CN113624621B - Multi-sample impact test device and method at high temperature - Google Patents
Multi-sample impact test device and method at high temperature Download PDFInfo
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- CN113624621B CN113624621B CN202110852177.4A CN202110852177A CN113624621B CN 113624621 B CN113624621 B CN 113624621B CN 202110852177 A CN202110852177 A CN 202110852177A CN 113624621 B CN113624621 B CN 113624621B
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- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/30—Investigating strength properties of solid materials by application of mechanical stress by applying a single impulsive force, e.g. by falling weight
- G01N3/307—Investigating strength properties of solid materials by application of mechanical stress by applying a single impulsive force, e.g. by falling weight generated by a compressed or tensile-stressed spring; generated by pneumatic or hydraulic means
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/003—Generation of the force
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Abstract
The invention relates to the technical field of flat plate impact experiments, in particular to a device and a method for multi-sample impact test at high temperature, which can obtain the impact response of a plurality of samples under the action of thermal coupling through one experiment. The test device comprises: the device comprises a heating assembly, a limiting and pressurizing assembly, a multi-sample impact assembly and a test unit; the heating assembly comprises a heat-conducting tray and a heating coil; the heat conduction tray is used for bearing a sample, and more than three loading channels are distributed on the heat conduction tray; a cutting board is arranged and limited in each loading channel of the heat-conducting tray, and the flying piece is used for simultaneously impacting the cutting boards in the loading channels from the front; the back of one of the chopping blocks is fixedly connected with a PZT probe, the back of each of the other chopping blocks is fixedly connected with a sample, and the coated end face of the coated lithium fluoride window is butted with the back of the sample; and each loading channel is correspondingly provided with a set of limiting and pressurizing assembly for limiting and pressurizing the whole formed by the chopping board, the sample and the coated lithium fluoride window and the PZT probe.
Description
Technical Field
The invention relates to the technical field of flat plate impact experiments, in particular to a device and a method for multi-sample impact test at high temperature.
Background
The damage and ignition mechanism of energetic materials under the thermal composite stimulation are more and more emphasized, and become the leading research direction in the fields of explosion mechanics and the like. Therefore, the law and mechanism of influence of temperature and different material properties (thickness, orientation, components and the like) on the mechanical response of the energetic material under the action of thermal coupling are obtained and mastered, and the method has important significance for avoiding ignition and detonation of the energetic material under accidental stimulation.
At present, chinese patent publication No. CN110784947A discloses a heating device and a heating method for heating a sample before a flat plate impact experiment; as shown in fig. 1, includes: a heat conducting tray and a heating coil; the heat conducting tray is provided with a through hole along the axis; an annular groove coaxial with the through hole is also formed in the heat conduction tray; the heating coil is wound in the annular groove. The heating coil is connected with the temperature regulating circuit, and the sample area is heated by the heating coil before the flat plate impact experiment is carried out, so that the sample is effectively heated and the flat plate impact experiment is carried out, and the whole structure is small and simple; the use of a flat plate impact experiment and a speed measuring system is not influenced while the sample is effectively heated.
The heating device and the heating method adopt the heat conduction tray with the plurality of grooves, and can perform a flat plate impact experiment on a single sample at a certain initial temperature. Considering that the synchronous measurement of multiple samples can greatly reduce the experiment cost and the experiment contingency and can ensure the consistency of the sample thermal coupling loading conditions, a plurality of channels need to be designed in the loading area, but the design space of multiple grooves is insufficient. Meanwhile, for local heating of a single sample, multiple samples only need to be heated integrally, and the requirement on heating efficiency is not high. Above-mentioned patent except can't satisfying the demand that many samples were measured in step, when heating temperature exceeded heat-resisting glue use temperature, the glue film that solidifies can soften, even melts, leads to producing the clearance or breaking away from between sample and chopping block, window, and this result that can lead to the experiment has great error.
Aiming at the problem that the structural integrity of a loading area is damaged by the melting of a glue layer, the Chinese patent with the publication number of CN204882213U discloses a loading structure for heating a sample before a dynamic loading process; as shown in fig. 2, the loading structure includes: the limiting frame is fixed on the electrode plate through a plurality of fixing screw rods, a limiting rod hung above the sample is arranged on the limiting frame, a limiting gasket acting on the sample is arranged at the tail end of the bottom of the limiting rod, and a pressurizing spring is sleeved on the outer side of the limiting rod between the limiting gasket and the limiting frame. After the sample is fixed, continuous pressure is applied to the sample, so that in the temperature rising process, the glue layer can be extruded out from the interlayer after being melted, the sample still keeps the original position at the moment, and gaps are eliminated between the sample and the electrode plate with the smooth surface polishing and between the sample and the lithium fluoride window with the polished surface due to the continuous pressure application, so that the slippage is avoided, and the purpose of improving the loading quality is achieved.
Compared with the limiting dynamic loading heating structure, the flyer needs to impact a chopping board, a sample and a window in front in a flat plate impact experiment, the middle of the whole loading area is communicated, and after a glue layer is melted, no electrode plate is fixed and still can slide, so that the limiting dynamic loading heating structure cannot achieve the using effect in the flat plate impact experiment.
In summary, the defects of the existing testing method are:
(1) only a single sample can be tested in one experiment, if the influence rule of different attributes (thickness, orientation, components and the like) on the mechanical response of the sample under the thermal action is researched, multiple experiments are needed, and a verification experiment is needed to ensure the accuracy and repeatability of the experiment, so that huge manpower and material resources are consumed;
(2) when the experimental temperature exceeds the use temperature of the heat-resistant glue, the solidified glue layer can be softened and even melted, so that gaps are generated or separated between the sample and a chopping block or a window, and the experimental result has larger error;
(3) in a flat plate impact experiment, the middle of a chopping block-sample-window loading structure is communicated, after a glue layer is melted, the chopping block is not fixed, a limiting effect cannot be achieved by using a compression spring limiting device, and the whole structure still can slide relatively;
(4) because the loading area that the flight piece striking formed is limited among the flat plate striking experiment, it is too complicated to lead to current spacing pressurization structure to be applied to many sample synchronous measurement, is unfavorable for processing and manufacturing. Meanwhile, the acting force of the double pressurizing springs on the limiting washer is not uniformly distributed, the limiting effect is poor, and the relative position of the double pressurizing springs and the limiting washer has high requirements.
Disclosure of Invention
The purpose of the invention is: aiming at the defects of the prior art, the device for the multi-sample impact test at high temperature is provided.
The technical scheme of the invention is as follows: a multi-sample impact test apparatus at high temperatures, comprising: the device comprises a heating assembly, a limiting and pressurizing assembly, a multi-sample impact assembly and a test unit;
the heating assembly includes: a heat conducting tray and a heating coil; the heat conduction tray is used for bearing a sample, and more than three loading channels are distributed on the heat conduction tray; the heating coil is used for heating the heat conduction tray, transferring heat through the heat conduction tray and heating a sample;
the test unit includes: PZT probe, VISAR system and DISAR system; the VISAR system is provided with test channels corresponding to the loading channels one by one;
the multi-sample impact assembly comprises: a cutting board, a flying piece, a sample and a film-coated lithium fluoride window; a cutting board is arranged and limited in each loading channel of the heat-conducting tray, and the flyers are loaded by light gas guns and used for simultaneously impacting the cutting boards in the loading channels from the front; the back of one of the chopping blocks is fixedly connected with a PZT probe, the back of each of the other chopping blocks is fixedly connected with a sample, and the coated end face of the coated lithium fluoride window is butted with the back of the sample to form a laser emitting surface;
in the test unit, a laser beam of the DISAR system is reflected at the center of the flyer, and a laser beam of each test channel of the VISAR system is reflected at the coating center of the coating lithium fluoride window in the corresponding loading channel;
each loading channel is correspondingly provided with a set of limiting and pressurizing components; and the limiting and pressurizing assembly is used for limiting and pressurizing the whole formed by the cutting board, the sample and the coated lithium fluoride window in the loading channel and the PZT probe.
As a preferable mode of the present invention, the limiting and pressurizing assembly includes: the limiting device comprises a limiting washer, a pressurizing spring, a supporting plate and a bolt;
the limiting and pressurizing assembly carries out limiting and pressurizing on the whole formed by the cutting board, the sample and the coated lithium fluoride window and the PZT probe from the back side;
the supporting plate and the heat conducting tray are fixedly connected in parallel through bolts; installing a limiting gasket on each coated lithium fluoride window; the position of the supporting plate corresponding to the loading channel on the heat-conducting tray is provided with a limiting groove, one end of the pressurizing spring is fixed in the limiting groove of the supporting plate, and the other end of the pressurizing spring is abutted to a limiting gasket or a PZT probe in the corresponding loading channel.
As a preferred mode of the invention, the chopping block is in a step round table shape, namely, the outer circumference of the chopping block forms a step surface; the loading channel on the heat-conducting tray is provided with a step surface corresponding to the loading channel, and the chopping block is limited in the loading channel of the heat-conducting tray through the limit butt joint of the two step surfaces.
As a preferred mode of the invention, the chopping block is annularly glued in the loading channel of the heat-conducting tray, the front surface of the chopping block is flush with the front surface of the heat-conducting tray, and the back surface is bonded with a sample; and the back surface of the sample is bonded with a coated lithium fluoride window.
In a preferred embodiment of the present invention, a thermocouple for monitoring the temperature of the sample in real time is disposed in the loading channel of the heat conducting tray.
As a preferred mode of the invention, the properties of the sample on each of the cutting boards are different, and the properties include the thickness, orientation or composition of the sample.
In addition, the invention provides a multi-sample impact test method at high temperature, which comprises the following steps:
first, the sample is heated: the thermocouple sends the detected sample temperature to a temperature controller in real time, and the temperature controller is provided with a set test temperature; in the process that the heating coil heats the sample, the thermocouple feeds back the temperature of the sample in real time, and the temperature controller controls the on-off of a heating coil power supply module according to the temperature of the sample fed back by the thermocouple: when the temperature of the sample fed back by the thermocouple is consistent with the set test temperature, disconnecting the power supply module of the heating coil; when the temperature of the sample fed back by the thermocouple is lower than the set test temperature, a power supply module of the heating coil is turned on; in the heating process, the limiting pressurizing assembly continuously pressurizes to ensure that the sample is tightly attached to a chopping board and the sample is tightly attached to a film-coated lithium fluoride window;
when the vacuum degree of the target chamber reaches a set standard and the sample is kept at an expected temperature, driving the flyer to simultaneously impact the cutting boards in the loading channels from the front by using a light gas gun; the DISAR system measures the impact speed of the flyer; the PZT probe measures the time when the shock wave reaches the sample interface; the VISAR system measures the particle velocity history of the interface between the sample and the coated lithium fluoride window in each loading channel.
Has the advantages that:
(1) a plurality of loading channels are designed on the heat conducting tray, so that the impact response of a plurality of samples under the action of thermal coupling can be obtained in one experiment, the experiment cost is greatly reduced, the consistency of the thermal coupling loading conditions of the samples can be ensured, and the error caused by multiple experiments is avoided.
(2) Increase spacing pressurization subassembly, utilize chopping block, spacing packing ring and compression spring, realize continuously pressurizeing, avoid producing the clearance or breaking away from between sample and chopping block, window.
(3) The single spring is used for continuously pressurizing, so that pressure can be uniformly applied to the limiting washer, the phenomenon that the acting force of the double pressurizing springs on the limiting washer is unevenly distributed is avoided, and a good limiting effect is achieved; and the limiting structure is simple, so that the synchronous measurement of multiple samples can be realized in a limited loading area.
Drawings
FIG. 1 is a schematic diagram of a heating apparatus for heating a sample before a flat plate impact test in the background art;
FIG. 2 is a schematic diagram of a limiting type dynamic loading heating structure in the background art;
FIG. 3 is a schematic structural view of the present invention;
FIG. 4 is a schematic view of a plurality of explosive samples secured to a thermally conductive tray.
Wherein: 1-1 heat conduction tray, 1-2 heating coils, 1-3 thermocouples, 2-1 chopping block, 2-2 limiting washers, 2-3 pressurizing springs, 2-4 supporting plates, 2-5 bolts, 3-1 flyer, 3-2 samples, 3-3 coated lithium fluoride windows, 4-1PZT probes, 4-2VISAR system and 4-3DISAR system.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples.
Example 1:
the embodiment provides a multi-sample impact test device under high temperature, which can obtain the impact response of a plurality of samples under the action of thermal coupling through one experiment.
As shown in fig. 3 and 4, the multi-sample impact test apparatus at high temperature includes: the device comprises a heating assembly, a limiting and pressurizing assembly, a multi-sample impact assembly and a test unit;
the heating assembly includes: a heat conducting tray 1-1 and a heating coil 1-2; the heat conducting tray 1-1 is used for bearing a sample, and a plurality of round holes are distributed on the heat conducting tray 1-1 and used as loading channels; in the embodiment, an axial through hole is arranged in the center of the heat conducting tray 1-1, and four round holes are uniformly distributed on the periphery of the axial through hole of the heat conducting tray 1-1 at intervals to serve as loading channels; the heating coil 1-2 is used to heat the heat conductive tray 1-1, transfer heat through the heat conductive tray 1-1, and heat the sample.
The multi-sample impact assembly comprises: 2-1 parts of a cutting board, 3-1 parts of flyings, 3-2 parts of a plurality of samples with different properties and 3-3 parts of a coated lithium fluoride window; sample properties here include: thickness, orientation (when the sample is an explosive single crystal, the orientation of the explosive single crystal), composition, etc.; wherein the chopping block 2-1 is a step round table shaped quartz chopping block, namely, one end of the chopping block is provided with a shaft shoulder, thereby forming a step surface on the outer circumference; the loading channel on the heat-conducting tray 1-1 is provided with a step surface corresponding to the loading channel, the step surface serves as a limiting step, the four chopping blocks 2-1 are respectively limited in the four loading channels of the heat-conducting tray 1-1 through the matching of the two step surfaces (namely, the front ends of the chopping blocks 2-1 are axially limited through the limiting step), and the chopping blocks 2-1 provide stress points for the limiting and pressurizing components. In the embodiment, three samples 3-2 with different thicknesses are taken as an example, the three samples 3-2 with different thicknesses are respectively arranged on the back surfaces of three cutting boards 2-1, and the coated end surface of the coated lithium fluoride window 3-3 is bonded with the back surface of the sample 3-2 to form a laser emitting surface. The back of the anvil 2-1 of the remaining one loading channel is provided with a PZT probe (piezoelectric probe) 4-1. The flyer 3-1 is loaded by a light gas gun and used for simultaneously impacting four cutting boards 2-1 from the front.
Spacing pressurization subassembly includes: a limiting washer 2-2, a pressurizing spring 2-3, a support plate 2-4 and a bolt 2-5; each loading channel is correspondingly provided with a set of limiting and pressurizing components; the limiting washer 2-2 is used for dispersing pressure and preventing the coated lithium fluoride window 3-3 from directly contacting with the pressurizing spring 2-3 to cause 'slipping'; the pressurizing spring 2-3 is used for continuously applying pressure to the limiting washer 2-2 or the PZT probe 4-1, so that gaps are prevented from being generated by slippage and dislocation of the sample 3-2 and the chopping block 2-1, the sample 3-2 and the film-coated lithium fluoride window 3-3 and the chopping block 2-1 and the PZT probe 4-1; a limiting groove is processed on the supporting plate 2-4 and used for fixing the pressurizing spring 2-3; bolt holes are respectively processed on the supporting plate 2-4 and the heat conducting tray 1-1, and the supporting plate 2-4 and the heat conducting tray 1-1 are fixed in parallel through bolts 2-5 and pressurizing springs 2-3.
The test unit includes: 4-1 parts of PZT probe, 4-2 parts of VISAR system (namely laser speed interference speed measurement system) and 4-3 parts of DISAR system (namely laser displacement interference speed measurement system); PZT probe 4-1 is used to measure the time when the shock wave reaches the back of anvil 2-1 (since the back of the other three anvils 2-1 is in contact with sample 3-2, this time is taken as the time when the shock wave reaches the sample); the VISAR system 4-2 is provided with three testing channels and is respectively used for measuring the particle velocity history of the relative interface of the sample 3-2 and the coated lithium fluoride window 3-3 in the three loading channels, and the DISAR system 4-3 is used for measuring the impact velocity of the flyer.
The overall connection relationship (installation process) of the impact test device is as follows:
firstly, a heat-conducting tray 1-1 is placed on a horizontal reference table, then four chopping blocks 2-1 are respectively placed in four loading channels of the heat-conducting tray 1-1, spacing butt joint is carried out through mutually matched step surfaces, the chopping blocks 2-1 are adhered to the loading channels of the heat-conducting tray 1-1 in a circumferential direction by glue, and the front end surface of the chopping block 2-1 is aligned with the front end surface of the heat-conducting tray 1-1 after adhesion. The impact surfaces of the chopping block 2-1 and the heat conducting tray 1-1, namely the surface facing the flying sheet 3-1, are the front end surfaces thereof.
Glue is smeared on the rear end faces of three chopping blocks 2-1 to respectively bond three samples 3-2 with different thicknesses; coating glue on the rear end face of the sample 3-2, and respectively bonding the film-coated end faces of the three film-coated lithium fluoride windows 3-3 on the sample 3-2 corresponding to the three film-coated lithium fluoride windows; coating glue on the coated lithium fluoride window 3-3, and respectively bonding the three limiting gaskets 2-2 on the coated lithium fluoride window 3-3; and (4) coating glue on the back end surface of the anvil plate 2-1 of the remaining loading channel to bond the PZT probe 4-1. And then a heating coil 1-2 is installed on the heat conductive tray 1-1.
Limiting grooves are respectively formed in the positions, corresponding to the four loading channels on the heat conduction tray 1-1, of the supporting plate 2-4, and one ends of the four pressure springs 2-3 are respectively fixed in the limiting grooves of the supporting plate 2-4; before the glue is solidified, bolt holes in the heat conduction tray 1-1 and the support plate 2-4 are aligned, the support plate 2-4 is installed on the heat conduction tray 1-1 through bolts 2-5, and the other ends of the four pressure springs 2-3 are respectively attached to the three limiting gaskets 2-2 and the PZT probe 4-1. Then, tightening the bolts 2-5 to enable the pressurizing springs 2-3 to be in a compressed state, and thus forming a target plate system of the impact test device; after the glue is solidified, the whole target plate system is placed on a flange of a light gas gun target chamber, so that a test area (namely an area enveloped by four loading channels) of the heat-conducting tray 1-1 is opposite to the flyer 3-1; and then arranging a VISAR system 4-2 and a DISAR system 4-3, reflecting laser beams of the DISAR system 4-3 at the center of the flyer 3-1, respectively reflecting laser beams of three testing channels of the VISAR system 4-2 at the coating centers of three coated lithium fluoride windows 3-3, and turning off the target plate chamber for vacuumizing after debugging the laser intensity.
Example 2:
on the basis of the embodiment 1, in order to effectively heat the sample 3-2 to the set temperature, the heating assembly further comprises a thermocouple 1-3, and the thermocouple 1-3 detects the sample temperature and feeds the sample temperature back to a power supply module of the heating coil 1-2.
A thermocouple key groove is arranged in a loading channel of the heat conducting tray 1-1, which is provided with a sample 3-2, and the position corresponding to the sample 3-2; three thermocouples 1-3 are fixed in the thermocouple keyways by glue respectively, and the probes of the thermocouples 1-3 are contacted with the corresponding samples 3-2.
Detecting and feeding back the temperature of the sample 3-2 through the thermocouple 1-3, controlling a power supply module of the heating coil 1-2 according to the temperature of the sample 3-2 fed back by the thermocouple 1-3, and disconnecting the power supply module of the heating coil 1-2 when the temperature of the sample 3-2 fed back by the thermocouple 1-3 is consistent with a set temperature; and when the temperature of the sample 3-2 fed back by the thermocouple is lower than the set temperature, a power supply module of the heating coil 1-2 is turned on, so that the sample 3-2 can be kept at a constant temperature.
Example 3:
the test procedure of this test apparatus is illustrated on the basis of example 2:
namely a multi-sample impact test method at high temperature, comprising the following steps:
sample 3-2 was heated first: setting an expected temperature in a power module of a heating coil 1-2, switching on a circuit, heating a test area of a heat conduction tray 1-1 through the heating coil 1-2, detecting and feeding back the temperature of each sample 3-2 by using a thermocouple 1-3, and adjusting the power of the circuit by the power module so as to achieve a constant temperature effect (even if the temperature of the sample 3-2 is kept at the expected temperature); when the solidified adhesive layer is softened or melted due to high temperature, due to continuous pressurization of the limiting pressurization assembly, the adhesive layer can be well tightly attached to the chopping block 2-1 and the coated lithium fluoride window 3-3 after being extruded;
measurement: when the vacuum degree of the target chamber reaches a certain standard (<200Pa) and the sample 3-2 is kept at the expected temperature, driving the flyer 3-1 to impact the target plate system by using a light gas gun; the DISAR system 4-3 measures the impact speed of the flyer; the PZT probe 4-1 measures the time when the shock wave reaches the interface of the sample 3-2; VISAR system 4-2 measures sample/coated lithium fluoride window interface particle velocity history; the PZT probe 4-1 is used for measuring a signal of a shock wave reaching a sample interface, the VISAR system 4-2 is used for recording a time difference of the shock wave reaching the sample and a signal of a coated lithium fluoride window interface, and the longitudinal wave sound velocity of samples 3-2 with different thicknesses can be calculated.
Although the invention has been described in detail above with reference to a general description and specific examples, it will be apparent to one skilled in the art that modifications or improvements may be made thereto based on the invention. Accordingly, such modifications and improvements are intended to be within the scope of the invention as claimed.
Claims (6)
1. Many samples impact test device under high temperature, its characterized in that includes: the device comprises a heating assembly, a limiting and pressurizing assembly, a multi-sample impact assembly and a test unit;
the heating assembly includes: a heat conducting tray (1-1) and a heating coil (1-2); the heat conduction tray (1-1) is used for bearing a sample (3-2), and more than three loading channels are distributed on the heat conduction tray (1-1); the heating coil (1-2) is used for heating the heat conducting tray (1-1), transferring heat through the heat conducting tray (1-1) and heating the sample (3-2);
the test unit includes: a PZT probe (4-1), a VISAR system (4-2) and a DISAR system (4-3); the VISAR system (4-2) is provided with test channels corresponding to the loading channels one by one;
the multi-sample impact assembly comprises: a cutting board (2-1), a flyer (3-1), a sample (3-2) and a film-coated lithium fluoride window (3-3); a cutting board (2-1) is arranged and limited in each loading channel of the heat conducting tray (1-1), and the flying pieces (3-1) are loaded by light gas guns and used for simultaneously impacting the cutting boards (2-1) in the loading channels from the front; the back of one of the chopping blocks is fixedly connected with a PZT probe (4-1), the back of each of the other chopping blocks (2-1) is fixedly connected with a sample (3-2), and the plated end face of the plated lithium fluoride window (3-3) is butted with the back of the sample (3-2) to form a laser emitting face;
in the test unit, laser beams of a DISAR system (4-3) are reflected at the center of a flyer (3-1), and laser beams of each test channel of a VISAR system (4-2) are reflected at the coating center of a coated lithium fluoride window (3-3) in a loading channel corresponding to the laser beams;
each loading channel is correspondingly provided with a set of limiting and pressurizing components; the limiting and pressurizing assembly is used for limiting and pressurizing the whole formed by the cutting board (2-1), the sample (3-2) and the coated lithium fluoride window (3-3) in the loading channel and the PZT probe (4-1);
spacing pressurization subassembly includes: a limiting washer (2-2), a pressure spring (2-3), a support plate (2-4) and a bolt (2-5);
the limiting and pressurizing assembly carries out limiting and pressurizing on the whole formed by the cutting board (2-1), the sample (3-2) and the coated lithium fluoride window (3-3) and the PZT probe (4-1) from the back;
the supporting plate (2-4) and the heat conducting tray (1-1) are fixedly connected in parallel through bolts (2-5); a limiting gasket (2-2) is arranged on each coated lithium fluoride window (3-3); a limiting groove is formed in the position, corresponding to the loading channel in the heat conduction tray (1-1), of the supporting plate (2-4), one end of the pressurizing spring (2-3) is fixed in the limiting groove of the supporting plate (2-4), and the other end of the pressurizing spring is abutted to a limiting gasket (2-2) or a PZT probe (4-1) in the corresponding loading channel.
2. The high temperature multi-sample impact test device according to claim 1, wherein said anvil (2-1) is stepped frustum shaped, i.e. its outer circumference forms a step face; the loading channel on the heat conduction tray (1-1) is provided with a step surface corresponding to the loading channel, and the cutting board (2-1) is limited in the loading channel of the heat conduction tray (1-1) through the limit butt joint of the two step surfaces.
3. The device for testing the impact of multiple samples at high temperature according to claim 1, wherein the anvil (2-1) is glued circumferentially into the loading channel of the heat conducting tray (1-1), the front surface of the anvil (2-1) is flush with the front surface of the heat conducting tray (1-1), and the back surface is glued with the sample (3-2); and the back surface of the sample (3-2) is bonded with a plated lithium fluoride window (3-3).
4. The multi-sample impact test device at high temperature according to claim 1, wherein a thermocouple (1-3) for real-time monitoring of the temperature of the sample (3-2) is provided in the loading channel of the heat conducting tray (1-1) provided with the sample (3-2).
5. A device for multi-sample impact testing at elevated temperatures according to claim 1, characterized in that the properties of the samples (3-2) on each of the cutting boards (2-1) are different, said properties including the thickness, orientation or composition of the samples.
6. A method for multi-sample impact testing at high temperatures, characterized in that a heating assembly according to claim 4 is used;
the sample (3-2) was first heated: the thermocouple (1-3) sends the temperature of the detected sample (3-2) to a temperature controller in real time, and the temperature controller is provided with a set test temperature; in the process that the heating coil (1-2) heats the sample (3-2), the thermocouple (1-3) feeds back the temperature of the sample (3-2) in real time, and the temperature controller controls the on-off of a power supply module of the heating coil (1-2) according to the temperature of the sample (3-2) fed back by the thermocouple (1-3): when the temperature of the sample (3-2) fed back by the thermocouple is consistent with the set test temperature, the power supply module of the heating coil (1-2) is disconnected; when the temperature of the sample (3-2) fed back by the thermocouple is lower than the set test temperature, a power supply module of the heating coil (1-2) is turned on; in the heating process, the limiting pressurizing assembly continuously pressurizes to ensure that the sample (3-2) is tightly attached to the chopping board (2-1) and the sample (3-2) is tightly attached to the film-coated lithium fluoride window (3-3);
when the vacuum degree of the target chamber reaches a set standard and the sample (3-2) is kept at an expected temperature, driving a flyer (3-1) to simultaneously impact a cutting board (2-1) in each loading channel from the front by using a light gas gun; the DISAR system (4-3) measures the impact speed of the flyer; the PZT probe (4-1) measures the time when the shock wave reaches the interface of the sample (3-2); the VISAR system (4-2) measures the particle velocity history of the relative interface of the sample (3-2) and the coated lithium fluoride window (3-3) in each loading channel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110852177.4A CN113624621B (en) | 2021-07-27 | 2021-07-27 | Multi-sample impact test device and method at high temperature |
Applications Claiming Priority (1)
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| DE4333863A1 (en) * | 1993-10-05 | 1995-04-06 | Michael Heufelder | Method and device for testing load-securing means |
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| CN211042937U (en) * | 2019-12-03 | 2020-07-17 | 镇江陆陆电气有限公司 | Explosion-proof electric heating pipe intensity check out test set of even heating |
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