CN113064773A - Memory PPR (Peer-to-Peer) testing and repairing method, system and storage medium - Google Patents
Memory PPR (Peer-to-Peer) testing and repairing method, system and storage medium Download PDFInfo
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- CN113064773A CN113064773A CN202110252133.8A CN202110252133A CN113064773A CN 113064773 A CN113064773 A CN 113064773A CN 202110252133 A CN202110252133 A CN 202110252133A CN 113064773 A CN113064773 A CN 113064773A
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
- G06F11/073—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment in a memory management context, e.g. virtual memory or cache management
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- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
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- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/079—Root cause analysis, i.e. error or fault diagnosis
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
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Abstract
The invention discloses a memory PPR testing and repairing method, which comprises the following steps: the method comprises the steps of firstly, setting a blacklist based on equipment information; secondly, reading equipment information of the equipment to be tested; executing equipment information judgment, and judging whether the blacklist contains the read equipment information; if the judgment result is yes, executing the test and repair of the memory PPR; if the judgment result is that the blacklist is not included, returning to the step of setting the blacklist; thirdly, after the memory PPR test and repair are executed, a result log is obtained; fourthly, reading the result log, judging the testing and repairing result of the memory PPR based on the result log, and performing corresponding operation; through the mode, the memory PPR testing and repairing are integrated in the testing process, the real faults of the memory are exposed in the testing process, and partial faults are repaired, so that manpower and material resources are saved.
Description
Technical Field
The invention relates to the technical field of memory testing, in particular to a memory PPR testing and repairing method, a system and a storage medium.
Background
With the development of DRAM technology, the memory capacity is larger and larger, and at present, due to the increase of the density of storage particles, bit and row faults in a memory bring more and more challenges to the DRAM industry and also bring challenges to server manufacturers; the memory PPR test is a new test method aiming at the dynamic random access memory in the BIOS test; the purpose is to fix potential bit and row failures in all memories, and to remove row and bit failures in advance before loading the operating system, which will help solve the problems encountered by server manufacturers.
In the current server production factory, after a memory fault occurs in an equipment testing stage, the memory is often directly replaced, a large amount of manpower and material resources are consumed, and the order production progress of the server production factory is influenced; the real memory fault cannot be exposed in the testing stage, so that the problem occurs in the using process of a client, the client can only go to home for maintenance, the manpower, the material resources and the financial resources are consumed, and the experience feeling of the client is directly influenced.
Disclosure of Invention
The invention mainly solves the technical problem of providing a memory PPR testing and repairing method, a system and a storage medium, which can solve the problem of how to effectively connect chips in series so that communication and routing can be optimized.
In order to solve the technical problems, the invention adopts a technical scheme that: a testing and repairing method for memory PPR is provided, which comprises the following steps:
setting a blacklist;
reading equipment information of equipment to be tested;
executing equipment information judgment, and judging whether the blacklist contains the read equipment information;
if the judgment result is yes, executing the test and repair of the memory PPR;
if the judgment result is that the blacklist is not included, returning to the step of setting the blacklist;
after the memory PPR test and repair are executed, a result log is generated;
and reading the result log, and executing memory maintenance operation based on the result log.
As an improvement, the setting the black list further includes the following steps:
setting a blacklist based on the device information; the equipment information comprises a machine type, a BIOS version, a Customer ID and a memory manufacturer; the black list includes a number of the device information.
As an improvement, the determining whether the black list includes the read device information further includes the following steps:
and judging whether the plurality of pieces of equipment information in the blacklist contain the read equipment information.
As an improved scheme, after the testing and repairing of the memory PPR are performed, a result log is generated, which further includes the following steps:
setting a PPR option in the BIOS option to be in an enabling state;
executing a memory PPR test; if the test is passed, writing the test result into the flash memory, and if the test is failed, executing memory PPR repair;
executing memory PPR repair, and writing a repair result into the flash memory;
and generating a result log based on the test result and the repair result.
As an improvement, the executing the memory PPR test further includes the following steps:
executing a read operation on each memory row string of the memory; judging a test result according to the reading result of the memory row string; if the reading is successful, the test result is that the test is passed; and if the reading fails, the test result is test failure.
As an improvement, the performing memory PPR repair further includes the following steps:
setting the memory row string which fails to be read as a failure state, and reading part of the memory row string from the standby memory to be set as an effective state;
executing reading operation on the memory row string set to be in the effective state in the standby memory; judging a repair result according to the read result of the memory row string; if the reading is successful, the repairing result is repairing success; and if the reading fails, the repairing result is repairing failure.
As an improvement, said reading said result log further comprises the steps of:
and calling a corresponding manufacturer tool to read the result log based on the memory manufacturer of the device to be tested.
As an improvement, the performing the memory repair operation based on the result log further includes the following steps:
judging the testing and repairing result of the memory PPR based on the result log;
if the judgment result is that the repair fails, outputting the repair failure and executing the memory replacement operation;
if the judgment result is that the repair is successful, outputting that the repair is successful;
and if the judgment result is that the test is passed, outputting that the test is passed.
The invention also provides a memory PPR testing and repairing system, which comprises: the device comprises a blacklist setting module, a blacklist judging module, a memory PPR testing and repairing module and a result log analyzing module;
the blacklist setting module is used for setting a blacklist based on the equipment information;
the blacklist judgment module is used for acquiring equipment information of equipment to be tested, comparing the acquired equipment information with the equipment information of the blacklist, and determining whether to perform memory PPR test and repair operation according to a comparison result;
the memory PPR testing and repairing module is used for setting the state of a PPR option in the BIOS; the memory PPR is used for testing and repairing the memory PPR and generating a result log according to a test result and a repair result;
and the result log analysis module is used for reading the result log, judging the memory state according to the result log and carrying out corresponding operation.
The present invention also provides a computer storage medium for storing computer software instructions for a memory PPR testing and repairing method, comprising a program for executing the above-described method for testing and repairing a memory PPR.
The invention has the beneficial effects that:
1. according to the memory PPR testing and repairing method, the memory PPR testing and repairing are carried out on the equipment to be tested supporting the memory PPR testing and repairing functions, potential faults of the memory are exposed, the repairing is carried out in advance, and after-sale repairing is avoided.
2. According to the memory PPR testing and repairing system, the memory PPR testing and repairing module is integrated into the memory testing process, so that the memory testing and repairing process is realized, the production efficiency is improved, and the memory fault of a machine is reduced.
3. The data transmission storage medium can automatically test and repair the PPR of the memory, saves manpower and material resources and improves the product quality.
Drawings
In order to more clearly illustrate the detailed description of the invention or the technical solutions in the prior art, the drawings needed in the detailed description or the prior art description are briefly introduced below; throughout the drawings, like elements or portions are generally identified by like reference numerals; in the drawings, elements or portions are not necessarily drawn to scale.
Fig. 1 is a schematic diagram of a testing and repairing method for a PPR in a memory according to embodiment 1 of the present invention;
fig. 2 is a schematic diagram of a memory PPR testing and repairing system according to embodiment 2 of the present invention.
The parts in the drawings are numbered as follows:
the system comprises a 1-blacklist setting module, a 2-blacklist judging module, a 3-memory PPR testing and repairing module, a 4-result log analyzing module and a 100-memory PPR testing and repairing system.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it is obvious that the described embodiments are some, not all embodiments of the present invention; all other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it should be noted that, for example, bios (basic Input Output system) is a basic Input Output system, ppr (post Package repair) is a Package repairable technology, Customer ID is a Customer name, Samsung is Samsung of a chip manufacturer, Hynix is a chip manufacturer, haishi, and Ami and instde are both motherboard types.
Example 1
This embodiment 1 provides a method for testing and repairing a PPR in a memory, referring to fig. 1, which includes the following steps:
in the step S100, setting a blacklist based on the device information; the equipment information comprises a machine type, a BIOS version, a Customer ID and a memory manufacturer; judging whether to test and repair the memory PPR memory according to the blacklist, for example, configuring 'NF 5280M5,4.1.13, Standard, Samsung | Hynix', namely when the model of the device is NF5280M5, the BIOS version is 4.1.13, the Customer ID is Standard, and the memory manufacturer is Samsung or Hynix, testing and repairing the memory PPR memory; and setting all devices needing to be subjected to memory PPR test and repair into the blacklist.
In the step S200, reading device information of the device to be tested, and determining whether the read device information is included in a blacklist; if yes, setting the memory PPR option in the BIOS option to be an Enable state, and restarting the equipment after the setting is finished; if not, the process returns to step S100.
Further, setting the memory PPR option in the BIOS option to an Enable state, comprising the following steps:
judging whether the type of the mainboard is Ami or Insyde;
if the mainboard is of the Ami type, setting a memory PPR option in the BIOS into an Enable state by using an SCELNX _64 tool;
if the mainboard is of an Insyde type, the h2 out-lx 64 tool is used for setting the PPR option of the memory in the BIOS into an Enable state.
In step S300, in the process of restarting the device to be tested, a memory PPR test is executed, and the BIOS reads all memory row strings of the memory; judging a memory PPR test result according to the read result of the memory row string;
if the reading is successful, writing the test result 'Pass' into a flash memory of the BIOS; if the memory row string reading fails, executing a repairing step;
the repairing steps are as follows: the BIOS sets the memory row string address which fails to be read as a failure state, and takes the memory row string with the same size from the reserved standby memory to be set as an effective state;
reading the memory row string set to be in an effective state in the standby memory; if the reading is successful, the repairing is successful, and a repairing result 'Repaired' is written into a flash memory of the BIOS; if the reading fails, the repair fails, and the repair result 'Fail' is written into a flash memory of the BIOS; and generating a result log based on the test result and the repair result.
In the step S400, calling a corresponding manufacturer tool to read a result log stored in the flash memory of the BIOS according to a memory manufacturer of the device to be tested;
if the memory manufacturer is Samsung, calling a manufacturer tool Samsung _ dmparser of the Samsung to read a result log stored in a BIOS flash memory;
if the memory manufacturer is Hynix, calling Hynix manufacturer tool Hynix _ srdv to read a result log stored in a BIOS flash memory;
judging the testing and repairing result of the memory PPR according to the result log;
if the judgment result is 'Fail', indicating that the repair fails, outputting the repair failure and specific abnormal memory information on the terminal, and performing memory replacement operation;
if the judgment result is 'Repaired', indicating that the repair is successful, outputting memory information of the repair success and the repair operation execution on the terminal, and setting a memory PPR option in the BIOS option to be in a Disable state;
if the judgment result is 'Pass', the test is passed, the test is output on the terminal, and the memory PPR option in the BIOS option is set to a Disable state.
Example 2
In this embodiment 2, a system for testing and repairing a PPR of a memory is provided, referring to fig. 2, where the system for testing and repairing a PPR of a memory includes: the device comprises a blacklist setting module, a blacklist judging module, a memory PPR testing and repairing module and a result log analyzing module;
the blacklist setting module is used for setting a blacklist based on equipment information, wherein the equipment information comprises a machine type, a BIOS version, a Customer ID and a memory manufacturer; the blacklist comprises a plurality of pieces of equipment information;
the blacklist judgment module is used for acquiring the equipment information of the equipment to be tested, comparing the acquired equipment information with the equipment information of the blacklist, and determining whether to test and repair the memory PPR according to a comparison result;
the memory PPR testing and repairing module is used for setting a PPR option in the BIOS, controlling the test equipment to restart, testing and repairing the memory PPR after the equipment is restarted, and generating a result log according to a testing and repairing result;
and the result log analysis module is used for reading the result log based on the memory manufacturer of the equipment to be tested, judging the memory state according to the result log and carrying out memory maintenance operation.
Example 3
This embodiment 3 provides a computer-readable storage medium, where the storage medium is used to store computer software instructions for implementing the method for testing and repairing the PPR in the memory according to embodiment 1, and the storage medium includes a program designed to execute the method for testing and repairing the PPR in the memory; specifically, the executable program may be embedded in the memory PPR testing and repairing system 100, so that the memory PPR testing and repairing system 100 may implement the memory PPR testing and repairing method according to embodiment 1 by executing the embedded executable program.
Furthermore, the computer-readable storage medium provided by the present embodiments may take any combination of one or more readable storage media, where a readable storage medium includes an electronic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof.
The serial numbers of the embodiments disclosed in the above embodiments are merely for description and do not represent the merits of the embodiments.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes performed by the present specification and drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (10)
1. A memory PPR testing and repairing method is characterized by comprising the following steps:
setting a blacklist;
reading equipment information of equipment to be tested;
executing equipment information judgment, and judging whether the blacklist contains the read equipment information;
if the judgment result is yes, executing the test and repair of the memory PPR;
if the judgment result is that the blacklist is not included, returning to the step of setting the blacklist;
after the memory PPR test and repair are executed, a result log is generated;
and reading the result log, and executing memory maintenance operation based on the result log.
2. The method for testing and repairing a memory PPR according to claim 1, wherein said setting of a blacklist further comprises the steps of:
setting a blacklist based on the device information; the equipment information comprises a machine type, a BIOS version, a CustomerID and a memory manufacturer; the black list includes a number of the device information.
3. The method for testing and repairing a memory PPR according to claim 2, wherein said determining whether said blacklist includes said read device information further comprises:
and judging whether the plurality of pieces of equipment information in the blacklist contain the read equipment information.
4. The method for testing and repairing a memory PPR according to claim 1, wherein a result log is generated after the memory PPR is tested and repaired, further comprising the steps of:
setting a PPR option in the BIOS option to be in an enabling state;
executing a memory PPR test; if the test is passed, writing the test result into the flash memory; if the test fails, executing memory PPR repair;
executing memory PPR repair, and writing a repair result into the flash memory;
and generating a result log based on the test result and the repair result.
5. The method of testing and repairing a memory PPR according to claim 4, wherein said performing a memory PPR test further comprises the steps of:
executing a read operation on each memory row string of the memory; judging a test result according to the reading result of the memory row string; if the reading is successful, the test result is that the test is passed; and if the reading fails, the test result is test failure.
6. The method of claim 5, wherein the performing memory PPR repair further comprises:
setting the memory row string which fails to be read as a failure state, and reading part of the memory row string from the standby memory to be set as an effective state;
executing reading operation on the memory row string set to be in the effective state in the standby memory; judging a repair result according to the read result of the memory row string; if the reading is successful, the repairing result is repairing success; and if the reading fails, the repairing result is repairing failure.
7. The method of testing and repairing a memory PPR according to claim 2, wherein said reading said result log further comprises the steps of:
and calling a corresponding manufacturer tool to read the result log based on the memory manufacturer of the device to be tested.
8. The method of testing and repairing a memory PPR according to claim 6, wherein said performing a memory repair operation based on said result log further comprises the steps of:
judging the testing and repairing result of the memory PPR based on the result log;
if the judgment result is that the repair fails, outputting the repair failure and executing the memory replacement operation;
if the judgment result is that the repair is successful, outputting that the repair is successful;
and if the judgment result is that the test is passed, outputting that the test is passed.
9. A memory PPR test and repair system, comprising: the device comprises a blacklist setting module, a blacklist judging module, a memory PPR testing and repairing module and a result log analyzing module;
the blacklist setting module is used for setting a blacklist based on the equipment information;
the blacklist judgment module is used for acquiring equipment information of equipment to be tested, comparing the acquired equipment information with the equipment information of the blacklist, and determining whether to perform memory PPR test and repair operation according to a comparison result;
the memory PPR testing and repairing module is used for setting the state of a PPR option in the BIOS; the memory PPR is used for testing and repairing the memory PPR and generating a result log according to a test result and a repair result;
and the result log analysis module is used for reading the result log, judging the memory state according to the result log and carrying out corresponding operation.
10. A computer storage medium storing computer software instructions for the in-memory PPR testing and repairing method of any one of claims 1-8, comprising program instructions for executing the in-memory PPR testing and repairing method.
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| CN113064773B (en) | 2023-03-24 |
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