CN113655254A - Test fixture for components to be tested - Google Patents

Abstract

The application discloses a test fixture for components and parts that await measuring, including upper cover and lower cover, be equipped with the recess that the middle components and parts that can await measuring between upper cover and the lower cover, on cover corresponding to the position of components and parts that await measuring is equipped with shell fragment structure, shell fragment structure is electrically conductive material, shell fragment structure follows the peripheral orientation of upper cover the center of upper cover extends, so that work as when upper cover and lower cover lid close shell fragment structure can with the device that awaits measuring in the recess contacts. Through adopting above-mentioned structure, when the components and parts that await measuring test, except the position of shell fragment structure and the components and parts contact that await measuring, all the other positions do not bear pressure, and shell fragment structure has reduced the torsion of exerting on the components and parts that await measuring, has realized electrical connection again simultaneously, makes this tool become a harmless test fixture, has greatly reduced the breakage rate that produces when the components and parts that await measuring test.

Description

Test fixture for components to be tested

Technical Field

The invention relates to the field of testing devices, in particular to a testing jig for a component to be tested.

Background

In the existing test of components, especially semiconductor components and circuit board structures, in order to ensure better contact performance, a probe jig is generally adopted, that is, a probe is contacted with a bonding pad of a component to be tested to form a test circuit. Because the semiconductor component is a precise component and is very sensitive to stress, the use of a probe for directly pressing a bonding pad of the component is easy to generate torsion, the deformation and the damage of the component to be tested are caused, the semiconductor component cannot be used for the second time after the test, and the rejection rate is particularly high.

Disclosure of Invention

In order to solve the problems existing in the prior art, the purpose of the application is to provide a nondestructive testing device which does not damage components to be tested.

The invention provides a test fixture for a component to be tested, which comprises an upper cover and a lower cover, wherein a groove capable of accommodating the component to be tested is arranged between the upper cover and the lower cover, a spring plate structure is arranged on the upper cover corresponding to the component to be tested and is made of a conductive material, and the spring plate structure extends from the periphery of the upper cover to the center of the upper cover, so that the spring plate structure can be in contact with the component to be tested in the groove when the upper cover and the lower cover are closed.

In a preferred embodiment, the elastic sheet structure comprises an elastic sheet and a gasket, the end point of the elastic sheet has a height difference with the plane where the gasket is located, and the end part of the elastic sheet is in contact with the component to be tested. When the end of the elastic sheet is in contact with the component to be tested, the acting force applied to the component to be tested can be automatically rebounded and adjusted within the height difference range, so that overlarge torsion on the component to be tested is avoided.

Preferably, the elastic sheet and the gasket are not on the same plane. The oblique pressing mode is adopted between the elastic sheet structure and the component to be tested, so that the pressure generated on the component to be tested is small, the structure is simple, and the processing is convenient.

Preferably, the elastic sheet and the gasket are on the same plane, and a bending part is arranged at the end part of the elastic sheet. The spring plate structure and the bonding pad are in a direct-pressing mode, and the contact between the spring plate structure and the component to be tested is good.

In a preferred embodiment, a pressing structure is disposed on the upper cover at a position corresponding to the elastic sheet to adjust a contact distance between the elastic sheet and the device to be tested. The contact state of the elastic sheet and the component to be tested is always kept when the test is carried out.

In a preferred embodiment, a through pin hole is formed in a position of the lower cover or the upper cover corresponding to the elastic sheet structure, and when a probe is inserted into the pin hole, the probe is electrically connected with the elastic sheet structure or the component to be tested. The probe is inserted from the pin hole and is conducted after contacting with the elastic sheet or the component to be detected, and the contact pressure of the probe on the component to be detected is reduced.

Preferably, the elastic sheet structure is in bilateral symmetry contact with the component to be tested, and the probe is inserted into the pin inserting hole to press the elastic sheet structure, so that two sides of the component to be tested are electrically connected with the probe through the elastic sheet structure. The probe is not in direct contact with the component to be detected, but is in contact with the component to be detected through the elastic sheet structure, so that the contact pressure on the component to be detected is reduced.

Preferably, one side of the component to be tested is in contact with the elastic sheet structure, and then is inserted from a pin hole on the lower cover corresponding to the elastic sheet structure through a probe to be electrically connected; the other side of the component to be tested is inserted into the pin hole on the upper cover through the probe to be in direct contact with the pin hole for electrical connection. When only one side of the component to be tested is in direct contact with the probe, the torsional force and deformation cannot be generated, and meanwhile, the good contact property of the probe is fully utilized.

In a preferred embodiment, two outer end faces of the lower cover or the upper cover in the horizontal direction are respectively embedded into a circuit board, a connecting hole connected with the pin hole is formed in the circuit board, and when the upper cover and the lower cover are closed, the probe is inserted into the pin hole and presses against the gasket, so that the component to be tested is electrically connected with the circuit board and the probe through the elastic sheet structure. The circuit board and the jig are integrated together, and the performance of the assembled components can be detected.

In a preferred embodiment, the test fixture is externally connected with the circuit board by a surface etching pad or a flexible-rigid combination board through the elastic sheet. Under the condition that the circuit board is separated from the jig, external connecting wires are correspondingly added in the condition that component assembly testing is required by adding an etching pad or an external connecting mode.

The invention discloses a test fixture for a component to be tested, which comprises an upper cover and a lower cover, wherein a groove capable of accommodating the component to be tested is arranged between the upper cover and the lower cover, a spring plate structure is arranged on the upper cover corresponding to the component to be tested and is made of conductive materials, and the spring plate structure extends from the periphery of the upper cover to the center of the upper cover, so that the spring plate structure can be contacted with the component to be tested in the groove when the upper cover and the lower cover are closed. Through adopting above-mentioned structure, when the components and parts that await measuring test, except the position of shell fragment structure and the components and parts contact that await measuring, all the other positions do not bear pressure, and shell fragment structure has reduced the torsion of exerting on the components and parts that await measuring, has realized electrical connection again simultaneously, makes this tool become a harmless test fixture, has greatly reduced the breakage rate that produces when the components and parts that await measuring test.

Drawings

Figures 1-4 are included to provide a further understanding of the embodiments and are incorporated into and constitute a part of this specification. The drawings illustrate embodiments and together with the description serve to explain the principle of operation of the invention. Other embodiments and many of the intended advantages of embodiments will be readily appreciated as they become better understood by reference to the following detailed description. The elements of the drawings are not necessarily to scale relative to each other. Like reference numerals designate corresponding similar parts.

Fig. 1 is a schematic structural diagram (non-conducting state) of a test fixture for a device under test according to an embodiment of the present invention;

fig. 2 is a schematic structural diagram (on state) of a test fixture for a device under test according to an embodiment of the present invention;

fig. 3 is a schematic view of a bias-pressing type spring structure according to an embodiment of the invention;

fig. 4 is a schematic diagram of a direct-pressure type spring structure according to an embodiment of the invention;

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention clearer, the present invention will be described in further detail with reference to the accompanying drawings, and it is apparent that the described embodiments are only a part of the embodiments of the present invention, not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

The present invention will be described in detail below with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be noted that, for convenience of description, only the portions related to the present invention are shown in the drawings.

It should be noted that, in the present application, the embodiments and the technical features in the embodiments may be combined with each other without conflict.

As shown in fig. 1 and 2, the invention provides a test fixture for a component to be tested, which includes an upper cover 1 and a lower cover 2, wherein a groove 3 is provided between the upper cover 1 and the lower cover 2, the middle of the groove is capable of accommodating the component to be tested 4, a spring structure 5 is provided on the upper cover 1 corresponding to the component to be tested 4, the spring structure 5 is made of a conductive material, and the spring structure 5 extends from the periphery of the upper cover 1 toward the center of the upper cover 1, so that the spring structure 5 can contact the component to be tested 4 in the groove 3 when the upper cover 1 and the lower cover 2 are closed.

By adopting the structure, the component 4 to be tested is arranged in the groove 3 between the upper cover and the lower cover, when the upper cover 1 and the lower cover 2 are covered, the contact with the component to be tested is carried out and the electrical connection is carried out through the elastic sheet structure 5, only the contact part of the component 4 to be tested bears less pressure, the rest part does not bear pressure, the torsion force and the deformation can not be generated, and therefore the nondestructive testing can be realized.

The test fixture is suitable for components sensitive to stress and easy to deform, in particular to optical filter devices, and in the invention, if the component to be tested is an optical filter device, the upper cover 1 of the fixture is also required to be correspondingly provided with a light through hole 11 corresponding to the position of the light through hole in the optical filter device 4 to be tested; meanwhile, the elastic sheet structure 5 is in contact with and electrically connected with a bonding pad of the optical filter device 4 to be tested.

The jig is also suitable for batch testing, for example, the test jig is used as a test unit to be arranged into an array, the control device is used for completing the process of closing the upper cover to the lower cover and carrying out unified testing, and the test efficiency of the product can be greatly improved.

In a specific embodiment, as shown in fig. 3 to 4, the elastic sheet structure 5 includes an elastic sheet 51 and a pad 52, a height difference exists between an end of the elastic sheet 51 and a plane where the pad 52 is located, and an end of the elastic sheet 51 is in contact with the component 4 to be tested. When the end of the elastic sheet 51 contacts with the component 4 to be tested, the acting force applied to the component 4 to be tested can be automatically adjusted in a rebound mode within the height difference range, and therefore overlarge torsion force generated on the component to be tested is avoided.

The elastic sheet 51 has elasticity, can be a thin sheet metal, or a single or double metal needle with a smaller diameter, can rebound within the range of height difference, and ensures better contact.

Be equipped with fixed orifices 53 on the gasket, close through the screw and fix shell fragment structure 5 on upper cover 1, it is corresponding, the position department that corresponds fixed orifices 53 on the lower cover 2 is equipped with dodges hole 6 to the interference of screw when avoiding upper and lower lid to close.

In a specific embodiment, as shown in fig. 3, the elastic sheet 51 and the gasket 52 are not on the same plane. The oblique pressing mode is adopted between the elastic sheet structure and the component to be tested, so that the pressure generated on the component to be tested is small, the structure is simple, and the processing is convenient.

In a specific embodiment, as shown in fig. 4, the elastic sheet 51 and the gasket 52 are on the same plane, and a bent portion 510 is disposed at an end of the elastic sheet 51. The spring plate structure in the form is in a direct-voltage mode with the component to be tested, and the contact between the spring plate structure and the component to be tested is good.

In a specific embodiment, as shown in fig. 2, a pressing structure 7 is disposed on the upper cover at a position corresponding to the elastic sheet to adjust a contact distance between the elastic sheet 51 and the device 4 to be tested. When the upper cover 1 and the lower cover 2 are closed, if the contact of the component 4 to be tested is found to be poor, the elastic sheet 51 can be contacted with the component 4 to be tested by downwards pressing the pressing structure 7 arranged on the upper cover 1 through adjustment, so that the elastic sheet 51 and the component 4 to be tested are always kept in a contact state when the test is carried out.

The abutting structure 7 can adopt a screw or a pressing block, a pressure spring and other structures which can adjust the vertical distance. Under the condition of single test, the screw adjustment is more convenient; if the test is a batch test, a pressing block or a pressing spring and the like are used preferably.

In a specific embodiment, as shown in fig. 1-2, a through pin hole 8 is disposed at a position of the lower cover 2 or the upper cover 1 corresponding to the elastic sheet structure 5, and when a probe 9 is inserted into the pin hole 8, the probe is electrically connected to the elastic sheet structure 5 or the device 4 to be tested. The probe 9 is in contact with the elastic sheet structure 5 or the component 4 to be tested, so that the component 4 to be tested is conducted with an external testing instrument.

In a specific embodiment, as shown in fig. 1, the elastic sheet structure 5 is in bilateral symmetry contact with the device to be tested 4, and the probe 9 is inserted into the pin hole 8 and presses against the elastic sheet structure 5, so that both sides of the device to be tested 4 are electrically connected with the probe 9 through the elastic sheet structure 5. In this form, the probe 9 is not directly contacted with the device 4 to be tested, but is electrically connected with the device 4 to be tested through the elastic sheet structure 5, so that the pressure on the device to be tested is minimum.

In this case, there are two schemes for testing the circuit.

The probe 9 is inserted into the elastic sheet structure 5 which is pressed against two sides of the component to be tested 4 from the pin hole of the lower cover 2, the probe 9 is inserted into the elastic sheet structure 5 which is pressed against two sides of the component to be tested 4 from the pin hole of the upper cover 1, the implementation effects of the two schemes are the same, and the two schemes are specifically arranged according to the application environment during actual testing.

In a specific embodiment, one side of the component 4 to be tested is in contact with the elastic sheet structure 5, and then is inserted from the pin hole 8 on the lower cover 2 corresponding to the elastic sheet structure 5 through the probe 9 for electrical connection; the other side of the component 4 to be tested is inserted into the pin hole 8 on the upper cover 1 through the probe 9 for direct contact and electrical connection.

In view of the good contact and large pressure of the probe, the small pressure and poor contact of the elastic sheet, and the torsional deformation of the two sides of the component to be tested only under the condition of simultaneously using the probe, therefore, the elastic sheet structure is used for contacting one side of the component to be tested 4, and the probe is used for directly contacting the other side of the component to be tested, so that the good contact performance can be ensured without deformation.

In a specific embodiment, the circuit board and the jig may be integrated together. The circuit board 10 is embedded into two outer end faces of the lower cover 2 or the upper cover 1 in the horizontal direction, a connecting hole connected with the pin hole 8 is formed in the circuit board 10, and when the upper cover 1 and the lower cover 2 are covered, the probe 9 is inserted into the pin hole 8 and pushes against the gasket 52, so that the component 4 to be tested is electrically connected with the circuit board 10 and the probe 9 through the elastic sheet structure 5. The circuit board and the jig are integrated together, and the performance of the assembled components can be detected.

In a specific embodiment, the circuit board and the jig can be separated. The test fixture is connected with the outside of the circuit board through the surface etching bonding pad or the elastic sheet by adopting a soft-hard combination board. In the form, the device to be tested can be tested independently, and the performance of the assembled device can be detected through the externally-connected circuit board.

The test fixture for the components to be tested comprises an upper cover and a lower cover, wherein a groove capable of accommodating the components to be tested is formed in the middle of the upper cover and the lower cover, a spring plate structure is arranged on the upper cover corresponding to the components to be tested and is made of conductive materials, and the spring plate structure extends towards the center of the upper cover from the periphery of the upper cover so as to be capable of contacting with the components to be tested in the groove when the upper cover and the lower cover are closed. Through adopting above-mentioned structure, when the components and parts that await measuring test, except the position of shell fragment structure and the components and parts contact that await measuring, all the other positions do not bear pressure, and shell fragment structure has reduced the torsion of exerting on the components and parts that await measuring, has realized electrical connection again simultaneously, makes this tool become a harmless test fixture, has greatly reduced the breakage rate that produces when the components and parts that await measuring test.

While the principles of the invention have been described in detail in connection with specific embodiments thereof, it will be understood by those skilled in the art that the foregoing embodiments are merely illustrative of exemplary implementations of the invention and are not limiting of the scope of the invention. The details of the embodiments are not to be interpreted as limiting the scope of the invention, and any obvious changes, such as equivalent alterations, simple substitutions and the like, based on the technical solution of the invention, can be interpreted without departing from the spirit and scope of the invention.

Claims (10)

1. The utility model provides a test fixture for components and parts that await measuring, its characterized in that, includes upper cover and lower cover, be equipped with the recess that the middle part can hold the components and parts that await measuring between upper cover and the lower cover, on cover corresponding to the position of the components and parts that await measuring is equipped with the shell fragment structure, the shell fragment structure is electrically conductive material, the shell fragment structure is followed the peripheral orientation of upper cover the center of upper cover extends, so that work as when upper cover and lower cover lid close the shell fragment structure can with the device that await measuring in the recess contacts.

2. The test fixture for the components to be tested according to claim 1, wherein the spring structure comprises a spring and a gasket, and the end point of the spring has a height difference with the plane of the gasket.

3. The test fixture for the components to be tested according to claim 2, wherein the spring pieces and the gaskets are not on the same plane.

4. The test fixture for the components to be tested according to claim 2, wherein the elastic sheet and the gasket are on the same plane, and a bending part is arranged at an end of the elastic sheet.

5. The test fixture for the components to be tested according to claim 3 or 4, wherein a pressing structure is arranged on the upper cover at a position corresponding to the elastic sheet so as to adjust a contact distance between the elastic sheet and the components to be tested.

6. The test fixture for the components to be tested according to claim 5, wherein a through pin hole is formed in the position, corresponding to the spring structure, of the lower cover or the upper cover, and when a probe is inserted into the pin hole, the probe is electrically connected with the spring structure.

7. The test fixture for the components to be tested according to claim 6, wherein the spring structure is in bilateral symmetry contact with the components to be tested, and the probes are inserted into the pin holes to press against the spring structure, so that both sides of the components to be tested are electrically connected with the probes through the spring structures.

8. The test fixture for the components to be tested according to claim 6, wherein one side of the components to be tested is in contact with the spring structure and then is electrically connected by inserting a probe from a pin hole on the lower cover corresponding to the spring structure; the other side of the component to be tested is inserted into the pin hole on the upper cover through the probe to be in direct contact with the pin hole for electrical connection.

9. The test fixture for components to be tested according to claim 7, wherein two outer end surfaces of the lower cover in the horizontal direction are respectively embedded into a circuit board, a connecting hole connected with the pin hole is formed in the circuit board, and when the upper cover and the lower cover are closed, the probe is inserted into the pin hole and presses against the gasket, so that the components to be tested are electrically connected with the circuit board and the probe through a spring structure.

10. The test fixture for the components to be tested according to claim 7, wherein the test fixture is externally connected with the circuit board through a surface etching pad or the spring plate by using a soft-hard combination board.

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