CN113555301A - Flip chip attaching device and processing method - Google Patents
Flip chip attaching device and processing method Download PDFInfo
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- CN113555301A CN113555301A CN202110872121.5A CN202110872121A CN113555301A CN 113555301 A CN113555301 A CN 113555301A CN 202110872121 A CN202110872121 A CN 202110872121A CN 113555301 A CN113555301 A CN 113555301A
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- 238000003672 processing method Methods 0.000 title claims abstract description 21
- 239000000758 substrate Substances 0.000 claims abstract description 154
- 239000000463 material Substances 0.000 claims abstract description 79
- 238000003825 pressing Methods 0.000 claims abstract description 24
- 238000012545 processing Methods 0.000 claims abstract description 20
- 238000012546 transfer Methods 0.000 claims abstract description 6
- 238000003384 imaging method Methods 0.000 claims description 18
- 238000010438 heat treatment Methods 0.000 claims description 16
- 238000006073 displacement reaction Methods 0.000 claims description 12
- 238000004806 packaging method and process Methods 0.000 claims description 12
- 238000013519 translation Methods 0.000 claims description 7
- 238000010030 laminating Methods 0.000 claims description 4
- 239000000853 adhesive Substances 0.000 claims description 3
- 230000001070 adhesive effect Effects 0.000 claims description 3
- 230000001678 irradiating effect Effects 0.000 claims description 3
- 208000010727 head pressing Diseases 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 20
- 239000003292 glue Substances 0.000 abstract description 10
- 230000007850 degeneration Effects 0.000 abstract description 2
- 238000011161 development Methods 0.000 description 4
- 230000033001 locomotion Effects 0.000 description 4
- 238000011160 research Methods 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
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- 230000001737 promoting effect Effects 0.000 description 2
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- 239000000919 ceramic Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000004925 denaturation Methods 0.000 description 1
- 230000036425 denaturation Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67121—Apparatus for making assemblies not otherwise provided for, e.g. package constructions
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/563—Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67126—Apparatus for sealing, encapsulating, glassing, decapsulating or the like
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
- H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
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- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Wire Bonding (AREA)
Abstract
The invention relates to the technical field of micro-nano processing, and discloses a flip chip bonding device and a processing method. The mounting mechanism comprises a material taking head and a transfer mechanism, the material taking head is used for holding and taking a second substrate to be mounted, the material taking head located at the first position is aligned to the working face, the coaxial microscope located at the second position is aligned to the common working face, the first substrate on the working face and the second substrate on the material taking head can be located at two focal length positions of the coaxial microscope respectively, therefore, a sample to be mounted can be directly accurately aligned through the coaxial microscope, chip micro-area mounting is achieved by pressing glue dispensing, compared with traditional micro-nano processing, the problem of sample degeneration in the traditional micro-nano processing process is avoided, and product quality is effectively guaranteed. The processing method applied to the device also has the advantages.
Description
Technical Field
The invention relates to the technical field of micro-nano processing, in particular to a flip chip bonding device and a processing method.
Background
At present, the processing of electronic devices required by two-dimensional material electricity research, such as micro-area mounting of flip chips, mostly adopts a traditional micro-nano processing method, and the processing process needs glue homogenizing, exposure and development. Due to the surface sensitivity of the two-dimensional material, the conventional micro-nano processing method is easy to cause the pollution and denaturation of a device, and the intrinsic characteristics of the two-dimensional material are difficult to store.
Disclosure of Invention
The present invention is directed to solving at least one of the problems of the prior art. Therefore, the invention provides a flip chip bonding device which can effectively avoid the problem that a chip is easy to be polluted in the processing process.
The invention also provides a processing method which can realize the micro-area mounting of the flip chip.
An embodiment of a first aspect of the present invention provides a flip chip bonding apparatus, including:
the bearing mechanism comprises a carrying platform, wherein the carrying platform is provided with a working surface for fixing a first substrate to be mounted;
the mounting mechanism comprises a material taking head and a transferring mechanism, wherein the material taking head is used for holding and taking a second substrate to be mounted, the transferring mechanism is used for driving the material taking head to move to a first position so as to enable the material taking head to be aligned with the working surface, and the transferring mechanism is also used for driving the material taking head to move along a direction vertical to the working surface so as to press the second substrate onto the first substrate;
the alignment mechanism comprises a moving arm, a coaxial microscope and an imaging display module, wherein the imaging display module is used for displaying the imaging of the coaxial microscope, the coaxial microscope is connected to the moving arm, the axis of the coaxial microscope is perpendicular to the working surface, the moving arm is used for moving the coaxial microscope to a second position, and the second position is located between the material taking head and the working surface and is configured as follows: when the coaxial microscope is located at the second position, the first substrate on the working surface is located at one focal length of the coaxial microscope, and the second substrate on the material taking head at the first position is located at the other focal length of the coaxial microscope.
The flip chip bonding device provided by the embodiment of the invention at least has the following beneficial effects: the material taking head located at the first position is aligned to the working face, the coaxial microscope located at the second position is aligned to the common working face, the first substrate on the working face and the second substrate on the material taking head can be located at two focal length positions of the coaxial microscope respectively, and therefore accurate alignment of a to-be-pasted sample can be achieved through the coaxial microscope directly.
According to the flip chip bonding device of some embodiments of the present invention, the carrying mechanism further includes a displacement platform, the carrier is connected to the displacement platform, and the displacement platform is configured to move the carrier on a plane parallel to the working surface.
According to the flip chip bonding apparatus of some embodiments of the present invention, the stage has a heating module for heating the first substrate on the working surface.
According to the flip chip bonding apparatus of some embodiments of the present invention, the heating module includes a heater and a temperature controller, the heater is disposed inside the carrier, the heater is capable of being electrically heated and is configured to heat the carrier to heat the first substrate on the working surface, and the temperature controller is electrically connected to the heater and is configured to adjust a temperature of the heater.
According to the flip chip attaching device provided by some embodiments of the invention, the transferring mechanism comprises a translation component and a pressing component, wherein the pressing component is connected to the material taking head and used for moving the material taking head in a direction perpendicular to the working surface; the translation assembly is connected to the pressing assembly and used for moving the pressing assembly on a plane parallel to the working surface so that the material taking head reaches the first position.
According to the flip chip bonding device of some embodiments of the present invention, the material taking head is further connected to a pressure gauge for detecting a pressure of the material taking head pressing the second substrate.
According to the flip chip bonding device of some embodiments of the present invention, the material taking head comprises a vacuum suction nozzle for sucking the second substrate, and the material taking head is provided with an interface for communicating with an air source.
According to some embodiments of the invention, the flip chip bonding apparatus further comprises a packaging mechanism including a dispenser and a curing lamp, wherein the dispenser is used for dispensing the bonded second substrate and first substrate, and the curing lamp is used for irradiating and curing the glue on the first substrate and the second substrate.
The embodiment of the second aspect of the present invention further provides a processing method, which is applied to the flip chip bonding apparatus of the embodiment of the first aspect of the present invention, and is used for processing a flip chip, where the processing method includes:
preparing a first substrate and a second substrate, wherein the first substrate is prefabricated with an electrode structure, and a two-dimensional material is attached to the second substrate;
fixing the first substrate on the working surface, so that the material taking head obtains the second substrate, and one side of the second substrate, which is attached with the two-dimensional material, deviates from the material taking head;
moving the coaxial microscope to the second position, and moving the material taking head to the first position, so that the first substrate and the second substrate are respectively located at two focal length positions of the coaxial microscope;
moving the coaxial microscope out of the second position, moving the material taking head towards the working surface, and attaching the second substrate to the first substrate;
and dispensing and packaging the attached second substrate and the first substrate.
According to the processing method of some embodiments of the present invention, the imaging of the coaxial microscope is displayed by the imaging display module, and the positions of the working surface and the pickup head are adjusted according to the imaging, so that the first substrate and the second substrate are respectively located at two focal positions of the coaxial microscope.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
FIG. 1 is a schematic view of a flip chip bonding apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic view of a flip chip bonding apparatus according to another embodiment of the present invention;
FIG. 3 is a schematic front view of a second substrate;
FIG. 4 is a schematic backside view of a second substrate;
fig. 5 is a partial process diagram of a flip chip bonding process.
Reference numerals:
a first substrate 10, an electrode structure 11, a second substrate 20, a front side 21, a back side 22, a two-dimensional material 23, a mark 24;
the device comprises a bearing mechanism 100, a carrier 120, a working surface 121, a displacement platform 130 and a temperature controller 140;
the attaching mechanism 200, the material taking head 210, the transferring mechanism 220, the translation assembly 221, the pressing assembly 222 and the pressure gauge 230;
an alignment mechanism 300, a moving arm 310, a coaxial microscope 320;
a dispenser 410, a curing light 420;
a frame 500, a base 510, a bracket 520.
Detailed Description
The concept and technical effects of the present invention will be clearly and completely described below in conjunction with the embodiments to fully understand the objects, features and effects of the present invention. It is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all embodiments, and those skilled in the art can obtain other embodiments without inventive effort based on the embodiments of the present invention, and all embodiments are within the protection scope of the present invention.
In the description of the embodiments of the present invention, if an orientation description is referred to, for example, the orientations or positional relationships indicated by "upper", "lower", "front", "rear", "left", "right", etc. are based on the orientations or positional relationships shown in the drawings, only for convenience of describing the present invention and simplifying the description, but not for indicating or implying that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present invention.
In the description of the embodiments of the present invention, if a feature is referred to as being "disposed", "fixed", "connected", or "mounted" to another feature, it may be directly disposed, fixed, or connected to the other feature or may be indirectly disposed, fixed, connected, or mounted to the other feature. In the description of the embodiments of the present invention, if "a number" is referred to, it means one or more, if "a plurality" is referred to, it means two or more, if "greater than", "less than" or "more than" is referred to, it is understood that the number is not included, and if "greater than", "lower" or "inner" is referred to, it is understood that the number is included. If reference is made to "first" or "second", this should be understood to distinguish between features and not to indicate or imply relative importance or to implicitly indicate the number of indicated features or to implicitly indicate the precedence of the indicated features.
The electronic device is prepared by adopting a traditional micro-nano processing method, glue homogenizing, exposure and development are needed in the processing process, and the intrinsic characteristics of the two-dimensional material are difficult to store due to the fact that the device is easily polluted and denatured in the process due to the surface sensitivity of the two-dimensional material. In addition, the traditional micro-nano processing process is long in period and low in efficiency, and is not beneficial to research and exploration of a large number of materials. The embodiment of the invention provides a flip chip mounting device and a processing method, which can quickly and efficiently realize micro-area mounting of a flip chip, can also manufacture a two-dimensional material device, not only avoids the defects that a sample is easily polluted and the efficiency is low in the traditional micro-nano processing process, but also has simple operation and high success rate, and is beneficial to promoting the quick development of the research field.
Fig. 1 is a schematic view of a flip chip bonding apparatus according to an embodiment of the present invention, fig. 2 is a schematic view of a flip chip bonding apparatus according to another embodiment of the present invention, and referring to fig. 1, a first aspect of the present invention provides a flip chip bonding apparatus including a carrying mechanism 100, a bonding mechanism 200, and an alignment mechanism 300, wherein the carrying mechanism 100 includes a carrier 120, and the carrier 120 has a working surface 121 for fixing a first substrate to be bonded. The attaching mechanism 200 includes a material taking head 210 and a transferring mechanism 220, the material taking head 210 is used for holding a second substrate to be attached, the transferring mechanism 220 is used for driving the material taking head 210 to move to a first position so as to align the material taking head 210 with the working surface 121, and the transferring mechanism 220 is further used for driving the material taking head 210 located at the first position to move along a direction perpendicular to the working surface 121, so that the second substrate can be pressed onto the first substrate.
The alignment mechanism 300 includes a moving arm 310, a coaxial microscope 320 and an imaging display module, the coaxial microscope 320 is connected to the moving arm 310 and has an axis perpendicular to the working surface 121, and the moving arm 310 is used for moving the coaxial microscope 320 to the second position. The second position is located between the take-off head 210 and the work surface 121, and the second position is configured to: when the in-line microscope 320 is in the second position, the first substrate on the working surface 121 is located at one focal length of the in-line microscope 320, and the second substrate on the pick head 210 at the first position is located at another focal length of the in-line microscope 320. The display in-line microscope 320 can be visually imaged by the imaging display module using a conventional microscope imaging system to bring the first and second substrates to two focal lengths of the in-line microscope 320 to achieve in-line alignment.
In this embodiment, the moving arm 310 moves the coaxial microscope 320 to the second position, and the transferring mechanism 220 moves the pick-up head 210 to the first position, so that the position accuracy can be adjusted by referring to the image of the imaging display module, thereby achieving the accurate alignment of the first substrate and the second substrate. Therefore, can be directly will treat that to paste the dress sample and realize accurate alignment through coaxial microscope 320 to press the laminating, follow-up point is glued the encapsulation, realizes that the chip micro-domain pastes dress, compares with the processing a little of tradition, has avoided the traditional little to receive the course of working such as exposure, development in the course of working to lead to the problem of sample degeneration, effectively guarantees product quality.
In some embodiments of the flip chip bonding apparatus, the carrier mechanism 100 further includes a displacement platform 130, the stage 120 is connected to the displacement platform 130, and the displacement platform 130 is configured to move the stage 120 on a plane parallel to the working surface 121, so that the position of the first substrate relative to the in-line microscope 320 can also be adjusted by adjusting the position of the stage 120, so as to align the first substrate at a focal position of the in-line microscope 320. Thus, the in-line microscope 320 can be located at a set position by defining two states of the moving arm 310, for example: the moving arm 310 can move the coaxial microscope 320 to the second position when in the first state, and the moving arm 310 can move the coaxial microscope 320 out of the second position when in the second state to avoid interfering with the movement of the pick head 210. The movable arm 310 may be a telescopic cylinder, and the position of the coaxial microscope 320 in the first state is defined by a preset stroke of the cylinder. Coaxial microscope 320 connects in the push rod of cylinder, and the cylinder push rod is first state when stretching out the settlement stroke, and coaxial microscope 320's position is in the second position this moment, is the second state when the cylinder push rod retracts, and coaxial microscope 320 leaves the second position this moment, and the cylinder is flexible according to setting for the stroke and can be realized stretching out and withdrawing of coaxial microscope 320, and the regulation and control mode is direct and simple. Therefore, the flip chip bonding apparatus of the embodiment can adjust the positions of the pick-up head 210 and the carrier 120 with the position of the coaxial microscope 320 as a reference, and can quickly and accurately align the first substrate and the second substrate for mounting, the mechanism operation is simple and quick, and the mounting efficiency can be effectively improved.
During processing, the movable arm 310 may be first brought to the first state to move the coaxial microscope 320 to the second position, and then the position of the stage 120 is adjusted by the displacement platform 130, so that the first substrate on the working surface 121 is aligned with the coaxial microscope 320 and located at a focal length position of an end of the coaxial microscope 320 facing the working surface 121. Meanwhile, the position of the pick-up head 210 can be adjusted by the transfer mechanism 220, so that the second substrate on the pick-up head 210 is aligned with the coaxial microscope 320 and located at the focal position of the coaxial microscope 320 towards one end of the pick-up head 210, and the pick-up head 210 reaches the first position. The displacement platform 130 is used to adjust the position of the stage 120 on a plane parallel to the working surface 121, and a conventional two-axis platform may be used. The position of the stage 120 and the pick head 210 can be adjusted with reference to microscope imaging, thereby achieving precise alignment of the first and second substrates. The moving arm 310 is moved to the second state to move the coaxial microscope 320 out of the second position, and then the transfer mechanism 220 drives the pick-up head 210 to move toward the working surface 121 along a direction perpendicular to the working surface 121 to press the second substrate to the first substrate at the aligned position for dispensing and packaging.
Of course, in some other embodiments, a fixed position of the stage 120 may be provided, and the position of the in-line microscope 320 relative to the stage 120 may be adjusted by moving the arm 310 to align the in-line microscope 320 with the work surface 121, and to position the first substrate on the work surface 121 at the focal length of the side of the in-line microscope 320 facing the work surface 121, when the in-line microscope 320 is in the second position. Then, the position of the pick-up head 210 is adjusted by the transfer mechanism 220 to be aligned with the coaxial microscope 320, and the first substrate on the pick-up head 210 is located at the focal length of the coaxial microscope 320 towards the pick-up head 210, at which time the pick-up head 210 is located at the first position. Similarly to the above embodiment, after the coaxial microscope 320 is moved out of the second position, the transfer mechanism 220 drives the pick-up head 210 to move toward the working surface 121 along a direction perpendicular to the working surface 121 to press the second substrate onto the first substrate at the aligned position, so as to perform dispensing and packaging.
In some embodiments, the carrier 120 has a heating module for heating the first substrate on the working surface 121 to remove moisture and the like adsorbed on the surface of the first substrate, so as not to affect the firmness of the package. The specific heating temperature and duration can be reasonably configured according to actual requirements. The heating module includes a heater and a temperature controller 140, the heater may be a conventional device capable of being electrically heated, such as a ceramic heating plate, and the heater is disposed inside the stage 120 and is used for heating the stage 120 to heat the first substrate on the working surface 121. The temperature controller 140 is electrically connected to the heater for adjusting the temperature of the heater, and thus, can set a heating temperature and a heating time to efficiently satisfy a processing requirement, contributing to a rapid mounting of the flip chip.
In the above embodiment, the transferring mechanism 220 may include a translation component 221 and a pressing component 222, the pressing component 222 is connected to the material taking head 210 and configured to move the material taking head 210 in a direction perpendicular to the working surface 121, a conventional linear motion mechanism may be adopted, for example, the material taking head 210 is connected to a slider, the slider is driven by a stepping motor to move to realize linear motion, an axial direction of the stepping motor is perpendicular to the working surface 121, thereby driving the slider and the material taking head 210 to move in the direction perpendicular to the working surface 121, ensuring that the second substrate moves along a straight line in the pressing process, and avoiding position deviation. The translation assembly 221 is connected to the pressing assembly 222, and is configured to move the pressing assembly 222 on a plane parallel to the working surface 121 so as to enable the material taking head 210 to reach the first position.
In some embodiments, a pressure gauge 230 is further connected to the pick-up head 210 for detecting the pressure of the pick-up head 210 pressing the second substrate, so as to prevent the device from being damaged due to excessive pressure. Can connect pressure gauge 230 earlier on pressing subassembly 222, will get stub bar 210 and connect on pressure gauge 230 again, adopt electron pressure gauge 230 to implement detection pressure to accurate control presses the pressure that the process was applyed, helps obtaining suitable laminating pressure, thereby improves laminating quality.
Get stub bar 210 and can adopt vacuum adsorption's mode to acquire the second substrate, for example, get stub bar 210 and include vacuum nozzle, and have the interface that is used for communicateing the air supply, vacuum nozzle passes through the pipe connection interface to switch on in the air supply, consequently can form the vacuum in vacuum nozzle in order to adsorb the second substrate, can guarantee to acquire the second substrate and can avoid the damage to the second substrate through vacuum adsorption.
In some embodiments of the flip chip bonding apparatus, a packaging mechanism is further included, fig. 2 is a schematic view of the flip chip bonding apparatus according to another embodiment of the present invention, referring to fig. 2, the present embodiment and the above embodiments are added with the packaging mechanism, wherein the packaging mechanism includes a dispenser 410, the dispenser 410 is used for dispensing the second substrate and the first substrate after bonding, and the dispenser 410 is a device commonly used in industrial production, and can dispense glue through a dispensing head and control a movement path of the dispensing head in a preset manner, so as to achieve dispensing at a desired position. To accelerate the curing of the glue solution, the packaging mechanism may further be provided with a curing lamp 420 for irradiating the glue on the first and second substrates to accelerate the curing. In this embodiment, the dispensing machine 410 may dispense the uv curing glue on the edge where the first substrate and the second substrate are attached through the dispensing head, and the uv lamp is used as the commonly used curing lamp 420, which may have a better curing effect on the uv curing glue, so that the conventional uv lamp may be used as the curing lamp 420 of the apparatus.
Referring to fig. 1 and 2, in the flip chip bonding apparatus of the above embodiment, a frame 500 for mounting each mechanism may be provided, and the carrier mechanism 100, the bonding mechanism 200, and the alignment mechanism 300 may be respectively mounted at set positions of the frame 500. Specifically, the rack 500 includes a base 510 and a support 520, the support 520 extends upward from the surface of the base 510, the carrying mechanism 100 may be disposed on the base 510, the mounting mechanism 200 is connected to the support 520 and located above the stage 120, the aligning mechanism 300 is connected to the support 520 and located between the pick-up head 210 and the stage 120, and the coaxial microscope 320 forms a vertical coaxial structure along the vertical direction so as to align a first substrate located below and a second substrate located above, thereby forming a vertical arrangement flip chip mounting device, and saving the occupation of the horizontal space. In other embodiments, the dispenser 410 and the curing lamp 420 may also be mounted at predetermined positions on the frame 500 to form a complete assembled flip chip bonding apparatus for connection and overall adjustment.
The flip chip bonding device of the embodiment of the invention is also provided with a controller (not shown) for operation control of the bonding process, and can be realized by adopting a common Programmable Logic Controller (PLC) in industrial control application. The programmable logic controller adopts a programmable memory, stores instructions for executing operations such as logic operation, sequence control, timing, counting, arithmetic operation and the like in the programmable memory, controls various types of mechanical equipment or production processes through digital or analog input and output, and is a digital operation electronic system widely applied in industrial environment. The detailed control flow is not described herein.
Therefore, the first substrate to be attached and the second substrate with the well-cleaved two-dimensional material are observed simultaneously by using the coaxial microscope 320, and the positions of the two substrates are adjusted to enable the two substrates to be accurately superposed and aligned, so that micro-area mounting of the flip chip can be realized, and the problems that a sample is easily polluted and the efficiency is low in the traditional micro-nano processing process are solved. The device is simple to operate, high in mounting efficiency, suitable for device processing of a large number of materials and capable of rapidly promoting research of two-dimensional materials.
Fig. 3 is a schematic front view of a second substrate, fig. 4 is a schematic back view of the second substrate, fig. 5 is a schematic partial process view of a flip chip bonding processing method, and referring to fig. 3 to 5, a second aspect of the present invention further provides a processing method for flip chip mounting processing, the processing method is applied to the flip chip bonding apparatus according to the first aspect of the present invention, and the processing method includes:
preparing a first substrate 10 and a second substrate 20, wherein the first substrate 10 is prefabricated with an electrode structure 11, and a two-dimensional material 23 is attached to the second substrate 20;
fixing the first substrate 10 on the working surface 121, so that the material taking head 210 obtains the second substrate 20, and the side, to which the two-dimensional material 23 is attached, of the second substrate 20 is away from the material taking head 210;
moving the coaxial microscope 320 to the second position, and moving the pick-up head 210 to the first position, so that the first substrate 10 and the second substrate 20 are respectively located at two focal positions of the coaxial microscope 320;
moving the coaxial microscope 320 out of the second position, and moving the pick-up head 210 toward the working surface 121 to attach the second substrate 20 to the first substrate 10;
and dispensing and packaging the attached second substrate 20 and the first substrate 10. And finishing the attaching package of one chip.
In the above method, the first substrate 10 and the second substrate 20 are pre-fabricated samples, and the method of the present invention is a processing method proposed for mounting the first substrate 10 and the second substrate 20, and therefore, the preparation method of the first substrate 10 and the second substrate 20 is not described herein again. Before the two-dimensional material 23 is attached to the second substrate 20, the second substrate 20 is cleaned, the two-dimensional material 23 is then cleaved with an adhesive tape and attached to the front surface 21 of the cleaned second substrate 20, and the substrate and the adhesive tape are separated, so that the second substrate 20 to which the two-dimensional material 23 is attached is obtained.
The second substrate 20 with the two-dimensional material 23 attached thereto is preprocessed before the pick-up head 210 picks up the substrate: the second substrate 20 with the two-dimensional material 23 attached thereto is suspended and fixed on an inverted laser processing microscope, the back surface 22 of the second substrate 20 (i.e., the surface to which the two-dimensional material 23 is not attached) is subjected to laser processing to outline the appearance of the sample, and marks 24 (e.g., cross marks) are marked on the back surface 22 corresponding to the two-dimensional material 23 by laser so as to align the pickup head 210.
The marked second substrate 20 is transferred and fixed on the material taking head 210 of the flip chip bonding device, taking an embodiment that a vacuum suction nozzle is adopted as the material taking head 210 as an example, the cross mark 24 on the back surface 22 of the second substrate 20 is opposite to the center of the suction nozzle, so that the position of the second substrate 20 corresponding to the position where the two-dimensional material 23 is attached can be absorbed, the pressing and the bonding are convenient, the position deviation of the two-dimensional material 23 from the required position is effectively avoided, and the efficiency and the precision of the bonding are improved.
A heater may be disposed on the stage 120, and after the first substrate 10 is fixed on the working surface 121 of the stage 120, the stage 120 may be heated by the temperature controller 140 to heat the first substrate 10 on the working surface 121, remove water vapor and the like adsorbed on the surface of the first substrate 10, set the heating temperature to 120 °, heat the duration for about 10 minutes, and then naturally cool down.
In the above method, when the positions of the first substrate 10 and the second substrate 20 are adjusted, the imaging display module displays the images of the coaxial microscope 320, and the positions of the working surface 121 and the pick-up head 210 are adjusted according to the images, so that the first substrate 10 and the second substrate 20 are respectively located at two focal positions of the coaxial microscope 320, and the first substrate 10 to be attached and the second substrate 20 with the cleaved two-dimensional material 23 are precisely aligned in an overlapping manner.
An electronic pressure gauge 230 may be connected to the pressing assembly 222, and the pick-up head 210 may be connected to the electronic pressure gauge 230, so that when the second substrate 20 is attached to the first substrate 10, the pressing pressure may be obtained by the electronic pressure, thereby accurately controlling the pressure applied during the pressing process.
In the above method, during dispensing and packaging, an ultraviolet curing adhesive is dispensed on the edges of the two bonded substrates by the dispenser 410, and the curing adhesive is irradiated by an ultraviolet lamp to be fixed, thereby completing the mounting of the flip chip. The irradiation time of the ultraviolet lamp can be reasonably set according to the curing time of the ultraviolet glue, in the process, the pressing assembly 222 keeps a pressing state until the pressing assembly 222 retracts to the material taking head 210 after the curing time is finished, and the attached device is moved out of the working surface 121 so as to attach the next sample.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge of those skilled in the art without departing from the gist of the present invention. Furthermore, the embodiments of the present invention and the features of the embodiments may be combined with each other without conflict.
Claims (10)
1. The utility model provides a flip chip laminating device which characterized in that includes:
the bearing mechanism comprises a carrying platform, wherein the carrying platform is provided with a working surface for fixing a first substrate to be mounted;
the mounting mechanism comprises a material taking head and a transferring mechanism, wherein the material taking head is used for holding and taking a second substrate to be mounted, the transferring mechanism is used for driving the material taking head to move to a first position so as to enable the material taking head to be aligned with the working surface, and the transferring mechanism is also used for driving the material taking head to move along a direction vertical to the working surface so as to press the second substrate onto the first substrate;
the alignment mechanism comprises a moving arm, a coaxial microscope and an imaging display module, wherein the imaging display module is used for displaying the imaging of the coaxial microscope, the coaxial microscope is connected to the moving arm, the axis of the coaxial microscope is perpendicular to the working surface, the moving arm is used for moving the coaxial microscope to a second position, and the second position is located between the material taking head and the working surface and is configured as follows: when the coaxial microscope is located at the second position, the first substrate on the working surface is located at one focal length of the coaxial microscope, and the second substrate on the material taking head at the first position is located at the other focal length of the coaxial microscope.
2. The flip chip bonding apparatus of claim 1, wherein the carrier mechanism further comprises a displacement platform, the stage is connected to the displacement platform, and the displacement platform is configured to move the stage in a plane parallel to the working surface.
3. The flip chip bonding apparatus according to claim 1, wherein the stage has a heating module for heating the first substrate on the work surface.
4. The flip chip bonding apparatus according to claim 3, wherein the heating module includes a heater and a temperature controller, the heater is disposed inside the stage, the heater is capable of being electrically heated for heating the stage to heat the first substrate on the working surface, and the temperature controller is electrically connected to the heater for adjusting a temperature of the heater.
5. The apparatus of claim 1, wherein the transfer mechanism comprises a translation assembly and a pressing assembly, the pressing assembly is connected to the pick-up head for moving the pick-up head in a direction perpendicular to the working surface; the translation assembly is connected to the pressing assembly and used for moving the pressing assembly on a plane parallel to the working surface so that the material taking head reaches the first position.
6. The flip chip bonding apparatus according to claim 1, wherein a pressure gauge is further connected to the pick-up head for detecting a pressure of the pick-up head pressing the second substrate.
7. The flip chip bonding apparatus of claim 1, wherein the pick-up head comprises a vacuum nozzle for sucking the second substrate, and the pick-up head has an interface for communicating with a gas source.
8. The flip chip bonding apparatus according to any one of claims 1 to 7, further comprising a packaging mechanism including a dispenser for dispensing the bonded second substrate and first substrate and a curing lamp for irradiating and curing the adhesive on the first substrate and second substrate.
9. A processing method applied to the flip chip bonding apparatus according to any one of claims 1 to 8 for flip chip processing, the processing method comprising:
preparing a first substrate and a second substrate, wherein the first substrate is prefabricated with an electrode structure, and a two-dimensional material is attached to the second substrate;
fixing the first substrate on the working surface, so that the material taking head obtains the second substrate, and one side of the second substrate, which is attached with the two-dimensional material, deviates from the material taking head;
moving the coaxial microscope to the second position, and moving the material taking head to the first position, so that the first substrate and the second substrate are respectively located at two focal length positions of the coaxial microscope;
moving the coaxial microscope out of the second position, moving the material taking head towards the working surface, and attaching the second substrate to the first substrate;
and dispensing and packaging the attached second substrate and the first substrate.
10. The processing method according to claim 9, wherein the imaging display module displays the imaging of the in-line microscope, and the positions of the working surface and the pick-up head are adjusted according to the imaging, so that the first substrate and the second substrate are respectively located at two focal positions of the in-line microscope.
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CN116593241A (en) * | 2023-03-02 | 2023-08-15 | 清华大学 | Micro-nano preparation method, device and system |
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CN116593241A (en) * | 2023-03-02 | 2023-08-15 | 清华大学 | Micro-nano preparation method, device and system |
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