CN113203943A - Test fixture of IGBT & KGD chip - Google Patents
Test fixture of IGBT & KGD chip Download PDFInfo
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- CN113203943A CN113203943A CN202110748516.4A CN202110748516A CN113203943A CN 113203943 A CN113203943 A CN 113203943A CN 202110748516 A CN202110748516 A CN 202110748516A CN 113203943 A CN113203943 A CN 113203943A
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- copper block
- test box
- adjusting washer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- Engineering & Computer Science (AREA)
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- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a test fixture for an IGBT & KGD chip. The invention has the effect of IGBT & KGD chip testing, the screwing cover plate is arranged on the testing box, the heating rod and the temperature sensing couple are arranged in the testing box, the heating rod is sleeved with the insulating protective sleeve which is made of aluminum nitride, the insulating protective sleeve is arranged on the bottom plate of the testing box, the adjusting washer is arranged in the testing box and is arranged in the adjusting washer mounting plate, the plastic insulating block is arranged below the adjusting washer mounting plate, the testing box bottom plate is arranged below the plastic insulating block, the upper copper block is arranged on the lower surface of the bottom plate of the testing box, the upper copper block probe is arranged in the upper copper block, the buckles are arranged at two ends of the testing box, the buckle spring is arranged between the buckle and the testing box, the measuring machine base is arranged at the lower end of the testing box, the lower copper block probe group is arranged in the measuring machine base, the air inlet and the air outlet are arranged at two sides of the measuring machine base, the inlet and the outlet are made of nitrogen, the lower surface of the bottom plate of the test box is provided with a shunting probe set.
Description
Technical Field
The invention relates to the technical field of chip test jigs, in particular to a test jig for IGBT & KGD chips.
Background
The IGBT is an insulated gate bipolar transistor, is a composite fully-controlled voltage-driven power semiconductor device composed of BJT (bipolar junction transistor) and MOS (insulated gate field effect transistor), and has the advantages of both high input impedance of MOSFET (field effect transistor) and low on-state voltage drop of GTR (giant transistor), the KGD chip is a Known qualified chip, which is Known as Known good die, and the chinese translation is: a good chip is known. When the production of the operator is completed, the production yield is over 90%, and the remaining 10% is qualified after the test, namely, KGD.
The IGBT is a core device for energy conversion and transmission, commonly called as a CPU of a power electronic device, an IGBT chip is an insulated gate bipolar transistor, has the advantages of a power transistor and a power field effect transistor, has good characteristics, and is one of the greatest inventions of human beings.
The unpackaged IGBT & KGD chip is ultra-thin (thickness 75~150 UM), the test needs super large current (last 2ms more than 400A, 90ns transient current more than 1000A), super large voltage (more than 600V), need manual test before the volume production, simply verify partial electrical property of chip, and a large amount of processes all need the manual work to carry out manual test, but the danger of manual test can be imagined, no matter the mistake touch nature of high voltage, the instability in the test process, all bring not little influence for the tester, be light injured, can lose life by weight, and be in the environment of test chamber for a long time, can produce the influence to tester's health. Means on chip testing are also diversified, but each means with too strong pertinence is only suitable for corresponding chip testing.
Disclosure of Invention
The present invention provides a testing fixture for IGBT & KGD chips to solve the problems in the background art.
In order to solve the technical problems, the invention provides the following technical scheme: the utility model provides a test fixture of IGBT & KGD chip, this test fixture includes: the tightening cover plate, the test box, a buckle rotating shaft, a buckle spring, a measuring base, an air inlet and an air outlet, wherein the tightening cover plate is arranged on the test box and is rotationally connected with the test box, the measuring base is arranged at the lower end of the test box, an IGBT & KGD chip is arranged between the test box and the measuring base, the buckles are arranged on two sides of the test box and are symmetrical about the longitudinal section of the test box, the buckle tightly connects the test box and the measuring base, the buckle spring is arranged between the buckle and the test box and is fixedly connected with the test box, so that the buckle spring can support the buckle, the buckle can not shake, the test box and the measuring base are stably connected, the buckle is rotationally connected with the test box through the buckle rotating shaft, the measuring base is fixedly connected with the test box through the buckle, the air outlet and the air inlet are arranged on two sides of the measuring base, and the air inlet are communicated with the IGBT & KGD chip mounting position, the air inlet gets into nitrogen gas, and gas outlet exhaust nitrogen gas for nitrogen gas can protection device constantly, thereby can not damage this test fixture because of high voltage.
By adopting the structural design, the screwing cover plate, the test box and the test base are more stably connected, so that the problem of exposure of the IGBT and KGD chip can not occur, and the feasibility of the test is enhanced.
The test box includes: an adjusting washer mounting plate, an adjusting washer, a test box bottom plate, a mounting plate pillar, a test box body, an adjusting washer mounting groove, a plastic insulating block, an upper copper block screw, a heating rod, an insulating protective sleeve, an upper copper block probe and a temperature sensing thermocouple, wherein the test box body is internally provided with the test box bottom plate, the lower surface of the test box bottom plate is provided with the upper copper block, the upper copper block is in contact with the upper copper block probe and a C pole of an IGBT & KGD chip, the upper copper block is connected with the test box bottom plate through the upper copper block screw, the upper copper block can move along with the movement of the test box bottom plate, the upper surface of the test box bottom plate is provided with the insulating protective sleeve, the insulating protective sleeve is fixedly connected with the test box bottom plate, the mounting position can be provided for the heating rod and the temperature sensing thermocouple, the upper copper block probe is arranged in the upper copper block, the upper copper block probe is used for conducting a circuit, current is transmitted to the upper copper block, the heating rod is embedded in the insulating protective sleeve, the heating rod can heat the IGBT & KGD chip, and can regulate and control the temperature under the action of the controller, the temperature sensing couple is embedded in the insulating protective sleeve, the temperature sensing couple can sense the temperature and transmit signals to the controller, the temperature efficiency provided by the heating rod can be detected in real time, meanwhile, the heating degree of the heating rod is synchronously controlled according to the requirement, the plastic insulating block is arranged above the bottom plate of the testing box and can effectively block the current in the copper block, thereby protecting the testing box body and also protecting the personal safety of an operator, the plastic insulating block is fixedly connected with the bottom plate of the testing box through screws, the plastic insulating block achieves the fixing effect, the adjusting washer mounting plate is arranged above the plastic insulating block and can provide the mounting position for the adjusting washer, and meanwhile, the bottom plate of the testing box is more tightly mounted, the plastic insulating block is fixedly connected with the adjusting washer mounting plate through screws, an adjusting washer mounting groove is formed in the adjusting washer mounting plate, a mounting position is provided for the adjusting washer, the insulating protective sleeve penetrates through the adjusting washer mounting groove, the adjusting washer and the plastic insulating block, the position relation of the adjusting washer and the plastic insulating block is determined, an adjusting washer is arranged in the adjusting washer mounting groove, the adjusting washer supports against a screwing cavity, direct contact between the screwing cavity and the adjusting washer mounting plate is avoided, the service life of a screwing cover plate is prolonged, a mounting plate strut is arranged on the adjusting washer mounting plate, a spring is sleeved on the mounting plate strut, the upper end of the spring supports against the inner surface of a test box body, the adjusting washer mounting plate is in sliding connection with the test box body through the mounting plate strut, a position is provided for mounting the screwing cover plate, and meanwhile, the connection strength of the test box body and the adjusting washer mounting plate is also increased.
The insulating protective sleeve is made of aluminum nitride ceramics. Adopt the protective sheath of this material, can accomplish effectual insulation, avoided damaging heating rod and temperature-sensing galvanic couple because of discharging of last copper billet, the insulating protective sheath of this material has better heat conductivity simultaneously for it is higher to measure the thermal conductivity precision of IGBT & KGD chip.
By adopting the structural design, the principle of the heating rod is utilized, the heating operation is increased for the test process, so that the detection of the heating performance of the IGBT & KGD chip is realized, the heating operation can become safer due to the adoption of the insulating protective sleeve made of the aluminum nitride material, and the test precision is improved.
The apron of screwing includes: the utility model provides a test box, including the apron screw, the cavity of screwing, the apron runner, be provided with the through-hole on the apron runner, the heating rod passes the cavity of screwing and apron runner with the temperature-sensing galvanic couple, the apron runner passes through apron screw fixed connection with the cavity of screwing, be provided with the screw thread on the cavity of screwing, be provided with the internal thread on the test box, the cavity of screwing passes through threaded connection with the test box, the apron of screwing is screwed the back, go up the copper billet and can remove downwards thereupon, thereby contact with chip C utmost point, the cavity lower surface of screwing supports the adjusting washer, when having protected the cavity of screwing, the test box has also been protected.
The edge of the cover plate rotating wheel is provided with two convex blocks which are symmetrical with respect to the center of the cover plate rotating wheel, and the structural design enables the cover plate rotating wheel to provide a supporting point for a palm when the cover plate rotating wheel rotates, so that the cover plate can be screwed more smoothly.
The measuring stand is provided with: the lower copper block probe group is internally provided with a lower copper block, the lower copper block probe group is internally provided with a lower copper block probe group, the lower copper block probe group is internally communicated with current and is connected with an E pole of an IGBT & KGD chip, the lower copper block probe group is connected with the lower copper block in a sliding way, the number of the probe groups can be adjusted according to the requirement, the lower surface of the lower copper block base is provided with a base mounting column which provides a mounting position for the lower copper block base and has a positioning function, the lower copper block base is connected with a measuring base through the base mounting column, the lower copper block base is provided with a second positioning pin, the measuring base is provided with a first positioning pin, the first positioning pin and the second positioning pin play a device positioning effect, the second positioning pin is embedded into a bottom plate of the testing box, and the first positioning pin is embedded into the testing box, thereby confirmed the mounted position and the installation direction of measuring the frame, measured the frame upper surface and be provided with the reposition of redundant personnel probe group, the reposition of redundant personnel probe group contains several probes in for share the high current that transmits, thereby reduced the transmission pressure of single probe, the reposition of redundant personnel probe group is about measuring the frame longitudinal section symmetry, and the reposition of redundant personnel probe group sets up copper billet base both sides under, communicates whole test circuit.
The lower copper block is provided with a ventilation groove, two ends of the ventilation groove are respectively connected with the air outlet and the air inlet, after nitrogen is filled into the air inlet, the filled nitrogen can enter a cavity formed between the lower copper block and the upper copper block along the ventilation groove and then flows to the air outlet from the cavity along the ventilation groove, the nitrogen is discharged out of the cavity, and the nitrogen can effectively protect a chip, so that the chip cannot be damaged due to high-pressure air breakdown.
By adopting the structural design, the change data of the current and the voltage of the IGBT & KGD chip can be tested, and meanwhile, the current bearing capacity of a single probe is relieved by adopting a plurality of groups of probes, so that the service life of the test fixture is prolonged, and the test range of the test fixture is enlarged.
The probe contact jaw in the lower copper billet probe group is circular-arc, and the probe surface in the lower copper billet probe group scribbles the nanometer coating, gives up traditional imperial crown head and tip and handles probe surface increase nanometer coating simultaneously, and single pin current bearing capacity of increase can the ultra-thin fragile problem of effectual solution IGBT & KGD chip.
Compared with the prior art, the invention has the following beneficial effects:
1. the IGBT & KGD chip testing device is more stable and effective in testing effect aiming at the IGBT & KGD chip, and meanwhile due to the design of the probe, the fragile IGBT & KGD chip is protected.
2. The invention also uses the heating rod, the heating rod can work more safely and stably without worrying about the accidents of circuit break and poor heat conduction effect through the protection of the aluminum nitride insulating protective sleeve, and meanwhile, the heating effect can be more obvious and safer through the matching use of the temperature sensing couple and the heating rod, and the accuracy of testing the IGBT & KGD chip is enhanced.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention. In the drawings:
FIG. 1 is a schematic longitudinal sectional structural view of the present invention;
FIG. 2 is a schematic view of the structure A of the present invention;
FIG. 3 is a schematic view of a disassembled structure of the test box of the present invention;
FIG. 4 is a schematic elevation view of the present invention;
FIG. 5 is a schematic view of the lower copper block base structure of the present invention;
FIG. 6 is a schematic structural view of a lower copper block probe set of the present invention;
FIG. 7 is a schematic diagram of the upper copper block probe structure of the present invention;
FIG. 8 is a schematic view of the overall structure of the present invention;
FIG. 9 is a schematic diagram of the circuit schematic of the present invention;
FIG. 10 is a schematic top view of the metrology frame of the present invention;
FIG. 11 is a side view of the measuring stand of the present invention;
FIG. 12 is a schematic view of a partially enlarged structure B of the present invention;
in the figure: 1. screwing the cover plate; 1-1, cover plate screws; 1-2, screwing the cavity; 1-3, a cover plate rotating wheel; 2. a test box; 2-1, adjusting a gasket mounting plate; 2-2, adjusting a gasket; 2-3, testing a box bottom plate; 2-4, mounting a plate strut; 2-5, testing the box body; 2-6, adjusting a gasket mounting groove; 2-7, plastic insulating blocks; 2-8, mounting a copper block; 2-9, mounting a copper block screw; 3. buckling; 3-1, fastening a rotating shaft; 4. a snap spring; 5. a heating rod; 6. an insulating protective sleeve; 7. feeding a copper block probe; 8. a copper block is arranged; 9. measuring the engine base; 10. a first positioning pin; 11. feeding a copper block probe group; 12. a shunting probe set; 13. an air inlet; 14. an air outlet; 15. a temperature sensing couple; 16. a base mounting post; 17. a lower copper block base; 18. and a second positioning pin.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-12, the present invention provides the following technical solutions:
the utility model provides a test fixture of IGBT & KGD chip, this test fixture includes: the device comprises a screwing cover plate 1, a test box 2, buckles 3, buckle rotating shafts 3-1, buckle springs 4, a measuring base 9, an air inlet 13 and an air outlet 14, wherein the screwing cover plate 1 is arranged on the test box 2, the screwing cover plate 1 is rotationally connected with the test box 2, the measuring base 9 is arranged at the lower end of the test box 2, an IGBT & KGD chip is arranged between the test box 2 and the measuring base 9, the buckles 3 are arranged on two sides of the test box 2, the buckles 3 are symmetrical relative to the longitudinal section of the test box 2, the test box 2 is tightly connected with the measuring base 9 through the buckles 3, the buckle springs 4 are arranged between the buckles 3 and the test box 2, the buckle springs 4 are fixedly connected with the test box 2, the buckle springs 4 can support the buckles 3, the buckles 3 cannot shake, the test box 2 is stably connected with the measuring base 9, and the buckles 3 are rotationally connected with the test box 2 through the buckle rotating shafts 3-1, measure frame 9 and pass through buckle 3 and test box 2 fixed connection, measure frame 9 both sides and be provided with gas outlet 14 and air inlet 13, air inlet 13 communicates to IGBT & KGD chip installation department with gas outlet 14, and air inlet 13 gets into nitrogen gas, and 14 exhaust nitrogen gases in gas outlet for nitrogen gas can be protection device constantly, thereby can not damage this test fixture because of high voltage.
The test box 2 includes therein: an adjusting washer mounting plate 2-1, an adjusting washer 2-2, a test box bottom plate 2-3, a mounting plate strut 2-4, a test box body 2-5, an adjusting washer mounting groove 2-6, a plastic insulating block 2-7, an upper copper block 2-8, an upper copper block screw 2-9, a heating rod 5, an insulating protective sleeve 6, an upper copper block probe 7 and a temperature sensing electric couple 15, wherein the test box bottom plate 2-3 is arranged in the test box body 2-5, the lower surface of the test box bottom plate 2-3 is provided with the upper copper block 2-8, the upper copper block 2-8 and the upper copper block probe 7 are contacted with a C pole of an IGBT & KGD chip, the upper copper block 2-8 is connected with the test box bottom plate 2-3 through the upper copper block screw 2-9, the upper copper block 2-8 can move along with the movement of the test box bottom plate 2-3, the upper surface of the bottom plate 2-3 of the test box is provided with an insulating protective sleeve 6, the insulating protective sleeve 6 is fixedly connected with the bottom plate 2-3 of the test box, a mounting position can be provided for a heating rod 5 and a temperature sensing couple 15, an upper copper block probe 7 is arranged in the upper copper block 2-8, the upper copper block probe 7 is used for conducting a circuit, the current is transmitted to the upper copper block 2-8, the heating rod 5 is embedded into the insulating protective sleeve 6, the heating rod 5 can heat an IGBT & KGD chip and can carry out temperature regulation and control under the action of a controller, the temperature sensing couple 15 is embedded into the insulating protective sleeve 6, the temperature sensing couple 15 can sense the temperature and transmit signals to the controller, the temperature efficiency provided by the heating rod 5 can be detected in real time, the heating degree of the heating rod 5 can be synchronously controlled according to requirements, the plastic insulating blocks 2-7 are arranged above the bottom plate 2-3 of the test box, the plastic insulating blocks 2-7 can effectively block current in the upper copper blocks 2-8, so that the test box body 2-5 is protected, and the personal safety of an operator is also protected, the plastic insulating blocks 2-7 are fixedly connected with the bottom plate 2-3 of the test box through screws, the plastic insulating blocks 2-7 achieve a fixing effect, the adjusting washer mounting plates 2-1 are arranged above the plastic insulating blocks 2-7, the adjusting washer mounting plates 2-1 can provide mounting positions for the adjusting washers 2-2 and enable the bottom plates 2-3 of the test box to be mounted more tightly, the plastic insulating blocks 2-7 are fixedly connected with the adjusting washer mounting plates 2-1 through screws, the adjusting washer mounting plates 2-1 are provided with adjusting washer mounting grooves 2-6 to provide mounting positions for the adjusting washers 2-2, an adjusting washer 2-2 is arranged in the adjusting washer mounting groove 2-6, the adjusting washer 2-2 is propped against the screwing cavity 1-2, the direct contact between the screwing cavity 1-2 and the adjusting washer mounting plate 2-1 is avoided, the service life of the screwing cover plate 1 is prolonged, the insulating protective sleeve 6 penetrates through the adjusting washer mounting groove 2-6, the adjusting washer 2-2 and the plastic insulating block 2-7, a mounting plate strut 2-4 is arranged on the adjusting washer mounting plate 2-1, a spring is sleeved on the mounting plate strut 2-4, the upper end of the spring is propped against the inner surface of the test box body 2-5, the adjusting washer mounting plate 2-1 is in sliding connection with the test box body 2-5 through a mounting plate support 2-4 to provide a position for mounting the screwing cover plate 1, meanwhile, the connection strength of the test box body 2-5 and the adjusting washer mounting plate 2-1 is increased.
The insulating protective sleeve 6 is made of aluminum nitride ceramic. Adopt the protective sheath of this material, can accomplish effectual insulation, avoided damaging heating rod 5 and temperature-sensing galvanic couple 15 because of last copper billet 2-8 discharge, insulating protective sheath 6 of this material has better heat conductivity simultaneously for it is higher to measure the thermal conductivity precision of IGBT & KGD chip.
The screwing cap 1 comprises: the device comprises a cover plate screw 1-1, a screwing cavity 1-2 and a cover plate rotating wheel 1-3, wherein a through hole is formed in the cover plate rotating wheel 1-3, a heating rod 5 and a temperature sensing galvanic couple 15 penetrate through the screwing cavity 1-2 and the cover plate rotating wheel 1-3, the cover plate rotating wheel 1-3 is fixedly connected with the screwing cavity 1-2 through the cover plate screw 1-1, a thread is formed in the screwing cavity 1-2, an internal thread is formed in a test box body 2-5, the screwing cavity 1-2 is connected with the test box body 2-5 through the thread, an upper copper block 2-8 can move downwards along with the screwing cover plate 1 after the cover plate 1 is screwed, so that the upper copper block is in contact with a chip C pole, and the lower surface of the screwing cavity 1-2 abuts against an adjusting washer 2-2, so that the protection and adjustment effects are achieved.
The edge of the cover plate rotating wheel 1-3 is provided with two convex blocks which are centrosymmetric about the cover plate rotating wheel 1-3, and the structural design ensures that the cover plate rotating wheel 1-3 can provide a supporting point for a palm when rotating, thereby ensuring that the cover plate 1 is screwed more smoothly.
The measuring stand 9 is provided with: a lower copper block probe group 11, a first positioning pin 10, a lower copper block 8, a shunt probe group 12, a machine base mounting column 16, a lower copper block base 17 and a second positioning pin 18, wherein the lower copper block 8 is arranged in the lower copper block base 17, the lower copper block probe group 11 is arranged in the lower copper block 8, current is introduced into the lower copper block probe group 11 and is connected with an E pole of an IGBT & KGD chip, the lower copper block probe group 11 is connected with the lower copper block 8 in a sliding way, the number of the probe groups can be adjusted according to requirements, the machine base mounting column 16 is arranged on the lower surface of the lower copper block base 17, the machine base mounting column 16 provides a mounting position for the lower copper block base 17 and has a positioning function, the lower copper block base 17 is connected with a measuring machine base 9 through the machine base mounting column 16, the second positioning pin 18 is arranged on the lower copper block base 17, the first positioning pin 10 is arranged on the measuring machine base 9, and the second positioning pin 18 is embedded into a bottom plate 2-3 of the measuring box, the first locating pin 10 is embedded into the test box body 2-5, so that the installation position and the installation direction of the measuring base 9 are determined, the upper surface of the measuring base 9 is provided with a shunting probe group 12, the shunting probe group 12 internally comprises a plurality of probes and is used for sharing the transmitted high current, so that the transmission pressure of a single probe is reduced, the shunting probe group 12 is symmetrical about the longitudinal section of the measuring base 9, and the shunting probe group 12 is arranged on two sides of the lower copper block base 17 and is communicated with the whole test circuit.
The probe contact end in the lower copper billet probe group 11 is circular-arc, and the probe surface in the lower copper billet probe group 11 scribbles the nanometer coating, gives up traditional imperial crown head and tip processing probe surface increase nanometer coating simultaneously, and single probe current bearing capacity of increase can the ultra-thin fragile problem of effectual solution IGBT & KGD chip.
The lower copper block 8 is provided with a ventilation groove, two ends of the ventilation groove are respectively connected with the air outlet 14 and the air inlet 13, after nitrogen is filled into the air inlet 13, the filled nitrogen can enter a cavity formed between the lower copper block 8 and the upper copper block 2-8 along the ventilation groove, then the nitrogen flows to the air outlet 14 from the cavity along the ventilation groove, the nitrogen is discharged out of the cavity, and the nitrogen can effectively protect a chip, so that the chip cannot be damaged due to high-pressure air breakdown.
The working principle of the invention is as follows: the screwing cover plate 1 is arranged on the test box 2, a heating rod 5 and a temperature sensing couple 15 are arranged in the test box 2, an insulating protective sleeve 6 is sleeved on the heating rod 5, the insulating protective sleeve 6 is made of aluminum nitride, the insulating protective sleeve 6 is arranged on a bottom plate 2-3 of the test box, an adjusting washer 2-2 is arranged in the test box 2-5, the adjusting washer 2-2 is arranged in an adjusting washer mounting plate 2-1, a plastic insulating block 2-7 is arranged below the adjusting washer mounting plate 2-1, a bottom plate 2-3 of the test box is arranged below the plastic insulating block 2-7, an upper copper block 2-8 is arranged on the lower surface of the bottom plate 2-3 of the test box, an upper copper block probe 7 is arranged in the upper copper block 2-8, buckles 3 are arranged at two ends of the test box 2-5, and buckle springs 4 are arranged between the buckles 3 and the test box 2-5, the lower end of the test box 2 is provided with a measuring base 9, a lower copper block probe group 11 is arranged in the measuring base 9, air inlets 13 and air outlets 14 are arranged on two sides of the measuring base 9, inlet and outlet air is nitrogen, a shunting probe group 12 is arranged on the lower surface of a bottom plate 2-3 of the test box, an IGBT & KGD chip is placed on a lower copper block base 17 and is contacted with the lower copper block probe group 11 to complete the communication of an E pole, then the test box 2 is arranged above the measuring base 9, a buckle 3 clamps the measuring base 9 tightly, a cover plate 1 is screwed tightly, so that upper copper blocks 2-8 are contacted with the IGBT & KGD chip to complete the communication of a C pole, after electrification, current flows through the E pole, enters C pole current, flows out of the C pole, flows into the upper copper blocks 2-8 from the C pole, and flows through the shunting probe group 12 to output current, in the electrifying process, a heating rod 5 starts to work, a temperature induction couple 15 induces the change of temperature, and feedback information to the control box in to control heating rod 5's operating condition, heat transmission to IGBT & KGD chip can test IGBT & KGD chip the condition of being heated.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that changes may be made in the embodiments and/or equivalents thereof without departing from the spirit and scope of the invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (8)
1. The utility model provides a test fixture of IGBT & KGD chip which characterized in that: this test fixture includes: the device comprises a screwing cover plate (1), a test box (2), a buckle (3), a buckle rotating shaft (3-1), a buckle spring (4), a measuring base (9), an air inlet (13) and an air outlet (14), wherein the screwing cover plate (1) is arranged on the test box (2), the screwing cover plate (1) is rotationally connected with the test box (2), the lower end of the test box (2) is provided with the measuring base (9), the two sides of the test box (2) are provided with the buckles (3), the buckles (3) are symmetrical about the longitudinal section of the test box (2), the buckle spring (4) is arranged between the buckle (3) and the test box (2), the buckle spring (4) is fixedly connected with the test box (2), the buckle (3) is rotationally connected with the test box (2) through the buckle rotating shaft (3-1), the measuring base (9) is connected with the test box (2) through the buckle (3), and an air outlet (14) and an air inlet (13) are arranged on two sides of the measuring machine base (9).
2. The testing fixture of IGBT & KGD chip of claim 1, characterized in that: the test box (2) comprises: an adjusting washer mounting plate (2-1), an adjusting washer (2-2), a test box bottom plate (2-3), a mounting plate pillar (2-4), a test box body (2-5), an adjusting washer mounting groove (2-6), a plastic insulating block (2-7), an upper copper block (2-8), an upper copper block screw (2-9), a heating rod (5), an insulating protective sleeve (6), an upper copper block probe (7) and a temperature sensing couple (15), wherein the test box bottom plate (2-3) is arranged in the test box body (2-5), the lower surface of the test box bottom plate (2-3) is provided with the upper copper block (2-8), the upper copper block (2-8) is connected with the test box bottom plate (2-3) through the upper copper block screw (2-9), the upper copper block probe (7) is arranged in the upper copper block (2-8), the upper copper block (2-8) is arranged above the measuring machine base (9), the upper surface of the testing box bottom plate (2-3) is provided with an insulating protective sleeve (6), the insulating protective sleeve (6) is fixedly connected with the testing box bottom plate (2-3), the heating rod (5) and the temperature sensing couple (15) are embedded into the insulating protective sleeve (6), the plastic insulating block (2-7) is arranged above the testing box bottom plate (2-3), the plastic insulating block (2-7) is fixedly connected with the testing box bottom plate (2-3) through screws, the adjusting washer mounting plate (2-1) is arranged above the plastic insulating block (2-7), the plastic insulating block (2-7) is fixedly connected with the adjusting washer mounting plate (2-1) through screws, the adjusting washer mounting groove (2-6) is arranged on the adjusting washer mounting plate (2-1), the testing device is characterized in that an adjusting washer (2-2) is arranged in the adjusting washer mounting groove (2-6), the adjusting washer (2-2) abuts against the lower end of the screwing cover plate (1), the insulating protective sleeve (6) penetrates through the adjusting washer mounting groove (2-6), the adjusting washer (2-2) and the plastic insulating block (2-7), a mounting plate strut (2-4) is arranged on the adjusting washer mounting plate (2-1), a spring is sleeved on the mounting plate strut (2-4), the upper end of the spring abuts against the inner surface of the testing box body (2-5), and the adjusting washer mounting plate (2-1) is in sliding connection with the testing box body (2-5) through the mounting plate strut (2-4).
3. The testing fixture of IGBT & KGD chip of claim 2, characterized in that: the insulating protective sleeve (6) is made of aluminum nitride ceramic.
4. The testing fixture of IGBT & KGD chip of claim 2, characterized in that: the screwing cover plate (1) comprises: the device comprises a cover plate screw (1-1), a screwing cavity (1-2) and a cover plate rotating wheel (1-3), wherein a through hole is formed in the cover plate rotating wheel (1-3), a heating rod (5) and a temperature sensing galvanic couple (15) penetrate through the screwing cavity (1-2) and the cover plate rotating wheel (1-3), the cover plate rotating wheel (1-3) and the screwing cavity (1-2) are fixedly connected through the cover plate screw (1-1), a thread is formed in the screwing cavity (1-2), an internal thread is formed in a test box body (2-5), the screwing cavity (1-2) is connected with the test box body (2-5) through the thread, and the lower surface of the screwing cavity (1-2) abuts against an adjusting washer (2-2).
5. The testing fixture of IGBT & KGD chip of claim 4, characterized in that: two convex blocks are arranged at the edge of the cover plate rotating wheel (1-3), and the convex blocks are centrosymmetric with respect to the cover plate rotating wheel (1-3).
6. The testing fixture of IGBT & KGD chip of claim 2, characterized in that: the measuring stand (9) comprises: a lower copper block probe group (11), a first positioning pin (10), a lower copper block (8), a shunt probe group (12), a base mounting column (16), a lower copper block base (17) and a second positioning pin (18), wherein the lower copper block (8) is arranged in the lower copper block base (17), the lower copper block probe group (11) is arranged in the lower copper block (8), the lower copper block probe group (11) is in sliding connection with the lower copper block (8), the base mounting column (16) is arranged on the lower surface of the lower copper block base (17), the lower copper block base (17) is connected with a measuring base (9) through the base mounting column (16), the lower copper block base (17) is provided with the second positioning pin (18), the measuring base (9) is provided with the first positioning pin (10), the second positioning pin (18) is embedded into a testing base plate (2-3), and the first positioning pin (10) is embedded into a testing box body (2-5), the upper surface of the measuring base (9) is provided with two groups of shunting probe sets (12), the shunting probe sets (12) are symmetrical about the longitudinal section of the measuring base (9), and the shunting probe sets (12) are arranged on two sides of the lower copper block base (17).
7. The testing fixture of IGBT & KGD chip of claim 6, characterized in that: and a ventilation groove is formed in the lower copper block (8), and two ends of the ventilation groove are respectively connected with the air outlet (14) and the air inlet (13).
8. The testing fixture of IGBT & KGD chip of claim 6, characterized in that: the contact end of a probe in the lower copper block probe group (11) is arc-shaped, and the surface of the probe in the lower copper block probe group (11) is coated with a nano coating.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110748516.4A CN113203943B (en) | 2021-07-02 | 2021-07-02 | Test fixture of IGBT & KGD chip |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110748516.4A CN113203943B (en) | 2021-07-02 | 2021-07-02 | Test fixture of IGBT & KGD chip |
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| Publication Number | Publication Date |
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| CN113203943A true CN113203943A (en) | 2021-08-03 |
| CN113203943B CN113203943B (en) | 2021-09-14 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202110748516.4A Active CN113203943B (en) | 2021-07-02 | 2021-07-02 | Test fixture of IGBT & KGD chip |
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| JP2007040926A (en) * | 2005-08-05 | 2007-02-15 | Tokyo Seimitsu Co Ltd | Prober |
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| CN112327139A (en) * | 2020-11-04 | 2021-02-05 | 上海航天科工电器研究院有限公司 | Chip testing device |
| CN112444734A (en) * | 2020-11-26 | 2021-03-05 | 苏州韬盛电子科技有限公司 | Chip testing machine and chip testing method |
| CN212872576U (en) * | 2020-08-25 | 2021-04-02 | 江苏斯米克电子科技有限公司 | Probe station for IGBT product |
| CN112630615A (en) * | 2020-12-10 | 2021-04-09 | 华北电力大学 | Crimping type IGBT chip dynamic characteristic experiment platform and measuring method |
| CN213068949U (en) * | 2020-09-15 | 2021-04-27 | 苏州韬盛电子科技有限公司 | Automatic lead positive chip test socket |
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2021
- 2021-07-02 CN CN202110748516.4A patent/CN113203943B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007040926A (en) * | 2005-08-05 | 2007-02-15 | Tokyo Seimitsu Co Ltd | Prober |
| CN209497546U (en) * | 2019-04-04 | 2019-10-15 | 信利光电股份有限公司 | A kind of test fixture of camera module |
| CN212872576U (en) * | 2020-08-25 | 2021-04-02 | 江苏斯米克电子科技有限公司 | Probe station for IGBT product |
| CN112083313A (en) * | 2020-09-11 | 2020-12-15 | 苏州韬盛电子科技有限公司 | Test fixture of ultra-thin naked die IGBT chip |
| CN213068949U (en) * | 2020-09-15 | 2021-04-27 | 苏州韬盛电子科技有限公司 | Automatic lead positive chip test socket |
| CN112327139A (en) * | 2020-11-04 | 2021-02-05 | 上海航天科工电器研究院有限公司 | Chip testing device |
| CN112444734A (en) * | 2020-11-26 | 2021-03-05 | 苏州韬盛电子科技有限公司 | Chip testing machine and chip testing method |
| CN112630615A (en) * | 2020-12-10 | 2021-04-09 | 华北电力大学 | Crimping type IGBT chip dynamic characteristic experiment platform and measuring method |
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| Publication number | Publication date |
|---|---|
| CN113203943B (en) | 2021-09-14 |
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