CN209460389U - Semiconductor test machine calibrating installation - Google Patents
Semiconductor test machine calibrating installation Download PDFInfo
- Publication number
- CN209460389U CN209460389U CN201822161718.5U CN201822161718U CN209460389U CN 209460389 U CN209460389 U CN 209460389U CN 201822161718 U CN201822161718 U CN 201822161718U CN 209460389 U CN209460389 U CN 209460389U
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- CN
- China
- Prior art keywords
- slot
- pedestal
- motion bar
- test machine
- semiconductor test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses semiconductor test machine calibrating installations, including pedestal, through slot is offered at the top of the pedestal, two sides inside the through slot slidably connect motion bar, top in the middle part of the through slot was provided with line set, it the motion bar and crosses between line set and is provided with connection structure, the top of the pedestal and front and rear sides for being located at through slot are provided with fixed structure.The utility model passes through pedestal, through slot, motion bar, the setting for crossing line set, connection structure, fixed structure and pin configuration, it can be convenient and activity adjustment is carried out to device, it solves simultaneously in the loss of test access, power probe is connected by radio frequency line with this access end, radio frequency line is partially in hanging free state, it is easy artificially not noticed that touching or external force are pullled, the problem of influencing test result, the semiconductor test machine calibrating installation, have advantage that can be fixed to radio frequency line, is worthy to be popularized.
Description
Technical field
The utility model relates to semiconductor detection technique fields, specially semiconductor test machine calibrating installation.
Background technique
Semiconductor refers to material of the electric conductivity between conductor and insulator under room temperature, and semiconductor is in radio, TV
It has a wide range of applications on machine and thermometric, if diode is exactly the device using semiconductor fabrication, semiconductor refers to that one kind is led
Electrically can be controlled, range can from insulator to the material between conductor, no matter from science and technology or economic development from the perspective of,
The importance of semiconductor be all it is very huge, today most electronic product, as computer, mobile phone or number record
Core cell in sound machine all has extremely close connection with semiconductor, and common semiconductor material has silicon, germanium, GaAs
Deng, and silicon is even more most influential one kind in business application in various semiconductor materials.
Engineer has a calibration steps when debugging semiconductor test machine program, for measuring the damage of power in the line
Then consumption is compensated the loss measured by program so that test can smoothly complete, in the loss of test access, general
Power probe is connected by radio frequency line with this access end, and radio frequency line is partially in hanging free state, is easy artificial
Do not notice that touching or external force are pullled, influence test result, proposes that one kind can solve the fixed device of radio frequency line thus
This problem.
Utility model content
The purpose of this utility model is to provide semiconductor test machine calibrating installation, having can be to the excellent of radio frequency line fixation
Point is solved in the loss of test access, and power probe is connected by radio frequency line with this access end, radio frequency line part
In hanging free state, it is easy artificially not paid attention to the problem of touching or external force pull, influence test result.
To achieve the above object, the utility model provides the following technical solutions: semiconductor test machine calibrating installation, including bottom
, through slot is offered at the top of the pedestal, the two sides inside the through slot slidably connect motion bar, the through slot middle part
Top be provided with line set, the motion bar and cross between line set and be provided with connection structure, the top of the pedestal and be located at
The front and rear sides of through slot are provided with fixed structure, and front and the back side of the pedestal are provided with pin configuration.
Preferably, the two sides of the pedestal are fixedly connected to mounting plate, and the quantity of the mounting plate is four, the peace
The surface of loading board offers mounting hole.
Preferably, the connection structure includes linking arm, and a part of the linking arm is located at the inside of through slot, the company
The both ends for connecing arm have been respectively fixedly connected with the first lantern ring and the second lantern ring, first lantern ring be located at the outer surface of line set and with
It crosses line set to be flexibly connected, second lantern ring is located at the outer surface of motion bar and is flexibly connected with motion bar.
Preferably, the fixed structure includes limiting slot, and the limiting slot is provided with the front and rear sides of through slot, the limit
The internal slide of slot is connected with limited block, and the limited block is fixedly connected with motion bar, and the surface of the limited block offers recessed
Slot, is provided with positioning pin at the top of the pedestal, and the bottom end of the positioning pin is through pedestal and extends to the inside of groove.
Preferably, the pin configuration includes extension board, and the extension board is fixedly connected with pedestal, the top of the extension board
Portion is fixedly connected with fixed ear, and the quantity of the fixed ear is several, and the extension board was offered far from one end of pedestal
Wire casing.
Compared with prior art, the beneficial effects of the utility model are as follows:
1, the utility model passes through pedestal, through slot, motion bar, crosses line set, connection structure, fixed structure and pin configuration
Setting can be convenient and carry out activity adjustment to device, while solving in the loss of test access, by power probe by penetrating
Frequency line is connected with this access end, and radio frequency line is partially in hanging free state, be easy artificially do not paid attention to touching or
The problem of external force is pullled, and test result is influenced, the semiconductor test machine calibrating installation, having can be to the excellent of radio frequency line fixation
Point, is worthy to be popularized.
2, the utility model passes through the setting of mounting plate and mounting hole, so that pedestal can be convenient installation and removal, guarantees
The flexibility of device can be convenient by the setting of linking arm, the first lantern ring and the second lantern ring to line set carry out activity tune excessively
Section can make line set be exposed to outside when in use, and line set was made to be located at the inside of through slot when not in use, by limiting slot and
The setting of limited block can be convenient motion bar in the inside of through slot and carry out activity adjustment, while limiting the movement of motion bar
Position, prevents the movement of motion bar from shifting, by the setting of groove and positioning pin, can consolidate to the limited block after adjusting
It is fixed, it is fixed to line set is crossed to achieve the effect that, by the setting of extension board, fixed ear and crossed beam trunking, radio frequency line can be carried out
Limit, reduces its overhanging portion to greatest extent.
Detailed description of the invention
FIG. 1 is a schematic structural view of the utility model；
Fig. 2 is the structure left view sectional view of the utility model pedestal；
Fig. 3 is the structure top view of the utility model pedestal；
Fig. 4 is the structural schematic diagram of the utility model fixed ear.
In figure: line set, 5 connection structures, 51 linking arms, 52 first lantern rings, 53 second are crossed in 1 pedestal, 2 through slots, 3 motion bars, 4
Lantern ring, 6 fixed structures, 61 limiting slots, 62 limited blocks, 63 grooves, 64 positioning pins, 7 pin configurations, 71 extension boards, 72 fixed ears,
73 crossed beam trunkings, 8 mounting plates.
Specific embodiment
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model
Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole
Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are without making creative work
Every other embodiment obtained, fall within the protection scope of the utility model.
Fig. 1-4, semiconductor test machine calibrating installation, including pedestal 1 are please referred to, the top of pedestal 1 offers through slot 2, leads to
Two sides inside slot 2 slidably connect motion bar 3, and the top at 2 middle part of through slot was provided with line set 4, motion bar 3 and excessively line set
It is provided with connection structure 5 between 4, the top of the pedestal 1 and front and rear sides for being located at through slot 2 are provided with fixed structure 6, pedestal 1
Front with the back side be provided with pin configuration 7, the two sides of pedestal 1 are fixedly connected to mounting plate 8, and the quantity of mounting plate 8 is
Four, the surface of mounting plate 8 offers mounting hole, and connection structure 5 includes linking arm 51, and a part of linking arm 51 is located at through slot
2 inside, the both ends of linking arm 51 have been respectively fixedly connected with the first lantern ring 52 and the second lantern ring 53, and the first lantern ring 52 was located at line
The outer surface of set 4 simultaneously with cross line set and 4 be flexibly connected, the second lantern ring 53 be located at the outer surface of motion bar 3 and with motion bar 3 is movable connects
It connects, fixed structure 6 includes limiting slot 61, and limiting slot 61 is provided with the front and rear sides of through slot 2, the internal slide connection of limiting slot 61
There is limited block 62, limited block 62 is fixedly connected with motion bar 3, and the surface of limited block 62 opens up fluted 63, and the top of pedestal 1 is set
It is equipped with positioning pin 64, the bottom end of positioning pin 64 runs through pedestal 1 and extends to the inside of groove 63, and pin configuration 7 includes extension board
71, extension board 71 is fixedly connected with pedestal 1, and the top of extension board 71 is fixedly connected with fixed ear 72, and the quantity of fixed ear 72 is
Several, extension board 71 offers crossed beam trunking 73 far from one end of pedestal 1, by the setting of mounting plate 8 and mounting hole, so that bottom
Seat 1 can be convenient installation and removal, guarantees the flexibility of device, passes through linking arm 51, the first lantern ring 52 and the second lantern ring 53
Setting can be convenient to 4 progress activity adjustment of line set is crossed, line set 4 can be made to be exposed to outside when in use, made when not in use
Crossing the inside that line set 4 is located at through slot 2 can be convenient motion bar 3 in through slot 2 by the setting of limiting slot 61 and limited block 62
Inside carries out activity adjustment, while limiting to the movement of motion bar 3, prevents the movement of motion bar 3 from shifting, by recessed
The setting of slot 63 and positioning pin 64 can be fixed the limited block 62 after adjusting, to reach to the fixed effects of line set 4 excessively
Fruit can limit radio frequency line by extension board 71, the setting of fixed ear 72 and crossed beam trunking 73, reduce it to greatest extent
Overhanging portion, pass through pedestal 1, through slot 2, motion bar 3, cross line set 4, connection structure 5, fixed structure 6 and pin configuration 7 are set
It sets, can be convenient and activity adjustment is carried out to device, while solving in the loss of test access, power probe is passed through into radio frequency
Line is connected with this access end, and radio frequency line is partially in hanging free state, is easy artificially not paid attention to touching or outer
The problem of power is pullled, and test result is influenced, the semiconductor test machine calibrating installation have advantage that can be fixed to radio frequency line,
It is worthy to be popularized.
In use, moving upwards line set 4, due to the setting of the first lantern ring 52 and the second lantern ring 53, crosses line set 4 and drive two
A motion bar 3 is moved to the middle part of through slot 2, and motion bar 3 drives limited block 62 in the internal slide of limiting slot 61, is moved to certain
Behind position, radio frequency line is then introduced by the installation of positioning pin 64 to the inside of groove 63 from crossed beam trunking 73, is fixed in solid
Determine the inside of ear 72, then pass through, then be fixed on inside the fixed ear 72 of the other side from the inside for crossing line set 4, can be completed pair
The fixation of radio frequency line.
The standardized element used in this specification arrived can commercially, and according to the description and the appended drawings
Record can carry out customized, and the specific connection type of each part is all made of in the prior art mature conventional means, part
It is all made of model conventional in the prior art, no longer makes specific narration herein.
In summary: the semiconductor test machine calibrating installation by pedestal 1, through slot 2, motion bar 3, crosses line set 4, connection
Structure 5, fixed structure 6 and pin configuration 7 are used cooperatively, and solve in the loss of test access, power probe is passed through
Radio frequency line is connected with this access end, and radio frequency line is partially in hanging free state, be easy artificially do not paid attention to touching or
It is the problem of external force is pullled, influences test result.
While there has been shown and described that the embodiments of the present invention, for the ordinary skill in the art,
It is understood that these embodiments can be carried out with a variety of variations in the case where not departing from the principles of the present invention and spirit, repaired
Change, replacement and variant, the scope of the utility model is defined by the appended claims and the equivalents thereof.
Claims (5)
1. semiconductor test machine calibrating installation, including pedestal (1), it is characterised in that: offer through slot at the top of the pedestal (1)
(2), the internal two sides of the through slot (2) slidably connect motion bar (3), and the top in the middle part of the through slot (2) was provided with
Line set (4), the motion bar (3) and crossing between line set (4) are provided with connection structure (5), the top of the pedestal (1) and are located at
The front and rear sides of through slot (2) are provided with fixed structure (6), and front and the back side of the pedestal (1) are provided with pin configuration
(7)。
2. semiconductor test machine calibrating installation according to claim 1, it is characterised in that: the two sides of the pedestal (1) are equal
It is fixedly connected with mounting plate (8), the quantity of the mounting plate (8) is four, and the surface of the mounting plate (8) offers installation
Hole.
3. semiconductor test machine calibrating installation according to claim 1, it is characterised in that: the connection structure (5) includes
Linking arm (51), a part of the linking arm (51) are located at the inside of through slot (2), and the both ends of the linking arm (51) are solid respectively
Surely be connected with the first lantern ring (52) and the second lantern ring (53), first lantern ring (52) be located at the outer surface of line set (4) and with
Line set (4) flexible connection is crossed, second lantern ring (53) is located at the outer surface of motion bar (3) and is flexibly connected with motion bar (3).
4. semiconductor test machine calibrating installation according to claim 1, it is characterised in that: the fixed structure (6) includes
Limiting slot (61), the limiting slot (61) are provided with the front and rear sides of through slot (2), the internal slide connection of the limiting slot (61)
Have limited block (62), the limited block (62) is fixedly connected with motion bar (3), and the surface of the limited block (62) opens up fluted
(63), it is provided with positioning pin (64) at the top of the pedestal (1), the bottom end of the positioning pin (64) through pedestal (1) and extends
To the inside of groove (63).
5. semiconductor test machine calibrating installation according to claim 1, it is characterised in that: the pin configuration (7) includes
Extension board (71), the extension board (71) are fixedly connected with pedestal (1), are fixedly connected with fixation at the top of the extension board (71)
Ear (72), the quantity of the fixed ear (72) are several, and the extension board (71) offered line far from the one end of pedestal (1)
Slot (73).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822161718.5U CN209460389U (en) | 2018-12-22 | 2018-12-22 | Semiconductor test machine calibrating installation |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822161718.5U CN209460389U (en) | 2018-12-22 | 2018-12-22 | Semiconductor test machine calibrating installation |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209460389U true CN209460389U (en) | 2019-10-01 |
Family
ID=68041674
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201822161718.5U Expired - Fee Related CN209460389U (en) | 2018-12-22 | 2018-12-22 | Semiconductor test machine calibrating installation |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209460389U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111781431A (en) * | 2020-07-13 | 2020-10-16 | 芝纶自动化科技(上海)有限公司 | Testing device |
-
2018
- 2018-12-22 CN CN201822161718.5U patent/CN209460389U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111781431A (en) * | 2020-07-13 | 2020-10-16 | 芝纶自动化科技(上海)有限公司 | Testing device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20191001 Termination date: 20201222 |