CN113434052B - Display panel, test circuit and touch test method of display panel - Google Patents
Display panel, test circuit and touch test method of display panel Download PDFInfo
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- CN113434052B CN113434052B CN202110701715.XA CN202110701715A CN113434052B CN 113434052 B CN113434052 B CN 113434052B CN 202110701715 A CN202110701715 A CN 202110701715A CN 113434052 B CN113434052 B CN 113434052B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0412—Digitisers structurally integrated in a display
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
- G06F3/0445—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using two or more layers of sensing electrodes, e.g. using two layers of electrodes separated by a dielectric layer
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09F—DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
- G09F9/00—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
- G09F9/30—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09F—DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
- G09F9/00—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
- G09F9/30—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
- G09F9/33—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements being semiconductor devices, e.g. diodes
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/40—OLEDs integrated with touch screens
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- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
The application discloses a display panel, a test circuit and a touch test method of the display panel, wherein the display panel comprises a light-emitting device layer, a touch layer and a test pin group arranged in a cutting area, the light-emitting device layer comprises a cathode and a cathode wire, the touch layer comprises a touch electrode and a touch wire, one end of the cathode wire is connected with the cathode, and the other end of the cathode wire extends from a non-display area to the cutting area; one end of the touch wire is connected with the touch electrode, and the other end of the touch wire extends from the non-display area to the cutting area; the testing pin group comprises a cathode testing pin and a touch testing pin, the cathode testing pin is connected with the cathode wire, the touch testing pin is connected with the touch wire in a one-to-one mode, so that a temporary testing capacitor is formed between the touch electrode and the cathode, and the state of each touch electrode and the touch wire connected with the touch electrode is determined by testing the capacitance value of the temporary testing capacitor. According to the application, the touch electrode and the touch wiring of the display panel can be effectively tested by the loading driving circuit.
Description
Technical Field
The application relates to the technical field of touch control, in particular to a display panel, a test circuit and a touch control test method of the display panel.
Background
Currently, a display panel with a touch function is widely applied to display devices such as mobile phones and wearable devices, so that the display devices can realize a human-computer interaction function in a simple and convenient manner. With the improvement of the performance requirements of people on Display panels, the Display panels mostly adopt a Touch Display Driver Integration (TDDI) scheme, and in the Display panels using the TDDI scheme, touch signals need to be introduced into a Display screen body through Touch wires and then into a driving chip through leads.
Due to the influence of factors such as a production process, the display panel may have a problem of poor touch due to defects, breakage and the like of the touch electrodes or the touch wires, and therefore the touch electrodes and the touch wires need to be tested before the display panel is bound with the driving chip, so that materials such as the bound chip and the circuit board are prevented from being wasted, and unnecessary production cost is increased. Therefore, the test scheme capable of accurately testing the touch electrode and the touch routing is provided, and the test scheme has important value.
Disclosure of Invention
The embodiment of the application provides a display panel, a test circuit and a touch test method of the display panel.
In a first aspect, an embodiment of the present application provides a display panel, including a finished product area and a cutting area disposed outside the finished product area, the finished product area includes a display area and a non-display area, and the display panel includes: a substrate; the driving device layer is arranged on one side of the substrate and is arranged in the display area; the light-emitting device layer is arranged on one side, back to the substrate, of the driving device layer and is arranged in the display area, the light-emitting device layer comprises a cathode and a cathode wire, the cathode is arranged in the display area correspondingly, one end of the cathode wire is connected with the cathode, and the other end of the cathode wire extends to the cutting area from the non-display area; the touch layer is arranged on one side, back to the driving device layer, of the light-emitting device layer and is insulated from the light-emitting device layer, the touch layer comprises touch electrodes and touch wires, the touch electrodes are arranged in the display area, one ends of the touch wires are connected with the touch electrodes, and the other ends of the touch wires extend from the non-display area to the cutting area; the testing pin group is arranged in the cutting area and comprises a cathode testing pin and a touch testing pin, the cathode testing pin is connected with the cathode wiring, the touch testing pin is connected with the touch wiring in a one-to-one mode so as to form a temporary testing capacitor between the touch electrode and the cathode, and the state of each touch electrode and the touch wiring connected with the touch electrode is determined by testing the capacitance value of the temporary testing capacitor.
According to the foregoing implementation manner of the first aspect of the present application, the distribution density of the touch traces in the cutting area is less than the distribution density of the touch traces in the non-display area.
According to any one of the foregoing implementation manners of the first aspect of the present application, the touch trace forms touch binding pins in the non-display area, the size of the touch testing pins is larger than that of the touch binding pins, and the interval between two adjacent touch testing pins is larger than that between two adjacent touch binding pins.
According to any of the foregoing embodiments of the first aspect of the present application, the cathode trace forms a cathode bonding pin in the non-display area, and the size of the cathode testing pin is larger than that of the cathode bonding pin.
According to any one of the foregoing embodiments of the first aspect of the present application, a distance between any two adjacent touch test pins is greater than 0.1mm; the touch test pins and the cathode test pins are rectangular, the lengths of the touch test pins and the cathode test pins are larger than or equal to 0.3mm, and the widths of the touch test pins and the cathode test pins are larger than or equal to 0.1mm.
According to any one of the foregoing embodiments of the first aspect of the present application, the touch test pin is disposed on a side surface of the substrate facing the driver layer, the touch trace includes a first touch section and a second touch section, the first touch section is connected to the touch electrode and disposed on the same layer as the touch electrode, the second touch section is connected to the touch test pin and disposed on the same layer as the touch test pin, and an end of the first touch section away from the touch electrode and an end of the second touch section away from the touch test pin are both located in the non-display area and in the lap joint.
According to any one of the foregoing embodiments of the first aspect of the present application, a first overlapping pin is formed in the non-display area at an end of the first touch segment away from the touch electrode, a second overlapping pin is formed in the non-display area at an end of the second touch segment away from the touch test pin, and the first overlapping pin and the second overlapping pin are connected in a one-to-one manner.
According to any of the preceding embodiments of the first aspect of the present application, the display panel further comprises: and the packaging cover plate is arranged in the finished product area on one side of the light-emitting device layer, which is back to the substrate, and the touch electrode and the first touch section of the touch routing are formed on the surface of one side, which faces the light-emitting device layer, of the packaging cover plate.
According to any one of the embodiments of the first aspect of the present application, an insulating gap is provided between the light emitting device layer and the touch layer; and/or the display panel further comprises: and the insulating layer is arranged between the light-emitting device layer and the touch layer.
According to any one of the foregoing embodiments of the first aspect of the present application, the cathode test pin is disposed on a surface of a side of the substrate facing the driver layer, the cathode trace includes a first cathode segment and a second cathode segment, the first cathode segment is connected to the cathode and disposed on the same layer as the cathode, the second cathode segment is connected to the cathode test pin and disposed on the same layer as the cathode test pin, and the first cathode segment is connected to the second cathode segment via a via hole.
In a second aspect, an embodiment of the present application provides a test circuit, configured to test a state of the touch electrode of the display panel according to any of the foregoing embodiments, where the test circuit includes a test capacitor, a first node, and a second node, the test capacitor includes a first board and a second board that are disposed opposite to each other, the first node is connected to the first board of the test capacitor, and the second node is connected to the second board of the test capacitor; the touch electrode of the display panel is used as the first plate body of the testing capacitor, the cathode is used as the second plate body of the testing capacitor, and the first node and the second node are used for being connected to an external tester to form a testing loop and receive a touch testing signal through the first node.
According to the foregoing embodiments of the second aspect of the present application, the touch test pin serves as the first node, and the cathode test pin serves as the second node.
In a third aspect, an embodiment of the present application provides a touch electrode testing method for a display panel, where the display panel includes a light emitting device layer and a touch layer, the light emitting device layer includes a cathode, the touch layer includes a touch electrode, and the touch electrode testing method includes: forming a test loop by the touch electrode and the cathode through a touch test board; inputting a touch test signal to the touch electrode; and reading a current value of the test loop, and determining the fracture state of the touch electrode according to the current value.
The display panel, the test circuit and the touch test method for the display panel provided by the embodiment of the application include a light-emitting device layer, a touch layer and a test pin group arranged in a cutting area, wherein the light-emitting device layer includes a cathode and a cathode wire, the touch layer includes a touch electrode and a touch wire, the test pin group includes a cathode test pin and a touch test pin, when the state of the touch electrode and the touch wire connected with the touch electrode needs to be tested, the touch electrode and the terminal on the touch test board can be in one-to-one butt joint through the cathode test pin and the touch test pin, so that the touch electrode and the cathode form a test loop, a temporary test capacitor is formed between the touch electrode and the cathode, and the state of each touch electrode and the touch wire connected with the touch electrode can be determined by measuring the capacitance value of the temporary test capacitor.
Drawings
Other features, objects, and advantages of the present application will become apparent from the following detailed description of non-limiting embodiments thereof, when read in conjunction with the accompanying drawings, in which like reference characters designate the same or similar parts throughout the figures thereof, and which are not to scale.
Fig. 1 is a schematic top view of a display panel according to an embodiment of the present disclosure;
fig. 2 is a schematic top view of a display panel according to another embodiment of the present disclosure;
fig. 3 is a schematic layer structure diagram of a display panel according to an embodiment of the present disclosure;
fig. 4 is a schematic top view illustrating a display panel according to another embodiment of the present disclosure;
fig. 5 is a schematic structural diagram of a display panel according to another embodiment of the present application;
FIG. 6 is a partial top view of a display panel according to an embodiment of the present application;
FIG. 7 is a schematic diagram of a test circuit according to an embodiment of the present disclosure;
fig. 8 is a flowchart of a method for testing touch electrodes of a display panel according to an embodiment of the present disclosure.
Description of the reference numerals:
e-a finished product area; e1-a display area; e2-a non-display area;
f-a cleavage region;
100-a substrate;
200-a drive device layer;
300-a light emitting device layer; 310-a cathode; 301-cathode routing; 302-cathode binding pin; 320-a light emitting layer; 330-anode;
400-an insulating layer;
500-a touch layer; 510-touch electrodes; 501-touch routing; 502-touch binding pins; 503-first landing leg; 504-second lap joint pin; 505-a ground trace; 506-ground binding pin;
600-a package cover plate;
710-cathode test pin; 720-touch test pins; 730-ground test pin;
c-testing capacitance; c 1-a first plate body; c 2-a second plate body; a-a first node; b-a second node.
Detailed Description
Features and exemplary embodiments of various aspects of the present application will be described in detail below, and in order to make objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative of and not restrictive on the broad application. It will be apparent to one skilled in the art that the present application may be practiced without some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the present application by illustrating examples thereof.
It should be noted that, in this document, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising … …" does not exclude the presence of another like element in a process, method, article, or apparatus that comprises the element.
It will be understood that when a layer or region is referred to as being "on" or "over" another layer or region in describing the structure of the element, it can be directly on the other layer or region or intervening layers or regions may also be present. Also, if the component is turned over, one layer or region may be "under" or "beneath" another layer or region.
Currently, a display panel with a touch function is widely applied to display devices such as mobile phones and wearable devices, so that the display devices can realize a human-computer interaction function in a simple and convenient manner. With the improvement of performance requirements of people on Display panels, touch Display Driver Integration (TDDI) schemes are mostly adopted for Display panels, and in a Display panel using the TDDI schemes, touch signals need to be introduced into a Display screen body through Touch wires and then into a driving chip through lead wires.
Due to the influence of factors such as a production process, the display panel may have a problem of poor touch due to defects, breakage and the like of the touch electrodes or the touch wires, and in order to ensure that a product meets design requirements, the touch electrodes and the touch wires need to be tested before the display panel is bound with the driving chip. The existing test scheme aiming at the TDDI display panel adopting the self-capacitance can only test the pin lapping condition, and can not directly load a driving circuit for testing, so that effective test can not be carried out on a touch electrode and a touch routing.
In order to solve the above problems, embodiments of a display panel, a test circuit, and a touch test method for the display panel are provided in the embodiments of the present application, and embodiments of the display panel, the test circuit, and the touch test method for the display panel will be described below with reference to fig. 1 to 8.
Embodiments of the present disclosure provide a display panel, which may be an Organic Light Emitting Diode (OLED) display panel.
Fig. 1 is a schematic top view of a display panel according to an embodiment of the present disclosure; fig. 2 is a schematic top view of a display panel according to another embodiment of the present disclosure; fig. 3 is a schematic layer structure diagram of a display panel according to an embodiment of the present disclosure.
The display panel provided by the embodiment of the application comprises a finished product area E and a cutting area F arranged on the outer side of the finished product area E, wherein the finished product area E comprises a display area E1 and a non-display area E2.
The shape of the display panel is not particularly limited. In some alternative embodiments, as shown in fig. 1, the finished area E of the display panel may be rectangular-like, having a predetermined length and width. The display panel with the finished product area E with the top view similar to the rectangle can be applied to products or components such as mobile phones, notebooks and the like.
When the finished product area E of the display panel is rectangular-like, the non-display area E2 may be disposed around the display area E1, and the cutting area F may be a closed annular area distributed around the non-display area E2, or may partially surround the non-display area E2.
In alternative embodiments, as shown in FIG. 2, the finished area E of the display panel may also be circular. The display panel having a circular top view can be applied to a product or a member having a display function such as a wristwatch. When the finished product area E of the display panel is circular, the non-display area E2 may be distributed around the periphery of the display area E1, and the cutting area F may be disposed on a side of the non-display area E2 where the bonding pad is disposed, away from the display area E1.
Of course, the shapes and the arrangement positions of the finished product area E and the cutting area F of the display panel are not limited to the above-mentioned situations, and can be selected and adjusted according to the actual situation, and are also within the protection scope of the present application.
As shown in fig. 3, the display panel provided in the embodiment of the present application includes a substrate 100, a driving device layer 200, a light emitting device layer 300, and a touch layer 500.
The substrate 100 may be a glass or silicon-based substrate 100, or the substrate 100 may be made of Polyimide (PI) material or PI-containing material, so that the substrate 100 may be bent.
The driving device layer 200 is disposed in the display area E1 on one side of the substrate 100. The light emitting device layer 300 is disposed in the display area E1 on a side of the driving device layer 200 opposite to the substrate 100, the light emitting device layer 300 includes a cathode 310 and a cathode trace 301, the cathode 310 is disposed in the display area E1, one end of the cathode trace 301 is connected to the cathode 310, and the other end of the cathode trace 301 extends from the non-display area E2 to the cutting area F. The insulating layer 400 is disposed in the display region E1 at a side of the light emitting device layer 300 facing away from the driving device layer 200. The touch layer 500 is disposed on a side of the light emitting device layer 300 opposite to the driving device layer 200 and is insulated from the light emitting device layer 300, the touch layer 500 includes a touch electrode 510 and a touch trace 501, the touch electrode 510 is disposed in the display area E1, one end of the touch trace 501 is connected to the touch electrode 510, and the other end of the touch trace 501 extends from the non-display area E2 to the cutting area F.
It is understood that the touch layer 500 generally includes a plurality of touch electrodes 510, the touch traces 501 are connected to the touch electrodes 510 in a one-to-one manner, and the touch traces 501 are used for sending touch driving signals sent by an external driving chip to the touch electrodes 510 and transmitting touch sensing signals generated by the touch electrodes 510 back to the driving chip.
The light emitting device layer 300 includes an anode 330, a light emitting layer 320, and a cathode 310 sequentially stacked in a thickness direction of the display panel, and the cathode 310 is disposed on a side of the light emitting layer 320 facing away from the driving device layer 200.
The touch electrode 510, the cathode 310, the touch trace 501, and the cathode trace 301 may be made of a conductive material, such as a metal.
The display panel further comprises a test pin group, and the test pin group is arranged in the cutting area F. The testing pin set includes a cathode testing pin 710 and a touch testing pin 720, the cathode testing pin 710 is connected to the cathode trace 301, and the touch testing pin 720 is connected to the touch trace 501 one-to-one.
When the states of the touch electrodes 510 and the touch traces 501 connected thereto need to be tested, the cathode test pins 710 and the touch test pins 720 can be connected to terminals on the touch test board in a one-to-one manner, so that the touch electrodes 510 and the cathodes 310 form a test loop, a temporary test capacitor is formed between the touch electrodes 510 and the cathodes 310, and the states of each touch electrode 510 and the touch trace 501 connected thereto can be determined by measuring a capacitance value of the temporary test capacitor.
It can be understood that the touch electrode 510 and the cathode 310 are disposed opposite to each other in the display area E1 and are insulated from each other, when the touch electrode 510 and the cathode 310 are in a circuit loop, the touch electrode 510 and the cathode 310 form a capacitor in the circuit loop, and a capacitance value of the capacitor is within a predetermined range; if the measured capacitance value of the temporary test capacitor is within a predetermined range, it indicates that neither the touch electrode 510 nor the touch trace 501 connected thereto is broken, and if the measured capacitance value of the temporary test capacitor is not within the predetermined range, it indicates that the touch electrode 510 and the touch trace 501 connected thereto are broken or otherwise defective.
In summary, according to the display panel provided in the embodiment of the present application, the cathode test pin 710 and the touch test pin 720 are disposed in the cutting area F, and the cathode trace 301 connected to the cathode 310 and the touch trace 501 connected to the touch electrode 510 are extended to the cutting area F, so that the cathode test pin 710 is connected to the cathode trace 301, and the touch test pin 720 and the touch trace 501 are connected in a one-to-one manner, so that the display panel can effectively test the touch electrode 510 and the touch trace 501 by loading the driving circuit.
The touch layer 500 is insulated from the light emitting device layer 300 in various ways, and in some optional embodiments, the display panel may further include an insulating layer 400, the insulating layer 400 is disposed between the light emitting device layer 300 and the touch layer 500, and the touch layer 500 is insulated from the light emitting device layer 300 by the insulating layer 400. Of course, it is within the scope of the present application to provide an insulating space between the light emitting device layer 300 and the touch layer 500, so that the light emitting device layer 300 and the touch layer 500 are insulated by air, or to provide both the insulating layer 400 and the insulating space between the light emitting device layer 300 and the touch layer 500.
It is understood that, for a flexible display panel, as an alternative embodiment, after the driving device layer 200 and the light emitting device layer 300 are sequentially formed on the substrate 100, the encapsulation layer is used for encapsulation, and then the touch layer 500 is formed on the side of the encapsulation layer opposite to the light emitting device layer 300, in which case the encapsulation layer may be used as the insulating layer 400.
In some optional embodiments, the distribution density of the touch traces 501 in the cutting area F may be smaller than the distribution density of the touch traces 501 in the non-display area E2, and since the touch test pins 720 disposed in the cutting area F are connected to the touch traces 501 in a one-to-one manner, the distribution density of the touch test pins 720 can be reduced by reducing the distribution density of the touch traces 501 in the cutting area F, so that the touch test board can be conveniently butted with the test pin groups during testing.
It is understood that the non-display area E2 may include a binding area for binding the driving chip or the circuit board. In the structure of the existing integrated touch display panel, the display lines and the touch traces 501 are integrated in the non-display area E2, so that the touch traces 501 are distributed more densely in the non-display area E2, especially in the binding area, and the touch traces 501 in the binding area cannot be directly pressurized to drive the circuit to be tested due to the alignment accuracy problem.
Fig. 4 is a schematic top view of a display panel according to another embodiment of the present disclosure.
In the display panel provided by the embodiment of the application, in order to facilitate the binding connection of the driving chip or the circuit board during the assembly of the display module, the touch trace 501 may form the touch binding pin 502 in the non-display area E2, and the cathode trace 301 may form the cathode binding pin 302 in the non-display area E2.
Optionally, the size of the touch test pins 720 is larger than the touch bonding pins 502, and the interval between two adjacent touch test pins 720 may be larger than the interval between two adjacent touch bonding pins 502, so as to facilitate accurate alignment connection between the external test circuit and the touch test pins 720.
As an optional embodiment, the touch test pins 720 may be rectangular, the size length of the touch test pins 720 is greater than or equal to 0.3mm, the width is greater than or equal to 0.1mm, the interval between any two adjacent touch test pins 720 may be greater than or equal to 0.1mm, and when the external test circuit is connected to perform a test, the situation of the staggered connection can be effectively avoided.
Optionally, the size of the cathode test pin 710 is larger than that of the cathode bonding pins 302, and the interval between the cathode test pin 710 and any touch control test pin 720 may be larger than that between two adjacent touch control bonding pins 502, so as to facilitate accurate alignment connection between an external test circuit and the cathode test pin 710.
As an alternative embodiment, the cathode test pin 710 may also be rectangular, the length of the cathode test pin 710 is greater than or equal to 0.3mm, the width of the cathode test pin 710 is greater than or equal to 0.1mm, and the distance between the cathode test pin 710 and any touch test pin 720 may be greater than or equal to 0.1mm.
In some alternative embodiments, the test pin group includes a cathode test pin 710 and a plurality of touch test pins 720, the plurality of touch test pins 720 may be equally spaced along the first direction (X direction in the figure) in the cutting region F, and the cathode test pin 710 may be disposed at one side of the plurality of touch test pins 720.
When the finished product area E of the display panel is rectangular in top view, the test pin group may be disposed on one side of the finished product area E in the length direction thereof, and the first direction may be the width direction of the finished product area E.
When the touch test pins 720 and the cathode test pins 710 are rectangular, the width directions of the touch test pins 720 and the cathode test pins 710 may be parallel to the first direction, and the length directions of the touch test pins 720 and the cathode test pins 710 may be perpendicular to the first direction.
Fig. 5 is a schematic structural diagram of a display panel according to another embodiment of the present application.
In some optional embodiments, in the display panel provided in this embodiment, the touch test pin 720 may be disposed on a side surface of the substrate 100 facing the driving device layer 200, the touch trace 501 may include a first touch segment and a second touch segment, the first touch segment is connected to the touch electrode 510 and disposed on the same layer as the touch electrode 510, the second touch segment is connected to the touch test pin 720 and disposed on the same layer as the touch test pin 720, that is, the second touch segment is disposed on the substrate 100, both an end of the first touch segment away from the touch electrode 510 and an end of the second touch segment away from the touch test pin 720 are located in the non-display area E2, and an end of the first touch segment away from the touch electrode 510 and an end of the second touch segment away from the touch test pin 720 are connected in a lap joint manner in the non-display area E2. The touch electrode 510 and the touch test pins 720 located in different functional layers are electrically connected by the lap joint of the first touch segment and the second touch segment.
Optionally, one end of the first touch segment, which is far away from the touch electrode 510, may form a first overlapping pin 503 in the non-display area E2, one end of the second touch segment, which is far away from the touch test pin 720, may form a second overlapping pin 504 in the non-display area E2 of the substrate 100, the first overlapping pin 503 and the second overlapping pin 504 have a certain height in the thickness direction of the display panel, and the first overlapping pin 503 and the second overlapping pin 504 are connected in a one-to-one manner, so as to implement overlapping connection between the first touch segment and the second touch segment.
It can be understood that the display panel provided in the embodiment of the present application may further include an encapsulation cover plate 600, so as to encapsulate the light emitting device layer 300 and the like, and prevent the atmosphere from reacting with organic functional layers such as a light emitting layer, where the encapsulation cover plate 600 is disposed in the finished product area E on a side of the light emitting device layer 300 opposite to the driving device layer 200. The package cover 600 may be a glass package cover 600, or a package cover 600 made of other inorganic materials or organic materials, and the like, which is not limited in this application.
Optionally, the touch electrode 510 and the first touch segment of the touch trace 501 may be disposed on a surface of the package cover 600 facing the light emitting device layer 300. When the display panel is manufactured, the touch electrode 510, the first touch section of the touch trace 501, and the first overlapping pin 503 may be formed on one side surface of the package cover 600, the driving device layer 200, the touch test pin 720, the second touch section of the touch trace 501, and the second overlapping pin 504 may be formed on one side surface of the substrate 100, the light emitting device layer 300 may be sequentially formed on the driving device layer 200, and then the package cover 600 and the substrate 100 may be aligned together by the package adhesive, and the first overlapping pin 503 and the second overlapping pin 504 may be connected one-to-one, so as to realize the overlapping connection between the first touch section and the second touch section, and the touch electrode 510 is electrically connected to the touch test pin 720. Specifically, a circle of encapsulation glue may be disposed along the edges of the encapsulation cover 600 and the substrate 100 to encapsulate the driving device layer 200, the light emitting device layer 300, and the touch layer 500 in a closed space.
It is understood that, when the light emitting device layer 300 and the touch layer 500 are disposed in an insulating manner through the insulating layer 400, the insulating layer 400 may be formed on a surface of the light emitting device layer 300 opposite to the driving device layer 200, or on a surface of the touch layer 500 opposite to the package glass 600, which is not limited in this application.
In some optional embodiments, in the display panel provided in the embodiments of the present application, the cathode test pin 710 may also be disposed on a surface of the substrate 100 facing the driving device layer 200.
To facilitate the connection of the cathode test pin 710 with the cathode 310 disposed on the light emitting device layer 300, the cathode trace 301 may include a first cathode 310 segment and a second cathode 310 segment, the first cathode 310 segment is connected with the cathode 310, the second cathode 310 segment is connected with the cathode test pin 710 and disposed on the substrate 100, and the first cathode 310 segment and the second cathode 310 segment may be connected by a via.
Fig. 6 is a partial top view of a display panel according to an embodiment of the present application.
In some optional embodiments, in the display panel provided in this embodiment of the application, the touch layer 500 may further include a ground trace 505, and the ground trace 505 is disposed to prevent the touch layer 500 from accumulating too much static electricity.
Optionally, the ground trace 505 extends from the non-display area E2 to the cutting area F, the test pin group may further include a ground test pin 730, one end of the ground trace 505 located in the cutting area F may be connected to the ground test pin 730, and the ground trace 505 may be tested by accessing an external test circuit through the ground test pin 730.
In order to facilitate the bonding connection of the driving chip or the circuit board during the assembly of the display module, the ground trace 505 may form a ground bonding pin 506 in the non-display area E2. Optionally, the ground test pin 730 is larger in size than the ground bonding pin 506 to facilitate accurate alignment of external test circuitry with the ground test pin 730.
It can be understood that, with the display panel provided in the embodiment of the present application, after the test is completed, the portion of the display panel located in the cutting area F may be cut away, so as to obtain the portion of the display panel located in the finished product area E.
Fig. 7 is a schematic structural diagram of a test circuit according to an embodiment of the present disclosure.
The embodiment of the present application further provides a test circuit, which can be used to test the state of the touch electrode 510 of the display panel.
The test circuit provided by the embodiment of the application comprises a test capacitor C, a first node A and a second node B. The testing capacitor C comprises a first plate body C1 and a second plate body C2 which are arranged oppositely, a first node A is connected to the first plate body C1 of the testing capacitor C, and a second node B is connected to the second plate body C2 of the testing capacitor C; the touch electrode 510 of the display panel is used as a first board C1 of the testing capacitor C, the cathode 310 is used as a second board C2 of the testing capacitor C, and the first node a and the second node B are used for accessing an external tester to form a testing loop and receive a touch testing signal through the first node a.
When the state of the touch electrode 510 of the display panel needs to be tested, an external tester is connected through the first node a and the second node B, so that the first board C1 and the second board C2, that is, the touch electrode 510 and the cathode 310, form a test loop, the touch electrode 510 and the cathode 310 form a test capacitor C, and the state of the touch layer 500 of the display panel can be determined by measuring the capacitance value of the test capacitor C.
It can be understood that, since the touch electrode 510 and the cathode 310 are disposed in the display area E1 and are disposed opposite to each other, when the touch electrode 510 and the cathode 310 are respectively used as two plates of the test capacitor C, a capacitance value of the test capacitor C is within a predetermined range, if the measured capacitance value of the test capacitor C is within the predetermined range, it indicates that the touch electrode 510 is not broken, and if the measured capacitance value of the test capacitor C is not within the predetermined range, it indicates that the touch electrode 510 is broken or otherwise defective.
During testing, an external tester is connected to the first node a and the second node B, and inputs a touch test signal to the touch electrode 510 through the first node a, optionally, the external tester can determine the capacitance of the test capacitor C according to the current value by reading the current value in the test loop, and further determine whether the touch electrode 510 has a defect.
Alternatively, the second node B may be connected to the cathode 310 terminal or the ground terminal of the external tester during the test, as long as the capacitance of the test capacitor C can be accurately measured.
In some optional embodiments, the touch test pin 720 of the display panel may be used as the first node a, and the cathode test pin 710 may be used as the second node B, and when the state of the touch electrode 510 needs to be tested, the external tester is connected through the touch test pin 720 and the cathode test pin 710, so that the external tester can be easily and conveniently connected to the test circuit.
Fig. 8 is a flowchart of a method for testing a touch electrode of a display panel according to an embodiment of the present disclosure.
The embodiment of the present application further provides a touch electrode testing method of a display panel, the display panel includes a light emitting device layer 300 and a touch layer 500, the light emitting device layer 300 includes a cathode 310, the touch layer 500 includes a touch electrode 510, and the touch testing method includes steps S10 to S30.
In step S10, the touch electrode 510 and the cathode 310 form a test loop through the touch test board.
It is understood that the touch electrode 510 of the display panel is disposed opposite to the cathode 310, when the touch electrode 510 and the cathode 310 are in a test loop, the touch electrode 510 and the cathode 310 form a capacitor in the test loop, and the capacitance value of the capacitor is within a predetermined range, so that the breaking state of the touch electrode 510 can be determined according to the capacitance value of the capacitor.
In step S20, a touch test signal is input to the touch electrode 510.
Optionally, the touch test board may be connected to a driving chip, and the driving chip provides a touch test signal.
In step S30, the current value of the test loop is read, and the fracture state of the touch electrode 510 is determined according to the current value.
It is understood that, in the test loop, the capacitance of the capacitor formed by the touch electrode 510 and the cathode 310 has a predetermined relationship with the current value generated in the test loop when the touch test signal is input to the touch electrode 510, so that the breaking state of the touch electrode 510 can be determined according to the current value of the test loop.
Alternatively, it may be determined whether the touch electrode 510 is in the broken state by reading the current value in the test loop and determining the capacitance value of the capacitor formed by the touch electrode 510 and the cathode 310 according to the current value.
If the measured capacitance value is within the predetermined range, it indicates that the measured touch electrode 510 has no fracture defect and is not in a fracture state, and if the measured capacitance value is not within the predetermined range, it indicates that the measured touch electrode 510 has defects such as fracture and is in a fracture state.
Alternatively, the current value in the test loop can be read by the driving chip and converted into the capacitance of the capacitor formed by the touch electrode 510 and the cathode 310.
According to the touch electrode testing method of the display panel provided by the embodiment of the application, the touch electrode 510 and the cathode 310 form a testing loop, a touch testing signal is input to the touch electrode 510, and the fracture state of the touch electrode 510 is determined according to the current value of the testing loop, so that the display panel can effectively test the touch electrode 510 by loading a driving circuit.
In accordance with the embodiments of the present application as described above, these embodiments are not exhaustive of all of the details and are not intended to limit the application to the specific embodiments described. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the application and its practical application, to thereby enable others skilled in the art to best utilize the application and its various modifications as are suited to the particular use contemplated. The application is limited only by the claims and their full scope and equivalents.
Claims (13)
1. A display panel, comprising a finished product area and a cutting area arranged outside the finished product area, wherein the finished product area comprises a display area and a non-display area, and the display panel comprises:
a substrate;
the driving device layer is arranged on one side of the substrate and is arranged in the display area;
the light-emitting device layer is arranged on one side, back to the substrate, of the driving device layer and is arranged in the display area, the light-emitting device layer comprises a cathode and a cathode wire, the cathode is arranged in the display area, one end of the cathode wire is connected with the cathode, and the other end of the cathode wire extends from the non-display area to the cutting area;
the touch layer is arranged on one side, back to the driving device layer, of the light emitting device layer and is insulated from the light emitting device layer, the touch layer comprises touch electrodes and touch wires, the touch electrodes are arranged in the display area, one ends of the touch wires are connected with the touch electrodes, and the other ends of the touch wires extend from the non-display area to the cutting area;
the testing pin group is arranged in the cutting area and comprises a cathode testing pin and a touch testing pin, the cathode testing pin is connected with the cathode wiring, the touch testing pin is connected with the touch wiring in a one-to-one mode so as to form a temporary testing capacitor between the touch electrode and the cathode, and the state of each touch electrode and the touch wiring connected with the touch electrode is determined by testing the capacitance value of the temporary testing capacitor.
2. The display panel according to claim 1, wherein the distribution density of the touch traces in the cutting area is less than the distribution density of the touch traces in the non-display area.
3. The display panel according to claim 2, wherein the touch trace forms touch bonding pins in the non-display area, the size of the touch testing pins is larger than that of the touch bonding pins, and the interval between two adjacent touch testing pins is larger than that between two adjacent touch bonding pins.
4. The display panel of claim 2, wherein the cathode traces form cathode bonding pins in the non-display area, and the cathode test pins are larger in size than the cathode bonding pins.
5. The display panel according to claim 2, wherein the interval between any two adjacent touch test pins is greater than 0.1mm; the touch test pins and the cathode test pins are rectangular, the lengths of the touch test pins and the cathode test pins are greater than or equal to 0.3mm, and the widths of the touch test pins and the cathode test pins are greater than or equal to 0.1mm.
6. The display panel according to claim 1, wherein the touch test pins are disposed on a surface of the substrate facing a side of the driver layer, the touch trace includes a first touch segment and a second touch segment, the first touch segment is connected to the touch electrode and disposed on a same layer as the touch electrode, the second touch segment is connected to the touch test pins and disposed on a same layer as the touch test pins, and an end of the first touch segment away from the touch electrode and an end of the second touch segment away from the touch test pins are both located in the non-display area and connected in a lap joint manner.
7. The display panel according to claim 6, wherein an end of the first touch segment away from the touch electrode forms a first overlapping pin in the non-display area, an end of the second touch segment away from the touch test pin forms a second overlapping pin in the non-display area, and the first overlapping pin and the second overlapping pin are connected in a one-to-one manner.
8. The display panel according to claim 6, characterized in that the display panel further comprises:
and the packaging cover plate is arranged in the finished product area on one side of the light-emitting device layer, which is back to the substrate, and the touch electrode and the first touch section of the touch routing are formed on the surface of one side, which faces the light-emitting device layer, of the packaging cover plate.
9. The display panel according to claim 8, wherein an insulating gap is provided between the light emitting device layer and the touch layer; and/or
The display panel further includes:
and the insulating layer is arranged between the light-emitting device layer and the touch layer.
10. The display panel according to claim 1, wherein the cathode test pin is disposed on a surface of a side of the substrate facing the driver layer, the cathode trace includes a first cathode segment and a second cathode segment, the first cathode segment is connected to the cathode and disposed on a same layer as the cathode, the second cathode segment is connected to the cathode test pin and disposed on a same layer as the cathode test pin, and the first cathode segment and the second cathode segment are connected by a via.
11. A test circuit for testing the state of the touch electrodes of the display panel according to claim 1,
the test circuit comprises a test capacitor, a first node and a second node, wherein the test capacitor comprises a first plate body and a second plate body which are arranged oppositely, the first node is connected to the first plate body of the test capacitor, and the second node is connected to the second plate body of the test capacitor;
the touch electrode of the display panel is used as the first plate body of the testing capacitor, the cathode is used as the second plate body of the testing capacitor, and the first node and the second node are used for being connected to an external tester to form a testing loop and receive a touch testing signal through the first node.
12. The test circuit of claim 11, wherein the touch test pin serves as the first node and the cathode test pin serves as the second node.
13. A touch electrode testing method of a display panel for testing the display panel according to any one of claims 1 to 10, wherein the display panel comprises a light emitting device layer and a touch layer, the light emitting device layer comprises a cathode, the touch layer comprises a touch electrode, and the touch electrode testing method comprises:
forming a test loop by the touch electrode and the cathode through a touch test board;
inputting a touch test signal to the touch electrode;
and reading a current value of the test loop, and determining the fracture state of the touch electrode according to the current value.
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| CN202110701715.XA CN113434052B (en) | 2021-06-23 | 2021-06-23 | Display panel, test circuit and touch test method of display panel |
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| CN202110701715.XA CN113434052B (en) | 2021-06-23 | 2021-06-23 | Display panel, test circuit and touch test method of display panel |
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| CN113434052B true CN113434052B (en) | 2022-10-04 |
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| CN115050334A (en) * | 2022-06-22 | 2022-09-13 | 厦门天马微电子有限公司 | Light-emitting panel, display device and backlight module |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103943061A (en) * | 2013-12-11 | 2014-07-23 | 上海天马微电子有限公司 | OLED display device with built-in touch control structure |
| CN108108057A (en) * | 2018-01-03 | 2018-06-01 | 京东方科技集团股份有限公司 | A kind of touch base plate |
| US20210013270A1 (en) * | 2018-06-20 | 2021-01-14 | Wuhan Tianma Micro-Electronics Co., Ltd. | Organic light emitting display panel and organic light emitting display device |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103943061A (en) * | 2013-12-11 | 2014-07-23 | 上海天马微电子有限公司 | OLED display device with built-in touch control structure |
| CN108108057A (en) * | 2018-01-03 | 2018-06-01 | 京东方科技集团股份有限公司 | A kind of touch base plate |
| US20210013270A1 (en) * | 2018-06-20 | 2021-01-14 | Wuhan Tianma Micro-Electronics Co., Ltd. | Organic light emitting display panel and organic light emitting display device |
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