CN113758939B - Method for representing metal surface cleanliness by using metal surface reflection and scattering spectrum - Google Patents
Method for representing metal surface cleanliness by using metal surface reflection and scattering spectrum Download PDFInfo
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- CN113758939B CN113758939B CN202010498595.3A CN202010498595A CN113758939B CN 113758939 B CN113758939 B CN 113758939B CN 202010498595 A CN202010498595 A CN 202010498595A CN 113758939 B CN113758939 B CN 113758939B
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
Abstract
The invention relates to the technical field of laser cleaning metal surface detection, in particular to a method for representing the cleanliness of a metal surface by using a metal surface reflection and scattering spectrum, which comprises the following steps: a1: adjusting the incident optical fiber and the corresponding optical adjusting device to enable the light emitted by the light source to irradiate a specific position on the surface of the sample in a certain spot size; a2: collecting the sample surface reflected light and the scattered light into a reflective optical fiber using a corresponding optical adjustment device; a3: the emergent light of the reflecting optical fiber is detected through the optical splitting equipment and the optical detector, and the computer reads the data; a4: calculating the integral average intensity I of light within a certain wavelength range; a5: integrated average intensity normalized value I obtained with standard clean metal surfaces b And taking the integral average intensity I of the surface of the sample as a numerator, and calculating to obtain the cleanliness of the metal surface. The invention solves the technical problems of real-time online monitoring, quantitative description of the cleanliness of the metal surface and the like in the laser cleaning process.
Description
Technical Field
The invention relates to the technical field of laser cleaning metal surface detection, in particular to a method for representing the cleanliness of a metal surface by using reflection and scattering spectra of the metal surface.
Background
At present, the cleaning degree and the corrosion degree of the metal surface are judged by a visual observation method, GB/T8923.1-2011 standard is executed, the method is a qualitative method, has great human factors, is low in detection speed, and cannot meet the requirement of rapid development of current industrialization. In addition, there are many methods for detecting the degree of corrosion of a metal surface, including ultrasonic detection, micrometer measurement after polishing, microscopic observation, scanning electron microscope analysis, section loss method, weight loss method, anodic current density method, image pixel acquisition analysis method, and the like. Due to the complexity of laser cleaning materials, these methods of measuring the thickness of the corrosion layer are generally not suitable for use in laser cleaning sites. At present, an RGB (red, green, blue) three-color judgment method is used for evaluating laser cleaning quality, a camera is used for analyzing RGB values of pixel points after photographing so as to judge the corrosion state and the cleaning effect of a metal surface, the analysis is generally required after the cleaning, the photographing position, the ambient light and the like have more limitations, the data processing time is long, and the method is not suitable for online analysis. Therefore, it is important to develop a novel method for detecting and characterizing the cleanliness of metal surfaces, and to realize rapid on-line detection in laser cleaning sites.
In the aspect of the technology for monitoring the laser cleaning quality, a part of the prior art methods apply for patents, wherein the technology for monitoring the laser cleaning quality by adopting a spectroscopic method comprises the following steps: the invention relates to a laser cleaning detection device and a laser cleaning detection method (patent application number: 201910973735.5) for Xiaohai soldiers, wherein the detection method utilizes a CCD detector to track and shoot the surface of a sample, analyzes various images and is a relatively complex technology; the invention provides a cleaning quality monitoring device and a method based on a laser cleaning device (patent application number: 201710546718.4), and the monitoring method essentially analyzes RGB gray values of a sample surface image; the invention relates to an on-line monitoring method for laser cleaning (patent application number: 201810727906.1), which is invented by Song Feng and the like, and the method utilizes the change of a light sensor to the temperature stress to realize on-line monitoring. Generally speaking, there are many technical methods for monitoring the laser cleaning quality, but it is still difficult to implement simple, intuitive, accurate, fast and real-time tracking of laser cleaning for detection.
Disclosure of Invention
The invention aims to provide a method for representing the cleanliness of a metal surface by using a reflection spectrum and a scattering spectrum of the metal surface, and the method solves the technical problems of real-time online monitoring, quantitative description of the cleanliness of the metal surface and the like in the laser cleaning process.
The purpose of the invention is realized by the following technical scheme:
a method for representing the cleanliness of a metal surface by using reflection and scattering spectra of the metal surface utilizes a device comprising a light source, an incident optical fiber, a reflection optical fiber, an optical splitting device, an optical detector, a computer and a plurality of optical adjusting devices, and comprises the following steps:
a1: adjusting the incident optical fiber and the corresponding optical adjusting device to enable the light emitted by the light source to irradiate a specific position on the surface of the sample in a certain spot size;
a2: collecting the sample surface reflected light and the scattered light into a reflective optical fiber using a corresponding optical adjustment device;
a3: the emergent light of the reflecting optical fiber passes through the optical splitting equipment and the optical detector to detect the intensity and the data is read by the computer;
a4: calculating the integral average intensity I of light in a certain wavelength range by a computer;
a5: integrated average intensity normalized value I obtained with standard clean metal surfaces b And taking the integral average intensity I of the surface of the sample as a numerator, and calculating by a computer to obtain the cleanliness of the metal surface.
The step A1 specifically comprises the following steps:
a11: turning on the light source, the types of light sources that can be used include continuous light sources, pulsed light sources, polychromatic light sources;
a12: adjusting a corresponding optical adjusting device according to the characteristics of the light source, coupling partial light beams emitted by the light source to the light source end of the incident optical fiber, and enabling the partial light beams to enter the incident optical fiber;
a13: adjusting the corresponding optical adjusting device to make the outgoing light of the sample end irradiated by the incident optical fiber irradiate on the surface of the sample at a specific angle;
a14: adjusting a corresponding optical adjusting device according to specific requirements to enable the size of a light spot irradiated on the surface of the sample to meet the measurement requirements;
a15: and adjusting the angle of the sample surface irradiated by the outgoing light of the irradiation sample end of the incident optical fiber, wherein the angle between the outgoing light of the irradiation sample end and the sample surface is more than 30 degrees and less than or equal to 90 degrees.
The angle between the outgoing light of the sample irradiating end of the incident optical fiber and the surface of the sample is larger than 30 degrees and smaller than 90 degrees, and a corresponding optical adjusting device is adjusted in the step A2, so that the reflected light and the scattered light on the surface of the sample are coupled to the reflected light coupling end of the reflecting optical fiber;
the outgoing light of the irradiation sample end of the incident optical fiber is perpendicular to the surface of the sample at 90 degrees, and the irradiation sample end of the incident optical fiber and the reflected light coupling end of the reflection optical fiber are made into a two-in-one port to form a Y-shaped optical fiber.
In the step A3, the emergent light of the reflective optical fiber is split by the optical splitting equipment and then the intensity at each wavelength is detected by the optical detector, and the reading time of the optical detector is less than 1 millisecond each time.
In step A4, the method for calculating the integral average intensity of light measured by the photodetector is to accumulate the intensities of all photosites in all the set wavelength ranges, and then divide the intensities by the number n of the photosites, and the specific calculation formula is as follows:
in the step A5, the cleanliness of any position point (x, y) on the surface of the sample is calculated by the following formula:
and (3) taking points on the surface of the sample at certain intervals, obtaining cleanliness values of different positions of the surface of the sample, and imaging the obtained surface cleanliness of the sample on a computer.
The invention has the advantages and positive effects that:
1. the invention is convenient and quick to use, and solves the technical problems of real-time online monitoring, quantitative description of the cleanliness of the metal surface and the like in the laser cleaning process.
2. The invention can synchronously run with the laser cleaning equipment, realizes the online monitoring of the surface quality of the laser cleaning, and can also guide the adjustment of the laser cleaning power to a certain extent.
Drawings
FIG. 1 is a schematic flow diagram of the present invention;
FIG. 2 is a schematic view of an apparatus for carrying out the method of the present invention, wherein the incident light angle is between 30 degrees and 90 degrees;
FIG. 3 is a second schematic view of an apparatus for carrying out the method of the present invention, wherein the incident light angle is 90 degrees;
FIG. 4 is a schematic diagram of a steel sample used in the comparison of the effects of the method of the present invention;
FIG. 5 is an image of the cleanliness of the steel sample shown in FIG. 4 after the test by the method of the present invention.
Wherein:
s1 is a light source, and S2 is a sample;
f1 is an incident optical fiber, F1a is a light source end, and F1b is an irradiation sample end;
f2 is a reflection optical fiber, F2a is a reflection light coupling end, and F2b is a reflection light emergent end;
l1a is a first optical adjusting device, L1b is a second optical adjusting device, L2a is a third optical adjusting device, and L2 is a fourth optical adjusting device;
d1 is optical splitting equipment and a light detector;
c1 is a computer.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings.
As shown in fig. 1 to 3, the apparatus utilized by the method of the present invention includes a light source S1, an incident optical fiber F1, a reflective optical fiber F2, an optical splitting device and optical detector D1, a computer C1 and a plurality of optical adjusting devices, wherein light emitted from the light source S1 is adjusted by a first optical adjusting device L1a, coupled into a light source end F1a of the incident optical fiber F1, emitted from an irradiated sample end F1b of the incident optical fiber F1, adjusted by a corresponding optical adjusting device, and irradiated onto a surface of a sample S2, while light reflected from the surface of the sample S2 is coupled by a related optical adjusting device and then enters a reflected light coupling end F2a of the reflective optical fiber F2, light emitted from a reflected light emitting end F2b of the reflective optical fiber F2 is detected by the optical splitting device and optical detector D1 to obtain light intensities of various wavelengths, and finally the computer C1 calculates an integrated average intensity and cleanliness.
As shown in fig. 2, an irradiation sample end F1b of the incident optical fiber F1 and a reflection light coupling end F2a of the reflection optical fiber F2 may form a certain included angle, wherein light emitted from the irradiation sample end F1b of the incident optical fiber F1 is irradiated onto the surface of the sample S2 after being adjusted by the second optical adjustment device L1b, an emergent light angle of the irradiation sample end F1b is controlled between 30 degrees and 90 degrees, and light reflected from the surface of the sample S2 enters the reflection light coupling end F2a of the reflection optical fiber F2 after being coupled by the third optical adjustment device L2 a.
As shown in fig. 3, a specific example of the present invention is: the irradiation sample end F1b of the incident optical fiber F1 and the reflection light coupling end F2a of the reflection optical fiber F2 are perpendicular to the surface of the sample S2, the incident optical fiber F1 and the reflection optical fiber F2 are Y-shaped, the emergent light angle of the irradiation sample end F1b is 90 degrees, light emitted from the irradiation sample end F1b of the incident optical fiber F1 is perpendicularly irradiated to the surface of the sample S2 after passing through the fourth optical adjusting device L2, and light perpendicularly reflected from the surface of the sample S2 is coupled into the reflection light coupling end F2a of the reflection optical fiber F2 through the fourth optical adjusting device L2.
The optical adjustment devices are well known in the art, and may be, for example, convex lenses or lens combinations.
The optical fiber, the optical splitting device and the optical detector D1 are all known in the art and are commercially available products.
The method comprises the following specific steps:
step A1: and adjusting the incident optical fiber F1 and a corresponding optical adjusting device to enable the light emitted by the light source S1 to irradiate a specific position on the surface of the metal sample S2 with a certain spot size.
The method specifically comprises the following steps:
a11: turning on a light source S1, wherein the light source S1 can be a continuous or pulse light source, and can also be but is not limited to a multicolor light source;
a12: adjusting a corresponding optical adjusting device (a first optical adjusting device L1 a) according to the characteristics of the light source S1, coupling partial light beams emitted by the light source S1 to a light source end F1a of an incident optical fiber F1, and enabling the partial light beams to enter the incident optical fiber F1;
a13: adjusting a corresponding optical adjusting device to enable emergent light of an irradiation sample end F1b of the incident optical fiber F1 to irradiate the surface of the metal sample S2 at a specific angle, wherein the specific angle needs to ensure the adjustment requirements of the size, the irradiation angle and the like of a subsequent light spot;
a14: adjusting a corresponding optical adjusting device according to specific needs to enable the size of a light spot irradiated on the surface of the metal sample S2 to meet measurement needs, wherein generally, the size of the light spot can be set but is not limited to be the same as that of a light spot for laser cleaning;
a15: and adjusting the angle of the emergent light of the irradiation sample end F1b irradiating the surface of the metal sample S2, wherein the included angle is more than 30 degrees and can be 90 degrees at most, namely vertical irradiation.
Step A2: and collecting part of angle reflected light and part of angle scattered light at the light spot on the surface of the metal sample S2 into the reflecting optical fiber F2 by using corresponding optical adjusting devices.
Wherein:
a21: if in step A1, the emergent light from the sample end F1b is irradiated onto the surface of the metal sample S2 at a certain angle (greater than 30 degrees and less than 90 degrees), as shown in fig. 2, at this time, a third optical adjustment device L2a needs to be adjusted, so that part of the reflected light and part of the scattered light at the light spot on the surface of the sample S2 are coupled to the reflected light coupling end F2a of the reflective optical fiber F2 and enter the reflective optical fiber F2;
a22: if the emergent light angle of the irradiation sample end F1b is perpendicular to the surface of the sample S2 in step A1, as shown in fig. 3, the irradiation sample end F1b of the incident optical fiber F1 and the reflected light coupling end F2a of the reflective optical fiber F2 can be made into a two-in-one port by using an optical fiber technology to form a Y-shaped optical fiber, and at this time, the light is reflected perpendicularly from the surface of the sample S2.
Step A3: the light collected in the reflective optical fiber F2 is detected in intensity by an optical splitter and a photodetector D1, and the computer C1 reads the data.
Wherein:
a31: the surface of a sample S2 emitted from a reflected light emitting end F2b of the reflective optical fiber F2 reflects and scatters light, and the light is split by an optical splitting device and then the intensity of each wavelength is detected by an optical detector;
a32: the type and sampling frequency of the light detector are adjusted according to actual needs, and in order to realize rapid measurement, the reading time of the light detector is less than 1 millisecond.
Step A4: the integrated average intensity I of the light over a certain wavelength range of the sample S2 is calculated by the computer C1.
Wherein:
a41: the method for calculating the integral average intensity of light measured by the light detector is that the intensities of all photosites in all set wavelength ranges are accumulated and then divided by the number n of the photosites, and the specific calculation formula is as follows:
a42: the optical detector is a photodiode or a photomultiplier, and if the multi-wavelength light intensity cannot be measured simultaneously, the integrated average intensity can be represented by the gate integrated intensity or the total intensity.
Step A5: integrated average intensity I obtained with a clean surface of standard metal b Taking the integral average intensity I of the surface of the metal sample S2 as a numerator, and calculating by using a computer C1 to obtain the cleanliness of the metal surface, wherein the method specifically comprises the following steps:
a51: a standard clean metal surface can be examined by the above-described method to obtain an integrated average intensity value as the standard value I b
A52: the cleanliness of a certain position point (x, y) on the surface of the metal sample S2 is calculated by the formula,
a53: and (3) taking points on the surface of the metal sample S2 at certain intervals, obtaining cleanliness values of different position points on the surface of the sample S2, and imaging the obtained surface cleanliness of the sample S2 on a computer C1 to obtain the visual metal surface cleaning condition.
The technical effect of the method of the present invention is illustrated below by a specific application example.
According to the application example, the marine steel plate is selected as a sample, the laser cleaning method is used for cleaning different areas of the surface of the plate in different degrees, as shown in fig. 4, the cleaned marine steel plate sample is divided into four areas, namely 1,2,3 and 4, and different corrosion degrees from Sa1 to Sa3 are achieved. The central points of 5 positions are selected from the steel sample, and the corrosion degrees corresponding to all the areas are different. The ratings, by visual means, were: zone 1 is the zone that was not cleaned, with staining being the most severe; the area 2 is partially cleaned, but is an area which is not cleaned completely and does not reach the standard, and is Sa1 level; zone 3 is a partially cleaned zone, grade Sa2, it is noted that the upper half of zone 3 is over-cleaned, resulting in substrate damage such that the entire zone is grade Sa2, and if only the lower half of zone 3 is considered, then grade Sa3 with very good cleaning quality should be present; and the area 4 is the area which reaches the standard after most of cleaning, and can reach the grade Sa 3.
The cleanliness of the sample shown in fig. 4 is detected by using the method of the present invention, and a cleanliness imaging chart shown in fig. 5 is obtained. As can be seen from fig. 5, the cleanliness imaging graph can truly and clearly reflect the cleanliness of each measuring point, and the result is far more accurate than that of a visual method. Especially for zone 3, the results are significantly different for the upper and lower halves. In the actual laser cleaning work, if a certain cleaning degree value is set as a threshold value (i.e. I) b ) Therefore, the position of the metal surface can be accurately judged to be not up to standard when being cleaned, the thickness of the rust layer can be qualitatively known according to the cleanliness, and the parameters can be provided for the laser cleaning device, so that the secondary treatment of the sample at the later stage is facilitated.
Claims (3)
1. A method for characterizing the cleanliness of a metal surface by using reflection and scattering spectra of the metal surface is characterized by comprising the following steps: the method utilizes a device comprising a light source (S1), an incident optical fiber (F1), a reflecting optical fiber (F2), an optical splitting device, an optical detector (D1), a computer (C1) and a plurality of optical adjusting devices, and comprises the following steps:
a1: adjusting an incident optical fiber (F1) and a corresponding optical adjusting device to enable light emitted by a light source (S1) to irradiate a specific position on the surface of a sample (S2) with a certain spot size;
the step A1 specifically comprises the following steps:
a11: turning on the light source (S1), the types of light source (S1) that can be used include continuous light source, pulsed light source, polychromatic light source;
a12: adjusting a corresponding optical adjusting device according to the characteristics of the light source (S1), coupling partial light beams emitted by the light source (S1) to a light source end (F1 a) of an incident optical fiber (F1) and entering the incident optical fiber (F1);
a13: adjusting a corresponding optical adjusting device to enable emergent light of an irradiation sample end (F1 b) of an incident optical fiber (F1) to irradiate the surface of a sample (S2) at a specific angle;
a14: adjusting a corresponding optical adjusting device according to specific requirements to enable the size of a light spot irradiated on the surface of the sample (S2) to meet the measurement requirements;
a15: adjusting the angle of emergent light of an irradiation sample end (F1 b) of an incident optical fiber (F1) to irradiate the surface of a sample (S2), wherein the angle between the emergent light of the irradiation sample end (F1 b) and the surface of the sample (S2) is more than 30 degrees and less than or equal to 90 degrees;
a2: collecting light reflected and scattered from the surface of the sample (S2) into a reflective optical fiber (F2) using a corresponding optical adjustment device;
a3: the emergent light of the reflecting optical fiber (F2) passes through an optical splitting device and an optical detector (D1) to detect the intensity and the data is read by a computer (C1);
wherein:
a31: the surface of a sample (S2) emitted from a reflected light emitting end (F2 b) of a reflective optical fiber (F2) reflects and scatters light, and the light is split by an optical splitting device and then the intensity of each wavelength is detected by an optical detector;
a32: adjusting the type and sampling frequency of the optical detector as required, wherein the reading time of the optical detector is less than 1 millisecond each time;
a4: a computer (C1) calculates an integrated average intensity I of light within a certain wavelength range;
in step A4, the method for calculating the integral average intensity of light measured by the photodetector is to accumulate the intensities of all photosites in all the set wavelength ranges, and then divide the intensities by the number n of the photosites, and the specific calculation formula is as follows:
a5: integrated average intensity normalized value I obtained with standard clean metal surfaces b Taking the integral average intensity I of the surface of the sample (S2) as a numerator, and calculating by a computer (C1) to obtain the cleanliness of the metal surface;
in the step A5, the cleanliness of any position point (x, y) on the surface of the sample (S2) is calculated by the following formula:
and (3) taking points on the surface of the sample (S2) at certain intervals, obtaining cleanliness values of different positions of the surface of the sample (S2), and imaging the obtained surface cleanliness of the sample (S2) on a computer (C1).
2. The method for characterizing the cleanliness of a metal surface using reflection and scattering spectra from a metal surface according to claim 1, wherein: the angle between emergent light of an irradiation sample end (F1 b) of the incident optical fiber (F1) and the surface of the sample (S2) is larger than 30 degrees and smaller than 90 degrees, and a corresponding optical adjusting device is adjusted in the step A2, so that part of reflected light and part of scattered light on the surface of the sample (S2) are coupled to a reflected light coupling end (F2 a) of the reflecting optical fiber (F2).
3. The method for characterizing the cleanliness of a metal surface using reflection and scattering spectra from a metal surface according to claim 1, wherein: emergent light of an irradiation sample end (F1 b) of the incident optical fiber (F1) is perpendicular to the surface of the sample (S2) by 90 degrees, and the irradiation sample end (F1 b) of the incident optical fiber (F1) and a reflected light coupling end (F2 a) of the reflected optical fiber (F2) are made into a two-in-one port to form a Y-shaped optical fiber.
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