Summary of the invention
The invention provides a kind of controlled THz wave of polarization of utilizing to the method for imaging of samples, in order to the subtle change that the terahertz polarization attitude that causes per sample occurs, obtain more image information.
For achieving the above object, the invention provides a kind of controlled THz wave of polarization of utilizing to the method for imaging of samples, it comprises the following steps: when the polarization state of THz wave is linear polarization, the polarization direction is adjusted into horizontal direction, measures the horizontal component of the THz wave after interacting with sample; Terahertz pulse to horizontal component is analyzed, and obtains the subject image of horizontal polarization THz wave incident; When the polarization state of THz wave is linear polarization, the polarization direction is adjusted into vertical direction, measure the horizontal component of the THz wave after interacting with sample; Terahertz pulse to horizontal component is analyzed, and obtains the subject image of vertical polarization THz wave incident.
Polarization state in THz wave is linear polarization, the polarization direction is adjusted into the horizontal direction step to be comprised: mobile BBO(barium metaborate) crystal is to change bbo crystal to the distance of plasma, the polarization direction of THz wave is controlled to be horizontal direction, wherein, position corresponding to horizontal direction electro-optic sampling for along the position of direction of beam propagation scanning bbo crystal the time is surveyed the position of the bbo crystal of the THz wave intensity maximum that obtains.
When the polarization state of THz wave is linear polarization, the polarization direction is adjusted into the vertical direction step to be comprised: mobile bbo crystal is to change bbo crystal to the distance of plasma, the polarization direction of THz wave is controlled to be vertical direction, wherein, the position that vertical direction is corresponding electro-optic sampling for along the position of direction of beam propagation scanning bbo crystal the time is surveyed the position of the bbo crystal of the THz wave intensity minimum that obtains.
Control the position of mobile bbo crystal by accurate translation stage.
When the polarization state of THz wave is linear polarization, the polarization direction is adjusted into the horizontal direction step to be comprised: by add the quartz crystal of a pair of wedge shape between bbo crystal and plasma, adjust its position of inserting in light beam the polarization direction of THz wave is controlled to be horizontal direction.
The polarization state of THz wave is controlled to be linear polarization, the polarization direction is adjusted into the vertical direction step to be comprised: by add the quartz crystal of a pair of wedge shape between bbo crystal and plasma, adjust its position of inserting in light beam the polarization direction of THz wave is controlled to be vertical direction.
Sample is for causing the object of terahertz polarization attitude generation subtle change after interacting with THz wave.
In the above-described embodiments, the two width Terahertz images that obtain are analyzed, the image that the THz wave incident of horizontal polarization obtains, signal is stronger owing to receiving, can reflect with sample effect after the variation that occurs of intensity; The image that the THz wave incident of vertical polarization obtains can reflect the subtle change of the terahertz polarization generation that sample causes, such as the edge scatter of sample and sample anisotropy etc., thereby improved the imaging resolution of sample and obtained more sample interior information, overcome electro-optic sampling detection method in the prior art and can not analyze the revolving property of Terahertz electric field intensity, caused the sample interior information limited problem of the image reflection of obtaining.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is only the present invention's part embodiment, rather than whole embodiment.Based on the embodiment in the present invention, those of ordinary skills belong to the scope of protection of the invention not paying the every other embodiment that obtains under the creative work prerequisite.
Below the description by specifically the polarization direction high precision being controlled, be further described the method that object carries out imaging the controlled THz wave of polarization of utilizing of the present invention.
Fig. 1 is for to utilize the controlled THz wave of polarization object to be carried out the device schematic diagram of imaging according to an embodiment of the invention.In Fig. 1, each device is as follows: 1, lens; 2, bbo crystal; 3, high-accuracy linear translation platform; 4, polyfluortetraethylene plate; 5, throw the face mirror; 6, sample; 7, electro-conductive glass (ITO); 8, ZnTe crystal; 9, catoptron; 10, quarter-wave plate; 11, Wollaston prism; 12, difference detector.In an embodiment of the present invention, adopt double-frequency laser to excite the air induced plasma to produce THz wave, in the present embodiment, the LASER Light Source that double-frequency laser excites air plasma to produce the utilization of Terahertz is the femtosecond laser amplifier that Spectra-Physics produces, its laser pulse average output power is 3.5W, repetition frequency 1KHz, centre wavelength 800nm, pulsewidth 50fs.LASER Light Source can also be selected the laser instrument that produces other wavelength lasers.
Femto-second laser pulse is divided into two-beam through beam splitting chip, and light beam has most energy of incident laser, and after carrying out frequency multiplication by bbo crystal, the fundamental frequency glistening light of waves focuses on rear mixing mutually with frequency doubled light, excites THz wave; Another bundle low power laser passes through crystal detection as detecting light beam and THz wave conllinear.In crystal detection, the Terahertz electric field changes the index ellipsoid of crystal, thereby the polarization state of outgoing detecting light beam is changed.Detecting light beam is surveyed by difference detector through being divided into horizontal polarization and vertical polarization two bundles by wollaston prism after quarter-wave plate.
Excite air to produce in the mechanism of plasma generation THz wave based on double-frequency laser, only during linearly polarized light, the THz wave that excites is also linear polarization when fundamental frequency.Along with the variation of the relative phase of fundamental frequency light and frequency doubled light, the polarization direction of THz wave can change 2 π continuously.The relative phase of fundamental frequency light and frequency doubled light is along with bbo crystal is different and change to the distance of focus, and the variation of the relative phase of fundamental frequency light and frequency doubled light is proportional to the variation of the position of bbo crystal.When the position of bbo crystal recurred variation, the polarization direction of THz wave also can recur variation, and we can utilize this method to come the polarization direction of the THz wave of high-precision control radiation.
Utilize according to an embodiment of the invention the controlled THz wave of polarization to the method for imaging of samples, comprise the following steps:
S102 when the polarization state of THz wave is linear polarization, is adjusted into horizontal direction with the polarization direction, measures the horizontal component of the THz wave after interacting with sample;
S104 analyzes the terahertz pulse of horizontal component, obtains the subject image of horizontal polarization THz wave incident;
S106 when the polarization state of THz wave is linear polarization, is vertical direction with the polarization direction, measures the horizontal component of the THz wave after interacting with sample;
S108 analyzes the terahertz pulse of vertical component, obtains the subject image of vertical polarization THz wave incident.
In the present embodiment, can adopt the electro-optic sampling Detection Techniques to THz wave the component on a direction measure, this is because the electro-optic sampling Detection Techniques can only be measured the component of THz wave on a direction, if the crystallographic axis of electro-optic crystal is arranged on the direction of measuring the THz wave horizontal component, when the incident THz wave was vertical polarization, the terahertz polarization that is caused by sample can accurately measure to the small deflection that horizontal direction occurs.Equally, if the crystallographic axis of electro-optic crystal is arranged on the direction of measuring the THz wave vertical component, when the incident THz wave was horizontal polarization, the terahertz polarization that is caused by sample can accurately measure to the small deflection that vertical direction occurs.
In the present embodiment, the two width Terahertz images that obtain are analyzed, the image that the THz wave incident of horizontal polarization obtains, signal is stronger owing to receiving, can reflect with sample effect after the variation that occurs of intensity; The image that the THz wave incident of vertical polarization obtains can reflect the subtle change of the terahertz polarization generation that sample causes, such as the edge scatter of sample and sample anisotropy etc., thereby improved the imaging resolution of sample and obtained more sample interior information, overcome electro-optic sampling detection method in the prior art and can not analyze the revolving property of Terahertz electric field intensity, caused the sample interior information limited problem of the image reflection of obtaining.
In an embodiment of the present invention, utilize the THz wave of different polarization direction to carry out two-dimensional imaging to object, horizontal polarization and vertically just better selection of polarization, this is because other polarization direction also can decompose on this both direction.
For example, can control the polarization direction of THz wave to the position of plasma by adjusting bbo crystal.Along the position of direction of beam propagation scanning bbo crystal, the bbo crystal position when the THz wave intensity that finds the electro-optic sampling detection to obtain is minimum and maximum, the polarization direction of the corresponding THz wave that produces is horizontal direction and vertical direction respectively.
Fig. 2 is that the angle of the polarization direction of THz wave according to an embodiment of the invention and horizontal direction and bbo crystal are to the graph of a relation between the distance of plasma.Shown in figure change bbo crystal to plasma apart from the time, the polarization direction of THz wave is with respect to the consequential variation of the angle of horizontal direction.Continuously change in experimental provision shown in Figure 1 bbo crystal to plasma apart from d, measure respectively the polarization angle of THz wave under different distance d, can obtain curve shown in Fig. 2.The method of wherein measuring the polarization angle of THz wave is prior art, does not repeat them here.
As can be drawn from Figure 2, when bbo crystal was 48mm to the distance of plasma, the polarization angle of THz wave was 90 ° (polarization direction is vertical direction); When bbo crystal was 60mm to the distance of plasma, the polarization angle of THz wave was 0 ° (polarization direction is horizontal direction).
Correspondingly, when the polarization state of THz wave is linear polarization, the polarization direction is adjusted into the horizontal direction step to be comprised: mobile bbo crystal is to change bbo crystal to the distance of plasma, the polarization direction of THz wave is controlled to be horizontal direction, wherein, position corresponding to horizontal direction electro-optic sampling for along the position of direction of beam propagation scanning bbo crystal the time is surveyed the position of the bbo crystal of the THz wave intensity maximum that obtains.
Correspondingly, when the polarization state of THz wave is linear polarization, the polarization direction is adjusted into the vertical direction step to be comprised: mobile bbo crystal is to change bbo crystal to the distance of plasma, the polarization direction of THz wave is controlled to be vertical direction, wherein, the position that vertical direction is corresponding electro-optic sampling for along the position of direction of beam propagation scanning bbo crystal the time is surveyed the position of the bbo crystal of the THz wave intensity minimum that obtains.
For example, for accurately controlling the polarization direction of the THz wave of radiation, in the mechanism that excites air plasma generation THz wave based on double-frequency laser, bbo crystal can be fixed on one dimension electric precise translation stage, accurately control bbo crystal to the distance of plasma by the movement of translation stage.
Again for example, also can be by inserting the quartz crystal of a pair of wedge shape between bbo crystal and plasma, insert by adjusting it polarization direction that THz wave is accurately controlled in position in light beam.
Correspondingly, polarization state in THz wave is linear polarization, the polarization direction is adjusted into the horizontal direction step to be comprised: by add the quartz crystal of a pair of wedge shape between bbo crystal and plasma, adjust its position of inserting in light beam the polarization direction of THz wave is controlled to be horizontal direction.
Correspondingly, the polarization state of THz wave is controlled to be linear polarization, the polarization direction is adjusted into the vertical direction step to be comprised: by add the quartz crystal of a pair of wedge shape between bbo crystal and plasma, adjust its position of inserting in light beam the polarization direction of THz wave is controlled to be vertical direction.
In an embodiment of the present invention, sample is for causing the object of terahertz polarization attitude generation subtle change after interacting with THz wave.
Fig. 3 is that the THz wave of incident is in horizontal polarization and vertical two kinds of situations of polarization, sees through azimuthal graph of a relation of transmitance and the material fiber orientation of anisotropic foam materials.Transmitance and azimuthal measuring and calculating are state of the art, repeat no more in the present invention.
Fig. 4 is the optical photograph of sample and the Terahertz design sketch that sample is carried out two-dimensional imaging.Wherein, left figure is the optical photograph of sample, and sample is by two even thickness but different bonding the forming of space flight foam of fiber orientation, and dash area (imaging region) has been indicated the zone of THz wave scanning.Right figure carries out the Terahertz image of the controlled imaging of polarization to left figure sample, top is that the incident THz wave is the Terahertz image of horizontal polarization, and the bottom is that the incident THz wave is the Terahertz image of vertical polarization.By two width Terahertz images are analyzed, can obtain more information about space flight foam 1 and space flight foam 2 bondings.
Above-mentioned formation method of the present invention is applicable to adopt difference diode receiving system and the focal plane Real Time Image System of electro-optic sampling detection method.
One of ordinary skill in the art will appreciate that: accompanying drawing is the schematic diagram of an embodiment, and the module in accompanying drawing or flow process might not be that enforcement the present invention is necessary.
One of ordinary skill in the art will appreciate that: the module in the device in embodiment can be described according to embodiment and be distributed in the device of embodiment, also can carry out respective change and be arranged in the one or more devices that are different from the present embodiment.The module of above-described embodiment can be merged into a module, also can further split into a plurality of submodules.
One of ordinary skill in the art will appreciate that: all or part of step that realizes said method embodiment can be completed by the hardware that programmed instruction is correlated with, aforesaid program can be stored in a computer read/write memory medium, this program is carried out the step that comprises said method embodiment when carrying out; And aforesaid storage medium comprises: the various media that can be program code stored such as ROM, RAM, magnetic disc or CD.
It should be noted that at last: above embodiment only in order to technical scheme of the present invention to be described, is not intended to limit; Although with reference to previous embodiment, the present invention is had been described in detail, those of ordinary skill in the art is to be understood that: it still can be modified to the technical scheme that previous embodiment is put down in writing, and perhaps part technical characterictic wherein is equal to replacement; And these modifications or replacement do not make the essence of appropriate technical solution break away from the spirit and scope of embodiment of the present invention technical scheme.