CN113484715B - Semiconductor automatic test machine - Google Patents
Semiconductor automatic test machine Download PDFInfo
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- CN113484715B CN113484715B CN202111047883.8A CN202111047883A CN113484715B CN 113484715 B CN113484715 B CN 113484715B CN 202111047883 A CN202111047883 A CN 202111047883A CN 113484715 B CN113484715 B CN 113484715B
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- 238000012360 testing method Methods 0.000 title claims abstract description 100
- 239000004065 semiconductor Substances 0.000 title claims abstract description 60
- 238000007789 sealing Methods 0.000 claims abstract description 9
- 238000004140 cleaning Methods 0.000 claims description 19
- 230000001681 protective effect Effects 0.000 claims description 17
- 239000000843 powder Substances 0.000 claims description 14
- 239000000463 material Substances 0.000 claims description 12
- 238000005096 rolling process Methods 0.000 claims description 9
- 230000000149 penetrating effect Effects 0.000 claims description 7
- CWYNVVGOOAEACU-UHFFFAOYSA-N Fe2+ Chemical compound [Fe+2] CWYNVVGOOAEACU-UHFFFAOYSA-N 0.000 claims description 4
- 230000017525 heat dissipation Effects 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 12
- 239000000306 component Substances 0.000 description 12
- 238000009960 carding Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- 210000004209 hair Anatomy 0.000 description 6
- 230000000630 rising effect Effects 0.000 description 6
- 238000002485 combustion reaction Methods 0.000 description 4
- 230000001737 promoting effect Effects 0.000 description 4
- 239000008358 core component Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000004020 conductor Substances 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 239000000696 magnetic material Substances 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 230000002431 foraging effect Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/10—Cleaning by methods involving the use of tools characterised by the type of cleaning tool
- B08B1/12—Brushes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a semiconductor automatic test machine, which relates to the technical field of semiconductors and comprises a test main board and a control piece arranged in the middle of one side of the test main board, wherein the upper end of each test core piece is provided with a protection part, the protection part comprises a protection shell and a fire extinguishing assembly arranged on the inner side of the protection shell, the inner side of the protection shell is also provided with a pressure pushing assembly, the pressure pushing assembly penetrates through the fire extinguishing assembly, the upper end of the pressure pushing assembly penetrates through a sealing cover arranged on the upper end of the protection shell in a threaded manner, and the middle part of the sealing cover is fixedly provided with an alarm piece. The buzzer alarm can continuously give an alarm until the worker finds the alarm and processes the alarm in time.
Description
Technical Field
The invention relates to the technical field of semiconductors, in particular to a semiconductor automatic test machine.
Background
A semiconductor refers to a material having a conductivity between a conductor and an insulator at normal temperature. The semiconductor has wide application in radio, television and temperature measurement. Such as diodes, are devices fabricated using semiconductors. Semiconductor refers to a material whose conductivity can be controlled, ranging from an insulator to a conductor. The importance of semiconductors is enormous, both from a technological and economic point of view. In high, low temperature and high speed testing of semiconductor chips, in order to improve efficiency, a plurality of chips are usually tested at one time, and a signal sending and receiving device in a testing system is formed by connecting a semiconductor testing board and a plurality of testing core boards through connectors. The semiconductor chip to be tested is placed in a slot on the semiconductor test board and is placed in a severe temperature environment for aging test. In the burn-in test, a semiconductor chip is usually tested at a high reading speed and a high current which is harsh to normal use conditions, which causes each chip element of the test core board to generate heat seriously, and affects the performance and the service life of the test core board.
However, the existing semiconductor automatic testing machine is aging tested in an extreme environment, and the testing quantity is large, the testing time is long, under such a condition, an emergency situation of short circuit or overhigh heat often occurs in the testing process, and then the local damage of the detecting instrument is caused.
To solve the above problems. Therefore, a semiconductor automatic testing machine is provided.
Disclosure of Invention
The invention aims to provide an automatic semiconductor testing machine, in the process of detecting semiconductors, when short circuit combustion or over-high temperature occurs, the air pressure in a protective shell is gradually increased, an air guide hole can not meet the requirement of internal pressure relief, the pressure pushes a pressure pushing assembly to move upwards, a mounting disc can move upwards, an extension column is further driven to move upwards, a puncture needle is further driven to move upwards, the puncture needle penetrates through a gap between adjacent linking frames along with continuous upward movement, a storage bag is punctured like a puncture balloon, dry powder filled in the storage bag is instantaneously released and rapidly diffused to the upper end of a testing core piece, a starting button is pressed to a starting piece along with continuous rising of the pushing disc, a buzzer alarm is started at the moment, and a worker is reminded of damage to the testing core piece at the position, along with promoting the continuous rising of dish, make the buzzer siren start-up back, the draw-in groove is crossed just to the fixture block this moment, under the effect that resets of penetrating the pole, make the fixture block card in the upper end of buzzer siren, even if pressure inside the protective housing reduces thereafter, but not handled by the staff, the buzzer siren still can continue to report to the police, until the staff discovery, the staff opens the back with the protective housing, can take out the clearance piece, and use the carding to clear up the remaining dry powder on will testing the core piece, after the carding clearance finishes, can be nimble promote the piece through promoting, make sled needle or sled piece released, and then timely will be complete or damage little part and semiconductor take out, can solve the problem of proposing among the above-mentioned background art.
In order to achieve the purpose, the invention provides the following technical scheme: the semiconductor automatic test machine comprises a test mainboard and a control piece arranged in the middle of one side of the test mainboard, wherein the upper end of the test mainboard is provided with a plurality of test core pieces, the middle of each test core piece is provided with a slot for inserting a semiconductor, and the upper end of each test core piece is provided with a protection component;
the protection part comprises a protection shell and a fire extinguishing assembly arranged on the inner side of the protection shell, the pressure pushing assembly is further arranged on the inner side of the protection shell, the pressure pushing assembly penetrates through the fire extinguishing assembly, the upper end of the pressure pushing assembly penetrates through a sealing cover arranged on the upper end of the protection shell in a threaded mode, an alarm piece is fixedly arranged in the middle of the sealing cover, and a cleaning assembly is arranged on the outer side of the protection shell.
Furthermore, a thread groove is formed in the lower end of the inner side of the protective shell and is in threaded connection with the outer side of the test core piece, disassembly and assembly are facilitated, and a plurality of air guide holes are formed in the protective shell in a penetrating mode and used for proper heat dissipation.
Furtherly, the subassembly of putting out a fire includes the link and sets up the linking frame in the link inboard, leaves the space between the adjacent linking frame, links up the other end and the center tube fixed connection of frame, links up the upper end of frame and has placed the storage bag, and the storage bag is the component that a rubber materials made, and the middle part packing of storage bag has the dry powder.
Further, the pressure pushing assembly comprises a mounting disc and piercing members arranged at two ends of the mounting disc.
Further, the piercing part comprises an extension rod and an extension column arranged at the upper end of the extension rod, a puncture needle is arranged at the upper end of the extension column, and the diameter of the extension column is larger than that of the puncture needle.
Furthermore, one side of the mounting disc is provided with a through pipe, and the other end of the through pipe is provided with a pushing disc.
Furthermore, the middle part of the upper end of the pushing disc is provided with a starting button, the alarm part comprises a buzzer alarm and a starting part arranged in the middle of the lower end of the buzzer alarm, and the starting button corresponds to the starting part.
Furthermore, the upper end of the pushing disc is also provided with a clamping assembly, and two sides of the clamping assembly, which are positioned on the starting button, are respectively provided with one clamping assembly.
Furthermore, the chucking subassembly is including running through the pole and setting at the fixture block that runs through pole upper end one side, runs through the pole and be the rigidity sheet metal, and the fixture block looks sideways at and is triangle-shaped, and is corresponding with the dead draw-in groove of buzzer siren both sides card.
Furthermore, the lower end of the fixture block is provided with a mounting ring, the inner side of the mounting ring is movably provided with a rolling pipe, and the diameter of the rolling pipe is larger than that of the mounting ring.
Further, the clearance subassembly is including placing the box and setting up placing the inboard clearance piece of box, it is the component that a ferrous material made to place the box, clearance piece includes the handle and sets up the extension piece at the handle lower extreme, the handle is the component that a magnetic material made, the lower extreme that extends the piece is provided with the combing hair, one side of handle is provided with the first piece that promotes, one side that first promotes the piece is provided with the head rod, the other end of head rod is provided with the sled needle, one side of handle still is provided with the second and promotes the piece, the second promotes one side of piece and is provided with the second connecting rod, the other end of second connecting rod is provided with the sled piece.
Compared with the prior art, the invention has the beneficial effects that:
1. the invention provides an automatic semiconductor testing machine table, wherein a storage bag is arranged at the upper end of a connecting frame, the storage bag is a component made of rubber materials, a pricker is arranged at the upper end of a dry powder extending column filled in the middle of the storage bag, the diameter of the extending column is larger than that of the pricker, and the storage bag can penetrate through a gap between adjacent connecting frames, when short circuit combustion or overhigh temperature occurs in the process of detecting a semiconductor, the air pressure in a protective shell is gradually increased, an air guide hole can not meet the requirement of internal pressure release, at the moment, the pressure pushes a pressure pushing component to move upwards, a mounting disc can move upwards, the extending column is further driven to move upwards, the pricker is further driven to move upwards, along with continuous upward movement, the pricker penetrates through the gap between adjacent connecting frames, the storage bag is pricked like a prick balloon, at the moment, the dry powder filled in the storage bag is released instantly, the quick upper end that spreads to test core spare can effectively water the naked light and go out, has certain cooling effect moreover, not only guarantees that test core spare self can not damage too seriously, can not influence test core spare on every side in addition, improves the self-protection ability of test board.
2. According to the automatic semiconductor testing machine, the starting button is arranged in the middle of the upper end of the pushing disc, the starting piece is arranged in the middle of the lower end of the buzzer alarm, the starting button corresponds to the starting piece, the starting button is pressed to the starting piece along with the continuous rising of the pushing disc, the buzzer alarm is started, and the buzzer alarm gives an alarm to remind a worker that a testing core piece at the position is damaged and is timely processed, so that the damage degree of the testing core piece is further reduced.
3. According to the automatic semiconductor testing machine, the fixture block is arranged on one side of the upper end of the through rod, the through rod is a rigid thin plate, the side view of the fixture block is triangular and corresponds to the clamping grooves clamped on the two sides of the buzzer alarm, the fixture block is located at the bottom of the clamping grooves and pushes the through rod to bend in the reverse direction under the normal use state of the testing machine, the pushing disc continuously rises, the fixture block just crosses the clamping grooves after the buzzer alarm is started, the fixture block is clamped at the upper end of the buzzer alarm under the reset effect of the through rod, and then the pressure pushing assembly cannot return freely even if the pressure inside the protective shell is reduced but is not processed by a worker, the buzzer alarm can still give an alarm continuously until the worker finds and processes the pressure in time, and further reduces the damage degree of the testing core piece.
4. According to the automatic semiconductor testing machine table provided by the invention, the mounting ring is arranged at the lower end of the clamping block, the rolling pipe is movably arranged on the inner side of the mounting ring, the diameter of the rolling pipe is larger than that of the mounting ring, and when the clamping block moves up and down, the friction force between the clamping block and the clamping groove is reduced, so that the pressure pushing assembly moves up more smoothly and quickly, and the alarm is ensured to be timely.
5. The invention provides an automatic semiconductor testing machine, a cleaning assembly comprises a placing box and a cleaning piece arranged on the inner side of the placing box, the placing box is a member made of ferrous materials, the cleaning piece comprises a handle and an extending piece arranged at the lower end of the handle, the handle is a member made of magnet materials, the placing box is convenient to adsorb, the storing and taking are convenient, the lower end of the extending piece is provided with carding hair, when a worker opens a protective shell, the cleaning piece can be taken out, the carding hair is used for cleaning residual dry powder on a testing core piece, one side of the handle is provided with a first pushing block, one side of the first pushing block is provided with a first connecting rod, the other end of the first connecting rod is provided with a prying needle, one side of the handle is also provided with a second pushing block, one side of the second pushing block is provided with a second connecting rod, the other end of the second connecting rod is provided with a prying piece, after the carding hair is cleaned, can be nimble promote the piece through promoting for sled needle or sled piece are released, and then timely will be complete or damage little part and semiconductor and take out, and the maintenance of being convenient for, sled needle and sled piece all can contract moreover, are convenient for place.
Drawings
FIG. 1 is a schematic diagram of an overall three-dimensional structure of a semiconductor automatic test machine according to the present invention;
FIG. 2 is a schematic perspective view of a protection component of the semiconductor automatic test machine according to the present invention;
FIG. 3 is a schematic diagram of an internal planar structure of a protection component of the semiconductor automatic test machine of the present invention in a non-operating state;
FIG. 4 is a schematic perspective view of a fire extinguishing module of the semiconductor automated testing machine of the present invention;
FIG. 5 is a partial perspective view of a pressure driving assembly of the semiconductor automated testing machine of the present invention;
FIG. 6 is a schematic diagram of an overall three-dimensional structure of a pressure driving assembly of the semiconductor automatic test machine according to the present invention;
FIG. 7 is a schematic view of an internal plane structure of the protection device of the semiconductor automatic test machine of the present invention in a working state;
FIG. 8 is an enlarged schematic view of a portion A of the semiconductor automated test machine of the present invention shown in FIG. 2;
FIG. 9 is a schematic view of a partial three-dimensional structure of a clamping assembly of the semiconductor automatic test machine according to the present invention;
FIG. 10 is a schematic perspective view of a cleaning member of the semiconductor automated testing machine according to the present invention.
In the figure: 1. testing the main board; 2. a control member; 3. testing the core piece; 4. a protective member; 41. a protective shell; 411. a thread groove; 412. an air vent; 42. a fire extinguishing assembly; 421. a connecting frame; 422. a linking frame; 423. a central tube; 424. a storage bag; 425. dry powder; 43. a pressure pushing assembly; 431. mounting a disc; 432. a piercing member; 4321. an extension rod; 4322. extending the column; 4323. a needle; 433. penetrating the pipe; 434. pushing the disc; 435. a start button; 436. a clamping assembly; 4361. penetrating the rod; 4362. a clamping block; 4363. a mounting ring; 4364. a rolling tube; 44. sealing the cover; 45. an alarm member; 451. a buzzer alarm; 4511. a card slot; 452. a trigger; 46. cleaning the assembly; 461. placing the box; 462. cleaning the workpiece; 4621. a handle; 4622. an extension piece; 4623. combing; 4624. a first pushing block; 4625. a first connecting rod; 4626. prying a needle; 4627. a second pushing block; 4628. a second connecting rod; 4629. a pry sheet.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, the semiconductor automated testing machine includes a testing motherboard 1 and a control component 2 disposed in the middle of one side of the testing motherboard 1, wherein the testing motherboard 1 is provided at an upper end thereof with a plurality of testing core components 3, the testing core components 3 are provided at a middle thereof with slots into which semiconductors are inserted, and the testing core components 3 are provided at an upper end thereof with a protection component 4.
Referring to fig. 3, the protection component 4 of the semiconductor automated testing machine includes a protection shell 41 and a fire extinguishing assembly 42 disposed inside the protection shell 41, the connection mode between the fire extinguishing assembly 42 and the protection shell 41 may be a threaded connection or a snap connection, a threaded groove 411 is disposed at the lower end of the inner side of the protection shell 41, the threaded groove 411 is in threaded connection with the outer side of the testing core 3, which is convenient for disassembly and assembly, and the protection shell 41 further has a plurality of air vents 412 formed therethrough for dissipating heat properly, thereby ensuring a normal testing environment inside the protection shell 41 during the testing phase.
Referring to fig. 3, in the semiconductor automated testing machine, a pressure pushing assembly 43 is further disposed on an inner side of a protection casing 41, the pressure pushing assembly 43 penetrates through a fire extinguishing assembly 42, an upper end of the pressure pushing assembly 43 penetrates through a sealing cover 44 screwed on an upper end of the protection casing 41, an alarm 45 is fixedly disposed in a middle of the sealing cover 44, and a cleaning assembly 46 is disposed on an outer side of the protection casing 41.
Referring to fig. 4, in the semiconductor automated testing machine, the fire extinguishing assembly 42 includes a connecting frame 421 and a connecting frame 422 disposed inside the connecting frame 421, a gap is left between adjacent connecting frames 422 to facilitate dropping of the dry powder 425, the other end of the connecting frame 422 is fixedly connected to the central tube 423, a storage bag 424 is disposed at the upper end of the connecting frame 422, the storage bag 424 is a member made of a rubber material, and the middle of the storage bag 424 is filled with the dry powder 425.
Referring to fig. 5, in the semiconductor automated testing machine, the pressure pushing assembly 43 includes a mounting plate 431 and piercing members 432 disposed at two ends of the mounting plate 431, the piercing members 432 include extending rods 4321 and extending columns 4322 disposed at the upper ends of the extending rods 4321, the upper ends of the extending columns 4322 are provided with pricking pins 4323, and the extending columns 4322 have a diameter larger than that of the pricking pins 4323 and can penetrate through the gaps between the adjacent engaging frames 422.
In the process of detecting semiconductors, when short circuit combustion occurs or the temperature is too high, the air pressure inside the protective shell 41 gradually increases at this time, the air vent 412 cannot far meet the requirement of internal pressure relief, at this time, the pressure pushes the pressure pushing assembly 43 to move upwards, the mounting plate 431 therefore moves upwards, thereby driving the extending column 4322 to move upward and further driving the needle 4323 to move upward, and as the needle 4323 continuously moves upward, the needle 4323 penetrates through the gap between the adjacent linking frames 422, then the storage bag 424 is punctured like a balloon, at the moment, the dry powder 425 filled in the storage bag 424 is instantly released and rapidly diffused to the upper end of the test core piece 3, the open fire can be effectively extinguished, but also has a certain cooling effect, not only ensures that the test core piece 3 is not damaged too seriously, and the surrounding test core piece 3 is not affected, and the self-protection capability of the test machine is improved.
Referring to fig. 6, in the semiconductor automated testing machine, a through pipe 433 is disposed at one side of a mounting plate 431, and a pushing plate 434 is disposed at the other end of the through pipe 433, so that when the pressure inside a protection casing 41 is increased, the pushing plate 434 is pushed to move upward.
Referring to fig. 2, 6, 7 and 8, in the semiconductor automatic testing machine, a start button 435 is disposed in the middle of the upper end of a push plate 434, an alarm 45 includes a buzzer alarm 451 and a start piece 452 disposed in the middle of the lower end of the buzzer alarm 451, the start button 435 corresponds to the start piece 452, the start button 435 presses the start piece 452 along with the continuous rising of the push plate 434, so as to start the buzzer alarm 451, and the buzzer alarm 451 gives an alarm to remind a worker that a test core 3 at the position is damaged and disposed in time, so as to further reduce the damage degree of the test core 3.
The upper end of the push disk 434 is further provided with a clamping assembly 436, the clamping assemblies 436 are respectively arranged on two sides of the start button 435, each clamping assembly 436 comprises a through rod 4361 and a clamping block 4362 arranged on one side of the upper end of the through rod 4361, the through rod 4361 is a rigid thin plate, the side view of the clamping block 4362 is triangular and corresponds to a clamping groove 4511 clamped on two sides of the buzzer alarm 451, in a normal use state of the test machine, the clamping block 4362 is arranged at the bottom of the clamping groove 4511 and pushes and bends the through rod 4361 in a reverse direction, the push disk 434 continuously rises along with the push disk, after the buzzer alarm 451 is started, the clamping block 4362 just crosses the clamping groove 4511, under a resetting effect of the through rod 4361, the clamping block 4362 is clamped at the upper end of the buzzer alarm 451, and then even if the pressure inside the through rod 4361 is reduced, the pressure is not handled by a worker, the pressure push assembly 43 cannot freely return, the buzzer alarm 451 still alarms continuously, until the staff finds out, in time deal with, further reduce the damage degree of testing the core 3.
Referring to fig. 9, in an automatic semiconductor testing machine, a mounting ring 4363 is disposed at a lower end of a clamping block 4362, a rolling tube 4364 is movably disposed at an inner side of the mounting ring 4363, a diameter of the rolling tube 4364 is larger than a diameter of the mounting ring 4363, and when the clamping block 4362 moves up and down, friction between the clamping block 4362 and a clamping groove 4511 is reduced, so that the pressure pushing assembly 43 moves up more smoothly and rapidly, and an alarm is guaranteed to be timely.
Referring to fig. 2 and 10, the cleaning assembly 46 of the semiconductor automated testing machine includes a placing box 461 and a cleaning member 462 disposed inside the placing box 461, the placing box 461 is a member made of ferrous material, the cleaning member 462 includes a handle 4621 and an extension piece 4622 disposed at the lower end of the handle 4621, the handle 4621 is a member made of magnetic material, so as to facilitate the attachment of the placing box 461, and the access is convenient, the lower end of the extension piece 4622 is provided with a comb 4623, when the protective case 41 is opened by a worker, the cleaning member 462 can be taken out, and the comb 4623 can be used to clean the residual dry powder on the testing core 3.
One side of handle 4621 is provided with first promotion piece 4624, one side of first promotion piece 4624 is provided with first connecting rod 4625, the other end of first connecting rod 4625 is provided with sled needle 4626, one side of handle 4621 still is provided with second promotion piece 4627, one side of second promotion piece 4627 is provided with second connecting rod 4628, the other end of second connecting rod 4628 is provided with sled piece 4629, after carding 4623 finishes clearing up, can be nimble through promoting the promotion piece, make sled needle 4626 or sled piece 4629 released, and then in time take out complete or little part of damage and semiconductor, be convenient for maintain, sled needle 4626 and sled piece 4629 all can contract, be convenient for place.
The working principle is as follows: in the process of detecting a semiconductor, when short circuit combustion or over-high temperature occurs, the air pressure inside the protective shell 41 gradually increases at this time, the air vent 412 can not meet the requirement of internal pressure release far away, at this time, the pressure pushes the pressure pushing component 43 to move upwards, the mounting disc 431 therefore moves upwards, and further drives the extending column 4322 to move upwards, and further drives the puncture needle 4323 to move upwards, and along with continuous upward movement, the puncture needle 4323 penetrates through the gap between the adjacent linking frames 422, and further punctures the storage bag 424 like a puncture balloon, at this time, the dry powder 425 filled in the storage bag 424 is released instantaneously, and rapidly diffuses to the upper end of the test core 3, along with continuous rising of the pushing disc 434, the start button 435 presses the start piece 452, and further starts the buzzer alarm 451, at this time, the buzzer alarm 451 alarms to remind a worker that the test core 3 at this position is damaged, with the continuous rising of the pushing disc 434, after the buzzer alarm 451 is started, the clamping block 4362 just crosses the clamping groove 4511, under the reset effect of the through rod 4361, the clamping block 4362 is clamped at the upper end of the buzzer alarm 451, and then even if the pressure inside the protective shell 41 is reduced and is not processed by a worker, the buzzer alarm 451 still continuously alarms until the worker finds and processes in time, after the worker opens the protective shell 41 during processing, the worker can take out the cleaning piece 462 and clean the residual dry powder on the test core 3 by using the combing hairs 4623, after the combing hairs 4623 are cleaned, the pushing block can be flexibly pushed out, so that the prying needle 4626 or the prying piece 4629 can be pushed out, and complete or small-damage parts and semiconductors can be timely taken out.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be able to cover the technical solutions and the inventive concepts of the present invention within the technical scope of the present invention.
Claims (5)
1. The semiconductor automatic test machine comprises a test mainboard (1) and a control piece (2) arranged in the middle of one side of the test mainboard (1), wherein the upper end of the test mainboard (1) is provided with a plurality of test core pieces (3), and the middle of each test core piece (3) is provided with a slot for inserting a semiconductor, and the semiconductor automatic test machine is characterized in that the upper end of each test core piece (3) is provided with a protection component (4);
the protection component (4) comprises a protection shell (41) and a fire extinguishing assembly (42) arranged on the inner side of the protection shell (41), the inner side of the protection shell (41) is also provided with a pressure pushing assembly (43), the pressure pushing assembly (43) penetrates through the fire extinguishing assembly (42), the upper end of the pressure pushing assembly penetrates through a sealing cover (44) arranged at the upper end of the protection shell (41) in a threaded manner, the middle part of the sealing cover (44) is fixedly provided with an alarm piece (45), and the outer side of the protection shell (41) is provided with a cleaning assembly (46);
the lower end of the inner side of the protective shell (41) is provided with a thread groove (411), the thread groove (411) is in threaded connection with the outer side of the test core piece (3) so as to be convenient to disassemble and assemble, and the protective shell (41) is also provided with a plurality of air guide holes (412) in a penetrating mode and used for proper heat dissipation;
the fire extinguishing assembly (42) comprises a connecting frame (421) and connecting frames (422) arranged on the inner side of the connecting frame (421), a gap is reserved between every two adjacent connecting frames (422), the other ends of the connecting frames (422) are fixedly connected with a central pipe (423), a storage bag (424) is placed at the upper end of each connecting frame (422), the storage bag (424) is a member made of rubber materials, and dry powder (425) is filled in the middle of each storage bag (424);
the pressure pushing assembly (43) comprises a mounting disc (431) and piercing parts (432) arranged at two ends of the mounting disc (431), a penetrating pipe (433) is arranged at one side of the mounting disc (431), and a pushing disc (434) is arranged at the other end of the penetrating pipe (433); the piercing part (432) comprises an extension rod (4321) and an extension column (4322) arranged at the upper end of the extension rod (4321), the upper end of the extension column (4322) is provided with a puncture needle (4323), and the diameter of the extension column (4322) is larger than that of the puncture needle (4323);
the middle part of the upper end of the push disc (434) is provided with a starting button (435), the alarm part (45) comprises a buzzer alarm (451) and a starting part (452) arranged in the middle part of the lower end of the buzzer alarm (451), and the starting button (435) corresponds to the starting part (452).
2. The automatic semiconductor tester table as claimed in claim 1, wherein the upper end of the push plate (434) is further provided with a clamping assembly (436), and one clamping assembly (436) is respectively arranged on two sides of the start button (435).
3. The apparatus of claim 2, wherein the clamping member (436) comprises a through rod (4361) and a block (4362) disposed at one side of an upper end of the through rod (4361), the through rod (4361) is a rigid thin plate, and the block (4362) is triangular in side view and corresponds to the slots (4511) blocked at two sides of the buzzer alarm (451).
4. The automatic semiconductor testing machine of claim 3, wherein the lower end of the fixture block (4362) is provided with a mounting ring (4363), the inner side of the mounting ring (4363) is movably provided with a rolling tube (4364), and the diameter of the rolling tube (4364) is larger than that of the mounting ring (4363).
5. The automatic semiconductor test machine station as claimed in claim 4, wherein the cleaning assembly (46) comprises a placing box (461) and a cleaning member (462) disposed inside the placing box (461), the placing box (461) is a member made of a ferrous material, the cleaning member (462) comprises a handle (4621) and an extension piece (4622) disposed at a lower end of the handle (4621), the handle (4621) is a member made of a magnet material, a comb (4623) is disposed at a lower end of the extension piece (4622), a first pushing block (4624) is disposed at one side of the handle 4621, a first connecting rod (4625) is disposed at one side of the first pushing block (4624), a prying needle (4626) is disposed at the other end of the first connecting rod (4625), a second pushing block (4627) is further disposed at one side of the handle 4621), a second connecting rod (4628) is disposed at one side of the second pushing block (4627), and a prying piece (4629) is disposed at the other end of the second connecting rod (4628).
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| CN202111047883.8A CN113484715B (en) | 2021-09-08 | 2021-09-08 | Semiconductor automatic test machine |
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| CN202111047883.8A CN113484715B (en) | 2021-09-08 | 2021-09-08 | Semiconductor automatic test machine |
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| CN113484715B true CN113484715B (en) | 2021-11-05 |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB190803204A (en) * | 1907-03-02 | 1908-06-18 | John Sutton | Improvements in and relating to Fire Alarms. |
| EP1163931A2 (en) * | 2000-06-14 | 2001-12-19 | Williams Fire and Hazard Control, Inc. | System for automatic self-proportioning of foam concentrate into fire fighting fluid variable flow conduit |
| CN102608507A (en) * | 2011-12-09 | 2012-07-25 | 致茂电子(苏州)有限公司 | Temperature control system and automatic semiconductor testing table with temperature control system |
| CN105736804A (en) * | 2016-04-29 | 2016-07-06 | 西安新竹防灾救生设备有限公司 | Multifunctional container valve |
| CN210302117U (en) * | 2019-07-05 | 2020-04-14 | 安徽鑫思诚科技有限公司 | A intelligent extinguishing device for electric motor car lithium cell case |
| CN211785667U (en) * | 2020-01-17 | 2020-10-27 | 深圳市森东宝科技有限公司 | Non-vacuum temperature-changing test probe station for semiconductor device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2018091055A1 (en) * | 2016-11-16 | 2018-05-24 | Rosenby Engineering Aps | Fire fighting device |
-
2021
- 2021-09-08 CN CN202111047883.8A patent/CN113484715B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB190803204A (en) * | 1907-03-02 | 1908-06-18 | John Sutton | Improvements in and relating to Fire Alarms. |
| EP1163931A2 (en) * | 2000-06-14 | 2001-12-19 | Williams Fire and Hazard Control, Inc. | System for automatic self-proportioning of foam concentrate into fire fighting fluid variable flow conduit |
| CN102608507A (en) * | 2011-12-09 | 2012-07-25 | 致茂电子(苏州)有限公司 | Temperature control system and automatic semiconductor testing table with temperature control system |
| CN105736804A (en) * | 2016-04-29 | 2016-07-06 | 西安新竹防灾救生设备有限公司 | Multifunctional container valve |
| CN210302117U (en) * | 2019-07-05 | 2020-04-14 | 安徽鑫思诚科技有限公司 | A intelligent extinguishing device for electric motor car lithium cell case |
| CN211785667U (en) * | 2020-01-17 | 2020-10-27 | 深圳市森东宝科技有限公司 | Non-vacuum temperature-changing test probe station for semiconductor device |
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| CN113484715A (en) | 2021-10-08 |
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