CN113612102A - Self-rotating terahertz generation device - Google Patents
Self-rotating terahertz generation device Download PDFInfo
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- CN113612102A CN113612102A CN202110872824.8A CN202110872824A CN113612102A CN 113612102 A CN113612102 A CN 113612102A CN 202110872824 A CN202110872824 A CN 202110872824A CN 113612102 A CN113612102 A CN 113612102A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S1/00—Masers, i.e. devices using stimulated emission of electromagnetic radiation in the microwave range
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
- G02B27/283—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising used for beam splitting or combining
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2302/00—Amplification / lasing wavelength
- H01S2302/02—THz - lasers, i.e. lasers with emission in the wavelength range of typically 0.1 mm to 1 mm
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- Optics & Photonics (AREA)
- Electromagnetism (AREA)
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- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention discloses a spinning terahertz generation device which comprises an emitter shell, a pumping light incidence hole, a polarization beam splitter, a quarter-wave plate, a focusing lens, a spinning terahertz emitter and a detection light emergence hole; the spinning terahertz transmitter consists of a permanent magnet, a spinning terahertz sample wafer and a silicon lens; the spin terahertz sample wafer is fixed at the focus of the focusing lens in parallel with the pump light incident hole, and the femtosecond laser incident from the pump light incident hole is converged on the spin terahertz sample wafer by the focusing lens; the femtosecond laser energy is completely acted on the spinning terahertz transmitter by introducing the polarization beam splitter and the quarter wave plate, and the generated terahertz is detected by the femtosecond laser reflected by the spinning terahertz transmitter, so that the energy utilization rate of the femtosecond laser is greatly improved, and the generated terahertz signal is enhanced.
Description
Technical Field
The invention relates to the technical field of terahertz, in particular to a spinning terahertz generation device.
Background
The spinning terahertz generation device has the advantages that the terahertz frequency band is located between infrared and microwave, is a transition frequency band of macroscopic electronics and microscopic photonics, has various advantages of broadband property, low energy, high permeability, uniqueness and the like, and has great scientific value and wide application prospect in the fields of nondestructive testing, satellite communication, medical diagnosis, satellite communication and the like. The spinning terahertz source has the advantages of low cost, high efficiency and the like due to the unique terahertz generation mechanism, and is an important development direction of the future terahertz technology.
The size of the terahertz generated by the spinning terahertz transmitter is irrelevant to the polarization state of the femtosecond laser acting on the spinning terahertz transmitter, but is closely relevant to the energy of the femtosecond laser, the spinning terahertz system in the prior art needs to adopt a beam splitter to divide the femtosecond laser into two beams which are respectively used for generating and detecting the terahertz, the utilization rate of the femtosecond laser is low, and the generated terahertz is weak.
Disclosure of Invention
The spin terahertz generation device provided by the invention can solve the technical problem.
In order to achieve the purpose, the invention adopts the following technical scheme:
a spin terahertz generation device comprises an emitter shell, a pumping light incident hole, a polarization beam splitter, a quarter wave plate, a focusing lens, a spin terahertz emitter and a detection light emergent hole;
the spinning terahertz transmitter consists of a permanent magnet I, a permanent magnet II, a spinning terahertz sample wafer and a silicon lens; the spinning terahertz sample wafer is tightly attached to the silicon lens, and the first permanent magnet and the permanent magnet are symmetrically fixed on two sides of the spinning terahertz sample wafer;
the focusing lens is positioned between the quarter-wave plate and the spin terahertz transmitter, and the spin terahertz sample plate is fixed at the focal point of the focusing lens in a manner of being parallel to the pump light incident hole. The femtosecond laser with the polarization direction parallel to the transmission direction of the polarization beam splitter is incident from a pump light incident hole, then is converged on a spinning terahertz sample wafer by a focusing lens through a quarter-wave plate to generate terahertz radiation, and the radiated terahertz is output after being collimated by a silicon lens;
the femtosecond laser reflected by the surface of the spinning terahertz sample plate is called terahertz detection light, and the terahertz detection light sequentially passes through the focusing lens, the quarter-wave plate and the polarization beam splitter and then is emitted from the detection light emitting hole.
Furthermore, the included angle between the pump light incident hole and the probe light emergent hole is 90 degrees, and two surfaces of the polarization beam splitter are respectively parallel to the pump light incident hole and the probe light emergent hole.
Furthermore, the fast axis direction of the quarter-wave plate and the polarization direction of the transmitted light of the polarization beam splitter form an angle of 45 degrees; after the linearly polarized light passes through the quarter-wave plate, the polarization state of the linearly polarized light is changed into circular polarization.
According to the technical scheme, the spin terahertz generation device has the following beneficial effects:
according to the spinning terahertz high-efficiency transmitter, all femtosecond laser is applied to the spinning terahertz transmitter by adopting the polarization beam splitter, the generated terahertz is detected by taking the femtosecond laser reflected by the surface of the spinning terahertz transmitter as detection light, the polarization state of the terahertz detection light is orthogonal to the polarization state of the femtosecond laser penetrating through the polarization beam splitter by introducing the quarter wave plate, and then the terahertz detection light is reflected and output by utilizing the polarization beam splitter again, so that the energy utilization rate of the femtosecond laser in the whole process is greatly improved, and the generated terahertz signal is enhanced.
Obviously, when the polarization direction of the femtosecond laser incident from the pump light incident hole is parallel to the transmission direction of the polarization beam splitter, the energy utilization rate of the femtosecond laser is the highest, and the generated terahertz signal is the strongest.
Drawings
FIG. 1 is an overall block diagram of the present invention;
in the figure: 101 a transmitter housing; 102 pump light entrance holes; 103 a polarizing beam splitter; 104 a quarter wave plate; 105 a focusing lens; 106 permanent magnets; 107 permanent magnets; 108 spinning the terahertz sample wafer; 109 a silicon lens; the light exit aperture is detected 110.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention.
As shown in fig. 1, the spin terahertz high-efficiency transmitter according to the embodiment includes a transmitter housing 101, a pump light incident hole 102, a polarization beam splitter 103, a quarter-wave plate 104, a focusing lens 105, a spin terahertz transmitter, and a detection light emergent hole 110; the spin terahertz transmitter consists of a first permanent magnet 106, a second permanent magnet 107, a spin terahertz sample piece 108 and a silicon lens 109; the arrow direction in the drawing is the magnetic field direction of the permanent magnets 106 and 107.
The focusing lens 105 is located between the quarter-wave plate 104 and the spin terahertz transmitter, the spin terahertz sample 108 is fixed at the focal point of the focusing lens in parallel with the pump light incident hole 102, and the femtosecond laser incident from the pump light incident hole 102 is converged on the spin terahertz sample 108 by the focusing lens 105.
The included angle between the pump light incident hole 102 and the probe light emergent hole 110 is 90 degrees, and two surfaces of the polarization beam splitter are respectively parallel to the pump light incident hole 102 and the probe light emergent hole 110; commercial polarizing beamsplitter 103 is a 90 ° polarizing beamsplitter, such that the 90 ° design allows polarized beamsplitter light to enter 102 and exit 110.
The fast axis direction of the quarter-wave plate 104 forms an angle of 45 degrees with the polarization direction of the transmission light of the polarization beam splitter 103; after the linearly polarized light passes through the quarter-wave plate 104, the polarization state of the linearly polarized light is changed into circular polarization; the circularly polarized pump light is focused on the spinning sample 108 by the focusing lens 105 to generate terahertz radiation, and the radiated terahertz radiation is collimated by the silicon lens 109 and then output.
The femtosecond laser reflected by the surface of the spinning terahertz sample plate 108 is called terahertz detection light, and after passing through the focusing lens 105 and the quarter-wave plate 104 in sequence, the polarization state of the femtosecond laser is changed from circular polarization into linearly polarized light orthogonal to the input light of the pump light incident hole 102, and then the linearly polarized light passes through the polarization beam splitter 103 and is emitted from the detection light emitting hole 110.
The spinning terahertz sample wafer 108 is tightly attached to the silicon lens 109 and used for improving the terahertz emission efficiency, and if a gap exists in the middle, the silicon lens has a reflection effect on the emergent terahertz, so that the final terahertz emission efficiency is reduced; the permanent magnet I106 and the permanent magnet II 107 are symmetrically fixed on two sides of the spin terahertz sample piece 108 and are used for magnetizing a spin sample.
It is assumed that when the polarization direction of the incident femtosecond laser is perpendicular to the paper surface direction, all the femtosecond laser transmits through the polarization beam splitter 103, and the terahertz generation efficiency is highest at this time. The polarization direction of the incident femtosecond laser can be manually adjusted without being considered in the scope of the invention.
The following description will be made with a preferred example in which the polarization direction of the incident femtosecond laser is the direction perpendicular to the paper surface.
When linearly polarized femtosecond laser passes through the polarization beam splitter 103 and the quarter wave plate 104, the polarization direction of the linearly polarized femtosecond laser is changed into circularly polarized light, the circularly polarized light is focused on the spinning terahertz sample plate 108 by the focusing lens 105 to generate terahertz radiation, and the radiated terahertz radiation is collimated by the silicon lens 109 and then output; the femtosecond laser reflected by the surface of the spinning terahertz sample plate 108 is called terahertz detection light, passes through the quarter-wave plate 104 through the focusing lens 105 in the original path, has a polarization direction which is linearly polarized light vertical to the paper surface at the moment, is orthogonal to the polarization direction of the originally incident femtosecond laser, is reflected by the polarization beam splitter 103, is emitted through the detection light emitting hole 110, and is used for detecting the generated terahertz.
The whole femtosecond laser polarization state evolution process is mathematically explained by means of a Jones matrix. The Jones matrix with the polarization direction of the incident femtosecond laser vertical to the paper surface is assumed as
As mentioned above, the fast axis direction of the quarter-wave plate 104 forms an angle of 45 degrees with the polarization direction of the light transmitted by the polarization beam splitter 103, and when the incident femtosecond laser first passes through the quarter-wave plate, the Jones matrix thereof is
Then the femtosecond laser is focused on the spinning terahertz sample piece 108 by the focusing lens 109, wherein part of the femtosecond laser is reflected by the surface of the spinning terahertz sample piece 108, and the reflection matrix is
The reflected femtosecond laser is called terahertzThe detection light passes through the focusing lens 109 and the quarter wave plate 104 in sequence, and the transmission direction of the femtosecond laser is opposite to the direction of the femtosecond laser initially passing through the quarter wave plate 104, so that the quarter wave plate Jones matrix is
The detection light finally passing through the quarter-wave plate 104 is
It can be seen that the polarization state thereof is orthogonal to the originally incident femtosecond laser, and finally exits from the probe light exit hole 110 through the polarization beam splitter 103.
Therefore, the spin terahertz efficient transmitter provided by the embodiment completely acts on the spin transmitter by adopting the polarization beam splitter to irradiate the incident femtosecond laser polarized in the direction perpendicular to the paper surface, the femtosecond laser reflected by the surface of the spin terahertz efficient transmitter is used as detection light to detect the generated terahertz, the quarter-wave plate is introduced to rotate the polarization direction of the terahertz detection light by 90 degrees, the polarization beam splitter is reused to realize the reflection output of the terahertz detection light, the femtosecond laser energy utilization rate is greatly improved in the whole process, and the generated terahertz signal is enhanced.
The above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (4)
1. A spin terahertz generation device comprising a spin terahertz transmitter, a transmitter housing (101), a pump light incident hole (102), and a probe light exit hole (110), characterized in that:
the device also comprises a polarization beam splitter (103), a quarter wave plate (104) and a focusing lens (105);
the spin terahertz transmitter consists of a first permanent magnet (106), a second permanent magnet (107), a spin terahertz sample wafer (108) and a silicon lens (109); the spinning terahertz sample wafer (108) is tightly attached to the silicon lens (109), and the permanent magnet I (106) and the permanent magnet II (107) are symmetrically fixed on two sides of the spinning terahertz sample wafer (108);
the focusing lens (105) is positioned between the quarter-wave plate (104) and the spin terahertz transmitter, and the spin terahertz sample plate (108) is fixed at the focal point of the focusing lens in parallel with the pump light incident hole (102);
femtosecond laser with the polarization direction parallel to the transmission direction of the polarization beam splitter (103) is incident from a pump light incident hole (102), then is converged on a spinning terahertz sample wafer (108) by a focusing lens (105) through a quarter-wave plate (104) to generate terahertz radiation, and the radiated terahertz radiation is collimated by a silicon lens (109) and then is output;
the femtosecond laser reflected by the surface of the spinning terahertz sample wafer (108) is called terahertz detection light, and the terahertz detection light sequentially passes through a focusing lens (105), a quarter-wave plate (104) and a polarization beam splitter (103) and then is emitted from a detection light emitting hole (110).
2. The spin terahertz generation device of claim 1, wherein:
the included angle between the pump light incidence hole (102) and the probe light emergent hole (110) is 90 degrees.
3. The spin terahertz generation device of claim 2, wherein:
two surfaces of the polarization beam splitter (103) are respectively parallel to the pump light incidence hole (102) and the detection light emergent hole (110).
4. The spin terahertz generation device of claim 1, wherein:
the fast axis direction of the quarter-wave plate (104) and the polarization direction of the transmission light of the polarization beam splitter (103) form an angle of 45 degrees; after the linearly polarized light passes through the quarter wave plate (104), the polarization state of the linearly polarized light is changed into circular polarization.
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| CN202110872824.8A CN113612102B (en) | 2021-07-30 | 2021-07-30 | Spin terahertz generating device |
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| CN202110872824.8A CN113612102B (en) | 2021-07-30 | 2021-07-30 | Spin terahertz generating device |
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