CN113132521A - Mobile terminal soft fault testing method and system - Google Patents
Mobile terminal soft fault testing method and system Download PDFInfo
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Abstract
The invention relates to the technical field of radiation effect evaluation, and discloses a method and a system for testing soft faults of a mobile terminal, which comprises the following steps of enabling the mobile terminal to be tested to be in a test mode; performing irradiation test on the mobile terminal to be tested by using neutron beam; controlling the mobile terminal to be tested to run different application functions; monitoring the mobile terminal to be tested, observing and counting error conditions of the mobile terminal to be tested when running different application functions; and distinguishing different soft fault types according to the error condition. And simulating the irradiation of atmospheric neutrons in the real environment on the mobile terminal to be detected by using the neutron beam. And observing and counting error conditions of the mobile terminal to be tested in different operation modes, and distinguishing different soft fault types based on the error conditions of the mobile terminal to be tested. The irradiation test is carried out on the mobile terminal to be tested through the high-flux neutron source, the soft fault type possibly existing in the mobile terminal to be tested is rapidly excited, and effective data support is provided for product research personnel.
Description
Technical Field
The invention relates to the technical field of radiation effect evaluation, in particular to a mobile terminal soft fault testing method and system.
Background
An invisible and untouchable dangerous particle, namely atmospheric neutron, exists in the environment of our daily life, and is derived from the interaction of high-energy cosmic rays and the earth atmosphere. Atmospheric neutrons are extremely permeable and widely distributed over the ground and throughout the air space. The single event effect caused by atmospheric neutron bombardment on semiconductor devices and integrated circuits can cause the problems of data inversion, function error, crash and even catastrophic burnout of the devices. A processor and a memory chip in a mobile phone system are sensitive components of atmospheric neutron single event effect and are also the root cause of soft fault of the system. Random atmospheric neutrons in a ground environment enter a mobile phone system and bombard a mobile phone processor to possibly cause the program operation error of the mobile phone and bombard a memory chip to possibly cause the data error of the mobile phone. Therefore, at the initial stage of designing the smart phone, the problem of soft failure caused by atmospheric neutrons needs to be fully considered. Therefore, it is very critical how to design the smart phone with a targeted design for the problem of quickly exposing soft faults in the smart phone.
Disclosure of Invention
Based on this, it is necessary to provide a method and a system for testing soft faults of a mobile terminal, aiming at the problem of how to quickly expose soft faults in a smart phone.
A mobile terminal soft fault testing method comprises the steps that a mobile terminal to be tested is in a testing mode; performing irradiation test on the mobile terminal to be tested by using neutron beam; controlling the mobile terminal to be tested to run different application functions; monitoring the mobile terminal to be tested, observing and counting error conditions of the mobile terminal to be tested when running different application functions; and distinguishing different soft fault types according to the error condition.
According to the mobile terminal soft fault testing method, the mobile terminal to be tested is in the testing mode. The neutron beam is used for irradiating the mobile terminal to be tested, and the situation that atmospheric neutrons act on the mobile terminal to be tested in the real environment is simulated. And controlling the mobile terminal to be tested to run different application functions, simultaneously measuring the mobile terminal to be tested in real time, and observing and counting error conditions in different running modes. And distinguishing different soft fault types based on the error condition of the mobile terminal to be tested. The mobile terminal soft fault testing method provided by the invention realizes the purpose of manually exciting the soft fault of the mobile terminal to be tested by adopting the neutron source to carry out the irradiation test on the mobile terminal to be tested. Under a severe stress condition, the soft fault type possibly existing in the mobile terminal to be tested is excited, the fault form is determined, and a designer is facilitated to carry out targeted optimization design or targeted fault-tolerant processing.
In one embodiment, a neutron beam is generated using a spallation neutron source.
In one embodiment, the beam spot area of the neutron beam current covers the whole mobile terminal to be tested.
In one embodiment, the controlling the mobile terminal to be tested to run different application functions includes classifying the application functions according to the situation of occupying hardware resources of the mobile terminal to be tested; and according to the classification result, the mobile terminal to be tested runs different application functions by using the self-contained test program in the mobile terminal to be tested.
In one embodiment, the controlling the mobile terminal to be tested to run different application functions includes classifying the application functions according to the situation of occupying hardware resources of the mobile terminal to be tested; developing a preset test program occupying various hardware resources of the mobile terminal to be tested; and utilizing the preset test program according to the classification result to enable the mobile terminal to be tested to run different application functions.
In one embodiment, the mobile terminal to be tested includes a smart phone.
In one embodiment, after the different soft fault types are distinguished according to the error condition, the method further includes analyzing an erroneous data stream in the mobile terminal to be tested based on the different soft fault types, and analyzing a bottom layer problem in the mobile terminal to be tested corresponding to the different soft fault types.
A mobile terminal soft fault test system comprises an irradiation device, a soft fault detection device and a soft fault detection device, wherein the irradiation device is used for generating neutron beam current to perform irradiation test on a mobile terminal to be tested under a test mode; the control device is used for enabling the mobile terminal to be tested to be in a test mode and controlling the mobile terminal to be tested to run different application functions; the data acquisition device is connected with the control device and is used for monitoring the mobile terminal to be tested, observing and counting error conditions of the mobile terminal to be tested when different application functions are operated; the control means is further arranged to distinguish between different soft fault types depending on the error condition.
In one embodiment, the irradiation device comprises a spallation neutron source.
In one embodiment, the mobile terminal soft fault testing system further includes a communication module, which is respectively connected to the control device and the mobile terminal to be tested, and is configured to implement data transmission between the control device and the mobile terminal to be tested.
Drawings
In order to more clearly illustrate the embodiments of the present specification or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only some embodiments described in the specification, and other drawings can be obtained by those skilled in the art without inventive labor.
Fig. 1 is a flowchart illustrating a method for testing soft faults of a mobile terminal according to an embodiment of the present invention;
fig. 2 is a flowchart illustrating a method for controlling a mobile terminal to be tested to run different application functions according to an embodiment of the present invention;
fig. 3 is a flowchart of a method for controlling a mobile terminal to be tested to run different application functions according to another embodiment of the present invention;
fig. 4 is a block diagram of a mobile terminal soft fault testing system according to an embodiment of the present invention.
Detailed Description
To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. As used herein, the terms "vertical," "horizontal," "left," "right," "upper," "lower," "front," "rear," "circumferential," and the like are based on the orientation or positional relationship shown in the drawings for ease of description and simplicity of description, and do not indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and are therefore not to be considered limiting of the present invention.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
At present, the functions of a smart phone system are more and more powerful, and the smart phone system has more and more powerful operation and processing functions, which mainly depend on an advanced processor. However, smart phones with advanced-technology vlsi processors as the core "brain" face the problem of high-energy cosmic ray impact from the ground. The sensitivity of integrated circuit processors to cosmic rays has led to soft failures caused by cosmic rays being an important factor that must be considered when investigating the reliability of integrated circuits. In the ground environment, atmospheric neutrons cause the integrated circuit to generate a single event effect, which is the most main cause of soft failure of an electronic system. The phenomenon of Single Event Upset (SEU) may cause errors and loss of device storage information, may trigger a Single Event Latch (SEL) to cause large-current burnout of an integrated circuit, and may also cause errors such as function interruption (SEFI) of a very large scale integrated circuit.
A processor and a memory chip in a mobile phone system are sensitive components of atmospheric neutron single event effect and are also the root cause of soft fault of the system. Random atmospheric neutrons in the ground environment enter the mobile phone system and bombard the mobile phone processor to possibly cause program operation errors and bombard the memory chip to possibly cause data errors. Some chip errors cannot be expressed in the system function, and are invisible errors, and some chip errors can be expressed in the system application level functional errors, namely, explicit errors. Explicit errors can cause serious consequences such as temporary interruptions in communications, mobile computing errors, crashes, and the like. Therefore, the problem of soft failure needs to be fully considered at the early stage of designing the smart phone.
Fig. 1 is a flowchart of a method for testing a soft failure of a mobile terminal according to an embodiment of the present invention, where the method for testing a soft failure of a mobile terminal includes the following steps S100 to S500.
S100: so that the mobile terminal under test is under test mode.
S200: and performing irradiation test on the mobile terminal to be tested by using neutron beam.
S300: and controlling the mobile terminal to be tested to run different application functions.
S400: and monitoring the mobile terminal to be tested, and observing and counting error conditions of the mobile terminal to be tested when different application functions are operated.
S500: and distinguishing different soft fault types according to the error condition.
The Soft fault (Soft Error) refers to the effect that single-event upset, single-event transient pulse, multi-bit upset and the like cannot cause hard damage to the device.
And providing a mobile terminal needing to be subjected to a soft fault test, adjusting the mobile terminal to be tested to be under a test mode, and placing the mobile terminal to be tested in a neutron irradiation environment for irradiation test. One of the most important factors for the potential failure of mobile terminals is the ground high-energy cosmic rays (mainly atmospheric neutrons). When a high-energy cosmic ray of the ground strikes a mobile phone chip, internal control bit data can be turned over or the function of the mobile phone chip is interrupted, and then the control bit data is transmitted between system hardware of the mobile terminal, so that a soft fault is caused. Atmospheric neutrons are ubiquitous, but the probability of excitation is not high. Therefore, the latent fault type of the mobile terminal can be excited in a short time by irradiating the mobile terminal with a manually provided high-flux neutron source, so that targeted fault tolerance improvement can be performed on the latent fault type. The method comprises the steps of enabling the mobile terminal to be tested to run different application functions in an irradiation environment, monitoring the mobile terminal to be tested in real time while irradiating, observing and counting error conditions of the mobile terminal to be tested when running different application functions, and distinguishing different soft fault types according to the error conditions.
The mobile terminal soft fault testing method provided by the invention realizes the purpose of manually exciting the soft fault of the mobile terminal to be tested by adopting the artificial neutron source to carry out the irradiation test on the mobile terminal to be tested. Under a severe stress condition, soft fault types possibly existing in the mobile terminal to be tested are excited, fault forms are determined, and product research personnel can carry out targeted optimization design according to the soft fault types.
In one embodiment, the soft fault test is mainly performed on a smart phone, and the mobile terminal to be tested comprises the smart phone. In general, newly developed smart phones require extensive and lengthy debugging and trial runs to find out and improve their potential soft failures. The method and the system utilize the neutron source to carry out rapid irradiation on the smart phone, can excite the type of the potential soft fault in the smart phone in a short time, and are convenient for product research personnel to carry out targeted fault-tolerant design on the potential soft fault.
In one embodiment, a spallation neutron source is used for generating the neutron beam, namely, a spallation neutron source is selected for manufacturing a neutron irradiation environment. When a medium-energy proton hits a heavy nucleus (tungsten, mercury and other elements), the heavy nucleus is unstable and 20-30 neutrons are evaporated, so that the heavy nucleus is cracked and emits a great amount of neutrons in all directions, and the neutron generation efficiency is greatly improved. The main characteristics of the neutron beam provided by the spallation neutron source include: a) the energy spectrum is wide, and high-energy neutrons are covered, so that the high similarity between the provided neutron irradiation environment and the atmospheric neutron distribution in the real environment can be ensured; b) the fluence rate is high, and the fluence rate of the spallation neutron source is usually 1 x 106Per cm2And the fault mode of the mobile terminal to be tested can be quickly exposed in a short time. Fluence rate refers to the number of neutrons accumulated per second, usually in units of counts/cm2And s. The spallation source can generally adjust the fluence rate when generating the neutron beam current, so that the appropriate fluence rate can be selected based on the test requirements in the actual test.
In one embodiment, the beam spot area of the neutron beam current covers the whole mobile terminal to be tested. The beam spot area of the neutron beam is determined by the adjustment of the spallation source. Therefore, the neutron beam current condition that the selected irradiation area can cover the mobile terminal to be tested can be adjusted in advance before the soft fault test is carried out. When the mobile terminal to be detected is irradiated, the beam spot area of the neutron beam can cover the whole mobile terminal to be detected.
Fig. 2 is a flowchart of a method for controlling a mobile terminal to be tested to run different application functions according to an embodiment of the present invention, where in an embodiment, the controlling the mobile terminal to be tested to run different application functions includes the following steps S310 to S320.
S310: and classifying the application functions according to the condition of occupying the hardware resources of the mobile terminal to be tested.
S320: and according to the classification result, the mobile terminal to be tested runs different application functions by using the self-contained test program in the mobile terminal to be tested.
The mobile terminal under test may include a variety of different application functions when in use. For example, when the mobile terminal to be tested is a smart phone, the smart phone includes application functions such as photographing, talking, and playing music. Hardware resources occupied by different application functions are different, and for example, hardware resources such as a camera and a memory in a mobile phone may be occupied when a picture is taken. The application functions are classified according to the condition that the application functions occupy the hardware resources of the mobile terminal to be tested, for example, all the application functions which need to occupy the memory during running can be classified into one class.
And carrying out classification test on the mobile terminal to be tested according to the classification result, and enabling the mobile terminal to be tested to run a program carried by the mobile terminal to be tested so as to enable the mobile terminal to be tested to run different application functions. For example, the smart phone is controlled to start a camera program carried by the smart phone, so that the mobile terminal to be tested operates a photographing function, and the memory of the mobile terminal is in an operating state to perform an irradiation test on the smart phone. And under the state that a certain application function is operated, the mobile terminal to be tested is placed in a neutron irradiation environment for irradiation, and meanwhile, the error mode of the mobile terminal to be tested at the moment is observed and counted. The error mode can be disconnection in the conversation process, code stream abnormity in music playing, image error in photographing and the like. For example, when the mobile phone receives radiation under the condition of operating the photographing function, whether the mobile phone has error conditions such as image error, flash back, black screen and the like is observed, and various error conditions are counted. And correspondingly analyzing and judging the potential soft fault type in the mobile terminal to be tested according to the condition that the mobile terminal to be tested occupies the hardware resource of the mobile terminal to be tested and various error conditions.
In one embodiment, the test may be performed only for an error condition of a specific function of the mobile terminal to be tested. And preparing the mobile terminal to be tested, enabling the mobile terminal to be in a specific program running or testing mode, and placing the mobile terminal in a neutron irradiation environment for irradiation. And measuring the mobile terminal to be detected in real time while irradiating, observing and counting the error condition of the mobile terminal to be detected in a specific operation mode, and correspondingly judging the soft fault problem possibly existing in the mobile terminal to be detected according to the error condition of the mobile terminal to be detected in the specific operation mode.
Fig. 3 is a flowchart of a method for controlling a mobile terminal to be tested to run different application functions according to another embodiment of the present invention, where in one embodiment, the controlling the mobile terminal to be tested to run different application functions includes the following steps S330 to S350.
S330: and classifying the application functions according to the condition of occupying the hardware resources of the mobile terminal to be tested.
S340: and developing a preset test program occupying various hardware resources of the mobile terminal to be tested.
S350: and utilizing the preset test program according to the classification result to enable the mobile terminal to be tested to run different application functions.
Likewise, the mobile terminal under test may include a variety of different application functions when in use. For example, when the mobile terminal to be tested is a smart phone, the smart phone includes application functions such as photographing, talking, and playing music. Hardware resources occupied by different application functions are different, and for example, hardware resources such as a camera and a memory in a mobile phone may be occupied when a picture is taken. The application functions are classified according to the condition that the application functions occupy the hardware resources of the mobile terminal to be tested, for example, all the application functions which need to occupy the memory during running can be classified into one class.
Aiming at various hardware resources in the mobile terminal to be tested, a preset test program capable of occupying various hardware resources is developed. That is, a special test program is developed, so that when the mobile terminal to be tested runs the preset test program, the hardware resource of the mobile terminal to be tested can be in a maximum running state. For example, a smart phone may include hardware resources such as a memory, a processor, or a power chip, and different hardware resources may perform corresponding reference functions. A special test program can be developed for the memory, and when the test program is operated, the mobile terminal to be tested can be enabled to operate a certain specific application function, and the memory is ensured to be in a maximum operation state.
And performing classification test on the mobile terminal to be tested according to the classification result, and enabling the mobile terminal to be tested to run different preset test programs, so that the mobile terminal to be tested runs different application functions. When the mobile terminal to be tested runs a certain preset test program, the mobile terminal to be tested is placed in a neutron irradiation environment for irradiation, meanwhile, the error mode of the mobile terminal to be tested appearing at the moment is observed and counted, and the error condition is counted. And correspondingly analyzing and judging the potential soft fault type in the mobile terminal to be tested according to the condition that the mobile terminal to be tested occupies the hardware resource of the mobile terminal to be tested and various error conditions.
It should be understood that although the various steps in the flowcharts of fig. 1-3 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 1-3 may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, which are not necessarily performed in sequence, but may be performed in turn or alternately with other steps or at least some of the other steps or stages.
In one embodiment, after different soft fault types are distinguished according to the error condition, the mobile terminal soft fault testing method further includes analyzing an erroneous data stream in the mobile terminal to be tested based on the different soft fault types, and analyzing a bottom layer problem in the mobile terminal to be tested corresponding to the different soft fault types. The soft faults include single event upset, single event transient pulse, multi-bit upset and the like which can not cause hard damage to the device. The bottom layer problems corresponding to different soft fault types are different, for example, the logic state of the circuit changes due to single event radiation during single event upset, that is, logic "1" changes into logic "0", or logic "0" changes into logic "1", which causes the logic function of the circuit to be disordered. Therefore, after the potential soft fault type in the mobile terminal to be tested is obtained, it can be determined where the data stream in the device may be in error according to the soft fault type, and which underlying problems exist in the mobile terminal to be tested are corresponded. Based on the design, product developers can make targeted product fault-tolerant designs.
Fig. 4 is a block diagram of a soft fault testing system of a mobile terminal according to an embodiment of the present invention. In one embodiment, the mobile terminal soft fault testing system comprises an irradiation device 100, a control device 200 and a data acquisition device 300. And the irradiation device 100 is used for generating neutron beam current to perform irradiation test on the mobile terminal to be tested under the test mode. The control device 200 is configured to enable the mobile terminal to be tested to be in a test mode, and control the mobile terminal to be tested to run different application functions. And the data acquisition device 300 is connected with the control device 200 and is used for monitoring the mobile terminal to be tested, observing and counting error conditions of the mobile terminal to be tested when different application functions are operated. The control device 200 is further adapted to distinguish between different soft fault types depending on the error condition.
Providing a mobile terminal needing to perform a soft fault test, connecting the control device 200 and the data acquisition device 300 with the mobile terminal 10 to be tested, and adjusting the mobile terminal 10 to be tested to be under a test mode. The irradiation device 100 is used for generating neutron beam to create a neutron irradiation environment, and the mobile terminal 10 to be tested in the test mode is placed in the neutron irradiation environment to receive irradiation of the neutron beam. The control device 200 controls the mobile terminal 10 to be tested to run different application functions, and meanwhile, the data acquisition device 300 monitors output data of the mobile terminal 10 to be tested, observes and counts error conditions of the mobile terminal 10 to be tested when running different application functions. The control device 200 distinguishes various soft fault types possibly existing in the mobile terminal to be tested according to the statistical error condition of the data acquisition device 300.
The mobile terminal soft fault testing device provided by the invention can excite the potential fault type of the mobile terminal in a short time under a severe stress condition by irradiating the mobile terminal by using a manually provided high-flux neutron source, so that the targeted fault tolerance improvement can be carried out on the potential fault type. By knowing the fault form existing in the mobile terminal, effective data support can be provided for product research personnel, and the product research personnel can be helped to carry out targeted optimization design on the mobile terminal according to the soft fault type.
In one embodiment, the irradiation device 100 is a spallation neutron source, the control device 200 is a main control computer, and the mobile terminal 10 to be tested is a smart phone. The spallation neutron source can provide neutron beam with wide energy spectrum, and the similarity with the atmospheric neutrons of the real environment is ensured. The main control computer can control the intelligent mobile phone to run a specific program, observe the error condition of the intelligent mobile phone on line and record data output by the intelligent mobile phone. The main control computer can also perform off-line analysis on the recorded data after completing the irradiation test on the smart phone.
In one embodiment, the mobile terminal soft fault testing system further comprises a communication module. The communication module is respectively connected with the control device 200 and the mobile terminal 10 to be tested, and is used for realizing data transmission between the control device and the mobile terminal to be tested. In this embodiment, the communication module is a USB data line, USB interfaces are disposed on the mobile terminal 10 to be tested and the control device 200, and the control device 200 and the mobile terminal 10 to be tested are connected by using the USB data line. The control device 200 controls the mobile terminal 10 to be tested to run a specific program through the USB data line, and observes an error condition thereof on line. The mobile terminal 10 to be tested transmits the output data to the control device 200 through the USB data line, and the control device 200 records the data in real time.
In the description herein, references to the description of "some embodiments," "other embodiments," "desired embodiments," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, a schematic description of the above terminology may not necessarily refer to the same embodiment or example.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A mobile terminal soft fault testing method is characterized by comprising the following steps:
enabling the mobile terminal to be tested to be under a test mode;
performing irradiation test on the mobile terminal to be tested by using neutron beam;
controlling the mobile terminal to be tested to run different application functions;
monitoring the mobile terminal to be tested, observing and counting error conditions of the mobile terminal to be tested when running different application functions;
and distinguishing different soft fault types according to the error condition.
2. The mobile terminal soft fault testing method of claim 1, wherein a spallation neutron source is utilized to generate a neutron beam.
3. The mobile terminal soft fault testing method of claim 2, wherein a beam spot area of the neutron beam current covers the whole mobile terminal to be tested.
4. The method for testing the soft fault of the mobile terminal according to claim 1 or 2, wherein the controlling the mobile terminal to be tested to run different application functions comprises:
classifying the application functions according to the condition of occupying the hardware resources of the mobile terminal to be tested;
and according to the classification result, the mobile terminal to be tested runs different application functions by using the self-contained test program in the mobile terminal to be tested.
5. The method for testing the soft fault of the mobile terminal according to claim 1, wherein the controlling the mobile terminal to be tested to run different application functions comprises:
classifying the application functions according to the condition of occupying the hardware resources of the mobile terminal to be tested;
developing a preset test program occupying various hardware resources of the mobile terminal to be tested;
and utilizing the preset test program according to the classification result to enable the mobile terminal to be tested to run different application functions.
6. The method for testing the soft fault of the mobile terminal according to claim 1, wherein the mobile terminal to be tested comprises a smart phone.
7. The method for testing soft faults of a mobile terminal according to claim 1, wherein after the distinguishing of different soft fault types according to the error condition, the method further comprises:
and analyzing the data flow which makes mistakes in the mobile terminal to be tested based on the different soft fault types, and analyzing the bottom layer problems in the mobile terminal to be tested corresponding to the different soft fault types.
8. A mobile terminal soft fault testing system, comprising:
the irradiation device is used for generating neutron beam current to carry out irradiation test on the mobile terminal to be tested under the test mode;
the control device is used for enabling the mobile terminal to be tested to be in a test mode and controlling the mobile terminal to be tested to run different application functions;
the data acquisition device is connected with the control device and is used for monitoring the mobile terminal to be tested, observing and counting error conditions of the mobile terminal to be tested when different application functions are operated;
the control means is further arranged to distinguish between different soft fault types depending on the error condition.
9. The mobile terminal soft fault testing system of claim 8, wherein the irradiation device comprises a spallation neutron source.
10. The mobile terminal soft fault testing system of claim 8, wherein the mobile terminal soft fault testing system further comprises:
and the communication module is respectively connected with the control device and the mobile terminal to be tested and used for realizing data transmission between the control device and the mobile terminal to be tested.
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| CN202110238546.0A CN113132521B (en) | 2021-03-04 | Soft fault test method and system for mobile terminal |
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