CN113655252A - Low resistance test needle - Google Patents
Low resistance test needle Download PDFInfo
- Publication number
- CN113655252A CN113655252A CN202111081416.7A CN202111081416A CN113655252A CN 113655252 A CN113655252 A CN 113655252A CN 202111081416 A CN202111081416 A CN 202111081416A CN 113655252 A CN113655252 A CN 113655252A
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- China
- Prior art keywords
- needle
- test
- low resistance
- resistance test
- adjusting block
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- Pending
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- 238000012360 testing method Methods 0.000 title claims abstract description 82
- 238000000034 method Methods 0.000 abstract description 7
- 238000005516 engineering process Methods 0.000 description 5
- 239000000306 component Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000011161 development Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000012536 packaging technology Methods 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention discloses a low resistance test needle, comprising: the testing device comprises a four-way adjusting block, a testing device and a testing device, wherein two adjacent side walls of the four-way adjusting block are respectively and movably connected with an elastic plastic card, and the end part of the elastic plastic card is connected with a testing needle; the two test needles face to the same direction and form a certain included angle, and the distance between the needle points is 12-40 mu m; the four-way adjusting block is rotationally connected to a connecting plate, and a needle seat fixing seat is further connected to the connecting plate; the diameter of the needle point used by the low-resistance test needle is smaller, the test of a high-precision pcb can be met, and the probability of the deflection of the test needle is smaller; the test needle is easier to adjust, and the setting of multi-directional adjustment enables the process of manual adjustment to be simpler and more efficient. The rejection rate of the test needle is lower than that of the prior test needle; the maintainability is better, if the condition that has the interval grow in later stage use, can put into use by the simple debugging of professional, need not to return the factory and reassemble the adjustment.
Description
Technical Field
The invention relates to the field of PCB detection equipment, in particular to a low-resistance test needle.
Background
Today, as electronic information technology is rapidly developed, various electronic devices cannot be separated from their core component, i.e., IC chip. With the advent of the 5G era and the integration of IC devices becoming higher, mounting technology has transitioned from the package-in-package (THT) technology to the surface mount technology, and chip scale packaging technology has become common. Meanwhile, due to the development requirement of communication technology, high-speed transmission of signals is required, and the PCB is used as a main carrier for transmitting signals, so that the development of the PCB to High Density (HDI) is inevitable, the precision of a medium-high-order HDI board, a Micro LED board and a smart phone board in the market at present is extremely high, and the measurement of low resistance is required, and the traditional test needle cannot meet the measurement precision under the low resistance measurement condition.
Most of the existing low-resistance test needles are in a blade form, and the needle point of the test needle is thicker due to the combination of two blades. The blade is installed to the elastic plastic part, and the plastic part is fixed on the needle stand test seat. The adjustment of the distance and the height difference of the needle points of the low-resistance test needle is difficult to complete in one step and needs to be manually adjusted under a microscope. After the adjustment is finished, glue is used for packaging to maintain the adjusted state of the test needle, so that the test needle is not easy to deform. Meanwhile, the needle point of the low-resistance test needle is thick (the distance between the needle points is more than 40 mu m generally), and the test cannot be carried out on a high-precision and ultra-small bonding pad; the two-knife type test needle has high processing cost, poor processing consistency and high maintenance cost; the adjustment and control of the distance between the test needles are difficult, and the rejection rate is high.
Disclosure of Invention
In order to solve the problems, the invention provides the low-resistance test needle which is convenient to adjust and has better accuracy.
In order to achieve the purpose, the invention provides the technical scheme that: a low resistance test pin comprising: the testing device comprises a four-way adjusting block, a testing device and a testing device, wherein two adjacent side walls of the four-way adjusting block are respectively and movably connected with an elastic plastic card, and the end part of the elastic plastic card is connected with a testing needle; the two test needles face to the same direction and form a certain included angle, and the distance between the needle points is 12-40 mu m; the four-way adjusting block is rotatably connected to the connecting plate, and the connecting plate is further connected with a needle seat fixing seat.
As a preferred technical scheme, one end of the test needle is a pointed end, and the other end of the test needle is a round end.
Preferably, the four-direction adjusting block is a triangular prism.
Preferably, the elastic plastic card is provided with a plurality of fixing holes in parallel in the extending direction.
As a preferred technical scheme, the elastic plastic card is movably connected to the four-way adjusting block through a miniature baffle.
As a preferable technical scheme, a waist-shaped hole is formed in one side, close to the test needle, of the elastic plastic card, and the waist-shaped hole is used for adjusting the position of the test needle.
As a preferred technical scheme, adjusting screws are mounted on the four-way adjusting blocks, and the distance between the testing pins and the height difference of the testing pins are adjusted through the adjusting screws.
Compared with the prior art, the invention has the beneficial effects that: the circular test needle has low cost, the diameter of the needle tip is smaller (the minimum diameter can reach 12 mu m), the test of a high-precision pcb can be met, and the probability of the test needle to be pricked to be deviated is smaller.
The test needle is easier to adjust, and the setting of multi-directional adjustment enables the process of manual adjustment to be simpler and more efficient. The rejection rate of the test needle is lower than that of the prior test needle.
The maintainability is better, if the condition that has the interval grow in later stage use, can put into use by the simple debugging of professional, need not to return the factory and reassemble the adjustment.
Drawings
FIG. 1 is a block diagram of one of the viewing angles for a low resistance test provided by the present invention;
fig. 2 is a structural view of another view of a low resistance test pin according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As used in this application and the appended claims, the terms "a," "an," "the," and/or "the" are not intended to be inclusive in the singular, but rather are intended to be inclusive in the plural unless the context clearly dictates otherwise. In general, the terms "comprises" and "comprising" merely indicate that steps and elements are included which are explicitly identified, that the steps and elements do not form an exclusive list, and that a method or apparatus may include other steps or elements.
The relative arrangement of the components and steps, the numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the present application unless specifically stated otherwise. Meanwhile, it should be understood that the sizes of the respective portions shown in the drawings are not drawn in an actual proportional relationship for the convenience of description. Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate. In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values. It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.
It should be noted that the terms "first", "second", and the like are used to define the components, and are only used for convenience of distinguishing the corresponding components, and the terms have no special meanings unless otherwise stated, and therefore, the scope of protection of the present application is not to be construed as being limited. Further, although the terms used in the present application are selected from publicly known and used terms, some of the terms mentioned in the specification of the present application may be selected by the applicant at his or her discretion, the detailed meanings of which are described in relevant parts of the description herein. Further, it is required that the present application is understood not only by the actual terms used but also by the meaning of each term lying within.
Referring to fig. 1 and 2, the present embodiment provides a low resistance test pin including: a four-direction adjusting block 10, in this embodiment, the four-direction adjusting block 10 is a triangular prism
Two adjacent side walls of the four-way adjusting block 10 are respectively and movably connected with an elastic plastic card 20, the end part of the elastic plastic card 20 is connected with a testing needle 30, one end of the testing needle 30 is a pointed end, and the other end of the testing needle is a round head.
The two test needles 30 face to the same direction, a certain included angle is formed between the two test needles, and the distance between the needle points is 12-40 mu m; the four-way adjusting block 10 is rotatably connected to the connecting plate 40, and the connecting plate 40 is further connected with a needle seat fixing seat 50.
Further, a plurality of fixing holes 201 are formed in parallel in the extending direction of the elastic plastic card 20. The elastic plastic card 20 is movably connected to the four-way adjusting block 10 through a miniature baffle 60.
A waist-shaped hole 202 is formed in one side of the elastic plastic card 20 close to the test needle 30, and the waist-shaped hole 20 is used for adjusting the position of the test needle 30.
The four-way adjusting block 10 is provided with an adjusting screw 101, and the distance between the testing needles and the height difference of the testing needles are adjusted through the adjusting screw 101.
The round test needle of the low-resistance test needle has low cost, the diameter of the needle tip is smaller (the minimum diameter can reach 12 mu m), the test of a high-precision pcb can be met, and the probability of the deflection of the test needle is smaller. The test needle is easier to adjust, and the setting of multi-directional adjustment enables the process of manual adjustment to be simpler and more efficient. The rejection rate of the test needle is lower than that of the prior test needle. The maintainability is better, if the condition that has the interval grow in later stage use, can put into use by the simple debugging of professional, need not to return the factory and reassemble the adjustment.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes performed by the present specification and drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (7)
1. A low resistance test pin, comprising: the testing device comprises a four-way adjusting block, a testing device and a testing device, wherein two adjacent side walls of the four-way adjusting block are respectively and movably connected with an elastic plastic card, and the end part of the elastic plastic card is connected with a testing needle; the two test needles face to the same direction and form a certain included angle, and the distance between the needle points is 12-40 mu m; the four-way adjusting block is rotatably connected to the connecting plate, and the connecting plate is further connected with a needle seat fixing seat.
2. The low resistance test pin according to claim 1, wherein: one end of the test needle is a pointed end, and the other end of the test needle is a round head.
3. The low resistance test pin according to claim 1, wherein: the four-way adjusting block is in a triangular prism shape.
4. The low resistance test pin according to claim 1, wherein: a plurality of fixing holes are formed in the extending direction of the elastic plastic card in parallel.
5. The low resistance test pin according to claim 4, wherein: the elastic plastic card is movably connected to the four-way adjusting block through a miniature baffle.
6. The low resistance test pin according to claim 1, wherein: one side of the elastic plastic card close to the test needle is provided with a waist-shaped hole, and the waist-shaped hole is used for adjusting the position of the test needle.
7. The low resistance test pin according to claim 1, wherein: and adjusting screws are arranged on the four-way adjusting blocks, and the distance between the testing needles and the height difference of the testing needles are adjusted through the adjusting screws.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111081416.7A CN113655252A (en) | 2021-09-15 | 2021-09-15 | Low resistance test needle |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111081416.7A CN113655252A (en) | 2021-09-15 | 2021-09-15 | Low resistance test needle |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113655252A true CN113655252A (en) | 2021-11-16 |
Family
ID=78494016
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111081416.7A Pending CN113655252A (en) | 2021-09-15 | 2021-09-15 | Low resistance test needle |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113655252A (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103513069A (en) * | 2012-06-21 | 2014-01-15 | 深圳麦逊电子有限公司 | Test probe device |
| CN205507027U (en) * | 2016-04-08 | 2016-08-24 | 昆山兢美电子科技有限公司 | Prong testing arrangement |
| CN205507026U (en) * | 2016-04-08 | 2016-08-24 | 昆山兢美电子科技有限公司 | Easily change knife needle testing arrangement |
| CN207408450U (en) * | 2017-10-17 | 2018-05-25 | 深圳市科鑫源电子有限公司 | testing needle module |
| CN207662931U (en) * | 2017-11-03 | 2018-07-27 | 深圳市三浦半导体有限公司 | A kind of LED lamp bead test fixture |
-
2021
- 2021-09-15 CN CN202111081416.7A patent/CN113655252A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103513069A (en) * | 2012-06-21 | 2014-01-15 | 深圳麦逊电子有限公司 | Test probe device |
| CN205507027U (en) * | 2016-04-08 | 2016-08-24 | 昆山兢美电子科技有限公司 | Prong testing arrangement |
| CN205507026U (en) * | 2016-04-08 | 2016-08-24 | 昆山兢美电子科技有限公司 | Easily change knife needle testing arrangement |
| CN207408450U (en) * | 2017-10-17 | 2018-05-25 | 深圳市科鑫源电子有限公司 | testing needle module |
| CN207662931U (en) * | 2017-11-03 | 2018-07-27 | 深圳市三浦半导体有限公司 | A kind of LED lamp bead test fixture |
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