CN113009289A - Device and method for testing impulse voltage of photoelectric material and device - Google Patents
Device and method for testing impulse voltage of photoelectric material and device Download PDFInfo
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/129—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of components or parts made of semiconducting materials; of LV components or parts
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Abstract
The invention discloses a device and a method for testing the impulse voltage of a photoelectric material and a device, wherein the device comprises a charging assembly, an output adjusting assembly, a monitoring assembly and a carrier to be tested; the charging assembly is connected with the adjusting output assembly, the adjusting output assembly is connected with a carrier to be detected, the monitoring assembly is connected with the carrier to be detected, and the component to be detected is used for monitoring the voltage conditions on two ends of the carrier to be detected; the charging assembly is used for being connected with an external power supply and charging, and comprises a control panel, a controller, a charging power supply and an energy storage capacitor; the charging power supply is connected with the energy storage capacitor, and the control panel is connected with the controller; the method can quickly obtain the standard waveform of the carrier to be detected, can quickly and conveniently adjust the standard waveform, improves the impact efficiency of photoelectric materials and devices, can be matched with the output waveform requirements of various types of photoelectric materials and devices, can adjust the standard waveform according to different carrier materials to be detected, greatly reduces the operation difficulty, and improves the working efficiency.
Description
Technical Field
The invention relates to the technical field of testing of impulse voltage of photoelectric materials and devices, in particular to a device and a method for testing the impulse voltage of the photoelectric materials and the devices.
Background
The pulse voltage resistance of photoelectric materials and devices is an important performance index. The impulse voltage generator (equipment for short, the same below) is mainly used for simulating and testing the influence of impulse voltages such as over-high voltage of lightning, over-high voltage of operation and the like on photoelectric materials and devices so as to ensure the insulation performance and the protection performance of the photoelectric materials and the devices.
Therefore, the test voltage is often much higher than the voltage that the equipment will withstand during normal operation of the insulation. The impulse voltage generator is one of basic devices in a high-voltage laboratory, and the output voltage and energy of the impulse voltage generator are continuously increased along with the continuous improvement of the transmission voltage grade and the wide application of high-capacity electrical devices such as cables and the like. At present, the following defects exist in the common surge voltage generating device: the device has the advantages of unstable breakdown voltage, unbalanced charging voltage, low experimental efficiency, narrow loaded waveform range, large occupied area of equipment, complex operation, difficult adjustment of waveform, high manufacturing cost and the like.
Disclosure of Invention
The invention aims to provide a device for testing the impulse voltage of the photoelectric material and the device aiming at the defects, and solves the problems that in the prior art, an impulse voltage generating device occupies a large area, the loaded waveform range is narrow, and the voltage waveforms at two ends of the photoelectric material to be tested cannot be accurately measured and adjusted.
The scheme is realized as follows:
a photoelectric material and device impulse voltage testing device: the device comprises a charging assembly, an output adjusting assembly, a monitoring assembly and a carrier to be detected; the charging assembly is connected with the adjusting output assembly, the adjusting output assembly is connected with a carrier to be detected, the monitoring assembly is connected with the carrier to be detected, and the component to be detected is used for monitoring the voltage conditions on two ends of the carrier to be detected; the adjusting output assembly is provided with a plurality of stages of adjusting resistors, and the adjusting of the voltage waveform of the carrier to be detected is realized by connecting different adjusting resistors.
Based on the photoelectric material and device impact voltage testing device, the charging assembly is used for being connected with an external power supply and charging, and comprises a control panel, a controller, a charging power supply and an energy storage capacitor; the charging power supply is connected with the energy storage capacitor, the control panel is connected with the controller, the controller is connected with the charging power supply, and the controller is used for controlling the reference setting voltage at the two ends of the energy storage capacitor;
based on the photoelectric material and device impulse voltage testing device, the adjusting output assembly comprises a front edge matching network, a rear edge matching network and a grounding end; the leading edge matching network comprises a multi-stage adjusting resistor and an output interface matched with the adjusting resistor; the back edge matching network comprises a multi-stage adjusting resistor and an output interface matched with the adjusting resistor.
Based on the device for testing the impulse voltage of the photoelectric material and the device, the rear edge matching network is connected with the low-voltage end and the grounding end of the energy storage capacitor and outputs low voltage to the outside, and the front edge matching network is connected with the high-voltage end of the energy storage capacitor and outputs high voltage to the outside.
Based on the photoelectric material and device impulse voltage testing device, the resistance values of all levels of resistors in the front edge matching network and the back edge matching network are uniformly and linearly changed.
Based on the photoelectric material and device impulse voltage testing device, the front edge matching network has five different resistance values which are respectively 1-1 to 1-5, and the resistance values are sequentially reduced and set; the back edge matching network has 13 different resistance values which are respectively counted as 2-1 to 2-13, and the resistance values are sequentially reduced and set.
Based on the device for testing the impulse voltage of the photoelectric material and the device, the monitoring assembly comprises a high-voltage probe and a digital storage oscilloscope, the high-voltage probe is connected with output ports of a front edge matching network and a back edge matching network in parallel respectively, the digital storage oscilloscope is connected with the high-voltage probe in series, the high voltage is output to be low voltage through the high-voltage probe, and a low-voltage signal is transmitted to the digital storage oscilloscope to display the voltage waveform.
Based on the device for testing the impulse voltage of the photoelectric material and the device, the waveform in the digital storage oscilloscope can be adjusted according to the access ends in the leading edge matching network and the trailing edge matching network.
The scheme provides a method for testing the impulse voltage of a photoelectric material and a device, which comprises the following steps;
the method comprises the following steps: performing pressure test, namely repeatedly setting the capacitance reference setting voltage according to the national standard peak voltage of different photoelectric materials and devices, and then outputting until the peak voltage displayed in the oscilloscope meets the national standard peak voltage;
step two: wave modulation, firstly, observing the form of the primary waveform in the step one, comparing the form with a standard waveform, controlling the rising time of an output waveform through a leading edge matching network, and reducing the resistance value in the leading edge matching network when the rising time exceeds a required value, otherwise, increasing the resistance value;
controlling the half-decay time of the output waveform through the trailing edge matching network, and reducing the resistance value in the trailing edge matching network when the half-decay time is greater than a required value; otherwise, the value is increased;
step three: and observing, and after the voltage meeting the regulation is obtained, impacting the photoelectric material and the device to judge whether the photoelectric material and the device are in compliance.
Based on the method for testing the impulse voltage of the photoelectric material and the device, the photoelectric material and the device can be 72-sheet silicon material photovoltaic module type, 60-sheet silicon material battery sheet type and copper indium gallium selenide thin-film photoelectric material.
Compared with the prior art, the invention has the beneficial effects that:
1. the method can quickly obtain the standard waveform of the carrier to be detected, can quickly and conveniently adjust the standard waveform, improves the impact efficiency of photoelectric materials and devices, can be matched with the output waveform requirements of various types of photoelectric materials and devices, can adjust the standard waveform according to different carrier materials to be detected, greatly reduces the operation difficulty, and improves the working efficiency.
2. This scheme will charge the subassembly, adjust output subassembly, the whole settings of monitoring subassembly can reduce whole space and account for the ratio in the network cabinet body to this scheme adopts multistage change's resistance to adjust, and the cost is lower, and application scope is wider.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic structural view of the whole appearance of the present invention;
in the figure: 1. a charging assembly; 2. adjusting the output assembly; 3. a monitoring component; 4. a carrier to be tested; 5. A network cabinet body; 11. a control panel; 12. a charging power supply; 13. an energy storage capacitor; 21. a leading edge matching network; 22. a trailing edge matching network; 23. a ground terminal; 31. a high-pressure probe; 32. a digital storage oscilloscope.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
In the description of the present invention, it is to be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like, indicate orientations or positional relationships based on the orientations or positional relationships illustrated in the drawings, and are used merely for convenience in describing the present invention and for simplicity in description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and thus, are not to be construed as limiting the present invention. Further, in the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
Example 1
Referring to fig. 1 or 2, the present invention provides a technical solution:
a photoelectric material and device impulse voltage testing device comprises a charging assembly 1, an adjusting output assembly 2, a monitoring assembly 3 and a carrier 4 to be tested; the charging assembly 1 is connected with the adjusting output assembly 2, the adjusting output assembly 2 is connected with the carrier 4 to be detected, the monitoring assembly 3 is connected with the carrier 4 to be detected, and the component to be detected is used for monitoring the voltage conditions at two ends of the carrier 4 to be detected.
The charging assembly 1 is used for being connected with an external power supply and charging, and the charging assembly 1 comprises a control panel 11, a controller, a charging power supply 12 and an energy storage capacitor 13; the charging power supply 12 is connected with the energy storage capacitor 13, the control panel is connected with the controller, the controller is connected with the charging power supply 12, and the controller is used for controlling the reference setting voltage at two ends of the energy storage capacitor 13;
when using, with charging source 12 and external 220V power intercommunication back, the staff sets up corresponding reference power on control panel, and charging source 12 can the energy storage power supply, because the impulse voltage who usually adopts is several kilovolts to ten and a few kilovolts usually, compares with the conventional 220V more high, so need charging source 12 to charge energy storage capacitor 13, charging assembly 1 can export enough big and accord with the voltage of standard outside.
The adjusting output component 2 comprises a leading edge matching network 21, a trailing edge matching network 22 and a grounding end 23; the leading edge matching network 21 comprises a multi-stage adjusting resistor and an output interface matched with the adjusting resistor; the back edge matching network 22 comprises a multi-stage adjusting resistor and an output interface matched with the adjusting resistor;
the back edge matching network 22 is connected with the low-voltage end and the grounding end 23 of the energy storage capacitor 13 and outputs low voltage to the outside, and the front edge matching network 21 is connected with the high-voltage end of the energy storage capacitor 13 and outputs high voltage to the outside.
The resistance values of the resistors at each stage in the leading edge matching network 21 and the trailing edge matching network 22 are uniformly and linearly changed, in the embodiment, the leading edge matching network 21 has five different resistance values which are respectively counted as 1-1 to 1-5, and the resistance values are sequentially reduced and set; the back edge matching network 22 has 13 different resistance values which are respectively counted as 2-1 to 2-13, and the resistance values are sequentially reduced and set; the output interface is connected with the corresponding resistor and outputs the resistor to the outside;
the output end of the leading edge matching network 21 is a high-voltage end which can directly act on the anode of the carrier 4 to be tested and the anode of the high-voltage probe; the output end of the back edge matching network 22 is a low-voltage end, is connected with the grounding hole through the output end, and then jointly acts on the negative electrode of the carrier 4 to be tested and the negative electrode of the high-voltage probe;
the monitoring assembly 3 comprises a high-voltage probe 31 and a digital storage oscilloscope 32, wherein the high-voltage probe 31 is connected with the output ports of the leading edge matching network 21 and the trailing edge matching network 22 in parallel respectively, the digital storage oscilloscope 32 is connected with the high-voltage probe 31 in series, the high voltage is output to be low voltage through the high-voltage probe 31, and low voltage signals are transmitted to the digital storage oscilloscope 32 to display the voltage waveform.
In this embodiment, the output end of the leading edge matching network 21 is a red output end, and the output end of the trailing edge matching network 22 is a black output end; the peak voltage of the energy storage voltage is 0-20 KV, the carrier 4 to be tested can be used for testing various photoelectric materials and devices, and the device can be used for testing different photoelectric materials and devices;
the scheme can switch between forward connection and reverse connection, a grounding end 23 of the oscilloscope is connected with an equipment output grounding hole (black output end), and a high-voltage end of the oscilloscope is connected with a high-voltage end (red output end) of the equipment;
in the scheme, the charging power supply 12 can be connected into a single-phase 220Vac through a three-pin plug 10A/250Vac, and a wire core is 2.5mm23. about.3; has a cross section not less than 2.5mm2The equipment ground 23 of the wire is well grounded to the ground.
Still include outside network cabinet body 5 in this scheme, will charge subassembly 1, adjust output assembly 2, the whole settings of monitoring subassembly 3 wherein, can reduce whole space and account for the ratio to this scheme adopts multistage change's resistance to adjust, and the cost is lower, and application scope is wider.
Example 2
The embodiment provides a method for testing the impulse voltage of a photoelectric material and a device; the method comprises the following specific steps:
the method comprises the following steps: performing pressure test, namely repeatedly setting the capacitance reference setting voltage according to the national standard peak voltage of different photoelectric materials and devices, and then outputting until the peak voltage displayed in the oscilloscope meets the national standard peak voltage;
step two: wave modulation, in the test, the photoelectric material and the device are not in compliance until the photoelectric material and the device are impacted by the voltage determined according to the specific voltage waveform, so that the output voltage waveform needs to be modulated;
firstly, observing the form of the primary waveform in the step one, comparing the form with a standard waveform, controlling the rising time of an output waveform through a leading edge matching network 21, and reducing the resistance value in the leading edge matching network 21 when the rising time exceeds a required value, otherwise, increasing the resistance value; controlling the half-decay time of the output waveform through the trailing edge matching network 22, and reducing the resistance value in the trailing edge matching network 22 when the half-decay time is greater than a required value; otherwise, the value is increased;
step three: and observing, and after the voltage meeting the regulation is obtained, impacting the photoelectric material and the device to judge whether the photoelectric material and the device are in compliance.
Because the output waveform is controlled by the multi-section matching network, the sample to be tested needs to be debugged for many times in actual operation, and finally the compliant output waveform and the corresponding output voltage are obtained.
The distributed inductance of the equipment affects the peak voltage of the output end of the equipment, the peak voltage obtained by testing the output end of the equipment is greater than the reference set voltage, the regulation from low voltage to high voltage is required when the reference set voltage is reached, meanwhile, the voltage waveform of the output end of the equipment is monitored by using the high-voltage probe 31 and an oscilloscope, when the peak voltage of the output end of the equipment reaches the rated test voltage of the photoelectric material and the device, the voltage setting knob can be stopped to regulate, and the test of the photoelectric material and the device to be tested is started.
The method can quickly obtain the standard waveform of the carrier 4 to be detected, can quickly and conveniently adjust the standard waveform, improves the impact efficiency of photoelectric materials and devices, can be matched with the output waveform requirements of various types of photoelectric materials and devices, can adjust the standard waveform according to different materials of the carrier 4 to be detected, greatly reduces the operation difficulty, and improves the working efficiency.
Example 3
The load to be tested is 72 sheets of silicon wafer material photovoltaic components, when the voltage is set on the reference, the voltage is required to be adjusted from low voltage to high voltage gradually, meanwhile, the voltage waveform of the output end of the equipment is monitored by using the high-voltage probe 31 and the oscilloscope, and when the peak voltage of the output end of the equipment reaches the rated test voltage of the photoelectric material and the device, the adjustment of the voltage setting knob can be stopped, and the photoelectric material and the device are tested.
When the voltage is set, the voltage setting knob is rotated, and the digital display voltage of the reference setting is changed, so that the output voltage of the charging power supply 12 is changed (at the moment, the charging power supply 12 has no high-voltage output, and the high-voltage output is realized only after a single or continuous button is touched).
When the photoelectric material and the device are 72-sheet silicon material photovoltaic modules and are connected, and the testing mode is forward connection, the reference set voltage of the energy storage capacitor 13 is 12.2KV, and the red output port is referenced to the output interface 1-1 of the equipment (large resistance); and 2-6, switching a reference device switching plug of the black output port, wherein the output waveform meets the standard waveform of the 72-piece silicon material photovoltaic module, and the output voltage under the waveform can be used for carrying out an impact test on the material.
When the connection is reversed, the reference set voltage is 10.8KV, and the red output port is referred to the device output interface 1-1; and 2, a reference device switching plug of the black output port is connected into 2-9, and the output waveform meets the standard waveform of the 72-piece silicon material photovoltaic module, namely, the output voltage under the waveform can be used for carrying out an impact test on the material.
Example 4
The load to be tested is 60-wafer silicon material battery plate type, when the test mode is forward connection, the reference set voltage of the energy storage capacitor 13 is 11.2KV, and the red output port is referenced to the equipment output interface 1-1; and a reference device switching plug of the black output port is connected into 2-9, and the output waveform meets the standard waveform of the type of the 60-piece silicon material battery piece, so that the output voltage under the waveform can be used for carrying out an impact test on the material.
When the connection is reversed, the reference set voltage is 11.5KV, and the red output port refers to the output interface 1-5 of the equipment; and a reference device switching plug of the black output port is connected into 2-9, and the output waveform meets the standard waveform of the type of the 60-piece silicon material battery piece, so that the output voltage under the waveform can be used for carrying out an impact test on the material.
Example 5
The load to be tested is a copper indium gallium selenide thin-film photoelectric material, and the testing mode is that when the load is connected in the forward direction, the reference setting voltage of the energy storage capacitor 13 is 13.8KV, and the red output port is referenced to the output interface 1-3 of the equipment; the switching plug of the reference equipment of the black output port is connected into 2-3, and the output waveform meets the standard waveform of the CIGS thin-film photoelectric material, namely the output voltage under the waveform can be adopted to carry out an impact test on the material
When the connection is reversed, the reference set voltage is 14.3KV, and the red output port refers to the output interface 1-3 of the equipment; and 2-1, connecting a reference device switching plug of the black output port to the device, wherein the output waveform meets the standard waveform of the CIGS thin-film photoelectric material, and performing an impact test on the material by using the output voltage under the waveform.
The present invention is not limited to the above preferred embodiments, and any modifications, equivalent substitutions and improvements made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. The utility model provides a photoelectric material and device impulse voltage testing arrangement which characterized in that: the device comprises a charging assembly, an output adjusting assembly, a monitoring assembly and a carrier to be detected; the charging assembly is connected with the adjusting output assembly, the adjusting output assembly is connected with a carrier to be detected, the monitoring assembly is connected with the carrier to be detected, and the component to be detected is used for monitoring the voltage conditions on two ends of the carrier to be detected; the adjusting output assembly is provided with a plurality of stages of adjusting resistors, and the adjusting of the voltage waveform of the carrier to be detected is realized by connecting different adjusting resistors.
2. The device for testing the surge voltage of photoelectric materials and devices according to claim 1, wherein: the charging assembly is used for being connected with an external power supply and charging, and comprises a control panel, a controller, a charging power supply and an energy storage capacitor; the charging power supply is connected with the energy storage capacitor, the control panel is connected with the controller, the controller is connected with the charging power supply, and the controller is used for controlling the reference setting voltage at the two ends of the energy storage capacitor.
3. The device for testing the surge voltage of photoelectric materials and devices according to claim 1 or 2, wherein: the adjusting output component comprises a leading edge matching network, a trailing edge matching network and a grounding end; the leading edge matching network comprises a multi-stage adjusting resistor and an output interface matched with the adjusting resistor; the back edge matching network comprises a multi-stage adjusting resistor and an output interface matched with the adjusting resistor.
4. The device for testing the surge voltage of photoelectric materials and devices according to claim 3, wherein: the rear edge matching network is connected with the low-voltage end and the grounding end of the energy storage capacitor and outputs low voltage to the outside, and the front edge matching network is connected with the high-voltage end of the energy storage capacitor and outputs high voltage to the outside.
5. The device for testing the surge voltage of photoelectric materials and devices according to claim 4, wherein: the resistance values of all stages of resistors in the front edge matching network and the rear edge matching network are uniformly and linearly changed.
6. The device for testing the surge voltage of photoelectric materials and devices according to claim 5, wherein: the front edge matching network has five different resistance values which are respectively counted as 1-1 to 1-5, and the resistance values are sequentially reduced; the back edge matching network has 13 different resistance values which are respectively counted as 2-1 to 2-13, and the resistance values are sequentially reduced and set.
7. The device for testing the surge voltage of photoelectric materials and devices according to claim 6, wherein: the monitoring assembly comprises a high-voltage probe and a digital storage oscilloscope, wherein the high-voltage probe is connected with output ports of a front edge matching network and a back edge matching network in parallel respectively, the digital storage oscilloscope is connected with the high-voltage probe in series, high voltage is output to be low voltage through the high-voltage probe, and a low voltage signal is transmitted to the digital storage oscilloscope to display voltage waveform.
8. The device for testing the surge voltage of photoelectric materials and devices according to claim 7, wherein: the waveform in the digital storage oscilloscope can be adjusted according to the access ends in the leading edge matching network and the trailing edge matching network.
9. A method for testing the impulse voltage of photoelectric materials and devices is characterized by comprising the following steps;
the method comprises the following steps: performing pressure test, namely repeatedly setting the capacitance reference setting voltage according to the national standard peak voltage of different photoelectric materials and devices, and then outputting until the peak voltage displayed in the oscilloscope meets the national standard peak voltage;
step two: wave modulation, firstly, observing the form of the primary waveform in the step one, comparing the form with a standard waveform, controlling the rising time of an output waveform through a leading edge matching network, and reducing the resistance value in the leading edge matching network when the rising time exceeds a required value, otherwise, increasing the resistance value;
controlling the half-decay time of the output waveform through the trailing edge matching network, and reducing the resistance value in the trailing edge matching network when the half-decay time is greater than a required value; otherwise, the value is increased;
step three: and observing, and after the voltage meeting the regulation is obtained, impacting the photoelectric material and the device to judge whether the photoelectric material and the device are in compliance.
10. The method for testing the surge voltage of the photoelectric material and the device according to claim 9, wherein the method comprises the following steps: the photoelectric material and the device can be 72-sheet silicon material photovoltaic component type, 60-sheet silicon material battery sheet type and copper indium gallium selenide thin-film photoelectric material.
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| CN111398748A (en) * | 2020-03-12 | 2020-07-10 | 山西耀源电力工程有限公司 | Impulse arc image edge detection method and device |
| CN211856689U (en) * | 2020-03-23 | 2020-11-03 | 西安高压电器研究院有限责任公司 | Adjustable impulse voltage source |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102298108A (en) * | 2011-05-25 | 2011-12-28 | 重庆大学 | Impact characteristic simulation test apparatus of earthing device and method thereof |
| CN106885946A (en) * | 2017-03-13 | 2017-06-23 | 贵州电网有限责任公司电力科学研究院 | A kind of impact grounding impedance measuring system and measuring method |
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