CN113533864B - 一种三反射镜紧缩场天线测量系统及结构和参数确定方法 - Google Patents
一种三反射镜紧缩场天线测量系统及结构和参数确定方法 Download PDFInfo
- Publication number
- CN113533864B CN113533864B CN202110743674.0A CN202110743674A CN113533864B CN 113533864 B CN113533864 B CN 113533864B CN 202110743674 A CN202110743674 A CN 202110743674A CN 113533864 B CN113533864 B CN 113533864B
- Authority
- CN
- China
- Prior art keywords
- reflector
- feed source
- optical center
- mirror
- shaped
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0878—Sensors; antennas; probes; detectors
- G01R29/0885—Sensors; antennas; probes; detectors using optical probes, e.g. electro-optical, luminiscent, glow discharge, or optical interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0892—Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
- G01R29/105—Radiation diagrams of antennas using anechoic chambers; Chambers or open field sites used therefor
Abstract
Description
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110743674.0A CN113533864B (zh) | 2021-07-01 | 2021-07-01 | 一种三反射镜紧缩场天线测量系统及结构和参数确定方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110743674.0A CN113533864B (zh) | 2021-07-01 | 2021-07-01 | 一种三反射镜紧缩场天线测量系统及结构和参数确定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN113533864A CN113533864A (zh) | 2021-10-22 |
CN113533864B true CN113533864B (zh) | 2022-07-29 |
Family
ID=78126489
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202110743674.0A Active CN113533864B (zh) | 2021-07-01 | 2021-07-01 | 一种三反射镜紧缩场天线测量系统及结构和参数确定方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN113533864B (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112834829B (zh) * | 2021-02-04 | 2021-12-31 | 北京邮电大学 | 紧缩场天线测量系统、构建其的方法、装置及电子设备 |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4186402A (en) * | 1976-05-18 | 1980-01-29 | Mitsubishi Denki Kabushiki Kaisha | Cassegrainian antenna with beam waveguide feed to reduce spillover |
EP1995599A1 (en) * | 2007-05-24 | 2008-11-26 | Seiko Epson Corporation | Method for determining an antenna parameter |
CN101576591A (zh) * | 2009-06-09 | 2009-11-11 | 北京邮电大学 | 一种三反射镜紧缩场天线测量系统及方法 |
CN103513117A (zh) * | 2013-07-16 | 2014-01-15 | 北京邮电大学 | 一种三反射镜紧缩场天线测量系统 |
CN109613343A (zh) * | 2018-12-05 | 2019-04-12 | 北京无线电计量测试研究所 | 一种太赫兹辐射体法向发射率的准光测量系统和方法 |
CN210347782U (zh) * | 2019-07-19 | 2020-04-17 | 北京中测国宇科技有限公司 | 一种反射面位于静区上方的紧缩场天线测量系统 |
CN112034266A (zh) * | 2020-05-25 | 2020-12-04 | 北京中测国宇科技有限公司 | 一种毫米波多馈源紧缩场测试系统 |
CN112540238A (zh) * | 2020-12-18 | 2021-03-23 | 北京航空航天大学 | 一种多频共用高效率紧缩场馈源系统 |
CN112834833A (zh) * | 2021-03-30 | 2021-05-25 | 中山香山微波科技有限公司 | 紧缩场天线测试系统 |
CN112834829A (zh) * | 2021-02-04 | 2021-05-25 | 北京邮电大学 | 紧缩场天线测量系统、构建其的方法、装置及电子设备 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103746187B (zh) * | 2013-12-23 | 2015-09-23 | 北京邮电大学 | 一种卡塞格伦天线探测系统及其设计方法 |
US10309999B2 (en) * | 2017-10-06 | 2019-06-04 | The Boeing Company | Compact test range system with adjustable feed horn locations |
JP6886449B2 (ja) * | 2018-11-29 | 2021-06-16 | アンリツ株式会社 | アンテナ装置及び測定方法 |
CN109885897A (zh) * | 2019-01-27 | 2019-06-14 | 中国电子科技集团公司第三十九研究所 | 一种星载通信混合反射面天线系统设计方法 |
-
2021
- 2021-07-01 CN CN202110743674.0A patent/CN113533864B/zh active Active
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4186402A (en) * | 1976-05-18 | 1980-01-29 | Mitsubishi Denki Kabushiki Kaisha | Cassegrainian antenna with beam waveguide feed to reduce spillover |
EP1995599A1 (en) * | 2007-05-24 | 2008-11-26 | Seiko Epson Corporation | Method for determining an antenna parameter |
CN101576591A (zh) * | 2009-06-09 | 2009-11-11 | 北京邮电大学 | 一种三反射镜紧缩场天线测量系统及方法 |
CN103513117A (zh) * | 2013-07-16 | 2014-01-15 | 北京邮电大学 | 一种三反射镜紧缩场天线测量系统 |
CN109613343A (zh) * | 2018-12-05 | 2019-04-12 | 北京无线电计量测试研究所 | 一种太赫兹辐射体法向发射率的准光测量系统和方法 |
CN210347782U (zh) * | 2019-07-19 | 2020-04-17 | 北京中测国宇科技有限公司 | 一种反射面位于静区上方的紧缩场天线测量系统 |
CN112034266A (zh) * | 2020-05-25 | 2020-12-04 | 北京中测国宇科技有限公司 | 一种毫米波多馈源紧缩场测试系统 |
CN112540238A (zh) * | 2020-12-18 | 2021-03-23 | 北京航空航天大学 | 一种多频共用高效率紧缩场馈源系统 |
CN112834829A (zh) * | 2021-02-04 | 2021-05-25 | 北京邮电大学 | 紧缩场天线测量系统、构建其的方法、装置及电子设备 |
CN112834833A (zh) * | 2021-03-30 | 2021-05-25 | 中山香山微波科技有限公司 | 紧缩场天线测试系统 |
Non-Patent Citations (5)
Title |
---|
《Analysis of Location Errors between Components in Large-Aperture Compact Antenna Test Range》;Lanhao Gao等;《2019 12th UK-Europe-China Workshop on Millimeter Waves and Terahertz Technologies (UCMMT)》;20200227;全文 * |
《Design of tri-reflector compact antenna test range from 40GHz to 100GHz》;陈晓东等;《2012 IEEE MTT-S International Microwave Workshop Series on Millimeter Wave Wireless Technology and Applications》;20121025;全文 * |
《一种三反射镜紧缩场天线测量系统的模拟研究》;杨雯森;《中国优秀博硕士学位论文全文数据库(硕士)信息科技辑》;20131115;全文 * |
《大口径紧缩场中板间缝隙对静区特性影响的分析》;王君波等;《北京邮电大学学报》;20161031;第5卷(第39期);78-82 * |
《毫米波与亚毫米波紧缩场三反射镜天线测量系统的研究》;杨诚;《中国优秀博硕士学位论文全文数据库(硕士)信息科技辑》;20180215;全文 * |
Also Published As
Publication number | Publication date |
---|---|
CN113533864A (zh) | 2021-10-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Hannan | Microwave antennas derived from the Cassegrain telescope | |
Dragone | Offset multireflector antennas with perfect pattern symmetry and polarization discrimination | |
Garcia-Pino et al. | A bifocal ellipsoidal Gregorian reflector system for THz imaging applications | |
Hasselmann et al. | Asymptotic analysis of parabolic reflector antennas | |
CN113533864B (zh) | 一种三反射镜紧缩场天线测量系统及结构和参数确定方法 | |
Yurchenko et al. | Numerical optimization of a cylindrical reflector-in-radome antenna system | |
Rappaport | An offset bifocal reflector antenna design for wide-angle beam scanning | |
US4223316A (en) | Antenna structure with relatively offset reflectors for electromagnetic detection and space telecommunication equipment | |
Penchel et al. | GO shaping of omnidirectional dual-reflector antennas with arbitrary main-beam direction in elevation plane by connecting conic sections | |
CN112834829B (zh) | 紧缩场天线测量系统、构建其的方法、装置及电子设备 | |
US4166276A (en) | Offset antenna having improved symmetry in the radiation pattern | |
Doerry | Just where exactly is the radar?(aka the radar antenna phase center) | |
CN114465019A (zh) | 收发共轴用于太赫兹实孔径成像的卡塞格伦天线 | |
Sletten et al. | The paraboloid mirror | |
White et al. | Scanning characteristics of two-reflector antenna systems | |
CN113063567B (zh) | 多反射镜准光系统中反射镜位置的确定方法及装置 | |
TWM583134U (zh) | 環形縮距天線測試裝置 | |
TWI713252B (zh) | 環形縮距天線測試裝置 | |
CN113296067B (zh) | 一种紧缩场测量系统 | |
JP2012182783A (ja) | 反射鏡アンテナ | |
CN214280169U (zh) | 波导极化衰减装置 | |
JP2822768B2 (ja) | アンテナ装置 | |
JP3668913B2 (ja) | 反射鏡アンテナ | |
Shan et al. | A Design Method for Imaging Reflector With Less Distorted Focal Spot | |
Narasimhan et al. | GTD analysis of a hyperboloidal subreflector with conical flange attachment |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB03 | Change of inventor or designer information | ||
CB03 | Change of inventor or designer information |
Inventor after: Yao Yuan Inventor after: Yu Junsheng Inventor after: Yu Haiyang Inventor after: Li Zhi Inventor after: Chen Tianyang Inventor after: Chen Yuqing Inventor after: Zhang Liang Inventor after: Chen Xiaodong Inventor before: Yao Yuan Inventor before: Yu Junsheng Inventor before: Yu Haiyang Inventor before: Li Zhi Inventor before: Chen Yuqing Inventor before: Zhang Liang Inventor before: Chen Xiaodong |
|
GR01 | Patent grant | ||
GR01 | Patent grant |