CN113720784B - Chromium-based spinel test system based on terahertz waveband magneto-optical spectrum - Google Patents
Chromium-based spinel test system based on terahertz waveband magneto-optical spectrum Download PDFInfo
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- CN113720784B CN113720784B CN202111184051.0A CN202111184051A CN113720784B CN 113720784 B CN113720784 B CN 113720784B CN 202111184051 A CN202111184051 A CN 202111184051A CN 113720784 B CN113720784 B CN 113720784B
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- 229910052804 chromium Inorganic materials 0.000 title claims abstract description 19
- 239000011651 chromium Substances 0.000 title claims abstract description 19
- 229910052596 spinel Inorganic materials 0.000 title claims abstract description 19
- 239000011029 spinel Substances 0.000 title claims abstract description 19
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 title claims abstract description 18
- 238000012360 testing method Methods 0.000 title claims abstract description 18
- 238000001228 spectrum Methods 0.000 title claims abstract description 16
- 230000010287 polarization Effects 0.000 claims abstract description 44
- 230000003287 optical effect Effects 0.000 claims abstract description 41
- 238000001514 detection method Methods 0.000 claims abstract description 38
- 229910052751 metal Inorganic materials 0.000 claims description 62
- 239000002184 metal Substances 0.000 claims description 62
- 230000005684 electric field Effects 0.000 claims description 6
- 238000004611 spectroscopical analysis Methods 0.000 claims description 2
- 239000000523 sample Substances 0.000 abstract description 56
- 239000013078 crystal Substances 0.000 abstract description 27
- 230000008878 coupling Effects 0.000 abstract description 5
- 238000010168 coupling process Methods 0.000 abstract description 5
- 238000005859 coupling reaction Methods 0.000 abstract description 5
- 230000007246 mechanism Effects 0.000 abstract description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000003595 spectral effect Effects 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 150000001844 chromium Chemical class 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
Abstract
The invention discloses a chromium-based spinel testing system based on terahertz waveband magneto-optical spectrum, which comprises a superconducting magnet and a rotatable sample rack, wherein the rotatable sample rack is arranged in the middle of the superconducting magnet, a terahertz polarization adjusting module and a terahertz detecting module are respectively arranged on the left side and the right side of the superconducting magnet, and reflecting plates are respectively arranged on the upper side and the lower side of the superconducting magnet. According to the invention, by the aid of the superconducting magnet, the horizontal optical window, the vertical optical window, the terahertz polarization adjusting module and the terahertz detection module, a microscopic mechanism of magnetoelectric coupling of a sample material to be detected under a multi-parameter combination mode of terahertz wave vector, polarization, magnetic field direction and crystal orientation of the sample to be detected can be detected, the intensity of terahertz wave is adjusted, meanwhile, the required terahertz incident light angle can be determined, and detection of terahertz components is facilitated at maximum efficiency.
Description
Technical Field
The invention relates to the field of chromium-based spinel materials, in particular to a chromium-based spinel testing system based on terahertz waveband magneto-optical spectrum.
Background
The chromium-based spinel material has abundant physical characteristics such as magnetic resistance, multiferroic property and various magnetic orders and has important theory and application value, a high magnetic field spectrum technology based on a Fourier change spectrometer or a backward wave oscillator is a common experimental method for detecting terahertz wave band high-frequency spin resonance, but in the actual experimental process, due to the limitation of various factors, terahertz polarization change or optical activity of an electromagnetic vibrator is difficult to obtain, and the propagation direction of a terahertz light path is fixed, so that the terahertz wave vector, the polarization and magnetic field direction and the associated information among sample crystal orientations under different modes can be obtained only by carrying out multiple tests, and the experiment is not facilitated.
Disclosure of Invention
The invention mainly aims to provide a chromium-based spinel testing system based on terahertz waveband magneto-optical spectrum, which can detect the micro mechanism of magnetoelectric coupling of a sample material to be tested in a multi-parameter combination mode of terahertz wave vector, polarization, magnetic field direction and crystal orientation of the sample to be tested through a superconducting magnet, a horizontal optical window, a vertical optical window, a terahertz polarization adjusting module and a terahertz detection module, adjust the intensity of terahertz wave, determine the required terahertz incident light angle, be beneficial to detecting terahertz components with the maximum efficiency and effectively solve the problems in the background technology.
In order to achieve the purpose, the invention adopts the technical scheme that:
the utility model provides a chromium base spinel test system based on terahertz wave band magneto-optical spectroscopy, is including the superconducting magnet that is used for providing low temperature and strong magnetic environment and be used for fixed crystal sample that awaits measuring and the rotatable sample frame of adjusting the crystal sample angle that awaits measuring, rotatable sample frame installs in the middle part of superconducting magnet, is equipped with terahertz polarization adjusting module that is used for adjusting terahertz wave intensity and confirms incident light angle and the terahertz detection module that is used for surveying terahertz polarization respectively on the left side and the right side of superconducting magnet, and has all seted up high adjusting module at the downside of terahertz polarization adjusting module and terahertz detection module, the upside and the downside of superconducting magnet all are equipped with the reflecting plate, and the reflecting plate outside all is equipped with angle adjusting module, horizontal optical window has been seted up to the left end and the right-hand member middle part symmetry of superconducting magnet, and vertical optical window has been seted up to the upper end and the lower extreme middle part symmetry of superconducting magnet.
Furthermore, the central point of the horizontal optical window and the central point of the rotatable sample holder are on the same straight line, and the arrangement can ensure that the terahertz waves irradiate on the surface of the crystal sample to be measured.
Furthermore, the central point of the vertical optical window, the central point of the rotatable sample holder and the central point of the reflecting plate are all on the same straight line, and the arrangement can ensure that the terahertz waves irradiate on the surface of the crystal sample to be measured.
Furthermore, the terahertz polarization adjusting module is composed of two metal wire grid polarizers capable of rotating independently and a connecting frame, the centers of the two metal wire grid polarizers capable of rotating independently are on the same horizontal line, when terahertz waves pass through a polaroid of the metal wire grid polarizer, polarized light components arranged in parallel to the metal wire grid are reflected by the metal wire grid of the polaroid, or the polarized light components are absorbed due to work on electrons in the metal wire grid, the polarized light components arranged in perpendicular to the metal wire grid can pass through the wire grid, the intensity of the terahertz waves can be adjusted by rotating the metal wire grid polarizer positioned on the front side, unnecessary polarized light can be filtered out by rotating the metal wire grid polarizer positioned on the rear side, and therefore the incident terahertz waves can be transmitted according to a required angle, and the height adjusting module is arranged on the lower side of the connecting frame of the terahertz polarization adjusting module.
Further, the terahertz detection module is composed of a metal wire grid polarizer which is positioned on the left side and a metal wire grid polarizer which is positioned on the right side and is fixed, and a connecting frame, and the height adjusting module is arranged on the lower side of the connecting frame of the terahertz detection module.
Furthermore, the rotatable metal wire grid polarizer positioned on the left side of the terahertz detection module has two configuration states, one configuration state is that the metal wire grid of the metal wire grid polarizer forms a 45-degree included angle with the central plane of the polarizer, the metal wire grid in the other configuration state is perpendicular to the distribution direction of the metal wire grid in the first configuration state, and two terahertz electric field components which are perpendicular to each other, namely plane terahertz polarization, are obtained through the arrangement.
Furthermore, the rotatable metal wire grid polarizer on the right side in the terahertz detection module has two configuration states, wherein one configuration state is that the metal wire grids of the metal wire grid polarizer are distributed in a horizontal state, and the other configuration state is that the metal wire grids of the metal wire grid polarizer are distributed in a vertical state, so that the terahertz component can be detected with the maximum efficiency.
Further, the use steps of the system are as follows:
fixing a crystal sample to be detected in the middle of a rotatable sample frame, moving the rotatable sample frame into the superconducting magnet, and adjusting the position of the crystal sample to be detected to enable the crystal sample to be detected to be located at the central connecting line of a horizontal optical window and a vertical optical window;
adjusting a rotatable metal wire grid polarizer positioned on the left side in the terahertz detection module to be in a first configuration state, adjusting the intensity of terahertz waves and determining the angle of required incident light by rotating two independently rotatable metal wire grid polarizers of the terahertz polarization adjustment module, so that the terahertz waves irradiated on the crystal sample to be detected are incident according to the calculated angle value;
starting equipment to generate terahertz pulses, wherein the terahertz pulses sequentially pass through the terahertz polarization adjusting module, the crystal sample to be detected and the terahertz detecting module, and required spectral data are acquired through relevant equipment;
step four, adjusting the angle of the crystal sample to be measured through a rotatable sample frame, repeating the step two and the step three, and obtaining required spectral data through related equipment, wherein the operation is to obtain the relation between the crystal direction of the sample to be measured and the terahertz wave vector, the polarization and the magnetic field direction on the premise that the terahertz wave is parallel to the magnetic field;
and fifthly, adjusting the positions of the terahertz polarization adjusting module and the terahertz detection module through the height adjusting module, enabling the center of the metal wire grid polarizer of the terahertz polarization adjusting module and the reflecting plate positioned on the upper side of the superconducting magnet to be on the same horizontal line, enabling the metal wire grid polarizer of the terahertz detection module and the reflecting plate positioned on the lower side of the superconducting magnet to be on the same horizontal line, adjusting the inclination angles of the reflecting plates on the two sides through the angle adjusting module, enabling the terahertz wave to irradiate the surface of the sample to be detected, and repeating the second step, the third step and the fourth step.
The invention has the following beneficial effects:
compared with the prior art, the superconducting magnet, the horizontal optical window, the vertical optical window, the height adjusting module and the angle adjusting module are arranged, so that two geometrically configured light paths with magnetic fields perpendicular to and parallel to the terahertz light propagation direction can be designed by utilizing the horizontal optical window and the vertical optical window of the low-temperature superconducting magnet, and the micro mechanism of magnetoelectric coupling of the sample material to be detected under the multi-parameter combination mode of terahertz wave vector, polarization, magnetic field direction and crystal orientation of the sample to be detected is convenient to detect;
compared with the prior art, when terahertz waves pass through a polaroid of a metal wire grid polarizer, polarized light components arranged in parallel to the metal wire grid are reflected by the metal wire grid of the polaroid or absorbed due to acting on electrons in the metal wire grid, the polarized light components arranged perpendicular to the metal wire grid can pass through the wire grid, and the terahertz polarization adjusting modules of the two metal wire grid polarizers capable of rotating independently are arranged on the front side of a sample, so that the intensity of the terahertz waves can be adjusted, and meanwhile, the required terahertz incident light angle can be determined;
compared with the prior art, the terahertz detection module is arranged, the configuration state of the metal wire grid polarizer in the terahertz detection module can be adjusted according to the crystal orientation and the detection light polarization of the detection crystal in actual measurement, the terahertz component can be detected at the maximum efficiency, and two terahertz electric field components which are perpendicular to each other, namely plane terahertz polarization, are obtained.
Drawings
In order to more clearly illustrate the technical solution of the present invention, the drawings needed to be used in the technical description of the present invention will be briefly introduced below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive labor.
FIG. 1 is a schematic diagram of the overall structure of a chromium-based spinel testing system based on terahertz waveband magneto-optical spectrum;
FIG. 2 is an optical schematic diagram of a terahertz detection module of a chromium-based spinel testing system based on terahertz waveband magneto-optical spectrum in a configuration state according to the invention;
FIG. 3 is an optical schematic diagram of a terahertz detection module of a chromium-based spinel testing system based on terahertz waveband magneto-optical spectrum in another configuration state;
fig. 4 is a schematic diagram of the operating principle of a metal wire grid polarizer.
In the figure: 1. a superconducting magnet; 2. a rotatable sample holder; 3. a terahertz polarization adjustment module; 4. a terahertz detection module; 5. a height adjustment module; 6. a reflective plate; 7. an angle adjustment module; 8. a horizontal optical window; 9. perpendicular to the optical window.
Detailed Description
The present invention will be further described with reference to the following detailed description, wherein the drawings are for illustrative purposes only and are not intended to be limiting of the present patent, wherein certain elements may be omitted, enlarged or reduced in size to better illustrate the detailed description, and not to represent actual dimensions, and wherein certain well-known structures and descriptions may be omitted from the drawings so that those skilled in the art can understand that based on the detailed description of the present invention, all other detailed descriptions that may be obtained by those skilled in the art without making any creative effort may be within the scope of the present invention.
Example 1
As shown in fig. 1-3, a chromium-based spinel test system based on terahertz waveband magneto-optical spectrum, including superconducting magnet 1 and rotatable sample frame 2, rotatable sample frame 2 is installed at the middle part of superconducting magnet 1, left side and right side at superconducting magnet 1 are equipped with terahertz respectively and are polarized adjusting module 3 and terahertz detect module 4 now, and at terahertz polarization adjusting module 3 and terahertz detect module 4's downside all seted up height adjusting module 5 now, the upside and the downside of superconducting magnet 1 all are equipped with reflecting plate 6, and the reflecting plate 6 outside all is equipped with angle adjusting module 7, horizontal optical window 8 has been seted up to the left end and the right-hand member middle part symmetry of superconducting magnet 1, and vertical optical window 9 has been seted up to the upper end and the lower extreme middle part symmetry of superconducting magnet 1.
The centre point of the horizontal optical window 8 is collinear with the centre point of the rotatable sample holder 2.
By adopting the technical scheme: the horizontal optical window 8 and the vertical optical window 9 of the low-temperature superconducting magnet 1 can be utilized to design two optical paths which are geometrically configured in the direction that the magnetic field is vertical and parallel to the terahertz light propagation direction, when the terahertz polarization adjusting module 3 and the terahertz detecting module 4 are on the same horizontal line with the horizontal optical window 8 of the superconducting magnet 1, the inclination angle of the crystal sample to be detected can be adjusted by adjusting the rotatable sample holder 2, and thus the micro mechanism of magnetoelectric coupling of the sample material to be detected can be detected in the state that the magnetic field direction is parallel to the terahertz wave direction.
Example 2
As shown in fig. 1-3, a chromium-based spinel test system based on terahertz waveband magneto-optical spectrum, including superconducting magnet 1 and rotatable sample frame 2, rotatable sample frame 2 is installed at the middle part of superconducting magnet 1, left side and right side at superconducting magnet 1 are equipped with terahertz respectively and are polarized adjusting module 3 and terahertz detect module 4 now, and at terahertz polarization adjusting module 3 and terahertz detect module 4's downside all seted up height adjusting module 5 now, the upside and the downside of superconducting magnet 1 all are equipped with reflecting plate 6, and the reflecting plate 6 outside all is equipped with angle adjusting module 7, horizontal optical window 8 has been seted up to the left end and the right-hand member middle part symmetry of superconducting magnet 1, and vertical optical window 9 has been seted up to the upper end and the lower extreme middle part symmetry of superconducting magnet 1.
The center point of the vertical optical window 9 is collinear with both the center point of the rotatable sample holder 2 and the center point of the reflector plate 6.
By adopting the technical scheme: the installation heights of the terahertz polarization adjusting module 3 and the terahertz detection module 4 are adjusted through the height adjusting module 5, the height adjusting module 5 can be composed of a linear guide rail and a control system thereof, the optical center of the terahertz polarization adjusting module 3 and the center of the reflecting plate 6 positioned on the upper side of the superconducting magnet 1 are enabled to be on the same horizontal line, the optical center of the terahertz detection module 4 and the center of the reflecting plate 6 positioned on the lower side of the superconducting magnet 1 are enabled to be on the same horizontal line, the inclination angles of the two reflecting plates 6 are adjusted through the angle adjusting module 7, the angle adjusting module 7 can be composed of a stepping motor and a control system thereof, at the moment, a light path is reflected through the upper reflecting plate 6 and then is emitted through a vertical optical window 9 at the upper end of the superconducting magnet 1, passes through a sample crystal to be detected, is emitted through a vertical optical window 9 at the lower end of the superconducting magnet 1 and then enters the terahertz detection module 4 after being reflected through the reflecting plate 6, the terahertz wave direction is perpendicular to the magnetic field direction at the moment, the inclination angle of the crystal sample to be detected can be adjusted through adjusting the rotatable sample frame 2, and therefore, the magnetoelectric coupling microscopic mechanism of the sample material to be detected in the state that the terahertz wave direction is perpendicular to be detected.
Example 3
As shown in fig. 1-3, a chromium-based spinel test system based on terahertz waveband magneto-optical spectrum, including superconducting magnet 1 and rotatable sample frame 2, rotatable sample frame 2 is installed at the middle part of superconducting magnet 1, left side and right side at superconducting magnet 1 are equipped with terahertz respectively and are polarized adjusting module 3 and terahertz respectively and survey module 4, and at terahertz polarization adjusting module 3 and terahertz and survey module 4's downside all seted up height adjusting module 5, the upside and the downside of superconducting magnet 1 all are equipped with reflecting plate 6, and the reflecting plate 6 outside all is equipped with angle adjusting module 7, horizontal optical window 8 has been seted up to superconducting magnet 1's left end and right-hand member middle part symmetry, and vertical optical window 9 has been seted up to superconducting magnet 1's upper end and lower extreme middle part symmetry.
The terahertz polarization adjusting module 3 is composed of two metal wire grid polarizers capable of rotating independently and a connecting frame, the centers of the two metal wire grid polarizers capable of rotating independently are on the same horizontal line, and the height adjusting module 5 is arranged on the lower side of the connecting frame of the terahertz polarization adjusting module 3.
The rotatable metal wire grid polarizer positioned on the left side in the terahertz detection module 4 has two configuration states, wherein one configuration state is that the metal wire grid of the metal wire grid polarizer forms an included angle of 45 degrees with the central plane of the over-polarizer, and the metal wire grid in the other configuration state is perpendicular to the distribution direction of the metal wire grid in the first configuration state.
By adopting the technical scheme: through terahertz polarization adjusting module 3 and terahertz detection module 4 that are equipped with, when terahertz wave passes through the polaroid of metal wire grid polarizer, the polarized light component that is on a parallel with metal wire grid and arranges is reflected by the metal wire grid of polaroid, or absorbed because of doing work to the inside electron of metal wire grid, the polarized light component that is perpendicular to metal wire grid and arranges can pass through the wire grid, set up terahertz polarization adjusting module 3 by two independently rotatable metal wire grid polarizers in the sample front side, not only can adjust terahertz wave intensity, can confirm required terahertz incident light angle simultaneously, can be simultaneously according to the crystallographic orientation and the detection light polarization of the detection crystal in the actual measurement, adjust the configuration state of metal wire grid polarizer in terahertz detection module 4, be favorable to the detection terahertz component of maximum efficiency, obtain two orthogonal terahertz electric field components, namely plane terahertz polarization.
The invention is to be noted that, the invention is a chromium-based spinel testing system based on terahertz waveband magneto-optical spectrum, when in use, a crystal sample to be tested is fixed in the middle of a rotatable sample holder 2, the rotatable sample holder 2 is moved into a superconducting magnet 1, the position of the crystal sample to be tested is adjusted, the crystal sample to be tested is positioned at the central connecting line of a horizontal optical window 8 and a vertical optical window 9, a rotatable metal wire grid polarizer positioned at the left side in a terahertz detection module 4 is adjusted to be in a first configuration state, the intensity of terahertz waves is adjusted and the angle of required incident light is determined by rotating two independently rotatable metal wire grid polarizers of a terahertz polarization adjustment module 3, the terahertz waves irradiated on the crystal sample to be tested are incident according to the calculated angle value, equipment is started to generate terahertz pulses, terahertz pulses sequentially pass through the terahertz polarization adjusting module 3, the crystal sample to be detected and the terahertz detection module 4, required spectral data are acquired through related equipment, the angle of the crystal sample to be detected is adjusted through the rotatable sample frame 2, the second step and the third step are repeated, required spectral data are acquired through the related equipment, the positions of the terahertz polarization adjusting module 3 and the terahertz detection module 4 are adjusted through the height adjusting module 5, the center of the metal wire grid polarizer of the terahertz polarization adjusting module 3 and the reflecting plate 6 positioned on the upper side of the superconducting magnet 1 are on the same horizontal line, the metal wire grid polarizer of the terahertz detection superconducting magnet module 4 and the reflecting plate 6 positioned on the lower side of the superconducting magnet 1 are on the same horizontal line, the inclination angles of the reflecting plates 6 on the two sides are adjusted through the angle adjusting module 7, terahertz light waves can irradiate the surface of the sample to be detected, and the second step, the second step, and step three and step four.
The foregoing shows and describes the general principles and broad features of the present invention and advantages thereof. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the invention as claimed. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (4)
1. The utility model provides a chromium base spinel test system based on terahertz wave band magneto-optical spectroscopy, includes superconducting magnet (1) and rotatable sample frame (2), its characterized in that: the rotatable sample holder (2) is installed in the middle of the superconducting magnet (1), the left side and the right side of the superconducting magnet (1) are respectively provided with a terahertz polarization adjusting module (3) and a terahertz detecting module (4), the lower sides of the terahertz polarization adjusting module (3) and the terahertz detecting module (4) are respectively provided with a height adjusting module (5), the upper side and the lower side of the superconducting magnet (1) are respectively provided with a reflecting plate (6), the outer side of the reflecting plate (6) is respectively provided with an angle adjusting module (7), the middle parts of the left end and the right end of the superconducting magnet (1) are symmetrically provided with horizontal optical windows (8), and the middle parts of the upper end and the lower end of the superconducting magnet (1) are symmetrically provided with vertical optical windows (9); the central point of the horizontal optical window (8) and the central point of the rotatable sample holder (2) are on the same straight line; the central point of the vertical optical window (9), the central point of the rotatable sample holder (2) and the central point of the reflecting plate (6) are on the same straight line.
2. The chromium-based spinel testing system based on terahertz waveband magneto-optical spectrum of claim 1, wherein: the terahertz polarization adjusting module (3) is composed of two metal wire grid polarizers capable of rotating independently and a connecting frame, the centers of the two metal wire grid polarizers capable of rotating independently are on the same horizontal line, and the height adjusting module (5) on the lower side of the terahertz polarization adjusting module (3) is arranged on the lower side of the connecting frame of the terahertz polarization adjusting module (3).
3. The chromium-based spinel testing system based on terahertz waveband magneto-optical spectrum of claim 1, wherein: the terahertz detection module (4) is composed of a metal wire grid polarizer positioned on the left side in a rotatable mode, a metal wire grid polarizer positioned on the right side in a fixed mode and a connecting frame, and the height adjusting module (5) on the lower side of the terahertz detection module (4) is arranged on the lower side of the connecting frame of the terahertz detection module (4).
4. The chromium-based spinel testing system based on terahertz waveband magneto-optical spectrum of claim 1, wherein: the rotatable metal wire grid polarizer positioned on the left side in the terahertz detection module (4) has two configuration states, wherein in one configuration state, the metal wire grid of the metal wire grid polarizer forms an included angle of 45 degrees with the direction of an electric field component in a plane where the electric field component Ex and the electric field component Ey passing through the center of the polarizer are located, and in the other configuration state, the metal wire grid is perpendicular to the distribution direction of the metal wire grid.
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| JP4790560B2 (en) * | 2006-10-10 | 2011-10-12 | 浜松ホトニクス株式会社 | Single terahertz wave time waveform measurement device |
| CN101876691B (en) * | 2009-11-20 | 2012-11-14 | 清华大学 | System and method for testing magnetoelectricity property of multiferroic thin-film material |
| CN101726362B (en) * | 2009-11-23 | 2011-08-17 | 首都师范大学 | Terahertz polarization analyzer and terahertz polarization measurement method |
| CN102192884B (en) * | 2011-03-14 | 2013-06-19 | 首都师范大学 | Method for imaging of samples by using polarization controllable terahertz waves |
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