CN113055086A - Optical module aging testing device - Google Patents
Optical module aging testing device Download PDFInfo
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- CN113055086A CN113055086A CN201911370001.4A CN201911370001A CN113055086A CN 113055086 A CN113055086 A CN 113055086A CN 201911370001 A CN201911370001 A CN 201911370001A CN 113055086 A CN113055086 A CN 113055086A
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- 230000003287 optical effect Effects 0.000 title claims abstract description 204
- 238000012360 testing method Methods 0.000 title claims abstract description 106
- 230000032683 aging Effects 0.000 title claims abstract description 63
- 238000010438 heat treatment Methods 0.000 claims abstract description 109
- 238000012544 monitoring process Methods 0.000 claims abstract description 42
- 238000004891 communication Methods 0.000 claims description 28
- 238000001816 cooling Methods 0.000 claims description 12
- 239000002184 metal Substances 0.000 claims description 6
- 230000005540 biological transmission Effects 0.000 claims description 5
- 238000012545 processing Methods 0.000 description 7
- 239000013307 optical fiber Substances 0.000 description 4
- 238000010998 test method Methods 0.000 description 4
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000002035 prolonged effect Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000002431 foraging effect Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000013021 overheating Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/073—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an out-of-service signal
- H04B10/0731—Testing or characterisation of optical devices, e.g. amplifiers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/44—Testing lamps
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/073—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an out-of-service signal
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- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Lasers (AREA)
Abstract
The present disclosure provides an optical module aging testing apparatus, including: the heating module is used for heating an optical module to be tested, and the optical module comprises an optical transmitting submodule and an optical receiving submodule; the test signal providing module is used for providing a test signal to the light emitting sub-module so that the light emitting sub-module can convert the test signal into an optical signal, and the light receiving sub-module can convert the optical signal into an electrical signal; and the monitoring module is used for judging whether the optical module is qualified or not according to the parameters of the optical module in the working state. The optical module aging test device can perform online aging test on the optical module, and the accuracy of test results is improved.
Description
Technical Field
The disclosure relates to the field of communication, in particular to an optical module aging test device.
Background
In the field of communication, optical modules, optical fibers and other components are used in a large number for signal conversion and transmission. In order to ensure that the product is qualified, the optical module needs to be subjected to a high-temperature aging test before the product leaves the factory.
The common aging test method for the optical module comprises the following steps:
placing an optical module to be tested in an incubator or a high-temperature room;
heating the air in the incubator or the high-temperature room to a preset temperature by a heater;
after the preset time, taking out the optical module and cooling to room temperature;
and powering on the optical module at room temperature, and detecting whether the optical module is normal.
The optical module aging test method is a static test method, and in a high-temperature environment, the optical module is not powered on and is also subjected to service test. Because the service test is carried out on the optical module in real time on line, a plurality of faults can not be detected, and inferior products are sent out.
Therefore, how to improve the detection accuracy of the aging test becomes a technical problem to be solved urgently in the field.
Disclosure of Invention
The purpose of the present disclosure is to provide an optical module aging test apparatus and an optical module aging test method using the same, which have higher detection accuracy when the optical module is subjected to aging test.
In order to achieve the above object, as a first aspect of the present disclosure, there is provided an optical module burn-in test apparatus including:
the heating module is used for heating an optical module to be tested, and the optical module comprises an optical transmitting submodule and an optical receiving submodule;
the test signal providing module is used for providing a test signal to the light emitting sub-module so that the light emitting sub-module can convert the test signal into an optical signal, and the light receiving sub-module can convert the optical signal into an electrical signal;
and the monitoring module is used for judging whether the optical module is qualified or not according to the parameters of the optical module in the working state.
Optionally, the parameter of the optical module in the working state includes an error rate, the monitoring module is configured to determine the error rate of the optical module according to the electrical signal, and the monitoring module is configured to determine that the optical module is unqualified when the error rate is greater than a predetermined value.
Optionally, the parameter of the optical module in the working state further includes at least one of a voltage of the optical module, a current in the optical module, a transmission power of the optical module, and a reception power of the optical module.
Optionally, the optical module aging test device further includes a communication control module, and the communication control module is in communication connection with the heating module, the test signal providing module, and the monitoring module;
the monitoring module is used for providing a heating control signal to the heating module through the communication control module so as to control the heating module to heat the optical module;
the monitoring module is used for providing the test signal to the test signal providing module through the communication control module and acquiring the parameters of the optical module through the communication control module.
Optionally, the heating module includes a heating control unit and a heating element, the heating element is disposed on the metal shell of the optical module, and the monitoring module is configured to control the heating control unit to provide voltage to the heating element according to a preset rule until the heating element reaches a first preset temperature.
Optionally, the preset rule includes:
increasing an absolute value of a voltage supplied to the heating element according to a first voltage increase until a temperature of the optical module reaches an intermediate temperature;
increasing an absolute value of a voltage supplied to the heating element according to a second voltage increase until the temperature of the optical module reaches a first target temperature from the intermediate temperature, wherein the first voltage increase is greater than the second voltage increase.
Optionally, the heating element has a sheet structure, and the heating element is attached to the metal shell of the optical module.
Optionally, the heating module is configured to feed back the temperature of the optical module to the monitoring module through the communication control module, and the monitoring module is configured to control the heating module to stop heating when the temperature of the optical module exceeds a second predetermined temperature.
Optionally, the optical module aging testing device further includes a machine frame, and the optical module, the heating module, the test signal providing module, and the communication control module are disposed on the machine frame.
Optionally, the optical module aging test device further includes a cooling module, and the cooling module is configured to cool a portion of the optical module aging test device except for the heating module.
When the optical module aging test device is used for aging test of the optical module, the optical module is powered on, and a test signal is provided to the light emitting sub-module through the test signal providing module, so that the optical module is in a working state. In the working state, the optical transmitting sub-module can convert the test signal into an optical signal, transmit the optical signal to the optical receiving sub-module through the optical fiber, and convert the optical signal into an electrical signal by the optical receiving sub-module.
The optical module in the working state is heated by the heating module, so that the optical module in the working state can reach an aging test environment. The monitoring module can judge whether the optical module is qualified according to various parameters of the optical module in the aging environment. In other words, the optical module aging test device provided by the disclosure has a function of performing a monitoring test on line, and can judge whether the optical module can normally work in an aging environment, so that whether the optical module is a qualified product can be judged more accurately.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention. In the drawings:
fig. 1 is a block diagram of an optical module aging test apparatus provided by the present disclosure.
Detailed Description
The following detailed description of embodiments of the invention refers to the accompanying drawings. It should be understood that the detailed description and specific examples, while indicating the present invention, are given by way of illustration and explanation only, not limitation.
The present disclosure provides an optical module aging test apparatus, as shown in fig. 1, the optical module aging test apparatus includes a heating module 210, a test signal providing module 220, and a monitoring module 230. The optical module aging test device is used for performing aging test on an optical module 100, wherein the optical module 100 comprises an optical transmitting submodule and an optical receiving submodule which are connected through an optical fiber. The light emitting sub-module can convert the received electrical signals into optical signals, and the light receiving sub-module can convert the received optical signals into electrical signals.
The heating module 210 is configured to heat the optical module 100 to be tested, the test signal providing module 220 is configured to provide a test signal to the light emitting submodule so that the light emitting submodule can convert the test signal into an optical signal, the light receiving submodule can convert the optical signal into an electrical signal, and the monitoring module 230 is configured to determine whether the optical module 100 is qualified according to a parameter of the optical module in a working state.
When the optical module 100 is subjected to the aging test by using the optical module aging test apparatus, the optical module 100 is powered on, and a test signal is provided to the light emitting sub-module through the test signal providing module 200, so that the optical module 100 is in a working state. In the working state, the optical transmitting sub-module can convert the test signal into an optical signal, transmit the optical signal to the optical receiving sub-module through the optical fiber, and convert the optical signal into an electrical signal by the optical receiving sub-module.
The heating module 210 heats the optical module 100 in the operating state, so that the optical module 100 in the operating state can reach an aging test environment. The monitoring module 230 can determine whether the optical module 100 is qualified according to various parameters of the optical module 100 in the aging environment. In other words, the optical module aging test apparatus provided by the present disclosure has a function of performing a monitoring test on line, and can determine whether the optical module 100 can normally operate in an aging environment, so as to more accurately determine whether the optical module 100 is a qualified product.
In the present disclosure, the parameter for determining whether the optical module 100 is qualified is not particularly limited. As an alternative embodiment, the parameter of the optical module 100 in the working state includes an error rate, accordingly, the monitoring module 230 may determine the error rate of the optical module according to the electrical signal, and the monitoring module 230 may further determine that the optical module 100 is not qualified when the error rate is greater than a predetermined value.
In the present disclosure, the specific structure of the test signal providing module 220 is not particularly limited. As an alternative embodiment, the test signal providing module 220 may be an FPGA, and the test signal providing module 220 may transmit a code stream (e.g., a Pseudo-Random Binary Sequence) to a light emitting sub-module of the optical module 100. In the present disclosure, the predetermined value is also not particularly limited. For example, the predetermined value may be one part per million. When the error rate of the optical module 100 exceeds one millionth in the aging test environment, it is determined that the optical module 100 is not qualified.
Of course, the present disclosure is not limited thereto, and the parameter of the optical module in the working state further includes at least one of a voltage of the optical module, a current in the optical module, a transmission power of the optical module, and a reception power of the optical module.
When the voltage of the optical module 100 is not within the acceptable range, the monitoring module 230 determines that the optical module 100 is not acceptable.
The monitoring module 230 determines that the optical module 100 is not qualified when the current of the optical module 100 is not within the qualified range.
The processing module 230 determines that the optical module 100 is not qualified when the transmission power of the optical module 100 is not within the qualified range.
When the received power of the optical module 100 is no longer within the acceptable range, the processing module 230 determines that the optical module 100 is not acceptable.
In the present disclosure, how to provide the parameter of the optical module 100 to the processing module 230 for the processing module 230 to determine is not particularly limited.
For example, a special display device may be provided to display various parameters of the optical module 100 during the burn-in test. After observing the parameters, the operator inputs the parameters to the value processing module 230 for processing by the processing module 230.
Of course, the disclosure is not limited thereto, and in order to improve the test efficiency, optionally, as shown in fig. 1, the optical module aging test apparatus further includes a communication control module 240, where the communication control module 240 is communicatively connected to each of the heating module 210, the test signal providing module 220, and the monitoring module 230.
The monitoring module 230 is configured to provide a heating control signal to the heating module 210 through the communication control module 240 to control the heating module 210 to heat the light module 100.
The monitoring module 230 is configured to provide the test signal to the test signal providing module 240 through the communication control module 240, and obtain the parameter through the communication control module 240.
The parameters can be directly acquired through the communication control module 240, so that errors caused by manual reading and manual operation can be avoided, and the test is more accurate.
Of course, the present disclosure is not limited thereto, and the heating modules 210 may be independently controlled instead of controlling the heating modules 210 by the monitoring module 230.
The monitoring module 230 is utilized to control the heating module 210, so that the heating module 210 can provide more accurate testing temperature and provide better aging environment.
In the present disclosure, the specific structure of the heating module 210 is not particularly limited, and in order to better heat the optical module 100 and ensure that the temperature of the heating module 210 is closer to the temperature of the optical module 100, optionally, the heating module 210 includes a heating control unit 211 and a heating element 212, the heating element 212 is disposed on a metal shell of the optical module 100, and the monitoring module 230 is configured to control the heating control unit 211 to provide a voltage to the heating element according to a preset rule until the heating element 212 reaches a first preset temperature.
The heating control unit 211 and the heating member 212 are separately arranged, so that the temperature of the heating member 212 can be prevented from influencing the heating control unit 211, the heating control unit 211 is prevented from being overheated, and the service life of the heating control unit 211 is prolonged. Likewise, the heating element 212 is separated from both the test signal providing module 220 and the communication control module 240, so that the test signal providing module 220 and the communication control module 240 can be prevented from being excessively hot.
In addition, the optical module 100 is heated only by the heating element 212, and a large heating device such as a high-temperature room is not required to be arranged, so that the optical module 100 can be subjected to a limit high-temperature test, the cost of the optical module aging test device can be reduced, high-temperature failure of other modules in the optical module aging test device can be avoided, and the service life of the optical module aging test device is prolonged.
In the present disclosure, the preset rule is not particularly limited, and in order to ensure the accuracy of reaching the first preset temperature while improving the temperature increase efficiency, optionally, the preset rule may rapidly increase the temperature of the heating member 212 to a certain temperature value (for example, 80% of the first preset temperature), and then gradually increase the temperature of the heating member 212 to the first preset temperature.
Specifically, the preset rule may include:
increasing an absolute value of the voltage supplied to the heating element 212 according to the first voltage increase until the temperature of the optical module 100 reaches an intermediate temperature;
the absolute value of the voltage supplied to the heating element 212 is increased according to a second voltage increase until the temperature of the optical module 100 reaches the first target temperature from the intermediate temperature, wherein the first voltage increase is greater than the second voltage increase.
It is to be noted that the first target temperature is a target temperature of the burn-in test.
For example, the first target temperature is 85 ℃ and the intermediate temperature is 75 ℃.
The preset rule may be:
the voltage initially applied to the heating element 212 is +5V and the initial temperature of the heating element 212 is 25 c, the voltage applied to the heating element 212 may be increased (coarsely adjusted) in a first voltage increment (e.g., a first voltage increment of 10V, i.e., each 10V increase in the voltage applied to the heating element 212) in multiple times until the temperature of the heating element 212 reaches 75 c;
the voltage supplied to the heating member 212 is increased (fine-tuned) a second voltage increment (e.g., a second voltage increment of 3V, i.e., each 3V increase in voltage supplied to the heating member 212) a plurality of times until the temperature of the heating member 212 increases from 75 c to 85 c.
When performing the burn-in test on the optical module 100, it is sometimes necessary to operate the optical module 100 at a relatively low temperature after a period of time at a relatively high temperature. In this case, the cooling may be achieved by gradually reducing the voltage supplied to the heating element 212 (coarse adjustment followed by fine adjustment).
At this time, the cooling rule includes:
decreasing an absolute value of a voltage supplied to the heating element by a first voltage step-down until a temperature of the optical module reaches a critical temperature;
decreasing an absolute value of a voltage supplied to the heating element by a second voltage step-down until the temperature of the light module reaches a second target temperature from the critical temperature, wherein the first voltage step-down is greater than the second voltage step-down.
For example, the first target temperature is 30 ℃ and the intermediate temperature is 40 ℃.
The preset rule may be:
the voltage initially applied to heating element 212 is +50V and the initial temperature of heating element 212 is 85 ℃, the voltage applied to heating element 212 may be reduced by a first voltage step-down (e.g., a first voltage step-down of 10V, i.e., each time the voltage applied to heating element 212 is reduced by 10V from the previous time) in multiple steps until the temperature of heating element 212 reaches 40 ℃;
the voltage supplied to the heating element 212 is reduced (fine-tuned) again a number of times with a second voltage reduction (e.g. a second voltage reduction of 3V, i.e. each time the voltage supplied to the heating element 212 is reduced by 3V compared to the previous time) until the temperature of the heating element 212 increases from 40 ℃ to 30 ℃.
In the present disclosure, the shape of the heating element 212 is not particularly limited, and in order to increase the heat receiving area of the optical module 100, optionally, the heating element 212 has a sheet structure, and the sheet-shaped heating element 212 is attached to a metal shell of the optical module 100.
In order to prevent the optical module 100 from failing due to an excessive temperature during the burn-in test of the optical module 100, a heating temperature may be set to be higher or lower. Accordingly, the heating module 210 is configured to feed back the temperature of the optical module 100 to the monitoring module 230 through the communication control module 240, and the monitoring module 230 is configured to control the heating module to stop heating when the temperature of the optical module 100 exceeds a second predetermined temperature.
To facilitate obtaining the temperature of the optical module 100, optionally, the optical module aging test apparatus may include a thermocouple for detecting the temperature of the optical module 100.
In the present disclosure, the specific value of the second predetermined temperature is not particularly limited, and may be determined according to the model, the function, and the like of the optical module 100. As an alternative, the second predetermined temperature may be 85 ℃.
In order to improve the integration degree of the optical module aging test device, optionally, the optical module aging test device further includes a machine frame 300, and the optical module 100, the heating module 210, the test signal providing module 220, and the communication control module 240 are all disposed on the machine frame 300.
It should be noted that, in order to avoid overheating damage, the monitoring module 230 is optionally disposed outside the machine frame 300, so that the temperature of the heating module 210 does not affect the monitoring module 230.
In order to improve the service life of the optical module aging test device, optionally, the optical module aging test device further includes a cooling module 250, and the cooling module 250 is used for cooling parts of the optical module aging test device except for the heating module 210.
In the present disclosure, the specific structure of the cooling module 250 is not particularly limited, and for example, the cooling module 250 may be a fan.
In the present disclosure, how to supply power to the optical module aging test apparatus is not particularly limited. For example, conventional mains power may be converted and the various modules of the optical module burn-in apparatus may be powered.
In order to increase the application range of the optical module aging test device, optionally, the optical module aging test device may further include a power board 260 for supplying power to a portion of the optical module aging test device located on the machine frame.
In the present disclosure, the specific structure of the monitoring module 230 is not particularly limited, and as an optional implementation, the monitoring module 230 may be a computer, and the monitoring module 230 may also play a role of recording in addition to determining whether the parameter of the optical module 100 is within the qualified range.
It will be understood that the above embodiments are merely exemplary embodiments taken to illustrate the principles of the present invention, which is not limited thereto. It will be apparent to those skilled in the art that various modifications and improvements can be made without departing from the spirit and substance of the invention, and these modifications and improvements are also considered to be within the scope of the invention.
Claims (10)
1. An optical module aging test device, comprising:
the heating module is used for heating an optical module to be tested, and the optical module comprises an optical transmitting submodule and an optical receiving submodule;
the test signal providing module is used for providing a test signal to the light emitting sub-module so that the light emitting sub-module can convert the test signal into an optical signal, and the light receiving sub-module can convert the optical signal into an electrical signal;
and the monitoring module is used for judging whether the optical module is qualified or not according to the parameters of the optical module in the working state.
2. The optical module aging test device of claim 1, wherein the parameter of the optical module in the working state includes an error rate, the monitoring module is configured to determine the error rate of the optical module according to the electrical signal, and the monitoring module is configured to determine that the optical module is failed when the error rate is greater than a predetermined value.
3. The optical module aging test device of claim 1, wherein the parameters of the optical module in an operating state further comprise at least one of a voltage of the optical module, a current in the optical module, a transmission power of the optical module, a reception power of the optical module.
4. The optical module aging test device according to any one of claims 1 to 3, wherein the optical module aging test device further comprises a communication control module, the communication control module is in communication connection with the heating module, the test signal providing module and the monitoring module;
the monitoring module is used for providing a heating control signal to the heating module through the communication control module so as to control the heating module to heat the optical module;
the monitoring module is used for providing the test signal to the test signal providing module through the communication control module and acquiring the parameters of the optical module through the communication control module.
5. The optical module aging test device of claim 4, wherein the heating module comprises a heating control unit and a heating element, the heating element is arranged on a metal shell of the optical module, and the monitoring module is used for controlling the heating control unit to provide voltage to the heating element according to a preset rule until the optical module reaches a first preset temperature.
6. The optical module aging test apparatus according to claim 5, wherein the preset rule includes:
increasing an absolute value of a voltage supplied to the heating element according to a first voltage increase until a temperature of the optical module reaches an intermediate temperature;
increasing an absolute value of a voltage supplied to the heating element according to a second voltage increase until the temperature of the optical module reaches a first target temperature from the intermediate temperature, wherein the first voltage increase is greater than the second voltage increase.
7. The optical module aging test device of claim 5, wherein the heating element has a sheet structure, and the heating element is attached to a metal housing of the optical module.
8. The optical module aging test device of claim 4, wherein the heating module is configured to feed back the temperature of the optical module to the monitoring module through the communication control module, and the monitoring module is configured to control the heating module to stop heating when the temperature of the optical module exceeds a second predetermined temperature.
9. The optical module aging test device according to claim 4, wherein the optical module aging test device further includes a machine frame, the optical module, the heating module, the test signal providing module, and the communication control module being provided on the machine frame.
10. The optical module aging test apparatus according to any one of claims 1 to 3, wherein the optical module aging test apparatus further comprises a cooling module for cooling a portion of the optical module aging test apparatus other than the heating module.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911370001.4A CN113055086A (en) | 2019-12-26 | 2019-12-26 | Optical module aging testing device |
| PCT/CN2020/125931 WO2021129161A1 (en) | 2019-12-26 | 2020-11-02 | Optical module aging test apparatus |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201911370001.4A CN113055086A (en) | 2019-12-26 | 2019-12-26 | Optical module aging testing device |
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| CN113055086A true CN113055086A (en) | 2021-06-29 |
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| WO (1) | WO2021129161A1 (en) |
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| CN114199515A (en) * | 2021-12-09 | 2022-03-18 | 中海石油(中国)有限公司 | Method for testing hydrogen loss aging of underground optical fiber |
| CN114301522A (en) * | 2021-12-25 | 2022-04-08 | 长飞光纤光缆股份有限公司 | Optical module aging test method and system |
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| CN114301522A (en) * | 2021-12-25 | 2022-04-08 | 长飞光纤光缆股份有限公司 | Optical module aging test method and system |
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| WO2021129161A1 (en) | 2021-07-01 |
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