CN113270336A - Method and system for testing positive silver of SE-PERC battery - Google Patents
Method and system for testing positive silver of SE-PERC battery Download PDFInfo
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- 238000012360 testing method Methods 0.000 title claims abstract description 182
- 229910052709 silver Inorganic materials 0.000 title claims abstract description 41
- 239000004332 silver Substances 0.000 title claims abstract description 41
- 238000000034 method Methods 0.000 title claims abstract description 40
- 229910052751 metal Inorganic materials 0.000 claims abstract description 167
- 239000002184 metal Substances 0.000 claims abstract description 167
- 239000002131 composite material Substances 0.000 claims abstract description 130
- 238000005215 recombination Methods 0.000 claims abstract description 36
- 230000006798 recombination Effects 0.000 claims abstract description 36
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 39
- 238000005245 sintering Methods 0.000 claims description 31
- 239000002002 slurry Substances 0.000 claims description 23
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 15
- 229910052710 silicon Inorganic materials 0.000 claims description 15
- 239000010703 silicon Substances 0.000 claims description 15
- 239000000758 substrate Substances 0.000 claims description 14
- 101001073212 Arabidopsis thaliana Peroxidase 33 Proteins 0.000 claims description 7
- 101001123325 Homo sapiens Peroxisome proliferator-activated receptor gamma coactivator 1-beta Proteins 0.000 claims description 7
- 102100028961 Peroxisome proliferator-activated receptor gamma coactivator 1-beta Human genes 0.000 claims description 7
- 238000005520 cutting process Methods 0.000 claims description 3
- 230000006698 induction Effects 0.000 abstract description 48
- 238000010998 test method Methods 0.000 abstract description 2
- 230000008569 process Effects 0.000 description 10
- 238000007639 printing Methods 0.000 description 9
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- 238000013461 design Methods 0.000 description 4
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- 238000005259 measurement Methods 0.000 description 3
- 238000005457 optimization Methods 0.000 description 3
- 238000005424 photoluminescence Methods 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- CMWTZPSULFXXJA-VIFPVBQESA-N naproxen Chemical compound C1=C([C@H](C)C(O)=O)C=CC2=CC(OC)=CC=C21 CMWTZPSULFXXJA-VIFPVBQESA-N 0.000 description 2
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Abstract
The application is suitable for the technical field of solar cells, and provides a method and a system for testing positive silver of an SE-PERC cell. The test method comprises the following steps: dividing the front surface of a battery piece to be tested into a plurality of regions, wherein the plurality of regions comprise a first battery region and a plurality of second battery regions, the first battery region is a region without grid lines, the second battery region is a region with grid lines, and the grid lines of the plurality of second battery regions are different in width; respectively testing the dark saturation current densities of the first battery area and the plurality of second battery areas to obtain a first test value and a plurality of second test values; and determining a metal induction composite value in an SE region and a metal induction composite value in a non-SE region of the battery piece to be tested according to the first test value and the plurality of second test values. Thus, the test of the metal-induced recombination value of the positive silver of the SE-PERC battery is realized.
Description
Technical Field
The application belongs to the technical field of solar cells, and particularly relates to a method and a system for testing positive silver of an SE-PERC cell.
Background
The related art mainly performs metal-induced composite tests on TOPCon batteries or SE-free PERC batteries. However, the SE area is generally smaller than 120um, and the gate lines with the gradually changing line width having a sufficiently large difference in line width cannot be arranged in the SE area, and the metal-induced composite test for SE cannot be performed with reference to the pattern design and test method of TOPCon or the SE-free PERC. Therefore, how to test the metal-induced recombination value of the positive silver of the SE-PERC battery becomes a problem to be solved urgently.
Disclosure of Invention
The application provides a method and a system for testing positive silver of an SE-PERC battery, and aims to solve the problem of how to test the metal induced recombination value of the positive silver of the SE-PERC battery.
In a first aspect, the application provides a method for testing positive silver of a SE-PERC battery, comprising:
dividing the front surface of a battery piece to be tested into a plurality of regions, wherein the plurality of regions comprise a first battery region and a plurality of second battery regions, the first battery region is a region without grid lines, the second battery region is a region with grid lines, and the grid lines of the plurality of second battery regions are different in width;
respectively testing the dark saturation current densities of the first battery area and the plurality of second battery areas to obtain a first test value and a plurality of second test values;
and determining a metal induced composite value in an SE region and a metal induced composite value in a non-SE region of the battery piece to be tested according to the first test value and the plurality of second test values.
Optionally, determining a SE region metal-induced composite value and a non-SE region metal-induced composite value of the battery piece to be tested according to the first test value and the plurality of second test values includes:
determining the non-SE region metal induced composite value according to the first test value and a plurality of second test values;
and determining the SE region metal-induced composite value according to the non-SE region metal-induced composite value, the first test value and the plurality of second test values.
Optionally, determining the non-SE region metal-induced composite value according to the first test value and a plurality of the second test values comprises:
fitting a curve according to a plurality of said second test values;
determining a slope of the curve;
and determining the metal-induced composite value of the non-SE region according to the slope of the curve and the first test value.
Optionally, in the step of determining the non-SE region metal-induced composite value according to the slope of the curve and the first test value, the following formula is adopted:
J0,m＝k+J0,e；
wherein, J0,mIs the metal induced recombination value of the non-SE region, k is the slope of the curve, J0,eIs the first test value.
Optionally, determining the SE region metal-induced composite value according to the non-SE region metal-induced composite value, the first test value, and a plurality of the second test values includes:
determining an intercept of the curve;
acquiring the dark saturation current density of the silicon substrate and the back dark saturation current density;
acquiring the ratio of the area of the SE region of the PERC battery to the total area;
and determining the SE region metal induced composite value according to the intercept, the first test value, the silicon substrate dark saturation current density, the back surface dark saturation current density, the ratio and the non-SE region metal induced composite value.
Optionally, in the step of determining the SE region metal-induced composite value according to the intercept, the first test value, the silicon substrate dark saturation current density, the back side dark saturation current density, the ratio, and the non-SE region metal-induced composite value, the following formula is adopted:
J0,SE,m＝(d-J0,e-J0,bulk-J0,rear)/FSE+J0,m；
wherein, J0,SE,mFor the metal induced recombination value in the SE region, d is the intercept of the curve, J0,eIs the first test value, J0,bulkIs the dark saturation current density of the silicon substrate, J0,rearIs the back side dark saturation current density, FSEIs the ratio, J0,mAnd (4) the non-SE region metal induced recombination value.
Optionally, the cell to be tested includes a third cell region, and the testing method includes:
cutting the third battery area to obtain a plurality of battery strips;
and measuring the contact resistance of each battery strip to obtain a contact resistance value.
Optionally, the battery pieces to be tested include multiple groups, each group of battery pieces to be tested adopts a corresponding paste printed circuit, the sintering temperatures of the multiple groups of battery pieces to be tested are the same current sintering temperature, and the testing method includes:
determining a first target group from the multiple groups of battery pieces to be tested according to the SE region metal induced composite value, the non-SE region metal induced composite value and the contact resistivity value of each group of battery pieces to be tested;
determining the slurry corresponding to the first target group as the slurry with the strongest matching property with the current sintering temperature;
wherein the SE region metal-induced composite value of the first target group is the minimum of all SE region metal-induced composite values, the non-SE region metal-induced composite value of the first target group is the minimum of all non-SE region metal-induced composite values, and the contact resistivity value of the first target group is the minimum of all contact resistivity values.
Optionally, the battery pieces to be tested include multiple groups, the multiple groups of the battery piece printed circuits to be tested all use the same current paste, each group of the battery pieces to be tested is sintered at a corresponding temperature, and the testing method includes:
determining a second target group from the multiple groups of battery pieces to be tested according to the SE region metal induced composite value, the non-SE region metal induced composite value and the contact resistivity value of each group of battery pieces to be tested;
determining the temperature corresponding to the second target group as the sintering temperature with the strongest matching property with the current slurry;
wherein the SE region metal-induced composite value of the second target group is the minimum of all SE region metal-induced composite values, the non-SE region metal-induced composite value of the second target group is the minimum of all non-SE region metal-induced composite values, and the contact resistivity value of the second target group is the minimum of all contact resistivity values.
In a second aspect, the present application provides a system for testing positive silver of a SE-PERC battery, including a processor and a memory connected to the processor, where the memory stores a test program, and the test program implements any one of the above methods when executed by the processor.
According to the method and the system for testing the positive silver of the SE-PERC battery, the dark saturation current density of the first battery area and the plurality of second battery areas of the battery piece to be tested is tested, and the obtained test values are processed, so that the metal induced recombination value of the SE area and the metal induced recombination value of the non-SE area can be obtained, and the test of the metal induced recombination value of the positive silver of the SE-PERC battery is realized.
Drawings
FIG. 1 is a schematic flow chart of a method for testing positive silver of a SE-PERC battery according to an embodiment of the present application;
fig. 2 is a schematic structural diagram of a front testing screen in the SE-PERC battery front silver testing method according to the embodiment of the present application;
fig. 3 is a schematic structural diagram of a back side testing screen in the SE-PERC battery front silver testing method according to the embodiment of the present application;
FIG. 4 is a schematic flow chart of a method for testing positive silver of the SE-PERC battery according to the embodiment of the application;
FIG. 5 is a schematic flow chart of a method for testing positive silver of the SE-PERC battery according to the embodiment of the application;
FIG. 6 is a schematic flow chart of a method for testing positive silver of the SE-PERC battery according to the embodiment of the application;
FIG. 7 is a schematic flow chart of a method for testing positive silver of the SE-PERC battery according to the embodiment of the application;
FIG. 8 is a schematic flow chart of a method for testing positive silver of the SE-PERC battery according to the embodiment of the application;
FIG. 9 is a schematic flow chart of a method for testing positive silver of the SE-PERC battery according to the embodiment of the application;
fig. 10 is a schematic flow chart of a testing method of positive silver of the SE-PERC battery according to the embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
At present, no method for testing the metal-induced recombination value of the positive silver of the SE-PERC battery exists. The dark saturation current density of the first battery area and the dark saturation current densities of the plurality of second battery areas of the battery piece to be tested are tested, and the obtained test values are processed, so that the test of the metal induced recombination value of the positive silver of the SE-PERC battery can be realized.
Referring to fig. 1, a method for testing positive silver of a SE-PERC battery according to an embodiment of the present application is characterized in that the method includes:
step S13: dividing the front surface of a battery piece to be tested into a plurality of regions, wherein the plurality of regions comprise a first battery region and a plurality of second battery regions, the first battery region is a region without grid lines, the second battery region is a region with grid lines, and the grid lines of the plurality of second battery regions are different in width;
step S14: respectively testing the dark saturation current densities of the first battery area and the plurality of second battery areas to obtain a first test value and a plurality of second test values;
step S15: and determining a metal induction composite value in an SE region and a metal induction composite value in a non-SE region of the battery piece to be tested according to the first test value and the plurality of second test values.
According to the method for testing the positive silver of the SE-PERC battery, the dark saturation current densities of the first battery area and the second battery areas of the battery piece to be tested are tested, the obtained test values are processed, the metal induced composite value of the SE area and the metal induced composite value of the non-SE area can be obtained, and the test of the metal induced composite value of the positive silver of the SE-PERC battery is achieved.
It is understood that SE refers to a selective emitter (selective emitter). PERC refers to a Passivated emitter Rear Cell (Passivated emitter and reader Cell).
Fig. 2 is a schematic structural diagram of the front testing screen 10 corresponding to the circuit of the cell to be tested. The front testing screen 10 includes a first cell region 110, a plurality of second cell regions 120 and a plurality of third screen regions 130. The first screen region 110 corresponds to a first battery region, the second screen region 120 corresponds to a second battery region, and the third screen region 130 corresponds to a third battery region.
Fig. 3 is a schematic structural diagram of a back testing screen 20 corresponding to a circuit of a battery to be tested. The rear testing screen 20 comprises a plurality of fourth screen areas 210. With the front and rear test screens 10, 20 overlapping, the fourth screen regions 210 cover the second screen regions 120. Therefore, the printed pattern of the positive electrode of the battery is completely positioned in the coverage area of the back electric field, and the uniform generation and the derivation of current carriers are ensured.
Note that the explanation and description of the screen area and the battery area can be referred to each other since they are based on the screen printed circuit.
Specifically, the phrase "the grid line widths of the plurality of second battery regions are different" means that the grid line width of each second battery region is different from the grid line widths of the other second battery regions.
Specifically, the first battery region may have a square shape. The first cell region has a side length in a range of more than 5 cm. For example, 5cm, 6cm, 7cm, 8 cm. The center of the first battery region may coincide with the center of the battery piece to be tested.
The number of second battery regions ranges from 2 to 8, such as 2, 3, 4, 5, 6, 7, 8. The number of third battery regions ranges from greater than or equal to 2, such as 2, 3, 4, 5, 6, 7, 8, 9. The number of fourth battery regions ranges from 2 to 8, such as 2, 3, 4, 5, 6, 7, 8. Therefore, the number of the measurements is large, and the result obtained by subsequently processing the data is more accurate.
In the example of fig. 2, the number of the first battery regions is 1, the number of the second battery regions is 4, and the number of the third battery regions is 2. Therefore, the area of the battery piece to be tested can be fully utilized, sufficient data can be obtained for processing, and the accuracy of the test is improved.
Further, 4 second battery regions and 2 third battery regions surround the first battery region. Therefore, errors caused by different specific positions of the regions in the battery piece to be tested can be reduced, and the accuracy of the test is improved.
Each second cell region may include a plurality of sub-gates parallel to the SE direction and a main gate perpendicular to the SE direction, the sub-gates covering or being located within the SE region. The second cell region is used to measure the metal induced recombination value.
Each third cell region may include a plurality of sub-grids having a width less than the SE width and a length greater than 1 cm. The third cell region is used to measure contact resistance.
The front testing screen 10 may be provided with positioning points for precise alignment when covering the front testing screen 10 on the printed circuit on the battery piece to be printed, so that the sub-grid covers the SE area or is located in the SE area. The back testing screen 20 may also be provided with positioning points. Thus, the printing is more accurate.
In step S13, the battery piece to be tested may be transported to the testing equipment by the transporting equipment, so as to obtain the battery piece to be tested. Therefore, manual participation is not needed, and the efficiency can be improved.
Specifically, the transport apparatus is, for example, a robot arm, a conveyor belt, or the like.
The test device may comprise a Photoluminescence (PL) tester, which is a device for testing minority carrier lifetime of a battery using Photoluminescence, and may measure the effective minority carrier lifetime of a specified Region of the battery using a Region of Interest (ROI) function. The dark saturation current density of the region can be calculated from the measured effective minority carrier lifetime.
The test equipment may include a Sinton minority carrier lifetime tester. The dark saturation current density of each second cell region can be measured separately by pressing a row or probe of the Sinton tester against the second cell region perpendicular to the primary grid of the secondary grid.
In step S14, the number of the battery pieces to be tested may be multiple, and multiple testing devices may be used to test the battery pieces to be tested simultaneously, thereby improving the testing efficiency.
In step S15, the number of the battery pieces to be tested may be multiple, and the test value corresponding to each battery piece to be tested may be marked, so as to trace the battery piece to be tested from which the test value originates. For each battery piece to be tested, the test value corresponding to each battery area can be marked, so that the area from which the test value comes can be traced. Therefore, the management of the test values is more standard and ordered, the tracing, the rechecking and the error correction are convenient, and the disorder is not caused.
Referring to fig. 4, optionally, step S15 includes:
step S151: determining a non-SE region metal induced composite value according to the first test value and the plurality of second test values;
step S152: and determining the SE region metal induced composite value according to the non-SE region metal induced composite value, the first test value and the plurality of second test values.
Therefore, the SE region metal induction composite value and the non-SE region metal induction composite value of the battery piece to be tested are determined according to the first test value and the plurality of second test values, and the accuracy is high.
Referring to fig. 5, optionally, step S151 includes:
step S1511: fitting a curve according to the plurality of second test values;
step S1512: determining the slope of the curve;
step S1513: and determining a metal-induced recombination value in the non-SE region according to the slope of the curve and the first test value.
Therefore, the non-SE region metal induced composite value is determined by fitting a curve, and the method is more accurate.
Specifically, in step S1511, each second battery region corresponds to a data point of the curve, and the abscissa is the ratio of the grid line coverage area to the total area of the second battery region, which is denoted as FmAnd the ordinate is a second test value, denoted J0, measured at this second cell region. In other words, by fitting a plurality of data points (F)mJ0) to obtain a curve.
It can be understood that the number of the battery slices to be tested can be multiple, so that more data points can be obtained, and the fitted curve is more accurate.
For example, the number of the battery pieces to be tested is 1, as shown in fig. 2, 4 data points can be obtained, and a curve is fitted according to the 4 data points; for another example, the number of the battery pieces to be tested is 2, each battery piece to be tested is as shown in fig. 2, 8 data points can be obtained, and a curve is fitted according to the 8 data points; if the number of the battery pieces to be tested is 3, and each battery piece to be tested is as shown in fig. 2, 12 data points can be obtained, and a curve is fitted according to the 12 data points.
In step S1512, the data points may be fitted to a curve using a fitting tool, and a report output by the fitting tool may be read to determine the slope of the curve. The fitting tool is, for example, origin function mapping software.
Specifically, in step S1513, the following formula is adopted:
J0,m＝k+J0,e；
wherein, J0,mIs the metal induced recombination value in the non-SE region, k is the slope of the curve, J0,eIs the first test value.
In other words, the non-SE region metal induced recombination value J0,mIs the slope k of the curve and the first test value J0,eAnd (4) summing.
It can be understood that, when the number of the battery slices to be tested is multiple, the first test value corresponding to each battery slice to be tested may be averaged, and the average value may be substituted into the above formula as the first test value. Therefore, errors can be reduced, and the accuracy of the test is improved.
It can be understood that the non-SE region metal induced recombination value J0,mI.e., non-SE region metal induced recombination current density.
Referring to fig. 6, optionally, step S152 includes:
step S1521: determining the intercept of the curve;
step S1522: acquiring the dark saturation current density of the silicon substrate and the back dark saturation current density;
step S1523: acquiring the ratio of the area of the SE region of the PERC battery to the total area;
step S1524: and determining the SE region metal induced composite value according to the intercept, the first test value, the silicon substrate dark saturation current density, the back surface dark saturation current density, the ratio and the non-SE region metal induced composite value.
Therefore, the metal induction composite value in the SE region is determined accurately according to the metal induction composite value in the non-SE region, the first test value and the plurality of second test values.
In step S1521, the report output by the fitting tool may be read to determine the intercept of the curve.
In step S1522, the silicon substrate dark saturation current density and the backside dark saturation current density may be measured in advance and stored. Therefore, the ratio can be directly read when needed, and efficiency is improved.
In step S1523, the area of the SE region of the PERC cell and the total area may be measured in advance, and the ratio of the two may be found and stored. Therefore, the ratio can be directly read when needed, and efficiency is improved.
In step S1524, the following formula is adopted:
J0,SE,m＝(d-J0,e-J0,bulk-J0,rear)/FSE+J0,m；
wherein，J0,SE,mThe metal induced recombination value in the SE region, d is the intercept of the curve, J0,eIs a first test value, J0,bulkIs the dark saturation current density of the silicon substrate, J0,rearIs the back side dark saturation current density, FSEIs a ratio of J0,mThe non-SE region metal induced recombination values.
It will be appreciated that, according to the formula:
J0＝J0,m*(Fm-FSE)+J0,e*(1-Fm)+J0,SE,m*FSE+J0,bulk+J0,rear
＝(J0,m-J0,e)*Fm+J0,e+J0,bulk+J0,rear+(J0,SE,m-J0,m)*FSE；
wherein, J0Is a second test value, J0,mIs the non-SE region metal induced recombination value, J0,eIs a first test value, FmIs the ratio of the grid line coverage area to the total area of the second cell region, J0,bulkIs the dark saturation current density of the silicon substrate, J0,rearIs the back side dark saturation current density, FSEIs a ratio of J0,SE,mThe metal induced recombination values are in the SE region.
As described above, the silicon substrate dark saturation current density J0,bulkBack side dark saturation current density J0,rearRatio, second test value J0A first test value J0,eAll known items can be measured or calculated.
By measuring different F of a certain number of battery pieces to be testedmCorresponding to J0Obtaining J0And FmWherein:
slope: k is J0,m-J0,e；
Intercept: d ═ J0,e+J0,bulk+J0,rear+(J0,SE,m-J0,m)*FSE；
Based on the above, the calculation formula of the SE region metal induced composite value and the non-SE region metal induced composite value can be obtained:
non-SE region metal induced recombination value: j. the design is a square0,m＝k+J0,e；
SE region metal induced recombination value: j. the design is a square0,SE,m＝(d-J0,e-J0,bulk-J0,rear)/FSE+J0,m。
Referring to fig. 7, optionally, before step S13, the testing method includes:
step S11: on the battery piece to be printed after the back surface is grooved by laser, a preset test screen printing plate is used for printing a circuit;
step S12: and sintering the cell piece printed with the circuit to obtain the cell piece to be tested.
Therefore, the distribution positions and the grid line number of a plurality of battery areas of the battery piece to be tested can be controlled by controlling the testing screen printing plate, the printing process is not required to be changed, extra manufacturing procedures are not required to be added, the battery piece to be tested can be obtained, and the cost is reduced. Moreover, a plurality of identical battery pieces to be tested can be manufactured according to the same testing screen printing plate, and efficiency is improved.
It will be appreciated that the test screens include a front test screen 10 and a rear test screen 20. The front testing screen 10 is used for printing the front of the battery piece to be printed, and the back testing screen 10 is used for printing the back of the battery piece to be printed.
Specifically, the solar cell after film coating can be obtained by performing texturing cleaning, diffusion, SE, etching, annealing, back passivation and Plasma Enhanced Chemical Vapor Deposition (PECVD) process on the front surface of a silicon wafer. And after the film is coated, the back surface of the battery piece is subjected to local laser grooving to form a battery piece to be printed. And printing back aluminum and front silver on the cell to be printed by a screen printing machine by using a testing screen, and drying and sintering to obtain the cell to be tested.
Further, the testing screen can be arranged on a printing machine, and a scraper and a feed back knife are arranged; spreading the slurry in a testing screen and adjusting printing parameters; and carrying out back aluminum printing on the cell to be printed, drying and sintering to obtain the cell to be tested.
Referring to fig. 2, in the present embodiment, the number of the first screen regions 110 is 1, and there is no grid line. The first screen area 110 is square with a side length of 5 cm.
The second screen area 120 is rectangular, 137.229mm long and 15mm wide. Two adjacent screen areas located on the same side of the first screen area 110 have a distance of 10 mm. The width of the inner frame, the width of the longitudinal grid line and the width of the transverse grid line in each second screen printing plate area 120 are the same. The distance between two adjacent grid lines is 1.3587 mm. The mating (PT) value is 137.229 +/-0.015 mm.
The number of the second screen regions 120 is 4, which are a second screen region 121, a second screen region 122, a second screen region 123, and a second screen region 124. The width of the grid line of the second screen area 121 is 0.15 mm. The width of the grid line of the second screen area 122 is 0.25 mm. The width of the grid line of the second screen area 123 is 0.35 mm. The width of the grid line of the second screen area 124 is 0.45 mm.
The number of the third screen area 130 is 2, the width of the fine grid is 0.026mm, the length of the fine grid is 43mm, and the number of the grid lines of each third screen area 130 is 32.
Referring to fig. 3, in the present embodiment, the fourth screen area 210 is rectangular, and has a length of 140.208mm and a width of 45 mm. The number of fourth screen areas 210 is 2 with a pitch of 58.734 mm. The widths of the inner frame and the outer frame of the two fourth screen printing plate areas 210 are the same, the widths of the thin grids are both 0.11mm, and the distance between two adjacent grid lines is both 1.104 mm. PT value is 140.208 + -0.015 mm.
The parameters are adopted by the front testing screen 10 and the back testing screen 20, which is beneficial to improving the accuracy and efficiency of the test.
Referring to fig. 8, optionally, the battery piece to be tested includes a third battery region, where the third battery region is a region with a gate line, and the testing method includes:
step S16: cutting the third battery area to obtain a plurality of battery strips;
step S17: the contact resistance of each battery bar was measured to obtain a contact resistance value.
Therefore, the contact resistivity value can be measured, and the measurement result is accurate.
Specifically, in step S16, the third battery region may be cut using a laser dicing saw to obtain a plurality of battery bars. The width of the cell strip in the direction of the sub-grid may range from 0.5 to 1.5cm, for example 0.5cm, 0.6cm, 0.7cm, 1cm, 1.3cm, 1.5 cm. In the present embodiment, the width of the cell bars in the sub-grid direction is 1 cm.
In step S17, a contact resistance tester may be used for the measurement.
Referring to fig. 9, optionally, the battery pieces to be tested include a plurality of sets, each set of battery pieces to be tested employs a corresponding paste printed circuit, the sintering temperatures of the plurality of sets of battery pieces to be tested are the same current sintering temperature, and the testing method includes:
step S181: determining a first target group from the multiple groups of battery pieces to be tested according to the SE region metal induction composite value, the non-SE region metal induction composite value and the contact resistivity value of each group of battery pieces to be tested;
step S182: determining the slurry corresponding to the first target group as the slurry with the strongest matching property with the current sintering temperature;
the SE region metal-induced composite value of the first target group is the minimum value of all SE region metal-induced composite values, the non-SE region metal-induced composite value of the first target group is the minimum value of all non-SE region metal-induced composite values, and the contact resistivity value of the first target group is the minimum value of all contact resistivity values.
Therefore, under the same sintering temperature, a plurality of groups of battery pieces to be tested printed by different pastes are tested, and the paste with the strongest matching property with the current sintering temperature is screened out according to the obtained SE region metal induced composite value, non-SE region metal induced composite value and contact resistivity value, so that the matching property evaluation of the sintering process and the paste can be realized efficiently and at low cost, and the optimization direction can be conveniently determined by the working personnel.
In step S181, determining a to-be-tested battery piece corresponding to the minimum SE region metal induction complex value according to the SE region metal induction complex value of each group of to-be-tested battery pieces; if the battery piece to be tested corresponding to the minimum SE region metal induction composite value is a group, determining that the group of battery pieces to be tested is a first target group under the condition that the non-SE region metal induction composite value corresponding to the group of battery pieces to be tested is the minimum non-SE region metal induction composite value and the contact resistivity value is the minimum contact resistivity value; and if the to-be-tested battery pieces corresponding to the minimum SE region metal induction composite value are multiple groups, and the to-be-tested battery piece corresponding to the minimum non-SE region metal induction composite value in the multiple groups of to-be-tested battery pieces is the same as the to-be-tested battery piece corresponding to the minimum contact resistivity value, determining the to-be-tested battery piece corresponding to the minimum non-SE region metal induction composite value as a first target group.
Similarly, the battery piece to be tested corresponding to the minimum non-SE region metal induction composite value can be determined according to the non-SE region metal induction composite value of each group of battery pieces to be tested; if the battery pieces to be tested corresponding to the minimum non-SE region metal induction composite value are in one group, determining that the group of battery pieces to be tested is a first target group under the condition that the SE region metal induction composite value corresponding to the group of battery pieces to be tested is the minimum SE region metal induction composite value and the contact resistivity value is the minimum contact resistivity value; and if the to-be-tested battery pieces corresponding to the minimum non-SE region metal induction composite value are multiple groups, and the to-be-tested battery piece corresponding to the minimum SE region metal induction composite value in the multiple groups of to-be-tested battery pieces is the same as the to-be-tested battery piece corresponding to the minimum contact resistivity value, determining the to-be-tested battery piece corresponding to the minimum SE region metal induction composite value as a first target group.
It can be understood that the first target group cannot be found under the condition that the battery piece to be tested corresponding to the minimum SE region metal induced composite value, the battery piece to be tested corresponding to the minimum non-SE region metal induced composite value and the minimum contact resistivity value are not the same group of battery pieces to be tested.
In one example, the battery pieces to be tested comprise two groups, a first group of battery pieces to be tested adopt a first paste printed circuit, a second group of battery pieces to be tested adopt a second paste printed circuit, and the sintering temperatures of the two groups of battery pieces to be tested are the current sintering temperatures. SE region metal induced composite values, non-SE region metal induced composite values and contact resistivity values are determined according to steps S13-S17. Determining that the first slurry is the slurry with the strongest matching property with the current sintering temperature under the condition that the SE region metal induction composite value of the first group of battery pieces to be tested is the minimum value of all SE region metal induction composite values, the non-SE region metal induction composite value is the minimum value of all non-SE region metal induction composite values, and the contact resistivity value is the minimum value of all contact resistivity values; and under the condition that the SE region metal induction composite value of the second group of the battery pieces to be tested is the minimum value of all SE region metal induction composite values, the non-SE region metal induction composite value is the minimum value of all non-SE region metal induction composite values, and the contact resistivity value is the minimum value of all contact resistivity values, determining that the second slurry is the slurry with the strongest matching property with the current sintering temperature.
Referring to fig. 10, optionally, the battery pieces to be tested include a plurality of sets, the pastes adopted by the printed circuits of the plurality of sets of battery pieces to be tested are the same current paste, each set of battery pieces to be tested is sintered at a corresponding temperature, and the testing method includes:
step S191: determining a second target group from the multiple groups of battery pieces to be tested according to the SE region metal induced composite value, the non-SE region metal induced composite value and the contact resistivity value of each group of battery pieces to be tested;
step S192: determining the temperature corresponding to the second target group as the sintering temperature with the strongest matching property with the current slurry;
the SE region metal-induced composite value of the second target group is the minimum value of all SE region metal-induced composite values, the non-SE region metal-induced composite value of the second target group is the minimum value of all non-SE region metal-induced composite values, and the contact resistivity value of the second target group is the minimum value of all contact resistivity values.
Therefore, under the condition of adopting the same paste printed circuit, a plurality of groups of battery pieces to be tested which are sintered at different temperatures are tested, and the temperature with the strongest matching property with the current paste is screened out according to the obtained SE region metal induced composite value, the non-SE region metal induced composite value and the contact resistivity value, so that the matching property evaluation of the sintering process and the paste can be realized efficiently and at low cost, and the optimization direction can be conveniently determined by the working personnel.
For the explanation and explanation of step S191, reference may be made to the previous part of step S191, and for avoiding redundancy, the explanation is not repeated here.
Note that the "sintering temperature" herein may refer to a peak temperature at the time of sintering.
In one example, the battery pieces to be tested comprise three groups, the slurries adopted by the three groups of battery pieces to be tested are all current slurries, the sintering temperature of the first group of battery pieces to be tested is 740 ℃, the sintering temperature of the second group of battery pieces to be tested is 750 ℃, and the sintering temperature of the third group of battery pieces to be tested is 760 ℃. SE region metal induced composite values, non-SE region metal induced composite values and contact resistivity values are determined according to steps S13-S17. Determining 740 ℃ as the sintering temperature with the strongest matching property with the current slurry under the condition that the SE region metal induction composite value of the first group of battery pieces to be tested is the minimum value of all SE region metal induction composite values, the non-SE region metal induction composite value is the minimum value of all non-SE region metal induction composite values, and the contact resistivity value is the minimum value of all contact resistivity values; determining 750 ℃ as the sintering temperature with the strongest matching property with the current slurry under the condition that the SE region metal induction composite value of the second group of battery pieces to be tested is the minimum value of all SE region metal induction composite values, the non-SE region metal induction composite value is the minimum value of all non-SE region metal induction composite values, and the contact resistivity value is the minimum value of all contact resistivity values; and under the condition that the SE region metal induction composite value of the third group of battery pieces to be tested is the minimum value of all SE region metal induction composite values, the non-SE region metal induction composite value is the minimum value of all non-SE region metal induction composite values, and the contact resistivity value is the minimum value of all contact resistivity values, determining 760 ℃ as the sintering temperature with the strongest matching property with the current slurry.
The SE-PERC battery positive silver testing system provided by the embodiment of the application comprises a processor and a memory connected with the processor, wherein the memory stores a testing program, and the testing program is executed by the processor to realize the method of any one of the above steps.
For example, performing:
step S13: dividing the front surface of a battery piece to be tested into a plurality of regions, wherein the plurality of regions comprise a first battery region and a plurality of second battery regions, the first battery region is a region without grid lines, the second battery region is a region with grid lines, and the grid lines of the plurality of second battery regions are different in width;
step S14: respectively testing the dark saturation current densities of the first battery area and the plurality of second battery areas to obtain a first test value and a plurality of second test values;
step S15: and determining a metal induction composite value in an SE region and a metal induction composite value in a non-SE region of the battery piece to be tested according to the first test value and the plurality of second test values.
According to the SE-PERC battery positive silver testing system, the dark saturation current densities of the first battery area and the second battery areas of the battery piece to be tested are tested, the obtained test values are processed, the SE area metal induced composite value and the non-SE area metal induced composite value can be obtained, and the SE-PERC battery positive silver metal induced composite value testing is achieved.
For further explanation and explanation of the test system, reference is made to the above description, and further explanation is omitted here to avoid redundancy.
In summary, the method and the system for testing the positive silver of the SE-PERC battery in the embodiment of the present application have the advantages that the preparation of the test battery piece is simple and convenient, no additional process or change of the existing previous process is needed, and the metal induced recombination and the contact resistivity under the specific process and the slurry can be simultaneously measured only by replacing the test screen. And the test accuracy is higher, specifically, under the condition of SE design, the tested SE area metal composite accuracy is higher, and the error is within 10%. In addition, the test results can be used for evaluation of slurry inorganic formulations, evaluation of cell process and slurry compatibility, and evaluation of new cell structures. The simulation and loss analysis of the battery efficiency can be carried out according to the measured metal induced recombination value and the contact resistance value, and research and development and process personnel are helped to judge the optimization direction of the battery structure, the process and the slurry.
The present invention is not intended to be limited to the particular embodiments shown and described, but is to be accorded the widest scope consistent with the principles and novel features herein disclosed.
Claims (10)
1. A method for testing positive silver of an SE-PERC battery, which is characterized by comprising the following steps:
dividing the front surface of a battery piece to be tested into a plurality of regions, wherein the plurality of regions comprise a first battery region and a plurality of second battery regions, the first battery region is a region without grid lines, the second battery region is a region with grid lines, and the grid lines of the plurality of second battery regions are different in width;
respectively testing the dark saturation current densities of the first battery area and the plurality of second battery areas to obtain a first test value and a plurality of second test values;
and determining a metal induced composite value in an SE region and a metal induced composite value in a non-SE region of the battery piece to be tested according to the first test value and the plurality of second test values.
2. The method for testing positive silver of a SE-PERC battery according to claim 1, wherein determining a SE region metal-induced recombination value and a non-SE region metal-induced recombination value of the battery piece to be tested according to the first test value and the plurality of second test values comprises:
determining the non-SE region metal induced composite value according to the first test value and a plurality of second test values;
and determining the SE region metal-induced composite value according to the non-SE region metal-induced composite value, the first test value and the plurality of second test values.
3. The method for testing positive silver of a SE-PERC battery of claim 2, wherein determining said non-SE region metal-induced recombination value based on said first test value and a plurality of said second test values comprises:
fitting a curve according to a plurality of said second test values;
determining a slope of the curve;
and determining the metal-induced composite value of the non-SE region according to the slope of the curve and the first test value.
4. The method for testing positive silver of a SE-PERC battery according to claim 3, wherein in said step of determining said non-SE region metal induced recombination value from said slope of said curve and said first test value, the following formula is used:
J0,m＝k+J0,e；
wherein, J0,mIs the metal induced recombination value of the non-SE region, k is the slope of the curve, J0,eIs the first test value.
5. The SE-PERC battery positive silver testing method according to claim 3, wherein determining the SE region metal induced recombination value according to the non-SE region metal induced recombination value, the first test value and a plurality of the second test values comprises:
determining an intercept of the curve;
acquiring the dark saturation current density of the silicon substrate and the back dark saturation current density;
acquiring the ratio of the area of the SE region of the PERC battery to the total area;
and determining the SE region metal induced composite value according to the intercept, the first test value, the silicon substrate dark saturation current density, the back surface dark saturation current density, the ratio and the non-SE region metal induced composite value.
6. The method for testing positive silver of an SE-PERC cell according to claim 5, wherein in said step of determining said SE area metal induced recombination value based on said intercept, said first test value, said silicon substrate dark saturation current density, said backside dark saturation current density, said ratio, and said non-SE area metal induced recombination value, the following formula is used:
J0,SE,m＝(d-J0,e-J0,bulk-J0,rear)/FSE+J0,m；
wherein, J0,SE,mFor the metal induced recombination value in the SE region, d is the intercept of the curve, J0,eIs the first test value, J0,bulkIs the dark saturation current density of the silicon substrate, J0,rearIs the back side dark saturation current density, FSEIs the ratio, J0,mAnd (4) the non-SE region metal induced recombination value.
7. The positive silver testing method for the SE-PERC battery as claimed in claim 1, wherein the battery piece to be tested comprises a third battery region, the third battery region is a region with grid lines, and the testing method comprises the following steps:
cutting the third battery area to obtain a plurality of battery strips;
and measuring the contact resistance of each battery strip to obtain a contact resistance value.
8. The method for testing positive silver of SE-PERC battery according to claim 7, wherein the battery pieces to be tested comprise a plurality of groups, each group of battery pieces to be tested adopts a corresponding paste printed circuit, the sintering temperatures of the plurality of groups of battery pieces to be tested are the same current sintering temperature, and the testing method comprises the following steps:
determining a first target group from the multiple groups of battery pieces to be tested according to the SE region metal induced composite value, the non-SE region metal induced composite value and the contact resistivity value of each group of battery pieces to be tested;
determining the slurry corresponding to the first target group as the slurry with the strongest matching property with the current sintering temperature;
wherein the SE region metal-induced composite value of the first target group is the minimum of all SE region metal-induced composite values, the non-SE region metal-induced composite value of the first target group is the minimum of all non-SE region metal-induced composite values, and the contact resistivity value of the first target group is the minimum of all contact resistivity values.
9. The method for testing positive silver of SE-PERC battery according to claim 7, wherein the battery pieces to be tested comprise a plurality of groups, the paste used by the printed circuits of the plurality of groups of battery pieces to be tested is the same current paste, each group of battery pieces to be tested is sintered at a corresponding temperature, and the testing method comprises the following steps:
determining a second target group from the multiple groups of battery pieces to be tested according to the SE region metal induced composite value, the non-SE region metal induced composite value and the contact resistivity value of each group of battery pieces to be tested;
determining the temperature corresponding to the second target group as the sintering temperature with the strongest matching property with the current slurry;
wherein the SE region metal-induced composite value of the second target group is the minimum of all SE region metal-induced composite values, the non-SE region metal-induced composite value of the second target group is the minimum of all non-SE region metal-induced composite values, and the contact resistivity value of the second target group is the minimum of all contact resistivity values.
10. A test system for positive silver of a SE-PERC battery, the test system comprising a processor and a memory connected to the processor, the memory storing a test program, the test program, when executed by the processor, implementing the method of any one of claims 1 to 9.
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