CN212965304U

CN212965304U - Take double product testing arrangement

Info

Publication number: CN212965304U
Application number: CN202022148048.0U
Authority: CN
Inventors: 段超毅; 陶杉; 陈海树
Original assignee: Shenzhen Kzt Microelectronics Technology Co ltd
Current assignee: Shenzhen Kzt Microelectronics Technology Co ltd
Priority date: 2020-09-25
Filing date: 2020-09-25
Publication date: 2021-04-13
Anticipated expiration: 2030-09-25

Abstract

The utility model discloses a take double product testing arrangement, including support plate, fixed plate, side push double probe subassembly, thin contact piece and PCB board, side push double probe subassembly includes needle piece, last row of probe, lower row of probe, activity post and elasticity thimble, and last row of probe and lower row of probe are fixed in the needle piece, and fixed plate one side is provided with the left side opening, and activity post and elasticity thimble are located the left side opening, and thin contact piece is located between activity post and the elasticity thimble, and the top of thin contact piece is located between the double base pin of product; the upper row of probes is positioned on the left side of the left row of tube feet of the product, and the lower row of probes is positioned on the left side of the movable column. The utility model discloses an action of promotion needle piece just can realize drawing forth of the double needle signal of product, and the action is simple, and is efficient. The contact structure is small and compact by the deformation of the thin contact piece and the contact of the row pins in the product, and can be applied to the double-row pin product with the dense small-size devices.

Description

Take double product testing arrangement

Technical Field

The utility model relates to a product function test field especially relates to a take double product testing device.

Background

When the product module with the double rows of pins is used for functional test, signals need to be led out from the pins of the rows of pins. The clamping pieces which are separated from left and right are pushed by a side air cylinder to contact the bonding wires of the double-row needles for leading out, and a butt-clamping structure with overlarge left and right separation is not suitable for small-size products and is also not suitable for products with high devices on the back and close to the double-row needles. Another commonly used device is that a bottom air cylinder pushes probes to upwards prick double-row pin pins, and the device needs to press a block or a pressing rod to pre-press the front surface of a product, so that the bottom air cylinder can act. The device has the disadvantages of excessive testing actions, low efficiency, complex structure and large volume. Products with front dense devices are not suitable because of the inability to push down the bar.

Accordingly, the prior art is deficient and needs improvement.

SUMMERY OF THE UTILITY MODEL

The utility model discloses the technical problem that will solve is: the testing device with the double-row products is simple in structure, high in testing efficiency and small in size.

The technical scheme of the utility model as follows: the utility model provides a take double product testing arrangement for the product of the double pin of test strip, includes support plate, fixed plate, side push double probe subassembly, thin contact piece and PCB board, place the product on the support plate, the support plate is located the fixed plate top, the PCB board is located the fixed plate below, the double pin of product passes the support plate and inserts in the fixed plate, the left side of fixed plate sets up the side and pushes double probe subassembly, thin contact piece bottom is connected with the PCB board.

The lateral-pushing double-row probe assembly comprises a needle block, an upper row of probes, a lower row of probes, a movable column and an elastic thimble, wherein the upper row of probes and the lower row of probes are fixed in the needle block, a left hole is formed in one side of the fixing plate, the movable column and the elastic thimble are located in the left hole, the thin contact piece is located between the movable column and the elastic thimble, and the top of the thin contact piece is located between double-row pins of a product; the upper row of probes is positioned on the left side of the left row of tube feet of the product, and the lower row of probes is positioned on the left side of the movable column.

By adopting the technical scheme, in the double-row product testing device, the right end of the upper row of probes is of a claw head structure.

Adopt above-mentioned each technical scheme, the double product testing arrangement in area, the left side of support plate is provided with the recess, the right side of going up the row of probes is located the recess, the left side calandria foot of product is located the recess.

By adopting the technical scheme, in the testing device with the double-row products, the right end of the lower row of probes is of a needle point structure.

Adopt above-mentioned each technical scheme, the double product testing arrangement of area in, the left side of activity post is provided with the shrouding, the shrouding is located the fixed plate, the needle point structure runs through the left side butt of shrouding and activity post.

By adopting the technical scheme, in the testing device with the double rows of products, the fixing plate is provided with the square hole, and the thin contact piece and the right row of pins of the products are positioned in the square hole.

Adopt above-mentioned each technical scheme, the utility model discloses an action of promotion needle piece just can realize drawing forth of the double needle signal of product, and the action is simple, and is efficient. The contact structure is small and compact by the deformation of the thin contact piece and the contact of the row pins in the product, and can be applied to the double-row pin product with the dense small-size devices.

Drawings

Fig. 1 is a schematic diagram of the explosion structure of the present invention;

FIG. 2 is a schematic view of the overall structure of the present invention;

fig. 3 is a schematic sectional view of the present invention.

Detailed Description

The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.

As shown in fig. 1 to 3, the present embodiment provides a testing device with double rows of product, which is used for testing a product 1 with double rows of pins, and the testing device is provided with a left row of pins and a right row of pins from the perspective of the attached drawings. The testing device comprises a carrier plate 2, a fixing plate 3, a side-push double-row probe assembly, a thin contact piece 5 and a PCB 6, wherein a product 1 is placed on the carrier plate 2, the carrier plate 2 is positioned above the fixing plate 3, the PCB 6 is positioned below the fixing plate 3, double-row pins of the product 1 penetrate through the carrier plate 2 and are inserted into the fixing plate 3, the side-push double-row probe assembly is arranged on the left side of the fixing plate 3, and the bottom of the thin contact piece 5 is connected with the PCB 6. The thin contact piece 5 is connected with the right row of pins of the product 1 and the PCB 6 up and down, and the probes of the side-pushing double-row probe assembly are connected with the left row of pins of the product 1 to form signal circuit conduction for testing.

Specifically, the side-push double-row probe assembly includes a probe block 41, an upper row of probes 42, a lower row of probes 43, a movable column 44 and an elastic thimble 45, wherein the right end of the upper row of probes 42 is of a claw head structure to increase the contact area between the upper row of probes 42 and the pins of the product 1. The left side of the carrier plate 2 is provided with a groove, the right side of the upper row of probes 42 is positioned in the groove, and the left row of pins of the product 1 is positioned in the groove. The upper row of probes 42 and the lower row of probes 43 are fixed in the needle block 41, one side of the fixing plate 3 is provided with a left hole, and the movable column 44 and the elastic thimble 45 are positioned in the left hole.

As shown in FIG. 3, the right end of the lower row of probes 43 is a tip structure, which facilitates the lower row of probes 43 to easily push the movable column 44 to the right. In order to prevent the movable column 44 from slipping out of the left hole, a sealing plate is arranged on the left side of the movable column 44, the sealing plate is positioned on the fixed plate 3, and the needle tip structure penetrates through the sealing plate and is abutted against the left side of the movable column 44. The thin contact piece 5 is located between the movable column 44 and the elastic thimble 45, and the top of the thin contact piece 5 is located between the double rows of pins of the product 1. In order to ensure that there is a certain elastic space on the top of the thin contact piece 5, a square hole 31 is provided on the fixing plate 3, and the thin contact piece 5 and the right row of pins of the product 1 are located in the square hole 31. The upper row of probes 42 is located to the left of the left array of feet of the product 1 and the lower row of probes 43 is located to the left of the movable column 44.

The principle of the embodiment is as follows: a movable column 44 and an elastic thimble 45 are arranged in a left hole of the fixed plate 3, and the movable column 44 can slide in the hole. The closing plate is locked at the side of the fixed plate 3 to prevent the movable column 44 from sliding out. The thin contact piece 5 is clamped between the movable column 44 and the elastic thimble 45, and the thin contact piece 5 is foot-welded on the PCB 6. The pin block 41 is pushed to the right, the upper row of probes 42 move to the right to be directly contacted with the left row of pins of the product 1, and signals are led out through bonding wires at the tail parts of the upper row of probes 42. The lower row of probes 43 pushes the movable column 44 to the right, the movable column 44 enables the thin contact piece 5 to generate right deformation, the top of the thin contact piece 5 is contacted with the right row of pins of the product 1, signals are led to the PCB 6 through the thin contact piece 5, and signal conduction is formed for testing. On the contrary, when the needle block 41 is reset, the upper row of probes 42 is separated from the left row of pins of the product 1, the elastic thimble 45 is restored from the compressed state to the normal state, the elastic thimble 45 pushes the thin contact piece 5 to the left, and the thin contact piece 5 is righted to be separated from the right row of pins of the product 1.

The above description is only exemplary of the present invention and should not be construed as limiting the present invention, and any modifications, equivalents and improvements made within the spirit and principles of the present invention are intended to be included within the scope of the present invention.

Claims

1. A test device with double rows of products is used for testing products with double rows of pins and is characterized by comprising a carrier plate, a fixing plate, a side-push double-row probe assembly, a thin contact piece and a PCB, wherein the products are placed on the carrier plate, the carrier plate is positioned above the fixing plate, the PCB is positioned below the fixing plate, the double rows of pins of the products penetrate through the carrier plate and are inserted into the fixing plate, the side-push double-row probe assembly is arranged on the left side of the fixing plate, and the bottom of the thin contact piece is connected with the PCB;

2. The apparatus for testing products with dual rows of claim 1, wherein the right end of the upper row of probes is of a claw head structure.

3. The testing device with double row of products of claim 2, wherein the carrier board is provided with a groove on the left side, the right side of the upper row of probes is positioned in the groove, and the left row of pins of the products is positioned in the groove.

4. The apparatus for testing products with double rows as claimed in claim 1, wherein the right end of the lower row of probes is a tip structure.

5. The testing device with double rows of products as claimed in claim 4, wherein a sealing plate is disposed on the left side of the movable column, the sealing plate is disposed on the fixing plate, and the needle tip structure penetrates through the sealing plate and abuts against the left side of the movable column.

6. The test device with double row of products in claim 1, wherein the fixing plate is provided with a square hole, and the thin contact piece and the right row of pins of the products are positioned in the square hole.