CN113348145A - Mems设备及其制备方法、电子设备 - Google Patents

Mems设备及其制备方法、电子设备 Download PDF

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Publication number
CN113348145A
CN113348145A CN201980086980.2A CN201980086980A CN113348145A CN 113348145 A CN113348145 A CN 113348145A CN 201980086980 A CN201980086980 A CN 201980086980A CN 113348145 A CN113348145 A CN 113348145A
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China
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region
mems device
rigidity
rigid
film structure
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Pending
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CN201980086980.2A
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English (en)
Inventor
罗松成
詹竣凯
游博丞
谢冠宏
方维伦
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Gettop Acoustic Co Ltd
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Gettop Acoustic Co Ltd
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Publication of CN113348145A publication Critical patent/CN113348145A/zh
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81BMICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B3/00Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00Manufacture or treatment of devices or systems in or on a substrate

Abstract

一种MEMS设备、包括该MEMS设备的电子设备以及该MEMS设备的制备方法,该MEMS设备的薄膜结构(10)包括位于中间区域的具有第一刚性的第一刚性区域(110)和位于边缘区域的具有第二刚性的第二刚性区域(120),第一刚性小于第二刚性,第二刚性区域包括至少一个从薄膜结构(10)表面向外延伸的凸起(122)。MEMS设备的制备方法包括提供基板(210);在基板(210)上形成沟槽(212);提供薄膜结构(10)。该MEMS设备通过增加支撑结构扩孔时的制程裕度,不会因为扩孔误差导致薄膜结构的第一刚性区域(110)的刚性发生实质性变化,从而避免影响MEMS设备的性能。

Description

PCT国内申请,说明书已公开。

Claims (20)

  1. PCT国内申请,权利要求书已公开。
CN201980086980.2A 2019-05-31 2019-05-31 Mems设备及其制备方法、电子设备 Pending CN113348145A (zh)

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PCT/CN2019/089575 WO2020237640A1 (zh) 2019-05-31 2019-05-31 Mems设备及其制备方法、电子设备

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CN113348145A true CN113348145A (zh) 2021-09-03

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104113810A (zh) * 2014-07-18 2014-10-22 瑞声声学科技(深圳)有限公司 Mems麦克风及其制备方法与电子设备
CN204014058U (zh) * 2014-07-31 2014-12-10 歌尔声学股份有限公司 一种mems麦克风
US20160373874A1 (en) * 2015-06-17 2016-12-22 Robert Bosch Gmbh In-plane overtravel stops for mems microphone
US20170081176A1 (en) * 2015-09-22 2017-03-23 Hangzhou Silan Microelectronics Co., Ltd. Mems device, semiconductor device and method for manufacturing the same
US20180007474A1 (en) * 2016-06-30 2018-01-04 Cirrus Logic International Semiconductor Ltd. Mems devices and processes
US20180148315A1 (en) * 2016-11-29 2018-05-31 Cirrus Logic International Semiconductor Ltd. Mems devices and processes
US20190052976A1 (en) * 2017-08-09 2019-02-14 Db Hitek Co., Ltd. Mems microphone and method of manufacturing the same

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104113810A (zh) * 2014-07-18 2014-10-22 瑞声声学科技(深圳)有限公司 Mems麦克风及其制备方法与电子设备
CN204014058U (zh) * 2014-07-31 2014-12-10 歌尔声学股份有限公司 一种mems麦克风
US20160373874A1 (en) * 2015-06-17 2016-12-22 Robert Bosch Gmbh In-plane overtravel stops for mems microphone
US20170081176A1 (en) * 2015-09-22 2017-03-23 Hangzhou Silan Microelectronics Co., Ltd. Mems device, semiconductor device and method for manufacturing the same
US20180007474A1 (en) * 2016-06-30 2018-01-04 Cirrus Logic International Semiconductor Ltd. Mems devices and processes
US20180148315A1 (en) * 2016-11-29 2018-05-31 Cirrus Logic International Semiconductor Ltd. Mems devices and processes
US20190052976A1 (en) * 2017-08-09 2019-02-14 Db Hitek Co., Ltd. Mems microphone and method of manufacturing the same

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WO2020237640A1 (zh) 2020-12-03

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