CN113063732B - Solar absorption ratio in-situ detection device and method in vacuum low-temperature environment - Google Patents
Solar absorption ratio in-situ detection device and method in vacuum low-temperature environment Download PDFInfo
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- CN113063732B CN113063732B CN202110315210.XA CN202110315210A CN113063732B CN 113063732 B CN113063732 B CN 113063732B CN 202110315210 A CN202110315210 A CN 202110315210A CN 113063732 B CN113063732 B CN 113063732B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
Abstract
The application provides a device and a method for in-situ detection of solar absorptance in a vacuum low-temperature environment, wherein the in-situ detection device comprises a vacuum low-temperature test tank, a detection probe arranged in the vacuum low-temperature test tank, and a control host arranged outside the vacuum low-temperature test tank and electrically connected with the detection probe; the detection probe includes: an integrating sphere and a processing module; the bottom of the integrating sphere is provided with a detection hole; the top of the inner wall of the integrating sphere is provided with a detector and a light source capable of generating a plurality of wave bands; the detector is configured to obtain an optical signal reflected by the inner wall of the integrating sphere and convert the optical signal into an electric signal; the input end of the processing module is connected with the output end of the detector, and the output end of the processing module is connected with the control host through a cable; the processing module is configured to output a radiance A t (λ); the control host is used for calculating and outputting the solar absorption ratio alpha. Through the structure, the light flux loss caused by light signal derivation is avoided in the detection process, and the method has the advantages of in-situ, accurate and rapid detection.
Description
Technical Field
The present disclosure relates generally to in situ solar absorptance detection devices, and more particularly to in situ solar absorptance detection devices in a vacuum low temperature environment.
Background
The solar absorption ratio is a dimensionless physical quantity representing the capacity of a material to absorb solar radiation, is numerically equal to the ratio of the solar absorption radiation flux to the incident radiation flux, and is one of important indexes for measuring the thermophysical performance of the surface of the material. The rapid and accurate in-situ measurement of the solar absorptance parameter on the surface of the material is always a concern in the engineering thermophysical field.
In-situ measurement of solar absorptance before and after testing under thermal control coating vacuum low temperature environment test conditions is generally performed by two methods: the first method is that after the test is finished, a sample is taken out and is subjected to solar absorptance detection on the surface of the material after the test by a portable or ground detection device; the second method is that the thermal control coating sample is left in a thermal vacuum test tank after the test, the surface of the sample is detected through a probe and an optical fiber structure, an optical signal emitted by the surface of the sample is collected, the optical signal is introduced into an integrating sphere structure outside the thermal vacuum test tank through an optical fiber, and the photoelectric conversion and the spectral analysis calculation are carried out through a spectrophotometer matched with the integrating sphere structure for detection.
The first detection method is characterized in that a tested sample is moved to a room temperature environment condition from a vacuum low-temperature environment condition for detection, the surface of the sample changes, and the detection result cannot reflect the real change state of the solar absorption ratio of the surface of the tested sample; in the second detection method, the detection light signal on the surface of the sample in the vacuum low-temperature test tank is introduced to the outside of the tank through the optical fiber for analysis and detection, and the light flux loss is introduced, so that the detection result is inaccurate.
Therefore, in order to realize in-situ detection of the solar absorption ratio on the surface of the material in a vacuum low-temperature environment and overcome the defects of the prior art, the design and invention of a novel solar absorption ratio detection device and a detection method have important practical significance.
Disclosure of Invention
In view of the above defects or shortcomings in the prior art, it is desirable to provide an in-situ detection apparatus and method for solar absorptance in vacuum low temperature environment, which can truly reflect the real change state of the solar absorptance on the surface of a sample to be detected and avoid light flux loss.
The first aspect of the application provides an in-situ detection device for solar absorption ratio in a vacuum low-temperature environment, which comprises a vacuum low-temperature test tank, a detection probe installed in the vacuum low-temperature test tank, and a control host which is arranged outside the vacuum low-temperature test tank and electrically connected with the detection probe through a cable;
the detection probe includes: the device comprises an integrating sphere with a hollow interior and a processing module arranged on the integrating sphere; the bottom of the integrating sphere is provided with a detection hole for detecting a sample to be detected; the top of the inner wall of the integrating sphere is provided with a detector and a light source capable of generating a plurality of wave bands; the detector is configured to acquire an optical signal reflected by the inner wall of the integrating sphere and convert the optical signal into an electrical signal;
the input end of the processing module is connected with the output end of the detector, and the output end of the processing module is connected with the control host through the cable; the processing module is configured to process the electrical signal and output a radiance A t (λ)；
The control host is configured to receive the radiance A t (λ), the solar absorption ratio α is calculated and output.
According to the technical scheme provided by the embodiment of the application, the control host is specifically configured to:
receiving the radiation brightness A output by the processing module under the irradiation of light sources with different wave bands t (λ)；
Calculating the reflectivity r (lambda) of the sample to be detected under the irradiation of light sources with different wave bands:
wherein A is w (lambda) is a first standard value which is the brightness of the total reflection radiation under the irradiation of the light source with the current lambda wavelength; a. The b (lambda) is a second standard value, which is the brightness of the total absorption radiation under the irradiation of the light source with the current lambda wavelength;
calculating the total reflectivity r of the sample to be detected:
r＝∑a λ *r(λ)
wherein, the a λ Setting the weight;
calculating the solar absorption ratio α:
α＝1-r。
according to the technical scheme that this application embodiment provided, vacuum low temperature test tank inner wall top installs motion actuating mechanism, motion actuating mechanism with integrating sphere lateral wall fixed connection, motion actuating mechanism is used for the drive the integrating sphere removes along level and vertical direction.
According to the technical scheme provided by the embodiment of the application, the motion executing mechanism comprises: the device comprises a guide rail horizontally arranged at the top of the inner wall of the vacuum low-temperature test tank, a slide block arranged on the guide rail, a screw rod arranged in the vertical direction, and a lifting nut arranged on the screw rod, wherein one end of the screw rod is connected with the bottom of the slide block through a bearing;
the lifting nut is fixedly connected with the side wall of the integrating sphere;
one end of the guide rail is connected with a first driving motor in a transmission mode, one end of the lead screw is connected with a second driving motor in a transmission mode, and the first driving motor, the second driving motor and the control host are electrically connected.
According to the technical scheme provided by the embodiment of the application, a first platform for placing the sample to be tested and a second platform for placing a total reflection standard sample are arranged at the bottom of the inner wall of the vacuum low-temperature test tank; and blackening the inner wall of the vacuum low-temperature test tank.
According to the technical scheme that this application embodiment provided, processing module includes filtering module, enlarged module and operation module, filtering module's input with the output of detector is connected, enlarged module's input with filtering module's output is connected, operation module's input with enlarged module's output is connected, operation module's output passes through the cable with main control system connects.
According to the technical scheme provided by the embodiment of the application, a base material with the thickness of 60-80 microns is sprayed on the inner wall of the integrating sphere, a magnesium oxide coating or a barium sulfate coating with the thickness of 80-100 microns is sprayed on the base material, and the reflectivity of the inner wall of the integrating sphere is larger than 0.97.
According to the technical scheme provided by the embodiment of the application, the light source is an LED light source array driven by constant current, and the wave bands of the light source comprise visible light wave bands of 200-370nm, 370-490nm, 490-560nm and 560-800nm and infrared wave bands of 800-1100nm, 1100-1400nm, 1400-1600 nm, 1600-1900nm and 1900-2600 nm.
In a second aspect, the present application provides an in-situ detection method for solar absorptance in a vacuum low-temperature environment, comprising the following steps:
obtaining a light source capable of generating a plurality of wave bands under a vacuum low-temperature environment and irradiating a sample to be detected in a time-sharing and sectional manner;
acquiring light fluxes reflected by the sample to be detected under the irradiation of light sources of different wave bands, and converting the light fluxes into electric signals;
processing the electric signal to obtain the radiation brightness A t (λ)；
The radiance A is measured t (λ) is sent outside the vacuum cryogenic environment and the solar absorption ratio α is calculated.
According to the technical scheme provided by the embodiment of the application, the method for calculating the solar absorption ratio alpha specifically comprises the following steps:
calculating the reflectivity r (lambda) of the sample to be detected:
wherein, A w (lambda) is a first standard value, which is the total reflection radiation brightness under the irradiation of the light source with the current lambda wavelength; a. The b (lambda) is a second standard value, which is the brightness of the total absorption radiation under the irradiation of the light source with the current lambda wavelength;
calculating the total reflectivity r of the sample to be detected:
r＝∑a λ *r(λ)
wherein, the a λ Setting the weight;
calculating the solar absorption ratio alpha:
α＝1-r。
the beneficial effect of this application lies in: based on the technical scheme provided by the application, in the using process, a sample to be detected is arranged below the detection hole in a contact manner, and the light source is started; the light source emits light of different wave bands in a time-sharing segmented manner and emits the light to the surface of the sample to be detected; the light source reflects on the surface of a sample to be measured, and the reflected light rays are emitted onto the inner wall of the integrating sphere to be subjected to diffuse reflection; the detector obtains the luminous flux after multiple diffuse reflections on the inner wall of the integrating sphere and converts the optical signal into an electric signal; the processing module processes the electric signal to obtain the radiation brightness A under the irradiation of the light sources with different wave bands lambda t (λ); the radiance A is transmitted through a cable t And (lambda) sending the solar absorption ratio alpha to a control host outside the vacuum low-temperature test tank, and further calculating and outputting the solar absorption ratio alpha of the sample to be tested.
The in-situ detection device for the solar absorption ratio in the vacuum low-temperature environment realizes in-situ acquisition and calculation of the solar absorption ratio on the surface of the sample to be detected in the vacuum low-temperature environment, and the detection calculation result can truly reflect the capacity of the surface of the sample to be detected for absorbing solar radiation; through set up detector and processing module on the detection probe, turn into the light signal into the signal of telecommunication, avoided the light signal to derive and cause luminous flux loss, avoid producing detection error, have the advantage that can realize normal position, accurate and short-term test.
Drawings
Other features, objects and advantages of the present application will become more apparent upon reading of the following detailed description of non-limiting embodiments thereof, made with reference to the accompanying drawings in which:
FIG. 1 is a diagram illustrating an in-situ solar absorptance detection apparatus under a vacuum low-temperature environment according to an embodiment of the present disclosure;
fig. 2 is a schematic structural view of the integrating sphere 4 shown in fig. 1;
FIG. 3 is a view of a convex inspection pad 20 for mounting on the inspection hole 7 of FIG. 2;
FIG. 4 is a view of a concave detection pad 21 for mounting on the detection hole 7 shown in FIG. 2;
FIG. 5 is a schematic structural diagram of the processing module 5 shown in FIG. 2;
fig. 6 is a method for in-situ detection of solar absorptance in a vacuum low-temperature environment according to the present disclosure.
Reference numbers in the figures:
1. a vacuum low-temperature test tank; 2. a cable; 3. a control host; 4. an integrating sphere; 5. a processing module; 6. a sample to be tested; 7. a detection hole; 8. a detector; 9. a light source; 10. a guide rail; 11. a slider; 12. a screw rod; 13. a lifting nut; 14. a first platform; 15. fully reflecting the standard sample; 16. a second platform; 17. a filtering module; 18. an amplifying module; 19. an operation module; 20. a convex detection rubber pad; 21. a concave detection rubber mat; 22. adding an integrating sphere; 23. a lower integrating sphere; 24. a first light source aperture; 25. a second light source aperture; 26. an exit aperture; 27. a rack-mounted cabinet; 28. a probe housing; 29. and a cable interface.
Detailed Description
The present application will be described in further detail with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not to be construed as limiting the invention. It should be noted that, for convenience of description, only the portions related to the present invention are shown in the drawings.
It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present application will be described in detail below with reference to the embodiments with reference to the attached drawings.
Please refer to fig. 1 for an in-situ detection apparatus for solar absorption ratio in a vacuum low-temperature environment provided by the present application, which includes a vacuum low-temperature test tank 1, a detection probe installed in the vacuum low-temperature test tank 1, and a control host 3 disposed outside the vacuum low-temperature test tank 1 and electrically connected to the detection probe through a cable 2;
as shown in fig. 2, the inspection probe includes: an integrating sphere 4 with a hollow inner part and a processing module 5 arranged on the integrating sphere; the bottom of the integrating sphere 4 is provided with a detection hole 7 for detecting a sample 6 to be detected; the top of the inner wall of the integrating sphere 4 is provided with a detector 8 and a light source 9 capable of generating a plurality of wave bands; the detector 8 is configured to acquire an optical signal reflected by the inner wall of the integrating sphere 4 and convert the optical signal into an electrical signal;
the input end of the processing module is connected with the output end of the detector 8, and the output end of the processing module 5 is connected with the control host 3 through the cable 2; the processing module 5 is configured to process the electrical signal and output a radiance A t (λ)；
The control host 3 is configured to receive the radiance A t (λ), the solar absorption ratio α is calculated and output.
Specifically, the light source 9 is an LED light source matrix, the LED light source matrix is composed of seven LED lamps and is driven by a constant current driving source, and the current stability is ± 0.1% (DAC =1V, -50 to 75 ℃). The light source 9 can generate nine light sources with set wave bands for simulating a solar light source, as shown in table 1;
TABLE 1 spectral distribution of light source and its package diameter
Specifically, integrating sphere 3 installs in vacuum low temperature test jar 1, it includes integrating sphere 22 and lower integrating sphere 23 two parts, go up integrating sphere 22 with integrating sphere 23 seals fixedly through the clamping ring down. The detection probe also comprises a probe shell 28, two sides of the integrating sphere 4 are provided with brackets fixedly connected with the probe shell 28, and one side of the probe shell 28, which is far away from the integrating sphere 4, is provided with a cable interface 29;
a first light source hole 24 with the thickness of 8mm is formed in the middle of the top of the upper integrating sphere 22, and six second light source holes 25 with the thickness of 5mm are formed around the first light source hole; the included angle between the connecting lines of the two adjacent second light source holes 25 and the first light source hole 24 is 60 degrees; install the intermediate infrared LED lamp that encapsulation diameter is 8mm in the first light source hole 24, install the LED lamp of other wave bands in the second light source hole 25 respectively.
An exit hole 26 with the diameter of 12mm is formed in the position, which is 3-5mm away from the edge, of two sides of the upper integrating sphere 22, and the detector 8 is installed in the exit hole 26.
The diameter of the detection hole 7 is 20mm, and the detection hole is formed in the middle of the bottom of the lower integrating sphere 23; the included angle between the central connecting line of the first light source hole 24 and the detecting hole 7 and the central connecting line of the second light source hole 25 and the detecting hole 7 is 8 degrees.
Specifically, the cable 2 adopts RS-232 level for data transmission, the transmission rate is 36000-39000bps, the length of the cable 2 is 5-10 meters, and the cable 2 can adopt a TPE sheath sports cable which can endure low temperature of-40 ℃, so that the cable can keep flexibility at low temperature.
Specifically, the control host 3 is installed on a rack-type cabinet 27 outside the vacuum low-temperature test tank 1; the control host 3 comprises a 4.3-inch display screen, three operating buttons arranged below the display screen and a power switch; a main control board, an LCD interface board, a multi-path direct current power supply and a light source driving module are integrated in the control host 3; the multi-path direct current power supply is used for supplying power to the detection probe, and the light source driving module is used for driving the light source 9; the working temperature range of chips adopted by the main control board and the multi-path direct current power supply is-50 ℃, the selected temperature drift resistance is a low temperature drift resistance of +/-5 ppm/DEG C, and the temperature stability of the power supply reference chip is +/-20 ppm/DEG C; the control host 3 is directly connected with 220V mains supply, is provided with an RS485 interface, runs a Modbus RTU protocol, and can be connected with a PLC system for control and result reading.
The working principle is as follows: in the using process, a sample 6 to be detected is arranged below the detection hole 7 in a contact mode, and the light source 9 is started; the light source 9 emits light of different wave bands in a time-sharing segmented manner and emits the light to the surface of the sample 6 to be detected; the light source 9 reflects on the surface of the sample 6 to be measured, and the reflected light rays are emitted onto the inner wall of the integrating sphere 4 to be subjected to diffuse reflection; the detector 8 obtains the luminous flux after multiple diffuse reflections on the inner wall of the integrating sphere 4 and converts the optical signal into an electric signal; the processing module 5 processes the electric signal to obtain the radiation brightness A under the irradiation of the light sources with different wave bands lambda t (λ); the radiance A is transmitted through the cable 2 t (lambda) is sent to a control host 3 outside the vacuum low-temperature test tank 1, and then the solar absorption ratio alpha of the sample to be tested can be calculated and output.
According to the in-situ detection device for the solar absorption ratio in the vacuum low-temperature environment, the solar absorption ratio of the surface of a sample to be detected can be acquired and calculated in situ in the vacuum low-temperature environment, and the detection calculation result can truly reflect the solar radiation absorption capacity of the surface of the sample to be detected; through set up detector 8 and processing module 5 on the test probe, convert light signal into the signal of telecommunication, avoided light signal to derive and cause luminous flux loss, avoid producing detection error, have the advantage that can realize normal position, accurate and short-term test.
In a preferred embodiment of the control host, the control host 3 is specifically configured to:
receiving the radiation brightness A output by the processing module 5 under the irradiation of the light sources with different wave bands t (λ)；
Calculating the reflectivity r (lambda) of the sample to be measured under the irradiation of light sources of different wave bands:
wherein A is w (lambda) is a first standard value, which is the total reflection radiation brightness under the irradiation of the light source with the current lambda wavelength; a. The b (λ) is a second criterion value for the current λ wavelengthThe brightness of the fully absorbed radiation under the irradiation of a light source;
calculating the total reflectivity r of the sample 6 to be detected:
r＝∑a λ *r(λ)
wherein, the is a λ Setting weight;
calculating the solar absorption ratio α:
α＝1-r。
it should be further noted that the first standard value A w (lambda) is the radiance of the total reflection standard sample at the current lambda wavelength; the total reflection standard sample may be a standard whiteboard sample, that is, the manner of obtaining the first standard value is as follows:
a standard whiteboard sample is arranged below the detection hole in a contact manner, the light source 9 is controlled to emit incident light with the wavelength of lambda and irradiate the incident light to the standard whiteboard, and the radiance acquired by the processing module at the moment is the total reflection radiance A irradiated by the light source with the current lambda wavelength w (λ)。
Similarly, the second standard value A b (lambda) is the radiance of the total absorption standard sample at the current lambda wavelength; the total absorption standard sample can be the inner wall of the vacuum low-temperature test tank after the blackening treatment, namely the second standard value is obtained by the following steps:
controlling the light source 9 to emit incident light with the wavelength of lambda and irradiate the incident light onto the inner wall of the vacuum test tank in a dark environment, wherein the radiance obtained by the processing module at the moment is the full-absorption radiance A irradiated by the light source with the current lambda wavelength b (λ)。
For convenience of explaining the working principle of the present embodiment, a sample a to be measured is taken as an example, wherein the light source 9 adopts the LED light source matrix described above, and the control host 3 obtains the radiance a t (lambda), first criterion A w (lambda), second standard value A b The results of the detection of (. Lamda.) are shown in the following table:
| wavelength lambda (nm) | A b (λ) | Aw(λ) | A t (λ) |
| 280 | 14497 | 19101 | 14894 |
| 465 | 19327 | 22123 | 20427 |
| 520 | 17534 | 20055 | 18503 |
| 627 | 17941 | 20292 | 18824 |
| 940 | 16941 | 20675 | 18227 |
| 1200 | 13337 | 15615 | 14116 |
| 1550 | 11869 | 13498 | 12390 |
| 1760 | 12119 | 14474 | 12861 |
| 2050 | 16139 | 20514 | 17566 |
TABLE 2 test results
Calculating the reflectivity r (lambda) of the sample A to be detected under the irradiation of light sources of different wave bands:
r(280)＝0.1105；
r(465)＝0.4260；
r(520)＝0.4161；
r(627)＝0.4048；
r(940)＝0.3906；
r(1200)＝0.3782；
r(1550)＝0.3484；
r(1760)＝0.3546；
r(2050)＝0.3808；
calculating the total reflectivity r of the sample A to be detected:
r＝∑a λ *r(λ)
wherein, a λ To set the weights, the specific weight values are shown in table 3:
| a (280) | a (465) | a (520) | a (627) | a (940) | a (1200) | a (1550) | a (1760) | a (2050) | |
| weight of | 0.024 | 0.183 | 0.167 | 0.144 | 0.220 | 0.123 | 0.069 | 0.047 | 0.023 |
TABLE 3 weight values
r＝0.3903；
Calculating the solar absorption ratio alpha:
α＝1-0.3903＝0.6097。
in a preferred embodiment of the integrating sphere 4, a motion executing mechanism is mounted at the top of the inner wall of the vacuum low-temperature test tank 1, the motion executing mechanism is fixedly connected with the outer side wall of the integrating sphere 4, and the motion executing mechanism is used for driving the integrating sphere 4 to move in the horizontal and vertical directions.
The movement actuator is arranged to facilitate the position adjustment of the integrating sphere 4, so that the sample 6 to be measured can be contactingly arranged at the bottom of the detection hole 7.
Wherein, in a preferred embodiment of the motion actuator, the motion actuator comprises: the device comprises a guide rail 10 horizontally arranged at the top of the inner wall 1 of the vacuum low-temperature test tank, a slide block 11 arranged on the guide rail 10, a screw rod 12 arranged in the vertical direction and with one end connected with the bottom of the slide block 11 through a bearing, and a lifting nut 13 arranged on the screw rod 12;
the lifting nut 13 is fixedly connected with the side wall of the integrating sphere 4;
one end of the guide rail 10 is connected with a first driving motor in a transmission manner, one end of the screw rod 12 is connected with a second driving motor in a transmission manner, and the first driving motor and the second driving motor are electrically connected with the control host 3.
Specifically, the first driving motor is used for driving the guide rail 10 to rotate forward and backward, so that the sliding block 11 can move left and right along the horizontal direction; the second driving motor is used for driving the screw rod 12 to rotate forwards and backwards, so that the lifting nut 13 can perform lifting motion along the second screw rod. Meanwhile, the first driving motor and the second driving motor are electrically connected with the control host 3, so that remote driving control is facilitated.
Through the structure, the accurate control contact measurement of the motion of the detection probe under the vacuum low-temperature environment is realized, the measurement error caused by artificial control of the existing detection device is avoided, and the detection device has the advantages of accurate detection control and high detection efficiency.
In a preferred embodiment of the vacuum cryogenic test tank 1, a first platform 14 for placing the sample 6 to be tested and a second platform 16 for placing a total reflection standard sample 15 are installed at the bottom of the inner wall of the vacuum cryogenic test tank 1; and the inner wall of the vacuum low-temperature test tank 1 is subjected to blackening treatment.
Specifically, the total reflection standard sample 15 is a cylindrical standard white board sample for calibration, wherein the diameter of the standard white board sample is 20mm, the thickness of the standard white board sample is 2-3mm, the standard white board sample is formed by pressing a polytetrafluoroethylene material, and the surface solar absorption ratio reflectivity of the standard white board sample is not lower than 0.98; the diameter of the sample 6 to be detected is less than or equal to 20mm;
specifically, the diameters of the first platform 14 and the first platform 16 are 20-22mm, the heights of the first platform and the first platform are 15-20mm, and the first platform are made of AISI 316 stainless steel materials; the distance between the edges of the first platform 14 and the second platform 16 is 10-15mm.
In the using process, the sample 6 to be detected is placed on the first platform 14, and the total reflection standard sample 15 is placed on the second platform 16;
the control host 3 controls the motion executing mechanism to enable the detection hole 8 on the integrating sphere 4 to correspond to the upper part of the inner wall of the bottom of the vacuum low-temperature test tank 1, because the inner wall of the vacuum low-temperature test tank 1 is blackened, the control host 3 controls the light source 9 to emit light with the wavelength of lambda, and the radiation brightness output by the processing module 5 is A b (λ)；
The control host 3 controls the motion executing mechanism to enable the detection hole 8 on the integrating sphere 4 to correspond to the second platform 16, and enables the total reflection standard sample 15 (namely, a standard white board sample) on the second platform 16 to be in contact with the bottom of the detection hole 7, at this time, the control host 3 controls the light source 9 to emit light with the wavelength of lambda, and the radiation brightness output by the processing module is A w (λ)；
The control host 3 controls the motion actuator to enable the detection hole 8 on the integrating sphere 4 to correspond to the first platform 14, and enables the sample 6 to be detected on the first platform 14 to be in contact with the bottom of the detection hole 7, and at the moment, the control host controls the light source 9 to use a light source with the wavelength of lambda as the light sourceEmitting, the radiant brightness output by the processing module is A t (λ)。
Through the structure, the sample to be measured can be conveniently measured, and the first standard value A can be conveniently determined w (lambda) and a second criterion A b (λ)。
In a preferred embodiment of the processing module 5, as shown in fig. 5, the processing module 5 includes a filtering module 17, an amplifying module 18, and an operation module 19; the input end of the filtering module 17 is connected with the output end of the detector 8, the input end of the amplifying module 18 is connected with the output end of the filtering module 17, the input end of the operation module 19 is connected with the output end of the amplifying module 18, and the output end of the operation module 19 is connected with the control host 1 through the cable 2.
Specifically, the processing module 5 comprises a module singlechip and an analog circuit module; the analog circuit module comprises the filtering module 17, an amplifying module 18 and an operation module 19;
the filtering module 17 is configured to filter the electrical signal output by the detector 8, the amplifying module 18 is configured to amplify the filtered signal, and the operation module 19 is configured to perform operation on the amplified signal and output a radiation brightness a t (λ)。
In a preferred embodiment of the integrating sphere 4, a base material with a thickness of 60-80 microns is sprayed on the inner wall of the integrating sphere 4, a magnesium oxide coating or a barium sulfate coating with a thickness of 80-100 microns is sprayed on the base material, and the reflectivity of the inner wall of the integrating sphere 4 is greater than 0.97.
Specifically, the base material is white paint; the inner wall of the integrating sphere 4 is milled, and the roughness of the inner wall is controlled to be Ra3.2; the integrating sphere 4 is made of AISI 316, the inner diameter of the integrating sphere 4 is 60mm, the wall thickness is 3-5mm, and the aperture ratio is 2%.
In a preferred embodiment of the light source 9, the light source 9 is an LED light source array driven by a constant current, and the light source has a visible light band of 200-370nm, 370-490nm, 490-560nm, 560-800nm, and an infrared band of 800-1100nm, 1100-1400nm, 1400-1600 nm, 1600-1900nm, 1900-2600nm, as shown in table 1 above.
Because the light source 9 is a full-LED light source array driven by a constant current, the LED light source has the advantages of high current stability, small temperature drift and suitability for low-temperature environment detection under the condition of-50 to 75 ℃.
In a preferred embodiment of the detector 8, the detector 8 is a silicon photodiode detector or an indium gallium arsenide photodiode detector.
Specifically, the silicon photodiode detector is used for detecting the wave band of 190-1100 nm, the indium gallium arsenic photodiode detector is used for detecting the wave band of 900-2600nm, and the response efficiency of the diode detector combination is 0.16A/W (350 nm) at the lowest and 1.3A/W (2.3 nm) at the highest;
specifically, the silicon photodiode detector and the indium gallium arsenic photodiode detector are respectively installed in the two exit holes 26.
In a preferred embodiment of the detection hole 7, as shown in fig. 3 and 4, a convex detection rubber pad 20 or a concave detection rubber pad 21 is mounted on an outer wall of the detection hole 7.
Specifically, the outer wall of the detection hole 7 is of an M5 thread structure, and can be connected with the convex detection rubber mat 20 or the concave detection rubber mat 21 through the thread structure so as to be adapted to the surface measurement of samples to be detected with different surface shapes; the thickness of the convex detection rubber mat 20 and the concave detection rubber mat 21 is 2-3mm, and the materials are ethylene propylene rubber.
Example 2
Please refer to fig. 6, which is a schematic diagram illustrating an in-situ detection method of solar absorptance in a vacuum low-temperature environment, comprising the following steps:
s100: obtaining a light source capable of generating a plurality of wave bands under a vacuum low-temperature environment and irradiating a sample to be detected in a time-sharing and sectional manner;
s200: acquiring the luminous flux reflected by the sample to be detected under the irradiation of light sources of different wave bands, and converting the luminous flux into an electric signal;
in this step, the method of obtaining the luminous flux and converting the luminous flux into an electrical signal includes: based on the principle of an integrating sphere spectral reflection method, the method comprises the following steps: the sample to be detected is arranged at the detection hole at the bottom of the integrating sphere in a contact manner, the light source is arranged at the top of the integrating sphere, the detector is arranged in the integrating sphere, the light source reflects when penetrating into the surface of the sample to be detected, the reflected light penetrates into the inner wall of the integrating sphere to generate diffuse reflection, and the light flux reflected by the sample to be detected can be obtained and converted into an electric signal through the detector.
S300: processing the electric signal to obtain the radiation brightness A t (λ)；
In this step, the electric signal can be filtered, amplified and operated by the processing module to obtain the radiation brightness A t (λ)。
S400: the radiance A is measured t (lambda) is sent outside the vacuum low temperature environment and the solar absorption ratio alpha is calculated.
In this step, the brightness A of the radiation can be measured by using a cable t (λ) is transmitted to the outside of the vacuum cryogenic environment through an RS-232 level.
The method for the solar absorption ratio alpha comprises the following specific steps:
calculating the reflectivity r (lambda) of the sample to be detected:
wherein A is w (lambda) is a first standard value, which is the total reflection radiation brightness under the irradiation of the light source with the current lambda wavelength; a. The b (λ) is a second standard value, which is the brightness of the total absorbed radiation under the irradiation of the light source with the current λ wavelength;
calculating the total reflectivity r of the sample to be detected:
r＝∑a λ *r(λ)
wherein, the a λ Setting the weight;
calculating the solar absorption ratio alpha:
α＝1-r。
the above description is only a preferred embodiment of the application and is illustrative of the principles of the technology employed. It will be appreciated by a person skilled in the art that the scope of the invention as referred to in the present application is not limited to the embodiments with a specific combination of the above-mentioned features, but also covers other embodiments with any combination of the above-mentioned features or their equivalents without departing from the inventive concept. For example, the above features may be replaced with (but not limited to) features having similar functions disclosed in the present application.
Claims (8)
1. The utility model provides a solar absorptance normal position detection device under vacuum low temperature environment which characterized in that: the device comprises a vacuum low-temperature test tank (1), a detection probe arranged in the vacuum low-temperature test tank (1), and a control host (3) which is arranged outside the vacuum low-temperature test tank (1) and is electrically connected with the detection probe through a cable (2);
the detection probe includes: the device comprises an integrating sphere (4) with a hollow interior and a processing module (5) mounted on the integrating sphere; the bottom of the integrating sphere (4) is provided with a detection hole (7) for detecting a sample (6) to be detected; the top of the inner wall of the integrating sphere (4) is provided with a detector (8) and a light source (9) capable of generating a plurality of wave bands; the detector (8) is configured to acquire an optical signal reflected by the inner wall of the integrating sphere (4) and convert the optical signal into an electrical signal;
the input end of the processing module is connected with the output end of the detector (8), and the output end of the processing module (5) is connected with the control host (3) through the cable (2); the processing module (5) is configured to process the electrical signal and output a radiance A t (λ)；
The control host (3) is configured to receive the radiance A t (lambda), calculating and outputting a solar absorption ratio alpha;
the light source (9) is an LED light source matrix, and the LED light source matrix consists of LED lamps; the integrating sphere (4) comprises an upper integrating sphere (22) and a lower integrating sphere (23); a first light source hole (24) is formed in the middle of the top of the upper integrating sphere (22), and a second light source hole (25) is formed around the first light source hole (24); the included angle between the connecting lines of two adjacent second light source holes (25) and the first light source hole (24) is 60 degrees; the first light source hole (24) is internally provided with a mid-infrared LED lamp, and the second light source hole (25) is internally provided with LED lamps with other wave bands; exit holes (26) are formed in two sides of the upper integrating sphere (22) and close to the edge of the upper integrating sphere, and the detector (8) is installed in the exit holes (26); the detection hole (7) is formed in the middle of the bottom of the lower integrating sphere (23); the included angle between the central connecting line of the first light source hole (24) and the detection hole (7) and the central connecting line of the second light source hole (25) and the detection hole (7) is 8 degrees;
the control host (3) is specifically configured to:
receiving the radiant brightness A output by the processing module (5) under the irradiation of light sources with different wave bands t (λ)；
Calculating the reflectivity r (lambda) of the sample to be detected under the irradiation of light sources with different wave bands:
wherein A is w (lambda) is a first standard value which is the brightness of the total reflection radiation under the irradiation of the light source with the current lambda wavelength; a. The b (λ) is a second standard value, which is the brightness of the total absorbed radiation under the irradiation of the light source with the current λ wavelength;
calculating the total reflectivity r of the sample (6) to be detected:
r＝∑a λ *r(λ)
wherein, the a λ Setting the weight;
calculating the solar absorption ratio alpha:
α＝1-r。
2. the in-situ detection device for solar absorptance under vacuum low-temperature environment according to claim 1, comprising: the top of the inner wall of the vacuum low-temperature test tank (1) is provided with a motion executing mechanism, the motion executing mechanism is fixedly connected with the outer side wall of the integrating sphere (4), and the motion executing mechanism is used for driving the integrating sphere (4) to move along the horizontal and vertical directions.
3. The in-situ detection device for solar absorptance under vacuum low-temperature environment according to claim 2, comprises: the motion actuator includes: the device comprises a guide rail (10) horizontally arranged at the top of the inner wall (1) of the vacuum low-temperature test tank, a sliding block (11) arranged on the guide rail (10), a screw rod (12) arranged in the vertical direction, and a lifting nut (13) arranged on the screw rod (12), wherein one end of the screw rod is connected with the bottom of the sliding block (11) through a bearing;
the lifting nut (13) is fixedly connected with the side wall of the integrating sphere (4);
one end of the guide rail (10) is in transmission connection with a first driving motor, one end of the screw rod (12) is in transmission connection with a second driving motor, and the first driving motor and the second driving motor are electrically connected with the control host (3).
4. The in-situ detection device for solar absorptance under vacuum low temperature environment according to claim 2, wherein: a first platform (14) for placing the sample (6) to be tested and a second platform (16) for placing a total reflection standard sample (15) are arranged at the bottom of the inner wall of the vacuum low-temperature test tank (1); the inner wall of the vacuum low-temperature test tank (1) is subjected to blackening treatment.
5. The in-situ detection device for solar absorptance under vacuum low-temperature environment according to any one of claims 1 to 4, comprising: processing module (5) include filtering module (17), enlarge module (18) and operation module (19), filtering module's (17) input with the output of detector (8) is connected, enlarge module's (18) input with filtering module's (17) output is connected, operation module's (19) input with enlarge module's (18) output and connect, operation module's (19) output passes through cable (2) with main control system (3) are connected.
6. The in-situ detection device for solar absorptance under vacuum low-temperature environment according to any one of claims 1 to 4, comprising: the inner wall of the integrating sphere (4) is sprayed with a base material with the thickness of 60-80 microns, the base material is sprayed with a magnesium oxide coating or a barium sulfate coating with the thickness of 80-100 microns, and the reflectivity of the inner wall of the integrating sphere (4) is larger than 0.97.
7. The in-situ detection device for solar absorptance under vacuum low-temperature environment according to any one of claims 1 to 4, comprising: the light source (9) is an LED light source array driven by constant current, and the wave bands of the light source comprise visible light wave bands of 200-370nm, 370-490nm, 490-560nm and 560-800nm and infrared wave bands of 800-1100nm, 1100-1400nm, 1400-1600 nm, 1600-1900nm and 1900-2600 nm.
8. An in-situ detection method for solar absorptance under a vacuum low-temperature environment, which adopts the in-situ detection device for solar absorptance under a vacuum low-temperature environment as claimed in any one of claims 1 to 7, and is characterized in that: the method comprises the following steps:
obtaining a light source capable of generating a plurality of wave bands under a vacuum low-temperature environment and irradiating a sample to be detected in a time-sharing and sectional manner;
acquiring the luminous flux reflected by the sample to be detected under the irradiation of light sources of different wave bands, and converting the luminous flux into an electric signal;
processing the electric signal to obtain the radiation brightness A t (λ)；
The radiance A is measured t (lambda) sending out of the vacuum low-temperature environment, and calculating a solar absorption ratio alpha;
the method for calculating the solar absorption ratio alpha specifically comprises the following steps:
calculating the reflectivity r (lambda) of the sample to be detected:
wherein A is w (lambda) is a first standard value which is the brightness of the total reflection radiation under the irradiation of the light source with the current lambda wavelength; a. The b (λ) is a second standard value, which is the brightness of the total absorbed radiation under the irradiation of the light source with the current λ wavelength;
calculating the total reflectivity r of the sample to be detected:
r＝∑a λ *r(λ)
wherein, the a λ Setting the weight;
calculating the solar absorption ratio α:
α＝1-r。
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7283222B1 (en) * | 2006-04-12 | 2007-10-16 | Matsushita Electric Industrial Co., Ltd. | Optical measuring device |
| CN103674250A (en) * | 2013-12-16 | 2014-03-26 | 中国电子科技集团公司第四十一研究所 | High-accuracy middle-infrared-band absolute spectral responsivity calibrating device |
| CN105259115A (en) * | 2015-09-29 | 2016-01-20 | 北京卫星制造厂 | Portable solar absorptance testing instrument |
| CN105806810A (en) * | 2016-06-01 | 2016-07-27 | 北京卫星环境工程研究所 | Spectral reflectivity in-situ test system in vacuum environment |
| CN110672655A (en) * | 2019-11-06 | 2020-01-10 | 上海卫星装备研究所 | In-situ detection system and method for thermal radiation performance |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7037083B2 (en) * | 2003-01-08 | 2006-05-02 | Brooks Automation, Inc. | Radiation shielding coating |
| CN108051082A (en) * | 2017-11-24 | 2018-05-18 | 中国科学院长春光学精密机械与物理研究所 | A kind of measuring device of blackbody chamber absorptance |
-
2021
- 2021-03-24 CN CN202110315210.XA patent/CN113063732B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7283222B1 (en) * | 2006-04-12 | 2007-10-16 | Matsushita Electric Industrial Co., Ltd. | Optical measuring device |
| CN103674250A (en) * | 2013-12-16 | 2014-03-26 | 中国电子科技集团公司第四十一研究所 | High-accuracy middle-infrared-band absolute spectral responsivity calibrating device |
| CN105259115A (en) * | 2015-09-29 | 2016-01-20 | 北京卫星制造厂 | Portable solar absorptance testing instrument |
| CN105806810A (en) * | 2016-06-01 | 2016-07-27 | 北京卫星环境工程研究所 | Spectral reflectivity in-situ test system in vacuum environment |
| CN110672655A (en) * | 2019-11-06 | 2020-01-10 | 上海卫星装备研究所 | In-situ detection system and method for thermal radiation performance |
Non-Patent Citations (1)
| Title |
|---|
| "真空条件下低温红外辐射测量技术研究";邱超 等;《应用光学》;20200731;第41卷(第04期);正文第1部分，图1 * |
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