CN113270336B - Method and system for testing positive silver of SE-PERC battery - Google Patents
Method and system for testing positive silver of SE-PERC battery Download PDFInfo
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- CN113270336B CN113270336B CN202110555737.XA CN202110555737A CN113270336B CN 113270336 B CN113270336 B CN 113270336B CN 202110555737 A CN202110555737 A CN 202110555737A CN 113270336 B CN113270336 B CN 113270336B
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- 238000012360 testing method Methods 0.000 title claims abstract description 165
- 238000000034 method Methods 0.000 title claims abstract description 45
- 229910052709 silver Inorganic materials 0.000 title claims abstract description 37
- 239000004332 silver Substances 0.000 title claims abstract description 37
- 229910052751 metal Inorganic materials 0.000 claims abstract description 154
- 239000002184 metal Substances 0.000 claims abstract description 154
- 239000002131 composite material Substances 0.000 claims abstract description 109
- 238000005215 recombination Methods 0.000 claims abstract description 43
- 230000006798 recombination Effects 0.000 claims abstract description 43
- 239000002002 slurry Substances 0.000 claims description 37
- 230000006698 induction Effects 0.000 claims description 35
- 238000005245 sintering Methods 0.000 claims description 32
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 13
- 229910052710 silicon Inorganic materials 0.000 claims description 13
- 239000010703 silicon Substances 0.000 claims description 13
- 239000000758 substrate Substances 0.000 claims description 12
- 238000005520 cutting process Methods 0.000 claims description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims 5
- 230000008569 process Effects 0.000 description 9
- 101001073212 Arabidopsis thaliana Peroxidase 33 Proteins 0.000 description 6
- 101001123325 Homo sapiens Peroxisome proliferator-activated receptor gamma coactivator 1-beta Proteins 0.000 description 6
- 102100028961 Peroxisome proliferator-activated receptor gamma coactivator 1-beta Human genes 0.000 description 6
- 238000007639 printing Methods 0.000 description 6
- 238000011156 evaluation Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000005457 optimization Methods 0.000 description 3
- 238000005424 photoluminescence Methods 0.000 description 3
- 238000007650 screen-printing Methods 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- CMWTZPSULFXXJA-VIFPVBQESA-N naproxen Chemical compound C1=C([C@H](C)C(O)=O)C=CC2=CC(OC)=CC=C21 CMWTZPSULFXXJA-VIFPVBQESA-N 0.000 description 2
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000013329 compounding Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000009472 formulation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 238000004513 sizing Methods 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Manufacturing & Machinery (AREA)
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- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Battery Electrode And Active Subsutance (AREA)
- Secondary Cells (AREA)
Abstract
The application is applicable to the technical field of solar cells and provides a method and a system for testing positive silver of a SE-PERC battery. The testing method comprises the following steps: dividing the front surface of a battery piece to be tested into a plurality of areas, wherein the plurality of areas comprise a first battery area and a plurality of second battery areas, the first battery area is an area without a grid line, the second battery area is an area with a grid line, and the grid line widths of the plurality of second battery areas are different; respectively testing dark saturation current densities of the first battery area and the plurality of second battery areas to obtain a first test value and a plurality of second test values; and determining the SE region metal-induced composite value and the non-SE region metal-induced composite value of the battery piece to be tested according to the first test value and the plurality of second test values. Thus, the test of the metal-induced recombination value of the positive silver of the SE-PERC battery is realized.
Description
Technical Field
The application belongs to the technical field of solar cells, and particularly relates to a method and a system for testing positive silver of a SE-PERC battery.
Background
The related art is mainly directed to metal induced recombination testing of TOPCON cells or SE-free PERC cells. However, the SE area is generally smaller than 120um, and the gate lines with the gradual line width with the large difference of line widths cannot be arranged in the SE area, so that the metal induced composite test for SE cannot be performed by referring to the pattern design and test method of TOPCon or the SE-free PERC. Based on the above, how to test the metal-induced recombination value of the positive silver of the SE-PERC battery becomes a problem to be solved urgently.
Disclosure of Invention
The application provides a method and a system for testing positive silver of a SE-PERC battery, and aims to solve the problem of how to test a metal-induced composite value of the positive silver of the SE-PERC battery.
In a first aspect, the method for testing positive silver of a SE-PERC battery provided by the application comprises the following steps:
dividing the front surface of a battery piece to be tested into a plurality of areas, wherein the plurality of areas comprise a first battery area and a plurality of second battery areas, the first battery area is an area without grid lines, the second battery area is an area with grid lines, and the grid line widths of the plurality of second battery areas are different;
respectively testing dark saturation current densities of the first battery area and the plurality of second battery areas to obtain a first test value and a plurality of second test values;
and determining the SE area metal induction composite value and the non-SE area metal induction composite value of the battery piece to be tested according to the first test value and the second test values.
Optionally, determining the SE region metal induced composite value and the non-SE region metal induced composite value of the to-be-tested battery piece according to the first test value and the plurality of second test values includes:
determining the metal-induced composite value of the non-SE region according to the first test value and the second test values;
and determining the SE region metal-induced composite value according to the non-SE region metal-induced composite value, the first test value and a plurality of second test values.
Optionally, determining the non-SE region metal induced recombination value according to the first test value and the plurality of second test values comprises:
fitting a curve according to a plurality of the second test values;
determining a slope of the curve;
determining the metal-induced recombination value of the non-SE region according to the slope of the curve and the first test value.
Optionally, in the step of determining the metal-induced recombination value of the non-SE region according to the slope of the curve and the first test value, the following formula is adopted:
J 0,m ＝k+J 0,e ；
wherein J is 0,m For the non-SE region metal-induced recombination value, k is the slope of the curve, J 0,e Is the first test value.
Optionally, determining the SE region metal induced recombination value from the non-SE region metal induced recombination value, the first test value, and the plurality of second test values comprises:
determining an intercept of the curve;
acquiring dark saturation current density and back dark saturation current density of a silicon substrate;
acquiring the ratio of the area of the SE area of the PERC battery to the total area;
and determining the SE region metal induced composite value according to the intercept, the first test value, the silicon substrate dark saturation current density, the back dark saturation current density, the ratio and the non-SE region metal induced composite value.
Optionally, in the step of determining the SE region metal induced composite value according to the intercept, the first test value, the silicon substrate dark saturation current density, the back dark saturation current density, the ratio, and the non-SE region metal induced composite value, the following formula is adopted:
J 0,SE,m ＝(d-J 0,e -J 0,bulk -J 0,rear )/F SE +J 0,m ；
wherein J is 0,SE,m For the SE region metal-induced recombination value, d is the intercept, J, of the curve 0,e For the first test value, J 0,bulk Dark saturation current density, J for the silicon substrate 0,rear For the back dark saturation current density F SE For the ratio J 0,m Metal-induced recombination values for the non-SE regions.
Optionally, the to-be-tested battery piece includes a third battery area, and the testing method includes:
cutting the third battery area to obtain a plurality of battery bars;
the contact resistance of each of the strips is measured to obtain a contact resistance value.
Optionally, the to-be-tested battery pieces include multiple groups, each group of to-be-tested battery pieces adopts a corresponding slurry printed circuit, the sintering temperatures of the multiple groups of to-be-tested battery pieces are the same current sintering temperature, and the testing method includes:
determining a first target group from a plurality of groups of battery pieces to be tested according to the SE area metal induction composite value, the non-SE area metal induction composite value and the contact resistivity value of each group of battery pieces to be tested;
determining the slurry corresponding to the first target group as the slurry with the strongest matching property with the current sintering temperature;
the metal-induced recombination value of the SE regions of the first target group is the minimum value of all the metal-induced recombination values of the SE regions, the metal-induced recombination value of the non-SE regions of the first target group is the minimum value of all the metal-induced recombination values of the non-SE regions, and the contact resistivity value of the first target group is the minimum value of all the contact resistivity values.
Optionally, the to-be-tested battery piece includes multiple groups, multiple groups of slurries adopted by the to-be-tested battery piece printed circuit are the same current slurry, each group of to-be-tested battery piece adopts a corresponding temperature for sintering, and the testing method includes:
determining a second target group from a plurality of groups of battery pieces to be tested according to the SE area metal induction composite value, the non-SE area metal induction composite value and the contact resistivity value of each group of battery pieces to be tested;
determining the temperature corresponding to the second target group as the sintering temperature with the highest matching property with the current slurry;
the second target group of SE region metal induced composite values are the smallest value among all SE region metal induced composite values, the second target group of non-SE region metal induced composite values are the smallest value among all non-SE region metal induced composite values, and the second target group of contact resistivity values are the smallest value among all contact resistivity values.
In a second aspect, the system for testing the positive silver of the SE-PERC battery provided by the present application includes a processor and a memory connected to the processor, where the memory stores a test program, and the test program when executed by the processor implements the method of any one of the above.
According to the method and the system for testing the positive silver of the SE-PERC battery, the metal-induced composite value of the SE area and the metal-induced composite value of the non-SE area can be obtained by testing the dark saturation current densities of the first battery area and the plurality of second battery areas of the battery piece to be tested and processing the obtained test values, and the test of the metal-induced composite value of the positive silver of the SE-PERC battery is realized.
Drawings
FIG. 1 is a flow chart of a method for testing positive silver of a SE-PERC battery in accordance with an embodiment of the present application;
fig. 2 is a schematic structural diagram of a front test screen in the method for testing positive silver of a SE-PERC battery according to an embodiment of the present application;
fig. 3 is a schematic structural diagram of a backside test screen in the method for testing the front silver of the SE-PERC battery according to the embodiment of the present application;
FIG. 4 is a flow chart of a method for testing positive silver of a SE-PERC battery of an embodiment of the present application;
FIG. 5 is a flow chart of a method for testing positive silver of a SE-PERC battery of an embodiment of the present application;
FIG. 6 is a flow chart of a method for testing positive silver of a SE-PERC battery of an embodiment of the present application;
FIG. 7 is a flow chart of a method for testing positive silver of a SE-PERC battery of an embodiment of the present application;
FIG. 8 is a flow chart of a method for testing positive silver of a SE-PERC battery of an embodiment of the present application;
FIG. 9 is a flow chart of a method for testing positive silver of a SE-PERC battery of an embodiment of the present application;
fig. 10 is a flow chart of a method for testing positive silver of a SE-PERC battery according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the present application.
There is no method for testing the metal induced recombination value of the positive silver of the SE-PERC battery at present. According to the method and the device, the dark saturation current density of the first battery area and the dark saturation current density of the plurality of second battery areas of the battery piece to be tested are tested, and the obtained test value is processed, so that the test of the metal-induced composite value of the positive silver of the SE-PERC battery can be realized.
Referring to fig. 1, the method for testing positive silver of a SE-PERC battery according to the embodiment of the present application is characterized in that the method includes:
step S13: dividing the front surface of a battery piece to be tested into a plurality of areas, wherein the plurality of areas comprise a first battery area and a plurality of second battery areas, the first battery area is an area without a grid line, the second battery area is an area with a grid line, and the grid line widths of the plurality of second battery areas are different;
step S14: respectively testing dark saturation current densities of the first battery area and the plurality of second battery areas to obtain a first test value and a plurality of second test values;
step S15: and determining the SE region metal-induced composite value and the non-SE region metal-induced composite value of the battery piece to be tested according to the first test value and the plurality of second test values.
According to the method for testing the positive silver of the SE-PERC battery, the first battery area and the plurality of second battery areas of the battery piece to be tested are tested for dark saturation current density, and the obtained test values are processed, so that the metal-induced composite value of the SE area and the metal-induced composite value of the non-SE area can be obtained, and the test of the metal-induced composite value of the positive silver of the SE-PERC battery is realized.
It is understood that SE refers to a selective emitter (selective emitter). PERC refers to a passivated emitter back cell (Passivated Emitterand Rear Cell).
Fig. 2 is a schematic structural diagram of a front test screen 10 corresponding to a circuit of a battery cell to be tested. The front test screen 10 includes a first screen region 110, a plurality of second screen regions 120, and a plurality of third screen regions 130. The first screen region 110 corresponds to a first battery region, the second screen region 120 corresponds to a second battery region, and the third screen region 130 corresponds to a third battery region.
Fig. 3 is a schematic structural diagram of a backside test screen 20 corresponding to a circuit of a battery to be tested. The backside test screen 20 includes a plurality of fourth screen areas 210. In the case where the front side test screen 10 and the back side test screen 20 overlap, the plurality of fourth screen areas 210 covers the plurality of second screen areas 120. Therefore, the printed pattern of the positive electrode of the battery is completely in the coverage area of the back electric field, and uniform generation and export of carriers are ensured.
Note that since the screen printing circuit is used, explanation and explanation of the screen region and the battery region can be referred to each other.
Specifically, herein, "the gate line widths of the plurality of second battery regions are different" means that the gate line width of each second battery region is different from the gate line width of the other second battery regions.
In particular, the first cell region may be square. The first cell region has a side length in the range of greater than 5cm. For example, 5cm, 6cm, 7cm, 8cm. The center of the first cell region may coincide with the center of the battery piece to be tested.
The number of second cell areas ranges from 2 to 8, for example from 2, 3, 4, 5, 6, 7, 8. The number of third battery regions ranges from greater than or equal to 2, for example, 2, 3, 4, 5, 6, 7, 8, 9. The number of fourth cell areas ranges from 2 to 8, for example from 2, 3, 4, 5, 6, 7, 8. Therefore, the number of the measurements is large, and the result obtained by the subsequent data processing is more accurate.
In the example of fig. 2, the number of first battery areas is 1, the number of second battery areas is 4, and the number of third battery areas is 2. Therefore, the area of the battery piece to be tested can be fully utilized, and sufficient data can be obtained for processing, so that the accuracy of the test is improved.
Further, 4 second cell regions and 2 third cell regions surround the first cell region. Therefore, errors caused by different specific positions of the battery piece to be tested in the area can be reduced, and the accuracy of the test is improved.
Each second cell region may include a plurality of secondary grids parallel to the SE direction and a primary grid perpendicular to the SE direction, the secondary grids covering or being located within the SE region. The second cell region was used to measure the metal induced recombination value.
Each third cell region may include a plurality of sub-grids having a width smaller than the SE width and a length greater than 1cm. The third cell region is used to measure contact resistance.
The front side test screen 10 may be provided with anchor points to precisely align when the front side test screen 10 is overlaid onto a printed circuit on a battery sheet to be printed such that the secondary grid covers or is located within the SE area. The backside test screen 20 may also be provided with anchor points. Thus, printing is more accurate.
In step S13, the battery piece to be tested may be transported to the testing device by the transporting device, so as to achieve the acquisition of the battery piece to be tested. Therefore, the efficiency can be improved without manual participation.
Specifically, the transport device is, for example, a robot arm, a conveyor belt, or the like.
The test device may comprise a Photo Luminescence (PL) tester, which is an instrument that tests the minority carrier lifetime of a battery using Photoluminescence, and the effective minority carrier lifetime of a specified region of the battery may be measured using a region of interest (Region ofInterest, ROI) function. The dark saturation current density of the region can be calculated from the measured effective minority carrier lifetime.
The test equipment may include a Sinton minority carrier lifetime tester. The probe row or probe of the Sinton tester can be pressed against the primary grid of the secondary grid perpendicularly to the secondary cell areas, thereby measuring the dark saturation current density of each secondary cell area separately.
In step S14, the number of the battery pieces to be tested may be plural, and plural testing devices may be used to test the battery pieces to be tested synchronously, so as to improve the testing efficiency.
In step S15, the number of the battery pieces to be tested may be plural, and the test value corresponding to each battery piece to be tested may be marked, so as to trace the battery piece to be tested from which the test value is derived. For each battery piece to be tested, the test value corresponding to each battery area can be marked so as to trace the area from which the test value is derived. Therefore, the test value management is more standard and ordered, the tracing, the review and the error correction are convenient, and the confusion is not caused.
Referring to fig. 4, optionally, step S15 includes:
step S151: determining a metal-induced composite value of the non-SE region according to the first test value and the plurality of second test values;
step S152: and determining the SE region metal-induced composite value according to the non-SE region metal-induced composite value, the first test value and the plurality of second test values.
Therefore, according to the first test value and the plurality of second test values, the SE area metal induction composite value and the non-SE area metal induction composite value of the battery piece to be tested are determined, and accuracy is high.
Referring to fig. 5, optionally, step S151 includes:
step S1511: fitting a curve according to the plurality of second test values;
step S1512: determining the slope of the curve;
step S1513: and determining a metal-induced recombination value of the non-SE region according to the slope of the curve and the first test value.
Therefore, the metal induction composite value of the non-SE region is determined by fitting a curve, and is more accurate.
Specifically, in step S1511, each second cell region corresponds to a data point of the curve, and the abscissa is the ratio of the coverage area of the gate line of the second cell region to the total area, denoted as F m The ordinate is the second test value measured in this second cell region, noted J0. In other words, by fitting a plurality of data points (F m J0), a curve is obtained.
It can be appreciated that the number of battery pieces to be tested can be multiple, so that more data points can be obtained, and the fitted curve is more accurate.
For example, the number of the battery pieces to be tested is 1, as shown in fig. 2, 4 data points can be obtained, and a curve is fitted according to the 4 data points; for another example, the number of the battery pieces to be tested is 2, each battery piece to be tested is shown in fig. 2, 8 data points can be obtained, and a curve is fitted according to the 8 data points; if the number of the battery pieces to be tested is 3, each battery piece to be tested is shown in fig. 2, 12 data points can be obtained, and a curve is fitted according to the 12 data points.
In step S1512, the data points may be fitted to a curve using a fitting tool, and the report output by the fitting tool may be read to determine the slope of the curve. The fitting tool is, for example, origin function mapping software.
Specifically, in step S1513, the following formula is adopted:
J 0,m ＝k+J 0,e ；
wherein J is 0,m Is the metal induction complex value of the non-SE region, k is the slope of a curve, J 0,e Is the first test value.
In other words, non-SE region metal induced recombination value J 0,m For the slope k of the curve and the first test value J 0,e And (3) summing.
It can be understood that, in the case that the number of the battery pieces to be tested is plural, the first test value corresponding to each battery piece to be tested may be averaged, and the average value may be substituted as the first test value into the above formula. Thus, errors can be reduced, and the accuracy of the test can be improved.
It will be appreciated that the non-SE region metal induced recombination value J 0,m I.e. the metal-induced recombination current density of the non-SE region.
Referring to fig. 6, optionally, step S152 includes:
step S1521: determining the intercept of the curve;
step S1522: acquiring dark saturation current density and back dark saturation current density of a silicon substrate;
step S1523: acquiring the ratio of the area of the SE area of the PERC battery to the total area;
step S1524: and determining the SE region metal-induced composite value according to the intercept, the first test value, the silicon substrate dark saturation current density, the back dark saturation current density, the ratio and the non-SE region metal-induced composite value.
Therefore, the metal induction composite value of the SE area is determined accurately according to the metal induction composite value of the non-SE area, the first test value and the second test values.
In step S1521, the report output by the fitting tool may be read, thereby determining the intercept of the curve.
In step S1522, the silicon substrate dark saturation current density and the back surface dark saturation current density may be measured in advance and stored. Therefore, the ratio can be directly read when the ratio is needed, and the efficiency is improved.
In step S1523, the area of the PERC cell SE region and the total area may be measured in advance, and the ratio of the two may be obtained and stored. Therefore, the ratio can be directly read when the ratio is needed, and the efficiency is improved.
In step S1524, the following formula is adopted:
J 0,SE,m ＝(d-J 0,e -J 0,bulk -J 0,rear )/F SE +J 0,m ；
wherein J is 0,SE,m Metal-induced recombination value for SE region, d is the intercept of the curve, J 0,e For the first test value, J 0,bulk Dark saturation current density for silicon substrate, J 0,rear For the back dark saturation current density F SE Is the ratio, J 0,m Metal-induced recombination values for non-SE regions.
It will be appreciated that according to the formula:
J 0 ＝J 0,m *(F m -F SE )+J 0,e *(1-F m )+J 0,SE,m *F SE +J 0,bulk +J 0,rear
＝(J 0,m -J 0,e )*F m +J 0,e +J 0,bulk +J 0,rear +(J 0,SE,m -J 0,m )*F SE ；
wherein J is 0 For the second test value, J 0,m Metal-induced recombination value for non-SE regions, J 0,e For the first test value, F m A ratio of the grid line coverage area to the total area of the second battery area, J 0,bulk Dark saturation current density for silicon substrate, J 0,rear For the back dark saturation current density F SE Is the ratio, J 0,SE,m Metal-induced recombination values for SE region.
As described previously, the silicon substrate dark saturation current density J 0,bulk Dark saturation current density of back face J 0,rear Ratio, second test value J 0 First test value J 0,e Are known items that can be measured or calculated.
By measuring a certain number of different F of the cells to be tested m Corresponding J 0 J can be obtained 0 And F is equal to m Wherein:
slope: k=j 0,m -J 0,e ；
Intercept: d=j 0,e +J 0,bulk +J 0,rear +(J 0,SE,m -J 0,m )*F SE ；
Based on this, the calculation formulas of the foregoing SE region metal-induced recombination value and non-SE region metal-induced recombination value can be obtained:
non-SE region metal-induced recombination values: j (J) 0,m ＝k+J 0,e ；
Metal-induced recombination values in SE region: j (J) 0,SE,m ＝(d-J 0,e -J 0,bulk -J 0,rear )/F SE +J 0,m 。
Referring to fig. 7, optionally, before step S13, the testing method includes:
step S11: on a battery piece to be printed after back laser slotting, a preset test screen printing circuit is utilized;
step S12: and sintering the battery piece printed with the circuit to obtain the battery piece to be tested.
Therefore, the distribution positions and the grid line number of a plurality of battery areas of the battery piece to be tested can be controlled by controlling the test screen, the printing process is not required to be changed, and the battery piece to be tested can be obtained without adding additional manufacturing procedures, so that the cost is reduced. Moreover, a plurality of identical battery pieces to be tested can be manufactured according to the same test screen, which is beneficial to improving the efficiency.
It will be appreciated that the test screen includes a front test screen 10 and a back test screen 20. The front test screen 10 is used for printing the front surface of the battery piece to be printed, and the back test screen 10 is used for printing the back surface of the battery piece to be printed.
Specifically, the battery piece after coating can be obtained after the silicon wafer is subjected to texturing cleaning, diffusion, SE, etching, annealing, back passivation and front plasma enhanced chemical vapor deposition PECVD process. And forming the battery piece to be printed after the back surface of the battery piece is subjected to local laser grooving after the coating. And (3) carrying out screen printing on back aluminum and front silver on the battery piece to be printed by using the test screen, and drying and sintering to obtain the battery piece to be tested.
Further, the test screen can be mounted on a printer, and a scraper and a feed back knife are mounted; spreading the slurry in a test screen and adjusting printing parameters; and carrying out back aluminum printing and drying sintering on the battery piece to be printed, thereby obtaining the battery piece to be tested.
Referring to fig. 2, in the present embodiment, the number of first screen regions 110 is 1, and no grid lines are provided. The first screen region 110 is square with sides of 5cm.
The second screen region 120 is rectangular and has a length of 137.229mm and a width of 15mm. Adjacent two screen areas on the same side of the first screen area 110 are spaced apart by 10mm. The width of the outer frame, the width of the longitudinal grid lines, and the width of the transverse grid lines in each second screen region 120 are the same. The spacing between two adjacent grid lines is 1.3587mm. The mating (PT) value is 137.229 plus or minus 0.015mm.
The number of the second screen regions 120 is 4, and the second screen regions 121, 122, 123, and 124 are respectively. The width of the grid line of the second screen region 121 is 0.15mm. The width of the grid line of the second screen region 122 is 0.25mm. The width of the grid line of the second screen region 123 is 0.35mm. The width of the grid line of the second screen region 124 is 0.45mm.
The number of the third screen regions 130 is 2, the width of the fine grid is 0.026mm, the length of the fine grid is 43mm, and the number of grid lines of each third screen region 130 is 32.
Referring to fig. 3, in the present embodiment, the fourth screen region 210 is rectangular, and has a length of 140.208mm and a width of 45mm. The fourth screen area 210 is 2 in number and has a pitch of 58.734mm. The width of the inner frame and the outer frame of the two fourth screen areas 210 are the same, the width of the fine grid is 0.11mm, and the distance between two adjacent grid lines is 1.104mm. PT values were 140.208.+ -. 0.015mm.
The front test screen 10 and the back test screen 20 adopt the above parameters, which is beneficial to improving the accuracy and efficiency of the test.
Referring to fig. 8, optionally, the to-be-tested battery slice includes a third battery area, where the third battery area is an area with a grid line, and the testing method includes:
step S16: cutting the third cell region to obtain a plurality of cell bars;
step S17: the contact resistance of each cell strip was measured to obtain a contact resistivity value.
Therefore, the measurement of the contact resistivity value can be realized, and the measurement result is more accurate.
Specifically, in step S16, the third battery region may be cut using a laser dicing saw to obtain a plurality of battery bars. The width of the cell strip in the direction of the sub-grid may range from 0.5 to 1.5cm, for example, 0.5cm, 0.6cm, 0.7cm, 1cm, 1.3cm, 1.5cm. In this embodiment, the width of the battery bar in the sub-grid direction is 1cm.
In step S17, measurement may be performed using a contact resistance tester.
Referring to fig. 9, optionally, the battery pieces to be tested include a plurality of groups, each group of battery pieces to be tested adopts a corresponding slurry printed circuit, the sintering temperatures of the plurality of groups of battery pieces to be tested are the same current sintering temperature, and the testing method includes:
step S181: determining a first target group from a plurality of groups of battery pieces to be tested according to the SE area metal induction composite value, the non-SE area metal induction composite value and the contact resistivity value of each group of battery pieces to be tested;
step S182: determining the slurry corresponding to the first target group as the slurry with the strongest matching property with the current sintering temperature;
the metal-induced recombination value of the SE regions of the first target group is the minimum value of all the metal-induced recombination values of the SE regions, the metal-induced recombination value of the non-SE regions of the first target group is the minimum value of all the metal-induced recombination values of the non-SE regions, and the contact resistivity value of the first target group is the minimum value of all the contact resistivity values.
Therefore, under the same sintering temperature, multiple groups of to-be-tested battery pieces printed by different slurries are tested, slurry with the strongest matching property with the current sintering temperature is screened out according to the obtained SE region metal induction composite value, non-SE region metal induction composite value and contact resistivity value, the matching property evaluation of the sintering process and the slurry can be realized efficiently and at low cost, and the optimization direction can be conveniently determined by workers.
In step S181, the to-be-tested battery piece corresponding to the minimum SE area metal induction composite value may be determined according to the SE area metal induction composite value of each group of to-be-tested battery pieces; if the group of battery pieces to be tested corresponding to the metal induction composite value of the smallest SE area is a group, determining the group of battery pieces to be tested as a first target group under the condition that the metal induction composite value of the non-SE area corresponding to the group of battery pieces to be tested is the metal induction composite value of the smallest non-SE area and the contact resistivity value is the contact resistivity value of the smallest; and if the battery pieces to be tested corresponding to the metal-induced composite value of the minimum SE area are multiple groups, and the battery pieces to be tested corresponding to the metal-induced composite value of the minimum non-SE area in the multiple groups of battery pieces to be tested are the same as the battery pieces to be tested corresponding to the minimum contact resistivity value, determining the battery pieces to be tested corresponding to the metal-induced composite value of the minimum non-SE area as a first target group.
Similarly, the to-be-tested battery piece corresponding to the minimum non-SE area metal induction composite value can be determined according to the non-SE area metal induction composite value of each group of to-be-tested battery pieces; if the group of the battery pieces to be tested corresponding to the minimum non-SE area metal induction composite value is a group, determining the group of the battery pieces to be tested as a first target group under the condition that the SE area metal induction composite value corresponding to the group of the battery pieces to be tested is the minimum SE area metal induction composite value and the contact resistivity value is the minimum contact resistivity value; and if the battery pieces to be tested corresponding to the minimum non-SE area metal induced composite value are multiple groups, and the battery pieces to be tested corresponding to the minimum SE area metal induced composite value in the multiple groups of battery pieces to be tested are the same as the battery pieces to be tested corresponding to the minimum contact resistivity value, determining the battery pieces to be tested corresponding to the minimum SE area metal induced composite value as a first target group.
It can be appreciated that, in the case where the battery cell to be tested corresponding to the minimum SE region metal induced composite value, the battery cell to be tested corresponding to the minimum non-SE region metal induced composite value and the minimum contact resistivity value are not the same group of battery cells to be tested, it may be determined that the first target group cannot be found.
In one example, the battery pieces to be tested comprise two groups, the first group of battery pieces to be tested adopts a first slurry printed circuit, the second group of battery pieces to be tested adopts a second slurry printed circuit, and the sintering temperatures of the two groups of battery pieces to be tested are all the current sintering temperatures. And determining a SE region metal-induced composite value, a non-SE region metal-induced composite value and a contact resistivity value according to steps S13-S17. Determining that the first slurry is the slurry with the strongest matching property with the current sintering temperature under the condition that the metal-induced composite value of the SE area of the first group of battery plates to be tested is the minimum value in all the metal-induced composite values of the SE area, the metal-induced composite value of the non-SE area is the minimum value in all the metal-induced composite values of the non-SE area, and the contact resistivity value is the minimum value in all the contact resistivity values; and determining that the second slurry is the slurry with the strongest matching performance with the current sintering temperature under the condition that the metal-induced composite value of the SE area of the second group of to-be-tested battery plates is the minimum value in all the metal-induced composite values of the SE area, the metal-induced composite value of the non-SE area is the minimum value in all the metal-induced composite values of the non-SE area, and the contact resistivity value is the minimum value in all the contact resistivity values.
Referring to fig. 10, optionally, the battery pieces to be tested include multiple groups, the pastes adopted by the multiple groups of battery piece printed circuits to be tested are the same current paste, each group of battery pieces to be tested is sintered at a corresponding temperature, and the testing method includes:
step S191: determining a second target group from a plurality of groups of battery pieces to be tested according to the SE area metal induction composite value, the non-SE area metal induction composite value and the contact resistivity value of each group of battery pieces to be tested;
step S192: determining the temperature corresponding to the second target group as the sintering temperature with the strongest matching property with the current slurry;
the second target group has a minimum value of all SE region metal induced composite values, the second target group has a minimum value of all non-SE region metal induced composite values, and the second target group has a minimum value of all non-SE region metal induced composite values.
Under the condition of adopting the same slurry printed circuit, multiple groups of battery pieces to be tested sintered at different temperatures are tested, and according to the obtained SE region metal induction composite value, non-SE region metal induction composite value and contact resistivity value, the temperature with the strongest matching property with the current slurry is screened out, so that the matching property evaluation of the sintering process and the slurry can be realized efficiently and at low cost, and the optimization direction can be conveniently determined by staff.
The explanation and explanation of step S191 can refer to the previous part of step S181, and will not be repeated here to avoid redundancy.
Note that "sintering temperature" herein may refer to a peak temperature at the time of sintering.
In one example, the battery pieces to be tested comprise three groups, the slurries adopted by the three groups of battery pieces to be tested are all current slurries, the sintering temperature of the first group of battery pieces to be tested is 740 ℃, the sintering temperature of the second group of battery pieces to be tested is 750 ℃, and the sintering temperature of the third group of battery pieces to be tested is 760 ℃. And determining a SE region metal-induced composite value, a non-SE region metal-induced composite value and a contact resistivity value according to steps S13-S17. Determining 740 ℃ to be the sintering temperature with the strongest matching property with the current slurry under the condition that the metal-induced composite value of the SE area of the first group of battery plates to be tested is the minimum value in all the metal-induced composite values of the SE area, the metal-induced composite value of the non-SE area is the minimum value in all the metal-induced composite values of the non-SE area, and the contact resistivity value is the minimum value in all the contact resistivity values; determining 750 ℃ as the sintering temperature with the strongest matching property with the current slurry under the condition that the metal-induced composite value of the SE area of the second group of battery plates to be tested is the minimum value in all the metal-induced composite values of the SE area, the metal-induced composite value of the non-SE area is the minimum value in all the metal-induced composite values of the non-SE area, and the contact resistivity value is the minimum value in all the contact resistivity values; and determining 760 ℃ to be the sintering temperature with the strongest matching property with the current slurry under the condition that the metal-induced composite value of the SE area of the third group of to-be-tested battery plates is the minimum value of all the metal-induced composite values of the SE area, the metal-induced composite value of the non-SE area is the minimum value of all the metal-induced composite values of the non-SE area, and the contact resistivity value is the minimum value of all the contact resistivity values.
The test system for the positive silver of the SE-PERC battery comprises a processor and a memory connected with the processor, wherein the memory stores a test program, and the test program realizes the method of any one of the above steps when executed by the processor.
For example, perform:
step S13: dividing the front surface of a battery piece to be tested into a plurality of areas, wherein the plurality of areas comprise a first battery area and a plurality of second battery areas, the first battery area is an area without a grid line, the second battery area is an area with a grid line, and the grid line widths of the plurality of second battery areas are different;
step S14: respectively testing dark saturation current densities of the first battery area and the plurality of second battery areas to obtain a first test value and a plurality of second test values;
step S15: and determining the SE region metal-induced composite value and the non-SE region metal-induced composite value of the battery piece to be tested according to the first test value and the plurality of second test values.
According to the test system for the positive silver of the SE-PERC battery, the metal-induced composite value of the SE area and the metal-induced composite value of the non-SE area can be obtained by testing the dark saturation current density of the first battery area and the dark saturation current density of the plurality of second battery areas of the battery piece to be tested and processing the obtained test values, and the test of the metal-induced composite value of the positive silver of the SE-PERC battery is realized.
For further explanation and explanation of the test system, reference is made to the foregoing, and no further description is provided herein for the purpose of avoiding redundancy.
By combining the above, the method and the system for testing the positive silver of the SE-PERC battery are simple and convenient in preparation of the tested battery piece, and can simultaneously test the metal-induced recombination and the contact resistivity under a specific process and slurry by only replacing a testing screen without additional process procedures or changing the existing previous process procedures. Moreover, the testing accuracy is high, and in particular, under the condition of SE design, the metal compounding accuracy of the tested SE area is high, and the error is within 10%. In addition, the test results can be used for evaluation of slurry inorganic formulations, evaluation of battery technology and slurry matching, and evaluation of new battery structures. The simulation and loss analysis of the battery efficiency can be carried out according to the measured metal induction composite value and the measured contact resistance value, so that research and development and process personnel are helped to judge the optimization direction of the battery structure, process and sizing agent.
The foregoing description of the preferred embodiment of the present invention is not intended to limit the invention to the particular form disclosed, but on the contrary, the intention is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention.
Claims (5)
1. A method for testing positive silver of a SE-PERC battery, the method comprising:
dividing the front surface of a battery piece to be tested into a plurality of areas, wherein the plurality of areas comprise a first battery area and a plurality of second battery areas, the first battery area is an area without grid lines, the second battery area is an area with grid lines, and the grid line width of each second battery area is different from the grid line width of other second battery areas; each second cell region comprises a plurality of auxiliary grids parallel to the SE direction and a main grid perpendicular to the SE direction, and the auxiliary grids cover or are positioned in the SE regions;
respectively testing dark saturation current densities of the first battery area and the plurality of second battery areas to obtain a first test value and a plurality of second test values;
fitting a curve according to a plurality of the second test values; each second battery area corresponds to one data point of the curve, the abscissa of the curve is the ratio of the grid line coverage area of the second battery area to the total area, and the ordinate of the curve is the second test value measured in the second battery area;
determining a slope of the curve;
using formula J 0,m ＝k+J 0,e Determining a metal-induced recombination value of the non-SE region; wherein J is 0,m For the non-SE region metal-induced recombination value, k is the slope of the curve, J 0,e Is the first test value;
determining an intercept of the curve;
acquiring dark saturation current density and back dark saturation current density of a silicon substrate;
acquiring the ratio of the area of the SE area to the total area of the battery piece to be tested;
using formula J 0,SE,m ＝(d-J 0,e -J 0,bulk -J 0,rear )/F SE +J 0,m Determining a metal-induced recombination value of the SE region; wherein J is 0,SE,m For the SE region metal-induced recombination value, d is the intercept, J, of the curve 0,e For the first test value, J 0,bulk Dark saturation current density, J for the silicon substrate 0,rear For the back dark saturation current density, F SE For the ratio J 0,m Metal-induced recombination values for the non-SE regions.
2. The method for testing positive silver of a SE-PERC battery according to claim 1, wherein the battery piece to be tested includes a third battery region, the third battery region being a region having a grid line, the method comprising:
cutting the third battery area to obtain a plurality of battery bars;
the contact resistance of each of the strips is measured to obtain a contact resistance value.
3. The method for testing positive silver of a SE-PERC battery according to claim 2, wherein the battery pieces to be tested include a plurality of groups, each group of battery pieces to be tested adopts a corresponding slurry printed circuit, and sintering temperatures of the plurality of groups of battery pieces to be tested are the same current sintering temperature, the method for testing comprises:
determining a first target group from a plurality of groups of battery pieces to be tested according to the SE area metal induction composite value, the non-SE area metal induction composite value and the contact resistivity value of each group of battery pieces to be tested;
determining the slurry corresponding to the first target group as the slurry with the strongest matching property with the current sintering temperature;
the metal-induced recombination value of the SE regions of the first target group is the minimum value of all the metal-induced recombination values of the SE regions, the metal-induced recombination value of the non-SE regions of the first target group is the minimum value of all the metal-induced recombination values of the non-SE regions, and the contact resistivity value of the first target group is the minimum value of all the contact resistivity values.
4. The method for testing positive silver of a SE-PERC battery according to claim 2, wherein the battery pieces to be tested include a plurality of groups, the slurries used by the printed circuits of the battery pieces to be tested are the same current slurry, and each group of battery pieces to be tested is sintered at a corresponding temperature, the method for testing includes:
determining a second target group from a plurality of groups of battery pieces to be tested according to the SE area metal induction composite value, the non-SE area metal induction composite value and the contact resistivity value of each group of battery pieces to be tested;
determining the temperature corresponding to the second target group as the sintering temperature with the highest matching property with the current slurry;
the second target group of SE region metal induced composite values are the smallest value among all SE region metal induced composite values, the second target group of non-SE region metal induced composite values are the smallest value among all non-SE region metal induced composite values, and the second target group of contact resistivity values are the smallest value among all contact resistivity values.
5. A SE-PERC battery positive silver testing system, characterized in that the testing system comprises a processor and a memory connected to the processor, the memory storing a testing program which, when executed by the processor, implements the method according to any one of claims 1 to 4.
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