer to a time when the smart device starts to perform the test operation.

The test operation frequency may refer to the number of times the intelligent device performs the test operation. For example, when the frequency of the test operation is 3, it means that the smart device repeatedly performs the test operation 3 times during the test process. For example, when the smart device is a washing machine, when the frequency of the dehydration operation is 3, the washing machine repeats the dehydration operation 3 times during the test.

In an embodiment, the test operation information may include a test operation type and a test operation parameter, so that the main control terminal may perform information identification on the test operation information to obtain the test operation type and the test operation parameter.

In an embodiment, the master control terminal may generate an execution sequence of each test operation type according to the test operation parameters. The test operation parameters include test trigger time and test operation frequency, so that the main control terminal can generate an execution sequence of each test operation type according to the test trigger time and the test operation frequency. Specifically, the step "generating an execution sequence of each test operation type according to the test operation parameters" may include:

comparing the test trigger time of each test operation type to obtain an initial execution sequence of each test operation type;

and updating the initial execution sequence of each test operation type according to the test operation frequency to obtain the execution sequence of each test operation type.

In an embodiment, the master control terminal may compare the test trigger time of each test operation type, so as to obtain an initial execution sequence of each test operation type. For example, for a test operation type with a test trigger time before, the master control terminal may set an initial execution sequence of the test operation type before. For the test operation type with the later test trigger time, the main control terminal may set the initial execution sequence of the test operation type to the later.

For example, there are 4 operation types, respectively test operation type 1, test operation type 2, test operation type 3, and test operation type 4. Wherein the test trigger time of the test operation type 1 is 11: 30, test trigger time of test operation type 2 is 11: 31, test trigger time for test operation type 3 is 11: 32, test trigger time for test operation type 4 is 11: 33. then, according to the test trigger time of the test operation type, the initial execution sequence may be set to execute the test operation type 1 first, then execute the test operation type 2, then execute the test operation type 3, and finally execute the test operation type 4.

In an embodiment, after the main control terminal obtains the initial execution sequence of each test operation type, the initial execution sequence of each test operation type may be updated according to the test operation frequency, so as to obtain the execution sequence of each test operation type.

For example, the test operation frequency of the test operation type 1 and the test operation type 3 is 1, and the test operation frequency of the test operation type 2 and the test operation type 4 is 2. Then, the execution sequence obtained after updating the initial execution sequence of each test operation type is: test operation type 1, test operation type 2, test operation type 3, test operation type 4, and test operation type 4.

In an embodiment, after generating the execution sequence of each test operation type, the main control terminal may perform information packing processing on the test operation type and the test operation parameter according to the execution sequence, so as to obtain the test operation instruction.

For example, the test operation type and the test operation parameter may be spliced according to the execution sequence, and a communication address of the slave control terminal and a communication address of the test operation program may be added to obtain the test operation instruction.

Wherein, the communication address of the test operation program may be an xpath path, and the like. Among them, the xpath path is a positioning policy. The xpath path may be a direct path or an indirect path and may identify the location of the application in the terminal device.

In an embodiment, the agent end in the main control terminal may package the test operation information, so as to obtain the test operation instruction.

105. And sending the test operation instruction to a plurality of slave control terminals so that the plurality of slave control terminals perform test operation on the plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal.

In an embodiment, the master control terminal may send the test operation instruction to the plurality of slave control terminals, so that the plurality of slave control terminals perform test operation on the plurality of intelligent devices according to the test operation instruction.

The master control terminal can send the test operation instruction to the plurality of slave control terminals in parallel, so that the plurality of slave control terminals can simultaneously perform test operation on the plurality of intelligent devices according to the test operation instruction.

For example, if a tester triggers the intelligent device to perform an opening operation in the master control terminal, the slave control terminal simulates the master control terminal and also performs an opening operation on the intelligent device.

For another example, after the tester triggers the intelligent device to perform the opening operation in the main control terminal, the tester performs the closing operation again. The slave control terminal can simulate the master control terminal and also carry out closing operation after the intelligent equipment is opened.

The embodiment of the application provides an intelligent device testing method, which can receive test starting instructions aiming at a master control terminal and a plurality of slave control terminals; displaying a test operation interface according to the test starting instruction; acquiring at least one piece of test operation information through a test operation interface; packaging information of at least one piece of test operation information to obtain a test operation instruction; and sending the test operation instruction to a plurality of slave control terminals so that the plurality of slave control terminals perform test operation on the plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal. According to the intelligent equipment testing method provided by the embodiment of the application, the operation of a tester on the master control terminal can be copied to the slave control terminal through the master control terminal, so that the slave control terminal can simultaneously carry out testing operation on the intelligent equipment connected with the slave control terminal according to the testing operation instruction, the intelligent equipment of different models can be simultaneously tested on the premise of not repeatedly developing scripts, the workload of the tester for carrying out automatic testing on the intelligent equipment is reduced, and the efficiency of automatic testing is improved.

In addition, in the embodiment of the present application, the main control terminal may further perform a packing process with the test operation type and the test operation parameter according to the test operation information. By packaging the test operation types and the test operation parameters, the slave control terminal can quickly perform test operation on the intelligent equipment according to the execution sequence after receiving the test operation instruction, and the efficiency of automatic test is further improved.

In addition, in the embodiment of the application, the master control terminal can also send a communication test instruction to each slave control terminal; receiving a communication test feedback instruction returned by the slave control terminal; identifying the communication test feedback instruction to obtain the feedback time of the communication test feedback instruction; and establishing an information transmission path between the slave control terminal and the master control terminal according to the feedback time, thereby improving the safety and reliability of the intelligent equipment testing method provided by the embodiment of the application.

The intelligent device testing method provided in the embodiment of the present application is introduced from the perspective of the first intelligent device testing apparatus, where the first intelligent device testing apparatus may be integrated in a first electronic device, and the first electronic device may be a main control terminal.

The following describes a method for testing an intelligent device according to an embodiment of the present application from the perspective of a second intelligent device testing apparatus. The second intelligent device testing apparatus may be integrated in a second electronic device, and the second electronic device may be a controlled terminal.

As shown in fig. 4, a method for testing an intelligent device is provided, where the method for testing an intelligent device can be executed by a slave control terminal, and the specific process includes:

201. and receiving a test operation instruction sent by the main control terminal, wherein the test operation instruction is generated based on the test operation information, and the test operation information is obtained through a test operation interface.

In an embodiment, after the master control terminal sends the test operation instruction to the plurality of slave control terminals, the slave control terminals may receive the test operation instruction sent by the master control terminal.

202. And displaying a test operation execution interface according to the test operation instruction.

In an embodiment, after the slave control terminal receives the test operation instruction, the slave control terminal may display a test operation execution interface according to the test operation instruction.

The test operation execution interface comprises a test operation interface and an interface which can trigger the test operation of the intelligent equipment according to the test operation instruction.

In an embodiment, the test operation execution interface may be an interface in a test operation program on the controlled terminal. For example, after receiving the test operation instruction from the slave control terminal, the slave control terminal may display the test operation execution interface in the test operation program.

203. And analyzing the test operation instruction to obtain test operation information.

In an embodiment, the slave control terminal may further analyze the test operation instruction to obtain test operation information, so that the slave control terminal may trigger the intelligent device to execute a corresponding test operation through the test operation execution interface according to the test operation information.

For example, the slave control terminal may traverse the test operation instruction to obtain the test operation information. For another example, the slave control terminal may obtain the test operation information by reading information in the test operation instruction.

204. And triggering the intelligent equipment to execute corresponding test operation through the test operation execution interface according to the test operation information.

In an embodiment, after the slave control terminal obtains the test operation information, the slave control terminal may trigger the intelligent device to execute a corresponding test operation through the test operation execution interface according to the test operation information. Specifically, the step of triggering the intelligent device to execute the corresponding test operation through the test operation execution interface according to the test operation information may include:

analyzing the test operation information to obtain at least one test operation type and an execution sequence corresponding to the test operation type;

determining a target operation control corresponding to the test operation type in a test operation execution interface according to the test operation type;

and triggering the target operation control according to the execution sequence so that the intelligent equipment executes corresponding test operation.

In an embodiment, since the test operation information may include the test operation type and the test parameter corresponding to the test operation type, the slave control terminal may analyze the test operation information to obtain at least one test operation type and the test operation parameter corresponding to the test operation type.

In one embodiment, a plurality of test operation controls may be included on the test operation execution interface. For example, when the intelligent device is an intelligent washing machine, the test operation execution interface may include an open control, a close control, a pause control, a wash control, a dehydration control, and the like.

Therefore, the slave control terminal can determine the corresponding target operation control in the test operation execution interface according to the test operation type. For example, when the test operation type is an operation of starting the intelligent device, the slave control terminal may determine the start control as the target operation control. For another example, when the test operation type is the operation of turning off the smart device, the slave control terminal may determine the pause control as the target operation control, and so on.

When the target operation control is determined on the test operation execution interface, the test operation type and the operation control on the test operation interface can be matched, so that the target operation control is determined.

After the target operation control is determined, the slave control terminal may trigger the target operation control according to the execution sequence, so that the intelligent device executes a corresponding test operation. Specifically, the step "triggering the target operation control according to the execution sequence" may include:

identifying the position information of the target operation control on the test operation execution interface according to the execution sequence;

and adding acting force information on the position to trigger the target operation control.

In an embodiment, each target operation control has a corresponding execution sequence, so that the position information of the target operation control on the test operation interface can be identified according to the execution sequence, and the acting force information is added at the position to trigger the target operation control.

The position information may include a position of the target operation control on the test operation execution interface.

For example, a rectangular coordinate system may be set on the test operation execution interface. For example, the lower left corner of the test operation execution interface may be a coordinate origin, and the position information of the target operation control may be identified by the position information on the coordinate axis.

For example, the position information of the target operation control in the test operation execution interface may be represented by a rectangular (Rect) object. The Rect object corresponding to the target operation control may include four parameters, which are (x, y, width, height). Wherein, x can represent the abscissa of the upper left corner of the rectangle, that is, the abscissa of the target operation control in the test operation execution interface; y can represent the ordinate of the upper left corner of the rectangle, namely the ordinate of the target operation control in the test operation execution interface; width may represent the width of the rectangle and height may represent the height of the rectangle.

In one embodiment, the target operation control may be identified in the test operation execution interface in a variety of ways. For example, image recognition technology may be used to perform target detection on the target operation control in the test operation execution interface, and so on.

In an embodiment, after the position information is obtained through identification, acting force information may be added to the target operation control according to the position information to trigger the target operation control.

Wherein the acting force information comprises information which can trigger the target operation control. The target operation control can be triggered through the acting force information.

In an embodiment, the embodiment of the application provides an intelligent device testing method, which can receive a test operation instruction sent by a master control terminal, wherein the test operation instruction is generated based on test operation information, and the test operation information is obtained through a test operation interface; displaying a test operation execution interface according to the test operation instruction; analyzing the test operation instruction to obtain test operation information; and triggering the intelligent equipment to execute corresponding test operation through the test operation execution interface according to the test operation information. The intelligent equipment testing method provided by the embodiment of the application can reduce the workload of carrying out automatic testing on the intelligent equipment, thereby improving the efficiency of automatic testing.

For example, after a tester clicks the open control in the master control terminal, the open control in the slave control terminal is also triggered. In this simulation, the master control terminal and the slave control terminal are bound to different intelligent devices, that is, the master control terminal a is bound to the intelligent device X, and the slave control terminal B is bound to the intelligent device Y. Wherein, each slave control terminal can also be bound with different intelligent devices. For example, the slave control terminal C is bound with the smart device Z. Therefore, in the same operation of triggering the start control, the intelligent device X is started after the master control terminal a executes the operation, the intelligent device Y is started after the slave control terminal B executes the operation, and the intelligent device Z is started after the slave control terminal C executes the operation. This enables a contrast test to be performed that contrasts the differences that the smart devices X, Y and Z would exhibit when the master control terminal A, the slave control terminal B, and the slave control terminal C would be operating identically. For example, the differences include response time, whether the booting is successful or not, default states of the smart device after the booting is completed (for example, when the smart device is a smart air conditioner, the booting default temperature of the smart air conditioner X is 26 °, the booting default temperature of the smart air conditioner Y is 27 °, the booting default temperature of the air conditioner Z is 24 °), and the like. Through the testing mode of mirror image simulation, the workload of carrying out automatic testing on the intelligent equipment can be reduced, and the efficiency of automatic testing is improved.

The following describes a method for testing an intelligent device according to an embodiment of the present application from the perspective of a third intelligent device testing apparatus. The third intelligent device testing apparatus may be integrated in a third electronic device, and the second electronic device may be a cloud server.

As shown in fig. 5, a method for testing an intelligent device is provided, where the method for testing an intelligent device may be executed by a cloud server, and the specific process includes:

301. and acquiring the test data of the slave control terminal of at least one slave control terminal.

The slave control terminal test data comprises various data which can represent the performance condition of the slave control terminal generated by the slave control terminal in the test process. For example, the slave terminal test data may include performance data such as CPU, memory, and frame rate of the slave terminal.

For example, the cloud server may continuously obtain slave control terminal test data of at least one slave control terminal during a test process.

302. Device test data of at least one smart device is obtained.

The device test data comprises test data generated by the intelligent device in the test process. For example, the device test data may include test states of the smart device, test parameters generated at the respective test states, and so on. For example, the device test data may include response time, power, etc. of the smart device.

In an embodiment, the intelligent device and the tester may be connected, and then the tester may collect device test data of the intelligent device in a test process and send the device test data to the cloud server, so that the cloud server obtains the device test data of at least one intelligent device.

303. And performing association processing on the slave control terminal test data and the equipment test data to obtain an association relation between the terminal test data and the equipment test data.

In an embodiment, after the cloud server obtains the slave control terminal test data and the device test data, the slave control terminal test data and the device test data may be associated to obtain an association relationship between the terminal test data and the device test data.

For example, the cloud server may correlate the slave control terminal test data of the intelligent device in different test states with the test parameters generated in each test state, so as to obtain a correlation between the terminal test data and the device test data.

304. And generating a test report of the intelligent equipment according to the association relation.

In an embodiment, the cloud service may further generate a test report of the smart device according to the association relationship.

For example, the cloud server may generate at least one of a graph, a line graph, a bar graph, a pie graph, and other statistical graphs according to the association relationship.

For example, the cloud service may generate at least one of a graph, a line graph, a bar graph, a pie graph, and other statistical graphs according to the association relationship between the slave control terminal test data in different test states and the test parameters generated in each test state.

For example, the intelligent washing machine is No. 13 at 6 months and 20 months in 2021: 20-13: the test state during 40 is a washing state, wherein during washing, the power of the intelligent washing machine is 1000 hz and the temperature is 40 degrees celsius. The cloud service may generate a histogram of the intelligent laundry machine according to the above data.

For another example, the intelligent washing machine is No. 13 at 6 months and 20 months in 2021: 20-13: the test state during 40 is a washing state. Wherein, during the washing period, the power changes of the intelligent washing machine are respectively 800 Hz, 1000 Hz, 1150 Hz, 1300 Hz and 900 Hz. Then, the cloud service may generate a line graph of the intelligent washing machine according to the data.

The embodiment of the application provides an intelligent equipment testing method, which can obtain the test data of a slave control terminal of at least one slave control terminal; acquiring equipment test data of at least one intelligent equipment; performing association processing on the slave control terminal test data and the equipment test data to obtain an association relation between the terminal test data and the equipment test data; and generating a test report of the intelligent equipment according to the association relation. Through the test, the tester can compare and analyze to see whether the product has the problems of compatibility, user experience difference and the like. In addition, the cloud server can automatically generate the test report, so that the workload of self-writing the report by testers can be reduced, and the efficiency of automatic testing is improved.

In an embodiment, the embodiment of the present application further provides an intelligent device testing system. The intelligent device testing system can comprise a master control terminal, a controlled terminal and a cloud server.

The master control terminal can receive a test starting instruction aiming at the master control terminal and a plurality of slave control terminals; according to the test starting instruction, the main control terminal can display a test operation interface; through the test operation interface, the master control terminal can obtain at least one piece of test operation information; the master control terminal packs the information of the at least one test operation information to obtain a test operation instruction; and the master control terminal sends the test operation instruction to the plurality of slave control terminals so that the plurality of slave control terminals perform test operation on the plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal.

The controlled terminal can receive a test operation instruction sent by the master control terminal, the test operation instruction is generated based on test operation information, and the test operation information is obtained through a test operation interface; the controlled terminal displays a test operation execution interface according to the test operation instruction; the controlled terminal analyzes the test operation instruction to obtain test operation information; and the controlled terminal triggers the intelligent equipment to execute corresponding test operation through the test operation execution interface according to the test operation information.

The cloud server can obtain slave control terminal test data of at least one slave control terminal; the cloud server can obtain the device test data of at least one intelligent device; the cloud server can perform association processing on the slave control terminal test data and the equipment test data to obtain an association relation between the terminal test data and the equipment test data; the cloud server can generate a test report of the intelligent device according to the association relation.

According to the intelligent device testing system provided by the embodiment of the application, the controlled terminal can copy the testing operation of the tester on the intelligent device on the main control terminal, so that the intelligent devices of various different models can be tested on the premise of not modifying the testing script, and the testing efficiency is improved. In addition, the intelligent device testing system provided by the embodiment of the application can test a plurality of intelligent devices simultaneously, so that comparison testing can be performed among the plurality of devices, and the testing efficiency is improved. In addition, in the intelligent device testing system provided by the embodiment of the application, the cloud server can automatically generate the test report, so that the workload of self-writing the report by testers can be reduced, and the efficiency of automatic testing is improved.

In order to better implement the intelligent device testing method provided by the embodiment of the present application, in an embodiment, a first intelligent device testing apparatus, a second intelligent device testing apparatus, and a third intelligent device testing are further provided, where the first intelligent device testing apparatus may be integrated in a first electronic device, and the first electronic device may be a terminal or other device. The second smart device test may be integrated in a second electronic device, which may be a terminal or the like. The third smart device test may be integrated in a third electronic device, which may be a device such as a cloud server. The meaning of the noun is the same as that in the intelligent device testing method, and specific implementation details can refer to the description in the method embodiment.

In an embodiment, a first intelligent device testing apparatus is provided, where the first intelligent device testing apparatus may be specifically integrated in a first electronic device (for example, a master control terminal), as shown in fig. 6, and the first device network distribution apparatus includes: a test start instruction receiving unit 401, a test operation interface display unit 402, an information obtaining unit 403, an information packaging unit 404, and an instruction sending unit 405, which are specifically as follows:

a test start instruction receiving unit 401, configured to receive a test start instruction for a master control terminal and multiple slave control terminals;

a test operation interface display unit 402, configured to display a test operation interface according to the test start instruction;

an information obtaining unit 403, configured to obtain at least one piece of test operation information through the test operation interface;

an information packing unit 404, configured to perform information packing processing on the at least one test operation information to obtain a test operation instruction;

an instruction sending unit 405, configured to send the test operation instruction to the multiple slave control terminals, so that the multiple slave control terminals perform a test operation on multiple intelligent devices according to the test operation instruction, where one intelligent device is controlled by one slave control terminal.

In one embodiment, the information packaging unit 404 includes:

In one embodiment, the generating subunit includes:

In one embodiment, the instruction sending unit 405 includes:

In one embodiment, the sending subunit includes:

In an embodiment, a second smart device testing apparatus is provided, which may be specifically integrated in a second electronic device (e.g., a slave terminal). As shown in fig. 7, the second smart device testing apparatus includes: the test operation instruction receiving unit 501, the test operation execution interface display unit 502, the parsing unit 503 and the triggering unit 504 are specifically as follows:

a test operation instruction receiving unit 501, configured to receive a test operation instruction sent by a master control terminal, where the test operation instruction is generated based on test operation information, and the test operation information is obtained through a test operation interface;

a test operation execution interface display unit 502, configured to display a test operation execution interface according to the test operation instruction;

an analyzing unit 503, configured to analyze the test operation instruction to obtain test operation information;

and a triggering unit 504, configured to trigger the intelligent device to execute a corresponding test operation through the test operation execution interface according to the test operation information.

In one embodiment, the trigger unit 504 includes

In one embodiment, the trigger subunit includes:

In an embodiment, a third smart device testing apparatus is provided, which may be specifically integrated in a third electronic device (e.g., a cloud server). Wherein, this third smart machine testing arrangement includes: the device comprises a first data acquisition unit, a second data acquisition unit, an association processing unit and a generation unit, and specifically comprises the following steps:

the first data acquisition unit is used for acquiring terminal test data of at least one slave control terminal;

the second data acquisition unit is used for acquiring the equipment test data of at least one intelligent equipment;

the association processing unit is used for performing association processing on the terminal test data and the equipment test data to obtain an association relation between the terminal test data and the equipment test data;

and the generating unit is used for generating a test report of the intelligent equipment according to the incidence relation.

In a specific implementation, the above units may be implemented as independent entities, or may be combined arbitrarily to be implemented as the same or several entities, and the specific implementation of the above units may refer to the foregoing method embodiments, which are not described herein again.

The test inspection device can inspect the test feedback data on the microscopic granularity, and improves the reliability of the test feedback data in the product verification test, thereby improving the accuracy of the test result in the product verification test.

The embodiment of the application further provides an electronic device, which may include a terminal or a server, for example, the electronic device may be an intelligent device test terminal, and the intelligent device test terminal may be an intelligent television or the like; for another example, the computer device may be a server, such as an intelligent device testing server. As shown in fig. 8, it shows a schematic structural diagram of a terminal according to an embodiment of the present application, specifically:

the electronic device may include components such as a processor 701 of one or more processing cores, memory 702 of one or more computer-readable storage media, a power supply 703, and an input unit 704. Those skilled in the art will appreciate that the electronic device configuration shown in fig. 8 does not constitute a limitation of the electronic device and may include more or fewer components than those shown, or some components may be combined, or a different arrangement of components. Wherein:

the processor 701 is a control center of the electronic device, connects various parts of the whole electronic device by using various interfaces and lines, and performs various functions of the electronic device and processes data by operating or executing software programs and/or modules stored in the memory 702 and calling data stored in the memory 702, thereby performing overall monitoring of the electronic device. Optionally, processor 701 may include one or more processing cores; preferably, the processor 701 may integrate an application processor and a modem processor, wherein the application processor mainly handles operating system, user pages, application programs, and the like, and the modem processor mainly handles wireless communication. It will be appreciated that the modem processor described above may not be integrated into the processor 701.

The memory 702 may be used to store software programs and modules, and the processor 701 executes various functional applications and data processing by operating the software programs and modules stored in the memory 702. The memory 702 may mainly include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application program required by at least one function (such as a sound playing function, an image playing function, etc.), and the like; the storage data area may store data created according to use of the computer device, and the like. Further, the memory 702 may include high speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other volatile solid state storage device. Accordingly, the memory 702 may also include a memory controller to provide the processor 701 with access to the memory 702.

The electronic device further includes a power source 703 for supplying power to each component, and preferably, the power source 703 may be logically connected to the processor 701 through a power management system, so as to implement functions of managing charging, discharging, and power consumption through the power management system. The power supply 703 may also include any component including one or more of a dc or ac power source, a recharging system, a power failure detection circuit, a power converter or inverter, a power status indicator, and the like.

The electronic device may also include an input unit 704, and the input unit 704 may be used to receive input numeric or character information and generate keyboard, mouse, joystick, optical or trackball signal inputs related to user settings and function control.

Although not shown, the electronic device may further include a display unit and the like, which are not described in detail herein. Specifically, in this embodiment, the processor 701 in the electronic device loads the executable file corresponding to the process of one or more application programs into the memory 702 according to the following instructions, and the processor 701 runs the application program stored in the memory 702, so as to implement various functions as follows:

and sending the test operation instruction to the plurality of slave control terminals, so that the plurality of slave control terminals perform test operation on a plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal.

Or to implement the following functions:

analyzing the test operation instruction to obtain test operation information;

The above operations can be implemented in the foregoing embodiments, and are not described in detail herein.

According to an aspect of the application, a computer program product or computer program is provided, comprising computer instructions, the computer instructions being stored in a computer readable storage medium. The processor of the computer device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions to cause the computer device to perform the method provided in the various alternative implementations of the above embodiments.

It will be understood by those skilled in the art that all or part of the steps of the methods of the above embodiments may be performed by a computer program, which may be stored in a computer-readable storage medium and loaded and executed by a processor, or by related hardware controlled by the computer program.

To this end, embodiments of the present application further provide a storage medium, where a computer program is stored, where the computer program can be loaded by a processor to execute the steps in any one of the intelligent device testing methods provided in the embodiments of the present application. For example, the computer program may perform the steps of:

Or to implement the following functions:

analyzing the test operation instruction to obtain test operation information;

Since the computer program stored in the storage medium can execute the steps in any of the intelligent device testing methods provided in the embodiments of the present application, the beneficial effects that can be achieved by any of the intelligent device testing methods provided in the embodiments of the present application can be achieved, which are detailed in the foregoing embodiments and will not be described again here.

The intelligent device testing method, the intelligent device testing device, the electronic device and the storage medium provided by the embodiment of the application are introduced in detail, a specific example is applied in the description to explain the principle and the implementation of the application, and the description of the embodiment is only used for helping to understand the method and the core idea of the application; meanwhile, for those skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application.

Claims

1. An intelligent device testing method is characterized by comprising the following steps:

2. The intelligent device testing method of claim 1, wherein the packaging the at least one piece of test operation information to obtain a test operation instruction comprises:

performing information identification on the at least one piece of test operation information to obtain a test operation type and a test operation parameter of each piece of test operation information;

and packaging the information of the test operation type and the test operation parameters according to the execution sequence to obtain a test operation instruction.

3. The smart device testing method of claim 2, wherein the test operating parameters include a test trigger time and a test operating frequency;

generating an execution sequence of each test operation type according to the test operation parameters, wherein the execution sequence comprises:

4. The intelligent device testing method of claim 1, wherein the sending the test operation instructions to the plurality of slave terminals comprises:

acquiring identification information of each slave control terminal;

respectively determining the information transmission path of each slave control terminal according to the identification information;

and sending the test operation instruction to the slave control terminal through the information transmission path.

5. The intelligent device testing method of claim 4, wherein the sending the test operation instruction to the slave control terminal through the information transmission path comprises:

acquiring identification information of a test operation program, wherein the test operation program is an application program in the slave control terminal;

and sending the test operation instruction to the test operation program of the slave control terminal through the information transmission path according to the identification information of the test operation program.

6. The intelligent device testing method according to claim 1, wherein before receiving the test start instruction for the master control terminal and the plurality of slave control terminals, the method further comprises:

and determining a test operation program in the application programs in the slave control terminal according to the test operation program configuration information.

7. The intelligent device testing method according to claim 6, wherein the determining the slave control terminal corresponding to each intelligent device according to the slave control terminal configuration information comprises:

8. The intelligent device testing method according to claim 6, wherein after determining the slave control terminal corresponding to each intelligent device according to the slave control terminal configuration information, the method further comprises:

and establishing an information transmission path between the slave control terminal and the slave control terminal according to the feedback time.

9. An intelligent device testing method is characterized by comprising the following steps:

analyzing the test operation instruction to obtain test operation information;

10. The intelligent device testing method of claim 9, wherein the triggering the intelligent device to execute the corresponding test operation through the test operation execution interface according to the test operation information comprises:

determining a target operation control corresponding to the test operation type in the test operation execution interface according to the test operation type;

11. The smart device testing method of claim 9, wherein said triggering the target operational control according to the execution order comprises:

according to the execution sequence, identifying the position information of the target operation control on the test operation execution interface;

12. An intelligent device testing apparatus, comprising:

13. An intelligent device testing apparatus, comprising:

14. An electronic device comprising a memory and a processor; the memory stores a computer program, and the processor is configured to execute the computer program in the memory to perform the smart device testing method of any one of claims 1 to 8, or to perform the smart device testing method of claims 9-11.

15. A storage medium storing a plurality of computer programs adapted to be loaded by a processor to perform the smart device testing method of any one of claims 1 to 8 or the smart device testing method of claims 9-11.