CN113608041A - Load testing method, device, equipment and storage medium - Google Patents
Load testing method, device, equipment and storage medium Download PDFInfo
- Publication number
- CN113608041A CN113608041A CN202110712681.4A CN202110712681A CN113608041A CN 113608041 A CN113608041 A CN 113608041A CN 202110712681 A CN202110712681 A CN 202110712681A CN 113608041 A CN113608041 A CN 113608041A
- Authority
- CN
- China
- Prior art keywords
- tested
- phase
- current
- parameters
- secondary circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 79
- 238000000034 method Methods 0.000 claims abstract description 52
- 238000004590 computer program Methods 0.000 claims description 27
- 238000004364 calculation method Methods 0.000 claims description 25
- 238000004804 winding Methods 0.000 claims description 18
- 230000009466 transformation Effects 0.000 claims description 11
- 238000010586 diagram Methods 0.000 description 11
- 238000007796 conventional method Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
Abstract
The application relates to a load testing method, a device, equipment and a storage medium, wherein the method comprises the following steps: simultaneously acquiring current parameters to be tested in a secondary loop of the transformer aiming at each phase to be tested; each phase to be tested corresponds to a plurality of groups of current parameters respectively; calculating the target differential current of the phase to be tested according to the standard configuration parameters of the secondary circuit and the current parameters corresponding to the phase to be tested; and determining whether a fault exists in the secondary circuit according to all the actual differential flows to be tested and the target differential flows of the phases to be tested in the secondary circuit. The technical scheme provided by the embodiment of the application can improve the efficiency of the load test.
Description
Technical Field
The present application relates to the field of computer technologies, and in particular, to a method, an apparatus, a device, and a storage medium for testing a load.
Background
The on-load test is an important means for guaranteeing fault detection in a secondary circuit of a transformer, is necessary test work before operation after a transformer substation is newly built or is transformed, and is also a premise for guaranteeing safe operation of power equipment.
When the on-load test is carried out, generally, after all current amplitudes and phases in the secondary circuit of the transformer are collected, a worker carries out differential current calculation according to the collected current amplitudes and phases, and then the differential current calculation result is compared with the differential current calculation result displayed in a differential current protection device on the transformer to obtain a comparison result, so that whether a fault occurs in the secondary circuit of the transformer is determined according to the comparison result.
However, the existing load testing method can only acquire the single-phase current amplitude and phase at one time, and needs manual differential current calculation according to the acquired current amplitude and phase, so that the calculation amount is large, and the efficiency of the load testing is reduced.
Disclosure of Invention
Based on this, the embodiments of the present application provide a method, an apparatus, a device and a storage medium for testing a load, which can improve the efficiency of testing the load.
In a first aspect, a method for testing a load is provided, which includes:
simultaneously acquiring current parameters to be tested in a secondary loop of the transformer aiming at each phase to be tested; each phase to be tested corresponds to a plurality of groups of current parameters respectively; calculating the target differential current of the phase to be tested according to the standard configuration parameters of the secondary circuit and the current parameters corresponding to the phase to be tested; and determining whether a fault exists in the secondary circuit according to all the actual differential flows to be tested and the target differential flows of the phases to be tested in the secondary circuit.
In one embodiment, for each phase to be tested, simultaneously acquiring current parameters to be tested in a secondary loop of the transformer, including:
aiming at each phase to be tested, current parameters corresponding to the phases to be tested in the secondary loop are simultaneously collected through a plurality of current collecting channels; one current collection channel can be used for collecting a group of current parameters to be tested correspondingly.
In one embodiment, calculating the target differential current of the phase to be tested according to the standard configuration parameter of the secondary loop and the current parameter corresponding to the phase to be tested comprises:
acquiring standard configuration parameters of a secondary circuit, a preset current phase-shifting mode and zero-sequence current parameters corresponding to be tested; the standard configuration parameters comprise rated voltage and current transformer transformation ratio; and calculating the target differential current of the phase to be tested according to the standard configuration parameters, the preset current phase-shifting mode, the zero-sequence current parameters corresponding to the phase to be tested and the current parameters corresponding to the phase to be tested.
In one embodiment, calculating a target differential current of a phase to be tested according to a standard configuration parameter, a preset current phase-shifting mode, a zero-sequence current parameter corresponding to the phase to be tested, and a current parameter corresponding to the phase to be tested, includes:
calculating a reduced current corresponding to the test according to the standard configuration parameter, the preset current phase-shifting mode, the zero sequence current parameter corresponding to the test and the current parameter corresponding to the test; and calculating the target differential current of the phase to be tested according to the corresponding reduced current to be tested.
In one embodiment, determining whether a fault exists in the secondary circuit according to all the actual differential flows to be tested and the target differential flows of the phases to be tested in the secondary circuit includes:
judging whether the difference value between all actual difference streams to be tested corresponding to the secondary circuit and the target difference stream of the phase to be tested is smaller than a preset difference value threshold value or not; if yes, determining that no fault exists in the secondary loop.
In one embodiment, the method further includes:
acquiring actual configuration parameters of a secondary circuit; and calculating the actual differential current to be tested according to the actual configuration parameters of the secondary circuit and the current parameters to be tested.
In one embodiment, the transformer comprises a three-winding transformer, and the low side of the three-winding transformer adopts a double-branch wiring mode; the preset current phase shifting mode comprises phase shifting from a low side to a high side;
aiming at each phase to be tested, current parameters to be tested in a secondary loop of the transformer are simultaneously acquired, and the method comprises the following steps:
aiming at each phase to be tested, taking a phase adjacent to the phase to be tested as a target phase according to a preset current phase shifting mode; and simultaneously acquiring a current parameter of a phase to be tested at a high-voltage side, a current parameter of a phase to be tested at a medium-voltage side, a current parameter of a phase to be tested at a branch at a low-voltage side, a current parameter of a target phase at a branch at a low-voltage side, a current parameter of a phase to be tested at a branch at a low-voltage side and a current parameter of a target phase at a branch at a low-voltage side.
In a second aspect, there is provided a loaded test apparatus, the apparatus comprising:
the acquisition module is used for simultaneously acquiring current parameters to be tested corresponding to each phase to be tested in a secondary loop of the transformer; each phase to be tested corresponds to a plurality of groups of current parameters respectively;
the first calculation module is used for calculating the target differential current of the phase to be tested according to the standard configuration parameters of the secondary circuit and the current parameters corresponding to the phase to be tested;
and the determining module is used for determining whether a fault exists in the secondary circuit according to all the actual differential flows to be tested and corresponding target differential flows of the phases to be tested in the secondary circuit.
In a third aspect, a computer device is provided, comprising a memory and a processor, the memory storing a computer program, the computer program, when executed by the processor, implementing the method steps in any of the embodiments of the first aspect.
In a fourth aspect, a computer-readable storage medium is provided, on which a computer program is stored, which computer program, when being executed by a processor, is adapted to carry out the method steps of any of the embodiments of the first aspect described above.
According to the load testing method, the device, the equipment and the storage medium, aiming at each phase to be tested, and aiming at each phase to be tested, current parameters corresponding to the phases to be tested in a secondary loop of the transformer are collected simultaneously; calculating the target differential current of the phase to be tested according to the standard configuration parameters of the secondary circuit and the current parameters corresponding to the phase to be tested; and determining whether a fault exists in the secondary circuit according to all the actual differential flows to be tested and the target differential flows of the phases to be tested in the secondary circuit. In the technical scheme provided by the embodiment of the application, as the current acquisition channel of the load tester is expanded, a plurality of groups of current parameters to be tested can be acquired simultaneously, so that the efficiency of acquiring current data is improved, and the efficiency of carrying out load testing is improved; in addition, the load tester can directly perform differential current calculation on the phases to be tested according to the obtained current parameters, manual calculation is not needed, and the efficiency of the load test is further improved.
Drawings
FIG. 1 is a block diagram of a computer device provided by an embodiment of the present application;
fig. 2 is a flowchart of a method for testing a load according to an embodiment of the present disclosure;
fig. 3 is a schematic diagram illustrating a difference flow calculation performed by a conventional method according to this embodiment;
fig. 4 is a flowchart of a method for testing a load according to an embodiment of the present disclosure;
fig. 5 is a schematic current flow diagram of different sides of a transformer according to an embodiment of the present disclosure;
fig. 6 is a schematic diagram of current phases on different sides of a transformer according to an embodiment of the present disclosure;
fig. 7 is a flowchart of a method for testing a load according to an embodiment of the present disclosure;
fig. 8 is a flowchart of a method for testing a load according to an embodiment of the present disclosure;
FIG. 9 is a flowchart of a load test for all test phases according to an embodiment of the present disclosure;
FIG. 10 is a flowchart of a method for testing a load according to an embodiment of the present disclosure;
fig. 11 is a flowchart of a method for testing a load according to an embodiment of the present disclosure;
fig. 12 is a block diagram of a load testing apparatus according to an embodiment of the present application.
Detailed Description
To make the objects, technical solutions and advantages of the present application more clear, embodiments of the present application will be described in further detail below with reference to the accompanying drawings.
The load testing method provided by the application can be applied to computer equipment, the computer equipment can be a server or a terminal, the server can be one server or a server cluster consisting of a plurality of servers, the load testing method is not particularly limited in the embodiment of the application, and the terminal can be but is not limited to various personal computers, notebook computers, smart phones, tablet computers and portable wearable equipment.
Taking the example of a computer device being a server, FIG. 1 shows a block diagram of a server, which may include a processor and memory connected by a system bus, as shown in FIG. 1. Wherein the processor of the server is configured to provide computing and control capabilities. The memory of the server comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The computer program is executed by a processor to implement a method of on-load testing.
Those skilled in the art will appreciate that the architecture shown in fig. 1 is a block diagram of only a portion of the architecture associated with the subject application, and does not constitute a limitation on the servers to which the subject application applies, and that servers may alternatively include more or fewer components than those shown, or combine certain components, or have a different arrangement of components.
The execution subject of the embodiments of the present application may be a computer device, or may be a device with a load test, and the following method embodiments will be described with reference to the computer device as the execution subject.
In one embodiment, as shown in fig. 2, a flowchart of a method for testing a load provided by an embodiment of the present application is shown, where the method may include the following steps:
During the process of carrying out the load test on the transformer, the test needs to be carried out for each phase, and the load test is realized by carrying out the difference current calculation on each phase, wherein the difference current refers to the difference between the current flowing into the high side of the transformer and the current flowing out of the low side of the transformer. The secondary circuit of the transformer is a circuit formed by connecting secondary equipment such as a current transformer secondary winding, a measurement monitoring instrument, a relay and the like in an electrical system through a control cable, when an on-load test is carried out on each phase to be tested, current parameters corresponding to testing in the secondary circuit of the transformer can be simultaneously acquired through the on-load tester, each phase to be tested corresponds to a plurality of groups of current parameters, the plurality of groups of current parameters are current parameters of corresponding phases required for calculating the phase differential current to be tested, and the current parameters can comprise current amplitude and phase.
When the corresponding current parameters to be tested in the secondary circuit of the transformer are collected, under the same voltage reference, a plurality of groups of current parameters can be collected simultaneously through different current collecting channels in the load tester. However, in the conventional method, usually, the load tester can only acquire one set of current parameters once, so that multiple sets of current parameters required for the differential current calculation are obtained after multiple acquisition, and then the differential current calculation is performed to obtain the differential current result of the phase to be tested, as shown in fig. 3, fig. 3 is a schematic diagram of the differential current calculation performed by the conventional method provided in this embodiment.
And 240, calculating the target differential current of the phase to be tested according to the standard configuration parameters of the secondary circuit and the current parameters corresponding to the phase to be tested.
After the current parameters corresponding to the phases to be tested in the secondary circuit of the transformer are obtained, the differential current result of the phases to be tested can be calculated according to the standard configuration parameters preset in the secondary circuit and the differential current calculation principle and serves as the target differential current. The standard configuration parameters are circuit parameters of the secondary circuit, and may include parameters such as a current transformer transformation ratio, a rated voltage, a wiring manner, and the like in the secondary circuit, and may also include other standard configuration parameters.
And step 260, determining whether a fault exists in the secondary circuit according to all the actual differential flows to be tested and the target differential flows of the phases to be tested in the secondary circuit.
The differential current protection device is a device which obtains the actual differential current by calculation according to the setting configuration parameters in the secondary circuit and the current parameters to be tested. Therefore, whether a fault exists in the secondary circuit can be determined according to all the actual differential flows to be tested corresponding to the phases to be tested in the secondary circuit and the target differential flows of the phases to be tested, whether a fault exists in the secondary circuit can be determined according to a comparison result after the actual differential flows of the phases to be tested are compared with the target differential flows, and the comparison mode can be difference comparison, quotient comparison or other modes, which is not specifically limited in this embodiment.
In the embodiment, for each phase to be tested, current parameters corresponding to the phases to be tested in the secondary loop of the transformer are collected simultaneously; calculating the target differential current of the phase to be tested according to the standard configuration parameters of the secondary circuit and the current parameters corresponding to the phase to be tested; and determining whether a fault exists in the secondary circuit according to all the actual differential flows to be tested and the target differential flows of the phases to be tested in the secondary circuit. The current acquisition channel of the load tester is expanded, so that the current parameters to be tested can be acquired simultaneously, the efficiency of acquiring current data is improved, and the efficiency of carrying out load testing is improved; in addition, the load tester can directly perform differential current calculation on the phases to be tested according to the obtained current parameters, manual calculation is not needed, and the efficiency of the load test is further improved.
In one embodiment, for each phase to be tested, simultaneously acquiring current parameters to be tested corresponding to the secondary circuit of the transformer, including: aiming at each phase to be tested, current parameters corresponding to the phases to be tested in the secondary loop are simultaneously collected through a plurality of current collecting channels; one current collection channel can be used for collecting a group of current parameters to be tested correspondingly. Can gather the corresponding current parameter of awaiting measuring in the secondary circuit simultaneously through the on-load tester, the on-load tester can include a plurality of electric current collection passageways, a set of current parameter can be gathered to every electric current collection passageway of on-load tester, can go to select specifically to gather the electric current parameter of which looks through the manual work to just can gather the corresponding current parameter of awaiting measuring according to a plurality of electric current collection passageways, therefore, the efficiency of obtaining the electric current data has been improved, and then the efficiency of carrying out the on-load test has been improved.
In one embodiment, as shown in fig. 4, which shows a flowchart of a method for testing a load provided by an embodiment of the present application, specifically, a possible process for calculating a target differential flow of a phase to be tested may include the following steps:
And 440, calculating the target differential current of the phase to be tested according to the standard configuration parameters, the preset current phase-shifting mode, the zero-sequence current parameters corresponding to the phase to be tested and the current parameters corresponding to the phase to be tested.
The transformer may generally include three phases, generally referred to as a phase, B phase, and C phase, which are arranged in a positive sequence and have a phase difference of 120 degrees. The transformer may in turn comprise a high side, a medium side, and a low side. For each phase, the phases of the high side and the middle side are the same, and the low side is 30 degrees ahead of the high side and the middle side, as shown in fig. 5 and 6, fig. 5 is a schematic current flow diagram of different sides of a transformer provided by an embodiment of the present application; fig. 6 is a schematic diagram of current phases on different sides of a transformer according to an embodiment of the present disclosure; h in the subscript indicates a high side, M indicates a middle side, and L indicates a low side. However, when calculating the differential current of the phase to be tested, three sides of the phase need to be in phase, so that a current phase shifting process is required, that is, a preset current phase shifting mode is required. The preset current phase shifting mode can comprise phase shifting from a low side to a high side and phase shifting from a middle side; the phase of the high side and the middle side is shifted to the low side.
The zero-sequence current parameter to be tested refers to the current generated in the zero line when the three-phase current is unbalanced. The standard configuration parameters can comprise rated voltage and current transformer transformation ratio, and after the parameters needed by the differential current calculation are obtained, the target differential current of the phase to be tested can be calculated according to the standard configuration parameters, a preset current phase-shifting mode, zero-sequence current parameters corresponding to the phase to be tested and current parameters corresponding to the phase to be tested.
In the embodiment, the standard configuration parameters of the secondary circuit, the preset current phase-shifting mode and the corresponding zero-sequence current parameters to be tested are obtained; and calculating the target differential current of the phase to be tested according to the standard configuration parameters, the preset current phase-shifting mode, the zero-sequence current parameters corresponding to the phase to be tested and the current parameters corresponding to the phase to be tested, wherein the load tester can efficiently and accurately calculate the differential current result of the phase to be tested according to the obtained parameters.
In one embodiment, as shown in fig. 7, which shows a flowchart of a method for testing a load provided by an embodiment of the present application, specifically, a possible process for calculating a target differential current of a phase to be tested according to a reduced current may include the following steps:
and 720, calculating the reduced current corresponding to the test according to the standard configuration parameters, the preset current phase-shifting mode, the zero sequence current parameters corresponding to the test and the current parameters corresponding to the test.
And 740, calculating the target differential current of the phase to be tested according to the corresponding reduced current to be tested.
After the converted current corresponding to the to-be-tested phase is obtained through calculation according to a preset current phase shifting mode, a zero sequence current parameter corresponding to the to-be-tested phase and a current parameter corresponding to the to-be-tested phase, the reduced current corresponding to the to-be-tested phase is obtained through calculation according to the converted current and a standard configuration parameter, and finally, the reduced current corresponding to the to-be-tested phase is summed to obtain the target differential current of the to-be-tested phase.
The specific current parameters to be acquired can be determined according to a preset current phase-shifting mode and the phase to be tested. Since the transformer may include a dual-winding transformer, a three-winding transformer, and the like, wherein the variable-low sides of the dual-winding transformer and the three-winding transformer may adopt a single-branch connection manner, a double-branch connection manner, or a multi-branch connection manner, if the three-winding transformer adopts a double-branch connection manner, it may be called a three-winding transformer variable-low-band double-branch, and the following description will be made of the target differential current calculation by taking the three-winding transformer variable-low-band double-branch, and the preset current phase-shifting manner as the variable-low-side and high-side phase-shifting as an example.
First, for each phase to be tested, a load tester is used to simultaneously collect current parameters corresponding to the phase to be tested in a secondary loop of a transformer, as shown in fig. 8, which shows a flowchart of a load testing method provided in an embodiment of the present application, and specifically relates to a possible process of collecting current parameters corresponding to the phase to be tested, the method may include the following steps:
and 820, regarding each phase to be tested, taking the phase adjacent to the phase to be tested as a target phase according to a preset current phase shifting mode.
And the current parameters of the phases to be tested and the current parameters of the target are acquired at the same time according to the load tester. Specifically, if the phase to be tested is the phase a, the current parameters to be tested in the secondary loop of the transformer are simultaneously acquired by the on-load tester, and the method comprises the following steps: simultaneously acquiring a phase-A current parameter of a phase-changing side, a phase-A current parameter of a branch of phase-A current of a phase-changing one branch, a phase-C current parameter of a branch of phase-C current of a phase-changing one branch, a phase-A current parameter of a branch of phase-A current of a phase-changing two branch and a phase-C current parameter of a branch of phase-C current of a phase-changing two branch;
if the phase to be tested is the B phase, the current parameters corresponding to the phase to be tested in the secondary loop of the transformer are acquired simultaneously through the load tester, and the method comprises the following steps: simultaneously acquiring a phase-B current parameter of a phase-changing side, a phase-B current parameter of a phase-changing one branch, a phase-A current parameter of a phase-changing one branch, a phase-B current parameter of a phase-changing two branch and a phase-A current parameter of a phase-changing two branch;
if the phase to be tested is the C phase, the current parameters corresponding to the phase to be tested in the secondary loop of the transformer are acquired simultaneously through the load tester, and the method comprises the following steps: and simultaneously acquiring a phase-C current parameter of a high side, a phase-C current parameter of a middle side, a phase-C current parameter of a first lower branch, a phase-B current parameter of a first lower branch, a phase-C current parameter of a second lower branch and a phase-B current parameter of a second lower branch.
Then, taking the phase to be tested as the phase a as an example, when the phase a differential current is calculated, the converted current corresponding to the test can be calculated through the formulas (1) to (4) according to the preset current phase shifting mode, the zero sequence current parameter corresponding to the test and the current parameter corresponding to the test. And calculating to obtain the corresponding reduced current to be tested through formulas (5) - (8) according to the reduced current and the standard configuration parameters. And finally, summing the reduced currents corresponding to the phases to be tested according to a formula (9) to obtain the target differential current of the phases to be tested. The calculation principle of other phases is the same, the overall flowchart is shown in fig. 9, and fig. 9 is a flowchart for performing a load test on all test phases according to the embodiment of the present application.
Wherein the content of the first and second substances,
is a phase difference stream;
IH0to get the high side phase a current and the zero sequence current,
for the high side A phase converted current and the reduced current reduced to the high side, UHA、nHAThe transformer is a transformer ratio of a phase A rated voltage and a phase A rated voltage of a high-side transformer;
IM0for the phase-change side A current and the zero sequence current,
for changing the middle-side A-phase converted current and the reduced current reduced to the high-voltage side, UMA、nMAThe transformer is a variable middle side A phase rated voltage and a variable middle side current transformer transformation ratio;
to lower side one branch of a-phase and C-phase currents,
for the low side branch A-phase converted current and the reduced current reduced to the high side, ULa、nLa1The transformer ratio of the phase A rated voltage at the low side and the branch current transformer at the low side is obtained;
to lower the side two-branch a-phase current and C-phase current,
for the low-side two-branch A-phase converted current and the reduced current reduced to the high-side, nLa2The transformation ratio of the two-branch current transformer on the low side is changed.
In the embodiment, the reduced current to be tested is calculated according to the standard configuration parameters, the preset current phase-shifting mode, the zero-sequence current parameters corresponding to the test and the current parameters corresponding to the test; and calculating the target differential current of the phase to be tested according to the corresponding reduced current to be tested. The calculation mode is simple and easy to operate, so that the load tester can quickly calculate the differential flow result of the phase to be tested.
In one embodiment, as shown in fig. 10, which shows a flowchart of a method for testing a load, provided in an embodiment of the present application, specifically related to a possible process of calculating an actual differential flow to be tested, the method may include the following steps:
and step 1020, acquiring actual configuration parameters of the secondary circuit.
The actual configuration parameters of the secondary circuit of the transformer, also called setting parameters of the transformer, are manually configured in the transformer by an operator. The actual configuration parameters may include parameters such as a current transformer transformation ratio, a rated voltage, a wiring mode and the like in the secondary circuit, and may also include other configuration parameters, after the actual configuration parameters of the secondary circuit are obtained, the actual differential current to be tested may be calculated based on the same principle as the previously calculated target differential current according to the actual configuration parameters of the secondary circuit and the current parameters corresponding to the current to be tested, and displayed on the transformer differential current protection device.
In this embodiment, the actual differential current to be tested is calculated by obtaining the actual configuration parameter of the secondary circuit and according to the actual configuration parameter of the secondary circuit and the current parameter corresponding to the test. The actual differential flow of the phase to be tested can be calculated to be used as a comparison reference of the target differential flow, so that whether a fault exists in the secondary circuit of the transformer can be rapidly determined.
In one embodiment, as shown in fig. 11, which shows a flowchart of a method for testing a load provided in an embodiment of the present application, specifically, a possible process for determining whether a fault exists in a secondary loop may include the following steps:
And step 1140, if yes, determining that no fault exists in the secondary circuit.
When determining whether a fault exists in the secondary circuit according to the actual differential flow and the target differential flow of the phase to be tested, determining whether an absolute value is smaller than a preset differential threshold value or not by subtracting the actual differential flow corresponding to the phase to be tested in the secondary circuit from the target differential flow of the phase to be tested, and determining whether the fault does not exist in the secondary circuit if the absolute value is smaller than the preset differential threshold value; otherwise, there is a failure.
The preset difference threshold may be zero, which is equivalent to performing consistency determination on the actual difference stream and the target difference stream of the phase to be tested, or may be a value within a certain acceptable range set according to actual requirements. For example, the actual difference flow of the phase a, the phase B and the phase C is respectively subtracted from the target difference flow, wherein the absolute value of the difference value of all the phases is smaller than a preset difference threshold value, and it is determined that no fault exists in the secondary loop; and if the absolute value of the difference value of any phase is larger than the preset difference value threshold, determining that the fault exists in the secondary loop.
In this embodiment, it is determined whether a difference between all actual differential flows to be tested in the secondary circuit and a target differential flow of a phase to be tested is smaller than a preset difference threshold, and if so, it is determined that no fault exists in the secondary circuit. The comparison method is simple, whether the secondary circuit of the transformer has a fault or not can be accurately judged, and the accuracy of the on-load test is improved.
It should be understood that although the various steps in the flow charts of fig. 2-11 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 2-11 may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, which are not necessarily performed in sequence, but may be performed in turn or alternately with other steps or at least some of the other steps.
Referring to fig. 12, a block diagram of a device 1200 for testing a load according to an embodiment of the present application is shown. As shown in fig. 12, the on-load test apparatus 1200 may include: an acquisition module 1202, a first calculation module 1204, and a determination module 1206, wherein:
the acquisition module 1202 is configured to simultaneously acquire current parameters to be tested in a secondary circuit of the transformer for each phase to be tested; each phase to be tested corresponds to a plurality of groups of current parameters respectively;
the first calculating module 1204 is configured to calculate a target differential current of the phase to be tested according to a standard configuration parameter of the secondary circuit and a current parameter corresponding to the phase to be tested;
the determining module 1206 is configured to determine whether a fault exists in the secondary circuit according to all actual differential flows to be tested corresponding to the phases to be tested in the secondary circuit and the target differential flow of the phases to be tested.
In one embodiment, the acquisition module 1202 includes an acquisition unit, and the acquisition unit is configured to simultaneously acquire, for each phase to be tested, current parameters to be tested in the secondary circuit through a plurality of current acquisition channels; one current collection channel can be used for collecting a group of current parameters to be tested correspondingly.
In an embodiment, the first calculating module 1204 includes an obtaining unit and a calculating unit, where the obtaining unit is configured to obtain a standard configuration parameter of a secondary circuit, a preset current phase-shifting manner, and a zero-sequence current parameter corresponding to a to-be-tested circuit; the standard configuration parameters comprise rated voltage and current transformer transformation ratio; the calculating unit is used for calculating the target differential current of the phase to be tested according to the standard configuration parameters, the preset current phase-shifting mode, the zero-sequence current parameters corresponding to the phase to be tested and the current parameters corresponding to the phase to be tested.
In one embodiment, the calculating unit is specifically configured to calculate the reduced current corresponding to the test according to a standard configuration parameter, a preset current phase shifting manner, a zero-sequence current parameter corresponding to the test, and a current parameter corresponding to the test; and calculating the target differential current of the phase to be tested according to the corresponding reduced current to be tested.
In one embodiment, the determining module 1206 includes a determining unit and a determining unit, wherein the determining unit is configured to determine whether a difference between all actual differential flows to be tested in the secondary circuit and a target differential flow of a phase to be tested is smaller than a preset difference threshold; the determining unit is used for determining that no fault exists in the secondary loop if the fault exists in the secondary loop.
In an embodiment, the apparatus 1200 for testing a load further includes an obtaining module 1208 and a second calculating module 1210, where the obtaining module 1208 is configured to obtain an actual configuration parameter of the secondary circuit; the calculating module 1210 is configured to calculate an actual differential current to be tested according to an actual configuration parameter of the secondary circuit and a current parameter corresponding to the secondary circuit to be tested.
In one embodiment, the transformer comprises a three-winding transformer, and the low side of the three-winding transformer adopts a double-branch wiring mode; the preset current phase shifting mode comprises phase shifting from a low side to a high side; the acquisition module 1202 includes a determining unit and an acquisition unit, where the determining unit is configured to, for each phase to be tested, take a phase adjacent to the phase to be tested as a target phase according to a preset current phase shifting manner; the acquisition unit is used for simultaneously acquiring the current parameter of a phase to be tested at the high side, the current parameter of a phase to be tested at the medium side, the current parameter of a phase to be tested at the low side, the current parameter of a target phase at the low side, the current parameter of a phase to be tested at the low side and the current parameter of a target phase at the low side.
For the specific definition of the load testing device, reference may be made to the above definition of the load testing method, which is not described herein again. The modules in the load testing apparatus may be implemented in whole or in part by software, hardware, or a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute the operations of the modules.
In one embodiment of the present application, there is provided a computer device comprising a memory and a processor, the memory having stored therein a computer program, the processor implementing the following steps when executing the computer program:
simultaneously acquiring current parameters to be tested in a secondary loop of the transformer aiming at each phase to be tested; each phase to be tested corresponds to a plurality of groups of current parameters respectively; calculating the target differential current of the phase to be tested according to the standard configuration parameters of the secondary circuit and the current parameters corresponding to the phase to be tested; and determining whether a fault exists in the secondary circuit according to all the actual differential flows to be tested and the target differential flows of the phases to be tested in the secondary circuit.
In one embodiment of the application, the processor when executing the computer program further performs the steps of:
aiming at each phase to be tested, current parameters corresponding to the phases to be tested in the secondary loop are simultaneously collected through a plurality of current collecting channels; one current collection channel can be used for collecting a group of current parameters to be tested correspondingly.
In one embodiment of the application, the processor when executing the computer program further performs the steps of:
acquiring standard configuration parameters of a secondary circuit, a preset current phase-shifting mode and zero-sequence current parameters corresponding to be tested; the standard configuration parameters comprise rated voltage and current transformer transformation ratio; and calculating the target differential current of the phase to be tested according to the standard configuration parameters, the preset current phase-shifting mode, the zero-sequence current parameters corresponding to the phase to be tested and the current parameters corresponding to the phase to be tested.
In one embodiment of the application, the processor when executing the computer program further performs the steps of:
calculating a reduced current corresponding to the test according to the standard configuration parameter, the preset current phase-shifting mode, the zero sequence current parameter corresponding to the test and the current parameter corresponding to the test; and calculating the target differential current of the phase to be tested according to the corresponding reduced current to be tested.
In one embodiment of the application, the processor when executing the computer program further performs the steps of:
judging whether the difference value between all actual difference streams to be tested corresponding to the secondary circuit and the target difference stream of the phase to be tested is smaller than a preset difference value threshold value or not; if yes, determining that no fault exists in the secondary loop.
In one embodiment of the application, the processor when executing the computer program further performs the steps of:
acquiring actual configuration parameters of a secondary circuit; and calculating the actual differential current to be tested according to the actual configuration parameters of the secondary circuit and the current parameters to be tested.
In one embodiment of the present application, the transformer comprises a three-winding transformer, and the low side of the three-winding transformer adopts a double-branch connection mode; the preset current phase shifting mode comprises phase shifting from a low side to a high side;
the processor, when executing the computer program, further performs the steps of:
aiming at each phase to be tested, taking a phase adjacent to the phase to be tested as a target phase according to a preset current phase shifting mode; and simultaneously acquiring a current parameter of a phase to be tested at a high-voltage side, a current parameter of a phase to be tested at a medium-voltage side, a current parameter of a phase to be tested at a branch at a low-voltage side, a current parameter of a target phase at a branch at a low-voltage side, a current parameter of a phase to be tested at a branch at a low-voltage side and a current parameter of a target phase at a branch at a low-voltage side.
The implementation principle and technical effect of the computer device provided by the embodiment of the present application are similar to those of the method embodiment described above, and are not described herein again.
In an embodiment of the application, a computer-readable storage medium is provided, on which a computer program is stored, which computer program, when being executed by a processor, carries out the steps of:
simultaneously acquiring current parameters to be tested in a secondary loop of the transformer aiming at each phase to be tested; each phase to be tested corresponds to a plurality of groups of current parameters respectively; calculating the target differential current of the phase to be tested according to the standard configuration parameters of the secondary circuit and the current parameters corresponding to the phase to be tested; and determining whether a fault exists in the secondary circuit according to all the actual differential flows to be tested and the target differential flows of the phases to be tested in the secondary circuit.
In one embodiment of the application, the computer program when executed by the processor further performs the steps of:
aiming at each phase to be tested, current parameters corresponding to the phases to be tested in the secondary loop are simultaneously collected through a plurality of current collecting channels; one current collection channel can be used for collecting a group of current parameters to be tested correspondingly.
In one embodiment of the application, the computer program when executed by the processor further performs the steps of:
acquiring standard configuration parameters of a secondary circuit, a preset current phase-shifting mode and zero-sequence current parameters corresponding to be tested; the standard configuration parameters comprise rated voltage and current transformer transformation ratio; and calculating the target differential current of the phase to be tested according to the standard configuration parameters, the preset current phase-shifting mode, the zero-sequence current parameters corresponding to the phase to be tested and the current parameters corresponding to the phase to be tested.
In one embodiment of the application, the computer program when executed by the processor further performs the steps of:
calculating a reduced current corresponding to the test according to the standard configuration parameter, the preset current phase-shifting mode, the zero sequence current parameter corresponding to the test and the current parameter corresponding to the test; and calculating the target differential current of the phase to be tested according to the corresponding reduced current to be tested.
In one embodiment of the application, the computer program when executed by the processor further performs the steps of:
judging whether the difference value between all actual difference streams to be tested corresponding to the secondary circuit and the target difference stream of the phase to be tested is smaller than a preset difference value threshold value or not; if yes, determining that no fault exists in the secondary loop.
In one embodiment of the application, the computer program when executed by the processor further performs the steps of:
acquiring actual configuration parameters of a secondary circuit; and calculating the actual differential current to be tested according to the actual configuration parameters of the secondary circuit and the current parameters to be tested.
In one embodiment of the present application, the transformer comprises a three-winding transformer, and the low side of the three-winding transformer adopts a double-branch connection mode; the preset current phase shifting mode comprises phase shifting from a low side to a high side;
the computer program when executed by the processor further realizes the steps of:
aiming at each phase to be tested, taking a phase adjacent to the phase to be tested as a target phase according to a preset current phase shifting mode; and simultaneously acquiring a current parameter of a phase to be tested at a high-voltage side, a current parameter of a phase to be tested at a medium-voltage side, a current parameter of a phase to be tested at a branch at a low-voltage side, a current parameter of a target phase at a branch at a low-voltage side, a current parameter of a phase to be tested at a branch at a low-voltage side and a current parameter of a target phase at a branch at a low-voltage side.
The implementation principle and technical effect of the computer-readable storage medium provided by this embodiment are similar to those of the above-described method embodiment, and are not described herein again.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above examples only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the claims. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A method for on-load testing, the method comprising:
simultaneously acquiring current parameters corresponding to the phases to be tested in a secondary loop of the transformer aiming at each phase to be tested; each phase to be tested corresponds to a plurality of groups of current parameters respectively;
calculating the target differential current of the phase to be tested according to the standard configuration parameters of the secondary circuit and the current parameters corresponding to the phase to be tested;
and determining whether a fault exists in the secondary circuit according to all the actual differential flows to be tested and corresponding to the phases to be tested in the secondary circuit and the target differential flow of the phases to be tested.
2. The method of claim 1, wherein the step of simultaneously acquiring the current parameters to be tested in the secondary loop of the transformer for each phase to be tested comprises:
for each phase to be tested, simultaneously acquiring current parameters corresponding to the phases to be tested in the secondary circuit through a plurality of current acquisition channels; wherein, the current collecting channel can be used for collecting the group of current parameters to be tested.
3. The method of claim 1, wherein said calculating a target differential current for the phases to be tested from the standard configuration parameters of the secondary loop and the corresponding current parameters to be tested comprises:
acquiring standard configuration parameters of the secondary circuit, a preset current phase-shifting mode and zero sequence current parameters corresponding to the to-be-tested current; the standard configuration parameters comprise rated voltage and current transformer transformation ratio;
and calculating the target differential current of the phase to be tested according to the standard configuration parameter, the preset current phase-shifting mode, the zero-sequence current parameter corresponding to the phase to be tested and the current parameter corresponding to the phase to be tested.
4. The method according to claim 3, wherein the calculating the target differential current of the phase to be tested according to the standard configuration parameter, the preset current phase-shifting manner, the zero-sequence current parameter corresponding to the phase to be tested and the current parameter corresponding to the phase to be tested comprises:
calculating the reduced current corresponding to the test according to the standard configuration parameter, the preset current phase-shifting mode, the zero sequence current parameter corresponding to the test and the current parameter corresponding to the test;
and calculating the target differential current of the phase to be tested according to the reduced current corresponding to the phase to be tested.
5. The method of claim 1, wherein said determining whether a fault exists in the secondary loop based on all of the actual differential flows corresponding to the phases to be tested in the secondary loop and the target differential flow of the phase to be tested comprises:
judging whether the difference value between all the actual differential flows to be tested corresponding to the phases to be tested in the secondary circuit and the target differential flow of the phases to be tested is smaller than a preset difference threshold value or not;
and if so, determining that no fault exists in the secondary loop.
6. The method of claim 1, further comprising:
acquiring actual configuration parameters of the secondary circuit;
and calculating the actual differential current to be tested according to the actual configuration parameters of the secondary circuit and the current parameters to be tested.
7. The method of claim 3, wherein the transformer comprises a three-winding transformer, and wherein the low side of the three-winding transformer is connected in a two-branch connection; the preset current phase shifting mode comprises phase shifting from a low side to a high side;
the method for simultaneously acquiring the current parameters to be tested in the secondary circuit of the transformer aiming at each phase to be tested comprises the following steps:
aiming at each phase to be tested, taking a phase adjacent to the phase to be tested as a target phase according to the preset current phase shifting mode;
and simultaneously acquiring the current parameter of the phase to be tested at the high side, the current parameter of the phase to be tested at the middle side, the current parameter of the phase to be tested at the low side, the current parameter of the target phase at the low side, the current parameter of the phase to be tested at the low side and the current parameter of the target phase at the low side.
8. A loaded test apparatus, the apparatus comprising:
the acquisition module is used for simultaneously acquiring current parameters to be tested in a secondary circuit of the transformer aiming at each phase to be tested; each phase to be tested corresponds to a plurality of groups of current parameters respectively;
the first calculation module is used for calculating the target differential current of the phase to be tested according to the standard configuration parameters of the secondary circuit and the current parameters corresponding to the phase to be tested;
and the determining module is used for determining whether a fault exists in the secondary circuit according to all the corresponding actual differential flows to be tested in the secondary circuit and the target differential flows of the phases to be tested.
9. A computer arrangement comprising a memory and a processor, the memory storing a computer program which, when executed by the processor, carries out the steps of the method according to any one of claims 1 to 7.
10. A computer-readable storage medium, characterized in that a computer program is stored thereon, which computer program, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110712681.4A CN113608041B (en) | 2021-06-25 | 2021-06-25 | On-load test method, device, equipment and storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110712681.4A CN113608041B (en) | 2021-06-25 | 2021-06-25 | On-load test method, device, equipment and storage medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113608041A true CN113608041A (en) | 2021-11-05 |
| CN113608041B CN113608041B (en) | 2023-12-29 |
Family
ID=78303732
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110712681.4A Active CN113608041B (en) | 2021-06-25 | 2021-06-25 | On-load test method, device, equipment and storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113608041B (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103743994A (en) * | 2014-01-27 | 2014-04-23 | 广州供电局有限公司 | Low-voltage load test method and device |
| CN109444651A (en) * | 2018-12-29 | 2019-03-08 | 云南电网有限责任公司电力科学研究院 | A kind of monitoring method and system for secondary circuit |
| CN110221146A (en) * | 2019-06-05 | 2019-09-10 | 国网江苏省电力有限公司苏州供电分公司 | Loading tests method suitable for intelligent substation |
| CN111007439A (en) * | 2019-12-24 | 2020-04-14 | 深圳供电局有限公司 | Transformer substation bus protection secondary circuit commissioning on-load test method |
| CN112269059A (en) * | 2020-09-27 | 2021-01-26 | 深圳供电局有限公司 | Electric mesh belt load testing method and device, computer equipment and storage medium |
-
2021
- 2021-06-25 CN CN202110712681.4A patent/CN113608041B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103743994A (en) * | 2014-01-27 | 2014-04-23 | 广州供电局有限公司 | Low-voltage load test method and device |
| CN109444651A (en) * | 2018-12-29 | 2019-03-08 | 云南电网有限责任公司电力科学研究院 | A kind of monitoring method and system for secondary circuit |
| CN110221146A (en) * | 2019-06-05 | 2019-09-10 | 国网江苏省电力有限公司苏州供电分公司 | Loading tests method suitable for intelligent substation |
| CN111007439A (en) * | 2019-12-24 | 2020-04-14 | 深圳供电局有限公司 | Transformer substation bus protection secondary circuit commissioning on-load test method |
| CN112269059A (en) * | 2020-09-27 | 2021-01-26 | 深圳供电局有限公司 | Electric mesh belt load testing method and device, computer equipment and storage medium |
Non-Patent Citations (1)
| Title |
|---|
| 桂小智等: "基于无线通信的二次交流回路无线遥测系统的开发", 《江西电力》 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113608041B (en) | 2023-12-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US20140244189A1 (en) | System For Achieving Real-Time Monitoring and State Estimation in Power Distribution Networks | |
| CN109633366B (en) | Power distribution network single-phase earth fault phase selection method and phase selection device | |
| CN104218526A (en) | Generator injection-type stator grounding protection method using segmented phase angle compensation | |
| Yalçın et al. | A study of symmetrical and unsymmetrical short circuit fault analyses in power systems | |
| JP2008199739A (en) | Method, device and program for analyzing voltage | |
| EP2378296B1 (en) | Method and arrangement for determining impedance values | |
| CN108345706B (en) | Power supply fast switching simulation method and model | |
| CN113608041A (en) | Load testing method, device, equipment and storage medium | |
| CN110879332B (en) | Single-phase earth fault phase selection method suitable for small current grounding system | |
| CN109375144B (en) | Current loss fault monitoring method and device based on three-phase four-wire meter equipment | |
| CN109193563B (en) | Current loss fault monitoring method and device based on three-phase three-wire meter equipment | |
| CN111077413A (en) | Three-phase transient current-based small current grounding system fault phase selection and line selection method | |
| CN116224148A (en) | Single-phase grounding fault analysis and treatment method and system for small-current grounding system | |
| CN112946421B (en) | Three-phase power grid fault diagnosis method and device, computer equipment and storage medium | |
| CN111737875B (en) | Active power unbalance rate analysis and diagnosis method, system and computer equipment | |
| RU2478977C1 (en) | Method for control of deformation of windings of step-down three-phase double winding three-legged power transformer under operational currents and voltages | |
| CN112269059B (en) | Power grid load test method and device, computer equipment and storage medium | |
| Bernardes et al. | Topological processing of mutually coupled circuits for directional overcurrent protection | |
| CN115267640A (en) | Current transformer abnormity checking method, system, equipment and medium | |
| RU2237254C1 (en) | Method for diagnosing power transformers | |
| CN114301055A (en) | Method and system for obtaining inter-harmonic power flow of power system based on broadband measurement | |
| CN112946558A (en) | Special transformer user metering abnormity monitoring method and system | |
| CN109919476A (en) | The appraisal procedure of distribution network cable operating status, device | |
| Popov et al. | Applications of synchrophasor measurement to improve the reliability and efficiency of power systems | |
| US10310017B2 (en) | Detection of generator stator inter-circuit faults |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |