CN113624250A - Automatic temperature cycle testing device and method - Google Patents
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Abstract
The invention provides an automatic temperature cycle testing device and method, which are realized by the following steps: according to the requirement of the temperature cycle test, carrying out dynamic parameter information configuration on the segment information and the event information; setting a starting segment sequence number N; setting a starting time T of the starting section; setting a cycle starting sequence number and times; executing the segment information of the sequence number N, checking whether an event is triggered, and if so, executing the triggered event; and after the triggered event is finished or the triggered event is not finished, checking whether segment circulation exists or not, if so, executing the specified segment information in a circulating way, and if not, executing the N +1 segment information until all the segment information is executed. According to the invention, through the configuration of the segment information and the event information, the configuration of the corresponding segment information and the event information is only required to be changed in different testing processes, and the design, the coding, the testing and the realization are not required to be carried out again, so that the temperature cycle testing process can be realized quickly and efficiently.
Description
Technical Field
The invention belongs to the technical field of temperature cycle testing, and particularly relates to an automatic temperature cycle testing device and method.
Background
Before the inertia products such as the inertia control inertia measurement system and the sub-components thereof are formally used, high and low temperature cycle tests are required. By applying proper temperature cyclic stress to the inertia product, defects in the aspects of inertia product manufacturing process, components and the like are found and eliminated, so that the reliability of the product is improved, and the quality of the product is ensured.
A temperature cycle generally comprises a pretreatment phase, a high temperature rise phase, a high temperature hold phase, a low temperature fall phase, and a low temperature hold phase. The temperature cycle testing process usually needs several temperature cycles to be repeated, the inertia product is started at a specific time point of a specific stage, the product is controlled to be powered on, and communication data acquisition is carried out, so that the performance index of the product is judged. Different inertia products have different final application scenes and application environments, and generally have different temperature cycle test flows. It is common practice to design, encode, test and implement each test flow by measurement and control software. Although the method can well meet the specified requirements, the adaptability is poor, and the design, the coding, the test and the implementation need to be carried out again after any change in the test process. The method has the advantages of complex operation, low efficiency, incapability of meeting the requirement of test flow change, and incapability of meeting the requirement of the temperature cycle test flow caused by introducing other errors sometimes.
Disclosure of Invention
The invention aims to overcome the defects in the prior art and provides an automatic temperature cycle testing device and method. The scheme of the invention can solve the problems in the prior art.
The technical solution of the invention is as follows:
according to one aspect of the invention, an automatic temperature cycle testing device is provided, which comprises a parameter acquisition unit, a judgment unit, a dynamic parameter configuration unit, a plurality of segment units, a plurality of event units and an external device;
the parameter acquisition unit acquires the time and temperature of the automatic temperature cycle test and the configuration parameters of the start of the test and transmits the result to the dynamic parameter configuration unit;
the dynamic parameter configuration unit generates a dynamic parameter configuration file according to the acquired data, and comprises a segment information configuration device and an event information configuration device;
the segment information configuration device configures the segment information of the segment unit according to the dynamic parameter configuration file;
the event information configuration device configures event information for the event unit according to the dynamic parameter configuration file;
the event unit defines information of an event in the temperature cycle test process, controls an external device related to the event unit according to the event information and transmits a running completion state to the judging unit;
the section unit defines information of a section in the temperature cycle test process, controls an external device related to the section according to the section information and transmits a running completion state to the judgment unit;
the judging unit judges according to the data of the dynamic parameter configuration unit, the operation conditions of the event unit and the segment unit so as to determine whether the temperature cycle test content is finished.
The working process is as follows: inputting the process and parameters to be tested in the temperature cycle test process into a dynamic parameter configuration unit through a parameter acquisition unit, dividing the temperature cycle test into different processes, wherein each process corresponds to a section unit, events in the temperature cycle test process correspond to different event units according to different types, the section units and the event units control related devices connected externally to work, section information and event information in the section units and the event units are configured in the dynamic parameter configuration unit, the setting of the whole temperature cycle test process is completed, a judgment unit judges dynamic parameters, and the temperature cycle test process is finished after the defined section information is executed.
Further, the segment information configuration content includes a segment sequence number, a segment name, a start point, an end point, an event, and a segment cycle.
Furthermore, the segment sequence number is unique and is used for identifying a piece of configuration content.
Furthermore, the event is event information which needs to be triggered in the execution process of the segment of information, and the event sequence number is associated with the event information.
Further, the segment loop includes a segment information sequence number and a loop number to be tested in a loop.
Further, the event information configuration content includes an event sequence number, an event name, time, type and parameters.
Furthermore, the event sequence number is unique and is used for identifying an event.
Further, the time is the duration of the event.
Further, the event types comprise a start test event, a stop test event, a cycle start event, a cycle end event, a cycle number, a cycle in execution event, an execution segment sequence number event and a user-defined event.
Further, the parameter is a configuration parameter of each event.
Further, the event information is triggered by an event in the segment information.
According to another aspect of the present invention, there is provided an automatic temperature cycle testing method, which is implemented by the steps of:
according to the requirement of the temperature cycle test, carrying out dynamic parameter information configuration on the segment information and the event information;
setting a starting segment sequence number N;
setting a starting time T of the starting section;
setting a cycle starting sequence number and times;
executing the segment information of the sequence number N, checking whether an event is triggered, and if so, executing the triggered event;
and after the triggered event is finished or the triggered event is not finished, checking whether segment circulation exists or not, if so, executing the specified segment information in a circulating way, and if not, executing the N +1 segment information until all the segment information is executed.
Further, the step of configuring the dynamic parameter information is as follows:
generating a dynamic parameter configuration file according to the requirement of the temperature cycle test;
configuring each segment of information according to the dynamic parameter configuration file;
and after the section information configuration is finished, configuring the event information according to the dynamic parameter configuration file.
Compared with the prior art, the invention has the beneficial effects that:
(1) according to the invention, through the configuration of the segment information and the event information, only the configuration of the corresponding segment information and the event information needs to be changed in different testing processes, and the design, the coding, the testing and the realization are not needed to be carried out again, so that the temperature cycle testing process can be realized quickly and efficiently;
(2) according to the invention, after the dynamic parameter configuration is completed in the temperature cycle process, manual intervention is not required, and the condition that the temperature cycle test flow cannot meet the requirement due to the introduction of other errors is avoided.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort.
FIG. 1 is a schematic diagram of an automatic thermal cycling testing apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic diagram illustrating a process of an automatic temperature cycle testing method according to an embodiment of the present invention;
FIG. 3 is a diagram illustrating a dynamic parameter configuration according to an embodiment of the present invention;
fig. 4 is a diagram illustrating a segment information configuration according to an embodiment of the present invention;
FIG. 5 is a diagram illustrating content of an event information configuration provided according to an embodiment of the present invention;
FIG. 6 is a diagram illustrating association between segment information and event information provided according to an embodiment of the present invention;
FIG. 7 is a diagram illustrating a structure of a segment object and an event object linked list according to an embodiment of the present invention;
FIG. 8 is a diagram illustrating a memory mapping relationship between a segment object linked list and an event object linked list according to an embodiment of the present invention;
fig. 9 shows a flow chart of dynamic parameter configuration provided according to an embodiment of the present invention.
Detailed Description
It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments according to the present application. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, and it should be understood that when the terms "comprises" and/or "comprising" are used in this specification, they specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof, unless the context clearly indicates otherwise.
The relative arrangement of the components and steps, the numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention unless specifically stated otherwise. Meanwhile, it should be understood that the sizes of the respective portions shown in the drawings are not drawn in an actual proportional relationship for the convenience of description. Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate. In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values. It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.
As shown in fig. 1, an automatic temperature cycling testing device according to an embodiment includes a parameter collecting unit, a determining unit, a dynamic parameter configuring unit, a plurality of segment units, a plurality of event units, and an external device;
the parameter acquisition unit acquires time and temperature of the automatic temperature cycle test and configuration parameters of the start of the test, and transmits results to the dynamic parameter configuration unit;
the dynamic parameter configuration unit generates a dynamic parameter configuration file according to the acquired data, and comprises a segment information configuration device and an event information configuration device;
the segment information configuration device performs segment information configuration on the segment unit according to the dynamic parameter configuration file, and the event information configuration device performs event information configuration on the event unit according to the dynamic parameter configuration file;
and one section unit defines information of one section in the temperature cycle test process, controls an external device related to the section according to the information of the section and transmits the running completion state to the judging unit. In one embodiment, the segment information configuration content includes a segment sequence number, a segment name, a start point, an end point, an event, and a segment loop; the segment sequence number is unique and is used for identifying a piece of configuration content; the event is event information which needs to be triggered in the execution process of the information segment and is related by an event serial number; the segment loop comprises a segment information sequence number and a loop number which need to be tested circularly.
And an event unit defines the information of an event in the temperature cycle test process, controls an external device related to the event unit according to the event information and transmits the running completion state to the judgment unit. In one embodiment, the event information configuration content comprises an event sequence number, an event name, time, type and parameters, wherein the event sequence number is unique and used for identifying an event, and the time is the execution duration of the event; the types comprise a start test event, a stop test event, a cycle start event, a cycle end event, a cycle number of events, a cycle execution middle event, an execution segment sequence number event and a user defined event; the parameters are configuration parameters for each event.
The judging unit judges the data of the dynamic parameter configuration unit, the operation conditions of the event unit and the segment unit so as to determine whether the temperature cycle test content is finished or not; .
The working process is as follows: inputting the process and parameters to be tested in the temperature cycle test process into a dynamic parameter configuration unit through a parameter acquisition unit, dividing the temperature cycle test into different processes, wherein each process corresponds to a section unit, events in the temperature cycle test process correspond to different event units according to different types, the section units and the event units control related devices connected externally to work, section information and event information in the section units and the event units are configured in the dynamic parameter configuration unit, the setting of the whole temperature cycle test process is completed, a judgment unit judges dynamic parameters, and the temperature cycle test process is finished after the defined section information is executed.
In one embodiment, the event information is triggered by an event in the segment information.
According to another embodiment of the present invention, there is provided an automatic temperature cycle testing method, which is implemented by the following steps:
according to the requirement of the temperature cycle test, carrying out information configuration on the segment information and the event information;
setting a starting segment sequence number N;
setting a starting time T of the starting section;
setting a segment cycle starting sequence number and times;
executing the segment information of the sequence number N, checking whether an event is triggered, and if so, executing the triggered event;
and after the triggered event is finished or the triggered event is not finished, checking whether segment circulation exists or not, if so, executing the specified segment information in a circulating way, and if not, executing the N +1 segment information until all the segment information is executed.
Further in one embodiment, the information configuring step is:
generating a dynamic parameter configuration file according to the requirement of the temperature cycle test;
configuring each segment of information according to the dynamic parameter configuration file;
after the section information configuration is completed, configuring the event information according to the dynamic parameter configuration file;
in one embodiment, as shown in fig. 2, an automatic temperature cycle test method is implemented by the following steps:
step one, according to the requirement of temperature cycle test, carrying out dynamic parameter information configuration on segment information and event information;
as shown in fig. 9, the step of configuring the dynamic parameter information includes:
s1.1, generating a dynamic parameter configuration file according to the requirement of the temperature cycle test; as shown in fig. 3, the dynamic parameter configuration file mainly includes two parts of content, a segment information configuration content and an event information configuration content;
s1.2, configuring each segment of information according to the dynamic parameter configuration file; the section information configuration content is composed of one or more pieces of section information, and one piece of section information can represent the stages of a temperature cycle test, such as a preprocessing stage, a high temperature raising stage, a high temperature maintaining stage, a low temperature lowering stage and a low temperature maintaining stage. In one embodiment, as shown in fig. 4, the segment information configuration contents include a segment sequence number, a segment name, a start point, an end point, an event, and a segment loop, and the contents of the segment information configuration are shown in table 1:
TABLE 1
The segment sequence number of each piece of segment information configuration content must be unique, the starting point (3 in table 1) is the basis for starting the execution of one piece of segment information, the ending point (4 in table 1) is the basis for ending the execution of one piece of segment information, and the relevant events in the segment information are triggered by combining the control time and the control temperature when the segment information is executed. If the triggering event content (5 in table 1) exists, one piece of information can trigger one or more pieces of event information, and all pieces of event information related to the piece of information are triggered according to the triggering time in sequence; and if the segment circulation test is needed (6 in the table 1), sequentially and circularly executing the content of each segment of information according to the segment circulation information configured by the segment information.
In one embodiment, the starting point and the ending point include a control time, a control temperature, a maximum temperature error value, and a minimum temperature error value, as shown in table 2:
TABLE 2
| Serial number | Content providing method and apparatus | Description of the |
| 1 | Controlling time | Operating System timing time, Unit min |
| 2 | Controlling temperature | Control temperature value of product during the |
| 3 | Maximum value of temperature error | Maximum value of error allowed to occur during temperature control |
| 4 | Minimum value of temperature error | Maximum value of error allowed to occur during temperature control |
In one embodiment, the event configuration content includes a trigger time and an event sequence number, as shown in table 3:
TABLE 3
As can be seen in table 3, the events (sequence number 5 in table 1) configuring the contents by the segment information are correlated with each other. The event information is triggered and executed through the segment information, the event sequence number in the segment information is the identifier of the event information, the segment information triggers the corresponding event information through the sequence number of the event information, a plurality of event information can be triggered in one segment information and is sequentially triggered and executed according to the triggering time sequence, and the mutual relationship between the event information and the triggering time sequence is shown in fig. 6.
In one embodiment, the segment loop configuration content includes the number of times and the segment sequence number, as shown in table 4:
TABLE 4
| Serial number | Content providing method and apparatus | Description of the |
| 1 | Number of times | Number of cycles |
| 2 | Serial number | Sequence number corresponding to segment information needing circulation |
S1.3, after the information configuration is completed, configuring event information according to the dynamic parameter configuration file;
in one embodiment, as shown in fig. 5, the event information includes an event sequence number, an event name, a time, a type and parameters, and the contents are shown in table 5:
TABLE 5
| Serial number | Content providing method and apparatus | Description of the |
|
| 1 | Event sequence number | Event sequence number | |
| 2 | Event | Event name | |
| 3 | Time | Duration of event | |
| 4 | Type (B) | Event message types, see in particular Table 6 | |
| 5 | Parameter(s) | Other parameters |
The sequence number of each piece of event information configuration content is unique, the segment sequence number and the event sequence number are not related, the segment sequence number and the event sequence number are related to each other through an event (the sequence number 5 in the table 1) of the segment information configuration content, each event defines duration, and the event automatically stops after the duration.
In one embodiment, the event information is triggered by an event in the segment information, and the event types include a start test event, a stop test event, a cycle start event, a cycle end event, a cycle number, a cycle in execution event, an execution segment sequence number event, and a user-defined event, which are shown in table 6. In one embodiment, through the user-defined type, the user can customize the event type according to the test requirement when applying, for example: data acquisition events, product power-on and power-off events, alarm events, and the like. The specific requirements in most temperature cycle test procedures can be met by customizing the event types by users.
In one embodiment, for convenience of management, a dynamic parameter configuration file for configuring the complete contents is loaded into the memory, and each piece of segment information data contents forms an independent "segment information object" and is stored in a segment information object linked list as shown in fig. 7. Each piece of event information data content forms an independent 'event information object', and is stored in an event information object linked list as shown in fig. 7. Corresponding objects are managed in a linked list mode, segment information objects are stored in a segment information linked list, and event information objects are stored in an event information linked list. As shown in FIG. 8, each object in the linked list has a unique index number corresponding to it. The serial numbers in the segment information objects and the serial numbers of the segment information linked lists are in one-to-one correspondence in the memory in a memory mapping mode; the sequence numbers in the event information object and the sequence numbers of the event information linked list are in one-to-one correspondence in the memory in a memory mapping mode.
Setting a starting segment sequence number N, wherein N is smaller than the maximum segment sequence number in the configuration file;
setting a starting time T of the starting section, wherein the starting time < T < the ending time;
setting a segment cycle starting sequence number and times M, wherein M is less than or equal to the segment cycle times in the segment information configuration file;
step five, executing the segment information of the serial number N, checking whether an event is triggered, and if so, executing the triggered event;
and step six, after the triggered event is finished or no triggered event exists, checking whether segment circulation exists or not, if yes, executing specified segment information in a circulating mode, and if not, executing the N +1 segment information until all the segment information is executed.
The automatic temperature cycle test process is mainly executed according to the segment information content, the initial segment information sequence number, the initial time and the initial cycle number can be set in advance before the user tests, and the segment information content in the segment object linked list is sequentially executed from the initial segment information according to the set information after the test starts. When executing a certain 'segment information object', judging the segment information content starting point time and the current test temperature to execute the segment information; and judging the end point time of the segment information content and the end of the segment information at the current test temperature. The event item in the segment information content can be '-1', which indicates that no event needs to be triggered at this time, and when the event item is not '-1', the corresponding event information is directly and quickly obtained in a memory linked list through a memory mapping mode through the event sequence number, and the event information is triggered and executed; and sequentially triggering execution when the events are not unique. And when the cyclic item is not-1', directly and quickly acquiring corresponding segment information in a memory linked list in a memory mapping mode through the segment information serial number configured in the cyclic item and sequentially executing.
In summary, the automatic temperature cycling test device and method of the present invention have at least the following advantages over the prior art:
(1) the automatic temperature cycle test is realized by dynamic parameter configuration, the parameter configuration file is dynamically configured according to different test requirements, and once the temperature cycle test flow is changed, the dynamic parameter configuration file is only required to be reconfigured according to the change requirement;
(2) the dynamic parameter configuration file integrates the segment information and the event information into one file, so that the unified management is realized, the software development or the temperature cycle process re-change of a user are convenient, and the contents of other software and hardware are not depended on;
(3) the segment information data and the event information data are managed in an object mode and are respectively stored in the linked list, the segment information and the event information are correlated through the event sequence number in the segment information content, the event sequence number in the segment information content and the event information are in one-to-one correspondence in the memory in a memory mapping mode, the segment information is convenient to quickly trigger the correlated event information in the executing process, and the real-time performance of the test is improved;
(4) after the dynamic parameter configuration is completed in the temperature cycle process, manual intervention is not needed, and the condition that the temperature cycle test flow cannot meet the requirement due to the introduction of other errors is avoided;
(5) the self-defined trigger event of the event in the invention can be used for carrying out personalized processing, data acquisition flow, product power-on and power-off, alarm and the like according to the tested product and the temperature cycle flow, thereby meeting the specific requirements of most temperature cycle test flows and leading the application of the invention to be wider.
The above is only a preferred embodiment of the present invention, and is not intended to limit the present invention, and various modifications and changes will occur to those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (8)
1. An automatic temperature cycle testing device is characterized by comprising a parameter acquisition unit, a judgment unit, a dynamic parameter configuration unit, a plurality of section units, a plurality of event units and an external device;
the parameter acquisition unit acquires the time and temperature of the automatic temperature cycle test and the configuration parameters of the start of the test and transmits the result to the dynamic parameter configuration unit;
the dynamic parameter configuration unit generates a dynamic parameter configuration file according to the acquired data, and comprises a segment information configuration device and an event information configuration device;
the segment information configuration device configures the segment information of the segment unit according to the dynamic parameter configuration file;
the event information configuration device configures event information for the event unit according to the dynamic parameter configuration file;
the event unit defines information of an event in the temperature cycle test process, controls an external device related to the event unit according to the event information and transmits a running completion state to the judging unit;
the section unit defines information of a section in the temperature cycle test process, controls an external device related to the section according to the section information and transmits a running completion state to the judgment unit;
the judging unit judges according to the data of the dynamic parameter configuration unit, the operation conditions of the event unit and the segment unit so as to determine whether the temperature cycle test content is finished.
2. The automatic thermal cycler test device of claim 1, wherein the segment information configuration comprises a segment sequence number, a segment name, a start point, an end point, an event, and a segment cycle.
3. An automatic thermal cycler test device as claimed in claim 2, wherein the segment sequence number is unique and identifies a configuration; the event is event information which needs to be triggered in the execution process of the information segment, and the event sequence number is associated with the event information; the segment loop comprises segment information serial numbers and loop times needing loop test.
4. The automatic thermal cycler test device of claim 1, wherein the event information configuration comprises an event sequence number, an event name, a time, a type, and parameters.
5. An automatic thermal cycler test device as recited in claim 4, wherein the event number is unique and identifies an event; the time is the duration of the event execution; the event types comprise a start test event, a stop test event, a cycle start event, a cycle end event, a cycle event for the next time, a cycle execution middle event, an execution segment sequence number event and a user-defined event; the parameters are configuration parameters of each event.
6. An automatic thermocycling device according to any one of claims 1 to 5 wherein the event information is triggered by an event in the segment information.
7. The method of claims 1-6, wherein the method comprises the steps of:
according to the requirement of the temperature cycle test, carrying out dynamic parameter information configuration on the segment information and the event information;
setting a starting segment sequence number N;
setting a starting time T of the starting section;
setting a cycle starting sequence number and times;
executing the segment information of the sequence number N, checking whether an event is triggered, and if so, executing the triggered event;
and after the triggered event is finished or the triggered event is not finished, checking whether segment circulation exists or not, if so, executing the specified segment information in a circulating way, and if not, executing the N +1 segment information until all the segment information is executed.
8. The automatic thermal cycler test device of claim 7, wherein the step of configuring the dynamic parameter information comprises:
generating a dynamic parameter configuration file according to the requirement of the temperature cycle test;
configuring each segment of information according to the dynamic parameter configuration file;
and after the section information configuration is finished, configuring the event information according to the dynamic parameter configuration file.
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