CN113369410A - Unidirectional bending equipment for probe - Google Patents
Unidirectional bending equipment for probe Download PDFInfo
- Publication number
- CN113369410A CN113369410A CN202110669811.0A CN202110669811A CN113369410A CN 113369410 A CN113369410 A CN 113369410A CN 202110669811 A CN202110669811 A CN 202110669811A CN 113369410 A CN113369410 A CN 113369410A
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- China
- Prior art keywords
- driving mechanism
- probe
- bending
- rotating shaft
- block
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- 238000005452 bending Methods 0.000 title claims abstract description 55
- 239000000523 sample Substances 0.000 title claims abstract description 46
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000011031 large-scale manufacturing process Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
- B21F—WORKING OR PROCESSING OF METAL WIRE
- B21F1/00—Bending wire other than coiling; Straightening wire
- B21F1/004—Bending wire other than coiling; Straightening wire by means of press-type tooling
Abstract
The invention discloses unidirectional bending equipment for a probe, which comprises a base, wherein a first driving mechanism and two supporting plates are arranged on the base, the upper ends of the two supporting plates are provided with a workbench, the first driving mechanism is positioned between the two supporting plates, the driving end of the first driving mechanism is provided with a rotating shaft, the upper end of the rotating shaft extends out of the workbench, and the upper end of the rotating shaft is provided with a bending block; the workbench is provided with a clamp and a second driving mechanism, a clamping groove is formed in the clamp, the driving end of the second driving mechanism is provided with a jacking block, the jacking block is located on the side of the clamp, and the bending block is located on the front side of the clamping groove. This one-way equipment of buckling for probe has solved the current manual mode and has had work efficiency low and the problem that the angle of buckling is difficult to control when buckling to surveying probe.
Description
Technical Field
The invention belongs to the technical field of probe processing equipment, and particularly relates to unidirectional bending equipment for a probe.
Background
The test probe, also called a semiconductor probe, is composed of a needle tube, a spring and needles, wherein the spring is arranged in the needle tube, and the needles are assembled at two ends of the needle tube. After the test probe is assembled, the test probe sometimes needs to be bent to a certain degree based on the application requirements of special occasions.
However, bending of the test probe is mainly performed by pressing the test probe to rotate by a person through the bending block, the operation mode is low in general production efficiency and difficult to adapt to large-scale production and processing operation, in addition, the person mainly controls the rotation angle of the bending block according to experience, and the problem that the bending degree is not satisfactory due to the fact that the rotation angle of the bending block is too large or too small easily causes the problem that the yield is high.
Disclosure of Invention
The invention aims to provide one-way bending equipment for a probe, which solves the problems of low working efficiency and difficulty in controlling the bending angle when a probing probe is bent in the conventional manual mode.
In order to achieve the purpose, the invention adopts the technical scheme that: a unidirectional bending device for a probe comprises a base, wherein a first driving mechanism and two supporting plates are arranged on the base, a workbench is arranged at the upper ends of the two supporting plates, the first driving mechanism is positioned between the two supporting plates, a rotating shaft is arranged at the driving end of the first driving mechanism, the upper end of the rotating shaft extends out of the workbench, and a bending block is arranged at the upper end of the rotating shaft; the workbench is provided with a clamp and a second driving mechanism, a clamping groove is formed in the clamp, the driving end of the second driving mechanism is provided with a jacking block, the jacking block is located on the side of the clamp, and the bending block is located on the front side of the clamping groove.
As a preferable aspect of the present invention, the first driving mechanism is a rotary cylinder or a motor.
As a preferable technical scheme of the invention, a guide sleeve is arranged in the workbench, and the rotating shaft is rotatably arranged in the guide sleeve.
As a preferable technical scheme of the invention, a limiting groove is arranged on the workbench, and the clamp and the bending block are positioned in the limiting groove.
In a preferred embodiment of the present invention, the second driving mechanism is an air cylinder.
The invention has the beneficial effects that: (1) according to the unidirectional bending equipment for the probe, disclosed by the invention, the test probe is bent in a machining mode, so that the manual participation degree is greatly reduced, the production efficiency is greatly improved, and the unidirectional bending equipment can adapt to industrial large-scale production operation; (2) according to the unidirectional bending device for the probe, the rotation angle of the bending block is controlled through the first driving mechanism, so that the size of the corner of the bending block can be controlled, the bending degree of the test probe is ensured to be consistent, and the generation probability of defective products is greatly reduced; (3) the one-way bending equipment for the probe is simple in structure, convenient to operate, low in manufacturing cost and good in market popularization and application prospect.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:
FIG. 1 is a schematic structural view of a unidirectional bending apparatus for a probe according to the present invention;
FIG. 2 is a schematic view of a partial structure of a unidirectional bending apparatus for a probe according to the present invention;
FIG. 3 is a schematic view of the assembly of the first driving device and the rotating shaft in the unidirectional bending apparatus for probe according to the present invention;
fig. 4 is a schematic view illustrating an assembly of a second driving device and a top block in the unidirectional bending apparatus for a probe according to the present invention.
In the figure: 1. the test fixture comprises a base, a support plate 2, a workbench 3, a clamp 4, a jacking block 5, a bending block 6, a second driving mechanism 7, a limiting groove 8, a rotating shaft 9, a first driving mechanism 10, a clamping groove 11, a test probe 12 and a guide sleeve 13.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention.
In the description of the present invention, if there are first and second described only for the purpose of distinguishing technical features, it is not understood that relative importance is indicated or implied or that the number of indicated technical features or the precedence of the indicated technical features is implicitly indicated or implied.
In the description of the present invention, unless otherwise explicitly limited, terms such as arrangement, installation, connection and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific contents of the technical solutions.
As shown in fig. 1 and 2, the unidirectional bending apparatus for a probe of the present invention comprises a base 1, wherein a first driving mechanism 10 and two supporting plates 2 are arranged on the base 1, a worktable 3 is arranged at the upper ends of the two supporting plates 2, the first driving mechanism 10 is located between the two supporting plates 2, a rotating shaft 9 is arranged at the driving end of the first driving mechanism 10, the upper end of the rotating shaft 9 extends out of the worktable 3, and a bending block 6 is arranged at the upper end of the rotating shaft 9; the workbench 3 is provided with a clamp 4 and a second driving mechanism 7, a clamping groove 11 is arranged in the clamp 4, the driving end of the second driving mechanism 7 is provided with a jacking block 5, the jacking block 5 is positioned at the side of the clamp 4, and the bending block 6 is positioned at the front side of the clamping groove 11.
When the test fixture works, the test probe 12 is inserted into the clamping groove 11 in the fixture 4, then the second driving mechanism 7 is started, the ejector block 5 is pressed on the side part of the fixture 4, at the moment, the clamping groove 11 is stressed to shrink, and the test probe 12 is clamped. Finally, the first driving mechanism 10 is started to rotate the bending block 6 by a certain angle, and the bending block 6 presses the test probe 12 to bend to a certain degree in the process.
Referring to fig. 3, in the unidirectional bending apparatus for a probe according to the present invention, the first driving mechanism 10 is preferably a rotary cylinder or a motor.
Referring to fig. 3, in the unidirectional bending apparatus for a probe according to the present invention, a guide sleeve 13 is provided in the table 3, and the rotary shaft 9 is rotatably provided in the guide sleeve 13.
The pivot 9 passes through the bearing and rotationally sets up in uide bushing 13, and the pivot 9 passes through the spacing direction of uide bushing 13 when rotating, can prevent that it from taking place the polarization, influences test probe 12's the effect of buckling.
Referring to fig. 3, in the unidirectional bending apparatus for a probe according to the present invention, a limiting groove 8 is disposed on the table 3, and the fixture 4 and the bending block 6 are disposed in the limiting groove 8.
The clamp 4 and the bending block 6 are positioned in the limiting groove 8, and the main function of the clamp is to ensure that the clamp 4 is propped against the inner side of the limiting groove 8 when being stressed, so that the clamp is prevented from deviating and the bending effect of the test probe 12 is influenced.
Referring to fig. 4, in the unidirectional bending apparatus for a probe according to the present invention, the second driving mechanism 7 is preferably an air cylinder.
Therefore, compared with the prior art, the unidirectional bending equipment for the probe bends the test probe in a machining mode, greatly reduces the manual participation degree, greatly improves the production efficiency, and can adapt to industrial large-scale production operation.
In addition, the unidirectional bending equipment for the probe controls the rotation angle of the bending block through the first driving mechanism, so that the size of the corner of the bending block can be controlled, the consistent bending degree of the test probe is ensured, and the generation probability of defective products is greatly reduced.
In addition, the one-way bending equipment for the probe is simple in structure, convenient to operate, low in manufacturing cost and good in market popularization and application prospect.
While the foregoing description shows and describes several preferred embodiments of the invention, it is to be understood, as noted above, that the invention is not limited to the forms disclosed herein, but is not to be construed as excluding other embodiments and is capable of use in various other combinations, modifications, and environments and is capable of changes within the scope of the inventive concept as expressed herein, commensurate with the above teachings, or the skill or knowledge of the relevant art. And that modifications and variations may be effected by those skilled in the art without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (5)
1. The unidirectional bending device for the probe is characterized by comprising a base (1), wherein a first driving mechanism (10) and two supporting plates (2) are arranged on the base (1), a workbench (3) is arranged at the upper ends of the two supporting plates (2), the first driving mechanism (10) is positioned between the two supporting plates (2), a rotating shaft (9) is arranged at the driving end of the first driving mechanism (10), the upper end of the rotating shaft (9) extends out of the workbench (3), and a bending block (6) is arranged at the upper end of the rotating shaft (9); be provided with anchor clamps (4) and second actuating mechanism (7) on workstation (3), be provided with clamping groove (11) in anchor clamps (4), the drive end of second actuating mechanism (7) is provided with kicking block (5), kicking block (5) are located the side of anchor clamps (4), and bending block (6) are located the front side in clamping groove (11).
2. The unidirectional bending apparatus for probe according to claim 1, wherein the first driving mechanism (10) is a rotary cylinder or a motor.
3. The unidirectional bending apparatus for probe according to claim 2, wherein a guide sleeve (13) is provided in the working table (3), and the rotating shaft (9) is rotatably provided in the guide sleeve (13).
4. The unidirectional bending device for the probe according to claim 3, wherein a limiting groove (8) is arranged on the workbench (3), and the clamp (4) and the bending block (6) are positioned in the limiting groove (8).
5. A unidirectional bending apparatus for a probe according to claim 4, wherein the second driving mechanism (7) is a cylinder.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110669811.0A CN113369410A (en) | 2021-06-17 | 2021-06-17 | Unidirectional bending equipment for probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110669811.0A CN113369410A (en) | 2021-06-17 | 2021-06-17 | Unidirectional bending equipment for probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113369410A true CN113369410A (en) | 2021-09-10 |
Family
ID=77577329
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110669811.0A Pending CN113369410A (en) | 2021-06-17 | 2021-06-17 | Unidirectional bending equipment for probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113369410A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030015013A1 (en) * | 2001-07-23 | 2003-01-23 | St Assembly Test Services Pte Ltd | Semi-automated probe bender |
| CN110421034A (en) * | 2019-06-13 | 2019-11-08 | 中电鼎康（天长）科技有限公司 | A kind of temperature sensor production probe bending device |
| CN110899582A (en) * | 2019-12-13 | 2020-03-24 | 华东师范大学 | Portable probe bending machine with electric and manual operation |
| CN111360178A (en) * | 2020-04-22 | 2020-07-03 | 渭南高新区木王科技有限公司 | Rotary driving device for probe bending |
| CN111390059A (en) * | 2020-04-20 | 2020-07-10 | 渭南高新区木王科技有限公司 | Bending machine |
| CN212111534U (en) * | 2020-02-27 | 2020-12-08 | 上海依然半导体测试有限公司 | Probe device of buckling |
-
2021
- 2021-06-17 CN CN202110669811.0A patent/CN113369410A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030015013A1 (en) * | 2001-07-23 | 2003-01-23 | St Assembly Test Services Pte Ltd | Semi-automated probe bender |
| CN110421034A (en) * | 2019-06-13 | 2019-11-08 | 中电鼎康（天长）科技有限公司 | A kind of temperature sensor production probe bending device |
| CN110899582A (en) * | 2019-12-13 | 2020-03-24 | 华东师范大学 | Portable probe bending machine with electric and manual operation |
| CN212111534U (en) * | 2020-02-27 | 2020-12-08 | 上海依然半导体测试有限公司 | Probe device of buckling |
| CN111390059A (en) * | 2020-04-20 | 2020-07-10 | 渭南高新区木王科技有限公司 | Bending machine |
| CN111360178A (en) * | 2020-04-22 | 2020-07-03 | 渭南高新区木王科技有限公司 | Rotary driving device for probe bending |
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| PB01 | Publication | ||
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| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information | ||
| CB02 | Change of applicant information |
Address after: 714000 No. 18, chongye Second Road, high tech Industrial Development Zone, Weinan City, Shaanxi Province Applicant after: Weinan Muwang Intelligent Technology Co.,Ltd. Address before: 710000 northwest corner of cross between Dongfeng Street and Shiquan Road, high tech Industrial Development Zone, Weinan City, Shaanxi Province Applicant before: WEINAN HI-TECH ZONE WOOD KING TECHNOLOGY Co.,Ltd. |
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| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20210910 |