CN212111534U

CN212111534U - Probe device of buckling

Info

Publication number: CN212111534U
Application number: CN202020219309.0U
Authority: CN
Inventors: 王英贤
Original assignee: Shanghai Yiran Semiconductor Test Co ltd
Current assignee: Shanghai Yiran Semiconductor Test Co ltd
Priority date: 2020-02-27
Filing date: 2020-02-27
Publication date: 2020-12-08
Anticipated expiration: 2030-02-27

Abstract

The utility model discloses a belong to probe manufacturing technical field, specifically be a probe device of buckling, it includes: bottom plate, slider and measurement board, two spouts, two have been seted up on the top of bottom plate equal swing joint has the slider in the spout, two first shrinkage pool and second shrinkage pool have all been seted up to one side of slider, one side fixed mounting of bottom plate has the measurement board, the measurement board is semi-circular structure, be provided with the scale on the measurement board, the rectangle recess has been seted up on the top of bottom plate, two first shrinkage pool is the semi-cylindrical structure that matches each other, two the rectangle structure that the second shrinkage pool matches each other, two the knot kerve has all been seted up on the top of slider. This probe device of buckling, simple structure, efficiency is higher, save time, the angle of buckling is directly perceived, and is more accurate.

Description

Probe device of buckling

Technical Field

The utility model relates to a technical field is made to the probe, specifically is a probe device of buckling.

Background

Wafer testing is the use of test equipment to test the chips to be tested on a wafer. The probe card is an interface between a chip under test and a tester in wafer testing. The cantilever probe card is an interface between a chip to be tested and a testing machine in wafer testing and is used for fixing an epoxy resin ring of a probe, and the tail part of the probe is welded on a fixed bonding pad of the probe card. The probes used to make the cantilever epoxy probe card need to be bent at a certain angle. The existing needle bending device usually directly inserts a probe into a notch, and bends at random for an angle, so that the bending result is not accurate enough.

SUMMERY OF THE UTILITY MODEL

This section is for the purpose of summarizing some aspects of embodiments of the invention and to briefly introduce some preferred embodiments. Some simplifications or omissions may be made in this section and in the abstract of the specification and the title of the application to avoid obscuring the purpose of this section, the abstract of the specification and the title of the application, and such simplifications or omissions are not intended to limit the scope of the invention.

The present invention has been made in view of the above and/or other problems occurring in the conventional probe bending apparatus.

Therefore, the utility model aims at providing a probe device of buckling, simple structure, efficiency is higher, and save time buckles the angle directly perceived, more accurate.

For solving the technical problem, according to the utility model discloses an aspect, the utility model provides a following technical scheme:

a probe bending apparatus, comprising: bottom plate, slider and measurement board, two spouts, two have been seted up on the top of bottom plate equal swing joint has the slider in the spout, two first shrinkage pool and second shrinkage pool have all been seted up to one side of slider, one side fixed mounting of bottom plate has the measurement board, the measurement board is semi-circular structure, be provided with the scale on the measurement board.

As the utility model discloses a probe device of buckling's an preferred scheme, wherein: the top end of the bottom plate is provided with a rectangular groove.

As the utility model discloses a probe device of buckling's an preferred scheme, wherein: the two first concave holes are of semi-cylindrical structures matched with each other, and the two second concave holes are of rectangular structures matched with each other.

As the utility model discloses a probe device of buckling's an preferred scheme, wherein: and the top ends of the two sliding blocks are provided with a pull-buckle groove.

As the utility model discloses a probe device of buckling's an preferred scheme, wherein: the scale is an angle scale of 180 degrees.

Compared with the prior art: through stirring the slider, the slider removes along the spout, and first shrinkage pool or second shrinkage pool are two liang mutually supported and are cliied the probe, carry out the probe again and crooked, observe the crooked angle of probe through the scale on the measuring plate to guarantee that the probe is crooked to suitable angle, this probe device of buckling, simple structure, efficiency is higher, save time, the angle of buckling is directly perceived, more accurate.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the present invention will be described in detail with reference to the accompanying drawings and detailed embodiments, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive labor. Wherein:

fig. 1 is a front view of the present invention;

fig. 2 is a side view of the present invention.

In the figure: 100 bottom plates, 110 sliding grooves, 120 rectangular grooves, 200 sliding blocks, 210 first concave holes, 220 second concave holes, 230 buckling grooves, 300 measuring plates and 310 scales.

Detailed Description

In order to make the above objects, features and advantages of the present invention more comprehensible, embodiments of the present invention are described in detail below with reference to the accompanying drawings.

In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention, but the present invention may be implemented in other ways than those specifically described herein, and one skilled in the art may similarly generalize the present invention without departing from the spirit of the present invention, and therefore the present invention is not limited to the specific embodiments disclosed below.

Next, the present invention will be described in detail with reference to the schematic drawings, and in the detailed description of the embodiments of the present invention, for convenience of explanation, the sectional view showing the device structure will not be partially enlarged according to the general scale, and the schematic drawings are only examples, and should not limit the scope of the present invention. In addition, the three-dimensional dimensions of length, width and depth should be included in the actual fabrication.

In order to make the objects, technical solutions and advantages of the present invention clearer, embodiments of the present invention will be described in further detail below with reference to the accompanying drawings.

The utility model provides a probe device of buckling, simple structure, efficiency is higher, save time, the angle of buckling is directly perceived, more accurate, please refer to figure 1 and figure 2, include: a base plate 100, a slider 200, and a measuring plate 300;

referring to fig. 1 and 2 again, the top end of the bottom plate 100 is provided with two sliding slots 110, specifically, the top end of the bottom plate 100 is provided with two sliding slots 110, the bottom plate 100 is used for fixing an upper device, and the sliding slots 110 are used for providing a moving channel for the sliding block 200;

referring to fig. 1 and 2 again, the two sliding grooves 110 are movably connected with sliding blocks 200, one side of each of the two sliding blocks 200 is provided with a first concave hole 210 and a second concave hole 220, specifically, the two sliding grooves 110 are slidably connected with the sliding blocks 200, one side of each of the two sliding blocks 200 is provided with a first concave hole 210 and a second concave hole 220, the sliding blocks 200 are used for providing a function of bending probes, and the first concave holes 210 and the second concave holes 220 are used for fixing probes with different shapes;

referring to fig. 1 and 2 again, a measuring plate 300 is fixedly installed at one side of the base plate 100, the measuring plate 300 is of a semicircular structure, and a scale 310 is arranged on the measuring plate 300, specifically, the measuring plate 300 is welded at one side of the base plate 100, the measuring plate 300 is of a semicircular structure, the measuring plate 300 is provided with a scale 310, the measuring plate 300 is used for fixing the scale 310, and the scale 310 is used for conveniently observing the bending angle of the probe;

when specific use, through stirring slider 200, slider 200 moves along spout 110, and first shrinkage pool 210 or second shrinkage pool 220 are mutually supported and are cliied the probe between two liang, again with the probe bending, observe the crooked angle of probe through scale 310 on measuring board 300 to guarantee that the probe is crooked to suitable angle.

Referring to fig. 1 again, in order to facilitate the lifting of the bottom plate 100, a rectangular groove 120 is formed at the top end of the bottom plate 100.

Referring to fig. 2 again, in order to clamp different probes by the first recess 210 and the second recess 220, the two first recesses 210 are semi-cylindrical structures matched with each other, and the two second recesses 220 are rectangular structures matched with each other.

Referring to fig. 1 again, in order to facilitate the sliding of the sliding blocks 200, the top ends of the two sliding blocks 200 are both provided with a buckling groove 230.

Referring again to fig. 1, to observe the bending angle of the probe, the scale 310 is an angle scale 310 of 180 degrees.

While the invention has been described above with reference to an embodiment, various modifications may be made and equivalents may be substituted for elements thereof without departing from the scope of the invention. In particular, as long as there is no structural conflict, the various features of the disclosed embodiments of the present invention can be used in any combination with each other, and the non-exhaustive description of these combinations in this specification is merely for the sake of brevity and resource conservation. Therefore, it is intended that the invention not be limited to the particular embodiments disclosed, but that the invention will include all embodiments falling within the scope of the appended claims.

Claims

1. A probe bending device is characterized by comprising: bottom plate (100), slider (200) and measurement board (300), two spout (110), two have been seted up on the top of bottom plate (100) equal swing joint has slider (200), two in spout (110) first shrinkage pool (210) and second shrinkage pool (220) have all been seted up to one side of slider (200), one side fixed mounting of bottom plate (100) has measurement board (300), it is semi-circular structure to measure board (300), be provided with scale (310) on measurement board (300).

2. The probe bending device according to claim 1, wherein a rectangular groove (120) is formed at the top end of the base plate (100).

3. The probe bending device according to claim 1, wherein the two first concave holes (210) are of a mutually matched semi-cylindrical structure, and the two second concave holes (220) are of a mutually matched rectangular structure.

4. The probe bending device according to claim 1, wherein the top ends of the two sliding blocks (200) are provided with a buckling groove (230).

5. A probe bending device according to claim 1, wherein the scale (310) is an angle scale (310) of 180 degrees.