CN113624250B - Automatic temperature cycle testing device and method - Google Patents
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Abstract
The invention provides an automatic temperature cycle testing device and method, which are realized through the following steps: carrying out dynamic parameter information configuration on the segment information and the event information according to the requirements of the temperature cycle test; setting a starting section sequence number N; setting a starting time T of a starting section; setting a cycle starting sequence number and times; executing segment information of the sequence number N, checking whether an event trigger exists, and executing the triggered event if the event trigger exists; after the triggered event is finished or without the triggered event, checking whether a segment circulation exists, if so, circularly executing the appointed segment information, and if not, executing the N+1 segment information until all the segment information is executed. The invention can realize the temperature cycle test flow rapidly and efficiently by configuring the segment information and the event information and only changing the configuration of the corresponding segment information and the event information in different test processes without redesigning, encoding, testing and realizing.
Description
Technical Field
The invention belongs to the technical field of temperature cycle testing, and particularly relates to an automatic temperature cycle testing device and method.
Background
Inertial products such as an inertial control inertial measurement system and components thereof need to be tested in terms of height Wen Wenxun before formal use. By applying proper temperature cycle stress to the inertia product, defects in the aspects of manufacturing process, components and the like of the inertia product are found and removed, so that the reliability of the product is improved, and the quality of the product is ensured.
One temperature cycle generally comprises a pretreatment stage, a high temperature rise stage, a high temperature hold stage, a low temperature drop stage, and a low temperature hold stage. The temperature cycle test process usually needs to be repeated by a plurality of temperature cycles, the inertia product is started at a specific time point of a specific stage, the product is controlled to be electrified, and communication data acquisition is carried out, so that the performance index of the product is judged. Different inertial product end-use scenarios and application environments are different, and the temperature cycle test flow is generally different. The common practice is to design, encode, test and implement for each test flow by measurement and control software. Although the method can well meet the specified requirements, the method is poor in adaptability, and design, coding, testing and implementation are needed to be carried out again after any change in the testing process. The method is complex in operation, low in efficiency and incapable of meeting the requirement of the change of the test flow, and other errors are sometimes introduced to cause that the temperature cycle test flow cannot meet the requirement.
Disclosure of Invention
The invention aims to overcome the defects in the prior art and provides an automatic temperature cycle testing device and method. The scheme of the invention can solve the problems in the prior art.
The technical solution of the invention is as follows:
According to one aspect of the invention, an automatic temperature cycle testing device is provided, which comprises a parameter acquisition unit, a judging unit, a dynamic parameter configuration unit, a plurality of section units, a plurality of event units and an external device;
The parameter acquisition unit acquires the time, temperature and configuration parameters of the start of the automatic temperature cycle test, and transmits the result to the dynamic parameter configuration unit;
The dynamic parameter configuration unit generates a dynamic parameter configuration file according to the acquired data, and comprises a section information configuration device and an event information configuration device;
The segment information configuration device configures segment information of the segment unit according to the dynamic parameter configuration file;
The event information configuration device configures event information for the event unit according to the dynamic parameter configuration file;
The event unit defines information of an event in the temperature cycle test process, controls an external device related to the event unit according to the event information, and transmits a running state to the judging unit;
The section unit defines the information of a section in the temperature cycle test process, controls the external device related to the section according to the section information, and transmits the running state to the judging unit;
The judging unit judges according to the data of the dynamic parameter configuration unit, the running conditions of the event unit and the segment unit so as to determine whether the temperature cycle test content is finished.
The working process is as follows: inputting the process and parameters to be tested in the temperature cycle test process into a dynamic parameter configuration unit through a parameter acquisition unit, splitting the temperature cycle test into different processes, wherein each process corresponds to one segment unit, the events in the temperature cycle test process correspond to different event units according to different types, the segment units and the event units control related devices connected externally to work, the configuration of segment information and event information in the segment units and the event units is completed in the dynamic parameter configuration unit, the setting of the whole temperature cycle test process is completed, a judgment unit judges the dynamic parameters, and the temperature cycle test process is ended after the defined segment information is executed.
Further, the segment information configuration content comprises a segment serial number, a segment name, a starting point, an ending point, an event and a segment cycle.
Further, the segment number is unique and is used to identify a piece of configuration content.
Further, the event is event information which needs to be triggered in the execution process of the piece of information, and the event sequence number is used for associating with the event information.
Further, the segment cycle includes a segment information sequence number and a cycle number which need a cycle test.
Further, the event information configuration content comprises an event sequence number, an event name, time, type and parameters.
Further, the event sequence number is unique and is used for identifying an event.
Further, the time is the duration of the event execution.
Further, the event types include a start test event, a stop test event, a cycle start event, a cycle end event, a number of cycle events, a cycle execution event, an execution segment sequence number event, and a user-defined event.
Further, the parameters are configuration parameters of each event.
Further, the event information is triggered by an event in the segment information.
According to another aspect of the present invention, there is provided an automatic warm-cycling test method, implemented by:
carrying out dynamic parameter information configuration on the segment information and the event information according to the requirements of the temperature cycle test;
setting a starting section sequence number N;
setting a starting time T of a starting section;
setting a cycle starting sequence number and times;
Executing segment information of the sequence number N, checking whether an event trigger exists, and executing the triggered event if the event trigger exists;
After the triggered event is finished or without the triggered event, checking whether a segment circulation exists, if so, circularly executing the appointed segment information, and if not, executing the N+1 segment information until all the segment information is executed.
Further, the step of configuring the dynamic parameter information is as follows:
Generating a dynamic parameter configuration file according to the temperature cycle test requirement;
configuring each piece of information according to the dynamic parameter configuration file;
After the configuration of the segment information is completed, the event information is configured according to the dynamic parameter configuration file.
Compared with the prior art, the invention has the beneficial effects that:
(1) The invention only needs to change the configuration of the corresponding segment information and event information in different testing processes by the configuration of the segment information and the event information, and does not need to carry out design, coding, testing and implementation again, thereby realizing the temperature cycle testing flow rapidly and efficiently;
(2) After the dynamic parameter configuration is completed in the temperature cycle process, the invention does not need manual intervention, and avoids that the temperature cycle test flow cannot meet the requirements due to the introduction of other errors.
Drawings
The accompanying drawings, which are included to provide a further understanding of embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention. It is evident that the drawings in the following description are only some embodiments of the present invention and that other drawings may be obtained from these drawings without inventive effort for a person of ordinary skill in the art.
FIG. 1 shows a schematic diagram of an automatic temperature cycle test apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic diagram showing a process of an automatic temperature cycle test method according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of dynamic parameter configuration content provided according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a segment information configuration according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of event information configuration content provided according to an embodiment of the present invention;
FIG. 6 is a diagram showing the association of segment information with event information provided in accordance with an embodiment of the present invention;
FIG. 7 is a schematic diagram of a segment object and event object linked list structure provided according to an embodiment of the present invention;
FIG. 8 is a diagram illustrating a memory mapping relationship between a segment object linked list and an event object linked list according to an embodiment of the present invention;
Fig. 9 shows a flow chart of dynamic parameter configuration provided according to an embodiment of the present invention.
Detailed Description
It should be noted that, without conflict, the embodiments of the present application and features of the embodiments may be combined with each other. The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments. The following description of at least one exemplary embodiment is merely exemplary in nature and is in no way intended to limit the application, its application, or uses. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of exemplary embodiments according to the present application. As used herein, the singular is also intended to include the plural unless the context clearly indicates otherwise, and furthermore, it is to be understood that the terms "comprises" and/or "comprising" when used in this specification are taken to specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof.
The relative arrangement of the components and steps, numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention unless it is specifically stated otherwise. Meanwhile, it should be understood that the sizes of the respective parts shown in the drawings are not drawn in actual scale for convenience of description. Techniques, methods, and apparatus known to one of ordinary skill in the relevant art may not be discussed in detail, but should be considered part of the specification where appropriate. In all examples shown and discussed herein, any specific values should be construed as merely illustrative, and not a limitation. Thus, other examples of the exemplary embodiments may have different values. It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further discussion thereof is necessary in subsequent figures.
As shown in fig. 1, according to one embodiment, an automatic temperature cycle testing device is provided, which includes a parameter acquisition unit, a judgment unit, a dynamic parameter configuration unit, a plurality of segment units, a plurality of event units and an external device;
the parameter acquisition unit acquires the time, temperature and configuration parameters of the start of the automatic temperature cycle test, and transmits the result to the dynamic parameter configuration unit;
the dynamic parameter configuration unit generates a dynamic parameter configuration file according to the acquired data, and comprises a section information configuration device and an event information configuration device;
The segment information configuration device configures segment information of the segment unit according to the dynamic parameter configuration file, and the event information configuration device configures event information of the event unit according to the dynamic parameter configuration file;
A section unit defines the information of a section in the temperature cycle test process, controls the external device related to the section information according to the section information, and transmits the running state to the judging unit. In one embodiment, the segment information configuration content includes a segment sequence number, a segment name, a start point, an end point, an event, and a segment loop; the segment number is unique and is used for identifying a piece of configuration content; the event is event information needing to be triggered in the execution process of the piece of information, and is related by an event serial number; the segment loop includes a segment information sequence number and a loop number that require a loop test.
An event unit defines the information of an event in the temperature cycle test process, controls the external device related to the event unit according to the event information, and transmits the running state to the judging unit. In one embodiment, the event information configuration content includes an event serial number, an event name, a time, a type and a parameter, wherein the event serial number is unique and is used for identifying an event, and the time is the duration of the execution of the event; the types comprise a start test event, a stop test event, a cycle start event, a cycle end event, a cycle execution event, an execution segment sequence number event and a user-defined event; the parameters are configuration parameters for each event.
The judging unit judges the running conditions of the data, the event unit and the segment unit according to the dynamic parameter configuration unit so as to determine whether the temperature cycle test content is finished; .
The working process is as follows: inputting the process and parameters to be tested in the temperature cycle test process into a dynamic parameter configuration unit through a parameter acquisition unit, splitting the temperature cycle test into different processes, wherein each process corresponds to one segment unit, the events in the temperature cycle test process correspond to different event units according to different types, the segment units and the event units control related devices connected externally to work, the configuration of segment information and event information in the segment units and the event units is completed in the dynamic parameter configuration unit, the setting of the whole temperature cycle test process is completed, a judgment unit judges the dynamic parameters, and the temperature cycle test process is ended after the defined segment information is executed.
In one embodiment, the event information is triggered by an event in the segment information.
According to another embodiment of the present invention, an automatic warm-cycling test method is provided, which is implemented by the following steps:
carrying out information configuration on the segment information and the event information according to the requirements of the temperature cycle test;
setting a starting section sequence number N;
setting a starting time T of a starting section;
Setting a segment circulation starting sequence number and the number of times;
Executing segment information of the sequence number N, checking whether an event trigger exists, and executing the triggered event if the event trigger exists;
After the triggered event is finished or without the triggered event, checking whether a segment circulation exists, if so, circularly executing the appointed segment information, and if not, executing the N+1 segment information until all the segment information is executed.
In a further embodiment, the step of information configuration is:
Generating a dynamic parameter configuration file according to the temperature cycle test requirement;
configuring each piece of information according to the dynamic parameter configuration file;
After the configuration of the segment information is completed, configuring event information according to the dynamic parameter configuration file;
As shown in fig. 2, in one embodiment, an automatic temperature cycle test method is implemented by the following steps:
step one, carrying out dynamic parameter information configuration on segment information and event information according to the requirements of a temperature cycle test;
As shown in fig. 9, the steps of dynamic parameter information configuration are:
S1.1, generating a dynamic parameter configuration file according to the requirements of a temperature cycle test; as shown in fig. 3, the dynamic parameter configuration file mainly includes two parts of contents, a segment information configuration content and an event information configuration content;
S1.2, configuring each piece of information according to a dynamic parameter configuration file; the configuration content of the section information is composed of one or more pieces of section information, and one piece of section information can represent a stage of a temperature cycle test, such as a pretreatment stage, a high temperature rise stage, a high temperature holding stage, a low temperature cooling stage and a low temperature holding stage. In one embodiment, as shown in fig. 4, the segment information configuration content includes a segment number, a segment name, a start point, an end point, an event, and a segment loop, and the content of the segment information configuration is as shown in table 1:
TABLE 1
The segment number of each piece of segment information configuration content must be unique, the starting point (3 in table 1) is the basis for starting the execution of a piece of segment information, the ending point (4 in table 1) is the basis for ending the execution of a piece of segment information, and the related events in the piece of segment information are triggered according to the combination of the control time and the control temperature when the piece of segment information is executed. If the trigger event content (5 in table 1) exists, one piece of information can trigger one or more pieces of event information, and all pieces of event information associated with the piece of information are sequentially triggered according to the trigger time; if a segment loop test is required (6 in table 1), the contents of each segment information are sequentially and circularly executed according to the segment loop information configured by the segment information.
In one embodiment, the start and end points include control time, control temperature, temperature error maximum and temperature error minimum, as shown in table 2:
TABLE 2
| Sequence number | Content | Description of the invention |
| 1 | Control time | Operating system time, unit min |
| 2 | Controlling temperature | Control temperature value of product during the test |
| 3 | Maximum value of temperature error | Maximum allowable error in temperature control |
| 4 | Minimum value of temperature error | Maximum allowable error in temperature control |
In one embodiment, the event configuration content includes a trigger time and an event sequence number, as shown in Table 3:
TABLE 3 Table 3
As can be seen in table 3, the two are related to each other by the event of the piece information configuration content (sequence number 5 in table 1). The event information is triggered and executed through the segment information, the event serial number in the segment information is the identification of the event information, the segment information triggers the corresponding event information through the serial number of the event information, a plurality of event information can be triggered in one segment information, the execution is triggered and executed in sequence according to the triggering time sequence, and the mutual relation between the event information and the segment information is shown in figure 6.
In one embodiment, the segment loop configuration content includes a number of times and a segment sequence number, as shown in Table 4:
TABLE 4 Table 4
| Sequence number | Content | Description of the invention |
| 1 | Number of times | Number of cycles |
| 2 | Sequence number | Sequence number corresponding to segment information needing to be circulated |
After the S1.3 section of information is configured, configuring event information according to a dynamic parameter configuration file;
in one embodiment, as shown in fig. 5, the event information includes an event number, an event name, a time, a type, and parameters, the contents of which are shown in table 5:
TABLE 5
| Sequence number | Content | Description of the invention |
| 1 | Event sequence number | Event sequence number |
| 2 | Event name | Event name |
| 3 | Time of | Event duration |
| 4 | Type(s) | Event message types, see in particular Table 6 |
| 5 | Parameters (parameters) | Other parameters |
The sequence number of each piece of event information configuration content is unique, the segment sequence number is not associated with the event sequence number, the sequence number and the event sequence number are associated with each other through the event (sequence number 5 in table 1) of the segment information configuration content, each event defines the duration time, and the event automatically stops after the time.
In one embodiment, the event information is triggered by an event in the segment information, and the event types include a start test event, a stop test event, a cycle start event, a cycle end event, a number of cycle events, a cycle in-process event, an execution segment sequence number event, and a user-defined event, and the content is shown in table 6. In one embodiment, by user customizing the type, a user can customize the type of join event at the time of application according to test needs, for example: data acquisition events, product on-off events, alarm events, etc. The specific requirements in most temperature cycle test flows can be met by user-defining event types.
In one embodiment, for ease of management, the dynamic parameter configuration file that configures the full content is loaded into memory, and each piece of segment information data content forms a separate "segment information object" that is stored in a segment information object linked list, as shown in fig. 7. Each piece of event information data content forms a separate "event information object" and is stored in an event information object linked list as shown in fig. 7. And managing the corresponding 'objects' in a linked list mode, wherein the segment information objects are stored in the segment information linked list, and the event information objects are stored in the event information linked list. As shown in fig. 8, each object in the linked list has a unique index number corresponding to it. The sequence numbers in the section information objects and the sequence numbers of the section information linked list are in one-to-one correspondence in the memory through a memory mapping mode; the sequence numbers in the event information object and the sequence numbers of the event information linked list are in one-to-one correspondence in the memory in a memory mapping mode.
Step two, setting a starting section sequence number N, wherein N is smaller than the maximum section sequence number in the configuration file;
Step three, setting a starting time T of a starting section, wherein the starting time T is less than the ending time;
setting a segment circulation starting sequence number and the number M, wherein M is smaller than or equal to the number of the segment circulation in the segment information configuration file;
Step five, executing segment information of the sequence number N, checking whether an event trigger exists, and executing the triggered event if the event trigger exists;
step six, after the triggered event is finished or without the triggered event, checking whether a segment circulation exists, if so, circularly executing the appointed segment information, and if not, executing the N+1 segment information until all the segment information is executed.
The automatic temperature cycle test flow is mainly executed according to the segment information content, the initial segment information sequence number, the initial time and the initial cycle number can be set in advance before the user tests, and the segment information content in the segment object linked list can be executed in sequence from the initial segment information according to the set information after the test starts. When executing a certain section information object, judging the starting point time of the section information content and the current test temperature to execute the section information; and judging the content end point time of the segment information and ending the segment information by the current test temperature. The event item in the segment information content can be '1', which indicates that the event is not required to be triggered at the moment, when the event item is not '1', the corresponding event information is directly and rapidly obtained in a memory mapping mode in a memory linked list through the event sequence number, and the event information is triggered and executed; and triggering execution in sequence when the event is not unique. The cyclic item in the segment information content can be "-1", which indicates that the segment information does not need to be circulated, and when the cyclic item is not "-1", the corresponding segment information is directly and rapidly obtained and sequentially executed in a memory mapping mode in the memory linked list through the segment information sequence number configured in the cyclic item.
In summary, compared with the prior art, the automatic temperature cycle testing device and method of the invention have at least the following advantages:
(1) The automatic temperature cycle test is realized by dynamic parameter configuration, the parameter configuration file is dynamically configured according to different test requirements, and once the temperature cycle test flow is changed, the dynamic parameter configuration file is only required to be reconfigured according to the change requirements;
(2) The dynamic parameter configuration file integrates the segment information and the event information into one file, is managed in a unified way, is convenient for software development or a user to change the temperature cycle flow again, and does not depend on other software and hardware contents;
(3) The segment information data and the event information data are managed in an object mode and are respectively stored in the linked list, the segment information and the event information are related with each other through the event sequence number in the segment information content, the event sequence number in the segment information content corresponds to the event information in the memory one by one in a memory mapping mode, the related event information is conveniently and rapidly triggered in the execution process of the segment information, and the real-time performance of the test is improved;
(4) After the dynamic parameter configuration is completed in the temperature cycle process, manual intervention is not needed, and the condition that the temperature cycle test flow cannot meet the requirements due to the introduction of other errors is avoided;
(5) The custom triggering event of the event in the invention can be personalized according to the tested product and the temperature cycle flow, and the data acquisition flow, the power on and off of the product, the alarm and the like, thereby meeting the specific requirements of most temperature cycle test flows and leading the application of the invention to be wider.
The above is only a preferred embodiment of the present invention, and is not intended to limit the present invention, but various modifications and variations can be made to the present invention by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (7)
1. An automatic temperature cycle testing device is characterized by comprising a parameter acquisition unit, a judging unit, a dynamic parameter configuration unit, a plurality of section units, a plurality of event units and an external device;
The parameter acquisition unit acquires the time, temperature and configuration parameters of the start of the automatic temperature cycle test, and transmits the result to the dynamic parameter configuration unit;
The dynamic parameter configuration unit generates a dynamic parameter configuration file according to the acquired data, and comprises a section information configuration device and an event information configuration device;
The segment information configuration device configures segment information of the segment unit according to the dynamic parameter configuration file, wherein the segment information configuration content comprises a segment serial number, a segment name, a starting point, an ending point, an event and a segment cycle;
The event information configuration device configures event information for the event unit according to the dynamic parameter configuration file;
an event unit defines information of an event in the temperature cycle test process, controls an external device related to the event unit according to the event information, and transmits a running state to a judging unit;
a section unit defines the information of a section in the temperature cycle test process, controls an external device related to the section information according to the section information, and transmits the running state to a judging unit;
The judging unit judges according to the data of the dynamic parameter configuration unit, the running conditions of the event unit and the segment unit so as to determine whether the temperature cycle test content is finished.
2. The automatic warm-up testing device of claim 1, wherein the segment number is unique for identifying a piece of configuration content; the event is event information which needs to be triggered in the execution process of the piece of information, and the event sequence number is used for associating with the event information; the segment circulation comprises a segment information sequence number and circulation times which need to be circularly tested.
3. The automatic warm-cycle testing apparatus of claim 1, wherein the event information configuration content comprises an event number, an event name, a time, a type, and a parameter.
4. An automatic warm-up testing device according to claim 3, wherein said event sequence number is unique for identifying an event; the time is the duration of the event execution; the event types comprise a start test event, a stop test event, a cycle start event, a cycle end event, a number of cycle events, a cycle execution event, an execution segment sequence number event and a user-defined event; the parameters are configuration parameters of each event.
5. The automatic warm-up testing device of claim 4, wherein the event information is triggered by an event in the segment information.
6. An automatic temperature cycling testing method of an automatic temperature cycling testing device according to any of claims 1-5, wherein the method comprises the steps of:
carrying out dynamic parameter information configuration on the segment information and the event information according to the requirements of the temperature cycle test;
setting a starting section sequence number N;
setting a starting time T of a starting section;
setting a cycle starting sequence number and times;
Executing segment information of the sequence number N, checking whether an event trigger exists, and executing the triggered event if the event trigger exists;
After the triggered event is finished or without the triggered event, checking whether a segment circulation exists, if so, circularly executing the appointed segment information, and if not, executing the N+1 segment information until all the segment information is executed.
7. The automatic temperature cycle test apparatus of claim 6, wherein the step of configuring the dynamic parameter information comprises:
Generating a dynamic parameter configuration file according to the temperature cycle test requirement;
configuring each piece of information according to the dynamic parameter configuration file;
After the configuration of the segment information is completed, the event information is configured according to the dynamic parameter configuration file.
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