CN113760750B

CN113760750B - Intelligent device testing method and device, electronic device and storage medium

Info

Publication number: CN113760750B
Application number: CN202110932945.7A
Authority: CN
Inventors: 林丰
Original assignee: Shenzhen TCL New Technology Co Ltd
Current assignee: Shenzhen TCL New Technology Co Ltd
Priority date: 2021-08-13
Filing date: 2021-08-13
Publication date: 2024-04-02
Anticipated expiration: 2041-08-13
Also published as: CN113760750A

Abstract

The embodiment of the application discloses an intelligent device testing method, an intelligent device testing device, electronic equipment and a storage medium; the embodiment of the application can receive test starting instructions aiming at the master control terminal and the plurality of slave control terminals; displaying a test operation interface according to the test starting instruction; acquiring at least one piece of test operation information through a test operation interface; at least one piece of test operation information is subjected to information packaging processing to obtain a test operation instruction; and sending the test operation instruction to the plurality of slave control terminals, so that the plurality of slave control terminals perform test operation on the plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal, the workload of performing automatic test on the intelligent device can be reduced, and the efficiency of automatic test is improved.

Description

Intelligent device testing method and device, electronic device and storage medium

Technical Field

The application relates to the technical field of communication, in particular to an intelligent device testing method, an intelligent device testing device, electronic equipment and a storage medium.

Background

After one intelligent device is developed, the developed intelligent device can be put into production and used after the intelligent device is often required to be subjected to complete machine test. When an automated test is performed on a smart device, due to the specificity of the smart device (for example, the same type of device may have multiple models), an automated test script may need to be customized for each model of smart device. When the requirements of the intelligent devices are changed, the automatic test scripts of the intelligent devices with different types under the same type can be required to be developed again, and the efficiency of automatic testing of the intelligent devices can be reduced.

Disclosure of Invention

The embodiment of the application provides an intelligent device testing method, an intelligent device testing device, electronic equipment and a storage medium, which can reduce the workload of automatic testing on intelligent devices, thereby improving the efficiency of automatic testing.

The embodiment of the application provides an intelligent device testing method, which comprises the following steps:

receiving test starting instructions aiming at a main control terminal and a plurality of slave control terminals;

displaying a test operation interface according to the test starting instruction;

acquiring at least one piece of test operation information through the test operation interface;

performing information packaging processing on the at least one piece of test operation information to obtain a test operation instruction;

and sending the test operation instruction to the plurality of slave control terminals, and performing test operation on the plurality of intelligent devices by the plurality of slave control terminals according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal.

Correspondingly, the embodiment of the application also provides an intelligent equipment testing device, which comprises:

the test starting instruction receiving unit is used for receiving test starting instructions aiming at the master control terminal and the plurality of slave control terminals;

the test operation interface display unit is used for displaying a test operation interface according to the test starting instruction;

The information acquisition unit is used for acquiring at least one piece of test operation information through the test operation interface;

the information packaging unit is used for carrying out information packaging processing on the at least one test operation information to obtain a test operation instruction;

and the instruction sending unit is used for sending the test operation instruction to the plurality of slave control terminals, and the plurality of slave control terminals perform test operation on the plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal.

In one embodiment, the information packaging unit includes:

the information identification subunit is used for carrying out information identification on the at least one piece of test operation information to obtain the test operation type and the test operation parameter of each piece of test operation information;

a generating subunit, configured to generate an execution sequence of each test operation type according to the test operation parameter;

and the information packaging subunit is used for carrying out information packaging processing on the test operation type and the test operation parameters according to the execution sequence to obtain a test operation instruction.

In an embodiment, the generating subunit includes:

the comparison module is used for comparing the test trigger time of each test operation type to obtain an initial execution sequence of each test operation type;

And the updating module is used for updating the initial execution sequence of each test operation type according to the test operation frequency to obtain the execution sequence of each operation type.

In one embodiment, the instruction sending unit includes:

the acquisition subunit is used for acquiring the identification information of each slave control terminal;

a determining subunit, configured to determine, according to the identification information, an information transmission path of each slave terminal;

and the transmitting subunit is used for transmitting the test operation instruction to the slave control terminal through the information transmission path.

In an embodiment, the transmitting subunit includes:

the acquisition module is used for acquiring identification information of a test operation program, wherein the test operation program is an application program in the slave control terminal;

and the sending module is used for sending the test operation instruction to the test operation program of the slave control terminal through the information transmission path according to the identification information of the test operation program.

The embodiment of the application also provides an intelligent device testing method, which comprises the following steps:

receiving a test operation instruction sent by a main control terminal, wherein the test operation instruction is generated based on test operation information, and the test operation information is obtained through a test operation interface;

Displaying a test operation execution interface according to the test operation instruction;

analyzing the test operation instruction to obtain test operation information;

and triggering the intelligent equipment to execute corresponding test operation through the test operation execution interface according to the test operation information.

the test operation instruction receiving unit is used for receiving a test operation instruction sent by the main control terminal, the test operation instruction is generated based on test operation information, and the test operation information is obtained through a test operation interface;

the test operation execution interface display unit is used for displaying a test operation execution interface according to the test operation instruction;

the analysis unit is used for analyzing the test operation instruction to obtain test operation information;

and the triggering unit is used for triggering the intelligent equipment to execute corresponding test operation through the test operation execution interface according to the test operation information.

In one embodiment, the trigger unit comprises

The analysis subunit is used for analyzing the test operation information to obtain at least one test operation type and test operation parameters corresponding to the test operation type;

The determining subunit is used for determining a corresponding operation control in the test operation execution interface according to the test operation type;

and the triggering subunit is used for triggering the target operation control according to the execution sequence so as to enable the intelligent equipment to execute corresponding test operation.

In an embodiment, the trigger subunit comprises:

the identification module is used for identifying the position information of the target operation control on the test operation execution interface according to the execution sequence;

and the adding module is used for adding acting force information on the position so as to trigger the target operation control.

Correspondingly, the embodiment of the application also provides electronic equipment, which comprises a memory and a processor; the memory stores a computer program, and the processor is configured to run the computer program in the memory, so as to execute any one of the intelligent device testing methods provided in the embodiments of the present application.

Correspondingly, the embodiment of the application also provides a storage medium, wherein the storage medium stores a computer program, and the computer program realizes the intelligent device testing method provided by any one of the embodiments of the application when being executed by a processor.

The embodiment of the application can receive test starting instructions aiming at the master control terminal and the plurality of slave control terminals; displaying a test operation interface according to the test starting instruction; acquiring at least one piece of test operation information through a test operation interface; at least one piece of test operation information is subjected to information packaging processing to obtain a test operation instruction; and sending the test operation instruction to the plurality of slave control terminals, so that the plurality of slave control terminals perform test operation on the plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal, the workload of performing automatic test on the intelligent device can be reduced, and the efficiency of automatic test is improved.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the description of the embodiments will be briefly introduced below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

Fig. 1 is a schematic view of a scenario of an intelligent device testing method provided in an embodiment of the present application;

Fig. 2 is a schematic flow chart of a testing method of an intelligent device according to an embodiment of the present application;

fig. 3 is a schematic diagram of another scenario of the smart device testing method provided in the embodiment of the present application;

FIG. 4 is a schematic flow chart of a smart device testing method according to an embodiment of the present disclosure;

FIG. 5 is a schematic flow chart of a smart device testing method according to an embodiment of the present disclosure;

fig. 6 is a schematic structural diagram of an intelligent device testing apparatus provided in an embodiment of the present application;

fig. 7 is a schematic structural diagram of an intelligent device testing apparatus provided in an embodiment of the present application;

fig. 8 is a schematic structural diagram of an electronic device according to an embodiment of the present application.

Detailed Description

The following description of the embodiments of the present application will be made clearly and fully with reference to the accompanying drawings, in which embodiments of the present application are shown, however, in which embodiments are shown, by way of illustration, only, and not in any way all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments herein without making any inventive effort, are intended to be within the scope of the present application.

The embodiment of the application provides a smart device testing method, which can be executed by a first smart device testing apparatus, and the first smart device testing apparatus can be integrated in a first electronic device with at least one device testing hardware. The first electronic device may be a terminal or the like.

The terminal may include a device for inputting a program and data to a computer or receiving a result of processing output from the computer via a communication facility, and for interacting with a user.

For example, the terminals may include smartphones, smartpads, and personal computers, among others.

The embodiment of the application also provides another intelligent device testing method, which can be executed by a second intelligent device testing apparatus, and the second intelligent device testing apparatus can be integrated in a second electronic device with at least one device testing hardware. The second electronic device may be a terminal or the like.

In an embodiment, the first electronic device may be a master terminal and the second electronic device may be a slave terminal.

The master control terminal comprises a terminal capable of controlling the slave control terminal. The slave terminal comprises a terminal which can execute corresponding operation according to the instruction of the master terminal. For example, the master terminal may control the slave terminal to perform a corresponding operation. For example, the master terminal may control the slave terminal and the master terminal to perform the same operation. For example, when a tester triggers a test initiation control on the master terminal, the test initiation control on the slave terminal may also be initiated.

In an embodiment, as shown in fig. 1, an application scenario schematic diagram of an intelligent device testing method provided in the embodiment of the present application is provided, where the application scenario may include a master control terminal, a slave control terminal, a cloud server, and the like.

The cloud server (Elastic Compute Service, ECS) is a simple, efficient, safe and reliable computing service with elastically scalable processing capacity. The management mode is simpler and more efficient than that of a physical server. A user can quickly create or release any plurality of cloud servers without purchasing hardware in advance.

In the embodiment of the application, the cloud server can communicate with a plurality of different types of intelligent devices and terminal devices, and a server for managing and controlling the plurality of different types of intelligent devices and terminal devices.

The main control terminal can receive test starting instructions aiming at the main control terminal and the plurality of slave control terminals; displaying a test operation interface according to the test starting instruction; acquiring at least one piece of test operation information through a test operation interface; at least one piece of test operation information is subjected to information packaging processing to obtain a test operation instruction; and sending the test operation instruction to the plurality of slave control terminals so that the plurality of slave control terminals perform test operation on the plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal.

The controlled terminal can receive a test operation instruction sent by the main control terminal, the test operation instruction is generated based on test operation information, and the test operation information is obtained through a test operation interface; displaying a test operation execution interface according to the test operation instruction; analyzing the test operation instruction to obtain test operation information; and triggering the intelligent equipment to execute corresponding test operation through a test operation execution interface according to the test operation information.

The cloud server can acquire test data of the slave control terminal of at least one slave control terminal; acquiring equipment test data of at least one intelligent equipment; carrying out association processing on the slave control terminal test data and the equipment test data to obtain an association relation between the terminal test data and the equipment test data; and generating a test report of the intelligent equipment according to the association relation.

For example, the method provided in the embodiment of the present application may copy the operation on the master control terminal to a plurality of slave control terminals, so that the slave control terminals may simulate the operation of the master control terminal. For example, the method provided in the embodiment of the present application may copy the test operation of the master control terminal on the intelligent device to the plurality of slave control terminals, so that the plurality of slave control terminals may model the master control terminal to perform the test operation on the intelligent device controlled by the slave control terminal. Then, in the testing process, the cloud server can acquire the test data of the slave terminal and the test data of the intelligent device, and generate a test report according to the test data of the slave terminal and the test data of the intelligent device.

The following detailed description is given, respectively, of the embodiments, and the description sequence of the following embodiments is not to be taken as a limitation of the preferred sequence of the embodiments.

The embodiment of the application will be described from the perspective of a first smart device testing apparatus, which may be integrated in a first electronic device, which may be a master terminal.

As shown in fig. 2, an intelligent device testing method is provided, and the intelligent device testing method can be executed by a main control terminal, and the specific flow includes:

101. and receiving test starting instructions aiming at the master control terminal and the plurality of slave control terminals.

The test starting instruction comprises an instruction capable of starting the main control terminal and the plurality of slave control terminals to perform test operation.

In an embodiment, the method for testing an intelligent device provided in the embodiment of the present application may include a master control terminal and a plurality of controlled terminals. The master control terminal can be connected with at least one intelligent device, the slave control terminal can also be connected with at least one intelligent device, and the master control terminal can control a plurality of slave control terminals.

The main control terminal can be a smart phone, a smart tablet, a personal computer and the like. The controlled terminal can also be a smart phone, a smart tablet, a personal computer and the like.

The smart devices may include various smart home devices. For example, the smart device may include a smart air conditioner, a smart washing machine, a smart television, a smart microwave oven, and the like.

For example, as shown in fig. 3, the method for testing an intelligent device according to the embodiment of the present application may include 1 master control terminal and 3 slave terminals. The master control terminal and the controlled terminal are smart phones respectively. The master control terminal can be connected with 1 intelligent device, and each controlled terminal can also be connected with 1 intelligent device. For example, the master terminal may be connected to 1 intelligent air conditioner, and each controlled terminal may also be connected to 1 intelligent air conditioner. The intelligent air conditioners can be of different types and have different functional bright spots.

In an embodiment, the master terminal may control the connected smart device. For example, the master terminal may control the on or off operation of the connected smart device.

In an embodiment, the slave terminal may also control the connected smart device. For example, the slave terminal may control the on or off operation of the connected smart device.

In one embodiment, the connection between the master terminal and the smart device may be made in a variety of ways. For example, the connection between the master terminal and the smart device may be through bluetooth. For another example, the master terminal and the smart device may be connected through WiFi (Wireless Fidelity), and so on.

The slave terminal and the intelligent device can be connected in various modes. For example, the slave terminal and the intelligent device may be connected by bluetooth. For another example, the slave terminal and the smart device may be connected through WiFi, and so on.

In one embodiment, the test procedure may be configured before the master terminal formally initiates the test operation. For example, the master terminal and the controlled terminals may be configured such that the master terminal knows which terminals are controlled terminals. For another example, a secure and stable information transmission path between the master terminal and the controlled terminal may be established, so that the test process may be smoothly performed, and so on.

In an embodiment, before the step of receiving the test initiation instruction for the master terminal and the plurality of slave terminals, the method may include:

acquiring test configuration information for a plurality of intelligent devices;

analyzing the test configuration information to obtain configuration information of the slave control terminal and configuration information of the test operation program;

determining a slave control terminal corresponding to each intelligent device according to the slave control terminal configuration information;

and determining the test operation program in the application program of the slave terminal according to the test operation program configuration information.

The test configuration information comprises information configured on the electronic equipment before a tester tests the intelligent equipment through the electronic equipment. According to the test configuration information, the electronic device can know what flow steps are followed to test the intelligent device.

For example, the test configuration information may configure which are slave terminals, which test operations, and so on.

In an embodiment, the smart device testing method proposed in the embodiment of the present application may be executed by a test operation program installed on a terminal.

The test operation program comprises an application program which can respond to the test starting instruction and control the intelligent equipment to perform test operation according to the test starting instruction.

For example, the test handler may control the smart device to turn on, turn off, or perform certain functional modes of operation, and so on.

For another example, when the smart terminal is a smart home, the test operating program may be a smart home APP, or the like.

Wherein the application comprises a computer program that performs one or more specific functions and that operates in an interactive mode to interact with a user using the application with a visual display interface.

For example, the application program may include application software on various terminals. For example, the Application programs may include various mobile phone software (Application), tablet computer Application software, application software on a notebook computer, application software on a personal computer (PC, personal Computer), and so on.

For another example, the application may also include an applet. Among them, the applet (Mini Program) is an application Program that can be used by S without downloading and installing. In order to provide more diversified business services to users, developers can develop corresponding applets for applications of the terminal (e.g., instant messaging applications, shopping applications, mail applications, etc.), which can be embedded as sub-applications into the applications of the terminal, and can provide corresponding business services to users by running the sub-applications (i.e., corresponding applets) within the applications.

In an embodiment, the test configuration information may include slave terminal configuration information and test operation program configuration information. Therefore, after the master control terminal obtains the test configuration information, the master control terminal can analyze the test configuration information so as to obtain the configuration information of the slave control terminal and the configuration information of the test operation program.

The configuration information of the slave terminal comprises configuration information related to the slave terminal. For example, the slave terminal configuration information may include identification information of the slave terminal, a server to which the slave terminal is connected, and the like.

The test operation program configuration information comprises configuration information related to the test operation program. For example, the test handler configuration information may include identification information of the test handler, a transmission path, and the like.

In an embodiment, the test configuration information may be configured by a tester and stored in the master control terminal, and the test master control terminal may obtain the test configuration information.

In an embodiment, the main control terminal may include a test configuration interface, and when a tester inputs test configuration information through the test configuration interface, the main control terminal may obtain the test configuration information.

In an embodiment, after obtaining the configuration information of the slave control terminal, the master control terminal may determine, according to the configuration information of the slave control terminal, a slave control terminal corresponding to each intelligent device. Specifically, the step of determining, according to the slave terminal configuration information, a slave terminal corresponding to each intelligent device may include:

analyzing the configuration information of the slave control terminal to obtain the identification information of the slave control terminal;

matching the identification information of the slave control terminal with a preset identification matching table to obtain a matching result;

and determining a slave control terminal of the intelligent equipment according to the matching result.

In an embodiment, the configuration information of the slave terminal may include identification information of the slave terminal, so that the master terminal may parse the configuration information of the slave terminal to obtain the identification information of the slave terminal.

Wherein the identification information of the slave terminal includes information that can represent the identity of the slave terminal. The slave terminal and other slave terminals can be distinguished through the identification information. For example, the identification information of the slave terminal may be a unique identifier of the device. For example, the identification information may be an international mobile equipment identity (International Mobile Equipment Identity, IMEI), etc.

In an embodiment, after the master terminal obtains the identification information of the slave terminals, the master terminal can determine which terminals are slave terminals.

For example, if the identification information of the slave terminal is abcd789dfg, the master terminal may determine the slave terminal according to the identification information.

Then, the main control terminal can match the identification information of the slave control terminal with a preset identification matching table to obtain a matching result. And then, the master control terminal can determine the connection relation between the slave control terminal and the intelligent terminal according to the matching result.

The preset identification matching table comprises a connection relation between the slave control terminal and the intelligent terminal. Therefore, the master control terminal can match the identification information of the slave control terminal with the preset identification matching identification, so that the connection relationship between the slave control terminal and the intelligent terminal is determined.

In an embodiment, after determining the slave terminal corresponding to each intelligent device, the master terminal may further determine the test operation program from the application programs of the slave terminals according to the test operation program configuration information.

For example, the test handler may include identification information for the test handler. Then, the master control terminal can detect the identification information of all the application programs in the slave control terminal, so as to judge whether the slave control terminal has a test operation program.

The identification information of the application program may include a Package Name (Package Name) of the application program, and the like. Wherein the package name may be a unique identification of the application program, one package name representing one application.

In an embodiment, after determining the slave terminal corresponding to each intelligent terminal, in order to enable the slave terminal to copy the operation of the tester on the master terminal, it is further required to ensure that information can be stably transmitted between the master terminal and the slave terminal. Therefore, after determining the slave terminal corresponding to each intelligent device, the master terminal can also determine whether information can be stably transmitted between the master terminal and the slave terminal. Specifically, after determining, according to the slave terminal configuration information, the slave terminal corresponding to each intelligent device, the step may include:

respectively sending a communication test instruction to each slave terminal;

receiving a communication test feedback instruction returned by the slave control terminal;

identifying the communication test feedback instruction to obtain the feedback time of the communication test feedback instruction;

and establishing an information transmission path between the slave terminals according to the feedback time.

The communication test instruction comprises an instruction capable of testing communication conditions. The communication test feedback instruction comprises an instruction returned to the main control terminal from the control terminal. This may only be an instruction to acknowledge a communication test instruction.

For example, the communication test instructions may include instructions with a communication test question, and then the communication test feedback instructions may include replies to the communication test question.

In an embodiment, after the slave terminal transmits the communication test instruction, the slave terminal may record the time of transmitting the instruction. Then, the master control terminal can calculate the feedback time and the instruction sending time of the test feedback instruction, so as to obtain the instruction feedback duration of the slave control terminal.

For example, the communication test instruction is sent at a time of 11:30, the feedback time of the test feedback instruction is 11:35. and the master control terminal obtains the instruction feedback time of the slave control terminal to be 5 minutes through calculation. Because the time of 5 minutes is longer, the current information transmission paths of the master control terminal and the slave control terminal can be slower in transmission rate. At this time, the master control terminal may notify the tester of the instruction feedback duration of the slave control terminal, so that the tester may adjust the information transmission path between the master control terminal and the slave control terminal.

For another example, when the instruction feedback duration of the slave terminal is 2 seconds, this indicates that the current information transmission paths of the master terminal and the slave terminal are relatively stable and efficient, and at this time, the current information transmission paths of the master terminal and the slave terminal can be determined as the information transmission paths.

In an embodiment, when the master control terminal has not received the communication test feedback instruction of the slave control terminal within a certain time threshold, the master control terminal may notify the tester, so that the tester may adjust the information transmission path between the master control terminal and the slave control terminal.

For example, when the master terminal still receives the communication test feedback instruction of the slave terminal for more than 10 minutes, the master terminal informs the tester so that the tester can adjust the information transmission path between the master terminal and the slave terminal.

In an embodiment, in order to more conveniently execute the smart device testing method provided in the embodiment of the present application, the applicant of the present application develops a smart device testing program (also referred to as agent).

In an embodiment, the agent may be installed on the master terminal and the controlled terminal. Then, the master control terminal can determine the slave control terminal according to the agent. In addition, the main control terminal can also determine a test operation program through the agent, so that the operation of a tester on the main control terminal can be synchronized on the controlled terminal. Moreover, the agent can also perform communication test between the master control terminal and the controlled terminal, so that the communication between the master control terminal and the controlled terminal can be ensured to be normal.

In an embodiment, the agent may also collect performance of the master control terminal and the controlled terminal during the testing process. For example, the agent may collect performance data such as CPU, memory, and frame rate of the master terminal and the controlled terminal, and send the collected performance data to the cloud, so that the cloud may analyze the testing process according to the performance data.

102. And displaying a test operation interface according to the test starting instruction.

In an embodiment, after the main control terminal receives the test start instruction, the test operation interface may be displayed according to the test start instruction.

The test operation interface comprises an interface capable of triggering test operation on the intelligent equipment.

In one embodiment, the test operator interface may be an interface on a test operator program. For example, when the tester clicks the test start control on the test operation program on the main control terminal, the main control terminal receives the test start instruction. Then, the main control terminal can display a test operation interface according to the test starting instruction.

103. And acquiring at least one piece of test operation information through the test operation interface.

In an embodiment, a plurality of controls may be included on the test operation interface, where each control may correspond to a test operation on the smart device.

For example, when the smart device is a smart washing machine, the test operation interface may include an open control, a close control, a pause control, a wash control, a spin control, and the like.

Each control is provided with a parameter setting area, and through the parameter setting area, a tester can set the parameters of each control, so that the test operation of the intelligent device is realized.

For example, when a tester needs to test the on function, the off function, and the pause function of the intelligent washing machine, the tester can select the on control, the off control, and the pause control on the test operation interface. The tester may then set the parameters of the open control, close control, and pause control, respectively. For example, a tester may set a time for which the intelligent washing machine is turned on, a time for which the intelligent washing machine is turned off, a pause time and a frequency of pauses of the intelligent washing machine, and the like.

When a tester selects a control and sets parameters of the control through the test operation interface, the main control terminal can acquire at least one piece of test operation information.

The test operation information includes information that can specify what test operation is performed on the intelligent device and how the test operation is performed.

Wherein one test operation information may correspond to one test operation

For example, when the tester selects the open control and sets the corresponding parameters, a test operation message is generated. For another example, when the tester selects the wash control and sets the corresponding parameters, another test operation message is generated, and so on.

104. And packaging the at least one piece of test operation information to obtain a test operation instruction.

In an embodiment, after the main control terminal obtains at least one test operation information, the at least one test operation information may be subjected to information packaging processing, so as to obtain a test operation instruction. Specifically, the step of "performing information packaging processing on at least one test operation information to obtain a test operation instruction" may include:

information identification is carried out on at least one piece of test operation information, and the test operation type and the test operation parameter of each piece of test operation information are obtained;

generating an execution sequence of each test operation type according to the test operation parameters;

and according to the execution sequence, carrying out information packaging processing on the test operation type and the test operation parameters to obtain a test operation instruction.

The operation type may refer to what a test operation performed on the smart device is. For example, when the smart device is a smart washing machine, turning on the smart washing machine is one type of operation. Turning off the intelligent washing machine is also one type of operation. It is also an operation type to make the intelligent washing machine perform a dehydrating function.

The test operation parameter may refer to a rule to be obeyed when the intelligent device is subjected to test operation. For example, the test operating parameters may include test trigger time and test operating frequency, and so forth.

The test trigger time may refer to a time when the intelligent device starts to perform the test operation.

The test operation frequency may refer to the number of repetitions of the test operation performed by the smart device. For example, when the test operation frequency is 3, it is indicated that the smart device repeatedly performs the test operation 3 times during the test. For example, when the smart device is a washing machine, the washing machine may repeat the dehydration operation 3 times during the test when the frequency of the dehydration operation is 3.

In an embodiment, the test operation information may include a test operation type and a test operation parameter, so that the main control terminal may perform information identification on the test operation information, thereby obtaining the test operation type and the test operation parameter.

In an embodiment, the master terminal may generate the execution sequence of each test operation type according to the test operation parameters. The main control terminal can generate the execution sequence of each test operation type according to the test trigger time and the test operation frequency. Specifically, the step of generating an execution sequence of each test operation type according to the test operation parameters may include:

comparing the test trigger time of each test operation type to obtain an initial execution sequence of each test operation type;

and updating the initial execution sequence of each test operation type according to the test operation frequency to obtain the execution sequence of each test operation type.

In an embodiment, the master control terminal may compare the test trigger time of each test operation type, so as to obtain an initial execution sequence of each test operation type. For example, for a test operation type having a preceding test trigger time, the main control terminal may set an initial execution order of the test operation type to the front. And for the test operation type with the subsequent test trigger time, the main control terminal can set the initial execution sequence of the test operation type at the subsequent test trigger time.

For example, there are 4 operation types, namely test operation type 1, test operation type 2, test operation type 3, and test operation type 4. The test triggering time of the test operation type 1 is 11:30, the test trigger time of the test operation type 2 is 11:31, the test trigger time of the test operation type 3 is 11:32, test operation type 4 test trigger time is 11:33. then, according to the test trigger time of the test operation type, the initial execution sequence may be set to execute the test operation type 1 first, then execute the test operation type 2, then execute the test operation type 3, and finally execute the test operation type 4.

In an embodiment, after the master control terminal obtains the initial execution sequence of each test operation type, the initial execution sequence of each test operation type may be updated according to the test operation frequency, so as to obtain the execution sequence of each test operation type.

For example, the test operation frequency of the test operation type 1 and the test operation type 3 is 1, and the test operation frequency of the test operation type 2 and the test operation type 4 is 2. The execution sequence obtained after updating the initial execution sequence of each test operation type is: test operation type 1, test operation type 2, test operation type 3, test operation type 4, and test operation type 4.

In an embodiment, after generating the execution sequence of each test operation type, the master control terminal may perform information packaging processing on the test operation type and the test operation parameter according to the execution sequence, so as to obtain the test operation instruction.

For example, according to the execution sequence, the information of the test operation type and the test operation parameter may be spliced, and the communication address of the slave terminal and the communication address of the test operation program are added, so as to obtain the test operation instruction.

Wherein the communication address of the test handler may be an xpath path, etc. Wherein the xpath path is a positioning strategy. The xpath path can be a direct path or an indirect path and can identify the location of an application in the terminal device.

In an embodiment, the agent end in the main control terminal may package the test operation information, so as to obtain the test operation instruction.

105. And sending the test operation instruction to the plurality of slave control terminals so that the plurality of slave control terminals perform test operation on the plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal.

In an embodiment, the master control terminal may send the test operation instruction to the plurality of slave control terminals, so that the plurality of slave control terminals perform test operation on the plurality of intelligent devices according to the test operation instruction.

The master control terminal can send the test operation instructions to the plurality of slave control terminals in parallel, so that the plurality of slave control terminals can perform test operation on the plurality of intelligent devices according to the test operation instructions.

For example, when the tester triggers the intelligent device to perform the opening operation in the master control terminal, the slave control terminal simulates the master control terminal and also performs the opening operation on the intelligent device.

For another example, after the tester triggers the intelligent device to perform the opening operation in the main control terminal, the tester performs the closing operation again. The slave terminal simulates the master terminal and performs the closing operation after the opening operation is performed on the intelligent device.

The embodiment of the application provides an intelligent device testing method, which can receive test starting instructions aiming at a main control terminal and a plurality of slave control terminals; displaying a test operation interface according to the test starting instruction; acquiring at least one piece of test operation information through a test operation interface; at least one piece of test operation information is subjected to information packaging processing to obtain a test operation instruction; and sending the test operation instruction to the plurality of slave control terminals so that the plurality of slave control terminals perform test operation on the plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal. According to the intelligent device testing method, the master control terminal can copy the operation of the tester on the master control terminal to the slave control terminal, so that the slave control terminal can test the intelligent devices connected with the slave control terminal according to the test operation instruction, and therefore the intelligent devices of different types can be tested on the premise that scripts are not repeatedly developed, the workload of the tester for automatically testing the intelligent devices is reduced, and the efficiency of automatic testing is improved.

In addition, in the embodiment of the application, the main control terminal can also carry out packaging processing with the test operation type and the test operation parameters according to the test operation information. By packing the test operation types and the test operation parameters, after the slave control terminal receives the test operation instruction, the intelligent equipment can be rapidly tested according to the execution sequence according to the test operation instruction, and the automatic test efficiency is further improved.

In addition, in the embodiment of the application, the master control terminal may also send a communication test instruction to each slave control terminal respectively; receiving a communication test feedback instruction returned by the slave control terminal; identifying the communication test feedback instruction to obtain the feedback time of the communication test feedback instruction; and establishing an information transmission path between the slave terminals according to the feedback time, so that the safety and reliability of the intelligent equipment testing method provided by the embodiment of the application are improved.

The intelligent device testing method provided by the embodiment of the application is introduced from the perspective of the first intelligent device testing device, wherein the first intelligent device testing device can be integrated in a first electronic device, and the first electronic device can be a master control terminal.

The intelligent device testing method provided by the embodiment of the application will be described from the perspective of the second intelligent device testing apparatus. The second intelligent device testing apparatus may be integrated in a second electronic device, which may be a controlled terminal.

As shown in fig. 4, there is provided a smart device testing method, which may be executed by a slave terminal, and the specific flow includes:

201. and receiving a test operation instruction sent by the main control terminal, wherein the test operation instruction is generated based on test operation information, and the test operation information is obtained through a test operation interface.

In an embodiment, after the master control terminal transmits the test operation instruction to the plurality of slave control terminals, the slave control terminals may receive the test operation instruction transmitted by the master control terminal.

202. And displaying a test operation execution interface according to the test operation instruction.

In an embodiment, after receiving the test operation instruction from the slave terminal, the slave terminal may display a test operation execution interface according to the test operation instruction.

The test operation execution interface comprises a test operation interface which comprises an interface capable of triggering test operation on the intelligent equipment according to the test operation instruction.

In an embodiment, the test operation execution interface may be an interface in a test operation program on the controlled terminal. For example, after receiving the test operation instruction from the slave terminal, the slave terminal may display the test operation execution interface in the test operation program.

203. Analyzing the test operation instruction to obtain test operation information.

In an embodiment, the slave terminal may further parse the test operation instruction to obtain test operation information, so that the slave terminal may trigger the intelligent device to execute a corresponding test operation through the test operation execution interface according to the test operation information.

For example, the slave terminal may traverse the test operation instruction, thereby obtaining test operation information. For another example, the slave terminal may obtain the test operation information by reading information in the test operation instruction.

204. And triggering the intelligent equipment to execute corresponding test operation through the test operation execution interface according to the test operation information.

In an embodiment, after obtaining the test operation information, the slave control terminal may trigger the intelligent device to execute the corresponding test operation through the test operation execution interface according to the test operation information. Specifically, the step of triggering the intelligent device to execute the corresponding test operation through the test operation execution interface according to the test operation information may include:

Analyzing the test operation information to obtain at least one test operation type and an execution sequence corresponding to the test operation type;

according to the test operation type, determining a target operation control corresponding to the test operation type in a test operation execution interface;

and triggering the target operation control according to the execution sequence so as to enable the intelligent equipment to execute corresponding test operation.

In an embodiment, since the test operation information may include the test operation type and the test parameter corresponding to the test operation type, the slave terminal may parse the test operation information, thereby obtaining at least one test operation type and the test operation parameter corresponding to the test operation type.

In one embodiment, a plurality of test operation controls may be included on the test operation execution interface. For example, when the smart device is a smart washing machine, the test operation execution interface may include an open control, a close control, a pause control, a wash control, a spin control, and the like.

Therefore, the slave control terminal can determine the corresponding target operation control in the test operation execution interface according to the test operation type. For example, when the test operation type is an operation of turning on the smart device, the slave terminal may determine the turning-on control as the target operation control. For another example, when the test operation type is an operation to turn off the smart device, the slave terminal may determine the pause control as a target operation control, and so on.

When the target operation control is determined on the test operation execution interface, the test operation type and the operation control on the test operation interface can be matched, so that the target operation control is determined.

After the target operation control is determined, the slave control terminal can trigger the target operation control according to the execution sequence, so that the intelligent device executes corresponding test operation. Specifically, the step of triggering the target operation control according to the execution sequence may include:

identifying the position information of the target operation control on the test operation execution interface according to the execution sequence;

force information is added to the location to trigger the target operational control.

In an embodiment, each target operation control has a corresponding execution sequence, so that the position information of the target operation control on the test operation interface can be identified according to the execution sequence, and acting force information is added at the position to trigger the target operation control.

The location information may include a location of the target operation control on the test operation execution interface.

For example, a rectangular coordinate system may be set on the test operation execution interface. For example, the lower left corner of the test operation execution interface may be the origin of coordinates, and the position information of the target operation control may be identified with the position information on the coordinate axis.

For example, the location information of the target operation control in the test operation execution interface may be represented by a Rectangle (Rectangle) object. The Rect object corresponding to the target operation control may include four parameters, which are respectively (x, y, width, height). Wherein x can represent the abscissa of the upper left corner of the rectangle, namely the abscissa of the target operation control in the test operation execution interface; y may represent the ordinate of the upper left corner of the rectangle, i.e., the ordinate of the target operation control in the test operation execution interface; width may represent the width of a rectangle and height may represent the height of a rectangle.

In one embodiment, the target operational controls may be identified at the test operation execution interface in a variety of ways. For example, image recognition techniques may be utilized to perform target detection of target operational controls at a test operation execution interface, and so on.

In an embodiment, after the position information is identified, force information can be added to the target operation control according to the position information so as to trigger the target operation control.

The acting force information comprises information capable of triggering a target operation control. By means of the force information, the target operation control can be triggered.

In an embodiment, the embodiment of the application provides an intelligent device testing method, which can receive a testing operation instruction sent by a main control terminal, wherein the testing operation instruction is generated based on testing operation information, and the testing operation information is obtained through a testing operation interface; displaying a test operation execution interface according to the test operation instruction; analyzing the test operation instruction to obtain test operation information; and triggering the intelligent equipment to execute corresponding test operation through the test operation execution interface according to the test operation information. The intelligent equipment testing method provided by the embodiment of the application can reduce the workload of automatic testing on the intelligent equipment, thereby improving the efficiency of automatic testing.

For example, after the tester clicks the open control in the master control terminal, the open control in the slave control terminal is triggered. When the simulation is performed, the master control terminal and the slave control terminal are bound with different intelligent devices, namely the master control terminal A is bound with the intelligent device X, and the slave control terminal B is bound with the intelligent device Y. Each slave terminal can also bind different intelligent devices. For example, the slave terminal C is bound to the smart device Z. Therefore, the same operation of triggering the starting control is performed, the intelligent device X is started after the master control terminal A performs the operation, the intelligent device Y is started after the slave control terminal B performs the operation, and the intelligent device Z is started after the slave control terminal C performs the operation. In this way, a comparison test can be implemented, that is, a comparison of differences in performance of the smart devices X, Y and Z when the master terminal a, the slave terminal B, and the slave terminal C are operated in the same manner. For example, the difference in performance includes response time, whether the power-on is actually successful, default state of the intelligent device after the power-on is completed (for example, when the intelligent device is an intelligent air conditioner, the power-on default temperature of the intelligent air conditioner X is 26 °, the power-on default temperature of the intelligent air conditioner Y is 27 °, and the power-on default temperature of the air conditioner Z is 24 °), etc. By the mirror image imitating test mode, the workload of automatic test on the intelligent equipment can be reduced, and therefore the efficiency of automatic test is improved.

The intelligent device testing method provided by the embodiment of the application will be described from the perspective of the third intelligent device testing apparatus. The third smart device testing apparatus may be integrated in a third electronic device, and the second electronic device may be a cloud server.

As shown in fig. 5, a smart device testing method is provided, where the smart device testing method may be executed by a cloud server, and the specific flow includes:

301. and obtaining the test data of the slave control terminal of at least one slave control terminal.

The test data of the slave control terminal comprises various data which can represent the performance condition of the slave control terminal in the test process. For example, the slave terminal test data may include performance data such as CPU, memory, and frame rate of the slave terminal.

For example, in the testing process, the cloud server may continuously acquire slave terminal test data of at least one slave terminal.

302. Device test data of at least one intelligent device is obtained.

The device test data comprise test data generated by the intelligent device in the test process. For example, the device test data may include test states of the smart device, test parameters generated in the respective test states, and so on. For example, the device test data may include response time, power, etc. of the smart device.

In an embodiment, the intelligent device and the tester may be connected, and then the tester may collect device test data of the intelligent device during the test process, and send the device test data to the cloud server, so that the cloud server obtains the device test data of at least one intelligent device.

303. And carrying out association processing on the slave terminal test data and the equipment test data to obtain an association relation between the terminal test data and the equipment test data.

In an embodiment, after the cloud server obtains the slave terminal test data and the device test data, the slave terminal test data and the device test data may be subjected to association processing, so as to obtain an association relationship between the terminal test data and the device test data.

For example, the cloud server may correlate the slave terminal test data of the intelligent device under different test states with the test parameters generated under each test state, so as to obtain a correlation between the terminal test data and the device test data.

304. And generating a test report of the intelligent equipment according to the association relation.

In an embodiment, the cloud service may further generate a test report of the intelligent device according to the association relationship.

For example, the cloud server may generate at least one of a graph, a line graph, a histogram, a pie chart, and other statistical graphs according to the association relationship.

For example, the cloud service may generate at least one of statistical graphs such as a graph, a line graph, a histogram, and a pie chart according to the association relationship between the test data of the slave terminal in different test states and the test parameters generated in each test state.

For example, intelligent washing machine at 2021, 6, 20, 13:20-13: the test state during 40 is a washing state, wherein during washing the intelligent washing machine has a power of 1000 hz and a temperature of 40 degrees celsius. The cloud service may generate a bar graph of the intelligent washing machine according to the above data.

For another example, intelligent washing machine at 2021, 6, 20, 13:20-13: the test state during 40 is the wash state. Wherein, during washing, the power change of the intelligent washing machine is 800 Hz, 1000 Hz, 1150 Hz, 1300 Hz and 900 Hz respectively. The cloud service may generate a line graph of the intelligent washing machine according to the data.

The embodiment of the application provides an intelligent equipment testing method, which can acquire testing data of a slave control terminal of at least one slave control terminal; acquiring equipment test data of at least one intelligent equipment; carrying out association processing on the slave control terminal test data and the equipment test data to obtain an association relation between the terminal test data and the equipment test data; and generating a test report of the intelligent equipment according to the association relation. Through the test, a tester can perform comparison analysis to see whether the product has compatibility, user experience difference and other problems. In addition, the cloud server can automatically generate a test report, so that the workload of a tester for writing the report by himself can be reduced, and the efficiency of automatic test is improved.

In an embodiment, the embodiment of the application also provides an intelligent device testing system. The intelligent equipment testing system can comprise a main control terminal, a controlled terminal and a cloud server.

The main control terminal can receive test starting instructions aiming at the main control terminal and the plurality of slave control terminals; according to the test starting instruction, the main control terminal can display a test operation interface; the main control terminal can acquire at least one piece of test operation information through the test operation interface; the main control terminal packs the information of the at least one piece of test operation information to obtain a test operation instruction; and the main control terminal sends the test operation instruction to the plurality of slave control terminals so that the plurality of slave control terminals perform test operation on a plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal.

The controlled terminal can receive a test operation instruction sent by the main control terminal, the test operation instruction is generated based on test operation information, and the test operation information is obtained through a test operation interface; the controlled terminal displays a test operation execution interface according to the test operation instruction; the controlled terminal analyzes the test operation instruction to obtain test operation information; and the controlled terminal triggers the intelligent equipment to execute corresponding test operation through the test operation execution interface according to the test operation information.

The cloud server can acquire test data of the slave control terminal of at least one slave control terminal; the cloud server can acquire device test data of at least one intelligent device; the cloud server can correlate the terminal test data and the equipment test data to obtain the correlation between the terminal test data and the equipment test data; the cloud server can generate a test report of the intelligent device according to the association relation.

According to the intelligent equipment testing system provided by the embodiment of the application, the controlled terminal can copy the testing operation of the intelligent equipment by a tester on the main control terminal, so that the intelligent equipment with various different models can be tested on the premise of not modifying the testing script, and the testing efficiency is improved. In addition, the intelligent equipment testing system provided by the embodiment of the application can test a plurality of intelligent equipment simultaneously, so that the comparison test can be performed among a plurality of equipment, and the testing efficiency is improved. In addition, in the intelligent equipment testing system provided by the embodiment of the application, the cloud server can automatically generate the testing report, so that the workload of a tester for writing the report by himself can be reduced, and the efficiency of automatic testing is improved.

In order to better implement the smart device testing method provided by the embodiment of the application, in an embodiment, a first smart device testing apparatus, a second smart device testing apparatus, and a third smart device test are further provided, where the first smart device testing apparatus may be integrated in a first electronic device, and the first electronic device may be a device such as a terminal. The second smart device test may be integrated in a second electronic device, which may be a terminal or the like. The third smart device test may be integrated in a third electronic device, which may be a cloud server or the like. The meaning of the nouns is the same as that in the intelligent device testing method, and specific implementation details can be referred to the description in the method embodiment.

In an embodiment, a first smart device testing apparatus is provided, which may specifically be integrated in a first electronic device (e.g. a master terminal), as shown in fig. 6, where the first device network allocation apparatus includes: a test start instruction receiving unit 401, a test operation interface display unit 402, an information acquisition unit 403, an information packaging unit 404, and an instruction transmitting unit 405, concretely as follows:

A test initiation instruction receiving unit 401, configured to receive test initiation instructions for a master control terminal and a plurality of slave control terminals;

a test operation interface display unit 402, configured to display a test operation interface according to the test start instruction;

an information obtaining unit 403, configured to obtain at least one piece of test operation information through the test operation interface;

an information packaging unit 404, configured to perform information packaging processing on the at least one test operation information to obtain a test operation instruction;

and the instruction sending unit 405 is configured to send the test operation instruction to the plurality of slave control terminals, so that the plurality of slave control terminals perform a test operation on a plurality of intelligent devices according to the test operation instruction, where one intelligent device is controlled by one slave control terminal.

In one embodiment, the information packaging unit 404 includes:

In an embodiment, the generating subunit includes:

In an embodiment, the instruction sending unit 405 includes:

In an embodiment, the transmitting subunit includes:

In an embodiment, a second smart device testing apparatus is provided, which may be integrated in particular in a second electronic device (e.g. a slave terminal). As shown in fig. 7, the second smart device testing apparatus includes: the test operation instruction receiving unit 501, the test operation execution interface display unit 502, the analysis unit 503, and the trigger unit 504 are specifically as follows:

a test operation instruction receiving unit 501, configured to receive a test operation instruction sent by a main control terminal, where the test operation instruction is generated based on test operation information, and the test operation information is obtained through a test operation interface;

a test operation execution interface display unit 502, configured to display a test operation execution interface according to the test operation instruction;

the parsing unit 503 is configured to parse the test operation instruction to obtain test operation information;

and the triggering unit 504 is configured to trigger, according to the test operation information, the intelligent device to execute a corresponding test operation through the test operation execution interface.

In one embodiment, the triggering unit 504 includes

In an embodiment, the trigger subunit comprises:

In an embodiment, a third smart device testing apparatus is provided, which may be integrated in a third electronic device (e.g., a cloud server) in particular. Wherein, this third smart machine testing arrangement includes: the system comprises a first data acquisition unit, a second data acquisition unit, an association processing unit and a generation unit, and specifically comprises the following steps:

The first data acquisition unit is used for acquiring terminal test data of at least one slave terminal;

the second data acquisition unit is used for acquiring equipment test data of at least one intelligent equipment;

the association processing unit is used for carrying out association processing on the terminal test data and the equipment test data to obtain an association relation between the terminal test data and the equipment test data;

and the generating unit is used for generating a test report of the intelligent equipment according to the association relation.

In the implementation, each unit may be implemented as an independent entity, or may be implemented as the same entity or several entities in any combination, and the implementation of each unit may be referred to the foregoing method embodiment, which is not described herein again.

The test feedback data on microscopic granularity can be tested through the test testing device, and the reliability of the test feedback data in the product verification test is improved, so that the accuracy of the test result in the product verification test is improved.

The embodiment of the application also provides electronic equipment, which can comprise a terminal or a server, for example, the electronic equipment can be used as an intelligent equipment test terminal, and the intelligent equipment test terminal can be an intelligent television or the like; for another example, the computer device may be a server, such as a smart device test server, or the like. As shown in fig. 8, a schematic structural diagram of a terminal according to an embodiment of the present application is shown, specifically:

The electronic device may include one or more processing cores 'processors 701, one or more computer-readable storage media's memory 702, power supply 703, and input unit 704, among other components. It will be appreciated by those skilled in the art that the electronic device structure shown in fig. 8 is not limiting of the electronic device and may include more or fewer components than shown, or may combine certain components, or a different arrangement of components. Wherein:

the processor 701 is a control center of the electronic device, connects various parts of the entire electronic device using various interfaces and lines, and performs various functions of the electronic device and processes data by running or executing software programs and/or modules stored in the memory 702, and calling data stored in the memory 702, thereby performing overall monitoring of the electronic device. Optionally, processor 701 may include one or more processing cores; preferably, the processor 701 may integrate an application processor and a modem processor, wherein the application processor primarily handles operating systems, user pages, applications, etc., and the modem processor primarily handles wireless communications. It will be appreciated that the modem processor described above may not be integrated into the processor 701.

The memory 702 may be used to store software programs and modules, and the processor 701 executes various functional applications and data processing by executing the software programs and modules stored in the memory 702. The memory 702 may mainly include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program (such as a sound playing function, an image playing function, etc.) required for at least one function, and the like; the storage data area may store data created according to the use of the computer device, etc. In addition, the memory 702 may include high-speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other volatile solid-state storage device. Accordingly, the memory 702 may also include a memory controller to provide access to the memory 702 by the processor 701.

The electronic device further comprises a power supply 703 for powering the various components, preferably the power supply 703 is logically connected to the processor 701 by a power management system, whereby the functions of managing charging, discharging, and power consumption are performed by the power management system. The power supply 703 may also include one or more of any component, such as a direct current or alternating current power supply, a recharging system, a power failure detection circuit, a power converter or inverter, a power status indicator, etc.

The electronic device may further comprise an input unit 704, which input unit 704 may be used for receiving input digital or character information and generating keyboard, mouse, joystick, optical or trackball signal inputs in connection with user settings and function control.

Although not shown, the electronic device may further include a display unit or the like, which is not described herein. In particular, in this embodiment, the processor 701 in the electronic device loads executable files corresponding to the processes of one or more application programs into the memory 702 according to the following instructions, and the processor 701 executes the application programs stored in the memory 702, so as to implement various functions as follows:

and sending the test operation instruction to the plurality of slave control terminals so that the plurality of slave control terminals perform test operation on a plurality of intelligent devices according to the test operation instruction, wherein one intelligent device is controlled by one slave control terminal.

Or the following functions are realized:

analyzing the test operation instruction to obtain test operation information;

The specific implementation of each operation above may be referred to the previous embodiments, and will not be described herein.

According to one aspect of the present application, there is provided a computer program product or computer program comprising computer instructions stored in a computer readable storage medium. The processor of the computer device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions to cause the computer device to perform the methods provided in the various alternative implementations of the above embodiments.

It will be appreciated by those of ordinary skill in the art that all or part of the steps of the various methods of the above embodiments may be performed by a computer program, or by computer program control related hardware, which may be stored in a computer readable storage medium and loaded and executed by a processor.

To this end, the embodiments of the present application also provide a storage medium in which a computer program is stored, which is capable of being loaded by a processor to perform the steps of any of the smart device testing methods provided in the embodiments of the present application. For example, the computer program may perform the steps of:

Or the following functions are realized:

Analyzing the test operation instruction to obtain test operation information;

The steps in any of the intelligent device testing methods provided in the embodiments of the present application may be executed by the computer program stored in the storage medium, so that the beneficial effects that any of the intelligent device testing methods provided in the embodiments of the present application may be achieved, which are described in detail in the previous embodiments and are not repeated herein.

The foregoing describes in detail a method, an apparatus, an electronic device, and a storage medium for testing an intelligent device provided in the embodiments of the present application, where specific examples are applied to illustrate principles and implementations of the present application, and the descriptions of the foregoing embodiments are only used to help understand the method and core ideas of the present application; meanwhile, those skilled in the art will have variations in the specific embodiments and application scope in light of the ideas of the present application, and the present description should not be construed as limiting the present application in view of the above.

Claims

1. The intelligent equipment testing method is characterized by comprising the following steps of:

at least one piece of test operation information is obtained through the test operation interface in response to control operation of the main control intelligent equipment corresponding to the main control terminal, wherein the test operation information is information corresponding to control operation of the main control intelligent equipment through the main control terminal, and the control operation corresponds to one test operation;

2. The intelligent device testing method according to claim 1, wherein said performing information packaging processing on the at least one test operation information to obtain a test operation instruction includes:

carrying out information identification on the at least one piece of test operation information to obtain a test operation type and a test operation parameter of each piece of test operation information;

3. The smart device testing method of claim 2, wherein the test operating parameters include a test trigger time and a test operating frequency;

the generating an execution sequence of each test operation type according to the test operation parameters comprises the following steps:

comparing the test triggering time of each test operation type to obtain an initial execution sequence of each test operation type;

4. The smart device testing method of claim 1, wherein the sending the test operation instruction to the plurality of slave terminals includes:

acquiring identification information of each slave terminal;

according to the identification information, respectively determining an information transmission path of each slave terminal;

And sending the test operation instruction to the slave terminal through the information transmission path.

5. The intelligent device testing method according to claim 4, wherein the sending the test operation instruction to the slave terminal through the information transmission path includes:

acquiring identification information of a test operation program, wherein the test operation program is an application program in the slave terminal;

and according to the identification information of the test operation program, sending the test operation instruction to the test operation program of the slave terminal through the information transmission path.

6. The smart device testing method of claim 1, wherein before receiving the test initiation instruction for the master terminal and the plurality of slave terminals, further comprising:

analyzing the test configuration information to obtain configuration information of the slave control terminal and configuration information of a test operation program;

and determining a test operation program in the application programs in the slave terminal according to the test operation program configuration information.

7. The method for testing intelligent devices according to claim 6, wherein determining the slave terminal corresponding to each intelligent device according to the slave terminal configuration information comprises:

and determining the slave control terminal of the intelligent equipment according to the matching result.

8. The method for testing intelligent devices according to claim 6, wherein after determining the slave terminal corresponding to each intelligent device according to the slave terminal configuration information, the method further comprises:

respectively sending a communication test instruction to each slave terminal;

and establishing an information transmission path between the slave terminal and the slave terminal according to the feedback time.

9. The intelligent equipment testing method is characterized by being applied to a slave control terminal and comprising the following steps of:

receiving a test operation instruction sent by a main control terminal, wherein the test operation instruction is generated based on test operation information, the test operation information is obtained through a test operation interface, the test operation information is information corresponding to control operation of a main control intelligent device corresponding to the main control terminal through the main control terminal, and the control operation corresponds to one test operation;

analyzing the test operation instruction to obtain test operation information;

and triggering the intelligent equipment controlled by the slave control terminal to execute corresponding test operation through the test operation execution interface according to the test operation information.

10. The method for testing the intelligent device according to claim 9, wherein triggering the intelligent device controlled by the slave terminal to execute the corresponding test operation through the test operation execution interface according to the test operation information comprises:

according to the test operation type, determining a target operation control corresponding to the test operation type in the test operation execution interface;

and triggering the target operation control according to the execution sequence so that the intelligent equipment executes corresponding test operation.

11. The smart device testing method of claim 10, wherein the triggering the target operational control according to the execution order comprises:

and adding acting force information at the position to trigger the target operation control.

12. An intelligent device testing apparatus, comprising:

the information acquisition unit is used for responding to the control operation of the main control intelligent equipment corresponding to the main control terminal through the test operation interface to acquire at least one piece of test operation information, wherein the test operation information is information corresponding to the control operation of the main control intelligent equipment through the main control terminal, and the control operation corresponds to one test operation;

13. An intelligent device testing apparatus, which is characterized in that it is applied to a slave terminal, comprising:

the test operation instruction receiving unit is used for receiving a test operation instruction sent by the main control terminal, the test operation instruction is generated based on test operation information, the test operation information is obtained through a test operation interface, the test operation information is information corresponding to control operation of the main control intelligent equipment corresponding to the main control terminal through the main control terminal, and the control operation corresponds to one test operation;

and the triggering unit is used for triggering the intelligent equipment controlled by the slave control terminal to execute corresponding test operation through the test operation execution interface according to the test operation information.

14. An electronic device comprising a memory and a processor; the memory stores a computer program, and the processor is configured to execute the computer program in the memory to perform the smart device testing method of any one of claims 1 to 8, or to perform the smart device testing method of claims 9-11.

15. A storage medium storing a plurality of computer programs adapted to be loaded by a processor for performing the smart device testing method of any one of claims 1 to 8 or for performing the smart device testing method of claims 9-11.