CN106370963A - Automatic aging system and method for optical active device - Google Patents
Automatic aging system and method for optical active device Download PDFInfo
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- CN106370963A CN106370963A CN201610740333.7A CN201610740333A CN106370963A CN 106370963 A CN106370963 A CN 106370963A CN 201610740333 A CN201610740333 A CN 201610740333A CN 106370963 A CN106370963 A CN 106370963A
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- aging
- optical active
- active component
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
Abstract
The invention relates to an automatic aging system for an optical active device. The system comprises an optical device assembly unit, a drive control unit, a master control logic unit, a protocol conversion unit and a parameter configuration and display unit. For the problem that in the aging process of the optical active device, a TEC and an LD are not limited, which causes failure of the optical active device, the drive control unit designs an over-voltage protection function and a limiting current limit function at the two ends of the TEC and the two ends of the LD respectively. The master control logic unit has a line detection function, and detects optical device assembly and line fault before aging starts and monitors abnormal conditions of the whole aging process after aging starts and enters the abnormality disposal program. The parameter configuration and display unit is used for configuring current, temperature, monitoring item parameter limit values and aging duration of an aging target, finishing aging process timing, and displaying the recorded aging data in the aging process in real time. The provided method realize automatic aging and abnormality processing of the optical active device and ensures stability of the aging process.
Description
Technical field
The present invention relates to a kind of production testing system and method for optic communication device, particularly to a kind of optical active component
Automatic aging system and method.
Background technology
Aging be optic communication device production process a kind of method of inspection, be the important step of production process.Lead to light
The increase of letter device speed, the aging of optic communication device proposes requirements at the higher level to ageing environment and drive control, and leads to light
Being significantly increased of letter device requirement, needs the production process more automatization of optical device that communicates.The aging survey of existing optic communication device
Method for testing does not typically take effective control type of drive, in ageing process, tec (semiconductor cooler) and ld during abnormal generation
Overshoot and punch-through, optics displacement in (laser instrument) two ends, and light path shifts, and leads to the light in this ageing process
Devices in batches lost efficacy.
Content of the invention
It is an object of the invention to overcoming the deficiencies in the prior art, the present invention provides a kind of automatic aging of optical active component
Method, realizes the aging automatization of optical device.
The present invention provides a kind of automatic aging system of optical active component, including optical device assembly unit, drive control list
Unit, master control logic unit, conversion unit of protocol and parameter configuration display unit；
Described optical device assembly unit is used for assembling optical active component to be tested；
Described drive control unit is connected with optical device assembly unit and sets up electrical connection with optical active component to be tested；
Described master control logic unit is embedded in described drive control unit, and described drive control unit is at the control
Execution automatic test program, described master control logic unit is by described conversion unit of protocol and described parameter configuration display unit
Interact, receive configuration parameter from described parameter configuration display unit, and report burn-in test data；
Described parameter configuration display unit configures burn-in test parameter, including but not limited to aging target current, temperature, prison
Control item parameter limits, aging duration.
In technique scheme, described drive control unit includes tec control module, ld drive module and communication and connects
Mouth module；Described tec control module is driven to the tec module of optical active component to be tested controlling, and described ld drives mould
Block is driven to the ld module in optical active component to be tested controlling.
In technique scheme, described master control logic unit passes through the communication of protocol interface and described drive control unit
Interface module interacts, and monitors aging collection item.
In technique scheme, described parameter configuration display unit can be handed over multiple conversion unit of protocol simultaneously
Mutually, multiple master control logic units can share a conversion unit of protocol and interact with described parameter configuration display unit.
In technique scheme, described parameter configuration display unit shows in real time in ageing process and preserves aging number
According to.
The present invention also provides a kind of automatic aging method of optical active component, comprises the steps:
Step 1, optical active component to be tested is fitted into corresponding optical device assembly unit, drive control unit and light
Device assembly unit is connected, and drive control unit is connected with parameter configuration display unit through conversion unit of protocol；
Step 2, the operating right of the configuration display unit that gets parms, configured to be tested using parameter configuration display unit
The aging target current of optical active component, temperature and aging duration, determine aging monitoring parameter limit according to target current and temperature
System is configured；
Step 3, opens circuit testing function, detects the assembly failure of optical active component to be tested, if monitoring data shows
Show exception, then investigate fault；
Step 4, opens aging and clocking capability, and in ageing process, master control logic unit realizes abnormality processing will be different
Often type reports parameter configuration display unit, and parameter configuration display unit shows aging data in real time, and preserves aging data, note
Record aging Exception Type.
In technique scheme, described circuit testing function specifically includes, and master control logic unit controls drive control list
Unit enables the tec module of optical active component to be tested, and adds Weak current, base to the ld module of optical active component to be tested
Every aging data in parameter configuration display unit monitoring optical active component to be tested.
8th, as claimed in claim 7 a kind of automatic aging method of optical active component it is characterised in that: described step 4
In, the tec module temperature of optical active component to be tested and ld blocks current are configured according to target temperature and electric current, are anti-
Only optical device overshoot, enables ld drive module after master control logic unit judges tec control module is stable again, and master control logic list
Unit realizes the slow of ld driving current and powers up function.
The present invention achieves following technique effect: parameter configuration display unit is realized ageing parameter and can be joined, and shows in real time
Record aging data；Detected by line fault, before ageing investigation assembling or line fault, it is to avoid fault causes optical device to damage
Wound；By ageing process exception monitoring, ageing process is monitored generation and the Exception Type of exception, for different exception class
Corresponding abnormality processing measure taken by type, it is to avoid extremely lead to optical device batch to lose efficacy in ageing process；Realize optical device aging
The automatization of process, improves aging production efficiency.
Brief description
Fig. 1 is the schematic diagram of optical active component ageing system.
Fig. 2 is the flow chart of optical active component ageing process.
Specific embodiment
Understand for the ease of those of ordinary skill in the art and implement the present invention, below in conjunction with the accompanying drawings and specific embodiment
The present invention is described in further detail.
The optical active component ageing system that the present invention provides is as shown in figure 1, include optical device assembly unit, drive control list
Unit, master control logic unit, conversion unit of protocol and parameter configuration display unit.
Wherein, optical device assembly unit is used for assembling optical active component to be tested, carries with optical active component to be tested
For being electrically connected and providing the test interface of every index of correlation.
Drive control unit includes tec control module ld drive module and communication interface modules；Drive control unit with
Optical device assembly unit is connected and sets up electrical connection with optical active component to be tested so that tec control module is active by light
The tec pin of device is realized the tec module in optical active component being driven control, and ld drive module passes through optical active component
Ld pin realize the ld module in optical active component being driven control, thus realizing to optical active component in ageing process
Tec control ld drive and back facet current monitoring etc..Thus, drive control unit is in tec (semiconductor cooler) two ends and ld
(laser instrument) two ends provide overpressure protection and carrying current limitation function, overcome optical device tec and ld in ageing process to lose efficacy
Abnormal conditions.
Master control logic unit is embedded in drive control unit, and drive control unit executes automatization at the control and surveys
Examination program, master control logic unit is interacted with parameter configuration display unit by conversion unit of protocol, shows from parameter configuration
Unit receives configuration parameter, and reports burn-in test data, and multiple master control logic units can share one or more protocol conversions
Unit is interacted with parameter configuration display unit；Master control logic unit is connect by the communication of protocol interface and drive control unit
Mouth module interacts, and monitors aging collection item；Master control logic unit also provides circuit testing function, in execution wireline inspection
When, master control logic unit controls the tec module that drive control unit treats light-metering active device to add normal pressurization, and treating light-metering has
The ld module of source device adds Weak current, monitors the aging each item data of optical active component to be measured, detection optical active component is in light
Whether there is assembly failure in device assembly unit.In ageing process, whether master control logic unit monitors each monitored item beyond pre-
Threshold value, judges whether Exception Type that is abnormal and occurring, takes corresponding abnormality processing for different Exception Types
Measure, simultaneously master control logic unit Exception Type is reported parameter configuration display unit.
Parameter configuration display unit configures aging target current temperature and monitored item parameter limit value, also may choose whether out
Open tec, above-mentioned configuration parameter is all saved, until modification configuration again.Parameter configuration display unit configures aging duration, and complete
Become ageing process timing.Prevent from changing by mistake parameter configuration for the aging safety of guarantee, parameter configuration unit also can be with parameter display unit
It is independently arranged, parameter configuration unit increases operating right, obtain operating right and can change configuration parameter.Data display unit is real
When show aging data, and record aging data and Exception Type.
Pin improvements over the prior art of the present invention specifically include that parameter configuration display unit is realized ageing parameter and can be joined, and
Display record aging data in real time；Drive control unit and master control logic unit, realize line fault detection and ageing process is different
Often detect, before ageing exclusion assembling or line fault, it is to avoid fault causes optical device to damage, monitor abnormal in ageing process
Generation and Exception Type, and carry out abnormality processing, it is to avoid abnormal in ageing process lead to optical device batch to lose efficacy.
The optical active component aging method that the present invention provides is as shown in Fig. 2 specifically comprise the following steps that
Step 1, as shown in figure 1, optical active component to be tested is fitted into corresponding optical device assembly unit, drives
Control unit is connected with optical device assembly unit, and the communication interface modules on drive control unit passes through master control logic unit through association
View converting unit is connected with parameter configuration display unit.
Step 2, the operating right of the configuration display unit that gets parms, configure aging target using parameter configuration display unit
According to target current and temperature, current temperature and aging duration, determine that aging monitoring parameter limits and are configured.
Step 3, opens circuit testing function, and it is active that master control logic unit controls drive control unit to enable light to be tested
The tec module of device, and Weak current is added to the ld module of optical active component to be tested, based on parameter configuration display unit prison
Control the active every aging data of light to be tested, detect the assembly failure of optical active component to be tested, if monitoring data shows
Show exception, investigate fault, treat that wireline inspection finishes and can open burn-in test.
Step 4, opens aging and clocking capability, the tec module temperature of optical active component to be tested and ld blocks current
Configured according to target temperature and electric current, for preventing optical device from overshooting, after master control logic unit judges tec control module is stable
Enable ld drive module again, and master control logic unit is realized the slow of ld driving current and powered up function.In ageing process, master control is patrolled
Collect unit to realize abnormality processing and Exception Type is reported parameter configuration display unit, parameter configuration display unit shows old in real time
Change data, and preserve aging data, record aging Exception Type.
By above-mentioned steps, present invention achieves the aging automatization of optical device, and can guarantee that the stability of ageing process.
It is emphasized that embodiment of the present invention is illustrative rather than determinate, therefore the present invention is simultaneously
Be not limited to the embodiment described in specific embodiment, every by those skilled in the art's such technology according to the present invention scheme
The other embodiment drawing, also belongs to the scope of protection of the invention.
Claims (8)
1. a kind of optical active component automatic aging system it is characterised in that include optical device assembly unit, drive control unit,
Master control logic unit, conversion unit of protocol and parameter configuration display unit；
Described optical device assembly unit is used for assembling optical active component to be tested；
Described drive control unit is connected with optical device assembly unit and sets up electrical connection with optical active component to be tested；
Described master control logic unit is embedded in described drive control unit, and described drive control unit executes at the control
Automatic test program, described master control logic unit is carried out with described parameter configuration display unit by described conversion unit of protocol
Interaction, receives configuration parameter from described parameter configuration display unit, and reports burn-in test data；
Described parameter configuration display unit configures burn-in test parameter, including but not limited to aging target current, temperature, monitored item
Parameter limits, aging duration.
2. as claimed in claim 1 a kind of optical active component automatic aging system it is characterised in that: described drive control list
Unit includes tec control module, ld drive module and communication interface modules；Described tec control module is active to light to be tested
The tec module of device is driven controlling, and described ld drive module is driven to the ld module in optical active component to be tested
Dynamic control.
3. as claimed in claim 2 a kind of optical active component automatic aging system it is characterised in that: described master control logic list
Unit is interacted by the communication interface modules of protocol interface and described drive control unit, monitors aging collection item.
4. a kind of optical active component as any one of claim 1-3 automatic aging system it is characterised in that: described
Parameter configuration display unit can be interacted with multiple conversion unit of protocol simultaneously, and multiple master control logic units can share one
Conversion unit of protocol is interacted with described parameter configuration display unit.
5. a kind of optical active component as any one of claim 1-4 automatic aging system it is characterised in that: described
Parameter configuration display unit shows in real time in ageing process and preserves aging data.
6. a kind of automatic aging method of optical active component is it is characterised in that comprise the steps:
Step 1, optical active component to be tested is fitted into corresponding optical device assembly unit, drive control unit and optical device
Assembly unit is connected, and drive control unit is connected with parameter configuration display unit through conversion unit of protocol；
Step 2, the operating right of the configuration display unit that gets parms, had using parameter configuration display unit configuration light to be tested
The aging target current of source device, temperature and aging duration, according to target current and temperature determine aging monitoring parameter limit into
Row configuration；
Step 3, opens circuit testing function, detects the assembly failure of optical active component to be tested, if monitoring data show different
Often, then investigate fault；
Step 4, opens aging and clocking capability, and in ageing process, master control logic unit realizes abnormality processing and by exception class
Type reports parameter configuration display unit, and parameter configuration display unit shows aging data in real time, and preserves aging data, and record is old
Change Exception Type.
7. as claimed in claim 6 a kind of automatic aging method of optical active component it is characterised in that: described wireline inspection work(
Can specifically include, master control logic unit controls drive control unit to enable the tec module of optical active component to be tested, and treats
The ld module of the optical active component of test adds Weak current, based on the optical active component that the monitoring of parameter configuration display unit is to be tested
Every aging data.
8. as claimed in claim 7 a kind of automatic aging method of optical active component it is characterised in that: in described step 4, treat
The tec module temperature of optical active component of test and ld blocks current are configured according to target temperature and electric current, for preventing light
Device overshoots, and enables ld drive module again, and master control logic unit is real after master control logic unit judges tec control module is stable
Existing the slow of ld driving current powers up function.
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| CN201610740333.7A CN106370963B (en) | 2016-08-26 | 2016-08-26 | A kind of automatic aging system and method for optical active component |
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| CN201610740333.7A CN106370963B (en) | 2016-08-26 | 2016-08-26 | A kind of automatic aging system and method for optical active component |
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| CN106370963A true CN106370963A (en) | 2017-02-01 |
| CN106370963B CN106370963B (en) | 2019-08-20 |
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Cited By (3)
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| CN108646117A (en) * | 2018-06-22 | 2018-10-12 | 武汉光迅科技股份有限公司 | A kind of aging method of optical active component |
| CN109471422A (en) * | 2018-11-13 | 2019-03-15 | 重庆佰节成测控技术有限公司 | A kind of aging tooling control system and its detection method |
| CN114546739A (en) * | 2022-01-23 | 2022-05-27 | 苏州浪潮智能科技有限公司 | Method, device, equipment and medium for detecting overcurrent of server current |
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Cited By (5)
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| CN109471422B (en) * | 2018-11-13 | 2021-07-13 | 重庆佰节成测控技术有限公司 | Aging tool control system and detection method thereof |
| CN114546739A (en) * | 2022-01-23 | 2022-05-27 | 苏州浪潮智能科技有限公司 | Method, device, equipment and medium for detecting overcurrent of server current |
| CN114546739B (en) * | 2022-01-23 | 2023-11-21 | 苏州浪潮智能科技有限公司 | Method, device, equipment and medium for detecting current flowing through server |
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| CN106370963B (en) | 2019-08-20 |
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