CN113108704A - Outer diameter detection device for test probe - Google Patents
Outer diameter detection device for test probe Download PDFInfo
- Publication number
- CN113108704A CN113108704A CN202110398611.6A CN202110398611A CN113108704A CN 113108704 A CN113108704 A CN 113108704A CN 202110398611 A CN202110398611 A CN 202110398611A CN 113108704 A CN113108704 A CN 113108704A
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- China
- Prior art keywords
- test probe
- outer diameter
- light
- detection
- bottom frame
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- 238000001514 detection method Methods 0.000 title claims abstract description 64
- 238000012360 testing method Methods 0.000 title claims abstract description 63
- 239000000523 sample Substances 0.000 title claims abstract description 61
- 239000011521 glass Substances 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 abstract description 16
- 238000007689 inspection Methods 0.000 description 7
- 230000005540 biological transmission Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention discloses an outer diameter detection device for a test probe, which comprises: a bottom frame; the light-transmitting plate is arranged on the bottom frame; the detection plate is arranged on the light-transmitting plate and provided with a plurality of detection holes for placing test probes; the top frame, the top frame sets up on the underframe, and the light-passing board is located in the top frame. This external diameter detection device for test probe has solved when current optical detection machine detects the external diameter of test probe, has the problem that is difficult to obtain the size information of test probe.
Description
Technical Field
The invention belongs to the technical field of probe detection equipment, and particularly relates to an outer diameter detection device for a test probe.
Background
The test probe is also called a semiconductor probe and consists of a needle tube, a spring and a needle head. After the test probe is assembled, the size of the outer diameter of the test probe needs to be detected, and the test probe can be determined to be a qualified product only after reaching the standard.
Because the outer diameter of the test probe is smaller, generally several millimeters, when the existing measuring tape is used for testing, the error of the test result is often larger, and the optical detection machine is mainly used for measuring at present. However, the existing optical detection machine has no auxiliary equipment for acquiring the size information of the test probe, so that the design of a detection device matched with the optical detection machine for measurement becomes very important.
Disclosure of Invention
The invention aims to provide an outer diameter detection device for a test probe, which solves the problem that the size information of the test probe is difficult to obtain when the existing optical detection machine detects the outer diameter of the test probe.
In order to achieve the purpose, the invention adopts the technical scheme that: an outer diameter detection device for a test probe, comprising:
a bottom frame;
the light-transmitting plate is arranged on the bottom frame;
the detection plate is arranged on the light-transmitting plate and provided with a plurality of detection holes for placing test probes;
the top frame, the top frame sets up on the underframe, and the light-passing board is located in the top frame.
As a preferable technical solution of the present invention, a limiting edge is disposed on an inner side of the bottom frame, and the light-transmitting plate is located on one side of the limiting edge.
As a preferable technical scheme of the present invention, the inner side of the bottom frame is provided with a limiting edge, the edges of the bottom frame and the top frame are provided with screw holes, and each pair of screw holes is provided with a bolt.
As a preferable technical solution of the present invention, the inside of the bottom frame is provided with a limiting edge, and the screw holes are provided at two ends and a middle portion of each edge of the bottom frame and the top frame.
As a preferable technical scheme of the present invention, the inner side of the bottom frame is provided with a limiting edge, and the light-transmitting plate is a glass plate.
As a preferable technical solution of the present invention, the inside of the bottom frame is provided with a limiting edge, and the detecting holes are arranged in a plurality of rows.
The invention has the beneficial effects that: (1) the outer diameter detection device for the test probe can be arranged in an information acquisition area of an optical detection machine, when light is irradiated from the lower part of a bottom frame, the light is sequentially emitted from a light-transmitting plate, the test probe and a gap between corresponding detection holes, at the moment, the optical detection machine can shoot a picture with the outline of the test probe from the upper part, the optical detection machine analyzes the picture, the outer diameter size of the test probe in the picture is measured, and whether the size reaches the standard or not is determined through comparison; (2) according to the outer diameter detection device for the test probes, the detection plate is provided with the plurality of detection holes, and one test probe can be placed in each detection hole, so that the outer diameter sizes of the plurality of test probes can be detected at one time, and the detection efficiency is high; (3) the outer diameter detection device for the test probe is simple in structure, convenient to operate, low in manufacturing cost and good in market popularization and application prospect.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:
FIG. 1 is an exploded view of an outer diameter detecting apparatus for a test probe according to the present invention;
FIG. 2 is a schematic structural diagram of an outer diameter detection apparatus for a test probe according to the present invention;
FIG. 3 is a schematic structural view of a detection plate in the outer diameter detection apparatus for a test probe according to the present invention;
fig. 4 is a schematic structural view of a top frame of an outer diameter detection apparatus for a test probe according to the present invention.
In the figure: 1. the device comprises a bottom frame, 2 limiting edges, 3 light-transmitting plates, 4 detection plates, 5 detection holes, 6 bolts and 7 top frames.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention.
In the description of the present invention, if there are first and second described only for the purpose of distinguishing technical features, it is not understood that relative importance is indicated or implied or that the number of indicated technical features or the precedence of the indicated technical features is implicitly indicated or implied.
In the description of the present invention, unless otherwise explicitly limited, terms such as arrangement, installation, connection and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific contents of the technical solutions.
As shown in fig. 1 to 4, the outer diameter detecting device for a test probe according to the present invention includes a bottom frame 1, a transparent plate 3, a detecting plate 4, and a top frame 7. Wherein: the bottom frame 1 is arranged below the optical detection machine; the light-transmitting plate 3 is arranged on the bottom frame 1; the detection plate 4 is arranged on the light-transmitting plate 3, and a plurality of detection holes 5 for placing test probes are formed in the detection plate 4; the top frame 7 is arranged on the bottom frame 1, and the light-transmitting plate 3 is positioned in the top frame 7.
The outer diameter detection device for the test probe is arranged in an information acquisition area of an optical detection machine and can acquire information. Specifically, the test probes are placed in the detection holes 5 on the detection plate 4, when light is irradiated from the lower part of the bottom frame 1, the light is firstly irradiated from the light-transmitting plate 3, and then is irradiated from the gap between the test probes and the corresponding detection holes 5, at the moment, the optical detector can shoot a picture with the outline of the test probes from the upper part, the optical detector analyzes the picture, the outer diameter size of the test probes in the picture is measured, and whether the size reaches the standard is determined through comparison.
As shown in fig. 1, in the outer diameter detecting device for a test probe according to the present invention, a position-limiting edge 2 is disposed on an inner side of a bottom frame 1, and a transparent plate 3 is disposed on one side of the position-limiting edge 2.
The light transmission plate 1 is blocked by the limiting edge 2, so that the light transmission plate 3 can be prevented, and the light transmission plate 3 can be prevented from contacting other parts to cause abrasion.
As shown in fig. 1, in the outer diameter detecting device for a test probe according to the present invention, screw holes are formed at the edges of the bottom frame 1 and the top frame 7, and a bolt 6 is provided in each pair of the screw holes.
Underframe 1 and top frame 7 are connected through a plurality of bolts 6, and the design is convenient for carry out the dismouting like this.
As shown in fig. 1, in an outer diameter detecting apparatus for a test probe according to the present invention, screw holes are provided at both ends and a middle portion of each side of a bottom frame 1 and a top frame 7.
The bolts 6 fix the bottom frame 1 and the top frame 7 from the two ends and the middle of each side of the bottom frame and the top frame respectively, so that all parts between the bottom frame 1 and the top frame 7 can be fastened together, and local looseness cannot occur.
As shown in fig. 1, in the outer diameter detection apparatus for a test probe according to the present invention, the light-transmitting plate 4 is preferably a glass plate.
As shown in fig. 1, in the outer diameter inspection device for a test probe according to the present invention, inspection holes 5 are provided in a plurality of rows.
The inspection holes 5 are arranged in a plurality of rows, so that the inspection holes 5 can be rapidly judged to be not met by the test probes in the inspection holes 5 according to the result detected by the optical inspection machine, and the inspection holes are picked out by workers to treat waste products.
Obviously, the outer diameter detection device for the test probe can be arranged in an information acquisition area of an optical detection machine, when light is irradiated from the lower part of a bottom frame, the light is sequentially emitted from gaps among a light-transmitting plate, the test probe and a corresponding detection hole, at the moment, the optical detection machine can shoot a picture with the outline of the test probe from the upper part, the optical detection machine analyzes the picture, the outer diameter size of the test probe in the picture is measured, and whether the size reaches the standard or not is determined through comparison. In addition, according to the outer diameter detection device for the test probes, a plurality of detection holes are formed in the detection plate, and one test probe can be placed in each detection hole, so that the outer diameter sizes of a plurality of test probes can be detected at one time, and the detection efficiency is high. In addition, the outer diameter detection device for the test probe is simple in structure, convenient to operate, low in manufacturing cost and good in market popularization and application prospect.
While the foregoing description shows and describes several preferred embodiments of the invention, it is to be understood, as noted above, that the invention is not limited to the forms disclosed herein, but is not to be construed as excluding other embodiments and is capable of use in various other combinations, modifications, and environments and is capable of changes within the scope of the inventive concept as expressed herein, commensurate with the above teachings, or the skill or knowledge of the relevant art. And that modifications and variations may be effected by those skilled in the art without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (6)
1. An outer diameter detection device for a test probe, comprising:
a bottom frame (1);
the light-transmitting plate (3), the light-transmitting plate (3) is arranged on the bottom frame (1);
the detection plate (4) is arranged on the light-transmitting plate (3), and a plurality of detection holes (5) for placing test probes are formed in the detection plate (4);
a top frame (7), the top frame (7) sets up on the underframe (1), and light-passing board (3) are located in top frame (7).
2. The outer diameter detection device for the test probe according to claim 1, wherein a limiting edge (2) is disposed on an inner side of the bottom frame (1), and the transparent plate (3) is disposed on one side of the limiting edge (2).
3. The outer diameter detection device for the test probe according to claim 2, wherein screw holes are provided on the edges of the bottom frame (1) and the top frame (7), and a bolt (6) is provided in each pair of screw holes.
4. The outer diameter detection apparatus for a test probe according to claim 3, wherein the screw holes are provided at both ends and a middle portion of each side of the bottom frame (1) and the top frame (7).
5. The outer diameter detection device for a test probe according to claim 4, wherein the light-transmitting plate (4) is a glass plate.
6. The outer diameter test device for a test probe according to claim 4, wherein the test holes (5) are arranged in a plurality of rows.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110398611.6A CN113108704A (en) | 2021-04-12 | 2021-04-12 | Outer diameter detection device for test probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110398611.6A CN113108704A (en) | 2021-04-12 | 2021-04-12 | Outer diameter detection device for test probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113108704A true CN113108704A (en) | 2021-07-13 |
Family
ID=76716512
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110398611.6A Pending CN113108704A (en) | 2021-04-12 | 2021-04-12 | Outer diameter detection device for test probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113108704A (en) |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002148026A (en) * | 2000-11-13 | 2002-05-22 | Nec Corp | Three-dimensional shape measuring apparatus three- dimensional information measuring method and measuring method of evaluating thin film |
| TW200710411A (en) * | 2005-06-30 | 2007-03-16 | Feinmetall Gmbh | Method and apparatus for electrical testing of a unit under test, as well as a method for production of a contact-making apparatus which is used for testing |
| TW200844448A (en) * | 2006-11-09 | 2008-11-16 | Tokyo Electron Ltd | Probe card for inspecting solid-state image sensor |
| CN102043072A (en) * | 2009-10-14 | 2011-05-04 | 汉民测试系统股份有限公司 | Cis circuit test probe card |
| CN103307989A (en) * | 2013-05-28 | 2013-09-18 | 江苏大学 | Device and method for measuring internal and external diameters of transparent glass bottleneck based on machine vision |
| CN204202559U (en) * | 2014-11-20 | 2015-03-11 | 昆山鸿富洋机电有限公司 | Chaining pin device |
| JP2017129395A (en) * | 2016-01-19 | 2017-07-27 | 三菱電機株式会社 | Semiconductor device inspection apparatus and semiconductor device inspection method |
| CN207515733U (en) * | 2017-11-15 | 2018-06-19 | 深圳市吉瑞达电路科技有限公司 | A kind of circuit board assignment test module |
| CN209230521U (en) * | 2018-07-10 | 2019-08-09 | 苏州德创测控科技有限公司 | Machine vision PIN position measurement assists sieve plate |
-
2021
- 2021-04-12 CN CN202110398611.6A patent/CN113108704A/en active Pending
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002148026A (en) * | 2000-11-13 | 2002-05-22 | Nec Corp | Three-dimensional shape measuring apparatus three- dimensional information measuring method and measuring method of evaluating thin film |
| TW200710411A (en) * | 2005-06-30 | 2007-03-16 | Feinmetall Gmbh | Method and apparatus for electrical testing of a unit under test, as well as a method for production of a contact-making apparatus which is used for testing |
| TW200844448A (en) * | 2006-11-09 | 2008-11-16 | Tokyo Electron Ltd | Probe card for inspecting solid-state image sensor |
| CN102043072A (en) * | 2009-10-14 | 2011-05-04 | 汉民测试系统股份有限公司 | Cis circuit test probe card |
| CN103307989A (en) * | 2013-05-28 | 2013-09-18 | 江苏大学 | Device and method for measuring internal and external diameters of transparent glass bottleneck based on machine vision |
| CN204202559U (en) * | 2014-11-20 | 2015-03-11 | 昆山鸿富洋机电有限公司 | Chaining pin device |
| JP2017129395A (en) * | 2016-01-19 | 2017-07-27 | 三菱電機株式会社 | Semiconductor device inspection apparatus and semiconductor device inspection method |
| CN207515733U (en) * | 2017-11-15 | 2018-06-19 | 深圳市吉瑞达电路科技有限公司 | A kind of circuit board assignment test module |
| CN209230521U (en) * | 2018-07-10 | 2019-08-09 | 苏州德创测控科技有限公司 | Machine vision PIN position measurement assists sieve plate |
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| PB01 | Publication | ||
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| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information | ||
| CB02 | Change of applicant information |
Address after: 714000 No. 18, chongye Second Road, high tech Industrial Development Zone, Weinan City, Shaanxi Province Applicant after: Weinan Muwang Intelligent Technology Co.,Ltd. Address before: 710000 northwest corner of cross between Dongfeng Street and Shiquan Road, high tech Industrial Development Zone, Weinan City, Shaanxi Province Applicant before: WEINAN HI-TECH ZONE WOOD KING TECHNOLOGY Co.,Ltd. |
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| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20210713 |