CN113315774A - Instrument testing method and instrument testing device - Google Patents
Instrument testing method and instrument testing device Download PDFInfo
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- CN113315774A CN113315774A CN202110605201.4A CN202110605201A CN113315774A CN 113315774 A CN113315774 A CN 113315774A CN 202110605201 A CN202110605201 A CN 202110605201A CN 113315774 A CN113315774 A CN 113315774A
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- 238000012360 testing method Methods 0.000 title claims abstract description 337
- 238000000034 method Methods 0.000 claims abstract description 44
- 238000004891 communication Methods 0.000 claims description 29
- 230000002159 abnormal effect Effects 0.000 claims description 7
- 238000000605 extraction Methods 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 10
- 230000006870 function Effects 0.000 description 10
- 238000005259 measurement Methods 0.000 description 10
- 238000012795 verification Methods 0.000 description 7
- 238000010998 test method Methods 0.000 description 6
- 230000009191 jumping Effects 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 125000004122 cyclic group Chemical group 0.000 description 1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L63/00—Network architectures or network communication protocols for network security
- H04L63/04—Network architectures or network communication protocols for network security for providing a confidential data exchange among entities communicating through data packet networks
- H04L63/0428—Network architectures or network communication protocols for network security for providing a confidential data exchange among entities communicating through data packet networks wherein the data content is protected, e.g. by encrypting or encapsulating the payload
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L63/00—Network architectures or network communication protocols for network security
- H04L63/08—Network architectures or network communication protocols for network security for authentication of entities
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L63/00—Network architectures or network communication protocols for network security
- H04L63/14—Network architectures or network communication protocols for network security for detecting or protecting against malicious traffic
- H04L63/1408—Network architectures or network communication protocols for network security for detecting or protecting against malicious traffic by monitoring network traffic
- H04L63/1416—Event detection, e.g. attack signature detection
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L63/00—Network architectures or network communication protocols for network security
- H04L63/14—Network architectures or network communication protocols for network security for detecting or protecting against malicious traffic
- H04L63/1441—Countermeasures against malicious traffic
Abstract
The application provides a method and a device for testing an instrument, which are characterized in that equipment attribute information of equipment to be tested and a corresponding target test type are obtained; extracting a target test scheme in a preset test set according to the equipment attribute information and the target test type; controlling the equipment to be tested to feed back corresponding test data based on the target test scheme; and determining the test result of the equipment to be tested according to the test data fed back by the equipment to be tested. According to the method provided by the scheme, the device to be tested is automatically tested, manual intervention of operators is not needed in the testing process, the testing efficiency is improved, and a foundation is laid for improving the safety of the power system.
Description
Technical Field
The application relates to the technical field of automation, in particular to an instrument testing method and a testing device thereof.
Background
The instrument is an important component of the current power system, wherein the instrument mainly comprises various devices such as an intelligent electric energy meter, an acquisition terminal, an intelligent gas meter and an industrial control instrument. The reliability of each device is related to the safety of the whole power system, because an operator needs to test the instrument to guarantee the reliability of the instrument.
In the prior art, the instrument is usually tested by manual testing.
However, as these devices are continuously updated, their functional requirements are also continuously changed, and the defect of low efficiency of the conventional instrument testing method is a technical problem to be solved at present.
Disclosure of Invention
The application provides an instrument testing method and a testing device thereof, which aim to overcome the defects of low testing efficiency and the like in the prior art.
The first aspect of the present application provides an instrument testing method, which is applied to an instrument testing system, the system includes a basic database, at least one testing scheme can be preset according to the basic database, and a testing set is established, the method includes:
acquiring equipment attribute information of equipment to be tested and a corresponding target test type;
extracting a target test scheme in a preset test set according to the equipment attribute information and the target test type;
controlling the equipment to be tested to feed back corresponding test data based on the target test scheme;
and determining the test result of the equipment to be tested according to the test data fed back by the equipment to be tested.
Optionally, when the target test type is an attack resistance test, controlling the device to be tested to feed back corresponding test data based on the target test scheme includes:
sending an attack instruction to the equipment to be tested according to a preset attack period;
and when the sending times of the attack instruction reach a preset threshold value, acquiring the current data of the equipment to be tested.
Optionally, the determining, according to the test data fed back by the device to be tested, a test result of the device to be tested includes:
judging whether the current data of the equipment to be tested is the same as the original data of the equipment to be tested;
and when the current data of the equipment to be tested is the same as the original data, determining that the test result of the equipment to be tested is normal.
Optionally, when the target test type is an error test, controlling the device to be tested to feed back corresponding test data based on the target test scheme includes:
and sending an equipment time reading instruction to the equipment to be tested so as to control the equipment to be tested to feed back the current equipment time.
Optionally, the determining, according to the test data fed back by the device to be tested, a test result of the device to be tested includes:
judging whether the time difference between the current equipment time and the current system time exceeds a preset time difference threshold value or not;
and when the time difference between the current equipment time and the current system time exceeds the time difference threshold value, determining that the test result of the equipment to be tested is abnormal.
Optionally, before controlling the device under test to feed back corresponding test data based on the target test scheme, the method further includes:
generating a test instruction; wherein the test instruction corresponds to the target test scenario;
and encrypting the test instruction by using a preset encryption machine according to the communication standard of the equipment to be tested.
Optionally, the method further includes:
sending an identity authentication request to the equipment to be tested;
and sending a test instruction to the equipment to be tested under the condition that the identity authentication request passes.
A second aspect of the present application provides an instrument testing device, comprising:
the acquisition module is used for acquiring the equipment attribute information of the equipment to be tested and the corresponding target test type;
the extraction module is used for extracting a target test scheme in a preset test set according to the equipment attribute information and the target test type;
the control module is used for controlling the equipment to be tested to feed back corresponding test data based on the target test scheme;
and the determining module is used for determining the test result of the equipment to be tested according to the test data fed back by the equipment to be tested.
Optionally, the apparatus is applied to an instrument testing system, where the system includes a basic database, at least one testing scheme may be preset according to the basic database, and a testing scheme set is established.
Optionally, the apparatus further comprises:
the encryption module is used for generating a test instruction; wherein the test instruction corresponds to the target test scenario; encrypting the test instruction by using a preset encryption machine according to the communication standard of the equipment to be tested;
the identity authentication module is used for sending an identity authentication request to the equipment to be tested; and sending a test instruction to the equipment to be tested under the condition that the identity authentication request passes.
This application technical scheme has following advantage:
according to the instrument testing method and the instrument testing device, the device attribute information of the device to be tested and the corresponding target testing type are obtained; extracting a target test scheme in a preset test set according to the equipment attribute information and the target test type; controlling the equipment to be tested to feed back corresponding test data based on the target test scheme; and determining the test result of the equipment to be tested according to the test data fed back by the equipment to be tested. According to the method provided by the scheme, the device to be tested is automatically tested, manual intervention of operators is not needed in the testing process, the testing efficiency is improved, and a foundation is laid for improving the safety of the power system.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present application, and other drawings can be obtained by those skilled in the art according to these drawings.
FIG. 1 is a schematic diagram of an instrumentation test system according to an embodiment of the present application;
FIG. 2 is a schematic flow chart illustrating a method for testing an instrument provided in an embodiment of the present application;
FIG. 3 is a schematic diagram of an exemplary instrumentation test system provided by an embodiment of the present application;
FIG. 4 is a schematic deployment flow diagram of an exemplary instrument testing method provided by an embodiment of the present application;
FIG. 5 is a schematic structural diagram of an instrumentation and testing device according to an embodiment of the present application;
fig. 6 is a schematic structural diagram of an electronic device according to an embodiment of the present application.
With the above figures, there are shown specific embodiments of the present application, which will be described in more detail below. These drawings and written description are not intended to limit the scope of the disclosed concepts in any way, but rather to illustrate the concepts of the disclosure to those skilled in the art by reference to specific embodiments.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Furthermore, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. In the description of the following examples, "plurality" means two or more unless specifically limited otherwise.
In the prior art, the instrument is usually tested by manual testing. However, as these devices are continuously updated, their functional requirements are also continuously changed, and the defect of low efficiency of the conventional instrument testing method is a technical problem to be solved at present.
In order to solve the above problems, the method for testing an instrument and a device thereof according to the embodiments of the present application obtain device attribute information of a device to be tested and a corresponding target test type; extracting a target test scheme in a preset test set according to the equipment attribute information and the target test type; controlling the equipment to be tested to feed back corresponding test data based on the target test scheme; and determining the test result of the equipment to be tested according to the test data fed back by the equipment to be tested. According to the method provided by the scheme, the device to be tested is automatically tested, manual intervention of operators is not needed in the testing process, the testing efficiency is improved, and a foundation is laid for improving the safety of the power system.
The following several specific embodiments may be combined with each other, and details of the same or similar concepts or processes may not be repeated in some embodiments. Embodiments of the present invention will be described below with reference to the accompanying drawings.
First, a structure of an instrument testing system based on the present application will be described:
the method and the device for testing the instruments and meters are suitable for automatically testing the instruments and meters in the power system. As shown in fig. 1, the structural diagram of an instrument testing system according to an embodiment of the present invention mainly includes a device to be tested, a device verification apparatus, and a testing apparatus. Specifically, before testing the device to be tested, the testing device sends a verification instruction to the device verification device, so that the device to be tested is powered on by the device verification device, and after the device to be tested is determined to be powered on, the testing device is used for automatically testing the device to be tested, and a corresponding testing result is generated.
The embodiment of the application provides an instrument testing method, which is applied to an instrument testing system, the system comprises a basic database, at least one testing scheme can be preset according to the basic database, a testing set is established, and the method is used for automatically testing an instrument. The execution subject of the embodiment of the present application is an electronic device, such as a server, a desktop computer, a notebook computer, a tablet computer, and other electronic devices that can be used for performing instrumentation tests.
As shown in fig. 2, a schematic flow chart of an instrument testing method provided in an embodiment of the present application is shown, where the method includes:
It should be noted that the testing method provided by the embodiment of the application is applicable to various devices such as intelligent electric energy meters (domestic and foreign), acquisition terminals (relating to special transformers, public transformers, concentrators, energy controllers and the like), intelligent gas meters, industrial control instruments (digital display meters) and the like.
the device attribute information at least includes a device type of the device to be tested, such as a device like an electric energy meter.
It should be noted that, the preset test set is provided with multiple device test schemes, i.e., multiple test methods, and has a wider coverage and a higher expandability, and each test scheme corresponds to different device attribute information and test types, so that a user can select one or more target test methods that are currently required. The test scheme in the preset test set can be expanded according to development requirements, so that the expandability of the instrument test method provided by the embodiment of the application is improved.
And 203, controlling the device to be tested to feed back corresponding test data based on the target test scheme.
Specifically, the device under test may be tested according to a target test scheme corresponding to the target test type. If a test instruction is sent to the device to be tested to trigger the device to be tested to generate test data, and the like, a specific test mode needs to be determined in combination with a specific situation, which is not limited in the embodiments of the present application.
The sent test instruction can be a device operation instruction such as reading and writing.
And 204, determining a test result of the equipment to be tested according to the test data fed back by the equipment to be tested.
It should be noted that the test data fed back by the device under test may correspond to the test instruction, so that the test result of the device under test may be determined according to the difference between the obtained test data and the ideal data.
On the basis of the foregoing embodiment, as an implementable manner, in an embodiment, when the target test type is an attack resistance test, controlling the device under test to feed back corresponding test data based on a target test scheme includes:
step 2021, sending an attack instruction to the device to be tested according to a preset attack period;
step 2022, when the sending times of the attack instruction reach a preset threshold, obtaining the current data of the device to be tested.
It should be noted that the attack instruction is an interference value that can interfere with the measurement performance of the device under test, so as to interfere with the measurement value obtained by the device under test, thereby affecting the accuracy of the measurement value.
Specifically, measurement data of the device to be tested is obtained first, then an attack instruction is sent to the device to be tested, and when the number of times of attack on the device to be tested reaches a preset threshold value, current data of the device to be tested is collected, that is, after the attack is completed for a plurality of times, measurement data of the device to be tested after the attack is collected.
Further, in an embodiment, it may be determined whether the current data of the device to be tested is the same as the original data of the device to be tested; and when the current data of the equipment to be tested is the same as the original data, determining that the test result of the equipment to be tested is normal.
In contrast, in an embodiment, when the current data of the device under test is different from the original data, the test result of the device under test is determined to be abnormal.
It should be noted that the raw data is measurement data before the device under test is attacked. Specifically, after the original data is acquired, an attack instruction may be sent to the device to be tested.
When the current data of the equipment to be tested is the same as the original data, the anti-interference capability of the equipment to be tested is determined to be good, and therefore the test result of the equipment to be tested is determined to be normal. On the contrary, when the current data of the device to be tested is different from the original data, the anti-interference capability of the device to be tested is determined to be poor, so that the test result of the device to be tested is determined to be abnormal.
Further, after the test result of the device to be tested is determined, a corresponding test report is generated for reading by a related operator.
For example, taking the device under test as an electric energy meter as an example, the measurement data (raw data) of the electric energy meter may be read by calling the corresponding sub-function. If the preset threshold is 10, the variable name is round, the operation value is 0, and the cyclic data attack with the initial value of 0 is performed. After a data attack value (attack instruction) is sent to the electric energy meter as [ self-defined frame 1], delaying for 1s, and then sending the self-defined frames to the electric energy meter in sequence according to the configuration of sending the self-defined frames, the operation values [ self-defined frame 2], [ self-defined frame 3] and the like of the subsequently set operation type so as to attack the data according to a preset period. And after all the custom frames are sent, and then, the rond +1 finishes the data attack until the round value is equal to 10. At this time, the sub-function is called again to read the measurement data (current data) of the electric energy meter. Then, based on a judgment formula, comparing whether the data read before and after the attack is consistent or not, if so, ending the test, and generating a test report, wherein the data read before and after the attack is the data read after the attack, and the unqualified reason is the data attack; otherwise, filling the unqualified reason in the specified position of the test report.
On the basis of the foregoing embodiment, as an implementable manner, in an embodiment, when the target test type is an error test, controlling the device under test to feed back corresponding test data based on the target test scheme includes: and sending an equipment time reading instruction to the equipment to be tested so as to control the equipment to be tested to feed back the current equipment time.
Further, judging whether the time difference between the current equipment time and the current system time exceeds a preset time difference threshold value or not; and when the time difference between the current equipment time and the current system time exceeds a time difference threshold value, determining that the test result of the equipment to be tested is abnormal.
Conversely, when the time difference between the current equipment time and the current system time does not exceed the time difference threshold, the test result of the equipment to be tested is determined to be normal.
The current system time refers to the time recorded by the current instrumentation test system, and can be understood as the accurate time. Because the obtained measurement data is usually recorded according to a time unit in the process of measuring data by the device to be measured, the reliability of the measurement data output by the device to be measured is directly influenced by the accuracy of the device time.
Specifically, after sending a device time reading instruction to the device to be tested, the device to be tested feeds back a time value (current device time), compares the time value fed back by the device to be tested with the current system time, calculates a deviation (time difference), further determines whether the deviation exceeds a preset time difference threshold, and determines that the time error of the device to be tested is large if the deviation exceeds the time difference threshold, thereby determining that the test result of the device to be tested is abnormal.
On the basis of the foregoing embodiment, in order to ensure the security of the device under test in practical application, for some sensitive information, the device under test uses an encrypted communication mode to perform communication, which is an implementable mode, and in an embodiment, before sending the test instruction to the device under test, the method further includes:
step 301, generating a test instruction; wherein the test instruction corresponds to the target test scheme;
step 302, encrypting the test instruction by using a preset encryption machine according to the communication standard of the device to be tested.
It should be noted that the generated test instruction is the test instruction sent to the device under test mentioned in the above embodiment, and the test instruction is generated by the instrument testing apparatus. The communication standard mainly includes ciphertext communication, plaintext communication, and the like.
Taking an example that the device to be tested is an electric energy meter, as shown in fig. 3, which is a schematic structural diagram of an exemplary instrument testing system provided in the embodiment of the present application, an encryption device is mainly used for encryption/decryption services provided for an instrument testing apparatus (electric energy meter testing apparatus).
Specifically, if the communication standard of the device under test is ciphertext communication, the encryption is performed by using the encryption machine according to the encryption rule corresponding to the ciphertext communication. The crypto dynamic library may be specifically invoked to perform the confidentiality of the test instructions.
Specifically, in an embodiment, to avoid a malicious attacker pretending to be a device under test to maliciously tamper the device under test parameters, before sending a test instruction to the device under test, the method further includes: sending an identity authentication request to equipment to be tested; and sending a test instruction to the equipment to be tested under the condition that the identity authentication request passes.
Specifically, the identity authentication request sent to the device to be tested includes identification information of the electronic device performing the instrument test, and if the identification information in the identity authentication request received by the device to be tested is consistent with the preset identification information of the electronic device, the identity authentication is passed, and at this time, a test instruction can be sent to the device to be tested.
For example, in order to enable the device under test to adapt to the test operation of the instrument, before testing the device under test, parameter configuration needs to be performed on the device under test, which can be understood as a preset process of the device under test, and an exemplary parameter configuration process is as follows:
(1) constitute the equipment that awaits measuring and set up the parameter instruction, after encrypting through calling the encryption machine, will encrypt the parameter instruction that sets up send to the equipment that awaits measuring, the equipment that awaits measuring receives after setting up the parameter instruction analysis and according to the instruction content setting equipment parameter that awaits measuring to return and set up the result, for example: and finishing parameter setting.
(2) According to the configuration of a preset judgment formula PL (3), the operation type is comparison, successful jumping is step ID1, unsuccessful jumping is step ID2 and the like, the phase line type of the equipment to be tested is read according to the PL identification (the setting is selected by a tester before testing is started), if the phase line type is selected to be a three-phase four-wire type, the phase line type is equal to 3, the phase line type is true, the step ID is 1, the step is skipped to the step, the ammeter setting parameter of the next three-phase equipment to be tested is carried out, an ammeter parameter reading instruction is carried out after the setting, if the phase line type is not equal to 3, the step ID is 2, whether the phase line type is equal to 1 or not is judged, and if the phase line type is not equal to 3, the setting parameter of the next single-phase equipment to be tested is carried out; and if not, jumping out of the parameter setting step and jumping to the operation of the ammeter parameter reading instruction.
(3) Intercepting the first to tenth data of the operation return value of the step of reading the electric meter parameter instruction, and splicing the intercepted data with 0100 (preset data to be spliced) according to a splicing rule. And sending the spliced characters serving as a next ammeter parameter setting instruction to equipment to be tested so as to configure other related parameters.
It should be noted that what parameters need to be configured specifically need to be determined by combining actual test requirements and application scenarios of the device under test, the above embodiment is only an exemplary parameter configuration flow, and the embodiment of the present application is not limited in this way.
In order to facilitate better understanding of the test method for the device under test provided in the embodiment of the present application by those skilled in the art, as shown in fig. 4, a schematic deployment flow diagram of the test method for the device under test provided in the embodiment of the present application is shown, where the exemplary deployment flow is as follows:
1. before executing the test method of the device to be tested, basic data such as an ammeter communication protocol, a device control interface, a logic control function, a data operation function and the like need to be edited in advance.
(1) Editing electric meter communication protocol
A user clicks a communication command management module to maintain and manage communication protocol information such as DL/T645 and DL/T698.45 supported by the system, wherein the communication protocol information comprises information such as a communication command name, a communication identifier, an attribute/method, an operation type, a function code, an analysis name, an analysis format, an analysis unit, a conversion unit, a fixed type, a data identifier and a display mode;
(2) editing device control interface
The system packages the control of equipment such as voltage regulation, current regulation, standard table information acquisition and the like into an operation method for the system to call; the method can be compatible with various detection equipment manufacturers, and can be realized in various modes such as compiling according to manufacturer protocol codes, calling of dynamic libraries, calling of communication interfaces and the like;
(3) editing a base function library
The system packages basic logic control and data operation such as delay, data comparison, judgment skip, assignment, operation, binary conversion, connection, substring solving, character processing, time operation, subfunction calling and the like into an operation method for the system to call.
2. Scheme configuration
A scheme builder establishes a test scheme on a scheme configuration interface according to a function item to be tested of equipment to be tested, edits a step name of ammeter operation or any other name, selects the operation type of the step as the equipment to be tested, selects the protocol type of the step as DL/T645, sets the operation method of the step as reading or other operation, sets the operation identifier of the step as communication identifier information maintained in a communication command management module, sets other configurations of the step such as a safety mode, a judgment formula, a step description, a data value, a disqualification reason, a successful skip and a failed skip, and a system can open information for editing according to the operation type. If the operation type of the step is the stage body (equipment), the system matches the relevant configuration of the stage body class, the operation method of the setting step is to read the power of the standard meter, and the other configuration of the setting step is set, such as step description, data value and unqualified reason.
The steps of editing are combined into a test scheme which can be packaged into a subfunction, and the entry parameters, the exit parameters and the parameter descriptions of the function are edited, so that the test scheme can be called when each project scheme is configured.
3. Scheme set configuration
The user combines the configured test schemes into a test scheme set (test set) according to the test process.
4. Project debugging
The method comprises the steps that a user configures information of a phase line, frequency, voltage, current specification, an electric energy constant and the like of a test ammeter, selects a scheme to be debugged, loads a scheme in the system, and after manual clicking is started, the system performs operations of command sending, logic control and the like according to the configured sequence of the steps, process information, abnormal information and communication information are generated in the process, and the user can debug and confirm the problems existing in scheme editing according to the information assistance scheme.
5. Automatic testing
The user selects a test scheme set (consisting of 1 or more schemes), and the system carries out tests according to the scheme set; in the test process, the system sends a control instruction to a device to be tested inspection device (equipment for short), the equipment receives the instruction, and returns an instruction execution result after acting according to the instruction. The system realizes communication with the encryption machine and returns a parameter and a ciphertext by calling the dynamic library of the encryption machine according to the scheme configuration and the specific content configured by the encryption machine, the system generates a communication instruction according to the parameter and the ciphertext and sends the communication instruction to the equipment to be tested, and the equipment to be tested acts according to the instruction content and returns a result after receiving the instruction; according to the step content of the scheme, if the returned data of the equipment to be tested needs to be verified and decrypted, the system communicates the received data with the encryption machine by calling the encryption machine dynamic library and returns a verification and analysis result. According to the scheme configuration content, the system can process the verification analysis result by calling the data operation processing module and display an interface.
6. Test conclusion and report derivation
The system can display and store the test result data, and simultaneously, the test result data can be processed and the report template format can be drawn according to the test report template to generate the test report.
According to the instrument testing method provided by the embodiment of the application, the device attribute information of the device to be tested and the corresponding target testing type are obtained; extracting a target test scheme in a preset test set according to the equipment attribute information and the target test type; controlling the equipment to be tested to feed back corresponding test data based on the target test scheme; and determining the test result of the equipment to be tested according to the test data fed back by the equipment to be tested. According to the method provided by the scheme, the device to be tested is automatically tested, manual intervention of operators is not needed in the testing process, the testing efficiency is improved, and a foundation is laid for improving the safety of the power system. Moreover, the method introduces a software programming idea, combines an ammeter communication protocol, an equipment control interface, a logic control and data operation function, a test flow and the like to form a test scheme, and the formed scheme can be called by other schemes for sub-functions; simulating the operation of the scheme, and giving error prompt and operation results; the scheme can be derived according to a specified format; and the virtual platform body can be generated according to the set parameters, the scheme verification function is realized, the equipment to be tested does not need to be hung on the platform body, and the platform body is generated virtually through software, so that related technical personnel can conveniently test instruments and meters.
The embodiment of the application provides an instrument testing device which is used for executing the instrument testing method provided by the embodiment.
Fig. 5 is a schematic structural diagram of an instrument testing device according to an embodiment of the present disclosure. The instrument testing device 50 includes an acquisition module 501, an extraction module 502, a control module 503, and a determination module 504.
The device comprises an acquisition module, a target test module and a control module, wherein the acquisition module is used for acquiring the device attribute information of the device to be tested and the corresponding target test type; the extraction module is used for extracting a target test scheme in a preset test set according to the equipment attribute information and the target test type; the control module is used for controlling the equipment to be tested to feed back corresponding test data based on the target test scheme; and the determining module is used for determining the test result of the equipment to be tested according to the test data fed back by the equipment to be tested.
Specifically, in one embodiment, the device is applied to an instrument testing system, the system comprises a basic database, at least one testing scheme can be preset according to the basic database, and a testing scheme set is established.
Specifically, in one embodiment, the apparatus further comprises:
the encryption module is used for generating a test instruction; wherein the test instruction corresponds to the target test scheme; encrypting the test instruction by using a preset encryption machine according to the communication standard of the equipment to be tested;
the identity authentication module is used for sending an identity authentication request to the equipment to be tested; and sending a test instruction to the equipment to be tested under the condition that the identity authentication request passes.
The specific manner in which the various modules perform operations has been described in detail in relation to the instrumentation test apparatus of this embodiment in relation to the embodiments of the method and will not be elaborated upon here.
The instrument testing device provided by the embodiment of the application is used for executing the instrument testing method provided by the embodiment, the implementation mode and the principle are the same, and the description is omitted.
The embodiment of the application provides electronic equipment for executing the instrument testing method provided by the embodiment.
Fig. 6 is a schematic structural diagram of an electronic device according to an embodiment of the present application. The electronic device 60 includes: at least one processor 61 and memory 62;
the memory stores computer-executable instructions; the at least one processor executes the computer-executable instructions stored by the memory to cause the at least one processor to perform the instrument testing method provided by the above embodiments.
The electronic device provided by the embodiment of the application is used for executing the instrument testing method provided by the embodiment, the implementation mode and the principle are the same, and the description is omitted.
The embodiment of the application provides a computer-readable storage medium, wherein a computer executing instruction is stored in the computer-readable storage medium, and when a processor executes the computer executing instruction, the instrument testing method provided by any one of the above embodiments is implemented.
The storage medium containing the computer executable instructions of the embodiment of the present application may be used to store the computer executable instructions of the instrument testing method provided in the foregoing embodiment, and an implementation manner and a principle thereof are the same and are not described again.
It is obvious to those skilled in the art that, for convenience and simplicity of description, the foregoing division of the functional modules is merely used as an example, and in practical applications, the above function distribution may be performed by different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules to perform all or part of the above described functions. For the specific working process of the device described above, reference may be made to the corresponding process in the foregoing method embodiment, which is not described herein again.
Finally, it should be noted that: the above embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present application.
Claims (10)
1. An instrument testing method is applied to an instrument testing system, the system comprises a basic database, at least one testing scheme can be preset according to the basic database, and a testing set is established, and the method is characterized by comprising the following steps:
acquiring equipment attribute information of equipment to be tested and a corresponding target test type;
extracting a target test scheme in a preset test set according to the equipment attribute information and the target test type;
controlling the equipment to be tested to feed back corresponding test data based on the target test scheme;
and determining the test result of the equipment to be tested according to the test data fed back by the equipment to be tested.
2. The instrument testing method of claim 1, wherein when the target testing type is an anti-attack test, the controlling the device under test to feed back corresponding test data based on the target testing scheme includes:
sending an attack instruction to the equipment to be tested according to a preset attack period;
and when the sending times of the attack instruction reach a preset threshold value, acquiring the current data of the equipment to be tested.
3. The method as claimed in claim 2, wherein the determining the test result of the device under test according to the test data fed back by the device under test comprises:
judging whether the current data of the equipment to be tested is the same as the original data of the equipment to be tested;
and when the current data of the equipment to be tested is the same as the original data, determining that the test result of the equipment to be tested is normal.
4. The instrument testing method of claim 1, wherein when the target testing type is error testing, the controlling the device under test to feed back corresponding testing data based on the target testing scheme comprises:
and sending an equipment time reading instruction to the equipment to be tested so as to control the equipment to be tested to feed back the current equipment time.
5. The method as claimed in claim 4, wherein the determining the test result of the device under test according to the test data fed back by the device under test comprises:
judging whether the time difference between the current equipment time and the current system time exceeds a preset time difference threshold value or not;
and when the time difference between the current equipment time and the current system time exceeds the time difference threshold value, determining that the test result of the equipment to be tested is abnormal.
6. The instrument testing method of claim 1, wherein prior to controlling the device under test to feed back corresponding test data based on the target test scenario, the method further comprises:
generating a test instruction; wherein the test instruction corresponds to the target test scenario;
and encrypting the test instruction by using a preset encryption machine according to the communication standard of the equipment to be tested.
7. The instrument testing method of claim 6, further comprising:
sending an identity authentication request to the equipment to be tested;
and sending a test instruction to the equipment to be tested under the condition that the identity authentication request passes.
8. An instrument testing device, comprising:
the acquisition module is used for acquiring the equipment attribute information of the equipment to be tested and the corresponding target test type;
the extraction module is used for extracting a target test scheme in a preset test set according to the equipment attribute information and the target test type;
the control module is used for controlling the equipment to be tested to feed back corresponding test data based on the target test scheme;
and the determining module is used for determining the test result of the equipment to be tested according to the test data fed back by the equipment to be tested.
9. The instrument testing device of claim 8, wherein the device is applied to an instrument testing system, the system comprises a base database, at least one test scenario can be preset according to the base database, and a test scenario set is established.
10. The instrument testing device of claim 8, further comprising:
the encryption module is used for generating a test instruction; wherein the test instruction corresponds to the target test scenario; encrypting the test instruction by using a preset encryption machine according to the communication standard of the equipment to be tested;
the identity authentication module is used for sending an identity authentication request to the equipment to be tested; and sending a test instruction to the equipment to be tested under the condition that the identity authentication request passes.
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