CN113485511A - Band gap reference circuit with low temperature coefficient - Google Patents

Band gap reference circuit with low temperature coefficient Download PDF

Info

Publication number
CN113485511A
CN113485511A CN202110755566.5A CN202110755566A CN113485511A CN 113485511 A CN113485511 A CN 113485511A CN 202110755566 A CN202110755566 A CN 202110755566A CN 113485511 A CN113485511 A CN 113485511A
Authority
CN
China
Prior art keywords
resistor
bjt transistor
mosfet
transistor
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202110755566.5A
Other languages
Chinese (zh)
Other versions
CN113485511B (en
Inventor
王新胜
白春阳
王静
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Harbin Institute of Technology Weihai
Original Assignee
Harbin Institute of Technology Weihai
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Harbin Institute of Technology Weihai filed Critical Harbin Institute of Technology Weihai
Priority to CN202110755566.5A priority Critical patent/CN113485511B/en
Publication of CN113485511A publication Critical patent/CN113485511A/en
Application granted granted Critical
Publication of CN113485511B publication Critical patent/CN113485511B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10Regulating voltage or current
    • G05F1/46Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • G05F1/565Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
    • G05F1/567Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for temperature compensation

Abstract

The invention relates to a band-gap reference circuit with a low temperature coefficient, which solves the technical problem of how to improve the performance of a Brokaw band-gap reference circuit. The invention is widely used for providing reference voltage for integrated circuits.

Description

Band gap reference circuit with low temperature coefficient
Technical Field
The invention relates to the technical field of band-gap reference circuits in integrated circuits, in particular to a band-gap reference circuit with a low temperature coefficient.
Background
The bandgap reference circuit is a crucial module in an integrated circuit, and can provide a reference voltage with small fluctuation variation due to temperature, power supply voltage and process for other circuit systems. The bandgap reference circuit is usually integrated in a digital-to-analog converter, an analog-to-digital converter, a low dropout regulator, etc. to provide a reference voltage for the digital-to-analog converter, the analog-to-digital converter, the low dropout regulator, etc.
Referring to the Brokaw bandgap reference circuit of fig. 1, the basic principle is to superimpose a voltage with positive temperature coefficient and a voltage with negative temperature coefficient in proper proportion to obtain a reference voltage with approximately zero temperature coefficient at the output of the reference circuit. Voltage V+Having a positive temperature coefficient and a negative temperature coefficient, the voltage V-satisfies equation (1) by selecting appropriate weights β and α.
Figure BDA0003147182210000011
An output voltage with a zero temperature coefficient can be obtained, and the expression of the output voltage is shown in formula (2).
VREF=αV++βV- (2)
CTAT voltage V-Typically by the base-emitter voltage V of a Bipolar Junction Transistor (BJT)BEProviding, a PTAT voltage V+Base-emitter voltage V from two BJTs with different areasBEDifference value Δ V ofBEAnd (4) generating.
Therefore, with the development of integrated circuit technology, how to improve the performance of the Brokaw bandgap reference circuit is a technical problem to be solved urgently by those skilled in the art.
Disclosure of Invention
The invention provides a bandgap reference circuit with a low temperature coefficient, aiming at solving the technical problem of improving the performance of the conventional Brokaw bandgap reference circuit.
The invention provides a band-gap reference circuit with a low temperature coefficient, which comprises a fifteenth MOSFET, a third resistor, a fourth resistor, a first BJT transistor, a second resistor, a first resistor and a first amplifier, wherein the source electrode of the fifteenth MOSFET is connected with a power supply, one end of the third resistor is connected with the drain electrode of the fifteenth MOSFET, the other end of the third resistor is connected with the collector electrode of the first BJT transistor, one end of the fourth resistor is connected with the drain electrode of the fifteenth MOSFET, the other end of the fourth resistor is connected with the collector electrode of the second BJT transistor, the base electrode of the first BJT transistor is connected with the base electrode of the second BJT transistor, the emitter electrode of the first BJT transistor is grounded through the second resistor and the first resistor, the emitter electrode of the second BJT transistor is connected with a node between the second resistor and the first resistor, and the node between the collector electrode of the third resistor and the first BJT transistor is connected with the positive phase input end of the first amplifier, the node between the fourth resistor and the collector of the second BJT transistor is connected with the inverting input end of the first amplifier, the output end of the first amplifier is connected with the base of the first BJT transistor, the band-gap reference circuit with the low temperature coefficient further comprises a second amplifier, the second amplifier is provided with a first positive phase input end, a second positive phase input end, an inverting input end and an output end, the node between the third resistor and the collector of the first BJT transistor is connected with the first positive phase input end, the node between the fourth resistor and the collector of the second BJT transistor is connected with the second positive phase input end, the inverting input end of the second amplifier is connected with the base of the second BJT transistor, and the grid of a fifteenth MOSFET is connected with the output end of the second amplifier.
Preferably, the second amplifier comprises a thirteenth MOSFET tube, a fourteenth MOSFET tube, a fifth BJT transistor, a fourth BJT transistor, a third BJT transistor, a sixth resistor, a fifth resistor and a twelfth MOSFET tube, wherein a collector of the fifth BJT transistor and a collector of the fourth BJT transistor are connected together and then connected to a drain of the thirteenth MOSFET tube, an emitter of the fifth BJT transistor and an emitter of the fourth BJT transistor are connected together and then connected to one end of the sixth resistor, the other end of the sixth resistor is connected to a drain of the twelfth MOSFET tube, an emitter of the third BJT transistor is connected to a drain of the twelfth MOSFET tube through the fifth resistor, a collector of the third BJT transistor is connected to a drain of the fourteenth MOSFET tube, a gate of the fourteenth MOSFET tube is connected to a gate of the thirteenth MOSFET tube, a source of the thirteenth MOSFET tube is connected to the power supply, a source of the fourteenth MOSFET tube is connected to the source VDD, and a gate and a drain of the thirteenth MOSFET tube are connected together, the source electrode of the twelfth MOSFET is grounded, the base electrode of the fifth BJT transistor is used as a first positive phase input end of the second amplifier, the base electrode of the fourth BJT transistor is used as a second positive phase input end, the base electrode of the third BJT transistor is used as an inverted phase input end, and the collector electrode of the third BJT transistor is used as an output end.
The invention has the advantages that the temperature coefficient of the conventional Brokaw band-gap reference circuit is optimized, the advantage of ultralow temperature coefficient is achieved, the noise performance is better, and the requirement of a high-precision circuit system on the reference circuit can be met.
Further features and aspects of the present invention will become apparent from the following description of specific embodiments with reference to the accompanying drawings.
Drawings
FIG. 1 is a circuit schematic of a Brokaw bandgap reference circuit;
FIG. 2 is a circuit diagram of a bandgap reference circuit of the present invention;
fig. 3 is a circuit diagram of the amplifier AMP 2;
fig. 4 is a circuit diagram of the amplifier AMP 1;
FIG. 5 is a graph showing simulation of temperature characteristics of a bandgap reference circuit according to the present invention;
FIG. 6 is a graph of a simulation of the linear adjustment rate of the bandgap reference circuit of the present invention;
FIG. 7 is a simulation diagram of the power supply rejection ratio of the bandgap reference circuit of the present invention;
fig. 8 is a graph of the output noise simulation of the bandgap reference circuit of the present invention.
The symbols in the drawings illustrate that:
M1-M15 are the first to the fifteenth MOSFET, R1-R9 are the first to the ninth resistor, Q1-Q7 are the first to the seventh BJT transistor, C1 is the capacitor, VDD is the power, VSS is the ground, V1 is the power supplyREFINN, INP1, INP2 are input terminals of a second amplifier AMP2, V is a reference circuit output voltageOUTIs the output terminal of the second amplifier AMP2, INN1, INN2 is the input terminal of the first amplifier AMP1, VBIAS1、VBIAS2Is the bias voltage of the current mirror.
Detailed Description
The present invention will be described in further detail below with reference to specific embodiments thereof with reference to the attached drawings.
As shown in fig. 2, the bandgap reference circuit with low temperature coefficient of the present invention comprises a fifteenth MOSFET M15, a third resistor R3, a fourth resistor R4, a first BJT transistor Q1, a second BJT transistor Q2, the second resistor R2, the first resistor R1, the first amplifier AMP1, the second amplifier AMP2, the source of the fifteenth MOSFET M15 is connected with the power supply VDD, one end of the third resistor R3 is connected with the drain of the fifteenth MOSFET M15, the other end of the third resistor R3 is connected with the collector of the first BJT transistor Q1, one end of the fourth resistor R4 is connected with the drain of the fifteenth MOSFET, the other end of the fourth resistor R4 is connected with the collector of the second BJT transistor Q2, the base of the first BJT transistor Q1 is connected with the base of the second BJT transistor Q2, the emitter of the first BJT transistor Q1 is grounded through the second resistor R2 and the first resistor R1, and the emitter of the second BJT transistor Q2 is connected with the node between the second resistor R2 and the first resistor R1. A node a1 between the third resistor R3 and the collector of the first BJT transistor Q1 is connected to a non-inverting input terminal of the first amplifier AMP1, a node a2 between the fourth resistor R4 and the collector of the second BJT transistor Q2 is connected to an inverting input terminal of the first amplifier AMP1, and an output terminal of the first amplifier AMP1 is connected to a base of the first BJT transistor Q1. The gate of the fifteenth MOSFET M15 is connected to the output terminal of the second amplifier AMP 2.
The second amplifier AMP2, shown in FIG. 3, may be considered as a combination of two double-ended input single-ended output amplifiers having a common inverting input INN and an output VOUTAnd a power supply VDD, a fifth resistor R5 and a sixth resistor R6 are added to an emitter of an input tube of the amplifier to improve the linearity of the amplifier, and the fifth resistor R5 and the sixth resistor R6 are negative feedback resistors. The second amplifier AMP2 includes a thirteenth MOSFET M13, a fourteenth MOSFET M14, a fifth BJT transistor Q5, a fourth BJT transistor Q4, a third BJT transistor Q3, a sixth resistor R6, a fifth resistor R5, a twelfth MOSFET M12, a collector of the fifth BJT transistor Q5 and a collector of the fourth BJT transistor Q4 are connected together and then connected to a drain of the thirteenth MOSFET M13, an emitter of the fifth BJT transistor Q5 and an emitter of the fourth BJT transistor Q4 are connected together and then connected to one end of the sixth resistor R6, the other end of the sixth resistor R6 is connected to a drain of the twelfth MOSFET M12, an emitter of the third BJT Q3 is connected to a drain of the twelfth MOSFET M12 through a fifth resistor R5, a collector of the third BJT Q3 is connected to a drain of the fourteenth MOSFET M14, a gate of the fourteenth MOSFET M14 is connected to a source of the thirteenth BJT M13, a source of the thirteenth BJT M13, the source of the fourteenth MOSFET M14 is connected to the power supply VDD, the gate and the drain of the thirteenth MOSFET M13 are connected together, the source of the twelfth MOSFET M12 is grounded, and the base of the fifth BJT transistor Q5 is used as the first non-inverting input IN of the second amplifier AMP2P1, the base of the fourth BJT transistor Q4 as the second non-inverting input INP2, the base of the third BJT transistor Q3 as the inverting input INN, and the collector of the third BJT transistor Q3 as the output VOUTThe gate of the twelfth MOSFET M12 is connected to the control signal VBIAS5. The drain of the twelfth MOSFET M12 is connected to the control signal PIBO 1. The second amplifier AMP2 is used for clamping the node potentials of the nodes A1 and A2 at V by using the characteristic that the input end is' virtual shortREFNearby, ensure BJT transistors Q1, Q2 work in the amplification region and form a feedback loop to stabilize the output voltage. The inverting input terminal INN is connected to the base of the second BJT transistor Q2, the first non-inverting input terminal INP1 is connected to the node A1 between the third resistor R3 and the collector of the first BJT transistor Q1, the second non-inverting input terminal INP2 is connected to the node A2 between the fourth resistor R4 and the collector of the second BJT transistor Q2, and the output terminal V is connected to the output terminal VOUTIs connected with the gate of the fifteenth MOSFET M15.
The provision of the second amplifier AMP2 enables: on one hand, Q1 and Q2 can be arranged to work in an amplification region, and on the other hand, a closed-loop stable reference circuit output voltage is formed, so that the reference circuit has better stability.
As shown in fig. 4, the first amplifier AMP1 may specifically adopt a two-stage amplifier, where the first stage adopts a current mirror circuit composed of a first MOSFET M1 and a second MOSFET M2 as a load, and negative feedback resistors R7 and R8 are added to the source to reduce the influence of circuit mismatch and 1/f noise of M1 and M2; the second stage of the amplifier adopts a common source amplifier structure, so that the gain of the amplifier can be improved; r9 is zero setting resistance, and C1 is miller compensation capacitance, and the effect is to carry out frequency compensation to the amplifier, improves amplifier stability.
Due to the base-emitter voltage difference V of the BJT transistorBEThe expression is formula (3).
Figure BDA0003147182210000051
The voltage difference across the second resistor R2 is expressed by equation (4).
Figure BDA0003147182210000052
With the first amplifier AMP1 "pseudo-short" characteristic, A is adjusted1、A2Two-node clamping, so that A in FIG. 21、A2The node potentials are approximately equal due to the third resistor R3And a fourth resistor R4Are directly connected together, setting a third resistance R3And a fourth resistor R4The resistance is the same, then the first BJT transistor Q1And a second BJT transistor Q2The currents of the two branches are approximately equal. In addition, due to ISIs in direct proportion to its area, Q1And Q2Is set to 72:9, corresponding to ISThe ratio of R to R is also 72:9, and the formula (4) can be simplified to obtain R2Voltage difference V ofR2See formula (5).
Figure BDA0003147182210000061
Therefore, the output end voltage V of the band gap reference circuit of the inventionREFIs the expression (6)
Figure BDA0003147182210000062
By regulating R1And R2Is such that the reference voltage VREFA zero temperature coefficient is obtained at a certain temperature point.
The band gap reference circuit of the invention is simulated:
setting VDD power supply voltage as 5V DC voltage, and under TT process angle, performing DC scanning on simulation temperature of the reference circuit at-40 ℃ to 85 ℃, wherein V isREFAs shown in FIG. 5, the output voltage V is within the temperature range of-40 deg.C to 85 deg.CREFFluctuates in the range of 1.25312V to 1.25243V with an error of about 0.69mV, and the temperature coefficient calculated to work at a temperature in the range of-40 ℃ to 85 ℃ is 4.405ppm/℃。
Setting VDD power supply voltage to be 5V, simulation temperature to be 25 ℃, performing 3.6V-5.5V direct current scanning on input power supply voltage under TT process angle, and generating linear adjustment rate simulation graph of output voltage VREF as shown in figure 6, wherein V isREFThe variation range is 1.253129V-1.253108V, the error is about 21 muV, and the linear adjustment rate is 11.7 muV/V.
The simulation temperature is set to be 25 ℃, the power supply voltage is 5V direct current voltage and 1V alternating current voltage is added, power supply rejection ratio simulation is carried out on the first-order band gap reference circuit under the TT process angle, and the simulation result is shown in figure 7. The power supply rejection ratio of the circuit at the low frequency of 1Hz is 89.12 dB; the power supply rejection ratio at 10kHz was 32.98 dB.
Setting the VDD power supply voltage as 5V direct current voltage, the simulation temperature as 25 ℃, performing noise simulation on the first-order band gap reference circuit under the TT process angle, setting the simulation frequency as 1 Hz-1 GHz, and setting the simulation result as shown in figure 8, wherein the circuit output noise at the low frequency of 1kHz is
Figure BDA0003147182210000071
The above description is only for the purpose of illustrating preferred embodiments of the present invention and is not to be construed as limiting the present invention, and it is apparent to those skilled in the art that various modifications and variations can be made in the present invention.

Claims (2)

1. A band gap reference circuit with a low temperature coefficient comprises a fifteenth MOSFET, a third resistor, a fourth resistor, a first BJT transistor, a second resistor, a first resistor and a first amplifier, wherein the source electrode of the fifteenth MOSFET is connected with a power supply, one end of the third resistor is connected with the drain electrode of the fifteenth MOSFET, the other end of the third resistor is connected with the collector electrode of the first BJT transistor, one end of the fourth resistor is connected with the drain electrode of the fifteenth MOSFET, the other end of the fourth resistor is connected with the collector electrode of the second BJT transistor, the base electrode of the first BJT transistor is connected with the base electrode of the second BJT transistor, the emitter electrode of the first BJT transistor is grounded through the second resistor and the first resistor, the emitter electrode of the second BJT transistor is connected with a node between the second resistor and the first resistor, and a node between the third resistor and the collector electrode of the first BJT transistor is connected with the positive phase input end of the first amplifier, the band-gap reference circuit with the low temperature coefficient is characterized by further comprising a second amplifier, wherein the second amplifier is provided with a first positive phase input end, a second positive phase input end, an inverse phase input end and an output end, a node between a third resistor and the collector of the first BJT transistor is connected with the first positive phase input end, a node between the fourth resistor and the collector of the second BJT transistor is connected with the second positive phase input end, the inverse phase input end of the second amplifier is connected with the base of the second BJT transistor, and the grid of a fifteenth MOSFET is connected with the output end of the second amplifier.
2. The bandgap reference circuit with low temperature coefficient according to claim 1, wherein the second amplifier comprises a thirteenth MOSFET transistor, a fourteenth MOSFET transistor, a fifth BJT transistor, a fourth BJT transistor, a third BJT transistor, a sixth resistor, a fifth resistor and a twelfth MOSFET transistor, wherein the collector of the fifth BJT transistor and the collector of the fourth BJT transistor are connected together and then connected to the drain of the thirteenth MOSFET transistor, the emitter of the fifth BJT transistor and the emitter of the fourth BJT transistor are connected together and then connected to one end of the sixth resistor, the other end of the sixth resistor is connected to the drain of the twelfth MOSFET transistor, the emitter of the third BJT transistor is connected to the drain of the twelfth MOSFET transistor through the fifth resistor, the collector of the third BJT transistor is connected to the drain of the fourteenth BJT transistor, and the gate of the fourteenth MOSFET transistor is connected to the gate of the thirteenth MOSFET, the source electrode of the thirteenth MOSFET is connected with the power supply, the source electrode of the fourteenth MOSFET is connected with the power supply VDD, the grid electrode and the drain electrode of the thirteenth MOSFET are connected together, the source electrode of the twelfth MOSFET is grounded, the base electrode of the fifth BJT transistor is used as the first positive phase input end of the second amplifier, the base electrode of the fourth BJT transistor is used as the second positive phase input end, the base electrode of the third BJT transistor is used as the reverse phase input end, and the collector electrode of the third BJT transistor is used as the output end.
CN202110755566.5A 2021-07-05 2021-07-05 Band gap reference circuit with low temperature coefficient Active CN113485511B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202110755566.5A CN113485511B (en) 2021-07-05 2021-07-05 Band gap reference circuit with low temperature coefficient

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202110755566.5A CN113485511B (en) 2021-07-05 2021-07-05 Band gap reference circuit with low temperature coefficient

Publications (2)

Publication Number Publication Date
CN113485511A true CN113485511A (en) 2021-10-08
CN113485511B CN113485511B (en) 2022-05-10

Family

ID=77940761

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202110755566.5A Active CN113485511B (en) 2021-07-05 2021-07-05 Band gap reference circuit with low temperature coefficient

Country Status (1)

Country Link
CN (1) CN113485511B (en)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101930247A (en) * 2009-06-25 2010-12-29 上海华虹Nec电子有限公司 Voltage reference circuit with automatic protection
CN202083976U (en) * 2011-05-05 2011-12-21 王宇星 High-precision CMOS (Complementary Metal Oxide Semiconductor) band-gap reference circuit
CN102541149A (en) * 2010-12-31 2012-07-04 无锡华润上华半导体有限公司 Reference power circuit
CN102999077A (en) * 2012-12-03 2013-03-27 哈尔滨工业大学(威海) Current leveling circuit with high linear compensation
CN103299250A (en) * 2011-01-12 2013-09-11 德克萨斯仪器股份有限公司 Bandgap voltage reference circuitry
US20150293552A1 (en) * 2014-04-14 2015-10-15 Renesas Electronics Corporation Current generation circuit, and bandgap reference circuit and semiconductor device including the same
CN111190454A (en) * 2020-02-28 2020-05-22 清华大学 Curvature compensation low-temperature drift band gap reference voltage source circuit
CN111427410A (en) * 2020-04-22 2020-07-17 中国科学院微电子研究所 Band gap reference circuit

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101930247A (en) * 2009-06-25 2010-12-29 上海华虹Nec电子有限公司 Voltage reference circuit with automatic protection
CN102541149A (en) * 2010-12-31 2012-07-04 无锡华润上华半导体有限公司 Reference power circuit
CN103299250A (en) * 2011-01-12 2013-09-11 德克萨斯仪器股份有限公司 Bandgap voltage reference circuitry
CN202083976U (en) * 2011-05-05 2011-12-21 王宇星 High-precision CMOS (Complementary Metal Oxide Semiconductor) band-gap reference circuit
CN102999077A (en) * 2012-12-03 2013-03-27 哈尔滨工业大学(威海) Current leveling circuit with high linear compensation
US20150293552A1 (en) * 2014-04-14 2015-10-15 Renesas Electronics Corporation Current generation circuit, and bandgap reference circuit and semiconductor device including the same
CN111190454A (en) * 2020-02-28 2020-05-22 清华大学 Curvature compensation low-temperature drift band gap reference voltage source circuit
CN111427410A (en) * 2020-04-22 2020-07-17 中国科学院微电子研究所 Band gap reference circuit

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
SONIYA GUPTE等: "Design of resistorless low temperature coefficient band gap reference bias circuit", 《2011 INTERNATIONAL CONFERENCE ON COMMUNICATION SYSTEMS AND NETWORK TECHNOLOGIES》 *
安景慧等: "一种宽温度范围的低温度系数带隙基准源设计", 《西安电子科技大学学报》 *

Also Published As

Publication number Publication date
CN113485511B (en) 2022-05-10

Similar Documents

Publication Publication Date Title
CN111240394B (en) Operational amplifier-free band gap reference circuit with pre-voltage stabilization structure
US5229711A (en) Reference voltage generating circuit
CN112859996B (en) Low-voltage high-precision band-gap reference circuit
CN111930169B (en) Negative feedback subsection curvature compensation band gap reference circuit
CN113157041B (en) Wide-input band gap reference voltage source
CN108052151B (en) Band-gap reference voltage source of no-clamping operational amplifier
WO2023097857A1 (en) Bandgap reference voltage circuit and bandgap reference voltage compensation method
CN111045470B (en) Band-gap reference circuit with low offset voltage and high power supply rejection ratio
CN113359929A (en) Band-gap reference circuit and low-offset high-power-supply-rejection-ratio band-gap reference source
CN112564631A (en) Band-gap reference circuit with pre-voltage stabilization and base current elimination
CN114489221B (en) Band-gap reference voltage source circuit and band-gap reference voltage source
CN112596576B (en) Band gap reference circuit
CN117055681A (en) Band gap reference circuit with high-order temperature compensation
CN111930170A (en) high-PSRR high-precision multi-order current compensation band gap reference source
CN113485511B (en) Band gap reference circuit with low temperature coefficient
CN115437446B (en) High-precision curvature compensation band gap reference circuit
CN112256078B (en) Positive temperature coefficient current source and zero temperature coefficient current source
CN114661086A (en) Band-gap reference voltage source circuit
CN115079766A (en) Band gap type reference voltage generating circuit
CN111061329A (en) Band-gap reference circuit with high loop gain and double loop negative feedback
CN114661087B (en) Reference voltage source with bias current matching
JP5925357B1 (en) Temperature compensation circuit
CN117519403B (en) Band gap reference circuit and electronic equipment
JP5925362B1 (en) Temperature compensation circuit
Nigam et al. Curvature compensated TIA based BGR

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant