CN113114414B

CN113114414B - Method and device for determining parameters

Info

Publication number: CN113114414B
Application number: CN202110274832.2A
Authority: CN
Inventors: 唐晓岩; 丁超
Original assignee: Huawei Technologies Co Ltd
Current assignee: Huawei Technologies Co Ltd
Priority date: 2016-03-28
Filing date: 2016-03-28
Publication date: 2022-07-12
Anticipated expiration: 2036-03-28
Also published as: CN113114414A; CN107241160B; CN107241160A

Abstract

The embodiment of the invention provides a method and a device for determining parameters. The method comprises the following steps: determining a first compensation value of a signal required to be transmitted by a transmitting circuit; and determining a pre-emphasis parameter required to be used by the transmitting circuit when transmitting the signal according to the first compensation value. Compared with the prior art, the technical scheme provided by the embodiment of the invention can flexibly determine the pre-emphasis parameter.

Description

Method and device for determining parameters

The application is a division of 2016 filed on 3/28 days of the year, and filed under the name of 201610181335.7 by the patent office of the national intellectual property office.

Technical Field

The present invention relates to the field of communications, and in particular, to a method and apparatus for determining parameters in the field of communications.

Background

The transmission circuit and the reception circuit are components in a network device. The network device communicates through the transmission circuit and the reception circuit. For example, the router 1 transmits a packet to the router 2 through a transmission circuit. The router 2 receives the message sent by the router 1 through the receiving circuit. A Serializer/Deserializer (Serdes) is an interface for realizing high-speed communication. Serdes may be applied in network devices such as routers, switches, etc. For example, the serializer may be included in the transmission circuit of the router 1. The deserializer may be included in the receive circuit of the router 2.

To improve the signal-to-noise ratio of the transmitted signal, the transmit circuit may employ a pre-emphasis mechanism. The transmitting circuit may pre-emphasize the signal and then transmit the pre-emphasized signal to the receiving circuit. For example, the transmit circuitry may determine the pre-emphasis parameters by accessing pre-stored pre-emphasis parameters. Then, the transmitting circuit performs pre-emphasis processing on the signal to be transmitted according to the pre-emphasis parameter. In the above scheme, the determination mode of the pre-emphasis parameter is not flexible enough.

Disclosure of Invention

The embodiment of the invention provides a method and a device for determining parameters, which can flexibly determine pre-emphasis parameters.

In a first aspect, an embodiment of the present invention provides a method for determining a parameter, including:

the circuit determines a first compensation value of a signal required to be transmitted by a transmitting circuit;

the circuit determines a pre-emphasis parameter to be used by the transmitting circuit when transmitting the signal according to the first compensation value.

According to the embodiment of the invention, the pre-emphasis parameter can be determined according to the first compensation value. Compared with the prior art, the embodiment of the invention can flexibly determine the pre-emphasis parameters.

Optionally, the determining a first compensation value of a signal that needs to be transmitted by the transmission circuit includes:

determining a first insertion loss value of the signal transmitted by the transmitting circuit according to the functional relation between the frequency and the insertion loss value;

and determining the first compensation value according to the first insertion loss value.

As an example, determining the first compensation value based on the first insertion loss value includes: determining a first allocation ratio beta of the transmitting circuit according to the relation between the first insertion loss value and the compensation capability of the transmitting circuit; a first compensation value for the transmit circuit is determined based on a first allocation ratio beta for the transmit circuit.

As another example, determining the first compensation value based on the first insertion loss value includes: determining a second allocation ratio (1-beta) of the receiving circuit and a first allocation ratio beta of the transmitting circuit according to the relation between the first insertion loss value and the compensation capability of the receiving circuit; a first compensation value for the transmission circuit is determined based on the first allocation ratio beta of the transmission circuit.

For example, the compensation capability of the transmission circuit is denoted as E_kSaid first insertion loss value is denoted as IL_kIf E is_k>IL_kBeta can be 20-30%; if E_k<IL_kAnd beta can be 70-80%.

Here, the first compensation value is a product of the first allocation ratio and a first insertion loss value, and the second compensation value is a product of the second allocation ratio and the first insertion loss value.

According to the embodiment of the invention, the appropriate distribution ratio can be flexibly determined according to the compensation capability of a specific sending circuit or a specific receiving circuit, and then the compensation values of the sending circuit and the receiving circuit to the link can be respectively determined according to the distribution ratio.

Optionally, determining the first compensation value according to the first insertion loss value includes: and determining the first compensation value according to the first insertion loss value and a first temperature correction coefficient.

For example, at high temperatures, the first insertion loss value may be (1+ ζ%) times the insertion loss value obtained according to the functional relationship; at low temperatures, the first insertion loss value may be (1- ζ%) times the insertion loss value obtained from the functional relationship, where ζ is the first temperature correction coefficient described above, and may be estimated from the sheet and link conditions or given from measured empirical values.

Optionally, before determining the first insertion loss value of the signal sent by the sending circuit, the method further includes:

acquiring the amplitude of each test signal in two test signals, wherein the frequencies of the two test signals are not equal, and the two test signals are not subjected to pre-emphasis processing;

determining an insertion loss value of each test signal according to the amplitude of each test signal;

and determining the functional relation according to the insertion loss value of each test signal and the frequency of each test signal.

Here, the two test signals may be clock test patterns of different frequencies, and different transmission symbol periods may be defined for the clock test patterns of the same frequency, so that the receiving circuit may reduce errors by taking an average value through multiple sampling sums. The test pattern may be obtained by using Serdes half-rate, 1/4-rate, or the like, in addition to the custom pattern.

In the embodiment of the present invention, when the at least two test signals are transmitted, the frequency of each test signal may also be determined.

In embodiments of the present invention, the insertion loss value of each test signal may be determined according to the amplitude of each test signal and the initial amplitude of each test signal. Specifically, the amplitude of each test signal and the initial amplitude of each test signal have the following functional relationship:

in the embodiment of the present invention, the functional relationship may be an insertion loss fitting curve. In general, since the insertion loss fitting curve is approximately linear, it is possible to set, by using straight line fitting:

IL＝a₁×F+a₂

from the obtained insertion loss value and frequency of each test signal, the coefficient a in the above equation can be determined₁And a₂。

Optionally, the determining the functional relationship according to the insertion loss value of each test signal and the frequency of each test signal includes: and determining the functional relation of the link according to the insertion loss value of each test signal, the frequency of each test signal and a second temperature correction coefficient.

At this time, it is possible to set:

IL＝t₁×a₁×F+a₂+t₀

wherein, t₁And t₀The second temperature correction coefficient can be estimated according to the plate and link conditions or given according to measured empirical values.

Alternatively, at high temperatures, the insertion loss value may be (1+ ζ%) times the insertion loss value IL obtained according to the functional relationship; at low temperatures, the insertion loss value may be (1- ζ%) times the insertion loss value IL obtained from the functional relationship.

When the insertion loss fitting curve of the link is determined, the first temperature correction coefficient or the second temperature correction coefficient is introduced to correct the curve of the frequency and the insertion loss value of the link, so that the curve can be adaptive under different temperature conditions, and the error code risk of the link is reduced or avoided.

Optionally, the method is performed by a control circuit, and before the determining the amplitude of each of the two test signals, the method further includes:

sending a first instruction to the sending circuit, the first instruction being used to instruct the sending circuit to send the two test signals to the receiving circuit;

sending a second instruction to the receive circuitry, the second instruction to instruct the receive circuitry to determine an amplitude of the each test signal;

receiving the amplitude of each test signal sent by the receiving circuit.

Optionally, the method is performed by the receiving circuit, and before determining the amplitude of each of the two test signals, the method further includes: and receiving the at least two test signals sent by the sending circuit.

Optionally, after determining the first compensation value of the signal that needs to be transmitted by the transmitting circuit, the method further includes:

determining a second compensation value for the receive circuit;

and determining an equalization parameter according to the second compensation value and the signal which is transmitted by the transmission circuit and is subjected to pre-emphasis processing by the transmission circuit according to the pre-emphasis parameter.

The receiving circuit may determine an equalization parameter based on the second compensation value and the received signal. For example, the receiving circuit determines a reference value of the equalization parameter by calculating simulation or table lookup, and the reference value can be used to determine whether the equalization parameter adaptively obtained by the receiving circuit is reasonable.

Optionally, the method further includes: transmitting the pre-emphasis parameter to the transmit circuit.

Optionally, the method is performed by the transmitting circuit, and before determining the amplitude of each of the two test signals, the method further includes:

sending two test signals to a receiving circuit;

the determining an amplitude of each of the two test signals comprises:

receiving the amplitude of each test signal sent by the receiving circuit.

determining a second compensation value for the receive circuit;

and sending the second compensation value to the receiving circuit, so that the receiving circuit determines an equalization parameter according to the second compensation value and the signal sent by the sending circuit according to the pre-emphasis parameter.

Optionally, the method is performed by a transmitting circuit, and the determining a first compensation value of a signal that needs to be transmitted by the transmitting circuit includes receiving the first compensation value transmitted by a receiving circuit.

Optionally, before the receiving the first compensation value sent by the receiving circuit, the method further includes: two test signals are sent to a receiving circuit so that the receiving circuit determines the first compensation value according to the two test signals.

Optionally, the determining, according to the first compensation value, a pre-emphasis parameter that needs to be configured when the sending circuit sends the signal includes: determining the pre-emphasis parameter according to the following formula:

|pos|＝γ×|pre|

|pre|+|main|+|pos|≤τ

wherein the EP_kRepresenting said first compensation value, main, pre and pos representing respectively three components, Log, of said pre-emphasis parameter₁₀The expression takes logarithm with 10 as the base, | · | represents modulus, γ and τ are preset values greater than zero.

In a second aspect, an embodiment of the present invention provides an apparatus for determining a parameter, which is configured to perform the method in the first aspect or any possible implementation manner of the first aspect, and specifically, the apparatus includes a module configured to perform the method in the first aspect or any possible implementation manner of the first aspect.

In a third aspect, an embodiment of the present invention provides an apparatus for determining a parameter, where the apparatus includes: memory, processor, transceiver and bus system. Wherein the memory and the processor are connected by the bus system, the memory is configured to store instructions, the processor is configured to execute the instructions stored by the memory, and when the processor executes the instructions stored by the memory, the execution causes the processor to execute the first aspect or the method in any possible implementation manner of the first aspect.

In a fourth aspect, an embodiment of the present invention provides a computer-readable medium for storing a computer program including instructions for executing the method of the first aspect or any possible implementation manner of the first aspect.

In a fifth aspect, an embodiment of the present invention is a method for determining a parameter, where the method is performed by a receiving circuit, and includes:

determining a first compensation value of a signal required to be transmitted by a transmitting circuit;

and sending the first compensation value to the sending circuit so that the sending circuit determines a pre-emphasis parameter according to the first compensation value.

As an example, determining the first compensation value based on the first insertion loss value includes: determining a first allocation ratio beta of the transmitting circuit according to the relation between the first insertion loss value and the compensation capability of the transmitting circuit; a first compensation value for the transmission circuit is determined based on the first allocation ratio beta of the transmission circuit.

For example, the compensation capability of the transmission circuit is denoted as E_kSaid first insertion loss value is denoted as IL_kIf E is_k>IL_kBeta can be 20-30%; if E_k<IL_kBeta can be 70-80%.

According to the embodiment of the invention, the appropriate distribution ratio can be flexibly determined according to the compensation capability of specific equipment, and then the compensation values of the transmitting circuit and the receiving circuit to the link can be respectively determined according to the distribution ratio.

Optionally, the determining the first compensation value according to the first insertion loss value includes: and determining the first compensation value according to the first insertion loss value and a first temperature correction coefficient.

Optionally, before determining the insertion loss value of the signal transmitted by the transmitting circuit, the method further includes:

receiving two test signals sent by the sending circuit, wherein the frequencies of the two test signals are not equal, and the two test signals are not subjected to pre-emphasis processing;

determining an amplitude of each of the two test signals;

Here, the two test signals may be clock test patterns with different frequencies, and the clock test patterns with the same frequency may define different transmission symbol periods, so that the receiving circuit may reduce errors by performing sampling and averaging for multiple times. Besides the custom patterns, the test patterns can also be used in Serdes half speed, 1/4 speed, etc.

In an embodiment of the present invention, the insertion loss value of each test signal may be determined according to the amplitude of each test signal and the initial amplitude of each test signal. Specifically, the amplitude of each test signal and the initial amplitude of each test signal have the following functional relationship:

in the embodiment of the present invention, the functional relationship may be an insertion loss fitting curve. In general, since the insertion loss fitting curve is approximately linear, a straight line fitting may be employed to set:

IL＝a₁×F+a₂

At this time, it is possible to set:

IL＝t₁×a₁×F+a₂+t₀

Optionally, the method further includes:

determining a second compensation value for the receive circuit;

and determining an equalization parameter according to the second compensation value and the signal which is sent by the sending circuit and is subjected to pre-emphasis processing by the sending circuit according to the pre-emphasis parameter.

In a sixth aspect, an embodiment of the present invention provides an apparatus for determining a parameter, which is configured to perform the method in any possible implementation manner of the fifth aspect or the fifth aspect, and specifically, the apparatus includes a module configured to perform the method in any possible implementation manner of the fifth aspect or the fifth aspect.

In a seventh aspect, an embodiment of the present invention provides an apparatus for determining a parameter, where the apparatus includes: memory, processor, transceiver, and bus system. Wherein the memory and the processor are connected by the bus system, the memory is configured to store instructions, the processor is configured to execute the instructions stored by the memory, and when the processor executes the instructions stored by the memory, the execution causes the processor to execute the method of the fifth aspect or any possible implementation manner of the fifth aspect.

In an eighth aspect, the present invention provides a computer-readable medium for storing a computer program including instructions for executing the method of the fifth aspect or any possible implementation manner of the fifth aspect.

In a ninth aspect, an embodiment of the present invention provides a method for determining a parameter, including:

receiving two test signals sent by a sending circuit, wherein the frequencies of the two test signals are unequal, and the two test signals are not subjected to pre-emphasis processing;

determining an amplitude of each of the two test signals;

sending the amplitude of each test signal to a first circuit so that the first circuit determines a pre-emphasis parameter according to the amplitude, wherein the first circuit is the sending circuit or a control circuit.

Here, the two test signals may be clock test patterns with different frequencies, and the clock test patterns with the same frequency may define different transmission symbol periods, so that the receiving circuit may reduce errors by performing sampling and averaging for multiple times. The test pattern may be obtained by using Serdes half-rate, 1/4-rate, or the like, in addition to the custom pattern.

optionally, before determining the amplitude of each of the at least two non-pre-emphasized test signals with different frequencies, the first circuit is the control circuit, further including:

receiving a first instruction sent by the control circuit, wherein the first instruction is used for instructing the receiving circuit to determine the amplitude of each test signal;

the determining an amplitude of each of the two test signals comprises:

determining an amplitude of each of the two test signals according to the second instructions.

In a tenth aspect, an embodiment of the present invention provides an apparatus for determining a parameter, which is configured to perform the method in any possible implementation manner of the ninth aspect or the ninth aspect, and specifically, the apparatus includes a module configured to perform the method in any possible implementation manner of the ninth aspect or the ninth aspect.

In an eleventh aspect, an embodiment of the present invention provides an apparatus for determining a parameter, where the apparatus includes: memory, processor, transceiver and bus system. Wherein the memory and the processor are connected by the bus system, the memory is used for storing instructions, the processor is used for executing the instructions stored by the memory, and when the processor executes the instructions stored by the memory, the execution causes the processor to execute the method of the ninth aspect or any possible implementation manner of the ninth aspect.

In a twelfth aspect, an embodiment of the present invention provides a computer-readable medium for storing a computer program including instructions for executing the method of the ninth aspect or any possible implementation manner of the ninth aspect.

In a thirteenth aspect, an embodiment of the present invention provides a method for determining a parameter, where the method is performed by a transmitting circuit, and includes:

sending two test signals to a receiving circuit, wherein the frequencies of the two test signals are unequal, and the two test signals are not subjected to pre-emphasis processing;

receiving a pre-emphasis parameter sent by a first circuit, wherein the pre-emphasis parameter is determined by the first circuit according to the two test signals, and the first circuit is the receiving circuit or a control circuit.

Optionally, the first circuit is the control circuit, and before the sending the test signal without pre-emphasis at least one different frequency to the receiving circuit, the method further includes:

receiving a first instruction sent by the control circuit, wherein the first instruction is used for instructing the sending circuit to send the two test signals;

the sending of the two test signals to the receiving circuit comprises:

and sending the two test signals to a receiving circuit according to the first instruction.

In a fourteenth aspect, an embodiment of the present invention provides an apparatus for determining a parameter, which is configured to perform a method in any possible implementation manner of the thirteenth aspect or the thirteenth aspect, and specifically, the apparatus includes a module configured to perform the method in any possible implementation manner of the thirteenth aspect or the thirteenth aspect.

In a fifteenth aspect, an embodiment of the present invention provides an apparatus for determining a parameter, where the apparatus includes: memory, processor, transceiver, and bus system. Wherein the memory and the processor are connected by the bus system, the memory is configured to store instructions, the processor is configured to execute the instructions stored by the memory, and when the processor executes the instructions stored by the memory, the execution causes the processor to perform the method of the thirteenth aspect or any possible implementation manner of the thirteenth aspect.

In a sixteenth aspect, an embodiment of the present invention provides a computer-readable medium for storing a computer program comprising instructions for executing the method of the thirteenth aspect or any possible implementation manner of the thirteenth aspect.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required to be used in the embodiments of the present invention will be briefly described below. It is to be understood that the drawings described below are merely exemplary of some of the embodiments of the invention. For a person skilled in the art, without inventive effort, further figures can be obtained from these figures.

Fig. 1 is a schematic structural diagram of a Serdes link according to an embodiment of the present invention.

Fig. 2 is a schematic structural diagram of a 3-order FIR filter according to an embodiment of the present invention.

Fig. 3 is a schematic flow chart of a method for configuring link parameters according to an embodiment of the present invention.

FIG. 4 is a schematic flow chart diagram of a method of determining a parameter of an embodiment of the present invention.

Fig. 5 is a schematic block diagram of an apparatus for determining a parameter according to an embodiment of the present invention.

FIG. 6 is a schematic flow chart diagram of another method of determining a parameter in accordance with an embodiment of the present invention.

FIG. 7 is a schematic flow chart diagram of another method of determining a parameter in accordance with an embodiment of the present invention.

FIG. 8 is a schematic flow chart diagram of another method of determining a parameter in accordance with an embodiment of the present invention.

FIG. 9 is a schematic flow chart diagram of another method of determining parameters in accordance with an embodiment of the present invention.

FIG. 10 is a schematic block diagram of an apparatus for determining parameters in accordance with an embodiment of the present invention.

Fig. 11 is a schematic block diagram of another apparatus for determining parameters in accordance with an embodiment of the present invention.

Fig. 12 is a schematic block diagram of another apparatus for determining parameters in accordance with an embodiment of the present invention.

Fig. 13 is a schematic block diagram of another apparatus for determining parameters in accordance with an embodiment of the present invention.

Fig. 14 is a schematic block diagram of another apparatus for determining parameters in accordance with an embodiment of the present invention.

Fig. 15 is a schematic block diagram of another apparatus for determining parameters in accordance with an embodiment of the present invention.

Fig. 16 is a schematic block diagram of another apparatus for determining parameters in accordance with an embodiment of the present invention.

Fig. 17 is a schematic block diagram of another apparatus for determining parameters in accordance with an embodiment of the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly described below with reference to the drawings in the embodiments of the present invention. It should be apparent that the described embodiments are only some of the embodiments of the present invention, and not all of the embodiments. Based on the embodiments of the present invention, those skilled in the art can obtain other embodiments without creative efforts.

Fig. 1 is a schematic structural diagram of a serdes link according to an embodiment of the present invention. The Serdes link may include a serializer 104, a Finite Impulse Response (FIR) filter 105, a transmitter 106, an equalizer 111, a Clock and Data Recovery Circuit (CDR) 112, and a deserializer 113. The auxiliary function module of the serdes link shown in fig. 1 further includes a plurality of selectors, such as the plurality of

selectors

101, 103 and 108 in fig. 1, including a signal generator 102, a signal checker 114, a receiver 109, an Automatic Gain Controller (AGC) 110, a loopback circuit (e.g., 107 and 115 in fig. 1), and the like.

The

multiple item selectors

101 and 103 are for selecting one signal output among a plurality of input signals. For example, the multiple item selector 101 selects one signal from the signal 1 and the signal output from the loopback circuit 115 to output to the multiple item selector 103. The multiple-item selector 103 selects one or more signals from the signal output from the multiple-item selector 101 and the signal output from the signal generator 102 to output to the serializer. The signal inputted to the serializer 104 is a parallel signal, the serializer 104 outputs the inputted parallel signal as a serial signal, the FIR filter 105 processes the serial signal, and finally the transmitter 106 transmits the serial signal. The signal transmitted by the Transmitter 106 is called a Transmitter (TX) signal (such as the TXp signal and the TXn signal in fig. 1). The Receiver 109 may receive TX signals transmitted by the transmitter 106, or receive Receiver (RX) signals (such as RXp signals and RXn signals in fig. 1) transmitted by other devices. The signal received by the receiver 109 passes through the AGC110, the equalizer 111, and the CDR112, and finally reaches the deserializer 113. The deserializer 113 outputs a parallel signal from the serial signal processing. The signal detector 114 is used to detect the parallel signal output by the deserializer. The parallel signal output from the deserializer may also be input again to the multiple item selector 101 through the loopback circuit 115.

Since the channel attenuation frequency characteristic is similar to a low pass filter, the pre-emphasis process first identifies the data high frequency part (0-1 or 1-0 hopping symbol) of the output TX signal, and can compensate for the line attenuation of the TX signal by boosting the high frequency component of the high frequency part. The pre-emphasis process is typically implemented using FIR filters. The FIR filter is composed of a Delay circuit (Delay), a multiplier and an adder, the time Delay of the Delay circuit is exactly 1 bit, a gain coefficient (tap level) is the gain of each level of multiplier (amplifier), and an input signal is processed by each level and added to obtain an output waveform.

Fig. 2 is a schematic structural diagram of a 3-order FIR filter according to an embodiment of the present invention. The 3 rd order FIR filter shown in FIG. 2 may beFor implementing the FIR filter 105 shown in fig. 1. Block 201 in fig. 2 represents a delay circuit and block 202 represents a multiplier. 202 module combines serial data with C_XMultiplication. Where C is_XCan be C_t-1，C_tOr C_t+1. Block 203 represents an adder. Block 203 is for adding the products of the respective serial data and Cx. When t is 0, the output formula of the pre-emphasis parameter can be expressed as:

H(Z)＝AMP(C₀×Z_-1+C₁×Z₀+C₂×Z₊₁)

wherein, C₀The order coefficient, referred to as the pre component, is mainly used to compensate for pre-cursor Inter-Symbol Interference (ISI). It can be understood that C₀The order coefficient is used to improve the rising edge of the high frequency signal. C₂The order coefficient, referred to as the post component, is used primarily to compensate for post-cursor ISI. It can be understood that C₂The order coefficient is used to improve the falling edge of the high frequency signal. C₁The order coefficient, called the main component, has an effect on the pulse height.

The receiving side Equalization includes a Continuous Time Linear Equalization (CTLE) and a Decision Feedback Equalizer (DFE). CTLE is used to boost the high frequency components of the RX input signal. CTLE is typically implemented with an on-chip analog filter. The DFE equalizer includes a delay circuit, a multiplier, and an adder. The DFE equalizer is used to cancel intersymbol interference.

In the prior art, the configuration of pre-emphasis parameters and equalization parameters needs to be realized by a parameter scanning method with a large workload. The Internet Engineering Task Force (IEEE) 802.3ap defines a method for adapting the pre-emphasis parameters of the backplane Serdes, and a receiving-end chip of a link sends a command for adjusting the pre-emphasis parameters to a sending-end chip according to the effect of sampling by the receiving end, so as to obtain the appropriate pre-emphasis parameters.

Fig. 3 shows a schematic flow chart of a method 100 for configuring pre-emphasis parameters according to an embodiment of the present invention. The method 100 of configuring pre-emphasis parameters includes:

s110, the sending end sends signals to the receiving end.

Here, the transmitting end may be a transmitting circuit, and may include the above-described devices such as the multi-item selector 101, the signal generator 102, the multi-item selector 103, the serializer 104, the FIR filter 105, and the transmitter 106 in fig. 1. The receiving end may be a receiving circuit, and may include the components of the multiple item selector 108, the receiver 109, the AGC110, the equalizer 111, the CDR112, the deserializer 113, and the signal checker 114 in fig. 1. The signal is a signal that the transmitting end needs to transmit to the receiving end, and may include information that the transmitting end needs to transmit, and the signal may be, for example, a Pseudo-Random Binary Sequence (PRBS). The signal may be an electrical signal having a waveform, such that the signal has a certain initial amplitude, and the signal has a high frequency component and a low frequency component. Here, the high frequency component of the signal transmitted from the transmitting end to the receiving end is subjected to pre-emphasis processing. For example, the high frequency component may be processed by a 3 rd order FIR filter in fig. 2.

S120, the receiving end detects the state of the received signal.

Specifically, the receiving end may use the digital eye diagram function in the Serdes link to obtain the state of the received signal. Here, the state of the signal may be the width and height of an eye pattern of the signal. Specifically, the receiving side detects the state of the received signal under the conditions of equalization and amplitude amplification, that is, the receiving side performs equalization processing and amplitude amplification on the signal in S110 before detecting the signal transmitted in S110, and thus the amplitude of the signal detected in S120 is different from the amplitude of the signal transmitted in S110.

And S130, judging an adjusting mode according to a preset strategy.

Specifically, the receiving end judges the size relationship between the width of the eye pattern of the detected signal and the width threshold and the size relationship between the height of the eye pattern and the height threshold, and adjusts each component of the pre-emphasis parameter by combining the pre-configuration strategy. For example, when the FIR filter in the link is a 3 rd order FIR filter in fig. 2, S130 may determine how to adjust the three components pre, pos, and main. Or the receiving end determines that the pre, pos and main components of the pre-emphasis parameters meet the link requirements according to the pre-configuration strategy without further adjustment.

S140, the receiving end notifies the sending end whether to update the coefficient.

The coefficients are the pre-emphasis parameters or the components of the pre-emphasis parameters. When the receiving end notifies the transmitting end of updating the coefficient, S150 is performed. And when the receiving end informs the sending end that the coefficient is not updated, the process is ended.

In particular, the IEEE802.3ap protocol defines a Training (Training) frame structure. The training Frame structure includes a Frame flag (Frame marker), a control channel (control channel), and a training pattern.

Here, the frame flag occupies 4 bytes, and has a value of 0xFFFF — 0000, and the frame flag does not appear in other bit fields in the normal data and training frames.

The control channel includes a Coefficient update (coeffient update) and a Status report (Status report). The coefficient update occupies 16 bytes, and is a coefficient update instruction sent by the receiving end to the sending end, and the instruction is used for instructing the sending end to adjust the pre-emphasis parameter, or instructing the sending end not to adjust the pre-emphasis parameter coefficient. The status report occupies 16 bytes, is a status report sent by the receiving end to the transmitting end, and is used for informing the tap status of the FIR filter of the transmitter at the transmitting end.

The training pattern takes 512 bytes and is the output of an 11-bit pseudo-random generator, the last two bits being 2' b 00.

The receiving end informs the sending end whether the coefficient needs to be updated or not by sending the training frame structure to the sending end.

S150, the sending end updates the pre-emphasis parameters.

Specifically, the sending end updates the pre-emphasis parameter according to the training frame structure.

After the transmitting end updates the pre-emphasis parameters, the transmitting end continues to transmit the PRBS signal to the receiving end, and executes S110 to S150 until the process is ended.

In the above technical solution, the approaching efficiency in the link initialization stage is relatively low under the influence of the response efficiency between the transmitting end and the receiving end. The convergence time of the training depends on the setting of the initial parameters. The initial parameters are empirically determined and may not be accurate.

Fig. 4 is a schematic flow chart of a method 200 of determining parameters in an embodiment of the present invention. The method for determining the parameter in the embodiment of the present invention may be executed by the first device or the second device, or may be executed by the control module. The first device is, for example, the transmitting end involved in the method shown in fig. 3. The second device is, for example, the receiving end involved in the method shown in fig. 3. The control module is, for example, a control circuit. The method 200 comprises:

s210, determining a first compensation value of a signal which needs to be transmitted by the first device.

The signal that the first device needs to transmit may be a particular pattern in the Serdes link, such as a BPRS. Here, the signal may be the signal in S110 in fig. 3 described above. Specifically, reference may be made to the description in fig. 3, and details are not repeated here to avoid repetition.

Optionally, in this embodiment of the present invention, the insertion loss value of the signal sent by the first device may be determined according to a functional relationship between a frequency and the insertion loss value. Then, the first compensation value is determined based on the insertion loss value. In particular, a first insertion loss value corresponding to a first frequency of a signal transmitted by the first device may be determined from the functional relationship.

Specifically, the signal that the first device needs to transmit has a specific frequency f, and the first insertion loss value corresponding to the frequency f can be determined based on the functional relationship, and further, the first compensation value for the first device to transmit the signal can be determined based on the first insertion loss value.

Optionally, the first compensation value of the signal sent by the first device is determined according to the first insertion loss value, where the first compensation value of the first device is determined according to a size relationship between the first insertion loss value and a compensation capability of the first device, and then the first compensation value of the first device is determined according to the first allocation ratio β of the first device.

Specifically, the compensation capability of the equipment produced by different manufacturers is different. May be based on the first device's ability to compensate for the TX signal (which ability may be denoted as E)_k) The insertion loss value of the current link (the insertion loss value can be expressed as IL)_k) Determine allocation policy, e.g. when E_k>IL_KWhen the beta is needed, the beta can be 20-30 percent; when E is_k<IL_KIn time, the value of beta can be 70% -80%, and the first compensation value of the first device for the TX signal can be improved if the value of beta is larger.

In an embodiment of the present invention, the first compensation value may be a product of the first allocation ratio and the first insertion loss value.

It should be noted that, in the embodiment of the present invention, when it is determined that the first allocation ratio of the first device is β, the second allocation ratio of the second device is (1- β).

Optionally, the first compensation value for the first device to transmit the signal is determined according to the first insertion loss value, where the second allocation ratio (1- β) of the second device and the first allocation ratio β of the first device are determined according to a relationship between the first insertion loss value and a compensation capability of the second device for the RX signal, and then the first compensation value of the first device is determined according to the first allocation ratio β of the first device.

In an embodiment of the present invention, the compensation value of the second device is a second compensation value, and the second compensation value may be a product of the second distribution ratio and the first insertion loss value.

According to the embodiment of the invention, the appropriate distribution ratio can be flexibly determined according to the compensation capability of the specific equipment, and then the compensation values of the first equipment and the second equipment for the signals needing to be sent in the link can be respectively determined according to the distribution ratio.

Optionally, determining the first compensation value according to the first insertion loss value includes: and determining the first compensation value according to the first insertion loss value and the temperature correction coefficient.

For example, at high temperatures, the first insertion loss value may be (1+ ζ%) times the insertion loss value obtained according to the functional relationship; at low temperatures, the first insertion loss value may be (1- ζ%) times the insertion loss value obtained from the functional relationship, where ζ is the above-mentioned temperature correction coefficient, and may be estimated from the sheet and link conditions or given from measured empirical values.

And S220, determining a pre-emphasis parameter required to be used by the first device when sending the signal according to the first compensation value.

In particular, the pre-emphasis parameters may be determined by a table look-up or by simulation according to a formula between the compensation values and the pre-emphasis parameters. The relation table between the compensation value of the TX signal and the pre-emphasis parameter of the devices manufactured by different manufacturers may not be consistent, or the formula between the compensation value of the TX signal and the pre-emphasis parameter of the devices manufactured by different manufacturers may not be consistent, and the pre-emphasis parameter may be determined by referring to the actual parameter of the first device.

Optionally, as an example, the pre-emphasis parameter may be calculated by simulation according to the following formula:

|pos|＝γ×|pre|

for commonly used coefficients and modes, the pre-emphasis parameters also satisfy the following formula:

|pre|+|main|+|pos|≤τ

wherein τ is a sum of pre-emphasis coefficients, γ is a ratio of pos to pre-emphasis coefficients, and values of τ and γ are preset and specifically related to attributes of the first device. Generally, the value of τ can be 64, the value range of γ is generally selected as an empirical value to be 2 to 3, and γ is selected to be more than or equal to 2, so that the rising edge of the signal can be improved.

Optionally, after S220, the method shown in fig. 4 may further include:

the first device pre-emphasizes the signal according to the pre-emphasis parameter to generate a pre-emphasized signal.

For example, the first device may be a transmit circuit. The transmission circuit may include devices such as the multi-item selector 101, the signal generator 102, the multi-item selector 103, the serializer 104, the FIR filter 105, and the transmitter 106 in fig. 1.

Optionally, after S220 and before the first device performs pre-emphasis processing on the signal according to the pre-emphasis parameter, so as to generate a pre-emphasized signal, the method shown in fig. 4 may further include:

and the first equipment configures the FIR filter according to the pre-emphasis parameters.

Specifically, the first device configures the FIR filter according to each component of the pre-emphasis parameter determined in S220 described above. For example, after the first device determines the three components of pre, main, and pos, module C of

modules

201, 202, and 203 in FIG. 2 may be considered₀Coefficient of order, C₁Coefficient of order and C₂And setting an order coefficient.

Optionally, the pre-emphasis processing, performed by the first device, on the signal according to the pre-emphasis parameter specifically includes: a FIR filter in the first device pre-emphasizes the signal.

The sending, by the first device, the pre-emphasis processed signal specifically includes:

the first device sends the pre-emphasis processed signal to a receive circuit.

For example, the receiving circuit may include the components of the multiple item selector 108, receiver 109, AGC110, equalizer 111, CDR112, deserializer 113, and signal checker 114 of fig. 1, described above.

Specifically, after the first device configures the pre-emphasis parameter, a signal that the first device needs to transmit to the second device in S110 may be transmitted to the second device. When the signal passes through the FIR filter, the high frequency component of the signal can be identified, and the FIR filter can perform pre-emphasis processing on the high frequency component of the signal. The method and the device for determining the pre-emphasis parameters comprise the steps that first compensation values of signals needing to be sent by first equipment are determined, then pre-emphasis parameters needing to be configured when the first equipment sends the signals are determined according to the first compensation values, and the first equipment can send the signals to second equipment according to the pre-emphasis parameters. According to the embodiment of the invention, the pre-emphasis parameters can be configured for the Serdes link according to the first compensation value. The embodiment of the invention can flexibly configure the pre-emphasis parameters for the links, thereby enabling the signals in the Serdes links to be transmitted reliably and efficiently.

The configuration for implementing the above-mentioned determined parameter in the embodiment of the present invention may be designed in a chip of the first device and/or the second device, and at this time, the control codeword channel of 802.3ap may be used to implement sending and receiving signals.

Optionally, in this embodiment of the present invention, before determining an insertion loss value of the signal transmitted by the first device, a functional relationship between the frequency and the insertion loss value may also be determined.

Specifically, determining the functional relationship may include: determining an amplitude of each of the two test signals; determining an insertion loss value of each test signal according to the amplitude of each test signal; and determining the functional relation according to the insertion loss value of each test signal and the frequency of each test signal.

Wherein, the frequencies of the two test signals are different. Each test signal is transmitted by the first device to the second device under a shut down emphasis condition. Thus, each signal is not pre-emphasized. And the amplitude of each test signal is determined by the second device with equalization turned off and amplitude amplification turned off.

Fig. 5 shows a schematic block diagram of the entity of the first device and the second device for determining parameters according to a specific embodiment of the present invention. In the embodiment of the present invention, a test frame transceiver module and a logic state machine are designed between a Physical Coding Sublayer (PCS) of the first device 11 and a Physical Coding Sublayer (PCS) of the second device 12 and a Serdes Internet Protocol Core (Internet Protocol Core). And the first device and the second device send or receive signals through the control word channel. The embodiment of the invention can automatically and quickly realize the configuration of the link parameters without software intervention by adding the test frame transceiver module and the logic state machine in the first equipment and the second equipment.

In the embodiment of the present invention, the test frame transceiver module in fig. 5 includes a test frame generation module and a test frame analysis module.

The logic state machine is used for controlling the test frame transceiving module to receive or send signals and processing the signals sent or received by the transceiving module.

When the first device needs to send a signal, the logic state machine 1108 of the first device controls the test frame generation module 1105 to generate a data frame of the signal, and sends the data frame to the sender 1103 through the selection of the multiple item selector 1102. The data frame is transmitted by the transmitter 1103.

When the first device needs to receive a signal, the first device receiver 1111 transmits a data frame of the received signal to the multi-item selector 1109. The multi-item selector sends the data frames of the received signal to test frame parsing module 1106. The test frame parsing module 1106 obtains a signal by parsing the data frame, and sends the signal to the logic state machine 1108.

The second device receives or transmits signals in a similar manner as the first device. To avoid repetition, further description is omitted here.

Here, the first device may transmit two test signals or may transmit a plurality of test signals to the second device, and the second device receives the test signals and detects the amplitudes of the test signals. Likewise, the second device may also send a test signal to the first device, which receives the test signal and detects the amplitude of the test signal. The following will describe the technical solution of determining the pre-emphasis parameter by taking the first device sending the test signal, the second device receiving the test signal and detecting the amplitude of the test signal as an example with reference to fig. 6, fig. 7 and fig. 8.

FIG. 6 shows a schematic flow chart of a method 300 of determining a parameter according to one embodiment of the invention. S350 in this method corresponds to S210 in method 200 described above. S360 corresponds to S220 in the method 200 described above. In the method 300, S350 and S360 are performed by the first device 11 shown in fig. 5.

The method 300 includes:

s310, the first device 11 sends a test signal to the second device 12.

Specifically, the transceiving ends of the first device and the second device handshake through a control word. The logic state machine 1108 of the first device controls the test frame generation module 1105 of the first device to generate at least two test signals that are not equal in frequency and that have not been pre-emphasized. The test signal may be a clock test pattern.

The clock test pattern with different frequencies may be 0101, 00110011, 0000011111, 00000000001111111111, etc., and the clock test pattern is a square wave signal that does not include information that the first device needs to send to the second device. The first device may transmit several cycles of the above-described different frequency clock pattern via transmitter 1130 to the second device without emphasis (i.e., without using FIR filter 1104), and the number of cycles of each clock pattern may be the same or different.

It is understood that, in the embodiments of the present invention, the number of the test signals may be multiple, and at least two of the test signals have the same frequency, that is, two of the test signals may also have the same frequency.

In the embodiment of the invention, the reserved control word of IEEE802.3ap can be used for sending the test signal, and a new control word format can be defined for sending the test signal. In addition, in addition to using custom patterns, embodiments of the present invention may use Serdes half-rate, 1/4-rate, etc. to determine the pattern of the test signal.

At this point, the logic state machine 1108 of the first device may record the frequency of the respective test signal. For example, the frequency of each test signal may be denoted as a frequency sequence F ═ F₁，F₂……F_N]Wherein F is₁Is the frequency of the first test signal, F₂Is the frequency of the second test signal, F_NThe frequency of the nth test signal.

When the first device sends a test signal, the logic state machine 1108 also needs to record the initial amplitude A of each test signal₀. A for a test signal of one frequency₀The value is fixed, and A₀Values may be considered approximately the same within a frequency band.

S320, the second device 12 determines the amplitude of the test signal.

Specifically, the second device may switch to the equalization-off condition (i.e., without using the adaptive equalization module 1211)The receiver 1210 receives the test signal. The amplitude test module 1207 of the second device detects a plurality of test signals transmitted by the first device under the condition of turning off amplitude amplification, where the second device can obtain the amplitude of each test signal by using the digital eye diagram function of the Serdes link, and the logic state machine 1208 of the second device records the amplitude of each test signal as an amplitude sequence a [ a ] according to the obtained amplitude transmitted by the amplitude test module 1207₁，A₂……A_N]Wherein A is₁Is the amplitude of the first test signal, A₂Is the amplitude of the second test signal, A_NThe amplitude of the nth test signal.

Here, for at least two clock test patterns of the same frequency, the second device may detect the amplitudes of a plurality of different test signals, and reduce the error of each test signal amplitude by taking an average value by summing a plurality of samples.

S330, the second device 12 sends the amplitude to the first device 11.

Here, the second device sends the amplitude to the first device via a control word. The control word in the embodiment of the invention can be a reserved control word of 802.3ap, and can also be a defined new control word format. Specifically, the logic state machine 1208 of the second device generates a data frame including the amplitude sequence through the test frame generation module 1205 of the second device, and transmits the data frame including the amplitude sequence to the first device through the transmitter of the second device.

The first device receives the data frame containing the amplitude sequence through the receiver 1111 of the first device, and then the test frame parsing module 1106 of the first device obtains the amplitude sequence and sends the obtained amplitude sequence to the logic state machine of the first device.

S340, the first device 11 determines a functional relationship between the frequency and the insertion loss value.

First, the logic state machine 1108 of the first device bases on the received amplitude sequence A and the initial amplitude A of each test signal₀And determining the insertion loss value IL of each test signal. Specifically, the insertion loss value may be determined according to the following formula:

here, the insertion loss values of the plurality of test signals may be expressed as an insertion loss value sequence IL ═ IL₁，IL₂……IL_N]Wherein, IL₁Is the insertion loss value, IL, of the first test signal₂Is the insertion loss value, IL, of the second test signal_NThe insertion loss value of the Nth test signal.

The functional relationship of the frequency and the insertion loss value of the link can then be determined. In the embodiment of the present invention, the functional relationship may be expressed as an insertion loss fitting curve. In a real situation, the insertion loss fitting curve is generally approximately linear in the application frequency range of the link, so that straight line fitting may be adopted, and a specific insertion loss formula may be set as follows:

IL＝a₁×F+a₀

the coefficient a can be obtained by the least square method₁And a₀。

Because the pre-emphasis parameters can change along with the change of conditions such as the length and the temperature of the link, the prior art can only adapt under the current temperature condition, when the temperature condition changes, the configuration parameters can not change, so that the pre-emphasis parameters and the equalization parameters can not meet the requirements of the link, and the link has the risk of error codes.

When the insertion loss fitting curve of the link is determined, the temperature correction coefficient can be introduced to correct the frequency and insertion loss value curve of the link, so that the curve can be adaptive under different temperature conditions, and the error code risk of the link is reduced or avoided.

As an example, in the embodiment of the present invention, the functional relationship may be determined according to the insertion loss value, the frequency, and the first temperature correction coefficient of each test signal.

Specifically, in the process of determining the functional relationship, a first temperature correction coefficient considering condition changes such as temperature is introduced, so that the adaptability of the pre-emphasis parameters measured and calculated by the method can be improved. Here, a fitting curve having a functional relationship as an insertion loss will be described as an example.

As an example, the above insertion loss formula can be adjusted as:

IL＝t₁×a₁×F+a₀+t₀

wherein, t₁And t₀The first temperature correction coefficient can be estimated according to the condition of the plate and the link or given according to an actual measurement experience value. E.g. t at high temperature₁And t₀The value of (A) may be greater than t at low temperature₁And t₀The value of (c). In this way, different insertion loss fit curves of the link at high and low temperatures can be obtained.

Here, the temperature may also be divided into a plurality of different ranges, such as three ranges of high temperature (90 deg.C-150 deg.C), medium temperature (10 deg.C-90 deg.C), and low temperature (-50 deg.C-10 deg.C), wherein the high temperature corresponds to a first temperature correction coefficient of t₁₁And t₀₁The first temperature correction coefficient corresponding to the intermediate temperature is t₁₂And t₀₂The first temperature correction coefficient corresponding to the low temperature is t₁₃And t₀₃. Therefore, insertion loss fitting curves of different links at three different temperatures can be fitted, a suitable insertion loss fitting curve can be selected according to the real-time temperature of the link, and then the link can adaptively determine pre-emphasis parameters at different temperatures.

As another example, in an embodiment of the present invention, the first compensation value may be determined according to the insertion loss value and a second temperature correction coefficient. Specifically, in engineering applications, the insertion loss formula in the foregoing can be further adjusted as follows:

IL₁＝(a₁×F+a₀)×(1+ζ％)

or IL₂＝(a₁×F+a₀)×(1-ζ％)

And zeta is a second temperature correction coefficient which can be estimated according to the conditions of the plate and the link or given according to an actual measurement empirical value. IL₁Indicates an increase in insertion loss value at high temperature, zeta%, IL₂Indicating a reduction in insertion loss value at low temperature by ζ%.

Therefore, by introducing the temperature correction coefficient in the curve fitting process, when the temperature condition changes, an insertion loss fitting curve suitable for the current temperature can be determined, and further, the optimal pre-emphasis parameter can be estimated according to the insertion loss fitting curve, so that the requirements of the system at different temperatures are met, and the risk of link error codes is reduced.

It should be noted that, in the embodiment of the present invention, the number of test signals to be scanned for fitting the insertion loss curve may be flexibly selected according to actual situations.

Generally, the insertion loss curve is approximately linear, and the number of test signals can be properly reduced, so that the measuring and calculating efficiency is improved. For example, when linearity is good, the fitted curve may be determined by only two test signals. For a link with poor impedance continuity, the insertion loss fitting curve of the link may present nonlinearity in a certain frequency band, at this time, the fitting model may be adjusted, the insertion loss fitting curve may be fitted in a polynomial manner of multiple degree, and the number of test signals may be appropriately increased to reduce the error of measurement and calculation, which is not limited in the present invention.

S350, the first device 11 determines a first compensation value.

The logic state machine 1108 of the first device determines the compensation value of the signal to be transmitted based on the frequency of the signal to be transmitted. Here, the first device may determine the first compensation value based on a relationship between its own compensation capability and the insertion loss value. Specifically, see S210 in fig. 4, which is described above, and details are not described here to avoid repetition.

Optionally, the logic state machine 1108 may also determine a second compensation value for the second device when performing S350. Specifically, reference may be made to S210 in fig. 4, and details are not repeated here to avoid repetition. When the second compensation value of the second device is determined in S350, the second compensation value may be transmitted to the second device through the control word.

S360, the first device 11 determines the pre-emphasis parameter.

This step may be implemented by the logic state machine 1108 of the first device. Specifically, see S220 in fig. 4, which is described above, and details are not described here to avoid repetition.

S370, the first device 11 sends a signal to the second device 12 according to the determined pre-reconfiguration parameter.

Specifically, the FIR filter 1104 of the first device updates the components of the pre-emphasis parameter according to the determined pre-emphasis parameter, and after the update is completed, the first device transmits the signal required to be transmitted to the second device in S350 to the first device through the transmitter 1103 under the emphasis condition.

S380, the second device 12 configures the equalization parameter according to the received signal.

Specifically, the receiver 1210 of the second device may include an adaptive equalization module 1211, and the adaptive equalization module 1211 may adjust the equalization parameter of the receiving end by using the existing adaptive receiving equalization method.

When the second device receives the second compensation value sent by the first device, the equalization parameter may also be determined according to the second compensation value and the received signal. For example, the logic state machine 1208 of the second device may determine the reference value of the equalization parameter by calculating a simulation or a table lookup according to the second compensation value, and the reference value may be used to determine whether the equalization parameter adaptively obtained by the second device is reasonable.

According to the embodiment of the invention, different test signals are constructed, the insertion loss fitting curve of a link between first equipment and second equipment is automatically measured and calculated, a first compensation value of the first equipment is determined according to the frequency of the signal to be sent and the insertion loss fitting curve, and a pre-emphasis parameter of the first equipment is further determined according to the first compensation value. After the first device configures the pre-emphasis parameters, the second device adaptively determines equalization parameters according to the signal transmitted by the first device. Therefore, the embodiment of the invention can flexibly allocate the compensation value and automatically configure the pre-emphasis parameter and the equalization parameter of the link according to the compensation capability of different devices. In addition, the embodiment of the invention introduces the temperature correction coefficient, and can determine the optimal link parameter under different temperature conditions.

FIG. 7 shows a schematic flow chart of a method 400 of determining a parameter according to one embodiment of the invention. Here, the first device 11 and the second device 12 may be the first device and the second device shown in fig. 5. In the method 400, the logic state machine 1208 of the second device 12 determines a first compensation value of the first device 11 and sends the first compensation value to the first device 11, and the logic state machine 1208 of the first device 11 determines the pre-emphasis parameter according to the received first compensation value. The method 400 includes:

s410, the first device 11 sends a test signal to the second device 12.

The logic state machine 1108 of the first device may control the transceiver module of the first device to send the test signal to the second device. Specifically, refer to S310 in fig. 6, which is not described herein again to avoid repetition.

S420, the second device 12 determines the amplitude of the test signal.

Specifically, reference may be made to the description of S320 in fig. 6, and details are not repeated here to avoid repetition.

S430, the second device 12 determines a frequency as a function of the insertion loss value.

The logic state machine 1208 of the second device may pre-store the initial amplitude A of each test signal₀And the frequency as a function of the insertion loss value can be determined. Specifically, reference may be made to the description of S340 in fig. 6, and details are not repeated here to avoid repetition.

S440, the second device 12 determines a first compensation value.

And the second equipment determines the compensation value of the signal to be transmitted according to the frequency of the signal to be transmitted. Here, the second device may determine the first compensation value based on a relationship between its own compensation capability and the first insertion loss value. Specifically, reference may be made to S210 in fig. 4, and details are not repeated here to avoid repetition.

Optionally, in S440, the second device may also determine a second compensation value of the second device, which may specifically refer to the description of S210 in fig. 4, and details are not described here again to avoid repetition.

S450, the second device 12 sends the first compensation value to the first device 11.

The second device sends the first compensation value to the first device through the control word. The control word in the embodiment of the invention can be a reserved control word of 802.3ap, and can also be a defined new control word format.

Specifically, the second device may generate a data frame containing the first compensation value through the test pin generation module 1205, and then transmit the data frame to the first device through the transmitter 1203 of the second device. After the receiver 1111 of the first device receives the data frame, the test frame parsing module 1106 obtains the first compensation value, and sends the first compensation value to the logic state machine 1108 of the first device.

S460, the first device 11 determines the pre-emphasis parameter according to the first compensation value.

This step is performed by the logic state machine 1108 of the first device. Specifically, reference may be made to S220 in fig. 4, and details are not repeated here to avoid repetition.

S470, the first device 11 sends a signal to the second device 12 according to the determined pre-reconfiguration parameter.

Specifically, see S370 in fig. 6, which is described above, and details are not repeated here to avoid repetition.

S480, the second device 12 configures the equalization parameter according to the received signal.

Specifically, see S380 in fig. 6, which is not described herein again to avoid repetition.

FIG. 8 shows a schematic flow chart of a method 500 of determining parameters according to one embodiment of the present invention. Here, the first device 11 and the second device 12 may be the first device and the second device shown in fig. 5. S540 in the method 500 corresponds to S210 in the method 200 described above, and S550 corresponds to S220 in the method 200 described above. In the method 500, S540 and S550 are performed by the second device 12 shown in fig. 5. The method 500 includes:

s510, the first device 11 sends a test signal to the second device 12.

The logic state machine 1108 of the first device may control the transceiver module of the first device to send the test signal to the second device. Specifically, see S310 in fig. 6, which is described above, and details are not described here to avoid repetition.

S520, the second device 12 determines the amplitude of the test signal.

S530, the second device 12 determines a frequency as a function of the insertion loss value.

The logic state machine 1208 of the second device may pre-store the initial amplitude A of each of the different test signals₀And the frequency as a function of the insertion loss value can be determined. Specifically, reference may be made to the description of S340 in fig. 6, and details are not repeated here to avoid repetition.

S540, the second device 12 determines a first compensation value for the first device.

And the second equipment determines the compensation value of the signal to be transmitted according to the frequency of the signal to be transmitted. Here, the second device may determine the first compensation value based on a relationship between its own compensation capability and the first insertion loss value. Specifically, see S210 in fig. 4, which is described above, and details are not described here to avoid repetition.

Optionally, in S540, the second device may also determine a second compensation value of itself, which may specifically refer to the description of S210 in fig. 4, and details are not described here again to avoid repetition.

And S550, the second device 12 determines the pre-emphasis parameter according to the first compensation value.

Specifically, reference may be made to S220 in fig. 4, and details are not repeated here to avoid repetition.

S560, the second device 12 sends the pre-emphasis parameter to the first device 11.

The second device may send the amplitude to the first device via a control word. The control word in the embodiment of the invention can be a reserved control word of 802.3ap, and can also be a defined new control word format.

Specifically, the second device generates a data frame containing the pre-emphasis parameter through the test pin generation module 1205, and then sends the data frame to the first device through the sender 1203 of the second device. After receiving the data frame, the receiver 1111 of the first device obtains the pre-emphasis parameter through the test frame parsing module 1106, and sends the pre-emphasis parameter to the logic state machine 1108 of the first device.

S570, the first device 11 signals the second device 12 according to the determined pre-reconfiguration parameters.

S580, the second device 12 configures the equalization parameters according to the received signal.

Specifically, reference may be made to S380 in fig. 6, and details are not repeated here to avoid repetition.

According to the embodiment of the invention, test signals with different frequencies are constructed, an insertion loss fitting curve of a link between first equipment and second equipment is automatically measured and calculated, a first compensation value of the first equipment is determined according to the frequency of a signal to be transmitted and the insertion loss fitting curve, and a pre-emphasis parameter of the first equipment is further determined according to the first compensation value. After the first device configures the pre-emphasis parameters, the second device adaptively determines equalization parameters according to the signal transmitted by the first device. Therefore, the embodiment of the invention can flexibly allocate the compensation value and automatically configure the pre-emphasis parameter and the equalization parameter of the link according to the compensation capability of different devices. In addition, the embodiment of the invention introduces the temperature correction coefficient, and can determine the optimal link parameter under different temperature conditions.

The configuration for implementing the above-mentioned determination parameter in the embodiment of the present invention may also be designed in an external system, for example, a control device. When the external system is used to implement the determining of the parameter, the external system may issue various instructions to the first device and the second device using control channels such as a Bus and Interface standard (PCIe), Management Data Input/Output (MDIO), Advanced High Performance Bus (AHB), and the like.

For example, an off-chip Central Processing Unit (CPU) or a main control board may be used as a control system, and corresponding software is used to flexibly implement configuration of link parameters. The software implementation does not depend on a chip, the expandability is strong, and the correction value of the functional relation can be flexibly configured according to the actual requirement. For example, the reconfiguration of the parameters may be implemented by software when the dispensing strategy or temperature correction coefficients need to be modified.

As another example, the configuration link parameters may be implemented using an on-chip integrated Micro Control Unit (MCU) and firmware. When the firmware program is started, the parameter configuration can be automatically completed, and the software dependence of the scheme can be reduced.

FIG. 9 shows a schematic flow chart of a method 600 of determining parameters according to an embodiment of the present invention. The first device 11 and the second device 12 in fig. 9 are able to receive and execute instructions of the control system. Here, the first device 11 and the second device 12 have a test frame transceiving module, and the first device 11 or the second device 12 can receive an instruction of an external system and transmit or receive a test signal according to the instruction of the external system. The method 600 comprises:

s601, the external system 13 sends a first control instruction to the first device 11.

Specifically, the first control instruction is used to instruct the first device to send at least two test signals to the second device, where the frequencies of the at least two test signals are not equal and the at least two test signals are not processed by pre-emphasis. . After receiving the first control instruction, the transceiver module of the first device executes the first control instruction.

S602, the external system 13 sends a second control instruction to the second device 12.

In particular, the second control instruction is used to instruct the second device to detect the amplitude of the received test signal. Specifically, in this embodiment of the present invention, the second control instruction may further instruct the second device to transmit the amplitude to an external system. And the transceiver module of the second device receives the second control command and executes the second control command.

S603, the first device 11 sends a test signal to the second device 12.

Specifically, the first device sends at least two of the test signals to the second device through a test frame generation module in a test frame transceiver module of the first device, and the second device receives the test signal sent by the first device under the condition of balance shutdown. Specifically, the description of the test signal can be referred to as S310 in fig. 6, and is not repeated here to avoid repetition.

S604, the second device 12 determines the amplitude of the test signal.

Specifically, the second device determines the amplitude of the test signal with the digital eye diagram function of the Serdes link turned off with amplitude amplification after receiving the second control command and the test signal. Specifically, the amplitude of the test signal determined by the second device may be described in S320 in fig. 6, and is not described herein again to avoid repetition.

S605, the second device 12 transmits the amplitude to the external system 13.

Specifically, reference may be made to the description of S330 in fig. 6, and details are not repeated here to avoid repetition.

S606, the external system 13 determines the frequency and insertion loss value functional relationship,

the external system may pre-store the initial amplitude A of each test signal₀And the frequency as a function of the insertion loss value can be determined. Specifically, reference may be made to the description of S340 in fig. 6, and details are not repeated here to avoid repetition.

S607, the external system 13 determines a first compensation value.

And the external system determines the compensation value of the signal required to be transmitted by the first equipment according to the frequency of the signal required to be transmitted by the first equipment. Here, the external system may determine the first compensation value based on a relationship between the first device compensation capability and the insertion loss value, or may determine the first compensation value based on a relationship between the second device compensation capability and the insertion loss value. Specifically, see S210 in fig. 4, which is described above, and details are not described here to avoid repetition.

Optionally, in S607, the external system may also determine a second compensation value of the second device, and send the second compensation value to the second device. For details, reference may be made to the description of S210 in fig. 4, and details are not repeated here to avoid repetition.

S608, the external system 13 determines the pre-emphasis parameter according to the first compensation value.

Specifically, see S220 in fig. 4, which is described above, and details are not described here to avoid repetition.

S609, the external system 13 sends the pre-emphasis parameter to the first device.

In particular, the external system may send the pre-emphasis parameter to the first device via a control word. The control word in the embodiment of the invention can be a reserved control word of 802.3ap, and can also be a defined new control word format. The pre-emphasis parameter is encapsulated into a data frame format and sent to the first device, which is not limited in the embodiment of the present invention.

S610, the first device 11 sends a signal to the second device 12 according to the determined pre-reconfiguration parameter.

Specifically, reference may be made to S370 in fig. 6, and details are not repeated here to avoid repetition.

S611, the second device 12 configures the equalization parameter according to the received signal.

According to the embodiment of the invention, different test signals are constructed, the insertion loss fitting curve of a link between first equipment and second equipment is automatically measured and calculated, a first compensation value of the first equipment is determined according to the frequency of the signal to be sent and the insertion loss fitting curve, and a pre-emphasis parameter of the first equipment is further determined according to the first compensation value. After the first device configures the pre-emphasis parameters, the second device adaptively determines equalization parameters according to the signal transmitted by the first device. Therefore, the embodiment of the invention can flexibly distribute the compensation value and automatically configure the pre-emphasis parameter and the equalization parameter of the link according to the compensation capability of different devices. In addition, the embodiment of the invention introduces the temperature correction coefficient, and can determine the optimal link parameter under different temperature conditions.

The method for determining parameters according to the embodiment of the present invention is described above with reference to fig. 4 to 9, and the apparatus for determining parameters according to the embodiment of the present invention is described below with reference to fig. 10 to 17.

Fig. 10 is a schematic block diagram of an apparatus 700 for determining parameters according to an embodiment of the present invention. The first device in fig. 10 may be a transmitting circuit, the second device may be a receiving circuit, and the control device may be a control circuit. The apparatus 700 comprises:

a first determining unit 710, configured to determine a first compensation value of a signal that needs to be transmitted by a first device;

a second determining unit 720, configured to determine, according to the first compensation value determined by the first determining unit 710, a pre-emphasis parameter that needs to be configured when the first device transmits the signal.

Optionally, the first determining unit 710 is specifically configured to determine, according to a functional relationship between a frequency and an insertion loss value, a first insertion loss value of the signal sent by the first device; and determining the first compensation value according to the first insertion loss value.

As an example, determining the first compensation value based on the first insertion loss value includes: determining a first allocation ratio beta of the first equipment according to the relation between the first insertion loss value and the compensation capacity of the first equipment; a first compensation value for the first device is determined based on the first allocation ratio beta for the first device.

As another example, determining the first compensation value based on the first insertion loss value includes: determining a second distribution ratio (1-beta) of the second equipment and a first distribution ratio beta of the first equipment according to the relation between the first insertion loss value and the compensation capacity of the second equipment; a first compensation value for the first device is determined based on the first allocation ratio beta for the first device.

For example, the compensation capability of the first device is denoted as E_kSaid first insertion loss value is denoted as IL_kIf E is_k>IL_kBeta can be 20-30%; if E_k<IL_KBeta can be 70-80%.

According to the embodiment of the invention, the appropriate distribution ratio can be flexibly determined according to the compensation capacity of the specific equipment, and then the compensation values of the first equipment and the second equipment to the link can be respectively determined according to the distribution ratio.

Optionally, the apparatus 700 may further include:

the device comprises an acquisition unit, a pre-emphasis unit and a control unit, wherein the acquisition unit is used for acquiring the amplitude of each of two test signals, the frequencies of the two test signals are not equal, and the two test signals are not subjected to pre-emphasis processing;

the first determining unit 710 is further configured to determine an insertion loss value of each test signal according to the amplitude of each test signal;

the first determining unit 710 is further configured to determine the functional relationship according to the insertion loss value of each test signal and the frequency of each test signal.

Here, the at least two non-pre-emphasized test signals of different frequencies may be clock test patterns of different frequencies, and the clock test patterns of the same frequency may define different transmission symbol periods, so that the second device may reduce errors by averaging through multiple sampling sums. The test pattern may be obtained by using Serdes half-rate, 1/4-rate, or the like, in addition to the custom pattern.

in the embodiment of the present invention, the functional relationship may specifically be an insertion loss fitting curve. In general, since the insertion loss fitting curve is approximately linear, a straight line fitting may be employed to set:

IL＝a₁×F+a₂

Optionally, the first determining unit 710 is specifically configured to: and determining the functional relation of the link according to the insertion loss value of each test signal, the frequency of each test signal and a second temperature correction coefficient.

At this time, it is possible to set:

IL＝t₁×a₁×F+a₂+t₀

Optionally, the apparatus 700 may be a control device, and the apparatus 700 may further include:

a first sending unit, configured to send a first instruction to the first device, where the first instruction is used to instruct the first device to send the two test signals to the second device;

the first sending unit is further configured to send a second instruction to the second device, where the second instruction is configured to instruct the second device to determine an amplitude of each of the two test signals;

the obtaining unit is specifically configured to:

receiving an amplitude of each of the two test signals transmitted by the second device.

Optionally, the apparatus 700 may be the second device, and the apparatus 700 may further include: a receiving unit, configured to receive the two test signals sent by the first device;

the acquisition unit is specifically configured to determine an amplitude of each of the two test signals.

Optionally, the first determining unit 710 is further configured to: determining a second compensation value for the second device; and determining an equalization parameter according to the second compensation value and the signal sent by the first device according to the pre-emphasis parameter.

Optionally, the apparatus 700 may further include: a second sending unit, configured to send the pre-emphasis parameter to the first device.

Optionally, the apparatus 700 may be the first device, and the apparatus 700 may further include: a third transmitting unit, configured to transmit two test signals to the second device;

the obtaining unit is specifically configured to: receiving an amplitude of each of the two test signals transmitted by the second device.

Optionally, the first determining unit 710 is further configured to: determining a second compensation value for the second device; the apparatus 700 further includes a fourth sending unit, configured to send the second compensation value to the second device, so that the second device determines an equalization parameter according to the second compensation value and the signal sent by the first device according to the pre-emphasis parameter.

Optionally, the apparatus 700 may be a first device, and the first determining unit 710 is specifically configured to: and receiving the first compensation value sent by the second equipment.

Optionally, the apparatus 700 further includes: a fifth sending unit, configured to send two test signals to a second device, so that the second device determines the first compensation value according to the two test signals.

Optionally, the determining, by the second determining unit 720, a pre-emphasis parameter that needs to be configured when the first device sends the signal according to the first compensation value includes: determining the pre-emphasis parameter according to the following formula:

|pos|＝γ×|pre|

|pre|+|main|+|pos|≤τ

wherein the EP_kRepresenting said first compensation value, main, pre and pos representing respectively three components, Log, of said pre-emphasis parameter₁₀Representing pairs taken at the bottom of 10A number, | · | denotes modulo, γ and τ are preset values greater than zero.

It should be noted that, in the embodiment of the present invention, the first determining unit 710 and the second determining unit 720 may be implemented by a processor, and the transmitting unit and the receiving unit may be implemented by a transceiver. As shown in fig. 11, the apparatus 800 may include a processor 810, a memory 820, a transceiver 830, and a bus system 840. Memory 820 may be used to store, among other things, code executed by processor 810.

The various components in device 800 are coupled together by a bus system 840, where bus system 840 includes a power bus, a control bus, and a status signal bus in addition to a data bus.

The apparatus 700 shown in fig. 10 or the apparatus 800 shown in fig. 11 can implement the corresponding processes in the foregoing method embodiments shown in fig. 4 to fig. 9, and in particular, when the apparatus 700 or the apparatus 800 is a first device, reference may be made to the description of the first device in fig. 4 to fig. 9; when the apparatus 700 or the apparatus 800 is a second device, reference may be made to the description of the second device in fig. 4 to 9; when the apparatus 700 or 800 is a control device, reference may be made to the description of the external system in fig. 9 above.

Fig. 12 is a schematic block diagram of an apparatus 900 for determining parameters according to an embodiment of the present invention. The first device in fig. 12 may be a transmitting circuit, the second device may be a receiving circuit, and the control device may be a control circuit. The apparatus 900 includes:

a determining unit 910, configured to determine a first compensation value of a signal that needs to be transmitted by a first device;

a sending unit 920, configured to send the first compensation value to the first device, so that the first device determines a pre-emphasis parameter according to the first compensation value.

Optionally, the determining unit 910 is specifically configured to: determining a first insertion loss value of the signal sent by the first equipment according to a functional relation between the frequency and the insertion loss value; and determining the first compensation value according to the first insertion loss value.

Optionally, the apparatus 900 further includes:

a receiving unit, configured to receive the two test signals sent by the first device, where frequencies of the two test signals are not equal, and the two test signals are not subjected to pre-emphasis processing;

the determining unit 910 is further configured to determine an amplitude of each of the two test signals;

the determining unit 910 is further configured to determine an insertion loss value of each test signal according to the amplitude of each test signal;

the determining unit 910 is further configured to determine the functional relationship according to the insertion loss value of each test signal and the frequency of each test signal.

Here, the two test signals may be clock test patterns with different frequencies, and the clock test pattern with the same frequency may define different transmission symbol periods, so that the second device may reduce errors by performing sampling and averaging for multiple times. The test pattern may be obtained by using Serdes half-rate, 1/4-rate, or the like, in addition to the custom pattern.

IL＝a₁×F+a₂

Optionally, the determining unit 910 is specifically configured to: and determining the functional relation of the link according to the insertion loss value of each test signal, the frequency of each test signal and a second temperature correction coefficient.

At this time, it is possible to set:

IL＝t₁×a₁×F+a₂+t₀

Optionally, the determining unit 9100 is further configured to: determining a second compensation value for the device; and determining an equalization parameter according to the second compensation value and the signal sent by the first device according to the pre-emphasis parameter.

The second device may determine an equalization parameter based on the second compensation value and the received signal. For example, the second device determines a reference value of the equalization parameter by calculating a simulation or a table lookup, and the reference value can be used to determine whether the equalization parameter adaptively obtained by the second device is reasonable.

According to the embodiment of the invention, different test signals are constructed, the insertion loss fitting curve of a link between first equipment and second equipment is automatically measured and calculated, a first compensation value of the first equipment is determined according to the frequency of the signal to be sent and the insertion loss fitting curve, and a pre-emphasis parameter of the first equipment is further determined according to the first compensation value. After the first device configures the pre-emphasis parameters, the second device adaptively determines equalization parameters according to the signal transmitted by the first device. The embodiment of the invention can flexibly distribute the compensation value and automatically configure the pre-emphasis parameter and the balance parameter of the link according to the compensation capability of different devices. In addition, the embodiment of the invention introduces the temperature correction coefficient, and can determine the optimal link parameter under different temperature conditions.

It should be noted that, in the embodiment of the present invention, the determining unit 910 may be implemented by a processor, and the transmitting unit 920 and the receiving unit may be implemented by a transceiver. As shown in fig. 13, the apparatus 1000 may include a processor 1010, a memory 1020, a transceiver 1030, and a bus system 1040. Memory 1020 may be used, among other things, to store code executed by processor 1010.

The various components in the device 1000 are coupled together by a bus system 1040, wherein the bus system 1040 includes a power bus, a control bus, and a status signal bus in addition to a data bus.

The apparatus 900 shown in fig. 12 or the apparatus 1000 shown in fig. 13 can implement each corresponding process in the foregoing method embodiment shown in fig. 7, specifically, the apparatus 900 or the apparatus 1000 may refer to the description of the second device in fig. 7, and is not described again here to avoid repetition.

Fig. 14 is a schematic block diagram of an apparatus 1100 for determining parameters according to an embodiment of the present invention, the apparatus 1100 comprising:

a receiving unit 1110, configured to receive two test signals sent by a first device, where frequencies of the two test signals are not equal, and the two test signals are not subjected to pre-emphasis processing;

a determining unit 1120 for determining an amplitude of each of the two test signals;

a sending unit 1130, configured to send the amplitude of each test signal to a second device, so that the second device determines a pre-emphasis parameter according to the amplitude, where the second device is the first device or the control device.

According to the embodiment of the invention, the pre-emphasis parameter can be determined according to the first compensation value. Compared with the prior art, the method and the device can flexibly determine the pre-emphasis parameters, so that the signals in the Serdes link can be reliably and efficiently transmitted.

Here, the at least two test signals may be clock test patterns of different frequencies, and the clock test patterns of the same frequency may define different transmission symbol periods, so that the second device may reduce the error by averaging through multiple sampling sums. The test pattern may be obtained by using Serdes half-rate, 1/4-rate, or the like, in addition to the custom pattern.

optionally, the second device is the control device, and the receiving unit 1110 is further configured to receive a first instruction sent by the control device, where the first instruction is used to instruct the second device to determine the amplitude of each test signal; the determining unit 1120 is specifically configured to: determining an amplitude of each of the two test signals according to the second instructions.

It should be noted that, in the embodiment of the present invention, the determining unit 1120 may be implemented by a processor, and the transmitting unit 1130 and the receiving unit 1110 may be implemented by a transceiver. As shown in fig. 15, the apparatus 1200 may include a processor 1210, a memory 1220, a transceiver 1230, and a bus system 1240. Memory 1220 may be used, among other things, to store code that is executed by processor 1210.

The various components in the device 1200 are coupled together by a bus system 1240, wherein the bus system 1240 includes a power bus, a control bus, and a status signal bus in addition to a data bus.

The apparatus 1100 shown in fig. 14 or the apparatus 1200 shown in fig. 15 can implement the respective processes corresponding to the method embodiments shown in fig. 6 and 9. Specifically, the apparatus 1100 or the apparatus 1200 may refer to the description of the second device in fig. 6 and fig. 9, and is not repeated here to avoid repetition.

Fig. 16 is a schematic block diagram of an apparatus 1300 for determining parameters according to an embodiment of the present invention. The first device in fig. 16 may be a transmitting circuit, the second device may be a receiving circuit, and the control device may be a control circuit. The apparatus 1300 comprises:

a transmitting unit 1310, configured to transmit two test signals to a first device, where frequencies of the two test signals are not equal, and the two test signals are not subjected to pre-emphasis processing;

a receiving unit 1320, configured to receive a pre-emphasis parameter sent by a second device, where the pre-emphasis parameter is determined by the second device according to the two test signals, where the second device is the first device or a control device.

Here, the two test signals may be clock test patterns with different frequencies, and the clock test patterns with the same frequency may define different transmission symbol periods, so that the second device may reduce the error by averaging through multiple sampling sums. The test pattern may be obtained by using Serdes half-rate, 1/4-rate, or the like, in addition to the custom pattern.

Optionally, the second device is the control device, and the receiving unit 1320 is further configured to:

receiving a first instruction sent by the control equipment, wherein the first instruction is used for instructing the first equipment to send the two test signals;

the sending unit 1310 is specifically configured to: and sending the two test signals to second equipment according to the first instruction.

It should be noted that, in the embodiment of the present invention, the transmitting unit 1310 and the receiving unit 1320 may be implemented by a transceiver. As shown in fig. 17, the apparatus 1400 may include a processor 1410, a memory 1420, a transceiver 1430, and a bus system 1440. Memory 1420 may be used to store code and the like that is executed by processor 1410.

The various components in the device 1400 are coupled together by a bus system 1440, where the bus system 1440 includes a power bus, a control bus, and a status signal bus in addition to a data bus.

The apparatus 1300 shown in fig. 16 or the apparatus 1400 shown in fig. 17 can implement various processes corresponding to the method embodiments shown in fig. 8 to fig. 9, specifically, the apparatus 1300 or the apparatus 1400 may refer to the description of the first device in fig. 8 to fig. 9, and is not repeated here for avoiding repetition.

It should be noted that the above-described method embodiments of the present invention may be applied to or implemented by a processor. The processor may be an integrated circuit chip having signal processing capabilities. In implementation, the steps of the above method embodiments may be performed by integrated logic circuits of hardware in a processor or by instructions in the form of software. The Processor may be a general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), an off the shelf Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic, discrete hardware components. The various methods, steps and logic blocks disclosed in the embodiments of the present invention may be implemented or performed. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of the method disclosed in connection with the embodiments of the present invention may be directly implemented by a hardware decoding processor, or implemented by a combination of hardware and software modules in the decoding processor. The software module may be located in ram, flash memory, rom, prom, or eprom, registers, etc. storage media as is well known in the art. The storage medium is located in a memory, and a processor reads information in the memory and combines hardware thereof to complete the steps of the method.

It will be appreciated that the memory in embodiments of the invention may be either volatile memory or nonvolatile memory, or may include both volatile and nonvolatile memory. The non-volatile Memory may be a Read-Only Memory (ROM), a Programmable ROM (PROM), an Erasable PROM (EPROM), an Electrically Erasable PROM (EEPROM), or a flash Memory. Volatile Memory can be Random Access Memory (RAM), which acts as external cache Memory. By way of example, but not limitation, many forms of RAM are available, such as Static random access memory (Static RAM, SRAM), Dynamic Random Access Memory (DRAM), Synchronous Dynamic random access memory (Synchronous DRAM, SDRAM), Double Data Rate Synchronous Dynamic random access memory (DDR SDRAM), Enhanced Synchronous SDRAM (ESDRAM), Synchronous link SDRAM (SLDRAM), and Direct Rambus RAM (DR RAM). It should be noted that the memory of the systems and methods described herein is intended to comprise, without being limited to, these and any other suitable types of memory.

Those of ordinary skill in the art will appreciate that the various method steps and elements described in connection with the embodiments disclosed herein can be implemented as electronic hardware, computer software, or combinations of both, and that the steps and elements of the embodiments are generally described in the foregoing description as functional or software interchange, for the purpose of clearly illustrating the interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the technical solution. One of ordinary skill in the art may use different methods to implement the described functionality for each particular application.

The methods or steps described in connection with the embodiments disclosed herein may be embodied in hardware, a software program executed by a processor, or a combination of both. The software routines may be located in Random Access Memory (RAM), memory, Read Only Memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.

Although the present invention has been described in detail by referring to the drawings in conjunction with the preferred embodiments, possible implementations of the present invention are not limited to the above-described embodiments. Modifications or substitutions to the embodiments of the invention may be made by those skilled in the art.

Claims

1. A method for determining parameters is applied to a chip, and signals are transmitted and received by using an IEEE802.3ap control code channel, and the method comprises the following steps:

determining a first compensation value according to the first insertion loss value;

determining a pre-emphasis parameter required to be used by the transmitting circuit when transmitting the signal according to the first compensation value;

determining a first compensation value according to the first insertion loss value includes:

determining a first allocation ratio beta of the transmitting circuit according to the relation between the first insertion loss value and the compensation capability of the transmitting circuit; determining a first compensation value of the transmitting circuit according to a first allocation ratio beta of the transmitting circuit; or the like, or, alternatively,

determining a second allocation ratio (1-beta) of the receiving circuit and a first allocation ratio beta of the transmitting circuit according to the relation between the first insertion loss value and the compensation capability of the receiving circuit; a first compensation value for the transmit circuit is determined based on a first allocation ratio β for the transmit circuit.

2. The method of claim 1, wherein prior to determining the first insertion loss value for the signal transmitted by the transmitting circuit, further comprising:

3. The method of claim 2, wherein said determining said functional relationship based on said insertion loss value of each test signal and said frequency of each test signal comprises:

and determining the functional relation according to the insertion loss value of each test signal, the frequency of each test signal and the first temperature correction coefficient.

4. The method according to claim 2 or 3, wherein the method is performed by a control circuit, the control circuit comprising the circuit,

prior to said obtaining an amplitude of each of the two test signals, the method further comprises:

sending a first instruction to the sending circuit, wherein the first instruction is used for instructing the sending circuit to send the two test signals to a receiving circuit;

sending a second instruction to the receive circuitry, the second instruction to instruct the receive circuitry to determine an amplitude of each of the two test signals;

the obtaining an amplitude of each of two test signals comprises:

receiving an amplitude of each of the two test signals transmitted by the receiving circuit.

5. The method according to claim 2 or 3, wherein the method is performed by a receiving circuit, the receiving circuit comprising the circuit,

receiving the two test signals sent by the sending circuit;

the obtaining an amplitude of each of two test signals comprises:

determining an amplitude of each of the two test signals from the two test signals received.

6. The method of claim 2 or 3, wherein the method is performed by the transmit circuit, the transmit circuit comprising the circuit,

before the obtaining the amplitude of each of the two test signals, the method further includes:

sending the two test signals to a receiving circuit;

the obtaining an amplitude of each of two test signals comprises:

receiving an amplitude of each of the two test signals transmitted by the receive circuit.

7. A method for determining parameters, wherein the method is performed by a receiving circuit, and the method is applied to a chip, and the method uses a control code word channel of IEEE802.3ap to realize signal transmission and reception, and comprises the following steps:

transmitting the first compensation value to the transmit circuitry, the first compensation value being used by the transmit circuitry to determine a pre-emphasis parameter;

determining a second distribution ratio (1-beta) of the receiving circuit and a first distribution ratio beta of the transmitting circuit according to the relation between the first insertion loss value and the compensation capability of the receiving circuit; determining a first compensation value of the transmission circuit based on a first allocation ratio β of the transmission circuit.

8. The method of claim 7, wherein prior to determining the insertion loss value of the signal transmitted by the transmitting circuit, further comprising:

determining an amplitude of each of the two test signals;

9. The method of claim 8, wherein determining the functional relationship based on the insertion loss value of each test signal and the frequency of each test signal comprises:

10. An apparatus for determining parameters, the apparatus comprising a chip for transmitting and receiving signals using an ieee802.3ap control codeword channel, the apparatus comprising:

the first determining unit is used for determining a first insertion loss value of the signal transmitted by the transmitting circuit according to the functional relation between the frequency and the insertion loss value; determining a first compensation value according to the first insertion loss value;

a second determining unit, configured to determine, according to the first compensation value determined by the first determining unit, a pre-emphasis parameter that needs to be used by the transmitting circuit when transmitting the signal;

11. The apparatus of claim 10, further comprising:

the first determining unit is further used for determining an insertion loss value of each test signal according to the amplitude of each test signal;

the first determining unit is further configured to determine the functional relationship according to the insertion loss value of each test signal and the frequency of each test signal.

12. The apparatus according to claim 11, wherein the first determining unit is specifically configured to:

13. The apparatus of claim 11 or 12, wherein the apparatus is a control circuit, the apparatus further comprising:

a first sending unit, configured to send a first instruction to the sending circuit, where the first instruction is used to instruct the sending circuit to send the two test signals to a receiving circuit;

the first sending unit is further configured to send a second instruction to the receiving circuit, where the second instruction is configured to instruct the receiving circuit to determine an amplitude of each of the two test signals;

the obtaining unit is specifically configured to:

14. The apparatus of claim 11 or 12, wherein the apparatus is a receiving circuit, the apparatus further comprising:

the receiving unit is used for receiving the two test signals sent by the sending circuit;

the acquisition module is specifically configured to:

15. The apparatus of claim 11 or 12, wherein the apparatus is the transmit circuit, the apparatus further comprising:

the third sending module is used for sending the two test signals to the receiving circuit;

the acquisition module is specifically configured to:

16. An apparatus for determining parameters, wherein the apparatus is a receiving circuit, wherein the apparatus comprises a chip for transmitting and receiving signals using a control codeword channel of IEEE802.3ap, comprising:

the determining unit is used for determining a first insertion loss value of the signal transmitted by the transmitting circuit according to the functional relation between the frequency and the insertion loss value; determining a first compensation value according to the first insertion loss value;

a transmitting unit for transmitting the first compensation value to the transmitting circuit, the first compensation value being used by the transmitting circuit to determine a pre-emphasis parameter;

determining a second allocation ratio (1-beta) of the receiving circuit and a first allocation ratio beta of the transmitting circuit according to the relation between the first insertion loss value and the compensation capability of the receiving circuit; determining a first compensation value of the transmission circuit based on a first allocation ratio β of the transmission circuit.

17. The apparatus of claim 16, further comprising:

the receiving unit is used for receiving two test signals sent by the sending circuit, the frequencies of the two test signals are not equal, and the two test signals are not subjected to pre-emphasis processing;

the determination unit is further configured to determine an amplitude of each of the two test signals;

the determining unit is further used for determining an insertion loss value of each test signal according to the amplitude of each test signal;

the determining unit is further configured to determine the functional relationship according to the insertion loss value of each test signal and the frequency of each test signal.

18. The apparatus of claim 17, wherein the determining unit determines the functional relationship based on the insertion loss value of each test signal and the frequency of each test signal, comprising: