KR101747710B1 - Real speed high temperature aging system for semiconductor - Google Patents
Real speed high temperature aging system for semiconductor Download PDFInfo
- Publication number
- KR101747710B1 KR101747710B1 KR1020150149579A KR20150149579A KR101747710B1 KR 101747710 B1 KR101747710 B1 KR 101747710B1 KR 1020150149579 A KR1020150149579 A KR 1020150149579A KR 20150149579 A KR20150149579 A KR 20150149579A KR 101747710 B1 KR101747710 B1 KR 101747710B1
- Authority
- KR
- South Korea
- Prior art keywords
- temperature
- target device
- heater
- aging
- socket
- Prior art date
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
- G01R31/2619—Circuits therefor for testing bipolar transistors for measuring thermal properties thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
- G01R31/2628—Circuits therefor for testing field effect transistors, i.e. FET's for measuring thermal properties thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
- G01R31/2875—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to heating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
- G01R31/2877—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to cooling
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
A semiconductor device testing system according to an embodiment of the present invention includes a socket to which a target device is mounted, a heater that is closely attached to one side of the socket and applies heat to the target device, A temperature sensor for detecting a current temperature of the surface of the target device, the temperature sensor being provided in an area facing the target device, the temperature sensor detecting a current temperature of the target device detected by the temperature sensor, And a temperature control module for controlling driving of the heater and the cooler by a signal of the test operation computer, and a temperature control module for controlling the operation of the heater and the cooler by a signal of the test operation computer .
Description
The present invention relates to a semiconductor device test system, and more particularly, to a semiconductor device test system, in which a heater is closely attached to a socket on which a target device is mounted to supply a set temperature of heat, And realizes a maximum load state with a minimum error with respect to the set temperature. The present invention relates to a semiconductor device aging test system that can accurately check temperature characteristics of a device in an actual environment.
ATE (Automatic Test Equipment) is used for testing semiconductor devices.
The ATE is a tester for determining whether a semiconductor device is good or bad by analyzing a signal output from the semiconductor device after applying a specific signal pattern to the semiconductor device.
However, such an ATE-like tester has a disadvantage in that the test cost per semiconductor device is increased due to its high cost, which weakens the price competitiveness. In addition, since ATE performs testing in a separate experimental environment instead of an environment in which a semiconductor device is actually installed and used, in the low-speed aging environment, it is impossible to consider the self-heating state of the device in the max clock state in addition to the external influent column, There is a disadvantage in that it is impossible to perform real-time operation and it is impossible to check the status of each peripheral IP of the device in a real environment.
In a high temperature aging system using a chamber, temperature stress is applied to peripheral devices in addition to a target device to which temperature stress should be applied, so accurate results in a high temperature environment can not be obtained.
In addition, in the conventional heat socket structure using a commercial temperature controller provided outside, temperature control is required individually. With such a commercial temperature controller, the state of the socket mounted on the device can not be predicted, There is a problem that an overshoot occurs and a stabilization time is long.
SUMMARY OF THE INVENTION The present invention has been made in order to solve the problems and limitations described above, and it is an object of the present invention to provide a socket in which a heater is closely attached to a socket on which a target device is mounted to supply heat of a predetermined temperature, And a semiconductor device aging test system that can accurately check temperature characteristics of a device in a real environment by realizing a maximum load state with a minimum error with a set temperature thereof.
In addition, since the target device is mounted and mounted in the socket and the heat of the set temperature is supplied through the heater closely attached to the socket, the peripheral device is not affected,
By providing a temperature sensor in the heater facing the target device, it is possible to feed back the current temperature of the surface of the target device in real time and utilize the firmware and operating system to achieve the maximum load state with the minimum error The goal is to provide a test system.
A semiconductor device testing system according to an embodiment of the present invention includes a socket to which a target device is mounted, a heater that is closely attached to one side of the socket and applies heat to the target device, A temperature sensor for detecting a current temperature of the surface of the target device, the temperature sensor being provided in an area facing the target device, the temperature sensor detecting a current temperature of the target device detected by the temperature sensor, And a temperature control module for controlling driving of the heater and the cooler by a signal of the test operation computer, and a temperature control module for controlling the operation of the heater and the cooler by a signal of the test operation computer .
According to the semiconductor device test system proposed in the present invention, it is possible to reproduce a situation in which a device is exposed to external heat in a real environment by using a temperature control module and a heater closely attached to a target device in a device that has been verified.
In addition, according to the semiconductor device test system of the present invention, it is possible to check the aging environment such as the power consumption state and the temperature deviation of the device during aging for a long time using the log file stored in the test operation computer, Can be analyzed in detail.
In addition, according to the semiconductor device test system of the present invention, it is possible to easily and quickly proceed the inconvenience of checking the state of each device by setting the temperature controller in the conventional high temperature aging and attaching the external cable Can be improved.
In addition, according to the semiconductor device test system of the present invention, by monitoring the aging environment in real time, it is possible to stop the aging of the device in the event of over current and overheat due to breakage of the device, Can be reported to a separate alarm list.
1 is a block diagram showing a schematic configuration of a semiconductor device test system according to an embodiment of the present invention.
2 is a cross-sectional view showing a configuration of a semiconductor device testing apparatus according to an embodiment of the present invention.
3 is a graph showing the temperature control solution and the temperature change according to the embodiment of the present invention.
4 is a graph showing temperature comparisons of a device by a temperature control module of the present invention and a conventional commercial temperature controller.
Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings, in order that those skilled in the art can easily carry out the present invention. In the following detailed description of the preferred embodiments of the present invention, a detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear. In the drawings, like reference numerals are used throughout the drawings.
In addition, in the entire specification, when a part is referred to as being 'connected' to another part, it may be referred to as 'indirectly connected' not only with 'directly connected' . Also, to "include" an element means that it may include other elements, rather than excluding other elements, unless specifically stated otherwise.
FIG. 1 is a block diagram illustrating a schematic configuration of a semiconductor device test system according to an embodiment of the present invention, and FIG. 2 is a cross-sectional view illustrating a configuration of a semiconductor device testing apparatus according to an embodiment of the present invention.
1, a semiconductor device test system according to an embodiment of the present invention includes a
The
The
The
When the target device is exposed to a predetermined age test temperature by the heat supplied from the
Here, the DUT board may be provided for each of the target devices and may include a plurality of DUT boards DUT1, ..., DUTN. Thus, the present invention can analyze the test result of the target device in per-ferral units in detail.
The
The
The
The temperature sensor 170 is provided in an area where the
The
The
That is, the
3 is a graph showing the temperature control solution and the temperature change according to the embodiment of the present invention.
3, when the present temperature of the target device is less than 80% of the set temperature, the
The
The
The
The
As such, the semiconductor device test system of the present invention can be used in a test operating computer environment driven by firmware or an operating system to maximize the device load in the real environment and to use the
The above-mentioned semiconductor device test system proposed in the present invention can reproduce a situation in which a device is exposed to external heat in a real environment by using a temperature control module and a heat socket in a device that has been verified.
In addition, the semiconductor device test system of the present invention can confirm the aging environment such as the power consumption state and the temperature deviation of the device during aging for a long time using the log file stored in the test operation computer, Can be analyzed.
In addition, the semiconductor device test system of the present invention improves the inconvenience of checking the status of each device by setting the temperature controller in the conventional high-temperature aging and attaching an external cable to the system using the UI .
In addition, according to the semiconductor device test system of the present invention, by monitoring the aging environment in real time, it is possible to stop the aging of the device in the event of over current and overheat due to breakage of the device, Can be reported to a separate alarm list.
The present invention may be embodied in many other specific forms without departing from the spirit or essential characteristics of the invention.
100: Heat Socket 200: Temperature Control Module
300: current measuring unit 400:
500: Microcomputer 600: Test Operation Computer
Claims (9)
A socket to which the target device is seated;
And a heater which is closely attached to one side of the socket and applies heat to the target device
The target device is mounted in the groove of the socket as the groove is formed in the socket so that the target device is seated on the socket, the heat preheated by the heater is transferred to the target The temperature of the target device is raised by introducing and conducting the heat into the device to reproduce the situation of exposure to heat in a real environment,
A cooler provided integrally with the heater for cooling the target device;
A temperature sensor provided in an area where the heater faces the target device to detect a current temperature of the surface of the target device;
A test operating computer that compares a current temperature of the target device detected by the temperature sensor with a set temperature and transmits a signal so that the temperature of the target device is maintained at the set temperature according to the result; And
And a temperature control module for controlling driving of the heater and the cooler by a signal of the test operation computer
Wherein the temperature control module operates the heater: cooler = 100%: 0% when the current temperature of the target device is less than 80% of the set temperature, and when the current temperature is 80% Heater: cooler = 50%: 50%, and when the present temperature is 90% or more and less than 100% of the set temperature, the heater: cooler = 20%: 80%
The temperature control module drives the heater and the cooler to preheat the target device to adjust the set temperature, analyze the curve of the rising of the aging temperature, adjust the set temperature without overshoot during initial setting
Wherein the socket is provided with a pogo pin at a portion in contact with the target device and is electrically connected to the target device via the pogo pin so that a signal regarding normal / To the computer
Wherein the test operation computer sets a threshold value for the aging temperature and a current value of the device through user input through a user interface (UI).
Wherein the test operation computer monitors the aging environment, stops aging of the target device when the target device is broken, and reports the suspended cause in a separate alarm list.
Wherein the test operating computer sets an aging test environment (aging time, target temperature) globally or individually for a plurality of the target devices, and monitors power consumption and temperature deviation of the target device. system.
A heat sink for absorbing heat of the target device to dissipate the heat to the outside; And
And a cooling fan which is provided at one side of the heat sink and is driven by a motor to cool the target device.
Wherein the heater and the cooler are connected to the temperature control module via a cable and a connector.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020150149579A KR101747710B1 (en) | 2015-10-27 | 2015-10-27 | Real speed high temperature aging system for semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020150149579A KR101747710B1 (en) | 2015-10-27 | 2015-10-27 | Real speed high temperature aging system for semiconductor |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20170049697A KR20170049697A (en) | 2017-05-11 |
KR101747710B1 true KR101747710B1 (en) | 2017-07-12 |
Family
ID=58740871
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020150149579A KR101747710B1 (en) | 2015-10-27 | 2015-10-27 | Real speed high temperature aging system for semiconductor |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR101747710B1 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109343605A (en) * | 2018-11-07 | 2019-02-15 | 南京牧镭激光科技有限公司 | A kind of temperature control equipment and control method |
KR102207091B1 (en) | 2019-08-16 | 2021-01-25 | 주식회사 시스다인 | Test Socket Board Aging Test System and Test Socket Board Aging Test Method |
KR102216598B1 (en) | 2019-09-17 | 2021-02-18 | 주식회사 메리테크 | Device high temperature aging test automation system using heating socket to prevent cable damage |
KR102286181B1 (en) | 2019-09-17 | 2021-08-06 | 주식회사 메리테크 | Wireless heating socket for easy automation of device high temperature aging test. |
CN111521922B (en) * | 2020-04-03 | 2022-07-01 | 中国电子科技集团公司第十三研究所 | Power cycle test device and system for semiconductor device |
KR102363018B1 (en) * | 2020-07-14 | 2022-02-15 | 주식회사 엑시콘 | Test system of semiconductor device with excellent circulating perpomance |
CN114236417A (en) * | 2021-12-02 | 2022-03-25 | 中国空间技术研究院 | Power supply device aging junction temperature monitoring device |
-
2015
- 2015-10-27 KR KR1020150149579A patent/KR101747710B1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
KR20170049697A (en) | 2017-05-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR101747710B1 (en) | Real speed high temperature aging system for semiconductor | |
US7839158B2 (en) | Method of detecting abnormality in burn-in apparatus | |
JP2008537637A (en) | Temperature detection and prediction in IC sockets | |
US20110084701A1 (en) | Testing of leds | |
CN102931579B (en) | Drive control device of belt refrigeration laser and drive control method | |
CN106233147A (en) | The branch current with temperature-compensating is measured | |
TWI451101B (en) | Inspection system and inspection method | |
US10101781B2 (en) | System and method for controlling temperatures of computer | |
US20090183045A1 (en) | Testing system for a device under test | |
US9658949B2 (en) | Test system of system on chip and test method thereof | |
CN109209962B (en) | Fan detection chip, fan detection method and fan detection system | |
KR20150069138A (en) | Life test apparatus for optical communication module | |
CN109239577A (en) | A kind of on-board circuitry plate Fault Quick Diagnosis method | |
KR101306280B1 (en) | Torque test device of speed reducer | |
US8449173B1 (en) | Method and system for thermal testing of computing system components | |
CN110825582A (en) | CPU temperature sensor testing device, method and system | |
KR102166663B1 (en) | Test system for soc and test method thereof | |
US11245313B2 (en) | Drive engine arrangement with sensor-monitored fan for an elevator system | |
CN106644401A (en) | Test system and test method for testing semiconductor laser | |
KR101048074B1 (en) | System for testing accelerated lifetime of electric device | |
CN117110735A (en) | High-temperature reverse bias aging test method and system | |
CN108693419B (en) | Measuring device and method for measuring a device under test | |
JP2022141621A (en) | Method of operating test and measurement system and static and dynamic device characterization platform | |
JP2008275448A (en) | Semiconductor test equipment | |
KR20160086073A (en) | Device of testing power semiconductor module and testing method using the same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right |