CN106950442B - Pin test method and device - Google Patents
Pin test method and device Download PDFInfo
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- CN106950442B CN106950442B CN201710087155.7A CN201710087155A CN106950442B CN 106950442 B CN106950442 B CN 106950442B CN 201710087155 A CN201710087155 A CN 201710087155A CN 106950442 B CN106950442 B CN 106950442B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Abstract
The present invention relates to a kind of pin test method and devices, which comprises when the first stage of the secondary boot load in system starting process, inquiry meets the pin to be measured of test condition；Obtain the pin mark of the pin to be measured inquired；Test trigger notice is generated according to the pin mark got；The test trigger notice is sent to the electronic equipment connected by data line by data line interface；Receive the pin test instruction that the electronic equipment is generated according to the test trigger notice；Pin to be measured is tested according to pin test instruction, obtains pin test results.Pin test method provided by the invention and device, entire test process start completely without waiting for system, save the system starting spent time, save the testing time of pin.
Description
Technical field
The present invention relates to production test technical fields, more particularly to a kind of pin test method and device.
Background technique
With the development of internet technology, more and more users connect internet by mobile terminal, to obtain
Resource in internet.With the growth of the number of users of mobile terminal, the production quantity of mobile terminal also gradually increases.
At present in the production process of mobile terminal, need to test the pin in mobile terminal.And traditional survey
During examination, it is required to after the system of mobile terminal starts completely, pin could be tested, the system of mobile terminal opens
It is dynamic to need to expend certain time, so that the time spent by the pin of test mobile terminal is longer, lead to pin testing efficiency more
Lowly.
Summary of the invention
Based on this, it is necessary to for the low problem of pin testing efficiency, provide a kind of pin test method and device.
A kind of pin test method, which comprises
When the first stage of the secondary boot load in system starting process, inquiry meets the to be measured of test condition
Pin；
Obtain the pin mark of the pin to be measured inquired；
Test trigger notice is generated according to the pin mark got；
The test trigger notice is sent to the electronic equipment connected by data line by data line interface；
Receive the pin test instruction that the electronic equipment is generated according to the test trigger notice；
Pin to be measured is tested according to pin test instruction, obtains pin test results.
The first stage that the secondary boot when in system starting process loads in one of the embodiments,
When, inquiry meets before the pin to be measured of test condition, further includes:
Detection data line interface is inputted with the presence or absence of electric signal；
Detecting that data line interface there are when electric signal input, triggers enabled instruction；
According to the enabled instruction bootload program.
The pin mark that the basis is got in one of the embodiments, generates test trigger notice, comprising:
The current level state of the pin to be measured inquired described in acquisition；
Test trigger notice is generated according to the pin mark got and the current level state got.
It is described in one of the embodiments, that pin to be measured is tested according to pin test instruction, comprising:
Extract the test authorization message and pin mark in the pin test instruction；
The test authorization message extracted is verified；
After being verified, the to be measured pin corresponding to the pin mark extracted is tested.
It is described in one of the embodiments, that pin to be measured is tested according to pin test instruction, drawn
Foot test result, comprising:
Extract the expectation level state in pin test instruction；
Obtain the test level state and tested pin total quantity of tested pin；
The expectation level state and the test level state are compared, determine normal pins quantity；
Pin natural rate of interest is obtained according to the tested pin total quantity and the normal pins quantity determined.
The test method of above-mentioned mobile terminal, when the first stage of the secondary boot load in system starting process
When, the pin mark for meeting the pin to be measured of test condition is obtained, test trigger notice is generated according to the pin mark got,
Test trigger notice is sent to electronic equipment, so that electronic equipment generates pin test instruction, receives what electronic equipment was sent
Pin test instruction is tested to obtain test result according to pin test instruction to pin to be measured.In this way, entire test process
Start completely without waiting for system, saves the system starting spent time, save the testing time of pin.Meanwhile
When the first stage of the secondary boot load in system starting process, all pins can be tested, avoid and starting
The case where part pin can only being tested due to permission limitation in the process, to substantially increase the testing efficiency of pin.
A kind of pin test device, described device include:
Pin enquiry module, for inquiring when the first stage of the secondary boot load in system starting process
Meet the pin to be measured of test condition；
Identifier acquisition module, the pin for obtaining the pin to be measured inquired identify；
Trigger module is tested, for generating test trigger notice according to the pin mark got；
It notifies sending module, is connected for being sent to the test trigger notice by data line interface by data line
Electronic equipment；
Directive generation module refers to for receiving the electronic equipment according to the pin test that the test trigger notice generates
It enables；
Pin test module obtains pin test for testing according to pin test instruction pin to be measured
As a result.
Described device in one of the embodiments, further include:
Electrical signal detection module is inputted for detection data line interface with the presence or absence of electric signal；
Enabled instruction trigger module, for detecting that data line interface there are when electric signal input, triggers enabled instruction；
Os starting module, for according to the enabled instruction bootload program.
The test trigger module is also used to obtain working as the pin to be measured inquired in one of the embodiments,
Preceding level state；Test trigger notice is generated according to the pin mark got and the current level state got.
The pin test module includes: in one of the embodiments,
Authorization message extraction module, for extracting test authorization message and pin mark in the pin test instruction；
Authorization message authentication module, for being verified to the test authorization message extracted；
Pin test module to be measured, for identifying corresponding pin to be measured to the pin extracted after being verified
It is tested.
The pin test module includes: in one of the embodiments,
Level state extraction module, for extracting the expectation level state in pin test instruction；
Pin number obtains module, for obtaining the test level state and tested pin total quantity of tested pin；
Level state comparison module, for the expectation level state and the test level state to be compared, really
Determine normal pins quantity；
Test result determining module, for being drawn according to the tested pin total quantity and the normal pins quantity determined
Foot natural rate of interest.
The test device of above-mentioned mobile terminal, when the first stage of the secondary boot load in system starting process
When, the pin mark for meeting the pin to be measured of test condition is obtained, test trigger notice is generated according to the pin mark got,
Test trigger notice is sent to electronic equipment, so that electronic equipment generates pin test instruction, receives what electronic equipment was sent
Pin test instruction is tested to obtain test result according to pin test instruction to pin to be measured.In this way, entire test process
Start completely without waiting for system, saves the system starting spent time, save the testing time of pin.Meanwhile
When the first stage of the secondary boot load in system starting process, all pins can be tested, avoid and starting
The case where part pin can only being tested due to permission limitation in the process, to substantially increase the testing efficiency of pin.
Detailed description of the invention
Fig. 1 is the applied environment figure of pin test method in one embodiment；
Fig. 2 is the structural block diagram of the mobile terminal in one embodiment in pin test macro；
Fig. 3 is the flow diagram of pin test method in one embodiment；
The flow diagram for the step of Fig. 4 is bootload program in one embodiment；
The flow diagram for the step of Fig. 5 is validation test authorization message in one embodiment；
Fig. 6 is flow diagram the step of obtaining pin natural rate of interest in one embodiment；
Fig. 7 is the structural block diagram of pin test device in one embodiment；
Fig. 8 is the structural block diagram of pin test device in another embodiment；
Fig. 9 is the structural block diagram of pin test module in one embodiment；
Figure 10 is the structural block diagram of pin test module in another embodiment.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right
The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and
It is not used in the restriction present invention.
Fig. 1 is the applied environment figure of pin test method in one embodiment.Referring to Fig.1, the pin test method application
In pin test macro.Pin test macro includes mobile terminal 110 and electronic equipment 120, and wherein mobile terminal 110 passes through number
It is connect according to line 130 with electronic equipment 120.Mobile terminal 110 specifically can be tablet computer, smart phone, personal digital assistant
With digital magazine at least one.Wherein, electronic equipment 120 is for testing the pin in mobile terminal 110, electronics
The serial line interface of equipment 120 connects data line 130, and the data line interface of mobile terminal 110 is connected to by data line 130.Electricity
Sub- equipment 120 specifically can be test terminal.
Fig. 2 is the schematic diagram of internal structure of the mobile terminal 110 in one embodiment in Fig. 1 pin test macro.Such as Fig. 2
Shown, which includes processor, the non-volatile memory medium, built-in storage sum number connected by system bus
According to line interface.Wherein, the non-volatile memory medium of mobile terminal 120 is stored with operating system, further includes a kind of pin test
Device, the pin test device is for realizing a kind of pin test method.Processor is for providing calculating and control ability, support
The operation of entire mobile terminal 110, the built-in storage in mobile terminal 110 are that the pin in non-volatile memory medium tests dress
The operation set provides environment, can be stored with computer-readable instruction in the built-in storage, the computer-readable instruction is by processor
When execution, processor may make to execute a kind of pin test method.Data line interface is used to pass through data line 130 and electronic equipment
120 carry out data transmission.
As shown in figure 3, in one embodiment, providing a kind of pin test method, the present embodiment is applied in this way
Mobile terminal 110 in Fig. 1 pin test macro comes for example, this method specifically includes the following contents:
S302, when the first stage of the secondary boot load in system starting process, inquiry meets test condition
Pin to be measured.
Specifically, needing to load Bootloader program, Bootloader in the system starting process of mobile terminal 110
Program is several Duan Chengxu of load operating when system just starts, and the program of load specifically includes at least PBL (Prime
Bootloader, primary boot loader), SBL1 (Second Bootloader stage 1, secondary boot load the first rank
Duan Chengxu) and LKBL (Little Kernel Bootloader, small boot kernel loading procedure), in system starting, first plus
PBL program is carried, SBL1 program is reloaded, reloads LKBL later.Wherein, load LKBL is for starting Android operation system.?
When loading SBL program, SBL1 program is first loaded, LKBL program is reloaded.In the system starting process of mobile terminal 110, add
Whether the first stage loaded when carrying SBL1 program for secondary boot, the current level state for detecting pin meet test condition,
If meeting, which is the pin to be measured for meeting test condition.In the first stage of secondary boot load, RPM (resource electricity
Source control, Resource Power Manager), QSEE (high pass safety management environment, Qualcomm Secure
Execution Environment) and TZ (safe trust region, TrustZone) it is inactive, each pin can be surveyed
Examination, if RPM, QSEE or TZ start, RPM, QSEE or TZ are managed part pin, then cannot survey to each pin
Examination, can only test to part pin.
In one embodiment, pin mark and expectation level shape corresponding with pin mark are store in mobile terminal 110
State.During the system startup process, detection pin identifies the current level state of corresponding pin to mobile terminal 110, by pin mark
Know corresponding current level state and desired level state is compared, if the current level state of pin and desired level state
Unanimously, then it represents that the pin is the pin to be measured for meeting test condition.
S304 obtains the pin mark of the pin to be measured inquired.
Specifically, mobile terminal 110 obtains the pin of pin to be measured after inquiring and meeting the pin to be measured of test condition
Mark.Pin mark is used for unique identification pin, and pin mark can be in pin numbering, pin name and terminal iidentification extremely
Few one kind.
S306 generates test trigger notice according to the pin mark got.
Specifically, the pin mark for the pin to be measured that mobile terminal 110 will acquire is packaged, and is generated and is surveyed by encapsulation
Try trigger notice.Test trigger notice is used for the pin to be measured that electronic device 120 can be tested, and tests trigger notice
In carry pin to be measured pin mark.
In one embodiment, S306 is specific further include: obtains the current level state of the pin to be measured inquired；According to
The pin mark got and the current level state got generate test trigger notice.
Specifically, mobile terminal 110 obtains the current level state of the pin to be measured inquired.Wherein, pin to be tested
Current level state specifically can be high level or low level.Mobile terminal 110 is according to the current level state of pin to be measured
Test trigger notice is generated with the pin mark of pin to be measured.
S308 is sent to the electronic equipment connected by data line for trigger notice is tested by data line interface.
Specifically, the data line interface of mobile terminal 110 is connected with data line 130, the other end and electronics of data line 130
Equipment 120 connects.Test trigger notice is sent to by mobile terminal 110 after generating test trigger notice by data line 130
Electronic equipment 120.
S310 receives electronic equipment according to the pin that test trigger notice generates and tests instruction.
Specifically, electronic equipment 120 by data line 130 receive test trigger notice after, to test trigger notice into
Row parsing is extracted the pin in test trigger notice by parsing and is identified.Electronic equipment 120 is identified according to pin generates pin survey
Examination instruction.Pin test instruction is to identify the instruction that corresponding pin to be measured is tested to pin.Electronic equipment 120 passes through number
Pin test instruction is sent to mobile terminal 110 according to line 130, to test the pin to be measured in mobile terminal 110.
In one embodiment, after electronic equipment 120 receives test trigger notice, drawing in test trigger notice is extracted
Footnote knows and the current level state of pin to be measured, and the level of pin to be tested is generated according to the current level state of pin to be measured
Regulation and controlling of information generates pin test instruction according to the level regulation and controlling of information of the pin mark and pin to be measured extracted.It illustrates
Bright, if the current level state of pin to be measured is high level, the level regulation and controlling of information of pin to be measured is the letter that level drags down
Breath；If the current level state of pin to be measured is low level, the level regulation and controlling of information of pin to be measured is the letter that level is drawn high
Breath.
S312 tests pin to be measured according to pin test instruction, obtains pin test results.
Specifically, after mobile terminal 110 is instructed by the pin test that data line 130 receives the production of electronic equipment 120,
Pin test instruction is parsed, the pin mark in pin test instruction is extracted.Mobile terminal 110 identifies pin and corresponds to
Pin to be measured tested, specifically can be and the level of pin to be measured drawn high or dragged down test.
In the present embodiment, when the first stage of the secondary boot load in system starting process, acquisition meets survey
The pin of the pin to be measured of strip part identifies, and generates test trigger notice according to the pin mark got, and test triggering is logical
Know and be sent to electronic equipment, so that electronic equipment generates pin test instruction, receives the pin that electronic equipment is sent and test instruction,
Pin to be measured is tested to obtain test result according to pin test instruction.In this way, entire test process is without waiting for system
Starting completely saves the system starting spent time, saves the testing time of pin.Meanwhile in system starting process
In secondary boot load first stage when, all pins can be tested, avoid during startup due to power
The case where limit limitation can only test part pin, to substantially increase the testing efficiency of pin.
In one embodiment, further include the steps that bootload program before S302, which specifically includes in following
Hold:
S402, detection data line interface are inputted with the presence or absence of electric signal.
Specifically, the data line interface access of mobile terminal 110 has data line 130, when the other end of data line 130 accesses
After electronic equipment 120, when electronic equipment 120 is in the open state, electronic equipment 120 can be by data line 130 to mobile terminal
110 input electrical signals.
S404 is detecting that data line interface there are when electric signal input, triggers enabled instruction.
S406, according to enabled instruction bootload program.
Specifically, mobile terminal 110 then triggers enabled instruction when detecting that data line interface has electric signal input.It opens
The dynamic instruction instructed for starting the operating system of mobile terminal.Mobile terminal 110 is according to the enabled instruction bootload of triggering
Program.Mobile terminal 110 is after boot program loads success, into operating system.
In one embodiment, mobile terminal 110 is then terminated when the electric signal for detecting data line interface terminates input
Starting stops bootload program.
In the present embodiment, detecting that data-interface there are when electric signal input, triggers enabled instruction, directly according to starting
Bootload program is instructed, additional input enabled instruction is not necessarily to, simplifies operation, save the time spent by tedious steps,
Improve the loading velocity of bootstrap.
As shown in figure 5, in one embodiment, the step of S312 specifically includes validation test authorization message, step tool
Body includes the following contents:
S502 extracts test authorization message and pin mark in pin test instruction.
It specifically, include test authorization message and pin mark in the pin generated of electronic equipment 120 test instruction.It moves
Dynamic terminal 110 parses pin test instruction, extracts after receiving the pin test instruction of the transmission of electronic equipment 120
Test authorization message and pin mark in pin test instruction.Test authorization message specifically starts production firm's information, key
At least one of with password.
S504 verifies the test authorization message extracted.
Specifically, also store test authorization message in mobile terminal 110, by the test authorization message being locally stored with mention
The test authorization message got is compared, if unanimously, being verified；If inconsistent, verify and do not pass through.
S506, after being verified, the to be measured pin corresponding to the pin mark extracted is tested.
Specifically, mobile terminal 110 is corresponding to the pin mark extracted after being verified to test authorization message
Pin progress level to be measured is drawn high or level drags down test, obtains the test result of pin to be measured.
In the present embodiment, by being verified to the test authorization message in pin test instruction, after being verified, according to
Pin to be measured is tested in pin test instruction, improves the Security of test in test process.
As shown in fig. 6, in one embodiment, S312 specifically includes the step of obtaining pin natural rate of interest, and the step is specific
Including the following contents:
S602 extracts the expectation level state in pin test instruction.
Specifically, mobile terminal 110 extract pin test instruction in expectation level state, it is expected that level state be
In test process, it is expected that level state locating for pin to be measured.
S604 obtains the test level state and tested pin total quantity of tested pin.
Specifically, mobile terminal 110 counts the test level state and tested pin total quantity of each tested pin, test electricity
Level state is mobile terminal 110 in the level state for executing the tested pin measured when pin test instruction.
S606, it would be desirable to which level state and test level state are compared, and determine normal pins quantity.
Specifically, mobile terminal 110 compares the expectation level state of the same tested pin and test level state
Compared with if the expectation level state and test level state consistency of tested pin, which is normal pins, if tested draw
The expectation level state and test level state of foot are inconsistent, then the tested pin is improper pin.Mobile terminal 110 counts
The data of normal pins obtain normal pins quantity.
S608 obtains pin natural rate of interest according to tested pin total quantity and the normal pins quantity determined.
Specifically, after statistics is obtained tested pin total quantity and normal pins quantity by mobile terminal 110, just by statistics
Normal pin number obtains pin natural rate of interest divided by tested pin total quantity.Mobile terminal 110 obtains pin according to pin natural rate of interest
Test result can also include that the pin of improper pin identifies in pin test results.
In the present embodiment, determined according to the survey level state of expectation level state and tested pin in pin test instruction
Normal pins data accurately obtain pin natural rate of interest according to normal pins quantity and tested pin total quantity, improve pin survey
The accuracy of test result.
In one embodiment, electronic equipment 120 is connected by the data line that serial line interface accesses with mobile terminal, is moved
During startup, when the first stage in secondary boot load, that is, when recording SBL1 program, inquiry meets survey to dynamic terminal
The pin to be measured of strip part, test condition are that detection current level state meets the normal level shape of pin under normal circumstances
State.After mobile terminal enquiry to the pin to be measured for meeting test condition, the pin mark of the pin to be measured inquired is obtained.It is mobile
Terminal identifies according to pin and generates test trigger notice with the current level state that pin identifies corresponding pin to be measured, will survey
It tries trigger notice and electronic equipment 120 is sent to by data line.
Electronic equipment 120 extracts pin mark in test trigger notice and current when receiving test trigger notice
Level state generates level regulation and controlling of information and desired level state according to current level state.For example, if current level shape
When state is low, the level regulation and controlling of information of generation is drawn high for level, it is expected that level state is high level；If current level state is low
When, the level regulation and controlling of information of generation drags down for level, it is expected that level state is low level.Electronic equipment 120 according to pin identify,
Level regulation and controlling of information and desired level state generate pin test instruction.Pin test instruction is passed through data by electronic equipment 120
Line is sent to mobile terminal.
Mobile terminal extracts pin mark, level regulation and controlling of information and expectation level state in pin test instruction, according to
The level that level regulation and controlling of information identifies corresponding pin to be measured to pin regulates and controls, the test level state after being regulated.
If test level state is consistent with desired level state, it is normal pins which, which identifies corresponding tested pin,；If test
Level state and desired level state are inconsistent, then it is improper pin that the pin, which identifies corresponding tested pin,.Test result
Including pin mark and whether be normal pins information, test result is sent to electronic equipment by data line by mobile terminal
120.Electronic equipment 120 shows test result.
As shown in fig. 7, in one embodiment, providing a kind of pin test device 700, which is specifically included: pin
Enquiry module 702, identifier acquisition module 704, test trigger module 706, notice sending module 708,710 and of directive generation module
Pin test module 712.
Pin enquiry module 702, for looking into when the first stage of the secondary boot load in system starting process
Ask the pin to be measured for meeting test condition.
Identifier acquisition module 704, the pin for obtaining the pin to be measured inquired identify.
Trigger module 706 is tested, for generating test trigger notice according to the pin mark got.
It notifies sending module 708, is connected for being sent to test trigger notice by data line interface by data line
Electronic equipment.
Directive generation module 710, the pin test instruction generated for receiving electronic equipment according to test trigger notice.
Pin test module 712 obtains pin test knot for testing according to pin test instruction pin to be measured
Fruit.
In one embodiment, test trigger module 706 is also used to obtain the current level shape of the pin to be measured inquired
State；Test trigger notice is generated according to the pin mark got and the current level state got.
In the present embodiment, when the first stage of the secondary boot load in system starting process, acquisition meets survey
The pin of the pin to be measured of strip part identifies, and generates test trigger notice according to the pin mark got, and test triggering is logical
Know and be sent to electronic equipment, so that electronic equipment generates pin test instruction, receives the pin that electronic equipment is sent and test instruction,
Pin to be measured is tested to obtain test result according to pin test instruction.In this way, entire test process is without waiting for system
Starting completely saves the system starting spent time, saves the testing time of pin.Meanwhile in system starting process
In secondary boot load first stage when, all pins can be tested, avoid during startup due to power
The case where limit limitation can only test part pin, to substantially increase the testing efficiency of pin.
As shown in figure 8, in one embodiment, pin test device 700 is specific further include: electrical signal detection module 714,
Enabled instruction trigger module 716 and os starting module 718.
Electrical signal detection module 714 is inputted for detection data line interface with the presence or absence of electric signal.
Enabled instruction trigger module 716, for detecting data line interface there are when electric signal input, triggering starting refers to
It enables.
Os starting module 718, for according to enabled instruction bootload program.
In the present embodiment, detecting that data-interface there are when electric signal input, triggers enabled instruction, directly according to starting
Bootload program is instructed, additional input enabled instruction is not necessarily to, simplifies operation, save the time spent by tedious steps,
Improve the loading velocity of bootstrap.
As shown in figure 9, in one embodiment, pin test module 712 specifically includes: authorization message extraction module
712a, authorization message authentication module 712b and pin test module 712c to be measured.
Authorization message extraction module 712a, for extracting test authorization message and pin mark in pin test instruction.
Authorization message authentication module 712b, for being verified to the test authorization message extracted.
Pin test module 712c to be measured, for after being verified, corresponding to the pin mark extracted to be to be measured
Pin is tested.
In the present embodiment, by being verified to the test authorization message in pin test instruction, after being verified, according to
Pin to be measured is tested in pin test instruction, improves the Security of test in test process.
As shown in Figure 10, in one embodiment, pin test module 712 is specific further include: level state extraction module
712d, pin number obtain module 712e, level state comparison module 712f and test result determining module 712g.
Level state extraction module 712d, for extracting the expectation level state in pin test instruction.
Pin number obtains module 712e, for obtaining the test level state and tested pin total quantity of tested pin.
Level state comparison module 712f is determined just for that will it is expected that level state and test level state are compared
Normal pin number.
Test result determining module 712g, for being drawn according to the normal pins quantity for being tested pin total quantity and determining
Foot natural rate of interest.
In the present embodiment, determined according to the survey level state of expectation level state and tested pin in pin test instruction
Normal pins data accurately obtain pin natural rate of interest according to normal pins quantity and tested pin total quantity, improve pin survey
The accuracy of test result.
Those of ordinary skill in the art will appreciate that realizing all or part of the process in above-described embodiment method, being can be with
Relevant hardware is instructed to complete by computer program, which can be stored in a computer-readable storage and be situated between
In matter, the program is when being executed, it may include such as the process of the embodiment of above-mentioned each method.Wherein, storage medium above-mentioned can be
The non-volatile memory mediums such as magnetic disk, CD, read-only memory (Read-Only Memory, ROM) or random storage note
Recall body (Random Access Memory, RAM) etc..
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, all should be considered as described in this specification.
The embodiments described above only express several embodiments of the present invention, and the description thereof is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to protection of the invention
Range.Therefore, the scope of protection of the patent of the invention shall be subject to the appended claims.
Claims (12)
1. a kind of pin test method, which comprises
When the first stage of the secondary boot load in system starting process, the current level state of pin is detected；
When the current level state reaches desired level state, determine that the pin is pin to be measured；
Obtain the pin mark of the pin to be measured；
Test trigger notice is generated according to the pin mark got；
The test trigger notice is sent to the electronic equipment connected by data line by data line interface；
Receive the pin test instruction that the electronic equipment is generated according to the test trigger notice；The pin test instruction packet
Include test authorization message；
Test authorization message in pin test instruction is verified；
After being verified, determine that the pin of the pin to be measured is normal according to the expectation level state of pin test instruction
Rate obtains pin test results according to the pin natural rate of interest.
2. the method according to claim 1, wherein the secondary boot when in system starting process adds
When the first stage of load, inquiry meets before the pin to be measured of test condition, further includes:
Detection data line interface is inputted with the presence or absence of electric signal；
Detecting that data line interface there are when electric signal input, triggers enabled instruction；
According to the enabled instruction bootload program.
3. the method according to claim 1, wherein the pin mark that the basis is got generates test triggering
Notice, comprising:
The current level state of the pin to be measured inquired described in acquisition；
Test trigger notice is generated according to the pin mark got and the current level state got.
4. the method according to claim 1, wherein it is described according to the pin test instruction to pin to be measured into
Row test, comprising:
Extract the test authorization message and pin mark in the pin test instruction；
The test authorization message extracted is verified；
After being verified, the to be measured pin corresponding to the pin mark extracted is tested.
5. the method according to claim 1, wherein it is described according to the pin test instruction to pin to be measured into
Row test, obtains pin test results, comprising:
Extract the expectation level state in pin test instruction；
Obtain the test level state and tested pin total quantity of tested pin；
The expectation level state and the test level state are compared, determine normal pins quantity；
Pin natural rate of interest is obtained according to the tested pin total quantity and the normal pins quantity determined.
6. a kind of pin test device, which is characterized in that described device includes:
Pin enquiry module, for detecting pin when the first stage of the secondary boot load in system starting process
Current level state；When the current level state reaches desired level state, determine that the pin is pin to be measured；
Identifier acquisition module, the pin for obtaining the pin to be measured identify；
Trigger module is tested, for generating test trigger notice according to the pin mark got；
Sending module is notified, for the test trigger notice to be sent to the electricity connected by data line by data line interface
Sub- equipment；
Directive generation module, the pin test instruction generated for receiving the electronic equipment according to the test trigger notice；
The pin test instruction includes test authorization message；
Pin test module, for being verified to the test authorization message in pin test instruction；After being verified, root
The pin natural rate of interest of the pin to be measured is determined according to the expectation level state of pin test instruction, it is normal according to the pin
Rate obtains pin test results.
7. device according to claim 6, which is characterized in that described device further include:
Electrical signal detection module is inputted for detection data line interface with the presence or absence of electric signal；
Enabled instruction trigger module, for detecting that data line interface there are when electric signal input, triggers enabled instruction；
Os starting module, for according to the enabled instruction bootload program.
8. device according to claim 6, which is characterized in that the test trigger module is also used to obtain described inquire
Pin to be measured current level state；It is generated and is surveyed according to the pin mark got and the current level state got
Try trigger notice.
9. device according to claim 6, which is characterized in that the pin test module includes:
Authorization message extraction module, for extracting test authorization message and pin mark in the pin test instruction；
Authorization message authentication module, for being verified to the test authorization message extracted；
Pin test module to be measured, for after being verified, the to be measured pin corresponding to the pin mark extracted to be carried out
Test.
10. device according to claim 6, which is characterized in that the pin test module includes:
Level state extraction module, for extracting the expectation level state in pin test instruction；
Pin number obtains module, for obtaining the test level state and tested pin total quantity of tested pin；
Level state comparison module determines just for the expectation level state and the test level state to be compared
Normal pin number；
Test result determining module, for obtaining pin just according to the tested pin total quantity and the normal pins quantity determined
Normal rate.
11. a kind of computer equipment, including memory and processor, the memory are stored with computer program, feature exists
In the step of processor realizes any one of claims 1 to 5 the method when executing the computer program.
12. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the computer program
The step of method described in any one of claims 1 to 5 is realized when being executed by processor.
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| CN111398701B (en) * | 2019-01-02 | 2022-07-22 | 深圳市广和通无线股份有限公司 | Equipment test method, device, computer equipment and storage medium |
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