CN113670447A - Method and system for positioning defect position of wireless charging coil - Google Patents
Method and system for positioning defect position of wireless charging coil Download PDFInfo
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- CN113670447A CN113670447A CN202110931560.9A CN202110931560A CN113670447A CN 113670447 A CN113670447 A CN 113670447A CN 202110931560 A CN202110931560 A CN 202110931560A CN 113670447 A CN113670447 A CN 113670447A
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- wireless charging
- charging coil
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- hot spot
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- 230000007547 defect Effects 0.000 title claims abstract description 50
- 238000000034 method Methods 0.000 title claims abstract description 16
- 238000002076 thermal analysis method Methods 0.000 claims abstract description 37
- 230000000737 periodic effect Effects 0.000 claims abstract description 11
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims description 6
- 238000004458 analytical method Methods 0.000 abstract description 9
- 238000009413 insulation Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 230000008707 rearrangement Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000002966 varnish Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/0066—Radiation pyrometry, e.g. infrared or optical thermometry for hot spots detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0077—Imaging
Abstract
The embodiment of the invention discloses a method and a system for positioning the defect position of a wireless charging coil. The method comprises the following steps: firstly, introducing a periodic square wave alternating current signal simulating a coil alternating current signal during wireless charging into a wireless charging coil; and step two, detecting and positioning the position of the hot spot in the wireless charging coil by using a phase-locked infrared thermal analysis microscope, and analyzing the defect of the position of the hot spot in the wireless charging coil. The embodiment of the invention solves the technical problem that the prior art can not carry out positioning analysis on the defect position of the wireless charging coil, can accurately position the defect position of the wireless charging coil, and finds the defects of mu A-level leakage current and micro short circuit of the wireless charging coil, thereby providing powerful technical support for failure analysis of wireless charging products.
Description
Technical Field
The embodiment of the invention relates to a thermal detection technology, in particular to a method and a system for positioning the defect position of a wireless charging coil.
Background
The wireless charging coil is used as one of wireless charging core components and is formed by winding a plurality of turns of insulating copper wires.
The wireless charging coil often because the load is overweight, coil crust insulating properties is poor or insulating paint is ageing to lead to insulating not to play a role under the high temperature and high humidity condition, takes place electric leakage or short circuit fault easily to lead to wireless charging product to become invalid.
Because the coil is formed by winding a plurality of turns of conducting wires, tiny defects are difficult to directly observe, and failure analysis of a wireless charging product is very difficult, so that a method and a system capable of positioning and analyzing the defect position of the wireless charging coil are very necessary to be developed and designed.
Disclosure of Invention
The invention provides a method and a system for positioning the defect position of a wireless charging coil, which can accurately position the defect position of the wireless charging coil and find the defects of mu A-level leakage current and micro short circuit of the wireless charging coil, thereby providing powerful technical support for failure analysis of wireless charging products.
In a first aspect, an embodiment of the present invention provides a method for locating a defect location of a wireless charging coil, including the following steps:
firstly, introducing a periodic square wave alternating current signal simulating a coil alternating current signal during wireless charging into a wireless charging coil;
and step two, detecting and positioning the position of the hot spot in the wireless charging coil by using a phase-locked infrared thermal analysis microscope, and analyzing the defect of the position of the hot spot in the wireless charging coil.
Optionally, a square wave signal is generated by the waveform generator and transmitted to a relay, and then the on-off frequency of the relay is controlled by the test software and output to the wireless charging coil, so that the periodic square wave alternating current signal is conducted into the wireless charging coil.
Optionally, the temperature resolution of the phase-locked infrared thermal analysis microscope is set through test software, the phase-locked infrared thermal analysis microscope is controlled through the test software to acquire a hot spot image of the wireless charging coil, and the hot spot image is analyzed through the test software, so as to locate a hot spot position in the wireless charging coil, which is caused by the μ a-level leakage current and the micro short circuit defect.
In a second aspect, an embodiment of the present invention provides a system for locating a defect location of a wireless charging coil, including:
the signal generating module comprises a signal output end and is used for generating and outputting a square wave signal;
the input end of the signal on-off module is connected with the signal output end of the signal generation module, and the output end of the signal on-off module is connected to the wireless charging coil to be tested;
the phase-locked infrared thermal analysis microscope is used for acquiring a hot spot image of the wireless charging coil to be detected;
the controller is electrically connected with the signal generation module, the signal on-off module and the phase-locked infrared thermal analysis microscope, test software is loaded in the controller, and the controller controls the on-off frequency of the signal on-off module through the test software so as to realize the purpose of introducing periodic square wave alternating current signals simulating coil alternating current signals during wireless charging into the wireless charging coil; and the controller controls the phase-locked infrared thermal analysis microscope to acquire a hot spot image of the wireless charging coil through the test software, and analyzes the hot spot image so as to position a hot spot position in the wireless charging coil.
Optionally, the signal generating module is a waveform generator, and the waveform generator is configured to generate the square wave signal.
Optionally, the output frequency of the waveform generator is 300KHz to 400KHz, and the amplitude of the square wave signal is 5V to 20V.
Optionally, the signal on-off module is a relay.
Optionally, the on-off frequency of the relay is 0.25-5 Hz.
Optionally, the temperature resolution of the phase-locked infrared thermal analysis microscope is 0.001 ℃, and the phase-locked infrared thermal analysis microscope acquires a hot spot image of a hot spot position caused by μ a-level leakage current and a micro short circuit defect.
The embodiment of the invention provides a method and a system for positioning the defect position of a wireless charging coil, which realize the purpose of introducing a periodic square wave alternating current signal simulating a coil alternating current signal during wireless charging into the wireless charging coil by combining a signal generating module and a signal on-off module; the temperature resolution of the phase-locked infrared thermal analysis microscope is set through test software, the phase-locked infrared thermal analysis microscope is controlled through the test software to obtain a hot spot image of the wireless charging coil, the hot spot image is analyzed through the test software, and the positioning of a hot spot position caused by the muA-level leakage current and the micro short circuit defect in the wireless charging coil is achieved. The invention innovatively provides a method and a system for detecting and positioning the position of a hotspot in a wireless charging coil and analyzing the defect of the hotspot in the wireless charging coil, solves the technical problem that the defect position of the wireless charging coil cannot be positioned and analyzed in the prior art, can accurately position the defect position of the wireless charging coil, and finds the micro A-level leakage current and micro short circuit defect of the wireless charging coil, thereby providing powerful technical support for failure analysis of wireless charging products.
Drawings
Fig. 1 is a schematic flowchart illustrating a method for locating a defect location of a wireless charging coil according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a system for locating a defect location of a wireless charging coil according to an embodiment of the present invention;
fig. 3 is a schematic view of a hot spot image captured by a phase-locked infrared thermal analysis microscope according to an embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
Fig. 1 is a schematic flowchart of a method for locating a defect location of a wireless charging coil according to an embodiment of the present invention, and fig. 1 is a schematic flowchart. The embodiment of the invention provides a method for positioning the defect position of a wireless charging coil, which comprises the following steps:
s1: a periodic square wave alternating current signal simulating a coil alternating current signal during wireless charging is conducted into the wireless charging coil;
s2: and detecting and positioning the position of the hot spot in the wireless charging coil by using a phase-locked infrared thermal analysis microscope, and analyzing the defect of the position of the hot spot in the wireless charging coil.
Wherein, when square wave alternating current signal flowed through wireless charging coil, wireless charging coil produced heat, but the point that leads to insulating varnish to age on the wireless charging coil crust insulating properties poor or high temperature and high humidity condition has the electric leakage phenomenon, consequently can lead to the temperature of this point to be showing the temperature that is higher than general position. Therefore, the hot spot position in the wireless charging coil can be detected and positioned by using the phase-locked infrared thermal analysis microscope, and further defect analysis is carried out according to the found hot spot position. The embodiment of the invention solves the technical problem that the prior art can not carry out positioning analysis on the defect position of the wireless charging coil, can accurately position the defect position of the wireless charging coil, and can find the mu A-level leakage current and micro short circuit defects of the wireless charging coil by using the phase-locked infrared thermal analysis microscope, thereby providing powerful technical support for failure analysis of wireless charging products.
In other embodiments, a square wave signal is generated by the waveform generator and transmitted to a relay, and then the on-off frequency of the relay is controlled by the test software and output to the wireless charging coil, so that the periodic square wave alternating current signal is conducted into the wireless charging coil.
The on-off frequency of the relay can be set through test software, and the on-off of the relay is controlled by the test software. The square wave signal generated by the waveform generator can be converted into a square wave alternating current signal through the on-off action of the relay in a circulating manner. The square wave alternating current signal can better simulate the alternating current signal flowing through the wireless charging coil under the normal working state of the wireless charging coil.
In other embodiments, the temperature resolution of the phase-locked infrared thermal analysis microscope is set through test software, the phase-locked infrared thermal analysis microscope is controlled through the test software to acquire a hot spot image of the wireless charging coil, and the hot spot image is analyzed through the test software to locate a hot spot position in the wireless charging coil, which is caused by muA-level leakage current and micro short circuit defects.
The temperature resolution of the phase-locked infrared thermal analysis microscope can be set by a tester through operating test software, and after the test software acquires a hot spot image of the wireless charging coil, the hot spot position can be determined through analyzing the hot spot image. The test software may be any kind of thermal image analysis software for a phase-locked infrared thermal analysis microscope, and the embodiment of the present invention is not limited to a specific version of the software. Since the temperature resolution of the phase-locked infrared thermal analysis microscope can be set sufficiently high, the position of the hot spot due to the μ a-level leakage current and the micro-short defect can be determined.
Fig. 2 is a schematic structural diagram of a system for locating a defect location of a wireless charging coil according to an embodiment of the present invention, referring to fig. 2. The embodiment of the invention provides a system for positioning the defect position of a wireless charging coil, which comprises:
the signal generating module 1, the signal generating module 1 includes the signal output terminal, the signal generating module is used for producing and outputting the square signal;
the input end of the signal on-off module 4 is connected with the signal output end of the signal generation module, and the output end of the signal on-off module 4 is connected to the wireless charging coil 2 to be tested;
the phase-locked infrared thermal analysis microscope 3 is used for acquiring a hot spot image of the wireless charging coil 2 to be detected;
the controller 5 is electrically connected with the signal generating module, the signal on-off module and the phase-locked infrared thermal analysis microscope, test software is loaded in the controller 5, and the controller 5 controls the on-off frequency of the signal on-off module through the test software so as to realize the purpose of introducing periodic square wave alternating current signals simulating coil alternating current signals during wireless charging into the wireless charging coil; and the controller 5 controls the phase-locked infrared thermal analysis microscope to acquire a hot spot image of the wireless charging coil through test software, and analyzes the hot spot image so as to locate the position of a hot spot in the wireless charging coil.
The signal on-off module 4 may be any device capable of switching on and off under the control of the controller 5, and the controller 5 is a device capable of switching on and off the signal on-off module 4 according to loaded test software. The signal generation module 1 is used for outputting signals to the wireless charging coil 2 to be tested, wherein the amplitude and the frequency of the signals can be determined according to actual needs. The waveform of the signal can be a square wave, a rectangular wave, a trapezoidal wave or a step wave. The signal forms an alternating current signal after passing through the signal switching module 4 controlled by the controller 5. Alternating current signal flows through wireless charging coil 2 that awaits measuring, can lead to the wireless charging coil 2 that awaits measuring to generate heat. Especially, at the insulation failure point position of the wireless charging coil 2 to be tested, the heat productivity of the insulation failure point is much larger than that of other normal areas due to electric leakage or short circuit. Therefore, the phase-locked infrared thermal analysis microscope 3 can be used for shooting and analyzing the wireless charging coil 2 to be tested so as to obtain a thermal image of the wireless charging coil 2 to be tested. Alternatively, the temperature resolution of the phase-locked infrared thermal analysis microscope 3 may be set to 0.001 ℃, and a 5 μm resolution lens may be used. The thermal image obtained in the above manner has high resolution. Can accurate know the heat distribution of wireless charging coil under operating condition, provide the basis for follow-up electric leakage or short circuit point analysis of wireless charging coil.
On the basis of the above embodiment, the signal generating module 1 is a waveform generator, and the waveform generator is used for generating a square wave signal.
Wherein a square wave can be generated by a waveform generator. The signal on-off module 4 simulates alternating current required by the normal work of the wireless charging coil 2 to be tested in a mode of supplying direct current intermittently.
On the basis of the previous embodiment, the signal on-off module is a relay.
The relay can be in a conducting or switching-off state by receiving a control signal sent by the controller. Wherein the control signal may be a high level signal or a low level signal.
In other embodiments, the square wave signal has an amplitude of 5-20V.
Wherein, the amplitude of the square wave signal can be determined according to actual needs. For example, the amplitude of the square wave signal may be 10V.
In other embodiments, the output frequency of the waveform generator is 300-400 kHz.
Wherein, the frequency of the waveform generator can be determined according to actual needs. For example, the frequency of the waveform generator may be 360 kHz.
In other embodiments, the on-off frequency of the relay is 0.25-5 Hz.
The on-off frequency of the relay can be determined according to actual needs. For example, the on-off frequency of the relay may be 1 Hz.
In other embodiments, the phase-locked infrared thermal analysis microscope obtains a hotspot image of hotspot locations due to μ a level leakage current and micro-short defects with a temperature resolution of 0.001 ℃.
Wherein adjusting the temperature resolution of the phase-locked infrared thermal analysis microscope to a high level facilitates obtaining accurate thermal images. Thereby facilitating the resolution of the location of the hot spot in the thermal image.
During the in-service use, can connect the input of relay with waveform generator's output, connect wireless charging coil's input with the output of relay, link together waveform generator and wireless charging coil's earthing terminal. And placing the wireless charging coil under a phase-locked infrared thermal analysis microscope, operating test software to detect hot spots, and storing hot spot images. Fig. 3 is a schematic view of a hot spot image captured by a phase-locked infrared thermal analysis microscope according to an embodiment of the present invention, referring to fig. 3. The hot spot image can clearly show the location of the insulation failure point 6.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious modifications, rearrangements, combinations and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (9)
1. A method for locating the defect position of a wireless charging coil is characterized by comprising the following steps:
firstly, introducing a periodic square wave alternating current signal simulating a coil alternating current signal during wireless charging into a wireless charging coil;
and step two, detecting and positioning the position of the hot spot in the wireless charging coil by using a phase-locked infrared thermal analysis microscope, and analyzing the defect of the position of the hot spot in the wireless charging coil.
2. The method for locating the defect position of the wireless charging coil according to claim 1, wherein a square wave signal is generated by a waveform generator and transmitted to a relay, and then the on-off frequency of the relay is controlled by test software and output to the wireless charging coil, so as to realize that the periodic square wave alternating current signal is conducted into the wireless charging coil.
3. The method for locating the defect position of the wireless charging coil according to claim 2, wherein the temperature resolution of the phase-locked infrared thermal analysis microscope is set through test software, the phase-locked infrared thermal analysis microscope is controlled through the test software to acquire a hot spot image of the wireless charging coil, and the hot spot image is analyzed through the test software to locate the hot spot position in the wireless charging coil caused by the μ A-level leakage current and the micro short circuit defect.
4. A system for locating a wireless charging coil defect location, comprising:
the signal generating module comprises a signal output end and is used for generating and outputting a square wave signal;
the input end of the signal on-off module is connected with the signal output end of the signal generation module, and the output end of the signal on-off module is connected to the wireless charging coil to be tested;
the phase-locked infrared thermal analysis microscope is used for acquiring a hot spot image of the wireless charging coil to be detected;
the controller is electrically connected with the signal generation module, the signal on-off module and the phase-locked infrared thermal analysis microscope, test software is loaded in the controller, and the controller controls the on-off frequency of the signal on-off module through the test software so as to realize the purpose of introducing periodic square wave alternating current signals simulating coil alternating current signals during wireless charging into the wireless charging coil; and the controller controls the phase-locked infrared thermal analysis microscope to acquire a hot spot image of the wireless charging coil through the test software, and analyzes the hot spot image so as to position a hot spot position in the wireless charging coil.
5. The system for locating wireless charging coil defect locations according to claim 4, wherein the signal generating module is a waveform generator for generating the square wave signal.
6. The system for locating wireless charging coil defect locations according to claim 5, wherein the output frequency of the waveform generator is 300KHz-400KHz and the amplitude of the square wave signal is 5-20V.
7. The system for locating the defect location of a wireless charging coil according to claim 4, wherein the signal on-off module is a relay.
8. The system for locating the defect location of a wireless charging coil according to claim 7, wherein the on-off frequency of the relay is 0.25-5 Hz.
9. The system for locating the defect location of a wireless charging coil according to claim 4, wherein the temperature resolution of the phase-locked infrared thermal analysis microscope is 0.001 ℃, and the phase-locked infrared thermal analysis microscope acquires the hot spot image of the hot spot location due to the μ A level leakage current and the micro short circuit defect.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110931560.9A CN113670447A (en) | 2021-08-13 | 2021-08-13 | Method and system for positioning defect position of wireless charging coil |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202110931560.9A CN113670447A (en) | 2021-08-13 | 2021-08-13 | Method and system for positioning defect position of wireless charging coil |
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| CN202110931560.9A Pending CN113670447A (en) | 2021-08-13 | 2021-08-13 | Method and system for positioning defect position of wireless charging coil |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150316496A1 (en) * | 2012-11-27 | 2015-11-05 | Korea Basic Science Institute | Device and method for analyzing defects by using heat distribution measurement |
| CN105301093A (en) * | 2015-10-21 | 2016-02-03 | 北京原力辰超导技术有限公司 | Superconducting coil flaw position detecting system |
| CN109532525A (en) * | 2018-12-06 | 2019-03-29 | 四川兴华福科技有限公司 | A kind of charge control method, wireless charging emitter and reception device |
| CN111823916A (en) * | 2019-04-18 | 2020-10-27 | 华为技术有限公司 | Wireless charging alignment method and device, wireless charging system and electric vehicle |
-
2021
- 2021-08-13 CN CN202110931560.9A patent/CN113670447A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150316496A1 (en) * | 2012-11-27 | 2015-11-05 | Korea Basic Science Institute | Device and method for analyzing defects by using heat distribution measurement |
| CN105301093A (en) * | 2015-10-21 | 2016-02-03 | 北京原力辰超导技术有限公司 | Superconducting coil flaw position detecting system |
| CN109532525A (en) * | 2018-12-06 | 2019-03-29 | 四川兴华福科技有限公司 | A kind of charge control method, wireless charging emitter and reception device |
| CN111823916A (en) * | 2019-04-18 | 2020-10-27 | 华为技术有限公司 | Wireless charging alignment method and device, wireless charging system and electric vehicle |
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Application publication date: 20211119 |